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Making Contact - Contact Technology - 1 of 2 BiTS 2017 Session 6 Presentation 4
March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org
Archive – Session 6
March 5 - 8, 2017
Hilton Phoenix / Mesa Hotel
Mesa, Arizona
© 2017 BiTS Workshop – Image: tonda / iStock
BiTS 2017
March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org
Copyright Notice
The presentation(s)/poster(s) in this publication comprise the Proceedings of the 2017 BiTS Workshop. The content reflects the opinion of the authors and their respective companies. They are reproduced here as they were presented at the 2017 BiTS Workshop. This version of the presentation or poster may differ from the version that was distributed in hardcopy & softcopy form at the 2017 BiTS Workshop. The inclusion of the presentations/posters in this publication does not constitute an endorsement by BiTS Workshop or the workshop’s sponsors. There is NO copyright protection claimed on the presentation/poster content by BiTS Workshop. However, each presentation/poster is the work of the authors and their respective companies: as such, it is strongly encouraged that any use reflect proper acknowledgement to the appropriate source. Any questions regarding the use of any materials presented should be directed to the author(s) or their companies. The BiTS logo and ‘Burn-in & Test Strategies Workshop’ are trademarks of BiTS Workshop. All rights reserved.
Making Contact - Contact Technology - 1 of 2 BiTS 2017 Session 6 Presentation 4
March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org
BiTS Workshop 2017 Schedule
Session
Session Chair
Frontier Day Tuesday March 7 - 1:30 pm
Making Contact
"High Current Final Test Contactor Development"
Thiha Shwe, Hisashi Ata – Texas Instruments
Kenichi Sato – Yokowo
"Customers Are the New Team Member for Board to Board Connectors"
Derek Biggs – Plastronics
"WLCSP Contacting Technologies for 0.2 mm Pitch and Below"
Valts Treibergs - Xcerra Corporation
"Coming to terms with Burn-In sockets"
James Tong - Texas Instruments
6 Jason Mroczkowski
Making Contact - Contact Technology - 1 of 2 BiTS 2017 Session 6 Presentation 4
March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org
Coming to Terms with
Burn-In Sockets
James Tong
Texas Instruments
BiTS Workshop
March 5 - 8, 2017
Conference Ready
mm/dd/2014
Making Contact - Contact Technology - 1 of 2 BiTS 2017 Session 6 Presentation 4
March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org
Contents
• Background
• Root cause review
• Solution selection
• Qualification process
• Result and data review
• Lesson learned
• Standardization
• Future plan
Coming to Terms with Burn-In Sockets 5
Making Contact - Contact Technology - 1 of 2 BiTS 2017 Session 6 Presentation 4
March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org
Background
• Custom solution per device per supplier
• Solution selected base on
– good faith and experience from last project
– pricing is the main driver
• Engineering hardware for device
checkout/qualification gets propagated to
production burn in
Coming to Terms with Burn-In Sockets 6
Making Contact - Contact Technology - 1 of 2 BiTS 2017 Session 6 Presentation 4
March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org
Root cause review
• Historically used solution was
inferred to be the best solution
• Ball damaged due to stuck pin
• Plastic socket housing around the
pin melted with Tj >200°C
– High current
– Contact resistance failure
– Housing material
– Defective device
• 5Ws => Ball deformation stuck
pin melted housing heated
spring current flows thru the
spring
Coming to Terms with Burn-In Sockets 7
Making Contact - Contact Technology - 1 of 2 BiTS 2017 Session 6 Presentation 4
March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org
Solution selection – pick the right
pin structure
• Considering the possible root causes of
failure
• Plan checkout DOEs
Your Paper Title Here: BiTS Presentation Guide & Template 1.0 8
Making Contact - Contact Technology - 1 of 2 BiTS 2017 Session 6 Presentation 4
March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org
Solution selection – decision matrix
• Pick supplier matrix
• Specify pin worst case test
requirement
• Qualify selected solution
qualification plan to define
roadmap solutions
Coming to Terms with Burn-In Sockets 9
Supplier Weightage Vendor A Vendor B Vendor C Vendor D
Cost 3 4 5 3 4
Design Robustness 5 4 2 3 4
Responsiveness 3 2 4 3 4
A/T site Support 3 3 2 4 4
Dallas Dev. Support 3 4 3 4 4
Pin Design 5 3 4 3 4
Engineeering Support 4 4 3 3 4
Quality 3 2 3 3 4
Delivery 4 3 4 2 4
3.22 3.33 3.11 4.00
102 100 92 120
Selection Matrix
Unweigthed Average
Total
Making Contact - Contact Technology - 1 of 2 BiTS 2017 Session 6 Presentation 4
March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org
Qualification process
• 3 steps process
• Best of the Cheapest vs. Cheapest of the Best
Coming to Terms with Burn-In Sockets 10
“Qualification
Process”
RTP
RELEASE
TO PROD
“BURN IN OPERATION”
“NEW SOLUTION”
Oven platform
Making Contact - Contact Technology - 1 of 2 BiTS 2017 Session 6 Presentation 4
March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org
Qualification process – Step1
• Max 2 pins designs to support all pitch in package family
(BGA, QFN, QFP)
• CCC of 2 A or greater, Pin force of 15g/pin or less
• Vendor factory data on proposed pin solution
• Engineering data to support design robustness
11 Coming to Terms with Burn-In Sockets
Making Contact - Contact Technology - 1 of 2 BiTS 2017 Session 6 Presentation 4
March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org
Qualification process – Step2
• Small sample functionality engineering
checkout
Electrical performance
Mechanical performance
Operation friendliness
12 Coming to Terms with Burn-In Sockets
Making Contact - Contact Technology - 1 of 2 BiTS 2017 Session 6 Presentation 4
March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org
Qualification process – Step3
• Production correlation
• High volume production qualification of
solution
• Expose to typical production variables
13 Coming to Terms with Burn-In Sockets
Making Contact - Contact Technology - 1 of 2 BiTS 2017 Session 6 Presentation 4
March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org
Yield Trend
Result and data review
• Significant burn in test cost saving
14
First Pass to Final
Yield Gap
improved
Final Yield
improved
Mechanical
Yield loss
drops (less
scraps)
More functional socket per
BIB
Better utilization / thru’ put
Performance
Coming to Terms with Burn-In Sockets
Making Contact - Contact Technology - 1 of 2 BiTS 2017 Session 6 Presentation 4
March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org
Lesson learned – Device surface
marring
Coming to Terms with Burn-In Sockets 15
Bottom BGA substrate surface marring Top side BGA
substrate marring
=> illegible symbols
Boss
(aka: pusher)
Thermal
Module
Surface
roughness Boss
Clam-shell
type Burn-In
socket
Making Contact - Contact Technology - 1 of 2 BiTS 2017 Session 6 Presentation 4
March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org
Lesson learned – Pin structure
• Through hole pinch contact pin is problematic for BGA
• Impossible to replace worn off or damage socket
Coming to Terms with Burn-In Sockets 16
Reproduced from BiTS workshop 2003 (Prasanth
Ambady, James Forster & Jason Cullen – Texas
Instruments)
Making Contact - Contact Technology - 1 of 2 BiTS 2017 Session 6 Presentation 4
March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org
Standardization
• Adopt proven qualification process
• Socket base sizes Burn In Board (BIB)
density
• Use compression mount technology (CMT)
pins only
• Lock in socket mechanical design
• Minimize pin type/geometry for all device
pitch
• Lower cost with best solution and volume
Coming to Terms with Burn-In Sockets 17
Making Contact - Contact Technology - 1 of 2 BiTS 2017 Session 6 Presentation 4
March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org
Future plan
• Use only roadmap CMT pin
solution
• Open top sockets design
• Use rack style solution for
active temperature control
requirement
• Ability to use multiple socket
suppliers on same device
Coming to Terms with Burn-In Sockets 18
Rack with pusher assembly
BIB PCB
Open Top
sockets
Clam-shell
socket
style
• Collaboration to define
industry standard
Making Contact - Contact Technology - 1 of 2 BiTS 2017 Session 6 Presentation 4
March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org
Acknowledgement
• TI operations team
• TI management team
• Suppliers
• BiTS2017 committee and attendees
Coming to Terms with Burn-In Sockets 19