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EE141 1 gital Integrated Circuits 2nd Devices Lecture 6. CMOS Device Lecture 6. CMOS Device (cont) (cont) ECE 407/507

Lecture 6. CMOS Device (cont)

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Lecture 6. CMOS Device (cont). ECE 407/507. Notice. Reading Assignment : chapter 1, chapter 3 (finish reading) Both hw1 and lab1 are on the website hw1 due in one week (next Thurs.) Lab1 due in two week (the Thurs. after next ). The Transistor as a Switch. The Transistor as a Switch. - PowerPoint PPT Presentation

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Page 1: Lecture 6. CMOS Device (cont)

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Lecture 6. CMOS Device (cont)Lecture 6. CMOS Device (cont)

ECE 407/507

Page 2: Lecture 6. CMOS Device (cont)

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NoticeNotice

Reading Assignment : chapter 1, chapter 3 (finish reading)

Both hw1 and lab1 are on the website hw1 due in one week (next Thurs.) Lab1 due in two week (the Thurs. after

next )

Page 3: Lecture 6. CMOS Device (cont)

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Page 4: Lecture 6. CMOS Device (cont)

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Page 5: Lecture 6. CMOS Device (cont)

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Page 6: Lecture 6. CMOS Device (cont)

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The Transistor as a SwitchThe Transistor as a Switch

VGS VT

RonS D

ID

VDS

VGS = VD D

VDD/2 VDD

R0

Rmid

ID

VDS

VGS = VD D

VDD/2 VDD

R0

Rmid

Page 7: Lecture 6. CMOS Device (cont)

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The Transistor as a SwitchThe Transistor as a Switch

0.5 1 1.5 2 2.50

1

2

3

4

5

6

7x 10

5

VDD

(V)

Req

(O

hm)

Page 8: Lecture 6. CMOS Device (cont)

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The Transistor as a SwitchThe Transistor as a Switch

Page 9: Lecture 6. CMOS Device (cont)

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Page 10: Lecture 6. CMOS Device (cont)

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Page 11: Lecture 6. CMOS Device (cont)

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C GCB_1 C GCS C GCD

Page 12: Lecture 6. CMOS Device (cont)

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Page 13: Lecture 6. CMOS Device (cont)

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Page 14: Lecture 6. CMOS Device (cont)

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Page 15: Lecture 6. CMOS Device (cont)

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Page 16: Lecture 6. CMOS Device (cont)

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Page 17: Lecture 6. CMOS Device (cont)

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Page 18: Lecture 6. CMOS Device (cont)

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The Sub-Micron MOS TransistorThe Sub-Micron MOS Transistor

Threshold Variations Subthreshold Conduction Parasitic Resistances

Page 19: Lecture 6. CMOS Device (cont)

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Threshold VariationsThreshold Variations

VT

L

Long-channel threshold Low VDS threshold

Threshold as a function of the length (for low VDS)

Drain-induced barrier lowering (for low L)

VDS

VT

Page 20: Lecture 6. CMOS Device (cont)

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Sub-Threshold ConductionSub-Threshold Conduction

0 0.5 1 1.5 2 2.510

-12

10-10

10-8

10-6

10-4

10-2

VGS (V)

I D (

A)

VT

Linear

Exponential

Quadratic

Typical values for S:60 .. 100 mV/decade

The Slope Factor

ox

DnkT

qV

D C

CneII

GS

1 ,~ 0

S is VGS for ID2/ID1 =10

Page 21: Lecture 6. CMOS Device (cont)

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Sub-Threshold Sub-Threshold IIDD vs vs VVGSGS

VDS from 0 to 0.5V

kT

qV

nkT

qV

D

DSGS

eeII 10

Page 22: Lecture 6. CMOS Device (cont)

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Sub-Threshold Sub-Threshold IIDD vs vs VVDSDS

DSkT

qV

nkT

qV

D VeeIIDSGS

110

VGS from 0 to 0.3V

Page 23: Lecture 6. CMOS Device (cont)

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Summary of MOSFET Operating Summary of MOSFET Operating RegionsRegions

Strong Inversion VGS > VT

Linear (Resistive) VDS < VDSAT

Saturated (Constant Current) VDS VDSAT

Weak Inversion (Sub-Threshold) VGS VT

Exponential in VGS with linear VDS dependence

Page 24: Lecture 6. CMOS Device (cont)

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Parasitic ResistancesParasitic Resistances

W

LD

Drain

Draincontact

Polysilicon gate

DS

G

RS RD

VGS,eff

Page 25: Lecture 6. CMOS Device (cont)

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Future PerspectivesFuture Perspectives

25 nm FINFET MOS transistor

Page 26: Lecture 6. CMOS Device (cont)

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New Tech: Silicon On Insulator (SOI)New Tech: Silicon On Insulator (SOI)

Silicon wafers are highly perfect : critically important for achieving high device yield.

But a more radical change may be needed in the material structure, processing method, or device design in order to enhance the circuit performance.

Page 27: Lecture 6. CMOS Device (cont)

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Why use SOIWhy use SOI

Extend the life of traditional silicon technology

Boost speed Reduce power consumption Solve some scaling difficulties

Page 28: Lecture 6. CMOS Device (cont)

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Transistor crosssectionTransistor crosssection

Page 29: Lecture 6. CMOS Device (cont)

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Page 30: Lecture 6. CMOS Device (cont)

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SOI material structure SOI material structure

Page 31: Lecture 6. CMOS Device (cont)

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Page 32: Lecture 6. CMOS Device (cont)

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Page 33: Lecture 6. CMOS Device (cont)

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Page 34: Lecture 6. CMOS Device (cont)

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Page 35: Lecture 6. CMOS Device (cont)

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Benefits of SOI -performanceBenefits of SOI -performance

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Benefits of SOI -- powerBenefits of SOI -- power

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Benefits of SOI – timing Benefits of SOI – timing

Page 38: Lecture 6. CMOS Device (cont)

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SiGe: Silicon Germanium SiGe: Silicon Germanium

Used to be inefficient in chip production Extremely high frequencies: 60Ghz Very little power usage 70% faster, 35% less power

Page 39: Lecture 6. CMOS Device (cont)

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Why SiGeWhy SiGe

The layer of latticed silicon and germanium added to the chips silicon layer increases the distance between

silicon atoms

Less force between atoms, easy for electrons to pass by with less resistance

IBM suggests combining SiGe and SOIIBM suggests combining SiGe and SOI

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Thermal problem with SiGeThermal problem with SiGe

The diagram above shows the effect of localized self-heating in the emitters(30C for 40mv)