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1 MECH 466 Microelectromechanical Systems University of Victoria Dept. of Mechanical Engineering Lecture 3: Basic Concepts: Semiconductors © N. Dechev, University of Victoria 2 Silicon Structural Properties Crystal Planes Bulk Micromachining Semiconductor Properties Doped Semiconductors Overview © N. Dechev, University of Victoria

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1

MECH 466Microelectromechanical Systems

University of VictoriaDept. of Mechanical Engineering

Lecture 3:Basic Concepts:Semiconductors

© N. Dechev, University of Victoria

2

Silicon Structural Properties

Crystal Planes

Bulk Micromachining

Semiconductor Properties

Doped Semiconductors

Overview

© N. Dechev, University of Victoria

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3

Silicon Structural Properties

Silicon solid exists in three different forms:

AmorphousRandomly oriented atoms,e.g. Glass

PolycrystallineCrystal grains/domains oriented in random directions, which meet at grain boundaries

CrystalEntire solid is made of an ordered array of atoms

© N. Dechev, University of Victoria

4

Silicon Structural Properties

Silicon crystal has a cubic lattice.

Silicon atoms form covalent bonds with four adjacent atoms, in the form of a diamond lattice structure.

Si Atoms

CovalentBonds

Note: Bonds outside of Cubic Lattice are not shown

© N. Dechev, University of Victoria

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5

Silicon Structural Properties

Silicon exhibits different properties along different crystal planes.

This includes properties such as E (young’s modulus), electron mobility, piezoresistivity, and chemical etch rates (for fabrication purposes). z

x

ya a

a

© N. Dechev, University of Victoria

6

Miller Indices, Planes

The Miller Indices are a common notation used to identify the planes and directions in a crystal lattice.

To determine the Miller Index of a plane, we use the following procedure:

z

x y

a

Step 0: Identify the plane of interest. For example, the plane shown in pink is one face of the cubic structure.

© N. Dechev, University of Victoria

Crystal Plane (100)

Step 3: Reduce these numbers to the smallest set of integers h,k and l, by multiplying all by a, which yields (1 0 0).Parentheses are used to denote a crystal plane.

Step 2: Take the reciprocals of the three numbers found in step 1.In this example: 1/a , 1/∞ (=0), and 1/∞ (=0).

Step 1: Identify the intercepts of the plane with the x, y and z axes. In this example, we have x = a, y = infinite, z = infinite.

x = a

y = ∞

z = ∞

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7

Miller Indices, Planes

Since atoms are symmetrical, similar planes have identical material properties.

z

x y

Families of similar planes are denoted with braces {}. Therefore, these three planes belong to the family of planes {100}.

(100)

(001)

(010)

Lattice View of {100} family of planes

© N. Dechev, University of Victoria

8

Miller Indices, Planesz

xy

Crystal Plane (110)

(110)

Lattice Top View of {111} family of planes

z

xy

(111)

Crystal Plane (111)

Lattice Top View of {110} family of planes

© N. Dechev, University of Victoria

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9

Miller Indices, Directions

[100]

Crystal Direction [100]

Step 1: Find the parallel vector that begins at the origin.

© N. Dechev, University of Victoria

Step 2: Reduce the three coordinates to the smallest set of integers [h,k and l]. For example, consider the vector originates at (0,0,0) and ends at (0,1,0). Therefore, the Miller Index direction is [0,1,0].

All collectively in direction family <100>.

[001]

Crystal Direction [001]

[010]

Crystal Direction [010]

Note that in a cubic lattice, such as Si, a vector with Miller Index [hkl] is always perpendicular to plane (hkl).

10

Miller Indices, Directions

z

x y

[110]

z

xy

Direction family <111>.Direction family <110>.

[111]

© N. Dechev, University of Victoria

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11

Image of Atomic Structure of Silicon Crystal along the {111} plane[image from Dept. of Synchrotron Radiation Research, in Lund]

Silicon Structural Properties

Image of Atomic Structure of Silicon Crystal along the {100} plane[image from Dept. of Synchrotron Radiation Research, in Lund]

We can view the actual atomic structure of a silicon crystal using SPM (Scanning Probe Microscopy) technology. Interestingly, the ‘probes’ used in SPM are made using ‘bulk micromachining’ of silicon crystal.

© N. Dechev, University of Victoria

12

Main components of the SPM system. Fig. 14.1 from textbook [Chang Liu]

Scanning Probe Microscopy

The basic operation of the SPM technique is shown below.

Chapter 14 in the textbook provides a good overview of SPM technology.

© N. Dechev, University of Victoria

!"#$%&

$'&()*&%&+,-'+!+"..&-

+)#$/,&-

,'$ +".,'%&0&-1!$-'.2

3&&45"+6,)1+).,-)%0&-,'+"%1,'$$)!',').

4'!$%"7

#&"!/-&#&.,!"#$%

%&'()(*#('+

,(-./0+-)%1(/,02$%

#%-'

)/(3

%0,

,#0$,

(3%

$"2,0$,4+"1%

2"2$"2,0$,+"1%

Interaction Forces used with SPM techniqes. Fig. 14.2 from textbook [Chang Liu]

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13

Image of SPM probes, Fig 14.12 in textbook[Chang Liu]

Scanning Probe Microscopy

SEM images of passive and active SPM probes.

© N. Dechev, University of Victoria

Image of SPM probe with thermal actuators, Fig 14.17 in textbook [Chang Liu]

14

MEMS Microfabrication

There are two main microfabrication methods for MEMS:

•Bulk Micromachining, which is based on the etching and bonding of thick sheets of material such as silicon oxides and crystalline silicon.

•Wet Etching (Anisotropic, or Isotropic)

•Dry Etching (Plasma Etching, Reactive Ion Etching)

•Surface Micromachining, which was discussed in the preceding lecture.

© N. Dechev, University of Victoria

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Bulk MicromachiningAnisotropic Wet Etching

Silicon Substrate

Wafer inserted into High Temp Furnace with oxygen gas, to grow oxide layer

© N. Dechev, University of Victoria

16

Bulk MicromachiningAnisotropic Wet Etching

Silicon Substrate

HF Acid Etch

Oxide is patterned with photolithography (Not Shown)

Oxide

© N. Dechev, University of Victoria

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Bulk MicromachiningAnisotropic Wet Etching

Silicon Substrate

Wet Silicon Etchant

© N. Dechev, University of Victoria

18

Bulk MicromachiningAnisotropic Wet Etching

Silicon Substrate

54.7˚

<100>

<111>

© N. Dechev, University of Victoria

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19

Bulk MicromachiningAnisotropic Wet Etching

Wet Etching of Rectangle Mask,with edges oriented along <110> vectors

Computer simulations of Anisotropic Wet Etching, using ACES freeware.

Wet Etching of Rectangle Mask,with edges oriented along <100> vectors

Wet Etching of Oval Mask,with major axis oriented along [100] vector© N. Dechev, University of Victoria

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Bulk MicromachiningDry Etching (Reactive Ion Etching)

Silicon Substrate

HF Acid Etch

Oxide is patterned with photolithography (Not Shown)

© N. Dechev, University of Victoria

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21

Bulk MicromachiningDry Etching (Reactive Ion Etching)

Silicon Substrate

Reactive Ion Etch

© N. Dechev, University of Victoria

22

Bulk MicromachiningDry Etching (Reactive Ion Etching)

Silicon Substrate

<100>

© N. Dechev, University of Victoria

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23

Bulk Micromachining

SEM images of samples:

Anisotropic Wet Etching using KOH withwafer edge aligned along <110> vectors

[Asia Pacific Microsystems, Inc.]

Deep Reactive Ion Etching (RIE) using Bosch Process[Tyndall National Institute]

Gas Phase Etching (Anisotropic Dry Etching) using XeF2© N. Dechev, University of Victoria

24

Semiconductor Properties

A semiconductor is a material whose conductivity lies between that of a perfect insulator and that of a perfect conductor.

Additionally, the conductivity of a semiconductor can be ‘controlled’ by various means such as:

- intentionally introduced impurities (doping)- externally applied electric fields- temperature variations- mechanical stress- radiation (light)

These methods of control have allowed for semiconductors to be used as thousands of electronic devices, such as:

- diodes- bipolar transistors, field effect transistors (FET)- temperature sensors- force and pressure sensors- solar cells and photo-transistors

© N. Dechev, University of Victoria

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25

Semiconductor Properties

The conductivity of a semiconductor is determined by the number of ‘free charged particles’ in the bulk, and their ability to move through the bulk (mobility).

There are two types of charge carriers:

- electrons

- holes

An ‘intrinsic semiconductor’ is a perfect semiconductor crystal with no impurities or lattice defects.

For equilibrium conditions, for an intrinsic semiconductor:

n = p ≡ ni

© N. Dechev, University of Victoria

26

Semiconductor Properties

An ‘extrinsic semiconductor’ is a semiconductor with an impurity. Usually a semiconductor that has been intentionally doped to create either:

- a surplus of electrons in the bulk (n-type material)usually done with phosphorus doping

- a surplus of holes in the bulk (p-type material)usually done with boron doping

Periodic Table (Right Side Only)Doping Atoms

[image from HyperPhysics, C.R. Nave, Georgia State]© N. Dechev, University of Victoria

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Semiconductor Properties

N-Type Silicon Semiconductor[image from HyperPhysics, C.R. Nave, Georgia State]

P-Type Silicon Semiconductor[image from HyperPhysics, C.R. Nave, Georgia State]

© N. Dechev, University of Victoria

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Semiconductor Properties

Conductivity of a semiconductor is the ability to conduct electric current:

where:

Note: Do not confuse σ (conductivity) with σ (stress)

do not confuse E (electric field) with E (Young’s modulus)

© N. Dechev, University of Victoria

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29

Semiconductor Properties

Conductivity associated with p-type silicon is:

(eq. 3.16) where:

Conductivity associated with n-type silicon is:

(eq. 3.15) where:

© N. Dechev, University of Victoria

30

Semiconductor Properties

Conductivity calculations are based on theory and experimentally determined coefficients.

We will not cover the details of ‘semiconductor conductivity theory’ in this course. However, some useful information and references are provided in the course textbook, pages 49-56.

Determining the conductivity parameters when fabricating semiconductors, or doping materials to create piezoresistive devices is critical.

For the remainder of the course, the ‘conductivity’ or ‘resistivity’ valves for semiconductors will be provided.

© N. Dechev, University of Victoria

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31

Techniques for Doping of Silicon

Doped silicon can be created in one of two methods:

Using the ‘crystal growth process’, the doping element is introduced and will be distributed uniformly throughout the bulk of the solid.

Using a photolithographic method, selected areas can be doped using a diffusion process or ion implantation.

© N. Dechev, University of Victoria

32

Diffusion Doping

Diffusion doping is done using a deposition and baking process.

(a) A temporary mask is patterned onto the silicon.(b) A layer containing a high concentration of the desired dopant element is deposited onto the material (for example, PSG).(c) The chip is then baked at an elevated temperature, which promotes the diffusion of the dopant atoms into the exposed silicon surfaces.(d) The dopant layer is removed by chemical etching.(e) Finally, the mask layer is removed by chemical etching.

© N. Dechev, University of Victoria

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Ion Implantation

Ion implantation involves the ‘insertion’ of ions of one material, into another.

(a) The implant material is ‘energized’ to create charged ions (single atoms).(b) The ions are accelerated using an electric field toward the target.(c) (Optional) a ‘separation’ magnetic field can be applied to remove impurities.(d) (Optional) a deceleration electric field may be used to control the implant energy.(e) This mechanical implantation creates damage to the crystal structure, therefore, a thermal annealing process follows implantation to ‘heal’ some of these defects.

© N. Dechev, University of Victoria

Ion Implantation Process [image from Wikipedia]

34

Sheet Resistivity

A concept used to determine the resistance of the doped paths in the silicon. The resistance of the tracks can be determined based on the track geometry and the resistivity.

Consider the following diagram:

Sheet Resistivity units:

Using Ohm’s Law:

Voltage is defined as:

Current is defined as:

© N. Dechev, University of Victoria

t

wL

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35

Sheet Resistivity

Therefore:

Recall, resisitivity is defined as:

Hence:

Therefore:

However, we can redefine this formula in terms of a new quantity known as ‘sheet resistivity’ by rewriting the above equation as:

Therefore, the ‘sheet resistivity’ is defined as:

© N. Dechev, University of Victoria

t

wL

36

Sheet Resistivity

Example of Sheet Resistivity:

© N. Dechev, University of Victoria

SEE CLASS NOTES FOR SOLUTION