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NABL ACCREDITEDLABORATORY No.
TOO01,T1572
LJJllt X10 : it 3m ~-~OO1:,
Form No. : TRF-2008WiIUI4?1 X10
toa-T;q;~fo(Bo) t, 0 ('15)-~ooo
ERTL(N)/90(4)-2K I' \ f;.u 6 ~'"'~: / /
Date: \ C; / OJ / ~Ol)
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1fRO '(1'( Cf>I '(
Government of India~ q ~ ~1~lfl1c61 ..t?lIt1~
Ministry of Communications & Information Technology~ ~1~)flIc6I fct1Wr
Department of Information Technology
+l1'1c6)Cf)'(UI~lfl1JT ~ ~ulq"l ~+lIUI'1 A~~IIC'1~
Standardisation Testing and Qualitv Certification Directorate~ ~ ~~ !oI~l~I~IIc:11(\j-ffi)
ELECTRONICS REGIONAL TEST LABORATORY (NORTH)(~ ~ ~ !oI~'i~I~IIt11 ~ ~ ~ ~ ~ ~, ~ ~ ~ ~ ~ - ~ eftQ~ ~ ~ Eft ~ em !oIt'<oIlfclt1!oI4'i~I~IIt1I)
[NSILaboratoryunder IECQ,IECEE-CB& NABIAccreditedLaboratory]~-~, ~ 3il~'ifllCf)&f?r~-II, ~ ~ qqoo~o
1fR'Q
S-Block, Okhla Industrial Area, Phase-II, New Delhi-110020INDIA
"$m . +91(11) 26384583,26387163Fax' +91(11) 26384583,26387163~ . [email protected])E-mail [email protected]~CSlt1I~C . http://www.stqc.nic.in\/\/"hc:.it" . httn'/Iwww dnr. nir. in
~ : +91(11) 26386219, 2638620626386205,26386118,26384400
Phone: +91(11) 26386219,2638620626386205,26386118,26384400
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Form No. : TRF-2008
WtA
)'dE)'dORANDU)'d
1. (ffi ~a:rur 1tqlt ~ ~ ~a:rur~~'I~I~II<.'11(~) 11T0-q°:1°>J01-1~~1I<.'1~,~~~, ~q~~ ~~I<.'1~,11ffift1~cpl~~\JfRTctr~ IThis test report issued by ELECTRONICS REGIONAL TEST LABORATORY(NORTH), under STQC Directorate, Department of Information Technology,Ministry of Communications andInformation Technology,Government of India.
2. (ffi ftqli ~i)I~I~II<.'11-B \Jf+1Tfcpir 1W ~ ~ ~ ~1ffUT~ ~ 4Rull~Cf>T~~ I (ffi ~ \3'1 \j ~ I~') tR ~ ~ -.=rtt~ \1fr\jff ~ ~ ~ x=f11R mfiffi~ 1W ~ I
This report is the record of results of test record only to the particular productssubmitted to the laboratory for testing and do not apply to other products even thoughdeclared to the identical.
3.1-1~~ICP,~01ff0>J0>J0(\3"0)~ ~ ~ 1tqlt ~ ~CPI~I'1ctr~ ~ ~ ~~ \j4xl~ fr1tqlt~vniTcBT\jfT~t IThis test report shall not be reproduced, except in full, unless written permission forthe publication of an approved abstract has been obtained from the Director,ELECTRONICS REGIONALTESTLABORATORY(NORTH),New Delhi.
4. ~1ffUT ftqli -B~ 4Rull~ cf>crc1~ ~ ~ 3m~ 3T~ ~ ~ ~ fr ~~ m-rrIThe results reported in this test report are valid at the time of and under the staticcondition or measurement.
5. '1fLR~ -B ~~ cfi~ ~o~o>Jo>Jo(\Jo)~ ~ \j\1~~I£n~ 6PJ IERTL (N), New Delhi shall not be liable for any change in the measurement data.
6. (ffi 1tqlt fctR:Ttcp'1-'11~ -B>rm-rrfcpir ~ cfi ~ -.=rtt~ d"~ ~ I~ I<.'1~ -B~ -.=rttcBT\jfT~ ~ I
This report is not to be used for any legal purposes and shall not be produced in courtof law. .
7. ~o~o-qo>Jo (\Jo) -B ~"CITi1 ~1ffUT q 3i~licp'1 ~ ~m ~ ~ t (1~ fctR:Tt
>fCPRcfi ~ cBTx-<!"IPIC1 -.=rtt ~ ~ ~ IERTL (N) provides third party testing and calibration services and does not approvedany products.
8. fcpx:fr>fCPRcfi ~ cfi ~ -Bf1~'!Iq, ~O~Oqo>Jo (\Jo) ~ ~ Cf>T f.1$J fr ~ q
1=fR:r~ IIn case of any disputes the decision of the Director, ERTL (N), New Delhi shall befinal and binding.
Government of India
Ministry of Communication & Information TechnologyDepartment of Information Technology
Standardisation Testing & Quality Certification DirectorateELECTRONICS REGIONAL TEST LABORA TORY (NORTH)
New Delhi-l 10020
TEST REPORTNUMBER
Name
Address
3.Manufacturer Name
Address
4.Descriptionof Item
NomenclatureMake ITrade Mark
Model No./Type No.Number of sample ISerial No.Year of ManufactureCondition
I5. Name & address where
testing carried out(In- houselS ubco ntracting/Singlewindow service/On-site/UsingCustomer Facilities
6. Applicable standardlspecification
7. Test Methodl
Operating Procedure8. Environmental
ConditionsTemperature
RelativeHumidit
9. No. of Annexures (If any)
(L). ~t.V~~t-9 Tested By
S.N. KachchhapSO'SB'
DATE OFRECEIPT OFITEM
15/09/2011 I 26/08/201111T060426/08/2011
DATEDATE OF IPAGE NO.COMPLETIONOF TESTING14/09/2011 I 1 of 4
MIS Power Pulse
E-128, First Floor, Dilshad Garden Indl Area,Delhi-l 10095.
MIS Power Pulse
E-128, First Floor, Dilshad Garden Indl Area,Delhi-l 10095.
Power SupplyPower PulsePP200TL-CM01No.39222011Good
ELECTRONICS REGIONAL TEST LABORATORY(NORTH)Okhla Industrial Area Phase-II,New Delhi-l 10020
Customer's
Standard
27:f:2°C
45-75%
Nil
~\\'Ap~B;
(Authorised Signatory)(Ashok Kumar)
Scientist' B'
~u)LIssuedBy
Ved Prakash
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C:o\t'tl1Jm1tof India
Mnistry ofCcmrunicatim&Infmmtim TechnolO6)'
~ofInfmmtim TechnolO6)'StaOOardisatimTesting &Q.Jality Certificatim Drectcrate
FLECIRCNCS REGlCNAL lESTlAOCRATCRY (l'{:R1H)N:w Thlhi-ll 0020
PAGE NO.
DATE15/09/2011 20f4
10. Details of Major Equipment used:
a \.'rJ
~'Vq
TestedByS.N.Kachchhap
- SO'SB'
(;\lC.w \1s'st~{d'f3y.I L--.Ved PrakashScientist'S'
SI. Nomenclature Make Model/ CalibrationNo. Type No. Valid UDto1 Power Analvser Voltech PM6000 21/03/2012
Gwerl1lrent of India
Mnistly of Ccmrunicatim &Inforrmtion TechnolO5Y
Ilputn~nt ofInforrmtion TechnolO5Y
StaOOardisation Te>ting & QJality Certification arectoo1te
HECIRCNCSREGICN\LTESTIAa:RAKRY(N::RIH)fuv Thlhi-llOO2O
TEST REPORTNUMBER
ERTL(N)/90( 4)-(20 11-12)/C0654
PAGE NO.DATE15/09/2011 30f4
I1.Test Results:
a \t-~0.(':C)
Tested ByS.N. Kachchhap
SO'SB'
I~~-LVedPrakash'Scientist"B"
SI. CI. No. Parameter Nominal Value/ Measured Value/ RemarksNo. Requirements Observations1.0 --- DC OUTPUT Shall be Satisfactory
At Cl 14.5:1::0.5V Output Voltage:Terminal 14.05 to 14.31VWith 160V,230V & 270V,50HZ Input
l.l --- DC OUTPUT Shall be SatisfactoryAt DRI 55:1::5V Output Voltage:Terminal 55.01 to 55.24VWith 160V,230V & 270V,50HZ Input
Cbvernrrrot ofIrrlia
MnistIy ofConmmicatim&Infmmtim TechnologyThp:n1:rn;mofInfmmtim Technology
Statxlardisatim Testing & QJality CertificatimIArectcrat:eElECIRCNCSREGICNALlESTIAOCRATIRY(NEIH)
1'-ew Thlhi-llOO2O
PAGE NO.DATE15/09/2011 40f4
12.Remarks: a) This Test Report pertains to item tested for the parameter(s) mentioned in thetest results at Sl. No.1 I.
b) Uncertainty has been taken into consideration while declaring the results of theparameters in the test report
~
@&~..TestedBy
S.N.KachchhapSO'SB'
An&oved By (Authorised Signatory)(Ashok Kumar)
Scientist "D"
&:~~ ~IssuedBy..JL--
FOR DIRECTOR~"" l iP", ~..°''''
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~~Aee~Ef)I'TA'TIONS
~NATIONAL
.. ~ >I~I~-1 ~ (~ ~ ~ ~) 1ffi(f GRT
~ ~ 3TI/~ ~ xtT9l9o:(~::(oo~~ ~~"d2:IT >lC-~lrqd>I~'I~Fm("j11
Approved Laboratory under NationalAccreditation Board for Testing andCalibration Laboratory (NABL India) forISO/TEC 17025:2005.
.. \jLjcpxulI~ ~ ~ ~ ~51r:i~~lcp fufctc;r
~1cI~~I-1GRT~ >I~I~I~II("j11
Approved laboratory for Calibration ofEquipment by Director General of CivilAviation,New Delhi.
.. fcIffl ~ I ~ ~, ~c1ctS(Ir:iCP
~("j("jltc ~ ~ fu<)~ 1=fRq) ~ ~~ '
GRT ''11'2.'\1>I~I~I~II("j1IApproved Laboratory of Bureau of IndianStandards for specific products (Energymeters,taximeters,ElectronicBallast)etc.
.. xtT~~~GRT~~~~&fUT~fu<)~ >I~I~I~II("j11
Approved Laboratory for testing energymeters by CBIP.
.. ~ ~IrdIcI~ fcMrr - 11R q 1=J1tR,~~ GRT~lxlT1l("jcp~ ~ tRT&fUT~ fu<)~ 'Y'1I'2.'\I >I~I~I~II("j1 IApproved laboratory for testing weighingmachine by Department of ConsumerAffairs-WeightandMeasure, New Delhi.
~
.. ~ ~ ~ ~ GRTfcIffl ~c1ctS(1r:icp ~~ tRT&fUT~ fu<)~ mt{f >I~I~I~II("j11
Recognized Laboratory by DGS & D fortesting of specified electronics products.
~
~INTERNATIONAL
.. ~c1ctS(l~rcMcp("j~ qft~ ~xtT~ ~~ CfflC1~ tRT&fUT>I~I~I~II("j11
Independent Test Laboratory under IECQsystem of interational Electro TechnicalCommission.
.. ~~xtT~~-xtT~~~3Rf7mW:Rr.,..,..J;\. ,'i~I&fUT>I~I~I~II("j11
Approved test Laboratory for Safety underIECEE-CB Scheme.
.. ~ xtT xtT (~ cp~r:icf>~I-1 cp~~11)~~~, ~~~/~~xtTtRT~~fu<) IFCC (Federal CommunicationsSommission), USA forEMI/EMC testing.
.. x-rNCfr~ 1=fRq)~ (00) GRT ~,mt{f >I~I~I~II("j11
Recognised Laboratory by Saudi ArabiaStandardOrganization (SASO).
~1ffUT : ~ooo9, ~9l;tl9~
TESTING: TOOOl,T1572
. ~ "fro : t'r'3m" ~-~oot:;
Form No. : TRF-2008
NABL ACCREDITED LABORATORY
~ mn3ii qft ~ ~OUR SERVICES AT A GLANCE
~: /CALIBRATION:~~cts(I~cpf1cpc1: "#I 0009 / Electrotechnical : COOOI1-j~f1cpc1:"#1 09l9l9/Mechanical: COI77
~/~ ~ : "#I099l9t:;/ Thermal/Optical Fiber: CO178
~1ffUT~
TESTING SERVICES:CP~I:t--Gqit&fUJ/ COMPONENT TESTING
~ ~ - (~"#I ~ q fI~cpr-s<tC>(~)Active-(IC discrete & Semiconductor devices)
~ 1)fuq(3m,~ "#I~) / Passive (R, L,C, Relays)
~ LRT!ffUT/ Battery testing
~ / Screening\j~cp'<UIqit&fUJ/EQUIPMENTTESTING
~ ~ ~ 9 ~, ~ ~ / Energy meters, 1<1>,3<1>
~ ~ q"#l~ ~ ~ / BallastandCFLLamps1:ffCI"X~Mct~If1<t<i (~, ~, x-2~c1I~V1>()
PowerElectronics(UPS, Inverter,Stabiliz~fS)~ ~Mct~If1<t<i/ ConsumerElectronics
~ !,j'h:Milcp~ q 3nir tCRfr~ .
I.T. Products & Auto/Taxi meters\o4~lq,<uft~ fcn><q'<1.ft~t11
ENVIRONMENTALIRELIABILITY
~ LRT!ffUT(-l9o"#l~ ~oo"#l) 3m ~ ~~%Climatic Test: (-70C to 300C) RH - 95%
~ ~: ~ q ~ / Vibration: Sine & Random
~. a111CfI:~~o ~V1I~4J~ ~ooo ~Capacity: 350 kgfto 5000 kgf
~ -q~~~~~ LRT!ffUT; ~ q wq) ~
Durability Test: Bump and shock Test etc.
~ cncn~ ~ : ~ dTCf,3ffif q ~ CfTLIlffi<$~ ~&:I(~: ~.t:;*:n*:(.'!I'1ft)Walk in Chamber available for dry heat, damp andcold temp. (size: 3.8*2.2*2.4M)
~~~/~~~/EMI/EMC~ ~ ~ <$f<;t<)~"#r"#r ~ ~
FCC listed site for EMC Measurement~ ~hS4~-s ~ <$f<;t<)~1cpl~cp~
Anechoic Chamber for Radiated emission~ 3m 'Ifff~ <$f<;t<)\;frtq ~ ~\;fr~ ~ dCP
GTEM cell upto 3 GHz for RS Measurement~ ~ ~3fcA ~4JXi"lxflX1~"I<SIc&dl3iR ~ 3fcA em LRT!ffUT
Testing for CE Marking FCC Iisting and EMC markwretqit&fUJ / SAFETY
~ ~ ldycp>(UI / House hold Appliances~ ~rcPC'{il~ ~ ldycp>(UI / Medical Equipment~, ~ UI~WIc6)~ / ITProducts~ ..~ ~ / Consumer Products~ ~ q~ q)C'Cdl-SI~~rctc.q
M;achines & low voltage Directive~ C"li~~{j/ Luminary~ cp"lI~-c.Xi q ~ / Components & devices~"#I t~, 00, ~ cfi~ emW!ffUT
Testing of products for CE Marking, SASO,SONCAPetc.
~q)'<1"1 ~DEVELOPMENTAL ASSISTANCE~ ~ ~/LRT!ffUT ,!~icp1 ~ ~
Providing facilities for product development /evaluation intesting.
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3i~~., CALIBRATION SERVICES:
~ ~c1cts()~rcMcpc13iR ~~f1cpc1 ~ ~ 3tR 31'R ~~ <$~ -q~ ~ ~ '<jf1~~t1~With assured traceability to national standard in '
electro-technical as well as thermal and mechanical inhouse and on-site calibration.
~ ~cfi"#l~(~Xi~~~)HPCC (High Precision Calibration Centre)
~ ~~~/OpticaIFibreCalibration~ ~ <$m~ ~ (f(I,<t<iXi-S~~)
Primary Standard for Temperatures (Fixed Point Cell)~ emm~ ~ (tvT~ - 9000 6IR) 3if1~~t1t11 -900 cfi cfi ~ ,
Primary Standard for Pressure (Range: 2 bar - 1000bar) uncertainty-100ppm.)
~ 1ffiR'r~ ~/~ "#I, ~.q ~ 3iR WR/~ (~o cficfi~) / Resistance, AC/DC -Volt,AC/DC Current andEreq. and Power Energy (50 ppm.)
~ ~~<SI~<:'>(~, 3Trir ~c1CfS(IPlCP/~ ~~~Y~<:' / Calibrator Calibration, Opto Electronic /Fibre optic equipment
~ 3m ~ xfI~ / R.L.C. Standard~ 3m~~'!I'o\;fr~~dCP
RF Calibration upto 40 G Hz~ CfTLIlffi, Gff(q q 11ffi, ~~ f1cp c1 ;s I~~~ 11
Temperature, pressure and Mass, MechanicalDimension.
~ ~ /OTHERSERVICES
~ ~ ~ q ~/3ii:~?~~~CPI cfi~ ~ &RTTCfffi q ~ ~~ ~ ' cfif<;t<)~ -q~ ~luality and knowledge support services with widecollection of related books, standards / specifications /data books etc. open to industry free of costs.
~ UlI'1<f>lfIti; ~ ~ cp;(:Forfurther Details,PleaseContact:
~ (3m ~)/~cn q;~ tJiR : 26386205,26386498,26386206,26386118HeadRM/CustomerServiceCellPh. : 26386205,26386498,26386206,26386118
~ : 91(11)26384583,26387163Fax: 91(11)26384583,26387163~ . [email protected]"Fm:lil'pr.llnnrJhtihlnc.nlc.ln~: http':/Iwww.stqc:nlc.inWebSites:http://www.stqc.nic.ln
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