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1 P. Farinelli 1 , L. Pelliccia 1 , B. Margesin 2 , R. Sorrentino 3 1 RF-Microtech, Italy 2 FBK – Fondazione Bruno Kessler, Italy 4 University of Perugia, Italy Ka-band Surface-Mountable Pseudo-elliptic Filter in Multilayer Micromachined Technology for On-board Communication Systems SPACE PASSIVE COMPONENT DAYS – New Developments

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Page 1: Ka-band Surface-Mountable Pseudo -elliptic Filter in

1 12-Oct-2016 SPCD – RF Microtech - New Developments

P. Farinelli1, L. Pelliccia1, B. Margesin2, R. Sorrentino3

1 RF-Microtech, Italy 2 FBK – Fondazione Bruno Kessler, Italy

4 University of Perugia, Italy

Ka-band Surface-Mountable Pseudo-elliptic Filter in Multilayer Micromachined Technology

for On-board Communication Systems

SPACE PASSIVE COMPONENT DAYS – New Developments

Page 2: Ka-band Surface-Mountable Pseudo -elliptic Filter in

2 12-Oct-2016 SPCD – RF Microtech - New Developments

• Motivation • 4th-order Ka-band filter in multilayer

micromachined technology • Design • Manufacturing • Experimental results

• Conclusions

Outline

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3 12-Oct-2016 SPCD – RF Microtech - New Developments

Filters, Diplexers (and multiplexer) are key elements in modern multiband and

multiservice telecommunications systems

Motivation

Conventional high Q filters in Ka band and beyond are based on coaxial TEM mode resonators allowing for high unloaded Q (>1000). However, they are bulky, heavy in weight and the integration with monolithic circuits is difficult.

Satellite market demands for innovative miniaturized technologies to reduce the dimensions, weight and cost of satellite equipment

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}

Process & RF design definition

Slide 4

Process Definition Two Wafer SOI (Silicon On Insulator) Deep silicon etching Etching angle: 3 degrees Gold plating deposition (2µm) Tolerances: ± 5µm

225 µm

225 µm

step for T-junction

Common input

Lo Filter Hi Filter

Wafer 1 SOI

Wafer 2 SOI

625µm } 625 µm

Lo Filter Hi Filter

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Based on resonant cavities and thin membranes that are: etched in Silicon/Silicon On

Insulator wafers gold-plated stacked in multilayer structures

Micromachining Technology for RF Filters

• High miniaturization • High Q • Small footprint (multilayer technology) • Small weight • High integration (Surface Mountable Devices) • Low manufacturing tolerances

Silicon wafers

Input Output

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Ka-band λ/2 TEM Mode Cavity

1) Number of geometrical parameters affecting the resonant frequency is minimized 2) Footprint reduction ~ 50%, Q decrease < 25%

Micromachined cavities are generally realized as TE101 mode cavities

wc

lr wr

α

hw

vs lc

wc hw

Main critical parameters: lc and wc Main critical parameter: lr TE101 mode cavity λ/2 TEM Mode Cavity

α

Page 7: Ka-band Surface-Mountable Pseudo -elliptic Filter in

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Ka-band λ/2 TEM Mode Cavity

20μm thick gold-plated Si membrane

resonator

short-circuited resonator ends

625μm thick SOI wafer

cavity

2nd layer 1st layer

cavity

Resonators are realized as short-circuited membranes etched in the Silicon wafers by Deep Reactive Ione Etching, gold electroplated and stacked by thermo-compressive bonding

lid layer

lid layer

625μm thick SOI wafer

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4th-order Filter: RF Design

input/output 50 Ω microstrip feeding lines

wings for capacitive couplings

opening for inductive couplings

1st layer

2nd layer

3rd layer

4th layer

5th layer

6th layer

1st res.

4th res.

3rd res. 2nd res.

square slot

input/output coupling slots

2.7 mm

11.6 mm 8.9 mm

Filter Topology

input/output 50Ω microstrip feeding

lines 1

3 2

4 S L -

+

The 4 cavities are placed on 2 levels stacking #6 silicon layers

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4th-order Filter: Simulated performance

Centre Frequency: 30GHz Fract. Bandwidth: 1.8% Insertion Loss < 2.5 dB Q ~ 600

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Filter Manufacturing

Stacking: 1 HR Silicon wafer, 200μm thick (top plate) 4 SOI wafers, 625μm thick each 1 supporting wafer Basic Technological Processes: Deep Reactive Ion Etching (DRIE) Gold Electroplating Anisotropic Etching (TMAH) for Conductive via’s Thermo-compressive Wafer Bonding

SOI #1

SOI #2

SOI #3

SOI #4

HR si

Supporting wafer Manufactured and

assembled in FBK - Italy Section of half filter

Flip Chip Assembly

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Filter Manufactured

Single resonant cavities

4th order Ka-band Filter

conductive vias

wafer details

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Inspections on Membrane flatness

• The final membranes are almost flat (buckling < 3µm).

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Dimensional Inspections

All membranes were longer than designed, because of a non-optimized etching time that caused an over-etching of the cavity side walls (about 60-80 µm for each side). This problem caused:

1. longer λ/2 membranes down-shift of the filter centre frequency (about 600-900 MHz)

2. Larger couplings between cavities that higher RL In the second run this error will be compensated for by undersizing the masks

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RF Measurements

Frequency down-shift by about 600MHz and poor S11 due to the over-etching problem

Comparison among measurements, circuital (AWR) and HFSS back simulations, accounting for the actual cavity dimensions

Frequency: 29.4 GHz Fract. Bandwidth: 2.6% Insertion Loss < 3 dB Simulated Q ~ 500

4th order Ka-band Filters

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Performance repeatability

Good agreement between measured performance of #8 samples and Montecarlo analysis, accounting for manufacturing and assembly tolerances

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Thermal Shocks

TEST CONDITIONs #10 cycles -30°/100° MIL –STD – 202G ; Method 107 G ,test condition A-1

No failure or change in S parameters for the #20 samples

DEVICES UNDER TEST: #10 single cavities #10 4th pole filters Before TS

After TS

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Mechanical Shocks

No failure or change in S parameters for the #5 samples

#5 4th order filters were glued on a test board and stressed with mechanical shocks

Before MS

After MS

Shape of shock pulse Half-sine

Peak acceleration 1500 g

Duration of pulse 0.3ms

Number of shocks 9 (3 shocks in each axis)

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Surface Mounting

The filter will soldered on a test board to measure the performance of the integrated device. The test board has been modeled and design to ensure good matching and

minimize the interconnection loss.

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Surface Mounting

Measurements and thermal shocks are on-going

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Conclusions A new micromachined resonator has been proposed for Ka–band filters for

space applications

4th order micromachined surface mountable filters have been designed,

fabricated and tested

Volume occupation is less than 12x9x3mm, weight is 0.75g

Unloaded Q around 500 and good reproducibility were demonstrated

Q up to 1000 is expected by increasing the cavity height, i.e. by using

thicker wafers

Good robustness to both thermal and mechanical shocks

The filter has been integrated in a test board by using standard surface

mounting techniques.

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Acknowledgements

ARTES 5.1 project “MIGNON”

“MIcromachined filters in multi-layer technoloGy for

satellite ON-board communication systems”

Special thanks to Dr Francois Deborgies and

Dr Christoph Ernst from ESA/ESTEC for their

support and suggestions.

Thank you for your kind attention