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Lecture #5 1 Lecture #5 – VLSI Design Review Photolithography Patterning Silicon Process steps used are: Starts with Si wafer Thermal oxidation Photoresist deposition UV light exposure through Mask Chemical etching for removal of Photoresist oxide layer Pattern formed Process used to transfer patterns to each layer of

Lecture #5 – VLSI Design Review

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Lecture #5 – VLSI Design Review. Photolithography Patterning Silicon Process steps used are: Starts with Si wafer Thermal oxidation Photoresist deposition UV light exposure through Mask Chemical etching for removal of Photoresist oxide layer Pattern formed. - PowerPoint PPT Presentation

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Page 1: Lecture #5 – VLSI Design Review

Lecture #5 1

Lecture #5 – VLSI DesignReview

Photolithography

Patterning Silicon Process steps used are:

Starts with Si wafer Thermal oxidation Photoresist deposition UV light exposure through Mask Chemical etching for removal of

Photoresistoxide layer

Pattern formed

Process used to transfer patterns to each layer of IC

Page 2: Lecture #5 – VLSI Design Review

Lecture #5 2

NMOS Transistor

Polysilicon Gate

Field Oxide

(Thick Oxide)

Gate Oxide

(Thin Oxide)

Page 3: Lecture #5 – VLSI Design Review

Lecture #5 3

Patterning Silicon

Si - Substarate

Silicon Di-oxide

Page 4: Lecture #5 – VLSI Design Review

Lecture #5 4

Process steps for Patterning

Light Sensitive organic polymer

Grow Crystal Saw

Silicon Wafer

Silicon Wafer

Oxide Layer SiO2 1m

Silicon Wafer

Oxide Layer

Photoresist

Bare silicon Wafer

Grow Oxide Layer

Spin coating with Photoresist –1mm

Thermal Oxidation

Acid-resistant

Soluble once exposed to UV

Light

4-12” dia <1mm

Page 5: Lecture #5 – VLSI Design Review

Lecture #5 5

Pattern formed on a glass plate (Mask) Transparent & Opaque

regionsPositive Photoresist Non exposed regions hardened

higher resolution

(hardened)Silicon Wafer

Oxide LayerExposed soluble

Expose to Ultraviolet Light

Page 6: Lecture #5 – VLSI Design Review

Lecture #5 6

Etching continued to remove SiO2

Pattern formed

Silicon Wafer

Oxide Layer

Silicon Wafer

Silicon Wafer

Soluble photoresist is chemically removed (etching) using HF acid

High-temp. plasma

removes hardened

photoresist

Page 7: Lecture #5 – VLSI Design Review

Lecture #5 7

Patterned Silicon

Si - Substarate

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Lecture #5 8

(l)

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Lecture #5 9

n-well CMOS Process

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Lecture #5 10

Grow Crystal Saw

The CMOS Process – Photolithography (1)

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The CMOS Process – Photolithography (2)

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Lecture #5 12

Impurity Implantation

Mask 1: N-well Diffusion

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Mask 2: Define Active Regions

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Mask 3: Polysilicon Gate

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Mask 4: n+ Diffusion

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Mask 5: p+ Diffusion

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Mask 6: Contact Holes

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Mask 7: Metallization

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Cross Section of a CMOS Inverter

Page 20: Lecture #5 – VLSI Design Review

Lecture #5 20

P-Substrate

P

N

P

N

N-Channel

P-Channel

L

W

L

IN

GND

OUT

Vdd

S

G

D

D

G

S

N-Well

Page 21: Lecture #5 – VLSI Design Review

Lecture #5 21

Layout of CMOS ICs

Translating the circuit schematic into a set of patterned layers in a silicon substrate

Layout drawings are used to generate the masks needed for fabrication

Every layer is described by geometrical objects of specified shape and size obeying certain rules (Design Rules).

Each layer is described by a distinct color

Page 22: Lecture #5 – VLSI Design Review

Lecture #5 22

Why do we need design rules?

Masks are tooling for manufacturing.Manufacturing processes have inherent

limitations in accuracy.Design rules specify geometry of masks

which will provide reasonable yields.Design rules are determined by

experienceDesign rule violation may result in a

non-functional circuit

Page 23: Lecture #5 – VLSI Design Review

Lecture #5 23

Manufacturing ProblemsPhotoresist shrinkage, tearing.Variations in material deposition.Variations in temperature.Variations in oxide thickness.Impurities.Variations between lots.Variations across a wafer.

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Lecture #5 24

Transistor Problems

Variations in threshold voltage: oxide thickness; ion implantation; poly variations.

Changes in source/drain diffusion overlap.Variations in substrate.

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Lecture #5 25

Wiring problems

Diffusion: changes in doping -> variations in resistance, capacitance.

Poly, metal: variations in height, width -> variations in resistance, capacitance.

Shorts and opens:

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Lecture #5 26

Oxide problemsVariations in height.Lack of planarity -> step coverage.

metal 1metal 2

metal 2

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Lecture #5 27

Via ProblemsVia may not be cut all the way through.Undersized via has too much resistance.Via may be too large and create short.