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Interference Total Interference Total Internal Reflection Internal Reflection
MicroscopyMicroscopy
Particle 2D-tracking with high spatial and temporal resolution
x
Experimental Setup
50mm
200mm
Laser YAG (532 nm)
BS 50/50
M1100mm
PlanApo 60xNA=1.45
coverslip
bead
M2
M3
160mm200mm
50mm
BS 95/5
cameraM4
PhotoDiode
120cm
4cm
),( kE
),( kE
),( qkE AOM
AOM
/24MHz
=1e-9
5.63909778e+14Hz
5.63909774e+14Hz
PlanApo 60xNA=1.45
coverslip
bead
50mm
tiikx
tiikx
eE
eE
xtIEEtxI
2
cos1),( 0
2
915
6
1010
105
Hz
Hz
Interference of 2 colored beams
ITIRM-Progressive waves
x
z
coverslip
v
=24MHz=197nm=200nm
The light diffused by the bead is modulated at high frequency with the amplitude related to the position along the z axis and the phase proportional to the position along the x axis
xteItzxI
z
2
cos1,, 0
Synchronous Detection
AOM
Photo Diode
90deg
LowPass
LowPass
BW=300kHz
tcos
xtzA cos xzAVc cos
xzAVs sin
c
s
V
Varctgx
22
22
0ln2 cs VV
Vζz
x
t
Phase variation = movement along X
APD
AOM
(x)=2rad
A(z)=1.0V
)(2
)( ttx
)(cos)( 0 xtItI
Phase variation = movement along X
x
t
APD
AOM
(x)=4rad
A(z)=1.0V
)(2
)( ttx
)(cos)( 0 xtItI
/0 )(cos)( zextItI
)(2
)( ttx
Single 10 nm step
RMS noise ± 2 Å
Piezo: 10 nanometers steps
Testing ITIRM with a piezo
BW=300kHz
/0)( zeIzI
z
t
Amplitude variation = movement along Z
APD
AOM
A(z)=0.5V
(x)=2rad
)(lnln)( 0 tIItz
nm30200
/)(
0 )(2
cos),,( tzetxtItzxI
nm30200 nm2197
Time resolution ~ 2 µs
RMS noise ~ 2 Å
Drift ~ 1 nm/s
ITIRM-Summary
![Photoionization microscopy of the lithium atom: Wave ...robichf/papers/pra94.013414.pdf · Dealing first with the simpler case of photodetachment [10], the connection between interference](https://img.pdfslide.us/doc/110x75/5f115ebc054242738b3edb24/photoionization-microscopy-of-the-lithium-atom-wave-robichfpaperspra94013414pdf.jpg)
