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LASER FRAME: Straightness monitor (Tentative results of resolution test) Third Mini-Workshop on Nano Project at AT F May 30-31,2005 KEK Nano BPM Group Y.Higashi, Y.Honda, T.Tauchi, H.Hayano, J.Urakawa, T.Kume, K.Kubo, H.Yamaoka

LASER FRAME: Straightness monitor (Tentative results of resolution test) Third Mini-Workshop on Nano Project at ATF May 30-31,2005 KEK Nano BPM Group Y.Higashi,

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Why we need Laser Frame Initial alignment (10  m) of the cavity BPM OD of cavities will be used as reference Fine alignment using BPMs signals Needs Nano-Movers Needs stable position of base of movers, magnets etc. with nm order Needs reference lines Laser Frame as Straightness monitor

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Page 1: LASER FRAME: Straightness monitor (Tentative results of resolution test) Third Mini-Workshop on Nano Project at ATF May 30-31,2005 KEK Nano BPM Group Y.Higashi,

LASER FRAME: Straightness monitor

(Tentative results of resolution test)

Third Mini-Workshop on Nano Project at ATF

May 30-31,2005

KEK Nano BPM Group

Y.Higashi, Y.Honda, T.Tauchi, H.Hayano, J.Urakawa, T.Kume, K.Kubo, H.Yamaoka

Page 2: LASER FRAME: Straightness monitor (Tentative results of resolution test) Third Mini-Workshop on Nano Project at ATF May 30-31,2005 KEK Nano BPM Group Y.Higashi,

Outline

Why we need Laser Frame as Straightness monitor

Complete design of the Laser Frame Configuration

Laser BPM Assembly Tentative results of resolution test Long distance(50-100m) straightness monitor

base on the laser frame techniques Schedule for the summer installation

Page 3: LASER FRAME: Straightness monitor (Tentative results of resolution test) Third Mini-Workshop on Nano Project at ATF May 30-31,2005 KEK Nano BPM Group Y.Higashi,

Why we need Laser Frame

Initial alignment (10 m) of the cavity BPMOD of cavities will be used as reference

Fine alignment using BPMs signalsNeeds Nano-Movers

Needs stable position of base of movers, magnets etc. with nm order

Needs reference lines

Laser Frame as Straightness monitor

Page 4: LASER FRAME: Straightness monitor (Tentative results of resolution test) Third Mini-Workshop on Nano Project at ATF May 30-31,2005 KEK Nano BPM Group Y.Higashi,

Concept of Laser Frame

We use; @ Laser-BPM @ Interferometer @ Vacuum environment

Page 5: LASER FRAME: Straightness monitor (Tentative results of resolution test) Third Mini-Workshop on Nano Project at ATF May 30-31,2005 KEK Nano BPM Group Y.Higashi,

Laser BPM

Reference Bar

L

2Ldy

P1 dP1=2Lsin +dy

dP2=Lsin +dy

sin dP1-dp2)/L

dy= dP1+Lsin

D11D12

D21D22

P1=D11-D12

P2=D21-D22

Ref.1Ref.2 D1D2

Page 6: LASER FRAME: Straightness monitor (Tentative results of resolution test) Third Mini-Workshop on Nano Project at ATF May 30-31,2005 KEK Nano BPM Group Y.Higashi,

Ground Motion Measurement

Ground Surface

Vacuum Chamber Plate

O rings

Laser BPM

Mirror for Interferometer

To reference Bar

O rings

Two Laser Beam

Page 7: LASER FRAME: Straightness monitor (Tentative results of resolution test) Third Mini-Workshop on Nano Project at ATF May 30-31,2005 KEK Nano BPM Group Y.Higashi,

Measurement of intensity change of light due to nm position shift of laser light Tested by Y.Honda

Page 8: LASER FRAME: Straightness monitor (Tentative results of resolution test) Third Mini-Workshop on Nano Project at ATF May 30-31,2005 KEK Nano BPM Group Y.Higashi,

Over view of KEK Nano BPMOver view of KEK Nano BPM

Page 9: LASER FRAME: Straightness monitor (Tentative results of resolution test) Third Mini-Workshop on Nano Project at ATF May 30-31,2005 KEK Nano BPM Group Y.Higashi,

Vertical Interferometer Extended Reference Bar

Reference Bar

Plane Mirror

Leg

Vacuum pipe, chamber B.S, Mirror, Detector

Laser BPM

Two Beam Optics

Laser Beam from Fiber

Page 10: LASER FRAME: Straightness monitor (Tentative results of resolution test) Third Mini-Workshop on Nano Project at ATF May 30-31,2005 KEK Nano BPM Group Y.Higashi,

Cross sectional drawing of a Laser BPMCross sectional drawing of a Laser BPM(including vacuum chamber)(including vacuum chamber)

To detector

Vacuum chamber

Laser ray

Ground

Page 11: LASER FRAME: Straightness monitor (Tentative results of resolution test) Third Mini-Workshop on Nano Project at ATF May 30-31,2005 KEK Nano BPM Group Y.Higashi,

Resolution test setup conditions

=>Laser: YAG Laser (CW,500mW, 532nm, Single mode, W0=0.9mm, Divergence 1mrad. Spot size 2900m, Rayleigh length = πw0^2 /λ= 4.8 m) =>Environment (not vacuum but transport in the pipe )=>BPM location (2 m distance from the reference beam generator)=>Beam splitter ( PBS 50% transmission)=>Detector (diff. amp gain 100-10000)=>Base (Granite table 1x2m. 0.3m thick no apply vibration isolator)=>BPM movement ( measured by capacitance gauge(resolution: 3nm)=>Tilt measurement ( light lever ratio 1:2)

Page 12: LASER FRAME: Straightness monitor (Tentative results of resolution test) Third Mini-Workshop on Nano Project at ATF May 30-31,2005 KEK Nano BPM Group Y.Higashi,

Measuring items

Use a Single Laser BPM

=>Vertical resolution =>Tilt resolution

Page 13: LASER FRAME: Straightness monitor (Tentative results of resolution test) Third Mini-Workshop on Nano Project at ATF May 30-31,2005 KEK Nano BPM Group Y.Higashi,

Calibration setup of beam position measurment(1)

2 m

Laser

4th BPM

Reference beam generator

Page 14: LASER FRAME: Straightness monitor (Tentative results of resolution test) Third Mini-Workshop on Nano Project at ATF May 30-31,2005 KEK Nano BPM Group Y.Higashi,

YAG Laser

500mW

Optical fiber

Beam divider

1st BPM

2nd BPM

3rd BPM

Setup (2)

Beam intensity of nth BPM= p* 0.5n

(n= BPM number, p=power)

Page 15: LASER FRAME: Straightness monitor (Tentative results of resolution test) Third Mini-Workshop on Nano Project at ATF May 30-31,2005 KEK Nano BPM Group Y.Higashi,

Vacuum chamber

Laser ray

Resolution test of the 4th BPM

Page 16: LASER FRAME: Straightness monitor (Tentative results of resolution test) Third Mini-Workshop on Nano Project at ATF May 30-31,2005 KEK Nano BPM Group Y.Higashi,

0

20

40

60

80

100

120

0 2 10-6 4 10-6 6 10-6 8 10-6 1 10-5 1.2 10-5

Tilt resolution

volt(T)

Tilt(rad)

0

20

40

60

80

100

120

140

0 20 40 60 80 100 120

Vertical resolution

volt(V)

position(nm)

Tentative results of resolution

Page 17: LASER FRAME: Straightness monitor (Tentative results of resolution test) Third Mini-Workshop on Nano Project at ATF May 30-31,2005 KEK Nano BPM Group Y.Higashi,

Summary

Vertical resolution => 10 nm Tilt resolution => 5x10-6 rad.

Need to Test => Long distance (10-2 0m) Interferometer test in 1m distance

Page 18: LASER FRAME: Straightness monitor (Tentative results of resolution test) Third Mini-Workshop on Nano Project at ATF May 30-31,2005 KEK Nano BPM Group Y.Higashi,

Laser beam based alignment for

JHF proton Linac

Page 19: LASER FRAME: Straightness monitor (Tentative results of resolution test) Third Mini-Workshop on Nano Project at ATF May 30-31,2005 KEK Nano BPM Group Y.Higashi,

Long distance alignment test

length about 100m

Page 20: LASER FRAME: Straightness monitor (Tentative results of resolution test) Third Mini-Workshop on Nano Project at ATF May 30-31,2005 KEK Nano BPM Group Y.Higashi,

Laser position change at 50m away due to environmental change

Page 21: LASER FRAME: Straightness monitor (Tentative results of resolution test) Third Mini-Workshop on Nano Project at ATF May 30-31,2005 KEK Nano BPM Group Y.Higashi,

Laser position change at 100m away due to environmental change

Page 22: LASER FRAME: Straightness monitor (Tentative results of resolution test) Third Mini-Workshop on Nano Project at ATF May 30-31,2005 KEK Nano BPM Group Y.Higashi,

Reference Bar

Page 23: LASER FRAME: Straightness monitor (Tentative results of resolution test) Third Mini-Workshop on Nano Project at ATF May 30-31,2005 KEK Nano BPM Group Y.Higashi,

Laser Input

Page 24: LASER FRAME: Straightness monitor (Tentative results of resolution test) Third Mini-Workshop on Nano Project at ATF May 30-31,2005 KEK Nano BPM Group Y.Higashi,

Distance change between Reference Bar and cavity(Due to the environmental change)

7 m

1 hour

Page 25: LASER FRAME: Straightness monitor (Tentative results of resolution test) Third Mini-Workshop on Nano Project at ATF May 30-31,2005 KEK Nano BPM Group Y.Higashi,

Deviation due to assembling and fabrication errors (2Kgf)

dY

+0.1m-0.4m

-0.4m -0.6m +0.4m

-0.1m

Page 26: LASER FRAME: Straightness monitor (Tentative results of resolution test) Third Mini-Workshop on Nano Project at ATF May 30-31,2005 KEK Nano BPM Group Y.Higashi,

Schedule for summer installation