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Light trapping in thin film silicon solar cells with mono and bidimensional photonic patterns A. Bozzola, M. Liscidini, L.C. Andreani Department of Physics A. Volta, University of Pavia. Via Bassi 6, 27100, Pavia, Italy. [email protected] Abstract: We investigate light trapping in thin film silicon solar cells with 1D and 2D photonic patterns. Absorbance and short-circuit current density are calculated with scattering matrix formalism and compared with Lambertian limits. © 2011 Optical Society of America OCIS codes: (040.5350) Photovoltaic, (050.5298) Photonic crystals. 1. Photonic light trapping and PV structures under investigation Light trapping has been suggested as a way to increase absorption of sunlight in PV cells since the ’80’s. It was first investigated by E. Yablonovitch, who derived an upper limit for light path enhancement for lambertian light trapping in bulk PV cells, where thickness is much larger than wavelength of solar radiation and absorption is sufficient weak [1]. In this case a maximum light path enhancement of 4n 2 with respect to single pass (with n real part of refractive index of the active material) can be derived using a Ray-Optics approach (hereafter it will be denoted as LL1 limit). In more recent years M.A. Green extended this result [2], giving analytical expressions (hereafter denoted as LL2 limit) for light path enhancement in the case of arbitrary absorbing active material. When thickness of active material is comparable with wavalength of incident light, these appoaches are no more applicable and absorbance has to be calculated solving Maxwell equation in a rigorous way. In the literature this case is often referred to as photonic light trapping [3]- [8]. In this work we evaluate its benefits in the thin film PV cells shown in Figs. 1a and 1b. The first (Fig 1a) is c-Si or a-Si PV cell of thickness d with a 1D pattern etched on the front surface (optical data for c-Si and a-Si are taken from Ref. [9]). The etching depth is denoted with h, the etching width with b, and the period of the 1D pattern is denoted with a. The etched grooves are filled with a transparent dielectric medium whose refractive index is taken to be 1.65. This upper layer serves both as anti reflection coating (ARC) and as passivating structure, and has fixed thickness equal to 70 nm. PV cells patterned with 2D square lattice are shown in Fig. 1b. The symbols are analogous to those of PV cells with 1D pattern, but now grooves are replaced with circular rods of radius r. As reference PV cell, a planar cell of the same thickness d , with an optimized, trasparent single-layer ARC with constrant refractive index is considered, and it is shown in Fig. 1c. 2. Theory and Numerical Methods We analyze the effects of photonic patterning on the absorbance A(E ) of the active material and on the short-circuit current density J sc of the PV cell, which are assumed as figures of merit. Assuming unit internal quantum efficiency for the processes of separation and collection of the photogenerated electron-hole pairs, J sc can be expressed as: J sc = e Z E g A(E ) dN dE dE = Z E g dJ sc dE dE , (1) where e is the electron charge, E g the energy gap of the active material (equal to 1.12 eV for c-Si and 1.25 eV for a-Si), dN dE is the incident solar photon flux, which has been modelized as a blackbody spectrum with temperature 5800 K and standard irradiance 100 mW/cm 2 , and dJ sc /dE are spectral contributions to short-circuit current density. The upper limit for integration in Eq. 1 has been set to 3.5 eV. The absorbance A(E ) of the active material is calculated solving Maxwell equations by means of rigorous coupled wave analysis and scattering matrix formalism [10]. PWC1.pdf 1 10/17/2011 12:06:44 PM Renewable Energy and the Environment Technical Digest © 2011 OSA

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Page 1: Light trapping in thin film silicon solar cells with ... - fisica.unipv.itfisica.unipv.it/nanophotonics/Pubs/Bozzola_OSA_2011_PWC1.pdf · 0.5 2D 1D LL1 1D LL2 Ref. 500 300 50 Thickness

Light trapping in thin film silicon solar cells withmono and bidimensional photonic patterns

A. Bozzola, M. Liscidini, L.C. AndreaniDepartment of Physics A. Volta, University of Pavia. Via Bassi 6, 27100, Pavia, Italy.

[email protected]

Abstract: We investigate light trapping in thin film silicon solar cells with 1D and 2Dphotonic patterns. Absorbance and short-circuit current density are calculated with scatteringmatrix formalism and compared with Lambertian limits.© 2011 Optical Society of America

OCIS codes: (040.5350) Photovoltaic, (050.5298) Photonic crystals.

1. Photonic light trapping and PV structures under investigation

Light trapping has been suggested as a way to increase absorption of sunlight in PV cells since the ’80’s. It was firstinvestigated by E. Yablonovitch, who derived an upper limit for light path enhancement for lambertian light trappingin bulk PV cells, where thickness is much larger than wavelength of solar radiation and absorption is sufficientweak [1]. In this case a maximum light path enhancement of 4n2 with respect to single pass (with n real part ofrefractive index of the active material) can be derived using a Ray-Optics approach (hereafter it will be denoted asLL1 limit). In more recent years M.A. Green extended this result [2], giving analytical expressions (hereafter denotedas LL2 limit) for light path enhancement in the case of arbitrary absorbing active material.When thickness of active material is comparable with wavalength of incident light, these appoaches are no moreapplicable and absorbance has to be calculated solving Maxwell equation in a rigorous way. In the literature thiscase is often referred to as photonic light trapping [3]- [8]. In this work we evaluate its benefits in the thin film PVcells shown in Figs. 1a and 1b. The first (Fig 1a) is c-Si or a-Si PV cell of thickness d with a 1D pattern etchedon the front surface (optical data for c-Si and a-Si are taken from Ref. [9]). The etching depth is denoted with h,the etching width with b, and the period of the 1D pattern is denoted with a. The etched grooves are filled witha transparent dielectric medium whose refractive index is taken to be 1.65. This upper layer serves both as antireflection coating (ARC) and as passivating structure, and has fixed thickness equal to 70 nm. PV cells patternedwith 2D square lattice are shown in Fig. 1b. The symbols are analogous to those of PV cells with 1D pattern, butnow grooves are replaced with circular rods of radius r. As reference PV cell, a planar cell of the same thickness d,with an optimized, trasparent single-layer ARC with constrant refractive index is considered, and it is shown in Fig. 1c.

2. Theory and Numerical Methods

We analyze the effects of photonic patterning on the absorbance A(E) of the active material and on the short-circuitcurrent density Jsc of the PV cell, which are assumed as figures of merit. Assuming unit internal quantum efficiencyfor the processes of separation and collection of the photogenerated electron-hole pairs, Jsc can be expressed as:

Jsc = e∫

Eg

A(E)dNdE

dE =∫

Eg

dJsc

dEdE, (1)

where e is the electron charge, Eg the energy gap of the active material (equal to 1.12 eV for c-Si and 1.25 eV fora-Si), dN

dE is the incident solar photon flux, which has been modelized as a blackbody spectrum with temperature 5800K and standard irradiance 100 mW/cm2, and dJsc/dE are spectral contributions to short-circuit current density. Theupper limit for integration in Eq. 1 has been set to 3.5 eV. The absorbance A(E) of the active material is calculatedsolving Maxwell equations by means of rigorous coupled wave analysis and scattering matrix formalism [10].

PWC1.pdf 1 10/17/2011 12:06:44 PM

Renewable Energy and the Environment Technical Digest © 2011 OSA

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b h

Fig. 1. Investigated PV cells’ strctures: PV cell with 1D pattern (a), PV cell with 2D square pattern(b) and reference planar cell (c). Countour plot of short-circuit current density Jsc for c-Si PV cells(thickness d=1 µm, period a=600 nm) with 1D pattern (d) and 2D square pattern (e). Countour plotof short-circuit current density Jsc for a-Si PV cells (thickness d=300 nm, period a=300 nm) with1D pattern (f) and 2D square pattern (g)

3. Results and Discussion

The analysis starts with a calculation of short-circuit current density Jsc varying at the same time both the etchingdepth h and the ratio b/a (for 1D patterns) or r/a (for 2D patterns), as it is shown in the contour plots of Figs. 1d-1gfor c-Si PV cells (thickness d=1 µm) and a-Si PV cells (thickness d=300 nm). Optimal configurations emerge whenboth reduction of reflection losses and wave coupling properties of the pattern are optimized. Reflectance R(E),absorbance A(E) and spectral contributions to short-circuit current density dJsc/dE are then analyzed. For absorbanceA(E) the comparison is also made with the single pass (SP in Figs. 2b and 2f) absorbance through a planar slab ofactive material with the same thickness d, with or without reflection losses, in order to compare with LL1 and LL2limits.Starting from reflectance, it is evident from the data of Figs. 2a and 2e that patterning reduces reflection losses over abroader spectral range with respect to simple single-layer ARC. Absorbance is increased due to both better impedancematching conditions and coupling into quasi guided modes (photonic light trapping), as it is shown in Figs. 2b and2f. The second feature is evident at low energy (below 2.75 eV for c-Si and below 2 eV for a-Si), and causes theabsorbance of c-Si PV cells with 2D pattern to be higher than both LL1 and LL2 limits when the exact energies forcoupling are matched. Furthermore, it is evident that 2D patterns are better than 1D patterns since, at a given energy,there are always more quasi-guided modes available for coupling [3]. The same conclusions hold also for spectralcontributions to short-circuit current density dJsc/dE which are shown in Fig. 2c and 2g. The effects of patterningare summarized in Figs. 2d and 2h where short-circuit current densities for optimal configurations are reported asfunctions of active material’s thickness d for c-Si and a-Si respectively. Patterning improves the PV cells’ performancewith respect to reference cells and the relative increase is higher for thinner cells. Furthermore 2D photonic patternsare better than simple 1D patterns due to better wave coupling properties.We have shown that patterned cells have better performance with respect to reference cell over a relatively large rangeof thicknesses (250 nm - 4 µm for c-Si, and 50-500 nm for a-Si), and this is due to both better optical impedancematching conditions (the effective refractive index of the patterned layer is between that of Si and that of the topARC) and to coupling of incident radiation into quasi-guided optical modes of the structures. Further strategies toimprove light trapping towards lambertian limits are being investigated.

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Renewable Energy and the Environment Technical Digest © 2011 OSA

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1,0 1,5 2,0 2,5 3,0 3,5

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/dE

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J sc (

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/cm

2 )

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c-Si

a-Si

Fig. 2. Calculated optical functions for c-Si PV cells (thickness d=1 µm, period a=600 nm): re-flectance R (a), absorbance (b), spectral contributions dJsc/dE (c) and short-circuit current densityJsc at optimal configurations (d). Calculated optical functions for a-Si PV cells (thickness d=300nm, period a=300 nm): reflectance R (e), absorbance (f), spectral contributions dJsc/dE (g) andshort-circuit current density Jsc at optimal configurations (h). Spectra (a-g) are smoothed for betterreadability.

References

1. E. Yablonovitch, Statistical ray optics, J. Opt. Soc. Am. A 72 (7), 899 (1982).2. M.A. Green, Lambertian Light Trapping in Textured Solar Cells and Light-Emitting Diodes: Analytical Solutions, Progr.

Photovolt: Res. Appl. 10, 235 (2002).3. Z. Yu, A. Raman and S. Fan, Fundamental limit of light trapping in grating structures, Optics Express 18 (103), A367

(2010).4. M. Kroll, S. Fahr, C. Helgert, C. Rockstuhl, F. Lederer, T. Pertsch, Employing dielectric diffractive structures in solar cells

a numerical study, Phys. Stat. Sol. (a) 205 (12), 2777 (2008).5. R. Dewan and D. Knippa, Light trapping in thin-film silicon solar cells with integrated diffraction grating, J. Appl. Phys.

106, 074901 (2009).6. S. Zanotto, M. Liscidini, and L.C. Andreani, Light trapping regimes in thin-film silicon solar cells with a photonic pattern,

Optics Express 18 (5), 4260 (2010).7. I. Prieto, B. Galiana, P.A. Postigo, C. Algora, L.J. Martnez, and I. Rey-Stolle, Enhanced quantum efficiency of Ge solar cells

by a two-dimensional photonic crystal nanostructured surface, Appl. Phys. Lett. 94, 191102 (2009).8. O. El Daif, E. Drouard, G. Gomard, A. Kaminski, A. Fave, M. Lemiti, S. Ahn, S. Kim, P. Roca i Cabarrocas, Heonsu Jeon,

C. Seassal, Absorbing one-dimensional planar photonic crystal for amorphous silicon solar cells, Optics Express, 18 (103),A293 (2010).

9. E.D. Palik, Handbook of Optical Constants of Solids (Academic, Orlando 1985).10. M Liscidini, D. Gerace, L.C. Andreani and J.E. Sipe, Scattering-matrix analysis of periodically patterned multilayers with

asymmetric unit cells and birefringent media, Phys. Rev. B 77, 035324 (2008).

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Renewable Energy and the Environment Technical Digest © 2011 OSA