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KP Technology USA Inc. The Kelvin Probe Specialists
www.airphotoemission.com www.kelvinprobe.com
KP Technology System CatalogueWinter 2013-2014
-1070
-1055
-1040
8486889092
Al Relative Humidity Ramp Test (10% steps) @ 2 Hr/step 09-10/Nov/2013
RH (%) WF (mV) 30 per. Mov. Avg. ( WF (mV) )
-1145
-1130
-1115
-1100
-1085
687072747678808284
WF(m
V)
RH(%
)
Sample: Al Tip: 2mm S/SSig Ave: 60 WF Ave: 2T: 18.9°C Gain: 4
-1220
-1205
-1190
-1175
-1160
525456586062646668
-1250
-1235
485052
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21
Time (Hours)
0
5
10
15
20
25
30
4.4 4.6 4.8 5 5.2 5.4 5.6 5.8 6 6.2 6.4 6.6 6.8 7 7.2 7.4
Phot
oem
issi
on c
urre
nt [1
/3] (
AU
)
Ep (eV)
Air Photoemission - Si
Sample : Si Gradient : 5 Averaging : 3 RH : 42% T : 19.9oC CPD : -749.2mV WF : 4.983eV R2 : 0.9981 Yield : 9.7
4.983eV
KP Technology USA Inc. The Kelvin Probe Specialists
www.airphotoemission.com www.kelvinprobe.com
Photoemission in Air SystemsAPS01, APS02, APS03, APS04
Work Function by Photoemission in Air
Density of States Measurements
<3.3eV to >7.0eV Energy Range
Measurement of all Semiconductor Bands
Contact Potential Di�erence by Kelvin Probe
Organic and Non-Organic Semiconductors
Metals
Thin Films
Solar Cells and Organic Photovoltaics
Corrosion
Features Applications
System DescriptionThe Photoemission in Air Systems are KP Technology’s newest addition to our large surface analysis range. The Air-PE systems measure the absolute work function of a material by Photoemission in Air, no vacuum required. With an excitation range of 3.3eV to over 7eV, the Air-PE systems are capable of measuring the absolute Work Function of Metals and with the addition of an SPV and SPS source, the full bands of Semicondcutors can be measured in one system, no other product can do this.
Each APS system comes with our gold-standard Kelvin Probe system, capable of Contact Potential Di�erence Measure-ments, backed-up by the APS’ Absolute measurements. Photoemission in Air measurement of a Silicon Sample
Air Photoemission system APS02 - Scanning Kelvin Probe with Air Photoemission Spectrometry
0
5
10
15
20
25
30
4.4 4.6 4.8 5 5.2 5.4 5.6 5.8 6 6.2 6.4 6.6 6.8 7 7.2 7.4
Phot
oem
issi
on c
urre
nt [1
/3] (
AU
)
Ep (eV)
Air Photoemission - Si
Sample : Si Gradient : 5 Averaging : 3 RH : 42% T : 19.9oC CPD : -749.2mV WF : 4.983eV R2 : 0.9981 Yield : 9.7
4.983eV
KP Technology USA Inc. The Kelvin Probe Specialists
www.airphotoemission.com www.kelvinprobe.com
Photoemission in Air SystemsAPS01, APS02, APS03, APS04
Measurement PrincipleWhen light is incident on a material such as a metal or a semiconductor, the photons may have enough energy to liberate electrons from the surface, a process known as the Photoelectric E�ect. Photons having insu�cient energy will not liberate electrons, while photons of just enough energy will liberate a few electrons; photons of much more energy than the work function will liberate a lot of electrons.
The energy required for electrons to escape the material is termed the work function. By varying the energy of the incoming light, the absolute work function can be established. Based on Fowler’s analysis of photoemission, the square root (cube root for Semicondcutors) of the photoelectron yield is plotted on a graph versus the incident photon energy (image right).
Air Photoemission Measurements of a Selection of Metals.
Each metal is measured with the PE Mode and Kelvin Probe Mode of an APS02 system.The Contact Potential is measured with the Kelvin Probe and the Work Function is measured by the air Photoemission Mode.
When Work Funciton is plotted against CPD, a straight line is formed. A line is drawn at 0V CPD to the line and when traced down revealsthe absolute Work Function of the Tip.
Air Photoemission Curve of Copper Sample
0
10
20
30
40
50
60
3.4 3.6 3.8 4 4.2 4.4 4.6 4.8 5 5.2 5.4 5.6 5.8 6 6.2 6.4 6.6 6.8 7 7.2 7.4
Phot
oem
issi
on c
urre
nt [1
/2] (
AU
)
Energy (eV)
Air Photoemission - Cu
Sample : Cu Gradient : 4 Averaging : 3 RH : 44% T : 20.7oC CPD : -103.8mV WF : 4.565eV R2 : 0.9842 Yield : 11.8
4.565eV
-1.2
-1
-0.8
-0.6
-0.4
-0.2
0
0.2
0.4
3.4 3.5 3.6 3.7 3.8 3.9 4 4.1 4.2 4.3 4.4 4.5 4.6 4.7 4.8 4.9 5 5.1 5.2
Cont
act P
oten
tial D
i�er
ence
(V)
Photon Energy (eV)
Au Ag
Cu
Fe
Zn
Ti
Al
Material WF (eV) WF Literature (eV) CPD (V) Ag 4.709 4.73 0.0403 Au 4.856 4.82 0.1779 Al 3.585 4.28 -1.137 Cu 4.565 4.65 -0.1038 Fe 4.558 4.50 -0.116 Ti 3.998 4.02 -0.6902 Zn 3.587 3.63 -1.039
y = 1.0028x - 4.6939 R2 = 0.927
Tip Work Function = 4.6939 eV
KP Technology USA Inc. The Kelvin Probe Specialists
www.airphotoemission.com www.kelvinprobe.com
Photoemission in Air SystemsAPS01, APS02, APS03, APS04
System Overview
Density of States
The properties of many materials are governed by the Density of States (DOS) near the Fermi Level. The Air Photoemssion system is capable of probing the DOS by di�erentiating the detected photoelectron yields by the incident photon energy. The DOS measurement can thus be compared to molecular orbital calculations for the material under investigation. DOS data collected with the APS in air is shown to the right for Copper. The data for all measured samples is consistent with literature.
0
0.2
0.4
0.6
0.8
1
3.4 3.6 3.8 4 4.2 4.4 4.6 4.8 5 5.2 5.4 5.6 5.8 6 6.2 6.4 6.6 6.8 7 7.2 7.4
DO
S (A
U)
Energy (eV)
Air Photoemission - Density of States - Cu
Sample : Cu Gradient : 4 Averaging : 3 RH : 44% T : 20.7oC CPD : -103.8mV WF : 4.565eV R2 : 0.9842 Yield : 11.8
Copper Sample Denisty of States
0
0.2
0.4
0.6
0.8
1
4.4 4.6 4.8 5 5.2 5.4 5.6 5.8 6 6.2 6.4 6.6 6.8 7 7.2 7.4
DO
S (A
U)
Energy (eV)
Air Photoemission - Density of States - Si
Sample : Si Gradient : 5 Averaging : 3 RH : 42% T : 19.9oC CPD : -749.2mV WF : 4.983eV R2 : 0.9981 Yield : 9.7
Silicon Sample Denisty of States
e e
UV Lamp UV Lamp PSUSpectrometer
PC and Monitor
Digital Controller
XYZ stage(APS02/03/04)
Optical Fiber
Optical Enclosure and Measurement System
Sample
Air Photoemission Light Source
Photoelectron Detector
The Optical Enclosure houses the sample in complete darkness prior to
measurement. The Photoelectron detector measures the liberated
electrons driven o� by the UV Light emitted by the Spectrometer.
The UV Bulb is powered by an external PSU and is controlled by software. The UV light is injected into the Spectrom-
eter and a variable wavelength of light is produced. The energy range of this
light is <3.3eV to >7.0eV.
The Digital Controller controls every aspect of the system and is controlled
by the dedicated software GUI. The measurement from the Photoelectron
Detector is passed to the Digital Controller, to the PC and plotted in software, producing the PE curve.
Photoemission in Air SystemsAPS01, APS02, APS03, APS04
KP Technology was founded with the aim of bringing to the market new surface research tools. These tools would �rstly allow specialists to investigate surface phenomena, secondly provide equipment pathways for non-specialists, and �nally educate scientists, engineers and technologists in the capabilities of these emerging technologies.KP Technology also performs a signi�cant amount of material research and training consultancy, mostly based upon the Work Function or Surface Potential evaulation of client samples. Along with a strong Research and Developement Division and over 300 systems shipped worldwide, this has placed KP Technology as the Number one supplier of Kelvin Probes in the world.
KP Technology USA Inc. The Kelvin Probe Specialists
www.airphotoemission.com www.kelvinprobe.com
KP Technology was the proud winner of the Queens Award for Enterprise:
International Trade 2013
For quotation requests, further inforamtion or to discuss any research or particular measurements, please feel free
to contact us:
Email: [email protected]: +44 1955 602 777
Or visit our websites www.kelvinprobe.com
www.airphotoemission.com
The Company Contact
System Speci�cations
APS04 Photoemission system with surface Photovoltage Spectroscopy
620 mm
836 mm1459 mm1249 mm
836 mm
620 mm
APS02 Photoemission system
APS01 APS02 APS03 APS04Kelvin Probe 3-Axis ScanningSurface PhotovoltageSurface Photovoltage SpectroscopyTip Material / DiameterWork Function ResolutionHeight Control (Auto)Kelvin Probe ModeCPD Measurement TimePE ModeWF Measurement TimeDOS MeasurementsOptical SystemOscilloscopeTest SampleFaraday Enclosure Base (mm)Control SuppliedWarranty
PC Control with Dedicated Software12 Months
Full CPD measurements
2mm Gold Tip<3meV
Colour Camera with Zoom Lens and Monitor for positioningDigital TFT Oscilloscope for Real Time Signal
Gold, Aluminium and Silver Test Samples
25mm Automatic
450 x 450mm Optical Enclosure
Full access to DOS Information
Full Photoemission measurementCPD measurements in <1 min
PE measurement in <5 mins
KP Technology USA Inc. The Kelvin Probe Specialists
www.airphotoemission.com www.kelvinprobe.com
Scanning Kelvin Probe SystemsSKP5050, ASKP100100, ASKP200250, ASKP350350
Work Function Measurement by Kelvin Probe
Work Function Resolution of <3meV
Scanning Area from 5mm to 300mm
Scanning Resolution from 317.5nm
Automatic Height Regulation
Organic and Non-Organic Semiconductors
Metals
Thin Films
Solar Cells and Organic Photovoltaics
Corrosion
Features Applications
System DescriptionOur large range of Scanning Kelvin Probes gives the user full access to 2D and 3D Work Function plots of samples ranging in size from 5mm to 300mm. With Work Function resolution at less than 3meV, and the resolution of the 3-axis scanning stages as low as 317.5nm, the Scanning Kelvin Probe gives reliable, repeatable measurements.
A high performance Faraday and optical enclosure shields all of our scanning systems from unwanted fast changing envi-ronmental conditions, electromagnetic interference and providing the perfect platform for our Photoemission and Surface Photovoltage add-on modules.
Silicon substrate modi�ed by a layer of small ‘Bumps’.Sample is scanned using SKP5050 advanced 2D and 3D techniques
Scanning Kelvin Probe SKP5050 Pictured Inside Standard Optical Enclosure
Scanning Kelvin Probe SystemsSKP5050, ASKP100100, ASKP200250, ASKP350350
Air Photoemission System
Surface Photovoltage (QTH or LED)
Surface Photovoltage Spectroscopy (400-1000nm)
Tips in Gold or S.Steel from 0.05mm to 20mm
Relative Humidity Control and Nitrogen Environmental Chamber
KP Technology was founded with the aim of bringing to the market new surface research tools. These tools would �rstly allow specialists to investigate surface phenomena, secondly provide equipment pathways for non-specialists, and �nally educate scientists, engineers and technologists in the capabilities of these emerging technologies.KP Technology also performs a signi�cant amount of material research and training consultancy, mostly based upon the Work Function or Surface Potential evaulation of client samples. Along with a strong Research and Developement Division and over 300 systems shipped worldwide, this has placed KP Technology as the Number one supplier of Kelvin Probes in the world.
KP Technology USA Inc. The Kelvin Probe Specialists
www.airphotoemission.com www.kelvinprobe.com
KP Technology was the proud winner of the Queens Award for Enterprise:
International Trade 2013
For quotation requests, further information or to discuss any research or particular measurements, please feel free
to contact us:
Email: [email protected]: +44 1955 602 777
Or visit our websites www.kelvinprobe.com
www.airphotoemission.com
The Company
Upgrades and Add-Ons
Contact
System Speci�cations
12” Silicon Wafer Measured Using the ASKP350350 Scanning Kelvin Probe
SKP5050 ASKP100100 ASKP200250 ASKP350350Tip Material / DiameterWork Function ResolutionSample Scan Size 50mm x 50mm 100mm x 100mm 200mm x 250mm 300mm x 300mm3D Sample Area Square Square Square Square & CircularHeight Control (Auto) 25mm 50mm 50mm 50mmVisualisationOptical SystemOscilloscopeTest SampleFaraday Enclosure Base (mm) 450 x 450 300 x 300 450 x 450 450 x 600Control SuppliedDetection SystemWarranty
PC Control with Dedicated SoftwareO�-Null with Parasitic Capacity Rejection
12 Months
3D Maps of Surface Potential
2mm Gold Tip<3meV
Colour Camera with Zoom Lens and MonitorDigital TFT Oscilloscope for Real Time Signal
Gold and Aluminium Test Sample
KP Technology USA Inc. The Kelvin Probe Specialists
www.airphotoemission.com www.kelvinprobe.com
Environmental Kelvin Probe SystemsRHC010, RHC020, RHC030, RHC040
Work Function Measurement by Kelvin Probe
Work Function Resolution of <3meV
Automatic Control of Relative Humidity
Atmospheric Control to <1% Oxygen
Modular System for Upgrades and Add-Ons
Organic and Non-Organic Semiconductors
Metals
Thin Films
Solar Cells and Organic Photovoltaics
Corrosion
Features Applications
System Description
-1070
-1055
-1040
8486889092
Al Relative Humidity Ramp Test (10% steps) @ 2 Hr/step 09-10/Nov/2013
RH (%) WF (mV) 30 per. Mov. Avg. ( WF (mV) )
-1145
-1130
-1115
-1100
-1085
687072747678808284
WF(m
V)
RH(%
)
Sample: Al Tip: 2mm S/SSig Ave: 60 WF Ave: 2T: 18.9°C Gain: 4
-1220
-1205
-1190
-1175
-1160
525456586062646668
-1250
-1235
485052
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21
Time (Hours)
The Relative Humidity Kelvin Probe Systems are the ideal solution for monitoring samples in a controlled atmosphere. The RHC systems have the ability to automatically control the Relative Humidity within the chamber from 5% to 95% using the easily programmable software. As well as RH control, the RHC020 and 040 Kelvin Probe Systems come with the KP Technology gold-standard Scanning Kelvin Probe platform, perfect for plotting the e�ect of corrosion over the surface of a sample. The RHC030 and 040 come with the added bene�t of Nitrogen atmosphere control with the ability to go down to <1% Oxygen within the System.
E�ect of Relative Humidity on Aluminium Sample over time
Relative Humidity System RHC040 with 3-Axis Scanning Capabilities
Environmental Kelvin Probe SystemsRHC010, RHC020, RHC030, RHC040
Air Photoemission System
Surface Photovoltage (QTH or LED)
Surface Photovoltage Spectroscopy (400-1000nm)
Upgrade to Scanning Kelvin Probe System
Sample Heating to 115˚C
KP Technology was founded with the aim of bringing to the market new surface research tools. These tools would �rstly allow specialists to investigate surface phenomena, secondly provide equipment pathways for non-specialists, and �nally educate scientists, engineers and technologists in the capabilities of these emerging technologies.KP Technology also performs a signi�cant amount of material research and training consultancy, mostly based upon the Work Function or Surface Potential evaulation of client samples. Along with a strong Research and Developement Division and over 300 systems shipped worldwide, this has placed KP Technology as the Number one supplier of Kelvin Probes in the world.
KP Technology USA Inc. The Kelvin Probe Specialists
www.airphotoemission.com www.kelvinprobe.com
KP Technology was the proud winner of the Queens Award for Enterprise:
International Trade 2013
For quotation requests, further information or to discuss any research or particular measurements, please feel free
to contact us:
Email: [email protected]: +44 1955 602 777
Or visit our websites www.kelvinprobe.com
www.airphotoemission.com
The Company
Upgrades and Add-Ons
Contact
System Speci�cations
Relative Humidity System RHC020 with 3-Axis Scanning
RHC010 RHC020 RHC030 RHC040Tip Material / DiameterWork Function ResolutionSample Scanning Single-Point 50mm x 50mm Single-Point 50mm x 50mmRelative Humidity ControlAtmospheric Control RH Only RH Only Oxygen to <1% Oxygen to <1%Optical SystemOscilloscopeTest SampleBreadboard FootprintControl SuppliedDetection SystemWarranty
PC Control with Dedicated SoftwareO�-Null with Parasitic Capacity Rejection
12 Months
2mm Stainless Steel Tip<3meV
Digital TFT Oscilloscope for Real Time SignalGold and Aluminium Test Sample
Automatic: 5% to 95%
Colour CameraFront Window
900 x 600 mm
0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.00.0
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
mm
mm
4439 -- 4450 4429 -- 4439 4418 -- 4429 4408 -- 4418 4397 -- 4408 4387 -- 4397 4376 -- 4387 4366 -- 4376 4355 -- 4366 4345 -- 4355 4334 -- 4345 4324 -- 4334 4313 -- 4324 4303 -- 4313 4292 -- 4303 4282 -- 4292 4271 -- 4282 4261 -- 4271 4250 -- 4261 4239 -- 4250 4229 -- 4239 4218 -- 4229 4208 -- 4218 4197 -- 4208 4187 -- 4197 4176 -- 4187 4166 -- 4176 4155 -- 4166 4145 -- 4155 4134 -- 4145 4124 -- 4134 4113 -- 4124 4103 -- 4113 4092 -- 4103 4082 -- 4092 4071 -- 4082 4061 -- 4071 4050 -- 4061
KP Technology USA Inc. The Kelvin Probe Specialists
www.airphotoemission.com www.kelvinprobe.com
UHV Kelvin Probe SystemsUHVKP020, UHVKP030
Work Function Measurement by Kelvin Probe
Work Function Resolution of <3meV
UHV, Gas or Ambient Measuring
Modular System for Upgrades and Add-Ons
Automatic Height Regulation
Organic and Non-Organic Semiconductors
Metals
Thin Films
Solar Cells and Organic Photovoltaics
Corrosion
Features Applications
System DescriptionOur range of Ultra High Vacuum Kelvin Probes gives the user full access to Work Function measurements under vacuum. Each UHV Kelvin Probe comes with a High Quality Manual or Motorised Translator that enables reliable and accurate tip-to-sample positioning, and the unrivalled tracking system holds the tip separation constant at all times during the measurement. Even under vacuum, the Work Function resolution is less than 3meV.
The UHV Kelvin Probe can be mounted to the user’s existing UHV Chamber with no fuss. If the user does not have a cham-ber, KP Technology o�ers an elegant UHVKP Cell System (UHVKP030) that can be used for Ambient, UHV or Gaseous measurements. This Cell is completely modular and a host of additional extras can be added-on. With a small chamber size, pumping-down the Cell, or injecting Gas, takes no time at all, resulting in fast, reliable measurements.
Ultra High Vacuum Kelvin Probe, UHVKP030, mounted on breadboard. UHV Cell with Heater Stage, Gas Inlet and UHV Kelvin Probe mounted vertically.
Work Function of Metals versus Temperature under Vacuum
UHV Kelvin Probe SystemsUHVKP020, UHVKP030
Photoemission System
Surface Photovoltage (QTH or LED)
Surface Photovoltage Spectroscopy (400-1000nm)
Motorised or Manual Translators (50mm to 200mm)
Heater Stage and/or Sample Translation
KP Technology was founded with the aim of bringing to the market new surface research tools. These tools would �rstly allow specialists to investigate surface phenomena, secondly provide equipment pathways for non-specialists, and �nally educate scientists, engineers and technologists in the capabilities of these emerging technologies.KP Technology also performs a signi�cant amount of material research and training consultancy, mostly based upon the Work Function or Surface Potential evaulation of client samples. Along with a strong Research and Developement Division and over 300 systems shipped worldwide, this has placed KP Technology as the Number one supplier of Kelvin Probes in the world.
KP Technology USA Inc. The Kelvin Probe Specialists
www.airphotoemission.com www.kelvinprobe.com
KP Technology was the proud winner of the Queens Award for Enterprise:
International Trade 2013
For quotation requests, further information or to discuss any research or particular measurements, please feel free
to contact us:
Email: [email protected]: +44 1955 602 777
Or visit our websites www.kelvinprobe.com
www.airphotoemission.com
The Company
Upgrades and Add-Ons
Contact
System Speci�cations
Tips in Gold or S.Steel from 0.05mm to 20mm UHVKP020 Kelvin Probe with Manual TranslatorPhotographed on desk before mounting on to User’s Chamber
UHVKP020 UHVKP030Tip Material / DiameterWork Function ResolutionStandard TranslatorTranslator Sizes PossibleHeight Control (Auto)VisualisationOscilloscopeTest SampleControl Supplied USB Control with Dedicated Software PC Control with Dedicated SoftwareDetection SystemUHV Cell Not Included 2.75" 6 Port CellWarranty
Available on Request
<3meV4mm Stainless Steel Tip
O�-Null with Parasitic Capacity Rejection
12 Months
50mm Manual Translator50mm or 100mm Manual or Motorised Translators
Digital TFT Oscilloscope for Real Time Signal
Approximately 1-5mm by DC O�set (unless Motorised)Single-Point Work Function / Contact Potential Di�erence Scans
KP Technology USA Inc. The Kelvin Probe Specialists
www.airphotoemission.com www.kelvinprobe.com
Single Point Kelvin Probe SystemKP020
Work Function Measurement by Kelvin Probe
Work Function Resolution of <3meV
Modular System for Upgrades and Add-Ons
Economical, Entry System
USB Version Plug-and-Play
Organic and Non-Organic Semiconductors
Metals
Thin Films
Solar Cells and Organic Photovoltaics
Corrosion
Features Applications
System DescriptionOur Single-Point Kelvin Probe System is the introductory system to the KP Technology range. The economical system enables users to quickly record non-scanning data in a numner of di�erent modes to match the exact requirement of the sample under investigation. For rapid events, the KP020 can record work function at a rate of 1000 work func-tion measurements per minute, or, alternatively, the system will track slow work function evolution over a number of days.
The KP020 provides the perfect platform for upgrades to Scanning, Air Photoemission and Surface Photovoltage add-on modules. Platinum Work Function over time after cleaning
Single-Point Kelvin Probe KP020 Pictured on the right without the included Optical Enclosure
Single Point Kelvin Probe SystemKP020
Air Photoemission System
Surface Photovoltage (QTH or LED)
Surface Photovoltage Spectroscopy (400-1000nm)
Upgrade to Scanning Kelvin Probe System
Relative Humidity Control and Nitrogen Environmental Chamber
KP Technology was founded with the aim of bringing to the market new surface research tools. These tools would �rstly allow specialists to investigate surface phenomena, secondly provide equipment pathways for non-specialists, and �nally educate scientists, engineers and technologists in the capabilities of these emerging technologies.KP Technology also performs a signi�cant amount of material research and training consultancy, mostly based upon the Work Function or Surface Potential evaulation of client samples. Along with a strong Research and Developement Division and over 300 systems shipped worldwide, this has placed KP Technology as the Number one supplier of Kelvin Probes in the world.
KP Technology USA Inc. The Kelvin Probe Specialists
www.airphotoemission.com www.kelvinprobe.com
KP Technology was the proud winner of the Queens Award for Enterprise:
International Trade 2013
For quotation requests, further information or to discuss any research or particular measurements, please feel free
to contact us:
Email: [email protected]: +44 1955 602 777
Or visit our websites www.kelvinprobe.com
www.airphotoemission.com
The Company
Upgrades and Add-Ons
Contact
System Speci�cations
The KP Technology Kelvin Probe
Tip Material / DiameterWork Function ResolutionProbe TranslationVisualisationOscilloscopeTest SampleControl SuppliedControl PossibleDetection SystemEnclosureOptical SystemWarranty
USB Control with Dedicated Software available upon request
450mm x 450mm Optical Enclosure IncludedColour Camera with Zoom Lens and Monitor
Gold on Aluminium Sample
<3meV2mm Gold Tip
KP020
PC Control with Dedicated Software
O�-Null with Parasitic Capacity Rejection
12 Months
25mm Manual Translator
Digital TFT Oscilloscope for Real Time SignalSingle-Point Work Function / Contact Potential Di�erence Scans
KP Technology USA Inc. The Kelvin Probe Specialists
www.airphotoemission.com www.kelvinprobe.com
Surface Photovoltage ModulesSPS030, SPS040
SPS030 - 400 to 700nm Range
SPS040 - 400 to 1000nm Range
Intense White Light QTH Source
DC and AC Measurement Modes
Compatible with all Kelvin Probe Systems
Organic and Non-Organic Semiconductors
Metals
Thin Films
Solar Cells and Organic Photovoltaics
Corrosion
Features Applications
System Description
0
50
100
150
200
250
300
350
1.2 1.4 1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2
Photon Energy (eV)
SPV
(mV
)
mc-Si, Si3N4
CdTe
The surface Photovoltage Spectroscopy modules are the perfect all-in-one solution for in-depth studies of light sensitive materials such as Organic Semiconductors, Solar Cells or Light Sensitive Dyes.
The modules o�er a comprehensive range of measurement modes including DC and AC surface photovoltage studies utilising the built-in Optical Chopper. Total digital control of all parameters including light intensity and wavelength (400-700nm or 400-1000nm) gives the oppurtunity to investigate the quality of samples , characterise interface and bulk defect states. SPS Response of mc-Si, Si3N4 and CdTe Samples
Surface Photovoltage Spectroscopy SPS030 Pictured with Silicon Solar Cell Sample
KP Technology USA Inc. The Kelvin Probe Specialists
www.airphotoemission.com www.kelvinprobe.com
Surface Photovoltage ModulesSPV010, SPV020
SPV010 - White LED Light Source
SPV020 - QTH Variable Light Source
Intense Light Sources
Automatic Software Control
Compatible with all Kelvin Probe Systems
Organic and Non-Organic Semiconductors
Metals
Thin Films
Solar Cells and Organic Photovoltaics
Corrosion
Features Applications
System DescriptionTThe SPV010 or SPV020 module is the ideal upgrade to any of our Kelvin Probe Systems, for any one with an interest in light sensitive materials such as solar cells and light sensitive dye. Vary the light intensity of the 150W DC regulated Quartz Tungsten Halogen bulb to achieve open circuit potential or investigate the quality of your latest roll-to-roll silicon solar cells.
The modules come in two forms; SPV010 is an intense White LED that is a simple on/o� DC measurement; SPV020 is an extremely intense Quartz Tungsten Halogen Light source that has a variable light intensity from softare control.
FSE and BSE Coated, Defective, measured with SPV020 QTH Light Pulse
Quartz Tungsten Halogen SPV020 Source and SPV010 LED Source with Electronics Control Box
-720
-700
-680
-660
-640
-620
-600
-580
-560
-540
-520
0 100 200 300 400 500 600 700 800 900 1000
Time (s)
chan
ge in
sur
face
pot
entia
l (m
V)
Back Side Grounded Front Side Grounded
1
2
3
4