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January 29th, 2015 Laser Test of RIN, Linewidth and Optical Noise Parameters Official Keysight solution partner Official SYCATUS supplier & Keysight system integrator Webcast Host Makoto Shikata President, Sycatus Corporation Technical expert Jack Dupre OgMentum Incorporated Applications specialist Jake Weise President, OgMentum Inc. Lead presenter Page 1

Laser Test of RIN, Linewidth and Optical Noise Parameters · January 29th, 2015 Laser Test of RIN, Linewidth and Optical Noise Parameters Official Keysight solution partner Official

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January 29th, 2015

Laser Test of RIN, Linewidth and

Optical Noise Parameters

Official Keysight solution partner

Official SYCATUS supplier & Keysight system integrator

Webcast Host

Makoto Shikata President, Sycatus Corporation Technical expert

Jack Dupre OgMentum Incorporated Applications specialist

Jake Weise President, OgMentum Inc. Lead presenter

Page 1

Outline

Telecom and Datacom demands on laser noise performance

Types of Laser Noise

Measuring RIN

Measuring Optical Frequency Noise and Linewidth

Presentation summary

Page 2

Telecom and Datacom Demands on Lasers

• Multilevel Modulation → RIN is an important factor in system SNR

– PAM4

• Complex Modulation → demands for Narrower Linewidth Lasers

– QPSK: <5.7 MHz* → Actual Demands: < 500 kHz

– 16QAM: <2.0 MHz* → Actual Demands: < 200 kHz

– 64QAM: <560 kHz* → Actual Demands: <50 kHz

*T. Pfau, S. Hoffmann, R. Noé, IEEE-JLT, vol. 27, no. 8, 2009, pp 989-999, 28 GBaud, 1 dB penalty @ 10-3

• OIF ITLA MSA → imposes new requirements on Laser Linewidth

– Lorentzian linewidth and white noise component

• ITLA / μ-ITLA→ issue of Interference by Various Noise Sources

– Dither Control(wavelength locking)

– EMI caused by Control Electronics

Page 3

Types of Laser Noise

Page 4

Types of Laser Noise

• Intensity noise

– Fluctuations in the optical intensity

– Common measurement parameter:

Relative Intensity Noise, RIN*

• Optical frequency noise

– Fluctuations in the optical frequency

– Common measurement parameters

Optical Frequency Noise* (the fundamental measurement parameter)

Linewidth*

Degree of coherence

Electric field spectrum

*Addressed in this presentation

Page 5

Cause of Laser Intensity Noise

• Fluctuations in the optical intensity due to interference between the

stimulated emission and spontaneous emission

– Stimulated emission: Consistent frequency (wavelength) and phase

– Spontaneous emission: Dispersed frequency (wavelength)

• Electrical signal demodulations are detected as a Beat Noise

Stimulated emission

Spontaneous emission

Limits system SNR

Beat Noise

Page 6

RIN - Relative Intensity Noise

• Parameter representing intensity fluctuations (optical intensity noise) of a

laser signal

• Normalized by average optical power, expressed as per unit frequency.

Average optical power

P

P RIN 2

2 D = [ ] Hz dB

P D

P

Optical intensity noise

:

:

Attenuator DUT Isolator RIN Measurement

Instrument

Loss

RIN does not depend on loss of the transmission medium

RIN can limit system SNR

Page 7

Optical Frequency Noise

• The power spectrum density of

instantaneous frequency of laser

electric field

– The instantaneous frequency is

time derivation of phase

– The unit is Hz2/Hz

• Frequency Noise results from

laser 1/f and white noise plus

spurious components from

electronic drive circuitry P

hase

Der

ivat

ion

F

ourie

r T

rans

form

atio

n

Ele

ctric

Fie

ld

Time

Inst

anta

neou

s O

ptic

al F

requ

ency

Time

Opt

ical

Fre

quen

cy N

oise

Frequency

 Optical Frequency Noise

Spectrum 

Page 8

Laser Linewidth

• Full Width at Half Maximum of Electric Field Power Spectrum of a Laser

– Impossible to measure directly

• No OSA with enough resolution (RBW : kHz)

Ele

ctric

Fie

ld P

SD

Optical Frequency

Laser Linewidth

3dB

• Narrower linewidth required for the latest complex modulation schemes

• OIF-ITLA-MSA-01.2 specifies Lorentzian linewidth

Ele

ctric

Fie

ld

Time

Fourier

Transformation

Page 9

Measuring RIN

Page 10

Challenges of RIN Measurement

• It is necessary to remove the thermal noise and the shot noise from total

noise power density

– Thermal noise: The noise measured in a dark condition

– Shot noise: Calculated from the average photocurrent

• It is necessary to accurately determine the optical to electrical conversion

frequency response of total system

– The system measures amplified total electrical noise power density

– From the electrical noise power density, the optical noise current density at the optical

input is calculated

0

22

2

2222

ˆˆ

ˆˆˆˆ

D=D

=D

DDD=D

AverageITotalThermal

AverageShot

ShotThermalIntensityTotal

ii

qIi

iiii

Page 11

-170

-165

-160

-155

-150

-145

-140

0 1000 2000 3000 4000 5000 6000 7000

Frequency (M Hz)

RIN (dB

/Hz)

-6dBm

-3dBm

0dBm

+3dBm

+6dBm

Effects of Thermal Noise and Shot Noise in RIN Measurements

• Thermal noise and shot noise must be removed correctly.

-170

-165

-160

-155

-150

-145

-140

0 1000 2000 3000 4000 5000 6000 7000

Frequency (M Hz)

RIN (dB

/Hz)

-6dBm

-3dBm

0dBm

+3dBm

+6dBm

without Thermal Noise removal, measurement

results vary significantly with received optical

power variation

without Shot Noise removal , measurement

results vary significantly with received optical

power variation

Page 12

Accurate Characterization of O/E Conversion Efficiency

• Signal analyzer measures amplified total electrical noise power density

• RIN measurement needs optical noise current density at photodetector

• Derivation of optical noise current density requires the O/E conversion efficiency

• SYCATUS developed a unique method for the characterization of total O/E conversion

efficiency in Keysight signal analyzers including frequency response of :

- O/E conversion efficiency of the photodetector

- Gain of the amplifier

- Loss of the RF cable

- Amplitude error of the signal analyzer

Signal

Analyzer

DUT

(LD) PD

AMP

Opto-electric conversion efficiency Amplification Gain

Page 13

Effect of O/E Conversion Efficiency applied to RIN Measurement

• RIN measurement results significantly depend on the accuracy of the

characterization of O/E conversion efficiency applied to RIN derivation

-170

-165

-160

-155

-150

-145

-140

0 1000 2000 3000 4000 5000 6000 7000

Frequency (M Hz)

RIN (dB

/Hz)

-6dBm

-3dBm

0dBm

+3dBm

+6dBm

-170

-165

-160

-155

-150

-145

-140

0 1000 2000 3000 4000 5000 6000 7000

Frequency (M Hz)

RIN (dB

/Hz)

-6dBm

-3dBm

0dBm

+3dBm

+6dBm

With 0.5 dB Error in O/E Conversion Efficiency,

measurement results vary significantly with

received optical power variation.

With Correct Thermal/Shot Noise Removal, and

Correct O/E Conversion Efficiency, RIN

Measurement results are stable.

Page 14

RIN Measurement Solution

• A0010A RIN Measurement System

– Measurement solutions to 3 GHz,

20 GHz, 26.5 GHz and 40 GHz

– Solution at 850 nm for MMF

lasers to 3 GHz, and 20 GHz

Digital Multimeter Signal Analyzer

Optical receiver RIN Measurement Software

operating on SA OS (Win 7)

-150mA -125mA -100mA -75mA -50mA

-5mW -4mW -3mW -2mW -1mW

Clear RIN Profiles up to 40 GHz RIN independent of received optical power

Page 15

RIN Profiles

- Conventional DFB-LD - External Cavity ITLA

• RIN profiles vary greatly with laser structures

Page 16

Relaxation Oscillation Frequency Measurement

• Estimation of Modulation Bandwidth from Relaxation Oscillation Frequency

– Correlation between frelax and Modulation Bandwidth of DML

• Screening of lasers before module assemblies

– Easy measurement without high-frequency assemblies

– Defect of EML can be detected by frelax

Relaxation Oscillation Frequency is obtained

by Marker Function of A0010A RIN

Measurement Software

Page 17

Measuring Optical Frequency

Noise and Linewidth

Page 18

Optical Frequency Noise Measurement Method

• Optical FM to Beat PM Conversion

– Conversion by specially designed interferometer

– Demodulation of PM by vector signal analysis

– Conversion characteristic dependency on only delay of the interferometer

– No tuning nor stabilization of operating point required

Signal Analyzer

LaserOptical FM to Beat

PM Conversion

Optical

ReceiverVector Signal Analysis

Ele

ctric

Fie

ld o

f Las

er

TimeI

Q

Optical Frequency Modulation Beat Phase Modulation

Page 19

Optical Noise and Linewidth Measurement Solutions

Signal Analyzer

Optical receiver Measurement Software

• A0040A Optical Noise Analyzer

– Optical frequency noise measurement

solutions to 12.5 MHz, 20 MHz and 80

MHz

– Calculate Lorentzian linewidth with

Fast Analysis Mode in less than one

second

Clear Noise Profiles up to 80 MHz Special Interferometry Yields Precise

Frequency and Amplitude Detail

Page 20

Typical Optical Frequency Noise Spectrum of DFB LD

• 1/f Noise + White Noise + Spurious Noise

White Noise

1/f Noise Spurious Noise

Page 21

Measuring Optical Frequency Noise vs. SOA Injection Current

• Optical Frequency Noise Depends on SOA Injection Current

I2→16 dBm

I1→ 11 dBm

Page 22

Measuring Optical Frequency Noise: Effect of Laser Driver

• Same laser shows different optical frequency noise profile depending on

laser drivers.

Driver B

Driver A

Page 23

Measuring Optical Frequency Noise: Variation from Laser to Laser

• Spectrum Profiles Vary Across Different ITLA Lasers

Page 24

Relationship Between Optical Frequency Noise and Laser Linewidth

Phase

D

erivatio

n

Fourier Transformation

Fourier Transformation

Ele

ctril

Fie

ld P

SD

Optical Frequency

Laser Linewidth

3dB

Ele

ctric

Fie

ld

Time

Inst

anta

neou

s O

ptic

al

Fre

quen

cy

Time

Opt

ical

Fre

quen

cy N

oise

Frequency

 Optical Frequency Noise

Spectrum 

Page 25

Measuring Laser Linewidth

– Conventional Measurement Methods

• Delayed Self Heterodyne Method

• Delayed Self Homodyne Method

0 f

SB(f)

ν0 f

Ele

ctri

c F

ield

f

SE(f)

Δν1/2

Δν1/2

Bea

t

SE(f)

Ele

ctri

c F

ield

ν0

0

0

0 fS f

SB(f)

ν0 - fS f

Ele

ctri

c F

ield

f

SE(f)

Δν1/2

2Δν1/2

Bea

t

SE(f)

Ele

ctri

c F

ield

ν0

0

0

LaserSignal

Analyzer

Optical Frequency

ShifterOptical

Receiver

Delay Fiber

LaserSignal

Analyzer

Optical

Receiver

Delay Fiber

Page 26

Method Comparison between ONA and Conventional DSH

• Optical Noise Analyzer

• Conventional Delayed Self-Heterodyne Method

Incomplete Information of Optical Frequency Noise Only one LW Value for a Given Delay

Resolved Data in Frequency Domain All Information of Optical Frequency Noise

LaserSignal

Analyzer

Optical Frequency ShifterOptical

ReceiverDelay Fiber

Linewidth

Optical Noise Analyzer Test Set

Laser

Signal Analyzer

Optical FM to Electrical PM Conversion Vector Signal Analysis Optical Frequency Noise PSD

Page 27

Conventional DSH Simulation from ONA Measurement Data

• Good correlations proves

– Accurate optical frequency noise measurement of ONA

– Correct methodology of Linewidth analysis

• ONA supports DSH simulation and actual DSH functionality.

Page 28

Good correlations between actual

measurement and simulation

Lorentzian Linewidth

• OIF-ITLA-MSA-01.2

11.1.1.5 The linewidth specified is the Lorentzian component and is related to

white phase noise component of the optical field. It is defined as the

-3dB full width of a self-heterodyne (3.5us delay) measurement.

Typically one arm of the interferometer is shifted in frequency.

• It is impossible to extract white noise portion by delayed self heterodyne

method.

• Practical method is to extract white noise portion from optical frequency

noise spectrum and calculate laser linewidth.

Page 29

Lorentzian Linewidth Analysis Function in the Sycatus A0040A

• Lorentzian Linewidth is calculated by averaging the white noise in the

frequency range specified by the start frequency and above

Start Frequency

Start Frequency

Lorentzian Linewidth

Page 30

Presentation summary

Page 31

Fiber Optic Telecom and Datacom Networks Demand Laser

Transmitters with… • Low RIN

– Important factor in SNR and identifies the Relaxation Oscillation Frequency

– Not effected by network attenuation

– Need to account for O/E conversion efficiency and remove the Thermal and Shot Noise

• A Clean Optical Frequency Noise Spectrum

– Low 1/f , spurious and white noise required for high-capacity systems

– Optical frequency noise vs. frequency gives a complete characterization of frequency noise

performance

– Optical frequency modulated noise can be converted to beat phase modulated noise with

special interferometry and measured on a calibrated Vector Signal Analyzer

• Narrow Laser Linewidth

– Critical for multilevel modulation and an OIF requirement

– Conventional LW measurement methods do not yield Lorentzian LW

– Lorentzian LW can be measured from the white noise portion of the optical noise spectrum

Page 32

Keysight / SYCATUS Measurement Solutions for RIN,

Linewidth, and Optical Noise

Only One

Industry

Standard

Industry

First

A0010A RIN Measurement System A0040A Optical Noise Analyzer

A0020A Laser Linewidth Measurement System

RIN Spectrum - Up to 40 GHz BW

- Single & Multi-mode

- From $75k to $175k*

Optical Noise Spectrum - Up to 80 MHz BW

- Lorentzian Linewidth

- From $100k to $150k*

Laser Linewidth - C and L-Band

- Down to 40 kHz

- From $75k* *Typical pricing. Actual prices will vary by configuration.

Page 33

Finding Out More About Measurement Alternatives

– TEL: +81-42-660-0881

– FAX: +81-42-660-0882

– Email: [email protected]

– URL: www.sycatus.com

– TEL: +1-775-473-9907

– FAX: +1-775-473-9916

– Email: [email protected]

– URL: www.ogmentum.com

– TEL: +1-800-829-4444

– FAX: +1-800-829-4433

– Email: [email protected]

– URL: www.keysight.com

Page 34