LTC2217 - 16-Bit, 105Msps Low Noise ADC - analog.com · VID Differential Input Voltage (Note 7) 0.2 V VICM Common Mode Input Voltage Internally Set ... VOH High Level Output Voltage

LTC2217

12217f

2217 TA01b

–130–120–110–100

–90–80–70–60–50–40–30–20–10

0

FREQUENCY (MHz)

AMPL

ITUD

E (d

BFS)

0 10 30 4020 50

TYPICAL APPLICATION

APPLICATIONS

16-Bit, 105Msps Low Noise ADC

The LTC®2217 is a 105Msps sampling 16-bit A/D converter designed for digitizing high frequency, wide dynamic range signals with input frequencies up to 400MHz. The input range of the ADC is fi xed at 2.75VP-P.

The LTC2217 is perfect for demanding communications applications, with AC performance that includes 81.3dBFS Noise Floor and 100dB spurious free dynamic range (SFDR). Ultra low jitter of 85fsRMS allows undersampling of high input frequencies while maintaining excellent noise performance. Maximum DC specifi cations include ±3.5LSB INL, ±1LSB DNL (no missing codes).

The digital output can be either differential LVDS or single-ended CMOS. There are two format options for the CMOS outputs: a single bus running at the full data rate or demultiplexed buses running at half data rate. A separate output power supply allows the CMOS output swing to range from 0.5V to 3.6V.

The ENC+ and ENC– inputs may be driven differentially or single-ended with a sine wave, PECL, LVDS, TTL or CMOS inputs. An optional clock duty cycle stabilizer al-lows high performance at full speed with a wide range of clock duty cycles.

■ Telecommunications■ Receivers■ Cellular Base Stations■ Spectrum Analysis■ Imaging Systems■ ATE

■ Sample Rate: 105Msps■ 81.3dBFS Noise Floor■ 100dB SFDR■ SFDR >90dB at 70MHz■ 85fsRMS Jitter■ 2.75VP-P Input Range■ 400MHz Full Power Bandwidth S/H■ Optional Internal Dither■ Optional Data Output Randomizer■ LVDS or CMOS Outputs■ Single 3.3V Supply■ Power Dissipation: 1.19W■ Clock Duty Cycle Stabilizer■ Pin Compatible with LTC2208■ 64-Pin (9mm × 9mm) QFN Package

, LT, LTC and LTM are registered trademarks of Linear Technology Corporation.All other trademarks are the property of their respective owners. Patents Pending.

64k Point FFT, FIN = 4.9MHz, –1dBFS

–

+S/HAMP

CORRECTIONLOGIC AND

SHIFT REGISTER

OUTPUTDRIVERS

16-BITPIPELINEDADC CORE

INTERNAL ADCREFERENCEGENERATOR

1.575VCOMMON MODEBIAS VOLTAGE

CLOCK/DUTYCYCLE

CONTROL

D15•••

D0

SHDN DITH MODE LVDS RAND

VCM

ANALOGINPUT

2217 TA01

CMOSORLVDS

0.5V TO 3.6V

3.3V

3.3V

SENSE

OGND

OVDD

2.2μF 1μF

1μF 1μF 1μF

VDD

GND

ADC CONTROL INPUTS

AIN+

ENC +

AIN–

ENC –

OFCLKOUT

FEATURES DESCRIPTION

LTC2217

22217f

The ● denotes the specifi cations which apply over the full operating temperature range, otherwise specifi cations are at TA = 25°C. (Note 4)

Supply Voltage (VDD) ................................... –0.3V to 4VDigital Output Ground Voltage (OGND) ........ –0.3V to 1VAnalog Input Voltage (Note 3) ..... –0.3V to (VDD + 0.3V) Digital Input Voltage .................... –0.3V to (VDD + 0.3V)Digital Output Voltage ................–0.3V to (OVDD + 0.3V)Power Dissipation ............................................ 2000mWOperating Temperature Range LTC2217C ................................................ 0°C to 70°C LTC2217I .............................................–40°C to 85°CStorage Temperature Range ..................–65°C to 150°CDigital Output Supply Voltage (OVDD) .......... –0.3V to 4V

OVDD = VDD (Notes 1 and 2)

PIN CONFIGURATIONABSOLUTE MAXIMUM RATINGSTOP VIEW

65

SENSE 1GND 2VCM 3GND 4VDD 5VDD 6GND 7AIN+ 8AIN– 9

GND 10GND 11

ENC+ 12ENC– 13GND 14VDD 15VDD 16

48 D11+/DA6 47 D11–/DA5 46 D10+/DA4 45 D10–/DA344 D9+/DA2 43 D9–/DA142 D8+/DA041 D8–/CLKOUTA40 CLKOUT+/CLKOUTB 39 CLKOUT–/OFB38 D7+/DB1537 D7–/DB1436 D6+/DB1335 D6–/DB1234 D5+/DB1133 D5–/DB10

64 N

C63

RAN

D62

MOD

E61

LVD

S60

OF+ /O

FA59

OF– /D

A15

58 D

15+ /D

A14

57 D

15/D

A13

56 D

14+ /D

A12

55 D

14–– /D

A11

54 D

13+ /D

A10

53 D

13– –/D

A952

D12

+ /DA8

51 D

12/D

A750

OGN

D49

OV D

D

V DD

17GN

D 18

SHDN

19

DITH

20

D0– /D

B0 2

1DO

+ /DB1

22

D1– /D

B2 2

3D1

+ /DB3

24

D2– /D

B4 2

5D2

+ /DB5

26

D3– /D

B6 2

7D3

+ /DB7

28

D4– /D

B8 2

9 D

4+ /DB9

30

OGN

D 31

OV D

D 32

TJMAX = 150°C, θJA = 20°C/WEXPOSED PAD (PIN 65) IS GND, MUST BE SOLDERED TO PCB

ORDER INFORMATIONLEAD FREE FINISH TAPE AND REEL PART MARKING PACKAGE DESCRIPTION TEMPERATURE RANGE

LTC2217CUP#PBF

LTC2217IUP#PBF

LTC2217CUP#TRPBF

LTC2217IUP#TRPBF

LTC2217UP

LTC2217UP

64-Lead (9mm × 9mm) Plastic QFN


0°C to 70°C

–40°C to 85°C

LEAD BASED FINISH TAPE AND REEL PART MARKING PACKAGE DESCRIPTION TEMPERATURE RANGE

LTC2217CUP

LTC2217IUP

LTC2217CUP#TR

LTC2217IUP#TR

LTC2217UP

LTC2217UP



0°C to 70°C

–40°C to 85°C

Consult LTC Marketing for parts specifi ed with wider operating temperature ranges.

For more information on lead free part marking, go to: http://www.linear.com/leadfree/ For more information on tape and reel specifi cations, go to: http://www.linear.com/tapeandreel/

CONVERTER CHARACTERISTICS

PARAMETER CONDITIONS MIN TYP MAX UNITS

Integral Linearity Error Differential Analog Input (Note 5) TA = 25°C ±1.3 ±3.5 LSB

Integral Linearity Error Differential Analog Input (Note 5) ● ±1.3 ±4 LSB

Differential Linearity Error Differential Analog Input ● 0.18/–0.22 ±1 LSB

Offset Error (Note 6) ● ±1.3 ±6 mV

Offset Drift ±4 μV/°C

Gain Error External Reference ● ±0.3 ±1 %FS

Full-Scale Drift Internal ReferenceExternal Reference

–65±12

ppm/°C

ppm/°C

Transition Noise External Reference 2 LSBRMS

LTC2217

32217f

The ● denotes the specifi cations which apply over the full operating temperature range, otherwise specifi cations are at TA = 25°C. (Note 4)ANALOG INPUT

SYMBOL PARAMETER CONDITIONS MIN TYP MAX UNITS

VIN Analog Input Range (AIN+ – AIN

–) 3.135V ≤ VDD ≤ 3.465V 2.75 VP-P

VIN, CM Analog Input Common Mode Differential Input (Note 7) ● 1.2 1.575 1.8 V

IIN Analog Input Leakage Current 0V ≤ AIN+, AIN

– ≤ VDD ● –1 1 μA

ISENSE SENSE Input Leakage Current 0V ≤ SENSE ≤ VDD ● –3 3 μA

IMODE MODE Pin Pull-Down Current to GND 10 μA

ILVDS LVDS Pin Pull-Down Current to GND 10 μA

CIN Analog Input Capacitance Sample Mode ENC+ < ENC–

Hold Mode ENC+ > ENC–9.11.8

pFpF

tAP Sample-and-HoldAcquisition Delay Time

0.35 ns

tJITTER Sample-and-HoldAperture Jitter

85 fs RMS

CMRR Analog InputCommon Mode Rejection Ratio

1.2V < (AIN+ = AIN

–) <1.8V 80 dB

BW-3dB Full Power Bandwidth RS < 25Ω 400 MHz

The ● denotes the specifi cations which apply over the full operating temperature range, otherwise specifi cations are at TA = 25°C. AIN = –1dBFS with 2.75V range unless otherwise noted. (Note 4)DYNAMIC ACCURACY


SNR Signal-to-Noise Ratio 5MHz Input 81.2 dBFS

15MHz Input, TA = 25°C15MHz Input ●

80.480.1

81.180.7

dBFSdBFS

30MHz Input, TA = 25°C 81.1 dBFS


79.679.3

80.480.1

dBFSdBFS

140MHz Input 78.8 dBFS

SFDR Spurious FreeDynamic Range2nd or 3rd Harmonic

5MHz Input 100 dBc


8887

10099

dBc dBc

30MHz Input 95 dBc


8583

9288

dBc dBc

140MHz Input 85 dBc

SFDR Spurious Free Dynamic Range4th Harmonic or Higher

5MHz Input 105 dBc

15MHz Input ● 93 105 dBc

30MHz Input 105 dBc

70MHz Input ● 93 103 dBc

140MHz Input 95 dBc

LTC2217

42217f


S/(N+D) Signal-to-NoisePlus Distortion Ratio



79.979.7

8180.6

dBFSdBFS



78.778.2

8079.5

dBFSdBFS


SFDR Spurious Free Dynamic Rangeat –25dBFSDither “OFF”

5MHz Input 105 dBFS

15MHz Input 105 dBFS




SFDR Spurious Free Dynamic Rangeat –25dBFSDither “ON”

5MHz Input 115 dBFS

15MHz Input ● 100 115 dBFS




IMD Intermodulation Distortion fIN1 = 14MHz, fIN2 = 21MHz, –7dBFSfIN1 = 67MHz, fIN2 = 74MHz, –7dBFS

10090

dBcdBc

The ● denotes the specifi cations which apply over the full operating temperature range, otherwise specifi cations are at TA = 25°C. AIN = –1dBFS with 2.75V range unless otherwise noted. (Note 4)DYNAMIC ACCURACY

The ● denotes the specifi cations which apply over the full operating temperature range, otherwise specifi cations are at TA = 25°C. (Note 4)COMMON MODE BIAS CHARACTERISTICS

PARAMETER CONDITIONS MIN TYP MAX UNITS

VCM Output Voltage IOUT = 0 1.475 1.575 1.675 V

VCM Output Tempco IOUT = 0 ±60 ppm/°C

VCM Line Regulation 3.135V ≤ VDD ≤ 3.465V 2.4 mV/ V

VCM Output Resistance | IOUT | ≤ 0.8mA 1.1 Ω

LTC2217

52217f

The ● denotes the specifi cations which apply over the full operating temperature range, otherwise specifi cations are at TA = 25°C. (Note 4)DIGITAL INPUTS AND DIGITAL OUTPUTS


Encode Inputs (ENC+, ENC–)

VID Differential Input Voltage (Note 7) ● 0.2 V

VICM Common Mode Input Voltage Internally SetExternally Set (Note 7) 1.2

1.63

VV

RIN Input Resistance (See Figure 2) 6 kΩ

CIN Input Capacitance (Note 7) 3 pF

Logic Inputs

VIH High Level Input Voltage VDD = 3.3V ● 2 V

VIL Low Level Input Voltage VDD = 3.3V ● 0.8 V

IIN Digital Input Current VIN = 0V to VDD ● ±10 μA

CIN Digital Input Capacitance (Note 7) 1.5 pF

LOGIC OUTPUTS (CMOS MODE)

OVDD = 3.3V

VOH High Level Output Voltage VDD = 3.3V IO = –10μA

IO = –200μA ● 3.1

3.299

3.29

V

V

VOL Low Level Output Voltage VDD = 3.3V IO = 160μA

IO = 1.6mA ●

0.01

0.10 0.4

V

V

ISOURCE Output Source Current VOUT = 0V –50 mA

ISINK Output Sink Current VOUT = 3.3V 50 mA

OVDD = 2.5V

VOH High Level Output Voltage VDD = 3.3V IO = –200μA 2.49 V

VOL Low Level Output Voltage VDD = 3.3V IO = 1.60mA 0.1 V

OVDD = 1.8V

VOH High Level Output Voltage VDD = 3.3V IO = –200μA 1.79 V

VOL Low Level Output Voltage VDD = 3.3V IO = 1.60mA 0.1 V

LOGIC OUTPUTS (LVDS MODE)

STANDARD LVDS

VOD Differential Output Voltage 100Ω Differential Load ● 247 350 454 mV

VOS Output Common Mode Voltage 100Ω Differential Load ● 1.125 1.2 1.375 V

Low Power LVDS

VOD Differential Output Voltage 100Ω Differential Load ● 125 175 250 mV

VOS Output Common Mode Voltage 100Ω Differential Load ● 1.125 1.2 1.375 V

LTC2217

62217f


VDD Analog Supply Voltage (Note 8) ● 3.135 3.3 3.465 V

PSHDN Shutdown Power SHDN = VDD 17 mW

Standard LVDS Output Mode

OVDD Output Supply Voltage (Note 8) ● 3 3.3 3.6 V

IVDD Analog Supply Current ● 365 430 mA

IOVDD Output Supply Current ● 75 90 mA

PDIS Power Dissipation ● 1450 1716 mW

Low Power LVDS Output Mode

OVDD Output Supply Voltage (Note 8) ● 3 3.3 3.6 V


IOVDD Output Supply Current ● 42 50 mA


CMOS Output Mode

OVDD Output Supply Voltage (Note 8) ● 0.5 3.6 V



POWER REQUIREMENTS The ● denotes the specifi cations which apply over the full operating temperature range, otherwise specifi cations are at TA = 25°C. AIN = –1dBFS unless otherwise noted. (Note 4)


fS Sampling Frequency (Note 8) ● 1 105 MHz

tL ENC Low Time Duty Cycle Stabilizer Off (Note 7)

Duty Cycle Stabilizer On (Note 7)

●

●

4.52

3.1

4.762

4.762

500

500

ns

ns

tH ENC High Time Duty Cycle Stabilizer Off (Note 7)

Duty Cycle Stabilizer On (Note 7)

●

●

4.52

3.1

4.762

4.762

500

500

ns

ns

LVDS Output Mode (Standard and Low Power)

tD ENC to DATA Delay (Note 7) ● 1.3 2.5 3.8 ns

tC ENC to CLKOUT Delay (Note 7) ● 1.3 2.5 3.8 ns

tSKEW DATA to CLKOUT Skew (tC-tD) (Note 7) ● –0.6 0 0.6 ns

tRISE Output Rise Time 0.5 ns

tFALL Output Fall Time 0.5 ns

Data Latency Data Latency 7 Cycles

CMOS Output Mode

tD ENC to DATA Delay (Note 7) ● 1.3 2.7 4 ns

tC ENC to CLKOUT Delay (Note 7) ● 1.3 2.7 4 ns

tSKEW DATA to CLKOUT Skew (tC-tD) (Note 7) ● –0.6 0 0.6 ns

Data Latency Data Latency Full Rate CMOSDemuxed

77

CyclesCycles

The ● denotes the specifi cations which apply over the full operating temperature range, otherwise specifi cations are at TA = 25°C. (Note 4)TIMING CHARACTERISTICS

LTC2217

72217f

TIMING DIAGRAM

Note 1: Stresses beyond those listed under Absolute Maximum Ratings

may cause permanent damage to the device. Exposure to any Absolute

Maximum Rating condition for extended periods may affect device

reliability and lifetime.

Note 2: All voltage values are with respect to GND, with GND and OGND

shorted (unless otherwise noted).

Note 3: When these pin voltages are taken below GND or above VDD, they

will be clamped by internal diodes. This product can handle input currents

of greater than 100mA below GND or above VDD without latchup.

Note 4: VDD = 3.3V, fSAMPLE = 105MHz, LVDS outputs, differential ENC+/

ENC– = 2VP-P sine wave with 1.6V common mode, input range = 2.75VP-P

with differential drive, unless otherwise specifi ed.

Note 5: Integral nonlinearity is defi ned as the deviation of a code from a “best

fi t straight line” to the transfer curve. The deviation is measured from the

center of the quantization band.

Note 6: Offset error is the offset voltage measured from –1/2LSB when the

output code fl ickers between 0000 0000 0000 0000 and 1111 1111 1111

1111 in 2’s complement output mode.

Note 7: Guaranteed by design, not subject to test.

Note 8: Recommended operating conditions.

LVDS Output Mode TimingAll Outputs are Differential and Have LVDS Levels

tH

tD

tC

tL

N – 7 N – 6 N – 5 N – 4 N – 3

ANALOGINPUT

ENC–

ENC+

CLKOUT–

CLKOUT+

D0-D15, OF

2217 TD01

tAPN + 1

N + 2

N + 4

N + 3N

ELECTRICAL CHARACTERISTICS

LTC2217

82217f

tH

tD

tD

tC

tL

N – 8 N – 6 N – 4

N – 7 N – 5 N – 3

ENC–

ENC+

CLKOUTA

CLKOUTB

DA0-DA15, OFA

DB0-DB15, OFB

2217 TD03

tAP

ANALOGINPUT

N + 1

N + 2

N + 4

N + 3N

tAP

ANALOGINPUT

tH

tD

tC

tL

N – 7 N – 6 N – 5 N – 4 N – 3

ENC–

ENC+

CLKOUTA

CLKOUTB

DA0-DA15, OFA

DB0-DB15, OFB2217 TD02

HIGH IMPEDANCE

N + 1

N + 2

N + 4

N + 3N

Demultiplexed CMOS Output Mode TimingAll Outputs are Single-Ended and Have CMOS Levels

Full-Rate CMOS Output Mode TimingAll Outputs are Single-Ended and Have CMOS Levels

TIMING DIAGRAMS

LTC2217

92217f

2217 G07

–130–120–110–100–90–80–70–60–50–40–30–20–10

0

0 10 20 30 40 50FREQUENCY (MHz)

AMPL

ITU

DE

(dBF

S)

2217 G08

–130–120–110–100–90–80–70–60–50–40–30–20–10

0

0 10 20 30 40 50FREQUENCY (MHz)

AMPL

ITU

DE

(dBF

S)

2217 G09

–130–120–110–100–90–80–70–60–50–40–30–20–10

0

0 10 20 30 40 50FREQUENCY (MHz)

AMPL

ITU

DE

(dBF

S)

–2.0

–1.5

–1.0

–0.5

0.0

0.5

1.0

1.5

2.0

0 16384 32768 49152 65536OUTPUT CODE

INL

ERRO

R (L

SB)

2217 G01

–2.0

–1.5

–1.0

–0.5

0.0

0.5

1.0

1.5

2.0

0 16384 32768 49152 65536OUTPUT CODE

INL

ERRO

R (L

SB)

2217 G02

–1.0

–0.8

–0.6

–0.4

–0.2

0.0

0.2

0.4

0.6

0.8

1.0

0 16384 32768 49152 65536OUTPUT CODE

DNL

ERRO

R (L

SB)

2217 G03

Integral Nonlinearity (INL) vs Output Code - Dither “Off“

Integral Nonlinearity (INL) vs Output Code - Dither “On“

64k Point FFT, fIN = 15.1MHz, –1dBFS


64k Point FFT, fIN = 15.1MHz, –20dBFS, Dither “Off”

AC Grounded Input Histogram

TYPICAL PERFORMANCE CHARACTERISTICS

64k Point 2-Tone FFT,fIN = 14.25MHz and 21.5MHz, –7dBFS

64k Point FFT, fIN = 15.1MHz, –20dBFS, Dither “On”

Differential Nonlinearity (DNL) vs Output Code

2217 G04

0

2000

4000

6000

8000

10000

12000

14000

32736 32745 32754OUTPUT CODE

COUN

T

2217 G05

–130–120–110–100

–90–80–70–60–50–40–30–20–10

0

0 10 20 30 40 50FREQUENCY (MHz)

AMPL

ITU

DE

(dBF

S)

2217 G06

–130–120–110–100–90–80–70–60–50–40–30–20–10

0

0 10 20 30 40 50FREQUENCY (MHz)

AMPL

ITU

DE

(dBF

S)

LTC2217

102217f

SNR vs Input Level, fIN = 15.2MHz64k Point FFT, fIN = 28.7MHz, –1dBFS




SFDR vs Input Level, fIN = 15.2MHz, Dither “On”



SFDR vs Input Level, fIN = 15.2MHz, Dither “Off”

64k Point 2-Tone FFT,fIN = 14.25MHz and 21.5MHz, –25dBFS, Dither “On”

–130–120–110–100–90–80–70–60–50–40–30–20–10

0

0 10 20 30 40 50FREQUENCY (MHz)

AMPL

ITU

DE

(dBF

S)

2217 G10

30

40

50

60

70

80

90

100

110

120

130

140

–80 –70 –60 –50 –40 –30 –20 –10 0INPUT LEVEL (dBFS)

SFD

R(d

BcAN

DdB

FS)

2217 G11

–80 –70 –60 –50 –40 –30 –20 –10 030

40

50

60

70

80

90

100

110

120

130

140

INPUT LEVEL (dBFS)

SFD

R(d

BcAN

DdB

FS)

2217 G12

2217 G13

78

79

80

81

82

INPUT LEVEL (dBFS)

SNR

(dBF

S)

–80 –70 –60 –50 –40 –30 –20 –10 0

2217 G14

–130–120–110–100–90–80–70–60–50–40–30–20–10

0

0 10 20 30 40 50FREQUENCY (MHz)

AMPL

ITU

DE

(dBF

S)

2217 G15

–130–120–110–100–90–80–70–60–50–40–30–20–10

0

0 10 20 30 40 50FREQUENCY (MHz)

AMPL

ITU

DE

(dBF

S)

2217 G16

–130–120–110–100–90–80–70–60–50–40–30–20–10

0

0 10 20 30 40 50FREQUENCY (MHz)

AMPL

ITU

DE

(dBF

S)

2217 G17

–130–120–110–100–90–80–70–60–50–40–30–20–10

0

0 10 20 30 40 50FREQUENCY (MHz)

AMPL

ITU

DE

(dBF

S)

2217 G18

–130–120–110–100–90–80–70–60–50–40–30–20–10

0

0 10 20 30 40 50FREQUENCY (MHz)

AMPL

ITU

DE

(dBF

S)

LTC2217

112217f

SNR vs Input Level, FIN = 70.5MHz

64k Point 2-Tone FFT, fIN = 67.2MHz and 74.4MHz, –7dBFS

64k Point 2-Tone FFT, fIN = 67.2MHz and 74.4MHz, –15dBFS, Dither “On”






64k Point 2-Tone FFT, fIN = 67.2MHz and 74.4MHz, –25dBFS, Dither “On”


2217 G19

–130–120–110–100–90–80–70–60–50–40–30–20–10

0

0 10 20 30 40 50FREQUENCY (MHz)

AMPL

ITU

DE

(dBF

S)

2217 G20

30

40

50

60

70

80

90

100

110

120

130

140

INPUT LEVEL (dBFS)

SFD

R(d

BcAN

DdB

FS)

–80 –70 –60 –50 –40 –30 –20 –10 0

2217 G21

30

40

50

60

70

80

90

100

110

120

130

140

INPUT LEVEL (dBFS)

SFD

R(d

BcAN

DdB

FS)

–80 –70 –60 –50 –40 –30 –20 –10 0

2217 G22

78

79

80

81

82

INPUT LEVEL (dBFS)

SNR

(dBF

S)

–80 –70 –60 –50 –40 –30 –20 –10 0

2217 G23

–130–120–110–100–90–80–70–60–50–40–30–20–10

0

0 10 20 30 40 50FREQUENCY (MHz)

AM

PLIT

UDE

(dBF

S)

2217 G24

–130–120–110–100–90–80–70–60–50–40–30–20–10

0

0 10 20 30 40 50FREQUENCY (MHz)

AMPL

ITU

DE

(dBF

S)

2217 G25

–130–120–110–100–90–80–70–60–50–40–30–20–10

0

0 10 20 30 40 50FREQUENCY (MHz)

AMPL

ITU

DE

(dBF

S)

2217 G26

–130–120–110–100–90–80–70–60–50–40–30–20–10

0

0 10 20 30 40 50FREQUENCY (MHz)

AMPL

ITU

DE

(dBF

S)

2217 G27

–130–120–110–100–90–80–70–60–50–40–30–20–10

0

0 10 20 30 40 50FREQUENCY (MHz)

AMPL

ITU

DE

(dBF

S)

LTC2217

122217f

SNR vs Input Level, fIN = 140.5MHz

SFDR (HD2 and HD3) vs Input Frequency SNR vs Input Frequency


SNR and SFDR vs Sample Rate, fIN = 5.2MHz



SNR and SFDR vs SupplyVoltage (VDD), fIN = 5.1MHz

IVDD vs Sample Rate and Supply Voltage, fIN = 5MHz, –1dBFS

SNR and SFDR vs Clock Duty Cycle, fIN = 5.2MHz

2217 G28INPUT LEVEL (dBFS)

SFD

R (d

Bc A

ND

dBF

S)

30

40

50

60

70

80

90

100

110

120

130

140

–80 –70 –60 –50 –40 –30 –20 –10 0

2217 G29

30

40

50

60

70

80

90

100

110

120

130

140

INPUT LEVEL (dBFS)

SFD

R (d

Bc A

ND

dBF

S)

–80 –70 –60 –50 –40 –30 –20 –10 0

2217 G30

78

79

80

81

82

INPUT LEVEL (dBFS)

SNR

(dBF

S)

–80 –70 –60 –50 –40 –30 –20 –10 0

2217 G31

0 50 100 150 200 250INPUT FREQUENCY (MHz)

SFDR

, HD2

, HD3

(dBc

)

HD3

HD2

70

75

80

85

90

95

100

105

110

SFDR

2217 G32

76

77

78

79

80

81

82

0 50 100 150 200 250INPUT FREQUENCY (MHz)

SNR

(dBF

S)

2217 G33

70

75

80

85

90

95

100

105

110

0 40 80 120 160SAMPLE RATE (MSPS)

SNR

(dBF

S) A

ND S

FDR

(dBc

)

SNR

SFDR

LIMIT

2217 G34

70

75

80

85

90

95

100

105

110

2.8 3.0 3.2 3.4 3.6SUPPLY VOLTAGE (V)

SNR

(dBF

S) A

ND S

FDR

(dBc

)

SFDR

SNR

LOWER LIMIT

UPPER LIMIT

2217 G35SAMPLE RATE (Msps)

0 50 100 150 200

I VD

D (m

A)

300

325

350

375

400

425

450

VDD = 3.465V VDD = 3.135V

VDD = 3.3V

2217 G36

60

70

80

90

100

110

30 40 50 60 70DUTY CYCLE (%)

SNR

(dBF

S)AN

DSF

DR

(dBc

)

SFDR DCS OFFSNR DCS OFFSFDR DCS ONSNR DCS ON

LTC2217

132217f

2217 G37

0.995

0.996

0.997

0.998

0.999

1

1.001

1.002

1.003

1.004

1.005

TEMPERATURE (°C)

NORM

ALIZ

ED F

ULL

SCAL

E

–40 –20 0 20 40 60 80

2217 G38

–5

–4

–3

–2

–1

0

1

2

3

4

5

–40 –20 0 20 40 60 80TEMPERATURE (°C)

OFFS

ET V

OLTA

GE (m

V)

2217 G39

0.995

0.996

0.997

0.998

0.999

1

1.001

1.002

1.003

1.004

1.005

TEMPERATURE (°C)

NORM

ALIZ

ED F

ULL

SCAL

E

–40 –20 0 20 40 60 80

2217 G40

–5

–4

–3

–2

–1

0

1

2

3

4

5

TEMPERATURE (°C)

OFFS

ET V

OLTA

GE (m

V)

–40 –20 0 20 40 60 80

2217 G41

60

65

70

75

80

85

90

95

100

105

110

0.5 0.75 1 1.25 1.5 1.75 2ANALOG INPUT COMMON MODE VOLTAGE (V)

SFDR

(dBc

)

70MHz

5MHz

Input Offset Voltage vs Temperature, Internal Reference, 5 Units

Normalized Full Scale vs Temperature, External Reference, 5 Units

Input Offset Voltage vs Temperature, External Reference, 5 Units


Normalized Full Scale vs Temperature, Internal Reference, 5 Units

SFDR vs Analog Input Common Mode Voltage, 5MHz and 70MHz, –1dBFS

Mid-Scale Settling After Wake Up from Shutdown or Starting Encode Clock

Full-Scale Settling After Wake Up from Shutdown or Starting Encode Clock

0 300 600 900 1200 1500TIME AFTER WAKE-UP OR CLOCK START (μs)

FULL

-SCA

LE E

RROR

(%)

–0.5

–0.4

–0.3

–0.2

–0.1

0.0

0.1

0.2

0.3

0.4

0.5

CLOCK START

WAKE-UP

2217 G42

TIME AFTER WAKE-UP OR CLOCK START (μs)

FULL

-SCA

LE E

RROR

(%)

–0.5

–0.4

–0.3

–0.2

–0.1

0.0

0.1

0.2

0.3

0.4

0.5

CLOCK START

WAKE-UP

0 400 800 1200 1600 2000

2217 G43

LTC2217

142217f

For CMOS Mode. Full Rate or Demultiplexed

SENSE (Pin 1): Reference Mode Select and External Reference Input. Tie SENSE to VDD to select the internal 2.5V bandgap reference. An external reference of 2.5V or 1.25V may be used; both reference values will set a full scale ADC range of 2.75V.

GND (Pins 2, 4, 7, 10, 11, 14, 18): ADC Power Ground.

VCM (Pin 3): 1.575V Output. Optimum voltage for input com-mon mode. Must be bypassed to ground with a minimum of 2.2μF. Ceramic chip capacitors are recommended.

VDD (Pins 5, 6, 15, 16, 17): 3.3V Analog Supply Pin. Bypass to GND with 1μF ceramic chip capacitors.

AIN+ (Pin 8): Positive Differential Analog Input.

AIN– (Pin 9): Negative Differential Analog Input.

ENC+ (Pin 12): Positive Differential Encode Input. The sampled analog input is held on the rising edge of ENC+. Internally biased to 1.6V through a 6.2kΩ resistor. Output data can be latched on the rising edge of ENC+.

ENC– (Pin 13): Negative Differential Encode Input. The sampled analog input is held on the falling edge of ENC–. Internally biased to 1.6V through a 6.2kΩ resistor. By-pass to ground with a 0.1μF capacitor for a single-ended Encode signal.

SHDN (Pin 19): Power Shutdown Pin. SHDN = low results in normal operation. SHDN = high results in powered down analog circuitry and the digital outputs are placed in a high impedance state.

DITH (Pin 20): Internal Dither Enable Pin. DITH = low disables internal dither. DITH = high enables internal dither. Refer to Internal Dither section of this data sheet for details on dither operation.

DB0-DB15 (Pins 21-30 and 33-38): Digital Outputs, B Bus. DB15 is the MSB. Active in demultiplexed mode. The B bus is in high impedance state in full rate CMOS mode.

OGND (Pins 31 and 50): Output Driver Ground.

OVDD (Pins 32 and 49): Positive Supply for the Output Drivers. Bypass to ground with 1μF capacitor.

OFB (Pin 39): Over/Under Flow Digital Output for the B Bus. OFB is high when an over or under fl ow has occurred on the B bus. At high impedance state in full rate CMOS mode.

CLKOUTB (Pin 40): Data Valid Output. CLKOUTB will toggle at the sample rate in full rate CMOS mode or at 1/2 the sample rate in demultiplexed mode. Latch the data on the falling edge of CLKOUTB.

CLKOUTA (Pin 41): Inverted Data Valid Output. CLKOUTA will toggle at the sample rate in full rate CMOS mode or at 1/2 the sample rate in demultiplexed mode. Latch the data on the rising edge of CLKOUTA.

DA0-DA15 (Pins 42-48 and 51-59): Digital Outputs, A Bus. DA15 is the MSB. Output bus for full rate CMOS mode and demultiplexed mode.

OFA (Pin 60): Over/Under Flow Digital Output for the A Bus. OFA is high when an over or under fl ow has occurred on the A bus.

LVDS (Pin 61): Data Output Mode Select Pin. Connecting LVDS to 0V selects full rate CMOS mode. Connecting LVDS to 1/3VDD selects demultiplexed CMOS mode. Connecting LVDS to 2/3VDD selects Low Power LVDS mode. Connect-ing LVDS to VDD selects Standard LVDS mode.

MODE (Pin 62): Output Format and Clock Duty Cycle Stabilizer Selection Pin. Connecting MODE to 0V selects offset binary output format and disables the clock duty cycle stabilizer. Connecting MODE to 1/3VDD selects offset binary output format and enables the clock duty cycle sta-bilizer. Connecting MODE to 2/3VDD selects 2’s complement output format and enables the clock duty cycle stabilizer. Connecting MODE to VDD selects 2’s complement output format and disables the clock duty cycle stabilizer.

RAND (Pin 63): Digital Output Randomization Selection Pin. RAND low results in normal operation. RAND high selects D1-D15 to be EXCLUSIVE-ORed with D0 (the LSB). The output can be decoded by again applying an XOR operation between the LSB and all other bits. This mode of operation reduces the effects of digital output interference.

NC (Pin 64): Not Connected Internally. For pin compatibility with the LTC2208 this pin should be connected to GND or VDD as required. Otherwise no connection.

GND (Exposed Pad): ADC Power Ground. The exposed pad on the bottom of the package must be soldered to ground.

PIN FUNCTIONS

LTC2217

152217f

For LVDS Mode. STANDARD or LOW POWER

SENSE (Pin 1): Reference Mode Select and External Reference Input. Tie SENSE to VDD to select the internal 2.5V bandgap reference. An external reference of 2.5V or 1.25V may be used; both reference values will set a full scale ADC range of 2.75V.

GND (Pins 2, 4, 7, 10, 11, 14, 18): ADC Power Ground.

VCM (Pin 3): 1.575V Output. Optimum voltage for input common mode. Must be bypassed to ground with a minimum of 2.2μF. Ceramic chip capacitors are recom-mended.

VDD (Pins 5, 6, 15, 16, 17): 3.3V Analog Supply Pin. Bypass to GND with 1μF ceramic chip capacitors.

AIN+ (Pin 8): Positive Differential Analog Input.

AIN– (Pin 9): Negative Differential Analog Input.

ENC+ (Pin 12): Positive Differential Encode Input. The sampled analog input is held on the rising edge of ENC+. Internally biased to 1.6V through a 6.2kΩ resistor. Output data can be latched on the rising edge of ENC+.

ENC– (Pin 13): Negative Differential Encode Input. The sampled analog input is held on the falling edge of ENC–. Internally biased to 1.6V through a 6.2kΩ resistor. By-pass to ground with a 0.1μF capacitor for a single-ended Encode signal.

SHDN (Pin 19): Power Shutdown Pin. SHDN = low results in normal operation. SHDN = high results in powered down analog circuitry and the digital outputs are set in high impedance state.

DITH (Pin 20): Internal Dither Enable Pin. DITH = low disables internal dither. DITH = high enables internal dither. Refer to Internal Dither section of the data sheet for details on dither operation.

D0–/D0+ to D15–/D15+ (Pins 21-30, 33-38, 41-48 and 51-58): LVDS Digital Outputs. All LVDS outputs require differential 100Ω termination resistors at the LVDS receiver. D15+/D15– is the MSB.

OGND (Pins 31 and 50): Output Driver Ground.

OVDD (Pins 32 and 49): Positive Supply for the Output Drivers. Bypass to ground with 0.1μF capacitor.

CLKOUT–/CLKOUT+ (Pins 39 and 40): LVDS Data Valid 0utput. Latch data on the rising edge of CLKOUT+, falling edge of CLKOUT–.

OF–/OF+ (Pins 59 and 60): Over/Under Flow Digital Output OF is high when an over or under fl ow has occurred.

LVDS (Pin 61): Data Output Mode Select Pin. Connecting LVDS to 0V selects full rate CMOS mode. Connecting LVDS to 1/3VDD selects demultiplexed CMOS mode. Connecting LVDS to 2/3VDD selects Low Power LVDS mode. Connect-ing LVDS to VDD selects Standard LVDS mode.

MODE (Pin 62): Output Format and Clock Duty Cycle Stabilizer Selection Pin. Connecting MODE to 0V selects offset binary output format and disables the clock duty cycle stabilizer. Connecting MODE to 1/3VDD selects offset binary output format and enables the clock duty cycle sta-bilizer. Connecting MODE to 2/3VDD selects 2’s complement output format and enables the clock duty cycle stabilizer. Connecting MODE to VDD selects 2’s complement output format and disables the clock duty cycle stabilizer.

RAND (Pin 63): Digital Output Randomization Selection Pin. RAND low results in normal operation. RAND high selects D1-D15 to be EXCLUSIVE-ORed with D0 (the LSB). The output can be decoded by again applying an XOR operation between the LSB and all other bits. The mode of operation reduces the effects of digital output interference.

NC (Pin 64): Not Connected Internally. For pin compat-ibility with the LTC2208 this pin should be connected to GND or VDD as required. Otherwise no connection.

GND (Exposed Pad Pin 65): ADC Power Ground. The exposed pad on the bottom of the package must be sol-dered to ground.

PIN FUNCTIONS

LTC2217

162217f

ADC CLOCKS

DIFFERENTIALINPUT

LOW JITTERCLOCKDRIVER

DITHERSIGNAL

GENERATOR

FIRST PIPELINEDADC STAGE

FIFTH PIPELINEDADC STAGE

FOURTH PIPELINEDADC STAGE

SECOND PIPELINEDADC STAGE

ENC+ ENC–

CORRECTION LOGICAND

SHIFT REGISTER

DITHM0DEOGND

CLKOUT+CLKOUT–OF+

OF–

D15+

D15–

OVDD

D0+

D0–

2217 F01

INPUTS/HAIN

–

AIN+

THIRD PIPELINEDADC STAGE

OUTPUTDRIVERS

CONTROLLOGIC

SHDN RAND LVDS

•••

VDD

GND

PGA

SENSE

VCMBUFFER

ADCREFERENCE

VOLTAGEREFERENCE

RANGESELECT

Figure 1. Functional Block Diagram

BLOCK DIAGRAM

LTC2217

172217f

DYNAMIC PERFORMANCE

Signal-to-Noise Plus Distortion Ratio

The signal-to-noise plus distortion ratio [S/(N+D)] is the ratio between the RMS amplitude of the fundamental input frequency and the RMS amplitude of all other frequency components at the ADC output. The output is band lim-ited to frequencies above DC to below half the sampling frequency (Nyquist Frequency).

Signal-to-Noise Ratio

The signal-to-noise (SNR) is the ratio between the RMS amplitude of the fundamental input frequency and the RMS amplitude of all other frequency components, except the fi rst fi ve harmonics.

Total Harmonic Distortion

Total harmonic distortion is the ratio of the RMS sum of all harmonics of the input signal to the fundamental itself. The out-of-band harmonics alias into the frequency band between DC and half the sampling frequency (Nyquist Frequency). THD is expressed as:

THD LogV V V V

VN

=+ + +…( )⎛

⎝

⎜⎜⎜

⎞

⎠

⎟⎟⎟

–202

23

24

2 2

1

where V1 is the RMS amplitude of the fundamental fre-quency and V2 through VN are the amplitudes of the second through nth harmonics.

Intermodulation Distortion

If the ADC input signal consists of more than one spectral component, the ADC transfer function nonlinearity can produce intermodulation distortion (IMD) in addition to THD. IMD is the change in one sinusoidal input caused

by the presence of another sinusoidal input at a different frequency.

If two pure sine waves of frequencies fa and fb are applied to the ADC input, nonlinearities in the ADC transfer function can create distortion products at the sum and difference frequencies of mfa ± nfb, where m and n = 0, 1, 2, 3, etc.

For example, the 3rd order IMD terms include (2fa + fb), (fa + 2fb), (2fa - fb) and (fa - 2fb). The 3rd order IMD is defi ned as the ratio of the RMS value of either input tone to the RMS value of the largest 3rd order IMD product.

Spurious Free Dynamic Range (SFDR)

The ratio of the RMS input signal amplitude to the RMS value of the peak spurious spectral component expressed in dBc. SFDR may also be calculated relative to full scale and expressed in dBFS.

Full Power Bandwidth

The Full Power bandwidth is that input frequency at which the amplitude of the reconstructed fundamental is reduced by 3dB from a full scale input signal.

Aperture Delay Time

The time from when a rising ENC+ equals the ENC– voltage to the instant that the input signal is held by the sample- and-hold circuit.

Aperture Delay Jitter

The variation in the aperture delay time from conversion to conversion. This random variation will result in noise when sampling an AC input. The signal-to-noise ratio term due to the jitter alone will be:

SNRJITTER = –20log (2π • fIN • tJITTER)

This formula states SNR due to jitter alone at any amplitude in terms of dBc.

OPERATION

LTC2217

182217f

CONVERTER OPERATION

The LTC2217 is a CMOS pipelined multistep converter with a low noise front-end. As shown in Figure 1, the converter has fi ve pipelined ADC stages; a sampled analog input will result in a digitized value seven cycles later (see the Timing Diagram section). The analog input is differential for improved common mode noise immunity and to maximize the input range. Additionally, the differential input drive will reduce even order harmonics of the sample and hold circuit. The encode input is also differential for improved common mode noise immunity.

The LTC2217 has two phases of operation, determined by the state of the differential ENC+/ENC– input pins. For brevity, the text will refer to ENC+ greater than ENC– as ENC high and ENC+ less than ENC– as ENC low.

Each pipelined stage shown in Figure 1 contains an ADC, a reconstruction DAC and an interstage amplifi er. In operation, the ADC quantizes the input to the stage and the quantized value is subtracted from the input by the DAC to produce a residue. The residue is amplifi ed and output by the residue amplifi er. Successive stages oper-ate out of phase so that when odd stages are outputting their residue, the even stages are acquiring that residue and vice versa.

When ENC is low, the analog input is sampled differen-tially directly onto the input sample-and-hold capacitors, inside the “input S/H” shown in the block diagram. At the instant that ENC transitions from low to high, the voltage on the sample capacitors is held. While ENC is high, the held input voltage is buffered by the S/H amplifi er which drives the fi rst pipelined ADC stage. The fi rst stage acquires the output of the S/H amplifi er during the high phase of ENC. When ENC goes back low, the fi rst stage produces its residue which is acquired by the second stage. At the same time, the input S/H goes back to acquiring the analog input. When ENC goes high, the second stage produces its residue which is acquired by the third stage. An identical process is repeated for the third and fourth stages, resulting in a fourth stage residue that is sent to the fi fth stage for fi nal evaluation.

Each ADC stage following the fi rst has additional range to accommodate fl ash and amplifi er offset errors. Results from all of the ADC stages are digitally delayed such that the results can be properly combined in the correction logic before being sent to the output buffer.

SAMPLE/HOLD OPERATION AND INPUT DRIVE

Sample/Hold Operation

Figure 2 shows an equivalent circuit for the LTC2217 CMOS differential sample and hold. The differential analog inputs are sampled directly onto sampling capacitors (CSAMPLE) through NMOS transitors. The capacitors shown attached to each input (CPARASITIC) are the summation of all other capacitance associated with each input.

During the sample phase when ENC is low, the NMOS transistors connect the analog inputs to the sampling capacitors and they charge to, and track the differential input voltage. When ENC transitions from low to high, the sampled input voltage is held on the sampling capacitors. During the hold phase when ENC is high, the sampling capacitors are disconnected from the input and the held voltage is passed to the ADC core for processing. As ENC transitions for high to low, the inputs are reconnected to the sampling capacitors to acquire a new sample. Since the sampling capacitors still hold the previous sample, a charging glitch proportional to the change in voltage between samples will be seen at this time. If the change between the last sample and the new sample is small, the charging glitch seen at the input will be small. If the

Figure 2. Equivalent Input Circuit

VDD

LTC2217

AIN+

2217 F02

VDD

AIN–

ENC–

ENC+

1.6V

6k

VDD

1.6V

6k

RPARASITIC3Ω

RPARASITIC3Ω

CPARASITIC1.8pF

CSAMPLE7.3pF

CSAMPLE7.3pF

CPARASITIC1.8pF

RON20Ω

RON20Ω

APPLICATIONS INFORMATION

LTC2217

192217f

input change is large, such as the change seen with input frequencies near Nyquist, then a larger charging glitch will be seen.

Common Mode Bias

The ADC sample-and-hold circuit requires differential drive to achieve specifi ed performance. Each input should swing ±0.6875V for the 2.75V range, around a common mode voltage of 1.575V. The VCM output pin (Pin 3) is designed to provide the common mode bias level. VCM can be tied directly to the center tap of a transformer to set the DC input level or as a reference level to an op amp differential driver circuit. The VCM pin must be bypassed to ground close to the ADC with 2.2μF or greater.

Input Drive Impedance

As with all high performance, high speed ADCs the dynamic performance of the LTC2217 can be infl uenced by the input drive circuitry, particularly the second and third harmonics. Source impedance and input reactance can infl uence SFDR. At the falling edge of ENC the sample and hold circuit will connect the sampling capacitor to the input pin and start the sampling period. The sampling period ends when ENC rises, holding the sampled input on the sampling capacitor. Ide-ally, the input circuitry should be fast enough to fully charge the sampling capacitor during the sampling period 1/(2 • fENCODE); however, this is not always possible and the incomplete settling may degrade the SFDR. The sam-pling glitch has been designed to be as linear as possible to minimize the effects of incomplete settling.

For the best performance it is recommended to have a source impedance of 100Ω or less for each input. The source impedance should be matched for the differential inputs. Poor matching will result in higher even order harmonics, especially the second.

INPUT DRIVE CIRCUITS

Input Filtering

A fi rst-order RC low-pass fi lter at the input of the ADC can serve two functions: limit the noise from input circuitry and provide isolation from ADC S/H switching. The LTC2217

has a very broadband S/H circuit, DC to 400MHz; it can be used in a wide range of applications; therefore, it is not possible to provide a single recommended RC fi lter.

Figures 3 and 4 show two examples of input RC fi ltering for two ranges of input frequencies. In general it is desirable to make the capacitors as large as can be tolerated—this will help suppress random noise as well as noise coupled from the digital circuitry. The LTC2217 does not require any input fi lter to achieve data sheet specifi cations; however, no fi ltering will put more stringent noise requirements on the input drive circuitry.

Transformer Coupled Circuits

Figure 3 shows the LTC2217 being driven by an RF trans-former with a center-tapped secondary. The secondary center tap is DC biased with VCM, setting the ADC input signal at its optimum DC level. Figure 3 shows a 1:1 turns ratio transformer. Other turns ratios can be used; however, as the turns ratio increases so does the impedance seen by the ADC. Source impedance greater than 50Ω can reduce the input bandwidth and increase high frequency distor-tion. A disadvantage of using a transformer is the loss of low frequency response. Most small RF transformers have poor performance at frequencies below 1MHz.

Center-tapped transformers provide a convenient means of DC biasing the secondary; however, they often show poor balance at high input frequencies, resulting in large 2nd order harmonics.

Figure 3. Single-Ended to Differential Conversion Using a Transformer. Recommended for Input Frequencies from 5MHz to 100MHz

35Ω

5Ω

35Ω10Ω

10Ω

5Ω

5Ω

0.1μF

AIN+

AIN–

8.2pF

2.2μF

8.2pF

8.2pF

VCM

T1

T1 = MA/COM ETC1-1TRESISTORS, CAPACITORSARE 0402 PACKAGE SIZEEXCEPT 2.2μF

2217 F03

LTC2217


LTC2217

202217f

Figure 4 shows transformer coupling using a transmis-sion line balun transformer. This type of transformer has much better high-frequency response and balance than fl ux coupled center-tap transformers. Coupling capacitors are added at the ground and input primary terminals to allow the secondary terminals to be biased at 1.575V.

Figure 5. DC Coupled Input with Differential Amplifi er

0.1μF

AIN+

AIN–

4.7pF

2.2μF

4.7pF

4.7pF

VCM

ANALOGINPUT

0.1μF

0.1μF5Ω

25Ω

25Ω 5Ω

10Ω

10Ω

T11:1

T1 = MA/COM ETC1-1-13RESISTORS, CAPACITORS ARE 0402 PACKAGE SIZEEXCEPT 2.2μF

2217 F04

LTC2217

5Ω

Figure 4. Using a Transmission Line Balun Transformer. Recommended for Input Frequencies from 100MHz to 250MHz

– –

+ +

AIN+

AIN–

2.2μF

12pF

12pF

VCM

ANALOGINPUT

2217 F05

CM

AMPLIFIER = LTC6600-20, LTC1993, ETC.

HIGH SPEEDDIFFERENTIAL

AMPLIFIER

LTC2217

25Ω

25Ω

PGA

1.575V

SENSE

VCMBUFFER

INTERNALADC

REFERENCE

RANGESELECT

AND GAINCONTROL

2.5VBANDGAP

REFERENCE

2.2μF

TIE TO VDD TO USE INTERNAL 2.5V

REFERENCE OR INPUT AN

EXTERNAL 2.5V REFERENCE

OR INPUT ANEXTERNAL 1.25V

REFERENCE

2217 F06

Figure 6. Reference Circuit

reference, tie the SENSE pin to VDD. To use an external reference, simply apply either a 1.25V or 2.5V reference voltage to the SENSE input pin. Both 1.25V and 2.5V ap-plied to SENSE will result in a full scale range of 2.75VP-P. A 1.575V output, VCM, is provided for a common mode bias for input drive circuitry. An external bypass capacitor is required for the VCM output. This provides a high frequency low impedance path to ground for internal and external circuitry. This is also the compensation capacitor for the reference; which will not be stable without this capacitor. The minimum value required for stability is 2.2μF.

Direct Coupled Circuits

Figure 5 demonstrates the use of a differential amplifi er to convert a single ended input signal into a differential input signal. The advantage of this method is that it provides low frequency input response; however, the limited gain bandwidth of any op amp or closed-loop amplifi er will de-grade the ADC SFDR at high input frequencies. Additionally, wideband op amps or differential amplifi ers tend to have high noise. As a result, the SNR will be degraded unless the noise bandwidth is limited prior to the ADC input.

Reference Operation

Figure 6 shows the LTC2217 reference circuitry consisting of a 2.5V bandgap reference, a programmable gain ampli-fi er and control circuit. The LTC2217 has three modes of reference operation: Internal Reference, 1.25V external reference or 2.5V external reference. To use the internal


LTC2217

212217f

The internal programmable gain amplifi er provides the internal reference voltage for the ADC. This amplifi er has very stringent settling requirements and therefore is not accessible for external use.

The SENSE pin can be driven ±5% around the nominal 2.5V or 1.25V external reference inputs. This adjustment range can be used to trim the ADC gain error or other system gain errors. When selecting the internal reference, the SENSE pin should be tied to VDD as close to the converter as possible. If the sense pin is driven externally it should be bypassed to ground as close to the device as possible with 1μF ceramic capacitor.

Figure 7. A 2.75V Range ADC with an External 2.5V Reference

VCM

SENSE

1.575V

3.3V

2.2μF

2.2μF1μF

2217 F07

LTC1461-2.52 6

4

LTC2217

3. If the ADC is clocked with a fi xed-frequency sinusoidal signal, fi lter the encode signal to reduce wideband noise.

4. Balance the capacitance and series resistance at both encode inputs such that any coupled noise will appear at both inputs as common mode noise.

The encode inputs have a common mode range of 1.2V to VDD. Each input may be driven from ground to VDD for single-ended drive.

Driving the Encode Inputs

The noise performance of the LTC2217 can depend on the encode signal quality as much as on the analog input. The encode inputs are intended to be driven differentially, primarily for noise immunity from common mode noise sources. Each input is biased through a 6k resistor to a 1.6V bias. The bias resistors set the DC operating point for transformer coupled drive circuits and can set the logic threshold for single-ended drive circuits.

Any noise present on the encode signal will result in ad-ditional aperture jitter that will be RMS summed with the inherent ADC aperture jitter.

In applications where jitter is critical (high input frequen-cies), take the following into consideration:

1. Differential drive should be used.

2. Use as large an amplitude possible. If using trans-former coupling, use a higher turns ratio to increase the amplitude.

Figure 8a. Equivalent Encode Input Circuit

VDD

LTC2217

2217 F08a

VDD

ENC–

ENC+

1.6V

1.6V

6k

6k

TO INTERNALADC CLOCK

DRIVERS

VDD

Figure 8b. Balun-Driven Encode

50Ω100Ω

8.2pF

0.1μF

0.1μF

0.1μF

T1

T1 = MA/COM ETC1-1-13RESISTORS AND CAPACITORSARE 0402 PACKAGE SIZE

50Ω

LTC2217

2217 F08b

ENC–

ENC+


LTC2217

222217f

The lower limit of the LTC2217 sample rate is determined by droop affecting the sample and hold circuits. The pipelined architecture of this ADC relies on storing analog signals on small valued capacitors. Junction leakage will discharge the capacitors. The specifi ed minimum operating frequency for the LTC2217 is 1Msps.

DIGITAL OUTPUTS

Digital Output Modes

The LTC2217 can operate in four digital output modes: standard LVDS, low power LVDS, full rate CMOS, and demultiplexed CMOS. The LVDS pin selects the mode of operation. This pin has a four level logic input, centered at 0, 1/3VDD, 2/3VDD and VDD. An external resistor divider can be used to set the 1/3VDD and 2/3VDD logic levels. Table 1 shows the logic states for the LVDS pin.

Table 1. LVDS Pin Function

LVDS DIGITAL OUTPUT MODE

0V(GND) Full-Rate CMOS

1/3VDD Demultiplexed CMOS

2/3VDD Low Power LVDS

VDD LVDS

Digital Output Buffers (CMOS Modes)

Figure 11 shows an equivalent circuit for a single output buffer in CMOS Mode, Full-Rate or Demultiplexed. Each buffer is powered by OVDD and OGND, isolated from the ADC power and ground. The additional N-channel transistor in the output driver allows operation down to low voltages. The internal resistor in series with the output makes the output appear as 50Ω to external circuitry and eliminates the need for external damping resistors.

As with all high speed/high resolution converters, the digital output loading can affect the performance. The digital outputs of the LTC2217 should drive a minimum capacitive load to avoid possible interaction between the digital outputs and sensitive input circuitry. The output should be buffered with a device such as a ALVCH16373 CMOS latch. For full speed operation the capacitive load should be kept under 10pF. A resistor in series with the

2217 F10

ENC–

ENC+

3.3V

3.3V

D0

Q0

Q0

MC100LVELT22 130Ω 130Ω

83Ω 83Ω

LTC2217

Figure 10. ENC Drive Using a CMOS to PECL Translator

Maximum and Minimum Encode Rates

The maximum encode rate for the LTC2217 is 105Msps. For the ADC to operate properly the encode signal should have a 50% (±5%) duty cycle. Each half cycle must have at least 4.5ns for the ADC internal circuitry to have enough settling time for proper operation. Achieving a precise 50% duty cycle is easy with differential sinusoidal drive using a transformer or using symmetric differential logic such as PECL or LVDS. When using a single-ended ENCODE signal asymmetric rise and fall times can result in duty cycles that are far from 50%.

An optional clock duty cycle stabilizer can be used if the input clock does not have a 50% duty cycle. This circuit uses the rising edge of ENC pin to sample the analog input. The falling edge of ENC is ignored and an internal falling edge is generated by a phase-locked loop. The input clock duty cycle can vary from 30% to 70% and the clock duty cycle stabilizer will maintain a constant 50% internal duty cycle. If the clock is turned off for a long period of time, the duty cycle stabilizer circuit will require one hundred clock cycles for the PLL to lock onto the input clock. To use the clock duty cycle stabilizer, the MODE pin must be connected to 1/3VDD or 2/3VDD using external resistors.

Figure 9. Single-Ended ENC Drive,Not Recommended for Low Jitter

2217 F09

ENC–1.6V

VTHRESHOLD = 1.6VENC+

0.1μF

LTC2217


LTC2217

232217f

resistor, even if the signal is not used (such as OF+/OF– or CLKOUT+/CLKOUT–). To minimize noise the PC board traces for each LVDS output pair should be routed close together. To minimize clock skew all LVDS PC board traces should have about the same length.

In Low Power LVDS Mode 1.75mA is steered between the differential outputs, resulting in ±175mV at the LVDS receiver’s 100Ω termination resistor. The output com-mon mode voltage is 1.20V, the same as standard LVDS Mode.

Data Format

The LTC2217 parallel digital output can be selected for offset binary or 2’s complement format. The format is selected with the MODE pin. This pin has a four level logic input, centered at 0, 1/3VDD, 2/3VDD and VDD. An external resistor divider can be user to set the 1/3VDD and 2/3VDD logic levels. Table 2 shows the logic states for the MODE pin.

Table 2. MODE Pin Function

MODE OUTPUT FORMATCLOCK DUTY

CYCLE STABILIZER

0(GND) Offset Binary Off

1/3VDD Offset Binary On

2/3VDD 2’s Complement On

VDD 2’s Complement Off

2217 F11

OVDD

VDD VDD0.1μF

TYPICALDATAOUTPUT

OGND

OVDD 0.5V TO 3.6V

PREDRIVERLOGIC

DATAFROM

LATCH

43Ω

LTC2217

Figure 11. Equivalent Circuit for a Digital Output Buffer

output may be used, but is not required since the ADC has a series resistor of 43Ω on-chip.

Lower OVDD voltages will also help reduce interference from the digital outputs.

Digital Output Buffers (LVDS Modes)

Figure 12 shows an equivalent circuit for an LVDS output pair. A 3.5mA current is steered from OUT+ to OUT– or vice versa, which creates a ±350mV differential voltage across the 100Ω termination resistor at the LVDS receiver. A feedback loop regulates the common mode output volt-age to 1.20V. For proper operation each LVDS output pair must be terminated with an external 100Ω termination

2217 F12

3.5mA

1.20V

LVDSRECEIVER

OGND

10k 10k

VDDVDD

0.1μF

OVDD3.3V

PREDRIVERLOGIC

DATAFROM

LATCH

+–

OVDD

OVDD

43Ω

43Ω

100Ω

LTC2217

Figure 12. Equivalent Output Buffer in LVDS Mode


LTC2217

242217f

Overfl ow Bit

An overfl ow output bit (OF) indicates when the converter is over-ranged or under-ranged. In CMOS mode, a logic high on the OFA pin indicates an overfl ow or underfl ow on the A data bus, while a logic high on the OFB pin indicates an overfl ow on the B data bus. In LVDS mode, a differ-ential logic high on OF+/OF– pins indicates an overfl ow or underfl ow.

Output Clock

The ADC has a delayed version of the encode input avail-able as a digital output, CLKOUT. The CLKOUT pin can be used to synchronize the converter data to the digital system. This is necessary when using a sinusoidal en-code. In both CMOS modes, A bus data will be updated as CLKOUTA falls and CLKOUTB rises. In demultiplexed CMOS mode the B bus data will be updated as CLKOUTA falls and CLKOUTB rises.

In Full Rate CMOS Mode, only the A data bus is active; data may be latched on the rising edge of CLKOUTA or the falling edge of CLKOUTB.

In demultiplexed CMOS mode CLKOUTA and CLKOUTB will toggle at 1/2 the frequency of the encode signal. Both the A bus and the B bus may be latched on the rising edge of CLKOUTA or the falling edge of CLKOUTB.

Digital Output Randomizer

Interference from the ADC digital outputs is sometimes unavoidable. Interference from the digital outputs may be from capacitive or inductive coupling, or coupling through the ground plane. Even a tiny coupling factor can result in discernible unwanted tones in the ADC output spectrum. By randomizing the digital output before it is transmitted off chip, these unwanted tones can be randomized, trading a slight increase in the noise fl oor for a large reduction in unwanted tone amplitude.

The digital output is “Randomized” by applying an exclu-sive-OR logic operation between the LSB and all other data output bits. To decode, the reverse operation is applied; that is, an exclusive-OR operation is applied between the

LSB and all other bits. The LSB, OF and CLKOUT output are not affected. The output Randomizer function is active when the RAND pin is high.

Output Driver Power

Separate output power and ground pins allow the output drivers to be isolated from the analog circuitry. The power supply for the digital output buffers, OVDD, should be tied to the same power supply as for the logic being driven. For example, if the converter is driving a DSP powered by a 1.8V supply, then OVDD should be tied to that same 1.8V supply. In CMOS mode OVDD can be powered with any logic voltage up to the 3.6V. OGND can be powered with any voltage from ground up to 1V and must be less than OVDD. The logic outputs will swing between OGND and OVDD. In LVDS Mode, OVDD should be connected to a 3.3V supply and OGND should be connected to GND.

Figure 13. Functional Equivalent of Digital Output Randomizer

•••

CLKOUT

OF

D15 ⊕ D0

D14 ⊕ D0

D2 ⊕ D0

D1 ⊕ D0

D0D0

D1

RAND = HIGH,SCRAMBLE

ENABLED

D2

D14

D15

OF

CLKOUT

RAND

2217 F13

LTC2217


LTC2217

252217f

Figure 14. Descrambling a Scrambled Digital Output

•••

D1

D0

D2

D14

D15

PC BOARD

FPGACLKOUT

OF

D15 ⊕ D0

D14 ⊕ D0

D2 ⊕ D0

D1 ⊕ D0

D0

2217 F14

LTC2217

Internal Dither

The LTC2217 is a 16-bit ADC with a very linear transfer function; however, at low input levels even slight imperfec-tions in the transfer function will result in unwanted tones. Small errors in the transfer function are usually a result of ADC element mismatches. An optional internal dither mode can be enabled to randomize the input location on the ADC transfer curve, resulting in improved SFDR for low signal levels.

As shown in Figure 15, the output of the sample-and-hold amplifi er is summed with the output of a dither DAC. The dither DAC is driven by a long sequence pseudo-random number generator; the random number fed to the dither DAC is also subtracted from the ADC result. If the dither DAC is precisely calibrated to the ADC, very little of the dither signal will be seen at the output. The dither signal that does leak through will appear as white noise. The dither DAC is calibrated to result in typically less than 0.5dB elevation in the noise fl oor of the ADC as compared to the noise fl oor with dither off, when a suitable input termination is provided (see Demo Board schematic DC996B).

Figure 15. Functional Equivalent Block Diagram of Internal Dither Circuit

+ –

AIN–

AIN+

S/HAMP

DIGITALSUMMATION

OUTPUTDRIVERS

MULTIBIT DEEP PSEUDO-RANDOM

NUMBERGENERATOR

16-BITPIPELINEDADC CORE

PRECISIONDAC

CLOCK/DUTYCYCLE

CONTROL

CLKOUTOF

D15•••

D0

ENC

DITHER ENABLEHIGH = DITHER ONLOW = DITHER OFF

DITHENC

ANALOGINPUT

2217 F15

LTC2217


LTC2217

262217f

Grounding and Bypassing

The LTC2217 requires a printed circuit board with aclean unbroken ground plane; a multilayer board with an internal ground plane is recommended. The pinout of the LTC2217 has been optimized for a fl owthrough layout so that the interaction between inputs and digital outputs is minimized. Layout for the printed circuit board should ensure that digital and analog signal lines are separated as much as possible. In particular, care should be taken not to run any digital track alongside an analog signal track or underneath the ADC.

High quality ceramic bypass capacitors should be used at the VDD, VCM, and OVDD pins. Bypass capacitors must be located as close to the pins as possible. The traces

connecting the pins and bypass capacitors must be kept short and should be made as wide as possible.

The LTC2217 differential inputs should run parallel and close to each other. The input traces should be as short as possible to minimize capacitance and to minimize noise pickup.

Heat Transfer

Most of the heat generated by the LTC2217 is transferred from the die through the bottom-side exposed pad. For good electrical and thermal performance, the exposed pad must be soldered to a large grounded pad on the PC board. It is critical that the exposed pad and all ground pins are connected to a ground plane of suffi cient area with as many vias as possible.


LTC2217

272217f

Layer 1 Component Side Layer 2 GND Plane


LTC2217

282217f


Layer 3 GND Layer 4 GND

LTC2217

292217f

Layer 5 GND Layer 6 Bottom Side


LTC2217

302217f

1225264748

12

233637

VC1VC2VC3VC4VC5

VE1VE2VE3VE4VE5

U3FI

N110

8

3.3V

EN12

EN34

EN58

EN78

EN I1N

I1P

I2N

I2P

I3N

I3P

I4N

I4P

I5N

I5P

I6N

I6P

I7N

I7P

I8N

I8P

O1N

O1P

O2N

O2P

O3N

O3P

O4N

O4P

O5N

O5P

O6N

O6P

O7N

O7P

O8N

O8P

3 22 27 46 13 4 5 6 7 8 9 10 11 14 15 16 17 18 19 20 21

2 4 6 8 10 12 14 16 18 20 22 24 26 28 30 32 34 36 38 40 42 44 46 48 50 52 54

1 3 5 7 9 11 13 15 17 19 21 23 25 27 29 31 33 35 37 39 41 43 45 47 49 51 53

56 58 60 62 64 66 68 70 72 74 76 78 80 82 84 86 88 90 92 94 96 98 100

55 57 59 61 63 65 67 69 71 73 75 77 79 81 83 85 87 89 91 93 95 97 99

3 22 27 46 13 4 5 6 7 8 9 10 11 14 15 16 17 18 19 20 21

U2LT

C221

7IUP

SENS

E

GND2

VCM

GND

VDD5

VDD6

GND7

AINP

AINN

GND1

0

GND1

1

ENCP

ENCN

GND1

4

VDD1

5

VDD1

6

D11+

D11–

D10+

D10– D9

+

D9–

D8+

D8–

CLKC

OUT+

CLKO

UT–

D7+

D7–

D8+

D8–

D5+

D5–

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16

48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33

NC

RAND

MODE

LVDS

OF+

OF–

D15+

D15–

D14+

D14–

D13+

D13–

D12+

D12–

OGND50

OVDD49

17

18

19

20

21

22

23

24

25

26

27

27

29

30

31

32

64

63

62

61

60

59

58

57

56

55

54

53

52

51

50

49

VDD17

GND18

SHDN

DITH

D0–

D0+

D1–

D1+

D2–

D2+

D3–

D3+

D4–

D4+

OGND31

OVDD32

1 2 3 4

8 7 6 5

U5FI

N110

1K8X

C15

0.1μ

FR41

100Ω

RIN–

GND

EN GND

RIN+ VC

C

DOUT

+

DOUT

–

2217

F16

ASSE

MBL

Y

*VER

SION

TAB

LE

U2BI

TSC8

R45

DC99

6B-E

LTC2

217I

UP16

4.7p

F86

.6

DC99

6B-F

LTC2

217I

UP16

1.8p

F18

2

DC99

6B-G

LTC2

216I

UP16

4.7p

F86

.6

DC99

6B-H

LTC2

216I

UP16

1.8p

F

C9-1

0

8.2p

F

3.9p

F

8.2p

F

3.9p

F

L1 56nH

18nH

56nH

18nH

182

R36,

44

86.6

43.2

86.6

43.2

T2

1MHZ

TO

70M

HZ

WBC

1-1L

B

1MHZ

TO

70M

HZ

WBC

1-1L

B

FREQ

UENC

Y

70M

HZ T

O 14

0MHZ

70M

HZ T

O 14

0MHZ

MAB

AES0

060

MAB

AES0

060

DC99

6B-I

LTC2

215I

UP16

4.7p

F86

.6

DC99

6B-J

LTC2

215I

UP16

1.8p

F

8.2p

F

3.9p

F

56nH

18nH

182

86.6

43.2

1MHZ

TO

70M

HZ

WBC

1-1L

B70

MHZ

TO

140M

HZ

MAB

AES0

060

C5 0.01

μF

C7 0.01

μF

C12

0.1μ

F

C60.

01μF

C4 8.2p

F

C30.

01μF

C13

2.2μ

F

R14

1000

Ω

R15

5Ω

C26

0.1μ

FC2

50.

1μF

C16

0.1μ

FC1

8OP

TC1

9OP

T

R44

86.6

Ω

R11

33.2

Ω

R12

33.2

Ω

R13

100Ω

R28

10Ω

R16

100Ω

R17

100Ω

R9 10Ω

R10

10Ω

R27

10Ω

C17

2.2μ

F

V CC

R37

100Ω

C8 4.7p

F

R5 5.1Ω R4 5.1Ω

R42

FERR

ITE

BEAD

R43

FERR

ITE

BEAD

R45

86.6

Ω

L1 56nH

••

• •

••

C10

8.2p

F

R36

86.6

Ω

R2 49.9

Ω

R1 49.9

Ω

C88.

2pF C2

0.01

μF

C10.

01μF

T1M

ABA-

0071

59-

0000

00

TP1

EXT

REF

T2

T3ET

C1-1

-13

J5 AIN

R810

00Ω

R6 1

000Ω

J3

R7 1000

Ω

3.3V

J7EN

CODE

CLOC

K

2 4 6

1 3 5

DITH

ER ON OFF

V CC

V CC

V CC

SHDN

RUN

2 4 6

1 3 5VD

D

GND

2 4 6

1 3 5

R24

100k

R26

4990

Ω

TP5

3.3V TP

2PW

RGN

D

C35

0.1μ

FC3

60.

1μF

C28

0.1μ

FC2

90.

1μF

C30

0.1μ

F

C20

0.1μ

F

C22

0.1μ

F

C34

0.1μ

F

C31

0.1μ

FC3

20.

1μF

C38

4.7μ

FC2

44.

7μF

C14

4.7μ

F1225264748

12

233637

VC1VC2VC3VC4VC5

VE1VE2VE3VE4VE5

U4FI

N110

8

3.3V

EN12

EN34

EN58

EN78

EN I1N

I1P

I2N

I2P

I3N

I3P

I4N

I4P

I5N

I5P

I6N

I6P

I7N

I7P

I8N

I8P

O1N

O1P

O2N

O2P

O3N

O3P

O4N

O4P

O5N

O5P

O6N

O6P

O7N

O7P

O8N

O8P

5 44 43 42 41 40 39 38 35 34 33 32 31 30 29 28 45 44 43 42 41 40 39 38 35 34 33 32 31 30 29 28

R30

100Ω

R23

100Ω

R22

100Ω

R21

100Ω

R20

100Ω

R19

100Ω

R18

100Ω

R31

100Ω

R40

100Ω

R39

100Ω

R38

100Ω

R35

100Ω

R34

100Ω

R33

100Ω

R32

100Ω

R29

4990

Ω

R25

4990

ΩU1

24LC

02ST

VCC

GND

6CL

6DA

WP A2 A1 A0

6 5 7 3 2 1

48

3.3V

C27

0.1μ

F

ARRA

YEE

PROM

R3 DNP

2 4 6

1 3 5VD

D

GND

ON OFF

J4

65

J1E

J1O

MEC

8-15

0-02

-L-D

-EDG

E_CO

NNRE

-DIM

J2 M

ODE

J9AU

X PW

RCO

NNEC

TOR


LTC2217

312217f

Information furnished by Linear Technology Corporation is believed to be accurate and reliable. However, no responsibility is assumed for its use. Linear Technology Corporation makes no representa-tion that the interconnection of its circuits as described herein will not infringe on existing patent rights.

PACKAGE DESCRIPTIONUP Package

64-Lead Plastic QFN (9mm × 9mm)(Reference LTC DWG # 05-08-1705)

9 .00 ± 0.10(4 SIDES)

NOTE:1. DRAWING CONFORMS TO JEDEC PACKAGE OUTLINE MO-220 VARIATION WNJR-52. ALL DIMENSIONS ARE IN MILLIMETERS3. DIMENSIONS OF EXPOSED PAD ON BOTTOM OF PACKAGE DO NOT INCLUDE MOLD FLASH. MOLD FLASH, IF PRESENT, SHALL NOT EXCEED 0.20mm ON ANY SIDE, IF PRESENT4. EXPOSED PAD SHALL BE SOLDER PLATED5. SHADED AREA IS ONLY A REFERENCE FOR PIN 1 LOCATION ON THE TOP AND BOTTOM OF PACKAGE 6. DRAWING NOT TO SCALE

PIN 1 TOP MARK(SEE NOTE 5)

0.40 ± 0.10

6463

12

BOTTOM VIEW—EXPOSED PAD

7.15 ± 0.10

7.15 ± 0.10

7.50 REF(4-SIDES)

0.75 ± 0.05R = 0.10

TYP

R = 0.115TYP

0.25 ± 0.05

0.50 BSC

0.200 REF

0.00 – 0.05

(UP64) QFN 0406 REV C

RECOMMENDED SOLDER PAD PITCH AND DIMENSIONSAPPLY SOLDER MASK TO AREAS THAT ARE NOT SOLDERED

0.70 ±0.05

7.50 REF(4 SIDES)

7.15 ±0.05

7.15 ±0.05

8.10 ±0.05 9.50 ±0.05

0.25 ±0.050.50 BSC

PACKAGE OUTLINE

PIN 1CHAMFER

C = 0.35

LTC2217

322217f

Linear Technology Corporation1630 McCarthy Blvd., Milpitas, CA 95035-7417 (408) 432-1900 ● FAX: (408) 434-0507 ● www.linear.com © LINEAR TECHNOLOGY CORPORATION 2007

LT 0108 • PRINTED IN USA

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Documents

LTC2217 - 16-Bit, 105Msps Low Noise ADC - analog.com · VID Differential Input Voltage (Note 7) 0.2 V VICM Common Mode Input Voltage Internally Set ... VOH High Level Output Voltage