MAN-22060-US002_C00_SSMTT-27_Dual_E1_MMD

8/14/2019 MAN-22060-US002_C00_SSMTT-27_Dual_E1_MMD

1/120

1Dual E1

Dual E1 Module

for the MTT and xDSL

Family of Products

Users Manual

SSMTT-27M

302 Enzo Drive San Jose, CA 95138

Tel: 1-408-363-8000 Fax: 1-408-363-8313

MAN-22060-US002 Rev C00


2/120

2 SSMTT-27

WARNINGUsing the supplied equipment in a manner not specified by Sunrise Telecom mayimpair the protection provided by the equipment.

CAUTIONS Do not remove or insert the module while the test set is on. Inserting or re-

moving a module with the power on may damage the module. Do not remove or insert the software cartridge while the test set is on. Oth-

erwise, damage could occur to the cartridge.

End of Life Recycling and Disposal InformationDO NOT dispose of Waste Electrical and Electronic Equipment (WEEE) asunsorted municipal waste. For proper disposal return the product to SunriseTelecom. Please contact our local ofces or service centers for information onhow to arrange the return and recycling of any of our products.

EC Directive on Waste Electrical and Electronic Equipment (WEEE

The Waste Electrical and Electronic Equipment Directive aims to

minimize the impact of the disposal of electrical and electronic

equipment on the environment. It encourages and sets criteria for

the collection, treatment, recycling, recovery, and disposal of wasteelectrical and electronic equipment.

2010 Sunrise Telecom Incorporated. All rights reserved.

Disclaimer: Contents subject to change without notice.


3/120

3Dual E1

Dual E1 Module

1 Dual E1 Module ..................................................7

1.1 Dual E1 LEDs ....................................................................71.2 Dual E1 Connector Panels ................................................9

1.3 Status Key .......................................................................10

1.4 Storage Allocation ...........................................................11

2 Menus ...............................................................13

2.1 Test Configuration ............................................................132.1.1 E1 Single Configuration ................................................14

2.1.2 E1 Dual Configuration ..................................................18

2.2 Test Pattern ......................................................................22

2.3 Measurement Result .......................................................26

2.3.1 Measurement Results and General Definitions ............28

2.4 Other Measurements .......................................................342.4.1 View Received Data .....................................................34

2.4.2 View Current Event .......................................................352.4.3 View FAS Words ...........................................................35

2.4.4 View MFAS Words ........................................................362.4.5 Pulse Mask Analysis.....................................................37

2.4.5.1 Start New Analysis ....................................................372.4.5.2 View Last Pulse Shape ..............................................38

2.4.6 C-Bit Analysis ...............................................................382.4.7 Histogram Analysis .......................................................402.4.7.1 Format SRAM ............................................................40

2.4.7.2 Current Histogram .....................................................402.4.7.3 Saved Histogram .......................................................42

2.4.8 Propagation Delay ........................................................432.4.9 Channel Loopback ........................................................43

2.5 VF Channel Access .........................................................442.5.1 VF & Noise Measurement.............................................44

2.5.2 View Line CAS ..............................................................482.5.3 Call Analysis .................................................................49

2.5.3.1 Digit Analysis .............................................................522.5.4 Call Emulator ................................................................53

2.5.4.1 Standard Emulations .................................................532.5.4.2 Place a Call ...............................................................54

2.5.4.3 Receive a Call ...........................................................55

2.5.4.4 User Emulation ..........................................................562.5.5 Supervision Setup ........................................................59

2.5.6 Dial Parameters ............................................................602.5.7 Signal Meanings ...........................................................61

2.6 Other Features ................................................................66


4/120

4 SSMTT-27

2.6.1 Error Injection ...............................................................66

2.6.2 Alarm Generation .........................................................682.6.3 Send Frame Words .......................................................69

2.7 System Parameters .........................................................712.7.1 Measurement Configuration .........................................71

2.8 View/Store/Print ...............................................................75

2.8.1 Saving a Test ................................................................762.8.2 Viewing a Stored Test ...................................................76

2.8.3 Printing a Stored Test ...................................................762.8.4 Deleting a Stored Test ..................................................76

2.8.5 Locking and Unlocking a Stored Test............................762.8.6 Renaming a Stored Test ...............................................77

2.9 Profiles .............................................................................78

3 Applications .....................................................79

3.1 Connecting the Cords ......................................................79

3.2 Basic Applications ...........................................................803.2.1 Accept a New Circuit ....................................................803.2.2 In-Service Circuit Monitoring ........................................81

3.2.3 Checking Frequency Synchronization ..........................833.2.4 Signal Level Measurement ...........................................85

3.2.5 V.54 Channel Loopback Test ........................................863.2.6 Running a Timed Test ...................................................87

3.2.6.1 Manual Start ..............................................................873.2.6.2 Auto Start...................................................................873.2.7 Observing Network Codes or Channel Data................88

3.2.8 Monitoring a Voice Frequency Channel ........................89

3.2.9 Simple Talk/Listen .........................................................903.2.10 Send a Tone................................................................913.2.11 Nx64 kbit/s Testing ......................................................92

3.3 Advanced Applications ....................................................93

3.3.1 In-Service Dual Drop and Insert THRU Testing............93

4 Reference .........................................................95

4.1 E1 Technology Overview .................................................95

4.1.1 Technical Standards .....................................................954.1.2 Basic Definitions ...........................................................95

4.1.3 Converting a Voice Signal .............................................954.1.4 2.048 Mbit/s Data Rate .................................................96

4.1.5 Line Coding ..................................................................974.1.6 Signal Levels ................................................................984.1.7 2.048 Mbit/s Framing ....................................................99

4.1.8 MFR2/DTMF/DP Technology ......................................103


5/120

5Dual E1

5 General Information ......................................105

5.1 Testing and Calibration Statement .................................105

5.2 Ofces ...........................................................................105

5.3 Express Limited Warranty ..............................................107

Index ....................................................................109


6/120

6 SSMTT-27


7/120

7Dual E1

1 Dual E1 Module

1.1 Dual E1 LEDs

The LEDs provide information on the test sets current test status.

SSMTT-ACM and -ACM+ SSMTT-B -CFigure 1 Test Set LED Panels

The LEDs described here are used by the module:

MODULE

Green: The test set is in module mode.

SIGNAL

Active when in E1DUAL mode.

Green: Receiving an E1 signal on the line selected in TEST

CONFIGURATION-LED SOURCE.

Red: Not receiving an E1 signal as expected.

FRAME

This LED is active when in a framed test mode. It is active for only

one line. In E1DUAL mode this line is selected in TEST CONFIGU-

RATION- LED SOURCE: either LINE 1 or 2 can be selected. When

the TEST MODE is E1 SINGL, the FRAME LED is for LINE 1. Green: Frame synchronization has been achieved and the fram-

ing found on the received signal of the selected line matches

the framing set in TEST CONFIGURATION-FRAMING.

Red: The congured framing type is not found on the received

signal on the line selected in TEST CONFIGURATION-

FRAMING. This could indicate either a loss of framing on the

received signal or a framing mismatch.

PAT SYNC

Active when performing a BERT test with a known test pattern.

Red: No pattern synchronization or synchronization is lost.

Green: Pattern synchronization achieved. Synchronization hasbeen achieved when the receiver of the line selected in TEST

CONFIGURATION-RxDROP is receiving the same pattern as

the one transmitted by the test set.

Inactive: The test set is in VF Channel Testing.


8/120

8 SSMTT-27

BIT ERR

Active when performing a BERT with a known test pattern.

Red: Currently detecting a bit error on the receiver of the line

selected in TEST CONFIGURATION-RxDROP. Blinking Red: Previously detected bit errors on the receiver

of the line selected in TEST CONFIGURATION-RxDROP, but

currently, there are none . Press HISTORY to clear.

Selected Line LEDs

The following LEDs are active for one line only. In E1DUAL mode

this line is selected in TEST CONFIGURATION-LED SOURCE;

LINE 1 or 2. When TEST MODE is E1SINGL, LINE 1 is moni-

tored.

AIS

Red: Currently detecting an AIS (all 1, no framing).

Blinking Red: Previously detected an AIS, but currently noneare detected. Press HISTORY to clear.

ALARM

Red: Currently detecting an alarm condition.

Blinking Red: Previously detected an alarm condition, but cur-

rently none are detected. Press HISTORY to clear.

ERRORS

Red: Currently detecting an error. This can be a framing bit,

CRC-6 or other errors, other than BPV or bit error.

Blinking Red: Previously detected errors, but currently none

are detected. Press HISTORY to clear.

BPV/CODE

Red: Currently detecting a Bipolar Violation or Code error. Blinking Red: Previously detected a Bipolar Violation or Code er-

ror, but currently none are detected. Press HISTORY to clear.


9/120

9Dual E1

1.2 Dual E1 Connector Panels

The Dual E1 module connector panels are shown in Figure 2.

SSMTT-27 with RJ-11 ports

SSMTT-27 with BNC ports

HEADPHONE

E1-TX1 E1-RX1 E1-TX2 E1-RX2

HEAD

PHONE

E1-TX2E1-TX1 E1-RX2E1-RX1

Figure 2 Dual E1 Connector Panels

HEAD PHONE

Use a stereo head set with a 3 conductor mini connector.

E1-RX2 and E2-TX2

These ports are used when E1DUAL is selected in TEST CON-

FIGURATION. The L2-RX port can also be used as the reference

frequency input in E1SINGL mode. The ports can be optioned as

RJ-11 or BNC.

E1-TX1 and E1-RX2

These ports are used both for E1SINGL and E1DUAL access

modes. The ports can be optioned as RJ-11 or BNC.

RJ-11 Port Pinout

Pin 1,2: E1-Rx

Pin 4,5: E1-Tx


10/120

10 SSMTT-27

1.3 Status Key

The STATUS key, found on the keypad, is used to display a graphic

of the current circuit conguration and status. The graphic may

be invoked during basic menu setups and basic operations, suchas: TEST CONFIGURATION, SEND TEST PATTERN, and VF

CHANNEL ACCESS. Press STATUS upon completing a TEST

CONFIGURATION setup to the proper settings are selected.

The graphics will update based on the TEST CONFIGURATION

settings.

E1SINGL

FRAMING : PCM30C

CODING : HDB3

PAT: 2e15

TEST RATE: 2048 Kbps

Line 1

TERM

Tx

Rx

T

R

Meas 8:21:36

Figure 3 Status Screen

The following is a description of some of the elements common

to a graphic display.

R: This is where the test set performs its received measure-ment results.

T:This is where the test set transmits a test pattern.

- Arrows denote the direction the signal is travelling.

Boxed words, or abbreviations, provide additional information:

Tx: The transmit port of the noted line (1 or 2).

Rx: The receive port of the noted line.

FRAMING: Reports the framing type, and if CRC checking is

present.

CODING: Reports the transmitted coding type.

PAT: Reports the test pattern.

TEST RATE: Reports the full or fractional test rate. BRDG, TERM, or MON: Noted by each line (TERM is reported

in Figure 3).


11/120

11Dual E1

1.4 Storage Allocation

Depending on the feature, some results are stored on the MMC

card, while others are stored on the SRAM card. Table 1 shows

where the results from each feature are stored

Feature Location

E1 BERT MMC

Pulse Mask Analysis SRAM

Histogram SRAM

Jitter Measurement SRAM

Jitter Tolerance MMC

Jitter Transfer MMC

Wander Measurement MMC > TIE

SRAM > Histogram

GPRS Abis Statistics MMCGPRS Gb Analysis MMC

ISDN Protocol Analysis SRAM

GSM Protocol Analysis SRAM

V5 SRAM

VF Call Analysis MMC

VF Call Emulation MMC

Table 1 Storage Allocation


12/120

12 SSMTT-27


13/120

13Dual E1

2 Menus

Figure 3 outlines the major functions of the E1 Dual module.

MODULEKey

PROTOCOLS

See Separate Option Users Manuals

E1 MAIN MENU

OTHER MEASUREMENT

2.4

MEASUREMENT RESULT

2.3

TEST PATTERN

2.2

TEST CONFIGURATION

2.1

VF CHANNEL ACCESS

2.5

OTHER FEATURES

2.6

SYSTEM PARAMETERS

2.7

VIEW/STORE/PRINT

2.8

PROFILES

2.9

C-BIT ANALYSIS

2.4.6

OTHER MEASUREMENTS

PULSE MASK ANALYSIS

2.4.5

VIEW MFAS WORDS

2.4.4

VIEW FAS WORDS

2.4.3

VIEW CURRENT EVENT

2.4.2

VIEW RECEIVED DATA

2.4.1

HISTOGRAM ANALYSIS

2.4.7

PROPAGATION DELAY

2.4.8

CHANNEL LOOBACK

2.4.9

SUPERVISION SETUP

2.5.5

VF CHANNEL ACCESS

CALL EMULATOR

2.5.4

CALL ANALYSIS

2.5.3

VIEW LINE CAS

2.5.2

VF & NOISE MEASUREMENTS

2.5.1

DIAL PARAMETERS

2.5.6

SIGNAL MEANINGS

2.5.7

VIEW/STORE/PRINT

2.8

OTHER FEATURES

SEND FRAME WORDS

2.6.3ALARM GENERATION

2.6.2

ERROR INJECTION

2.6.1

MEAS CONFIGURATION

2.7.1

SYSTEM PARAMETERS

Figure 4 Menu Tree

2.1 Test Configuration

A circuit is accessed by configuring the test set to the circuit under

test and connecting the test set to the circuit.

The Dual E1 module can be configured to automatically detect

incoming framing and test pattern by pressing the AUTO key.

Conguration is the most important part of the entire test proce-

dure. If the test conguration items are congured incorrectly, all

measurement results will be meaningless.To configure use this procedure:

1. Select E1 MAIN MENU > TEST CONFIGURATION and at

TEST MODE, select E1SINGL (F1) or E1DUAL (F2).

2. Refer to the following two sections for conguration details.


14/120

14 SSMTT-27

2.1.1 E1 Single Configuration

Figure 5 E1 Single Test Configuration Screen

Tx SOURCE

Options: LOOP (F1), TESTPAT (F2)

LOOP: Used for full duplex drop and insert testing on an in-

service line. In this case, the signal received on the Rx port

will be transmitted out the Tx port for Line 1.

TESTPAT: Used for out-of-service bit error rate testing. In this

case, a test pattern will be transmitted on the selected Transmit

port. During Nx64 or VF CHANNEL ACCESS testing, an idle

code will be inserted on the unused channels.

FRAMING

Options: PCM-30 (F1), PCM-31 (F2), UNFRAME (F3)Choose the appropriate framing for the circuit.

PCM-30: The test set will synchronize on both FAS (Frame

Alignment Signal) and MFAS (MultiFrame Alignment Signal).

PCM-31: The test set will synchronize only on FAS.

Notes:

If unsure of the proper framing, push AUTO. Use the combi-

nation which synchronizes properly and/or allows error free

measurement results.

If the received signal framing and CRC-4 status of dont match

the framing and CRC-4 settings, the test set will display LOS

(Loss of Frame) condition and may display loss of CRC DET.

AMI is the default line code. The line code can be congured for

AMI or HDB3 in: E1 MAIN MENU > SYSTEM PARAMETERS

> MEAS CONFIGURATION.


15/120

15Dual E1

CRC-4

Options: YES (F1), NO (F2)

YES: Measures of CRC-4 errors on an incoming signal and

also transmits the CRC-4 bits on the outgoing signal. CRC-4only works with PCM-31 and PCM-30 framing.

If UNFRAME has been selected for framing, the test set will

force the CRC-4 conguration to NO.

TEST RATE

Options: 2.048M (F1), Nx64K (F2)

2.048M: Used for full rate testing. If you are not certain about

which one to choose, select this for full rate testing.

Nx64: Use for fractional

testing. Upon pressing, the

SELECT TIMESLOT screen to

the right is displayed. In it

select each timeslot to test,

these can be selected

automatically, or manually.

Figure 6 Select TimeslotScreen

Manual Selection of Timeslots

1. Use to choose a timeslot, then press SELECT (F2).

2. Repeat until all the necessary timeslots have been selected.

Selected timeslots remain highlighted, as in Figure 6.

Press UN-SEL (F3) to deselect a timeslot. Press CLR-ALL (F4) to clear all selections and to start over.

Automatic Selection of Timeslots

1. Press AUTO (F1).

If receiving a signal which is already formatted in the N (or M)

x64 kbit/s fractional E1 format, the quickest method for select-

ing timeslots is to press AUTO (F1).

2. Press ENTER to set the choices, and return to the TEST

CONFIGURATION screen.

In AUTO, the test set will automatically congure the timeslots

by looking for active data. It will congure the transmit side to be

the same as the active timeslots on the receive side. The test

set determines which timeslots are active by rst determiningwhich timeslots are idle. Any timeslot that is not idle is assumed

to be active. The test set determines that a timeslot is idle when

it nds the lines idle code. This is set in SYSTEM PARAMETERS

> MEAS CONFIGURATION-CODE CONFIGUR.


16/120

16 SSMTT-27

Notes:

In PCM-31 framing, timeslots 1-31 correspond to channels 1-31.

In PCM-30 framing, timeslots 1-15 correspond to channels

1-15, and timeslots 17-31 correspond to channels 16-30. InPCM-30, timeslot 16 is used for the multiframe alignment signal.

Fractional E1 is not offered with unframed signals, because

framing is required to determine the location of timeslots.

The timeslots specied for transmit/receive need not be the

same. The number of selected timeslots can differ from the Tx

side to the Rx side. The test set will assume that all incoming

data is received byte by byte in ascending channel order.

L1-Rx PORT

Options: TERM (F1), BRIDGE (F2), MONITOR (F3)

Congures the Line 1 2.048 Mbit/s receiver.

These settings let the test set electrically decode a 2.048 Mbit/s

signal under a wide range of resistive cable losses. They also

determine which electrical load will be placed on the circuit by the

test set. These settings have no effect on the transmitters.

On a 2.048 Mbit/s circuit, there must always be exactly one

receiver that applies the low impedance (75/120) termination.

There should never be two or more receivers applying a low

impedance termination.

CAUTION: If uncertain, select BRIDGE, this will protect the

2.048 Mbit/s signal.

TERM: The received signal is terminated with a 75 or 120

impedance. The tested signal has been transmitted over realcable at a level between approximately +6 and -43 dB. This

mode will disrupt the circuit.

BRIDGE: The test set applies high-impedance isolation resis-

tors to the circuit. This will protect the signal from any possible

disruption. The tested signal has been transmitted over regular

cable at a level of approximately +6 and -43 dB.

MONITOR: Used when a measurement is made at a protected

monitoring point, at a level between -15 and -30 dB. The signal

is provided from the protected MONITOR port of a network

equipment.

In this mode, if a 0 dB signal is received, the CODE ERR LED

will light red. This often happens when the test set is pluggedinto an OUT port. In this case, choose TERM instead. If un-

certain if a port is bridged or protected, try BRIDGE rst.

TX CLOCK


17/120

17Dual E1

Options: L1-RX (F1), INTERN (F2), L2-RX (F3), OFFSET (more,

F1), TTL-L2 (more, F2)

This is used to time the transmit signal.

L1-Rx: The test set uses the timing from the signal receivedon Line 1 as the clock source.

INTERN: This uses the internal timing of the test set. This

timing is not synchronized to the network. You should use

internal timing in loopback testing where synchronization is

not required.

L2-Rx: Timing is received from the signal received on Line 2.

SHIFT: Press to display the

screen shown to the right. In

it, the test set uses a digital

synthesizer to shift the

transmit frequency in 1, 10,

100, or 1000 Hz steps. Shift

up to +/- 50,000 hz (25K

ppm).

Figure 7 DDS Shift Screen

1. Set DDS SHIFT from 0 and 50,000 Hz by using INC (F1) or

DEC (F2).

2. Set the SCALE of the shift by using INC (F1) and DEC (F2).

Choose among 1, 10, 100, and 1000 (i.e., a shift of 3 Hz with

a SCALE of 10 would shift the frequency 13 Hz).

TTL-L2: The test set uses a G.703 sinusoidal clock plugged

into E1 RX2 as the timing source


18/120

18 SSMTT-27

2.1.2 E1 Dual Configuration

Figure 8 E1 Dual Test Configuration Screen

Tx/INSERT

Options: L1-TX (F1), L2-TX (F2)Select the 2.048 Mbit/s test line that the test signal is inserted.

Determine where the 2.048 Mbit/s test pattern, Nx64 kbit/s test

pattern, Nx64 kbit/s multiplexed signal, or voice frequency channel

will be inserted (i.e., if Tx/INSERT is L2-Tx and if talking on the

test set, then the speech will be inserted on line 2).

Rx/DROP

Options: L1-RX (F1), L2-RX (F2)

Select the received test signal from either L1-Rx or L2-Rx.

Congures bit error rate, 2.048 Mbit/s line frequency, E-bit error

measurements, M.2100/550 measurements, voice channel fre-

quency, voice channel level, voice channel Rx ABCD. View received

data, FAS, and MFAS words, etc. (i.e., if performing a BERT on the

received signal from line 1, then select Rx/DROP as L1-Rx).

Tx SOURCE

Options: LOOP (F1), TESTPAT (F2)

LOOP: Used for in-service full duplex drop and insert testing. In

this case, the signal received on the Rx port will be transmitted

out the Tx port for Lines 1 and 2. A signal will be inserted on

1 or more channels on the line selected in Tx/INSERT. The

channels and corresponding ABCD bits on the unselected line

are passed through the test set unchanged from Rx to Tx.

TESTPAT: Used for out-of-service bit error rate testing. A

test pattern is transmitted on the selected Tx/INSERT port.During Nx64 or VF CHANNEL ACCESS testing, an idle code

is inserted on the unused channels. On the unselected line,

the channels and ABCD bits are passed through the test set

unchanged from Rx to Tx.


19/120

19Dual E1

FRAMING

Options: PCM-30 (F1), PCM-31 (F2), UNFRAME (F3)

Choose the framing that is appropriate for the circuit.

PCM-30: Test set will synchronize on both FAS (Frame Align-ment Signal) and MFAS (MultiFrame Alignment Signal).

PCM-31: The test set will synchronize only on FAS.

Notes:

If framing and CRC-4 state of the received signal do not match

the framing and CRC-4 settings, the test set will display LOS

(Loss of Frame) condition and may display loss of CRC DET.

AMI is the default line code. The line code can be congured for

AMI or HDB3 in: E1 MAIN MENU > SYSTEM PARAMETERS

> MEAS CONFIGURATION.

If unsure of the framing, press AUTO. Use the combination

which synchronizes properly and results in error free results.

CRC-4

Options: YES (F1), NO (F2)

YES: Allows the test set to measure CRC-4 errors on the in-

coming signal and to transmit the CRC-4 bits on the outgoing

signal. CRC-4 only works with PCM-31 and PCM-30 framing.

If UNFRAME has been selected for framing, the test set will

force the CRC-4 conguration to NO.

TEST RATE

Options: 2.048 (F1), Nx64K (F2)

2.048M congures the test set for full rate testing. If unsure,

select 2.048 Mbit/s.

Nx64K congures the test set for fractional testing. Upon se-lection, the SELECT TIMESLOT screen is displayed. In this

screen, choose each timeslot for testing. See Section 2.1.1-

TEST RATEfor the procedure.

L1-Rx Port and L2-Rx Port

Options: TERM (F1), BRIDGE (F2), MONITOR (F3)

Congures the two 2.048 Mbit/s receivers.

These settings let the test set electrically decode a 2.048 Mbit/s

signal under a wide range of resistive or cable losses. These

settings also determine which electrical load will be placed on

the circuit by the test set. These settings have no effect on the

transmitters. On a 2.048 Mbit/s circuit, there must always be

exactly one receiver that applies the low impedance (75/120)termination. There should never be two or more receivers ap-

plying a low impedance termination.

See L1-Rx PORT in Section 2.1.1for a choice descriptions.


20/120

20 SSMTT-27

TX CLOCK

Options: RECEIVE (F1), INTERN (F2), SHIFT (F3)

This is used to time the transmit signal.

RECEIVE: The test set uses the timing from the signal received onthe line set as RX/DROP as the clock source for both TX lines.

Figures 9-11 are the timing set ups when RECEIVE is selected.

Figure 9 represents slave timing. Here, Tx CLOCK=L1-Rx, but the

signal received on L1-Rx is timed off of the L1-Tx source. Thus,

there is no true clock source, thus the transmit signal may die.

Figure 9 Slave to Slave Timing Setup

Figure 10 depicts loop or slave timing. Tx/INSERT and TX CLOCK

are set for the same line. Loop timing is necessary when transmit-

ting toward an exchange or other network element that requires

synchronous signals. This network element must be congured

to be a master timing source in relation to the signal, or else this

will result in slave-to-slave timing.

Figure 10 Loop/Slave Timing Setup

Figure 11 depicts external timing. External timing uses an external

clock source to time the Tx/INSERT signal. The external clock

source should be congured for the opposite line from the Rx/

DROP selection. In this case, Rx/DROP and Tx/INSERT are setfor Line 2. Therefore, Tx CLOCK is set for Line 1 (L1-Rx).

Note: In Figures 9-11, Tx SOURCE has been set for TESTPAT.

The Tx CLOCK setting is ignored if Tx SOURCE is set for LOOP.

In LOOP, both Lines 1 and 2 pass timing from Rx to Tx.


21/120

21Dual E1

Figure 11 External Timing Setup

INTERN: This setting uses the internal timing of the test set.

This timing is not synchronized to the network. You should

use internal timing in loopback testing where synchronization

is not required. If you set Tx/INSERT as L1-Tx, and chooseINTERN, the L1-Tx signal will use the internal timing of the

test set. In E1DUAL mode, the L2-Tx signal will use the timing

recovered from L2-Rx.

SHIFT: Press to display the

screen shown to the right. In

it, the test set uses a digital

synthesizer to shift the

transmit frequency in 1, 10,

100, or 1000 Hz steps. Shift

up to +/- 50,000 hz (25K

ppm).

Figure 12 DDS Shift Screen

1. Set the DDS SHIFT between 0 and 50,000 Hz by using INC

(F1) and DEC (F2).

2. Set the SCALE of the shift by using INC (F1) and DEC (F2).

Choose among 1, 10, 100, and 1000. For example, a shift of

3 Hz with a SCALE of 10 would shift the frequency 13 Hz.

LED SOURCE

Options: LINE 1 (F1), LINE 2 (F2)

Select Line 1 or 2 to be displayed on the test sets LED panel. This

selection does not apply to PAT SYNC and BIT ERR LEDs.


22/120

22 SSMTT-27

2.2 Test Pattern

Figure 13 Test Pattern Selection Screen

Standard Test Patterns

To send one of the standard patterns:

1. Use to select a desired pattern. As each pattern isselected, the test set begins transmitting that pattern.

2. Press INVERT (F2) to send an inverted pattern (1s and 0sreversed). Press NORMAL (F2) to send a normal pattern.

3. At the MEASURE MODE line in SYSTEM PARAMETERS >MEAS CONFIGURATION, select BER or LIVE. In BER, the

test set looks for a BERT pattern. In LIVE, the test set doesnot look for a pattern, it tests live trafc. If LIVE is selected,

the PAT SYNC LED is off.

Long patterns are written in hex (hexadecimal). A pattern in hex will

be written with pairs of numbers separated by commas. The Hex

number system consists of the 16 digits; 0, 1, 2, 3, 4, 5, 6, 7, 8, 9,

A, B, C, D, E, F. 15 FA hex translates to the binary pattern 0001

0101 1111 1010, where the left most bit is transmitted rst.

The following test patterns are available:

2e23: Industry-standard 2e23-1pseudo random bit sequence and

is formed from a 23 stage shift register and is not zero-constrained.

It contains up to 22 zeros in a row and violates standards for

consecutive zeros in AMI-coded transmission.

2e20: Industry-standard 2e20-1pseudo random bit sequence is

formed from a 20 stage shift register and is not zero-constrained.

It contains up to 19 zeros in a row and violates standards for

consecutive zeros in AMI-coded transmission. The QRS pattern

is derived from the 2e20 pattern.2e15: Industry-standard 2e15-1pseudo random bit sequence is


It contains up to 14 zeros in a row and does not violate standards

for consecutive zeros in AMI-coded transmission.


23/120

23Dual E1

20ITU: This is the 2e20-1pseudo random bit sequence and is


It conforms to the ITU O.153 technical standard. It is not identical

to 2e20, because different feedback mechanisms are used whenthe patterns are produced by means of shift registers. 20ITU

suppresses consecutive sequences of more than 18 zeros, as

opposed to 14 zeros in 2e20.

2047: Industry-standard bit code used for DDS applications.

511,127,63: Industry-standard bit codes used for DDS.

1111: Industry-standard all ones pattern is used for stress testing

E1 AMI, and B8ZS lines. If it is sent unframed, it will be interpreted

as an AIS (Alarm Indication Signal). This is the pattern in its binary

form: 1111.

1010: Industry-standard alternating ones and zeros pattern. It is

frame aligned with f showing the location of the framing bit. Thepattern is: f 0101 0101.

0000: Industry-standard all zeros pattern is often used to make

sure that clear-channel lines have been properly provisioned for

B8ZS during circuit turn-up. If a portion of the circuit is AMI, then

pattern synch and/or signal will be lost. The pattern is: 0000.

FOX: Industry-standard pattern is used in data communications

applications. The ASCII translation of the pattern is the Quick

brown fox .... sentence. The pattern is frame aligned to ensure

proper ASCII translation of the bits. It is recommended that the

pattern be sent with framed signals, otherwise ASCII translation

is not possible. This is the pattern: 2A, 12, A2, 04, 8A, AA, 92, C2,

D2, 04, 42, 4A, F2, EA, 72, 04, 62, F2, 1A, 04, 52, AA, B2, 0A, CA,04, F2, 6A, A2, 4A, 04, 2A, 12, A2, 04, 32, 82, 5A, 9A, 04, 22, F2,

E2, 04, 8C, 4C, CC, 2C, AC, 6C, EC, 1C, 9C, 0C, B0, 50.

QRSS: Industry-standard Quasi Random Signal is formed from a

20 stage shift register and is zero-constrained for a maximum of

14 consecutive zeros. When transmitted in a framed signal, up to

15 consecutive zeros will occur in accordance with AMI minimum

density requirements.

1-4: The one-in-four pattern is used for stress testing circuits. It is

frame aligned. The pattern is 0100.

1-8: Industry-standard 1 in 8 pattern is used for stress testing AMI

and B8ZS lines. It is also called 1:7. The pattern is frame aligned(f is the framing bit) as shown in its binary form: f 0100 0000.

3-24: Industry-standard 3 in 24 pattern used for stress testing AMI

lines. The pattern is frame aligned (f is the framing bit) as shown

in its binary form: f 0100 0100 0000 0000 0000 0100.


24/120

24 SSMTT-27

User Test Patterns

In addition to the standard

patterns, a custom pattern can

be setup by pressing USER (F1)in the TEST PATTERN screen

(Figure 13). The screen to the

right is displayed listing any

stored patterns. Use this screen

to create, edit, view, send, or

delete a pattern. Figure 14 User Test Pattern

Screen

Sending a User Test Pattern

1. In TEST PATTERN, press USER (F1).

2. The test set will present a list of stored USER patterns. Use

to select a pattern.3. Press ENTER to send the selected pattern.

Viewing a User Test Pattern

1. In the USER TEST PATTERN screen, select a pattern.

2 Press VIEW (F1).

3. You will see your selected pattern on the screen (in binary).

4. When nished, press ESC.

Creating User-Defined Patterns

1. In USER TEST PATTERN

selection screen, select a

blank line, and press CREATE

(F1). A USER TEST PATTERN

screen like the one to the

right will be displayed with

the cursor at LABEL.

2. Press TOGGLE (F3) and the

A will be selected, as in the

screen to the right.Figure 15 User Test Pattern

Character Screen

3. Use to select the desired character and press SELECT

(F4). The selected character appears next to LABEL. Repeat

until finished.

4. Press TOGGLE (F3) and press to move to No.

5. Press SHIFT and use the numeric keypad to enter the patternup to 24 bits long. When nished, press SHIFT.

If a mistake is made, use INSERT (F1) or DELETE (F2).

6. Press ENTER to store the pattern and to return to the TEST

PATTERN screen, where the new pattern label is displayed.


25/120

25Dual E1

Editing a User Test Pattern Label

1. From TEST PATTERN, press USER (F1) to move into USER

TEST PATTERN.

2. Select the pattern label that you want and press EDIT (F2).3. When the cursor is on LABEL, use to select the desired

character to change and:

A. Press DELETE (F2), then press TOGGLE (F3), and select

the desired character. The character will be inserted in place

of the deleted character in the label, or

B. Press INSERT (F1), then press TOGGLE (F3), and select

the desired character. The character will be inserted to the

left of selected character in the label, or

C. Press TYPOVER, then press TOGGLE (F3), and select the

desired character. The character will be inserted in place

of the selected character in the label.

Correcting a Mistake in the Pattern

1. While entering the 1s and 0s, you notice an incorrect digit.

Press SHIFT to remove the SHFT indicator.

2. Select the incorrect digit with the keypad arrow keys and press

SHIFT to display the SHFT indicator.

3. Enter the correct digit.

4. Press the SHIFT key to remove the SHFT indicator.

5. Move the cursor with the keypad arrow keys to the end of the

line.

6. Press SHIFT again to display the SHFT indicator.

7. Enter in the rest of the digits.

8. Press ENTER to store the pattern.

You can edit the codes label using the same procedure.

Deleting a User Test Pattern

1. From TEST PATTERN, press USER (F1) to enter USER TEST

PATTERN.

2. Select the entry you want to delete, then press DELETE (F3).

The entry is deleted.

3. Press ESC to return to TEST PATTERN.


26/120

26 SSMTT-27

2.3 Measurement Result

To observe results:

1. From the E1 MAIN MENU, select MEASUREMENT RESULT

and press START (F3).2. Press PAGE-UP (F1) or PAGE-DN (F2) to view the screens.

3. Press ESC when nished.

The test set continuously performs measurements on received

signal(s). When a measurement is performed, MEAS is displayed

on screen. When stopped, it is not displayed.

Results are stored when STOP (F3) is pressed and when PRINT

RESULT is set to LAST in SYSTEM PARAMETERS > MEAS CON-

FIGURATION, or when a TIMED measurement nishes. Events are

also stored when PRINT EVENT is ENABLED, in MEAS CONFIGU-

RATION.

The screens do not need to be displayed for results to be compiled.Measurements are automatically restarted every time the con-

guration is signicantly changed. You can view the accumulated

measurements along with restarting the measurement.

The actual screens and the values displayed depend upon the se-

lected TEST MODE. However, all screens share common features.

Figure 16 Measurement Results Screen

Measurements often have a count number displayed on the left

side and a corresponding rate or percentage displayed on the right

side of the same line. For example, in Figure 16, CODE appears

on the left and RATE on the right.

A key concept is availability. A circuit is available for use only whenthe bit error rate is low enough that a signal can be understood. A

circuit is said to be unavailable at the beginning of 10 consecutive

severely errored seconds. Errors, errored seconds, and severely

errored seconds are not accumulated when the circuit is unavail-


27/120

27Dual E1

able. Therefore, if injecting errors continuously to the test set at

a 2x10-3error rate, increasing bit errors, errored seconds, and

severely errored seconds for the rst 9 seconds will be seen. At

the tenth second, all the counts will decrease back to the valuesthey had before the error injection was started, and the unavail-

able counter will increase by 10.

Once a circuit is unavailable, it becomes available only after 10

consecutive seconds without severe errors. To continue the previ-

ous example, if severe error injection is turned off, and then 1 or

2 errors are inserted during the next 5 seconds, the unavailable

second counter continues to increase for the rst 9 seconds while

the error counter does not change. At the tenth second, the un-

available second counter decreases by 10 and the error counter

increases by the 1 or 2 inserted errors.

Result Screen F-keysPAGE-UP (F1),PAGE-DN (F2): View of all screens.

STOP/START (F3): Stop the test, or start the measurement.

HOLDSCR/CONTINU(more, F1): Hold Screen freezes all mea-

surement so they may be easily observed. The measurement

count is still proceeding, but not displayed. The previous counts

can now be clearly read.When nished, press CONTINU to up-

date the measurements.

LOCK/UNLOCK(more, F2):Lock the keypad. The measurement

process continues, but keypad strokes have no effect on the test

set. This is useful if running a long-term test and wish to have the

test disturbed. UNLOCK enables the keypad.

EVENT(more, F3):View the EVENT RECORD screen described

in Section 2.4.2.

In addition to measurement data, the following is displayed at the

top of the Result screens:

ET: Elapsed Time since the test was started or restarted.

RT: Timed test Remaining Time. The default is that the test runs

continuously until stopped. CONTINU is displayed at RT to denote

a continuous test. To specify a timed test, select SYSTEM PARAM-

ETERS > MEAS CONFIGURATION, and specify the test length and

the remaining time will count down to zero during a measurement.

FRM: Transmitted framing

TxCK: Transmit clock source

PATT: Transmitted test pattern

RATE: Test rate


28/120

28 SSMTT-27

2.3.1 Measurement Results and General Definitions

These are several screens of data. The screens that are displayed

depend on the MODE, E1SINGL or E1DUAL. Screen 1, which

appears when rst entering MEASUREMENT RESULT, is a STA-

TUS screen. It displays the status of each line in use, a statusmessage is displayed for both lines 1 and 2. These messages (i.e.,

NO ERRORS, FRM LOSS, SIG LOSS, ERROR DET) represent

the condition of the line during testing.

Measurement Result Definitions

Note: Each measurement is proprietary to its screen; i.e., error

refers to E-Bit errors in the E-BIT screen, and to all Summary

errors in the SUMMARY screen, etcetera.

AISS: Number of Alarm Indication Signal Seconds in which AIS

was detected.

AS: Number of Available Seconds since the start of the test. AS

equals the length of the total test time minus any UAS.%AS: Percentage of Available Seconds since the start of the test.

BIT: Number of bit errors that have occurred since the start of the

test. Bit errors are not counted during UAS.

BER: Bit Error Rate is the total number of bit errors divided by the total

number of bits during available time since the start of the test.

CLK SLIP: Number of Clock Slips that have occurred since the

start of the test.

CODE: Number of line Code Errors (Bipolar Violations that violate

the coding rules) that have occurred since the start of the test. In

HDB3 coding, a Code Error is a bipolar violation that is not part

of a valid HDB3 substitution.(CODE) RATE: Average Bipolar Violation error rate since the

start of the test.

CRC: Number of CRC-4 block errors that have occurred since

the start of the test. It is reported as N/A when the test set is not

synchronized on a received CRC-4 check sequence.

(CRC) RATE: Average CRC-4 block error rate since the start of

the test. This measurement is reported as N/A when the test set

is not synchronized on a received FAS or MFAS signal.

DGRM: Number of Degraded Minutes since the start of the test.

A DGRM occurs when there is a 10-6bit error rate during 60 avail-

able, non-severely bit errored seconds.

%DGRM: Percentage of summary DGRM since the start of the

test.

EBIT: Number of E-bit errors since the start of the test.

EBER: Average E-bit error rate since the start of the test.


29/120

29Dual E1

EFS: Number of Error Free Seconds since the start of the test.

%EFS: Percentage of summary EFS since the start of the test.

A summary Error Free Second is a second in which the signal is

properly synchronized with no errors or defects.

ES: Number of Errored Seconds that have occurred since the

start of the test. An ES is any second with at least one BPV, bit

error, FBE, errored block, or CRC-4 error. An ES is not counted

during an UAS.

%ES: Percentage of ES that have occurred since the start of the

test.

FALM: Frame Alarm seconds is a count of seconds that have had

far end frame alarm (FAS Remote Alarm Indication, RAI) since

the start of the test.

FE: Number of Frame bit Errors that have occurred since the start

of the test. It reported as N/A when the test set has not synchro-

nized on a known framing pattern.Hz/PPM: The Hertz/Part Per Million count records any variance

from 2.048 Mbit/s in the received frequency.

LOFS: Loss Of Frame Seconds is a count of seconds since the

start of the test that have experienced a loss of frame.

LOSS: Loss Of Signal Seconds is a count of the number of sec-

onds during which the signal has been lost during the test.

+LVL: Positive Level is the level of positive pulses being received

by the test set. Measurements are displayed in decibels variance

from G.703 specied level (dB).

-LVL: Negative Level is the level of negative pulses being received

by the test set. Measurements are displayed in decibels variancefrom G.703 specied level (dB).

Lpp: Level Peak-to-Peak is the peak-to-peak level of negative and

positive pulses being received by the test set. Measurements are

displayed in decibels variance from DSX level (dB).

MAX Hz: Maximum frequency since the start of the test.

MIN Hz: Minimum frequency since the start of the test.

MFAL: Multiframe Alarm seconds is a count of seconds that have

had far end multiframe alarm (MFAS Remote Alarm Indication,

RAI) since the start of the test.

RxCLK: Received clocking frequency.

+/- RxLVL: Received Positive or negative level of pulses.

RCV Hz: Current frequency during the last second.

SES: Number of Severely Errored Seconds since the start of the test.

An SES has an error rate of >10-3. It is not counted during UAS.

%SES: Percentage of SES seconds since the start of the test.


30/120

30 SSMTT-27

SLIP: Number of Bit Slips. This occurs when the synchronized

pattern either loses a bit or has an extra bit stuffed into it.

UAS: Number of Unavailable Seconds that have occurred since

the start of the test. UAS begins at the onset of 10 consecutiveSES. The displayed value of UAS updates after the tenth consecu-

tive SES occurs. UAS also begins at a LOS or LOF.

%UAS: Percentage of UAS since the start of the test.

+WANDR: Total positive phase difference between the measured

frequency and the reference frequency since the start of the test.

The +WANDR value increases whenever the measured frequency

is largerthan the reference frequency.

-WANDR:Total negative phase difference between the measured

frequency and the reference frequency since the start of the test.

The -WANDR increases whenever the measured frequency is

less than the reference frequency.

The following sections describe the available results screens.

Line 1 and Line 2 Summary Screens

These two SUMMARY screens

report the summary results for

Lines 1 and 2, if both are in

use. The screen to the right is

for Line 1.

They report the most signifi-

cant measurements containing

specific types of impairments;

i.e.,code errors, CRC-4 block

errors, framing, and multifram-

ing bit errors. See Section

2.3.1for definitions.

Figure 17 Line 1 E1 Sum-mary Screen

Frequency Screen

The FREQUENCY screen shows frequency information.

Figure 18 E1 Mode Line Frequency Screens

The bar graph indicates how fast the signal is slipping in rela-

tion to the reference clock. RxDROP determines which line the


31/120

31Dual E1

measurements are from. The not selected line is the reference

clock. I.e., if RxDROP is L1-Rx, L1 is measured, and the reference

clock is from L2-Rx.

It is important to know the source of the reference clock, to mean-ingfully interpret the graph results.

The bar graph slips most rapidly at the center position and then

gradually slows down as the length of the bar increases.

One clock slip occurs when the measured frequency deviates from

the reference frequency by 1 unit interval. For E1 a unit interval

is equal to 488 nanoseconds. The number of clock slips is kept at

the end of the bar. At 256 clock slips the graph resets itself.

The bar graph is valid when L1-Rx and L2-Rx have valid signals.

If L2-Rx has no signal it will display NO LINE 2 REF SIGNAL,

and a graph is not displayed, as in the right screen Figure 18.

Note:When no reference clock signal is present, the test set willdefault to its internal clock, for the measurement of MAX, MIN,

and current RCV bit rates of the selected signal.

Line 1 and Line 2 G.821 Screens

The G.821 screen reports

measurement parameters

specified in ITU G.821. These

screens are displayed only if

G.821 in SYSTEM PARAM-

ETERS > MEAS CONFIG is

ON. The same applies specifi-

cally to the DGRM measure-

ment. See Section 2.3.1fordefinitions. Figure 19 G.821 Logical

Screen

Line 1 and Line 2 ALM/SIG Screens

The ALM/SIG screen reports

alarm and measurement

parameters relating to the E1

signal. See Section 2.3.1for

definitions.

Figure 20 E1 Mode ALM/

SIG Screen


32/120

32 SSMTT-27

Line 1 and Line 2 M.2100/550 Screens

The M2100/550 screen provides

pass/fail measurements in

accordance with ITU M.2100/550specifications. The specification is

used where a 2.048 Mbit/s circuit

crosses international boundaries.

It allocates a certain allowable

error rate for each boundary that

carries the circuit. You need only

enter the appropriate percentage

that is to be allowed for the line

under test. The test set makes calculation and reports whether

the line passed or failed.

Figure 21 Line 1 E1 ModeM.2100/550 Screen

The following are reported:

PERIOD: Identies the date and time interval of each of the

reported pass or fail results. The interval used in Figure 21 is 2

minutes. The interval can be changed in SYSTEM PARAMETERS

> MEAS CONFIGURATION, page 2, 0099 minutes.

P/F: Reports if the test passed or failed during the test period.

%ES: Percentage of M.2100 Errored Seconds since the start of

the test. An errored second is any second with a Code, Bit, Frame,

Multiframe or CRC error.

%SES: Percentage of Severely Errored Seconds since the start of

the test. An M.2100 Severely Errored Second is any second with

>10-3bit error rate, 10-3 code error, excessive frame, multiframe

or CRC bit errors, loss of frame, loss of pattern, synchronization,or loss of signal.


33/120

33Dual E1

LINE 1 and Line 2 G.826 Screens

The G.826 screen reports G.826 results.

Note:G.826 measurements must be on in SYSTEM PARAM-

ETERS > MEAS CONFIGURATION. This ITU standard speciesrequired performance characteristics of 2.048 Mbit/s lines. The

parameter definitions given in G.826 are block-based. This makes

in-service measurement convenient.

Figure 22 Line 1 E1 Mode G.826 Screen


BBE: Background Block Error is an errored block not occurring

as part of a SES.

%BBE: The percentage of errored blocks since the start of the

test, excluding all blocks during SES and unavailable time.

EB: Errored Block is a block containing one or more bit errors.

%EB: Percentage of Errored Blocks since the start of the test.

SES: A Severely Errored Second is a one second period which

contains greater or equal to 30% errored blocks.

%SES: Percentage of Severely Errored Seconds since the start

ofthe test.


34/120

34 SSMTT-27

2.4 Other Measurements

The menu screen contains, depending on ordered options:

VIEW RECEIVED DATA

VIEW CURRENT EVENT VIEW FAS WORDS

VIEW MFAS WORDS

PULSE MASK ANALYSIS

C-BIT ANALYSIS

HISTOGRAM ANALYSIS

PROPAGATION DELAY

CHANNEL LOOPBACK

2.4.1 View Received Data

VIEW RECEIVED DATA F-keys

PAGE-UP(F1), PAGE-DN(F2):

Use to view all data. Note the

PAGE number in the upper

left-hand portion of the screen.

64 pages of data are available;

which is equal to 16 frames or

one multiframe.

PAUSE(F3): Trap the current

data on the E1 line.

PRINT(F4): Send the data to

the serial port for printing.

Figure 23 View Received

Data Screen


PAGE: Indicates which of the available 64 pages of data is cur -

rently being displayed.

T/S: Species the Time Slot being viewed.

BINARY: This column shows the binary data actually being re-

ceived on the line. Each line represents the 8-bit timeslot.

HEX: This column shows the hexadecimal representation of the

8 bits being transmitted in each timeslot.

ASCII: Displays the ASCII representation of the 8-bit binary fram-

ing word which has been received.

The character displayed to the left of the parentheses repre-

sents the 8-bit framing words translated in order.

The character displayed within the parentheses representsthe 8 bits translated in reverse order.


35/120

35Dual E1

2.4.2 View Current Event

PAGE-UP PAGE-DN REFRESH more

Meas 8:21:36

EVENT RECORD

1. 2007-04-03 09:29:38

MEASUREMENT START

2. 2007-04-03 09:29:48

BERT BIT: 1

3. 2007-04-03 10:10:51

BERT BIT: 2

4.

This screen reports on all events

(date, time, type, and count of

the events) that occur duringmeasurements.

This screen can also be

accessed by pressing EVENT

(more, F3) in the Measurement

Results screens.

This feature is active when

PRINT EVENT is enabled in

SYSTEM PARAMETERS > MEAS

CONFIGURATION.

EVENT RECORD F-keys

PAGE-UP(F1), PAGE-DN(F2): Use to view all recordsREFRESH(F3): Use to refresh the screen.

PRINT(more, F1): Send the data to the serial port for printing.

SAVE F4 : Save the re ort records. See Section 2.8.

Figure 24 Event RecordScreen

2.4.3 View FAS Words

Use this to view the live presentation of E1 framing binary words.

Timeslots 0 of frames 0-15 are displayed. The presented data

refers to the Rx/DROP selection in TEST CONFIGURATION. Valid

framing is required to select this screen, see Section 4.

FAS FRAME WORD F-keys

PAUSE/RESUME (F1): Pause the presentation of data. Resume

the live FAS word display.

PRINT(F2): This is available when this screen is paused; send

the screen to the serial port for printing.

PCM-30PCM-31

Figure 25 FAS Frame Words Screens

The even frames, 0-14, contain the FAS in bits 2-8. In the left

screen of Figure 25, FAS is represented by 0011011.


36/120

36 SSMTT-27

The odd frames do not contain FAS. The top row of these frames

in the left screen of Figure 25 shows the allocation of bits 1-8 in

these frames. The gure represents an undisturbed condition.

When the framing is set for PCM-30 Multiframe (right screen inFigure 25), there is a slight variation in the odd framing bits, those

not containing the frame alignment signal. Bit 1 is used to transmit

the 6-Bit CRC-4 multiframe alignment signal and 2 CRC-4 error

indication bits. The CRC-4 multiframe alignment signal has the

form 001011. The screen shows the FAS frame words when fram-

ing is set for PCM-30. The rst bits of frames 1-11 (odd) send the

pattern 001011, the CRC-4 multiframe alignment signal.

2.4.4 View MFAS Words

Use this to view the live presentation of Timeslot 16, Frames 0-15.

TEST CONFIGURATION must be PCM-30 to access this screen. The

Rx/DROP selection in TEST CONFIGURATION provides data.MFAS WORDS F-keys

PAUSE/RESUME (F1): Pause the presentation of data; Resume

the live MFAS word display.

PRINT(F2): This is available when this screen is paused; send

the screen to the serial port for printing.

Figure 26 MFAS Frame Words Screen

In the Multiframe, timeslot 16 is used for either common channel

or channel associated signalling, as required. Please note that in

Figure 26, the template for the even frames (0000xyxx) applies

only to Frame 0. All other frames follow the template shown above

the odd frames (ABCDabcd). As seen in Figure 26, in frame 0,MFAS is 0000. The rest of the frames contain signalling channels

designated a, b, c, and d. Frame 1 contains channels 1 and 16,

frame 2 contains channels 2 and 17, and so forth until frame 15,

which contains channels 15 and 30.


37/120

37Dual E1

2.4.5 Pulse Mask Analysis

This option allows for measurement of the quality of an E1 wave-

form. The results compare favorably with pulse shape measure-

ments obtained from testing with a digital oscilloscope. The analysis is performed for any received test pattern or live

signal, and line interface mode.

The signal shape is displayed on the test sets screen.

The ITU G.703 pulse mask can be superimposed for fast

inspection.

The test set will store the present pulse shape.

Note that if an analysis is started while measurements are

running, the test set will stop the measurements. When the

analysis is complete, the test set will restart measurements.

The menu screen contains the following:

START NEW ANALYSIS VIEW LAST PULSE SHAPE

2.4.5.1 Start New Analysis

After a few seconds, the

captured pulse shape is

displayed. A PASS/FAIL

message will be displayed,

when a G.703 mask has been

imposed on the received pulse.

If the pulse meets the G.703

criteria, it passes, otherwise, it

fails. Figure 27 Pulse Shape

Analysis Screen

Pulse Shape Analysis F-keys

G.703/NO-MASK (F1): Displays the ITU G.703 mask with the

captured signal; press again to remove the G.703 mask.

RESTART(F2): Starts a new pulse shape capture and analysis.

PRINT(F3): Print the screen.

Denitions for this screen are:

Width: Pulse Width, in nanoseconds

Rise Time: In nano seconds

Fall Time: In nano secondsOvr Shoot: Percentage of overshoot

Und Shoot: Percentage of undershoot

Level: Signal level, in dB


38/120

38 SSMTT-27

2.4.5.2 View Last Pulse Shape

View the last pulse shape captured by the test set. The pulse

shape can be viewed at any time, even after the test set has

been turned off.The last pulse shape will be displayed on the screen, along with

the G.703 and PRINT F-keys.

See Section 2.4.5.1for the results denitions.

2.4.6 C-Bit Analysis

Send and receive C-Bit frames

with the C-BT ANALYSIS

screen. C-bits can also be

received and transmitted.

Note: The test set will transmit

an IDLE pattern upon entering

this screen.

Figure 28 C-Bit Analysis

Screen

Congure the following:

L1-Tx T/S or L2-Tx T/S

Options: 1-15, 17-31

Select the transmit timeslot on which to send C-bits by pressing

NEXT (F1) or PREVIUS (F2). To send C-bits on Line 2, set Tx/IN-

SERT to L2-Tx in TEST CONFIGURATION. Since PCM-30 framing

is required for this C-bit analysis, timeslot 16 cant be selected.TRANSMIT

Options; USER (F1), IDLE (F2)

This setting determines bit 2.

USER: This activates the C-bit framing and sets the program-

mable bits. To program the bits:

1. Select SEND bits.

2. At each bit, press SHIFT and use the numeric keypad to enter

either 0 or 1. The cursor automatically moves one spot to the

right once a bit is entered. When the cursor highlights a specic

bit, information about this C-bit is displayed.

L1-RxOptions: 1-15, 17-31

Select the Line receive timeslot on which to receive C-bits by

pressing NEXT (F1), or PREVIUS (F2). Since PCM-30, MFAS,

framing is required, timeslot 16 cant be selected.


39/120

39Dual E1

This screen also shows the received C-bits for Lines 1 and 2. If

C-bits are not found on a line, a C-BIT NOT FOUND is displayed

for that line.

Denitions of C-bits 2-15 are shown in Table 1.

Bit # Assignment

2 ESCAPE 0-C-Frame Active

1-C-Frame Ignored

3 2 Mb Loops 0-Subscriber

1-Network

4 Loop 2 or Loop 3 0-Subscriber

1-Network

5 Loop 2 Instruction 0-Active

1-Non-active

6 Loop 3 Instruction 0-Active

1-Non-active

7 HDB3 Command 0-Active

1-Non-active

8 Loop Acknowledge 0-Acknowledge

1-No Acknowledgement

9 Not Defined

10 Local Fault 0-Active

1-Non-active

11 Remote/Line Fault 0-Active

1-Non-active

12 C Frame Loss 0-Active

1-Non-active

13-15 Spare

Table 2 C-bit Definitions


40/120

40 SSMTT-27

2.4.7 Histogram Analysis

This menu screen contains the following:

CURRENT HISTOGRAM

SAVED HISTOGRAM FORMAT SRAM

Notes

Histogram analysis automaticity starts when E1 measurement

starts.

A SRAM memory card must be installed in the test set.

Interrupting a timed measurement to view results will cause

a new analysis to start when returning to measuring.

2.4.7.1 Format SRAM

Before using a new SRAM memory card, it must be formatted for

use with the test set. To do so follow the on-screen instructions.Press ESC to cancel the formatting.

Note: SRAM cards have mechanical erase protection, turn the

protection off to erase and format the card.

2.4.7.2 Current Histogram

The CURRENT HISTOGRAM

screen reports the start/stop

date and time.

The CURRENT date and time

correspond to the last time

MEASUREMENT RESULTS

was entered.

Figure 29 Current Histo-

gram Screen

Press VIEW (F1) to view the current histogram. Figure 30 shows

a sample screen.

Pressing STORE (F2) will erase any previously stored data.

The CURRENT histogram data is also stored, but it will be erased

the next time MEASUREMENT RESULTS is entered.

If you do not want to save the current le and erase the one

already saved, press ESC instead of ENTER at the warningmessage screen.


41/120

41Dual E1

Figure 30 Current Histogram Screen

Current Histogram F-keys

TYPE(F1): Select a measurement type.

The following error types are available:

- EBIT, CRC, FAS, MFAS, CODE: See Section 2.3.1.

- LOS: Loss of Signal

- LOF: Loss of Frame

- AIS: Alarm Indication Signal

- FASRAI: FAS Remote Alarm Indication

- MFASRAI: MFAS Remote Alarm Indication

- BERT_LOPS: Loss of Pattern Synchronization

- BERT_BIT: Bit errors

For all error types:- The history of each error type is displayed individually.

- The error type is specied in the upper portion of the

screen.

- Pressing TYPE automatically changes the type options

displayed. In Figure 30, BERT_BIT error was selected.

LINE 1/2(F2): Selects the parameters of either E1 Line 1 or E1

Line 2, depending on the setup.

ZOOM(F3): Changes the resolution to the next lower time period

at the cursor location. Select the error before pressing ZOOM.

Select a minute, hour, or day interval as your time period

JUMP(MORE, F1): Moves the display cursor 10 steps. Use to move the cursor one step at a time.

PRINT(MORE, F2): Print the results.


42/120

42 SSMTT-27

Notes:

The screen will display either the current or saved results.

Each time MEASUREMENTS RESULT is selected, the test

set will replace the le in the CURRENT HISTOGRAM data. For each le, the feature will store the most recent 24 hours

of data with a display resolution (PERIOD) of 1 minute.

For each le, the screen will store both the present 60 hours

and the previous 60 days of histogram data with a resolution

(PERIOD) of one hour.

2.4.7.3 Saved Histogram

Select the SAVED HISTOGRAM

selection screen to view, print,

or give a label to a saved

analysis. See Section 2.4.7.2

for an explanation of the data.

Figure 31 Saved HistogramSelection Screen

Histogram Selection F-keys

VIEW(F1): View the selected record.

PAGE-UP/PAGE-DN(F2): View the available histograms.

DELETE(MORE, F1): Delete a selected histogram.

LOCK/UNLOCK(MORE, F2): Lock a selected record, so that it

may not be deleted. Unlock a selected record.

LABEL (MORE, F3): Rename a selected record using the char-

acter entry screen with the following procedure:

1. Press TOGGLE (F3), then select the characters by using

. Press SELECT (F4) to enter the character into the

LABEL line.

Use INSERT (F1) and DELETE (F2) to add or remove a char-

acter.

2. Press TOGGLE (F3) when done.

3. Press ENTER to return to the SAVED HISTOGRAM screen,

where the new label is displayed.CLR-ALL(MORE, F1): Delete all unlocked records.


43/120

43Dual E1

2.4.8 Propagation DelayThis screen allows for viewing

the propagation delay of a loop

back signal at a full or Nx64 rate.The test set measures the

number of unit intervals it takes

for the signal to return. A unit

interval is the amount of time it

takes to transmit one bit (488 ns

for a E1 signal). This number is

translated into the number of

microsecondsofroundtripdelay.Figure 32 Propagation

Delay Screen

PROPAGATION DELAY F-keys

CALIB(F2): If more than one piece of looped equipment is on the

line, the test set will recalibrate to allow viewing the propagation

delay between two devices, not including the test set. OFFSET

then indicates the delay between the two pieces of equipment

(removing the test set to Equipment 1 measurement). Press again

to take measurements further down the line.

RESTART(F1): Stop and restart the test.

2.4.9 Channel Loopback

Use the V.54 CHANNEL LOOP-

BACK screen to set up a far

end loop to perform measure-

ments of V.54 datacom circuits.

A loopback can locate the faults

in the circuit by setting the far

end modem to loop, allowing for

measurements. The test set can

activate or deactivate the near

end device by sending the proper

T1 E1.2/94-003 standard code;

LOOP-UP (F1) or LOOP-DN (F2).

Figure 33 V.54 Channel

Loopback Screen

Figure 34 V.54 Application


44/120

44 SSMTT-27

2.5 VF Channel Access

This menu performs a variety of talk/listen functions.

Note: Do not attempt to enter VF CHANNEL ACCESS if the

FRAME LED is not green. A green LED indicates that the framingfound on the received signal matches the framing selected in TEST

CONFIGURATION. It is impossible to talk, listen, or perform other

channelized functions in the absence of frame synchronization,

since channels can be identied only within a framed signal.

The menu contains the following items:

VF & NOISE MEASUREMENT

VIEW LINE CAS

CALL ANALYSIS

CALL EMULATOR

SUPERVISION SETUP

DIAL PARAMETERS SIGNAL MEANINGS

VIEW/STORE/PRINT (see Section 2.8)

Note: During VF CHANNEL ACCESS, when TEST CONFIGU-

RATION-TxSOURCE is set to TESTPAT, idle channel code and

signalling (A/B/C/D bits) will be inserted into the unselected chan-

nels. The idle channel code and signal can be programmed from:

E1 MAIN MENU > SYSTEM PARAMETERS > MEAS CONFIGU-

RATION-IDLE CHNL CODE and IDLE CHNL A/B/C/D lines.

2.5.1 VF & Noise Measurement

This screen allows choosing:

which channel to test for both transmitting and receiving

whether to talk, send a tone, or place quiet termination on the

transmit signal

the transmitted frequency and level

which signalling bits to send

to listen on both or either line

It also reports:

the received signalling bits

the received 8-bit data

the received frequency and level

noise measurements on the received frequency

Note: There are some differences in setting up for E1SINGL orE1DUAL mode.


45/120

45Dual E1

Figure 35 VF Measurements E1 Dual Setup Screen

Figure 35 is an example of an E1DUAL conguration. Tx-1 is setfor timeslot 01. Tx is Line 1, since Tx/INSERT was set for Line 1 in

TEST CONFIGURATION. To insert on Line 2 (and consequently

see Tx-2 on this screen), select Tx/INSERT: L2-TX in TEST CON-

FIGURATION. Tx of the other line will be in loop mode.

Rx-1/2 shows the selected receive timeslot for each line. The

MEASUREMENT RESULTS come from the IN/DROP selection

further down this menu.

Tx-T/S (E1SINGL)or Tx-1 (E1DUAL)

Options: 1-31

Choose the transmit timeslot.

Press NEXT (F1) or PREVIUS (F2) as needed. Tx-1 normally should be the same as the Rx-1, but you do

have the option to set them for different channels.

Upon selecting a timeslot, approximately three seconds pass

before actually inserting on the timeslot.

Rx-1 (E1SINGL)or Rx-1/2 T/S (E1DUAL)

Options: 1-31

Choose the receive timeslot for E1 Line 1 (E1SINGL mode) or

E1 Lines 1 and 2 (E1DUAL mode) by pressing NEXT (F1) or

PREVIUS (F2).

To receive on Line 2, select L2-Rx for the DROP item.

TxABCD

Options: IDLE (F1), SEIZE (F2), manually set

Change the signalling bits transmitted with the associated transmit

channel. These bits will be transmitted only if the test set is using

MFAS (PCM-30) framing.


46/120

46 SSMTT-27

Pressing IDLE (F1) or SEIZE (F2) will place that signal onto

the A/B/C/D position. Program the IDLE or SEIZE signal in VF

CHANNEL ACCESS > SUPERVISION SETUP.

To change these bits manually:1. Press SHIFT and use the keypad to enter the signalling bits.

2. Press ENTER to send the ABCD bits.

IN/DROP(E1DUAL)

Options: L1 (F1), L2 (F2)

Determine on which line to Insert and Drop the signal.

Insert determines the line the test signal is inserted.

Drop determines which line will report the measurements.

TxMode

Options: THRU (F1), TALK (F2), QUIET (F3), TONE (F4)

THRU: Use to pass all of the received channels out on the

transmit signal. TALK: Use to talk on the selected transmit channel; the test

set will transmit speech from the microphone.

QUIET: Use to place a quiet termination on the transmit sig-

nal.

TONE: Use to insert a tone on the selected transmit channel.

If you select TONE, use the next two settings to set the tone

frequency and level.

TxFREQ

Options: 50-3950 Hz

If TONE is selected for TxMode, choose the tone frequency by

pressing SHIFT and entering the value from the keypad.

TxLVL

Options: -60 to 3 dBm

If TONE is selected for TxMode, choose the transmit tone level

by pressing SHIFT and entering the value from the keypad. You

may select any value from -60 to +3 dBm. Press MINUS (F1) to

achieve negative values.

Speaker(E1DUAL)

Options: L1 (F1), L2 (F2), L1+L2 (F3)

Select the line you want to hear on the speaker.

L1: Use to listen on Line 1.

L2: Use to listen on Line 2.

L1+L2: Use to listen on both lines.


47/120

47Dual E1

Measurement Results

The following items pertain to received data. As the equals sign

indicates, they are for viewing only.

RxFREQView the received frequency of the selected channel in Hz.

Rx(dBm)

View the received level in dBm.

RxABCD

View the received CAS (Channel Associated Signalling System)

bits.

Note:These bits are meaningful only if the FRAME LED is green.

Ignore these bits if this LED is not green.

S/N (dB)

Observe the Signal to Noise measurement, in decibels. This

measurement is updated every second.3K (dBm)

Observe the Noise 3-K Flat measurement, in dBm. This measure-

ment is updated every second.

OFFSET

Observe the coder offset.

PEAK

Observe the coder peak from +127 to -127, using A-law.

RxDATA

View the live 8-bit channel data as it is received from the selected

line.

PSOP (dBm)Observe the Noise Psophometric* measurement in dBm. This

measurement is updated every second.

*A noise weighting method established by the ITU-T, designated

as CCIF-1951 weighting, for use in a noise measuring set or

psophometer.

1010 (dBm)

Observe the Noise 1010 Hz measurement, in dBm. This measure-

ment is updated every second.


48/120

48 SSMTT-27

2.5.2 View Line CAS

This screen allows for viewing of the signalling bits for all 30 chan-

nels for either Line 1 (E1SINGL) or Lines 1 and 2 (E1DUAL).

In order to do this: Select PCM-30 framing in TEST CONFIGURATION.

The FRAMING LED must be green in order for the signalling

bits to be displayed.

Timeslots 1-5 are shown on the rst line, 6-10 are shown in the

second line, etc. Figure 36 is a sample screen.

Figure 36 View Line 1 and 2 CAS Screen

Press STATUS (F1) to see a decode of each ABCD state. Informa-

tion will be displayed when a match of state for forward/backward

conditions are met, as specied in the SUPERVISION SETUP

screen. Here are the definitions:

IDLE = IDLE

SEIZ = SEIZE

ACKW = SEIZE ACKNOWLEDGMENT

ANSW = ANSWER

CLRB = CLEAR BACK

CLFR = CLEAR FORWARD

BLCK = BLOCK

???? = UNKNOWN; no state or no match detected

Note: Some states will change too quickly for the test set to display

and detect. Therefore, only constant states which are detectedwhen the screen is refreshed will be displayed.

Press ABCD (F1) to return to the ABCD information.


49/120

49Dual E1

2.5.3 Call Analysis

This feature allows the test set

to monitor the digits and states

sent between two pieces of

equipment. To use this feature:

The test set must be in

E1DUAL mode, using

PCM-30 or PCN-31 framing.

Supervision setup must be

precisely setup for the

analysis.

The test set must see a

Seize and a Seize Acknowl-

edgment before it will

capture digits.

The SRAM card will bereformatted upon entering

CALL ANALYSIS.

Configure the following refer-

encing the screens shown in

Figures 37 and 38:

Figure 37 Call Analysis

Setup Screen

Figure 38 Call Analysis

Setup Screen with Trigger

TYPE

Options: MFR1SS5 (F1), MFR2 (F2), DTMF (F3), PULSE (F4)

Select the type of signal to be analyzed.

MFR1SS5: to analyze SS5 signalling.

MFR2: to analyze MFR2 and MFR2 compelled signalling.

DTMF: to analyze DTMF signalling. PULSE: to analyze Pulse signalling.

Rx-1 T/S

Options: 1-31, or AUTO (F3)-MFR2, DTMF or PULSE only

Select the Line 1 timeslot to receive the signal by pressing NEXT

(F1), PREVIUS (F2) or AUTO.

If AUTO is used, the test set scans all channels for the TRIG-

GER event (line 4). Two additional choices will then be available;

TRIGGER and SUPERVISION/ABCD.

Rx-2 T/S

Options: 1-31, or AUTO (F3)-MFR2, DTMF or PULSE only

Select the Line 2 timeslot to receive the signal on by pressingNEXT (F1), PREVIUS (F2), or AUTO.

If AUTO is used, the test set will scan for the Line 2 receive

timeslot. Two additional choices will then be available; TRIG-

GER and SUPERVISION/ABCD.


50/120

50 SSMTT-27

TRIGGER(available if RX T/S set to AUTO, shown in Figure 38)

Options: CAS (F1), STATE (F2)

CAS: Have the test set start capturing after it detects specic

CAS bits. An ABCD line will appear in place of SUPERVISION.Use the SHIFT and numeric keypad to enter the bits to match.

When the test set sees the set ABCD bits, they are displayed.

STATE: Have the test set begin capturing information after it

sees the selected state.

SUPERVISION (STATE only, shown in Figure 38)

Options: IDLE (F1), SEIZE (F2), ACKW (F3), ANSW (MORE, F2),

CLR-BK (MORE, F2), CLR-FW (MORE, F2), BLOCK (MORE, F1)

Determine the signal trigger state that must be met for the test

set to start capturing.

IDLE looks for an idle signal.

SEIZE looks for a seizure. ACKW looks for a backward seize acknowledgment.

ANSW looks for an answer signal.

CLR-BK looks for a Clear-Back signal.

CLR-FW looks for a Clear-Forward signal.

BLOCK looks for a Block signal.

When nished, press ENTER to observe the real-time analysis.

Examples are shown in Figure 39 with the following F-keys:

STOP/RESTART (F1): Stop the analysis and restart it.

ABSOLUT(F2): Shows timestamps in absolute mode; the abso-

lute time since start.

RELATIV(F3): Shows timestamps in relative mode; the time rela-

tive to the last change.

Figure 39 shows a DTMF analysis screen on the left and a MFR2

analysis screen on the right.

Figure 39 Call Analysis Screens


51/120

51Dual E1

The following F-keys are available after pressing STOP:

PAGE-UP(F1)/PAGE-DN(F2): Page up/down one page.

ANALYZE(F3): Analyzes the digits; see Section 2.5.3.1.

RESTART(MORE, F1): Restarts the analysis.

ABSOLUT(MORE, F2): Shows timestamps in Absolute mode;

the absolute time since start.

RELATIV(MORE, F2): Shows timestamps in Relative mode; the

time relative to the last change. Toggle between the ABSOLUT

and RELATIV modes to see the timestamp for each.

PRINT(MORE, F1): Send the results to the serial port.

SAVE(MORE, F1): Save the results; see Section 2.8.

Notes:

When SS5 is selected (MFR1SS5), the SS5 tones will be

detected. The Label decode will be supplied automatically.

When MFR2 is selected, MFR2 tones will be detected, andthe choices will appear. Line 1 Rx is always in the Forward

direction, and Line 2 Rx is in the backward direction.

To differentiate between CAS line signalling and PULSE digits

in the PULSE CALL ANALYSIS, PULSE will be displayed

before a detected pulse digit sequence of IDLE/SEIZE.


52/120

52 SSMTT-27

2.5.3.1 Digit Analysis

To access this function, press STOP (F1) in CALL ANALYSIS, then

press ANALYZE (F3), and the analysis screen is displayed.

Digit Analysis will record the last 32 digits for analysis whenthe analysis is stopped.

If a TRIGGER is set (in CALL ANALYSIS), then up to 32 digits

from the stopping point back to the trigger points will be stored

and analyzed.

The following is reported in this

CALL ANALYSIS screen:

H/L Hz: The high and low

frequencies of the digit, in Hz.

dBm: The dBm level.

INTD: Interdigit periodthe time

between digits.

PERD: The dial period.

TWIST: Difference between the

two frequencies. Figure 40 DTMF Digit

Analysis Screen

This CALL ANALYSIS screen

reports the following:

PPS: Pulses per second

PPRD: Pulse Period

CALL ANALYSIS F-keys

LINE-1/2(F3): Toggle between

the lines.

RETURN(F4): Return to the

CALL ANALYSIS screen.Figure 41 Pulse DigitAnalysis Screen


53/120

53Dual E1

2.5.4 Call Emulator

Use this feature to place and receive calls. Select one of the 10

predefined sequences, or input a user defined sequence.

Notes: To run the user call emulator, press START (F4) in USER CALL

EMULATOR. If you escape from the menu to CALL EMULA-

TOR, then press START (F4), you will be running the Q.441

specication instead of the one you dened.

When you edit your own sequence, no default Q.441 timer

value will be provided for PERD (periodic timer). You need to

enter a value according to the Q.441 specication or any other

desired value to make the sequence work.

2.5.4.1 Standard Emulations

Use the screen to the right toselect a standard emulation to

place a call.

Figure 42 Call Emulator

List Screen

Call Emulator List F-keys

USER (F1): Enter USER CALL EMULATOR to create, edit, or use

a User emulation sequence. See Section 2.5.4.4.

VIEW(F2): View a screen which

shows a sample sequence of

the selected emulation. Figure

45 shows a DTMF sequence.

Note that for DTMF RECEIVE,

the RECEIVE side is only

emulated.

START(F4): Start the selected

emulation as shown in the

DTMF TRACER screen.

Figure 43 DTMF Receive

Sequence Screen


54/120

54 SSMTT-27

2.5.4.2 Place a Call

For call emulation, use the

screen shown to the right to

setup and place a call.

Use this procedure to setup the

call:

Figure 44 Q.441 MFCR2Call Setup Screen

1. CHANNEL: Choose a timeslot to place the call on. Select from

1-15, 17-31 by using NEXT (F1) and PREVIUS (F2).

2. CALL NUMBER: Press SHIFT and use the numeric keypad

to enter the digits for the number to call. The A-F keys, cor-responding to the digits, are also available.

For some emulation sequences the following items will also

be available to configure:

3. CALLING NUMBER: This is the number you are dialing from.

Use the SHIFT and number keys to enter the digits.

4. CALLING PARTYS CATEGORY: This deals with the category

of the calling party as dened by Q.441 (or user dened by

the Signal Meanings) Forward Group II, i.e. the user can be

a subscriber without priority II-1, subscriber with priority II-2,

etc. Use SHIFT and keypad number keys to enter the digits.

5. Press CALL (F4) when ready to place the call. The appropriate

CALL screen is then displayed, as in Figure 45.

The following is reported:

Time/s: Time sent; the time the

digits were sent.

Send: The CAS or Register

signalling sent.

Recv: The CAS or Register

signalling received.

Label: Sent or received CAS or

Register signalling meanings,

as defined by Supervision

Documents

MAN-22060-US002_C00_SSMTT-27_Dual_E1_MMD