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    Lecture22

    SurfaceCharacterization

    Unlessotherwisenoted,sourceInformationforthefollowingslides:

    1) B.Ratner,A.Hoffman,F.Schoen,andJ.Lemons:BiomaterialsScience,2nd edition(SanDiego:ElsevierAcademicPress.2004).

    2) Modifiedfrom:Anne Mayes3.051J/20.340JMaterialsforBiomedical

    Application,MIT,http://ocw.mit.edu,

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    SurfaceCharacterizationof

    Biomaterials:Vacuum

    Techniques

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    ray otoe ectron pectroscopy

    (XPS)

    Physicalbasis:photoionizationandemissionof

    core

    level

    electrons

    upon

    irradiation

    with

    X

    rays XPSspectrallinesareidentifiedbytheshellfromwhichtheelectronwasejected(1s,2s,2p,etc)

    Surfacesensitive(1 10nm)

    Quantitative countingelectrons!But accuracydependsonthequalityoftheatomicsensitivity

    factors

    Sampledegradationisanissue!

    Enablesanalysisofcomplexsurfacechemistries

    Automatedhigh

    throughput

    (at

    least

    for

    high

    vacuumtechniques)

    Valence Band

    Conduction Band

    Ejected PhotoelectronIncident X-ray

    2p

    2s

    1s

    L2,L3

    L1

    K

    Free e-

    level

    Fermi

    level

    SpecBEhKE

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    AreaunderpeakIiproportionalto

    numberof

    electrons

    ejected

    (&

    to

    numberofatomspresent)

    Onlyelectronsinthenearsurface

    regionescapewithoutlosing

    energybyinelasticcollision

    Sensitivity:dependsonelement.

    Elementspresentinconcentrations

    >0.1atom%aregenerally

    detectable(H&Heexceptions,

    nondetectable)

    XPS

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    High

    Resolution

    XPS

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    High

    Resolution

    XPS

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    Quantification:

    Peak

    FittingHigh Resolution C 1s and O 1s Spectra of p(S-co-MMA) Brush

    2)/(3

    )/(8

    exp

    exp

    CO

    COFMMA1)/(3

    )/(8

    expCCO

    expCCO

    II

    IIFMMA

    Survey Method High Resolution Method

    where is the O/C ratio

    obtained from XPSexp)/( CO where is the ratio

    of the carbonyl C to the total C

    )/( CCO II

    Ton-That et al. Polymer2001, 42, 1121.

    m n

    OO

    CH3

    C2

    C2 C1C1

    C4C

    5

    C3

    C2

    m n

    OO

    CH3

    O1O2

    C1

    C2C3

    C5

    C4 O1O2

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    XPS CopolymerComposition

    Gradient X-ray photoelectron spectroscopy (XPS) was used to map the surface

    composition of the statistical copolymer brush gradients

    Spectra collected at 4 mm intervals along the gradient substrate

    Survey Spectra

    C 1s

    High Resolution Spectra

    O 1s

    C 1s envelope

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    XPS CopolymerComposition

    Gradient X-ray photoelectron spectroscopy (XPS) was used to map the surface

    composition of the statistical copolymer brush gradients

    Spectra collected at 4 mm intervals along the gradient substrate

    Survey Spectra

    C 1s

    O 1s

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    DepthProfilingwithXPSatDepths>10nm

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    SIMS

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    SIMS

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    SIMS

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    SIMSModesofOperation

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    SIMSModesofOperation:

    Exampleof

    Static

    Mode

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    SIMSModesofOperation:ExampleofDynamicMode