Upload
hugh
View
30
Download
3
Tags:
Embed Size (px)
DESCRIPTION
45 th Design Automation Conference Anaheim , California. Electric Field Integral Equation Combined with Cylindrical Conduction Mode Basis Functions for Electrical Modeling of Three-Dimensional Interconnects. June 11, 2008 Ki Jin Han*, Madhavan Swaminathan, and Ege Engin - PowerPoint PPT Presentation
Citation preview
Electric Field Integral Equation Electric Field Integral Equation Combined with Cylindrical Conduction Combined with Cylindrical Conduction
Mode Basis Functions for Electrical Mode Basis Functions for Electrical Modeling of Three-Dimensional Modeling of Three-Dimensional
InterconnectsInterconnects
June 11, 2008June 11, 2008
Ki Jin Han*, Madhavan Swaminathan, and Ege EnginKi Jin Han*, Madhavan Swaminathan, and Ege EnginSchool of Electrical and Computer Engineering,School of Electrical and Computer Engineering,
Georgia Institute of TechnologyGeorgia Institute of Technology{kjhan, madhavan, engin}@ece.gatech.edu{kjhan, madhavan, engin}@ece.gatech.edu
45th Design Automation ConferenceAnaheim, California
22
ContentsContents IntroductionIntroduction Cylindrical conduction mode basis Cylindrical conduction mode basis
functions (CMBF’s)functions (CMBF’s) Electric field integral equation (EFIE) Electric field integral equation (EFIE)
formulation with CMBF’sformulation with CMBF’s Simulation examplesSimulation examples ConclusionsConclusions
33
BackgroundBackground Interconnections in 3-D Interconnections in 3-D
integrationintegration– Role of interconnections Role of interconnections
is critical for signal is critical for signal transmission.transmission.
– Design and modeling of Design and modeling of interconnections are interconnections are important. important.
Challenges in electrical Challenges in electrical design of SiPdesign of SiP– Modeling of the entire Modeling of the entire
coupling among coupling among interconnects in an SiP.interconnects in an SiP.
– High-frequency High-frequency modeling, including skin modeling, including skin and proximity effects.and proximity effects.
Introduction (1)
Bonding wires in a 3-D integration. (Photo courtesy of Amkor Technology,
Inc.)
* R. Chatterjee, R. Tummala, “The 3DASSM Consortium: An Industry/Academia Collaboration,” online article in http://ap.pennnet.com
Through-silicon via (TSV) interconnections in a Si substrate*
Wideband modeling of the entire coupling (between a thousand wires) is required for multi-functional and high-
density integrations.
44
Approach in this PaperApproach in this Paper State of the artState of the art
– Existing modeling tools: Have issues in accuracy or Existing modeling tools: Have issues in accuracy or speed for modeling of large number of 3-D interconnects.speed for modeling of large number of 3-D interconnects.
– Electric field integral equation (EFIE) combined with Electric field integral equation (EFIE) combined with conduction mode basis function (CMBF)*conduction mode basis function (CMBF)*
AdvantagesAdvantages– Describes current density distribution with a few CMBF’s.Describes current density distribution with a few CMBF’s.– Provides simplified equivalent circuit model.Provides simplified equivalent circuit model.
Issues for 3-D interconnect modelingIssues for 3-D interconnect modeling– Not geometrically suitable for 3-D cylindrical structures.Not geometrically suitable for 3-D cylindrical structures.– Allocating basis functions is difficult to describe various Allocating basis functions is difficult to describe various
proximity effects.proximity effects. Approach in this paper: EFIE combined with Approach in this paper: EFIE combined with
cylindrical CMBFcylindrical CMBF– Maintains advantages of the original CMBF-based Maintains advantages of the original CMBF-based
approach.approach.– Geometrically suitable for 3-D interconnections (bonding Geometrically suitable for 3-D interconnections (bonding
wires, through hole vias).wires, through hole vias).– Automatically captures skin and proximity effects. Automatically captures skin and proximity effects.
Introduction (2)
* L. Daniel, J. White, and A. Sangiovanni-Vincentelli, “Interconnect Electromagnetic Modeling using Conduction Modes as Global Basis Functions,” Topical Meeting on Electrical Performance of Electronic Packages, EPEP 2000, Scottsdale, Arizona, Oct. 2000.
55
Cylindrical CMBFCylindrical CMBF Derived from solutions of Derived from solutions of
the current density the current density diffusion equation in a diffusion equation in a conductor.conductor.
The fundamental mode The fundamental mode (skin-effect mode) basis (skin-effect mode) basis captures skin effect.captures skin effect.
Two orthogonal higher-Two orthogonal higher-order mode (proximity-order mode (proximity-effect mode) bases effect mode) bases captures proximity effects captures proximity effects in arbitrary orientations.in arbitrary orientations.
elsewhere0
ˆ)(ˆ
)( 000,
iiii
i
i
VrrrJA
zrw
elsewhere0
))(cos(ˆ)(ˆ
)(,iiniiin
in
i
ni
VrnrrJA
zrw
-1.5 -1 -0.5 0 0.5 1 1.5
x 10-5
-1.5
-1
-0.5
0
0.5
1
1.5x 10
-5 Order 0, Frequency 1.0e+008 Hz
X
Y
-1.5 -1 -0.5 0 0.5 1 1.5
x 10-5
-1.5
-1
-0.5
0
0.5
1
1.5x 10
-5 Order 0, Frequency 1.0e+010 Hz
X
Y
-1.5 -1 -0.5 0 0.5 1 1.5
x 10-5
-1.5
-1
-0.5
0
0.5
1
1.5x 10
-5 Order 1, Frequency 1.0e+008 Hz
X
Y
-1.5 -1 -0.5 0 0.5 1 1.5
x 10-5
-1.5
-1
-0.5
0
0.5
1
1.5x 10
-5 Order 2, Frequency 1.0e+008 Hz
X
Y
-1.5 -1 -0.5 0 0.5 1 1.5
x 10-5
-1.5
-1
-0.5
0
0.5
1
1.5x 10
-5 Order 1, Frequency 1.0e+010 Hz
X
Y
-1.5 -1 -0.5 0 0.5 1 1.5
x 10-5
-1.5
-1
-0.5
0
0.5
1
1.5x 10
-5 Order 2, Frequency 1.0e+010 Hz
X
Y
CMBF (1)
66
Basic FormulationBasic Formulation
),('),'()',(),(
'
rdVrJrrGjrJ
V
),(),(
,
rwIrJ jnqqn
jnqj
),(),(1
4),(
1
,,
rdVrw
rrIjrwI
jVjjjnq
jdnjnq
dnjnqjnq
i
i j
i
S iiimdi
V iV j
ji
jjnqiimdqn
jnq
qniijnqV iimdjnq
Sdrwr
dVdVrr
rwrwIj
dVrwrwI
)()(
1)()(
4
)()(1
*
*
,
,
*
j : conductor index, n: order indexq: orientation index
V imd
imd
dVxrw
xrw
),(
),,(
*
(3) Applying innerproduct
(Galerkin’s method)
(2) Approximationof current density
with CMBF’s
(1) EFIEConstruction of partial impedance matrix
jnqimdpR ,,
jnqimdpL ,,
imdV
dVrwrw ijnqV iimd )()(1 *
V V jnqimd dVdVrr
rwrw'
* ''
1)'()(
4
S imdS imd SdrwrSdrwr
)()()()( **
imdqn
jnqimdpjnqqn
jnqimdpjnq VLIjRI ,
,,,
,,
ijijij VIj
)( LR
jnqimdpij R ,,R
jnqimdpij L ,,L
The global partial impedance matrix equation (N: number of conductors)
N
i
N
j
NNN
ij
N
N
j
NNN
ij
N
V
V
V
I
I
I
j
I
I
I
11
1
1111
1
111
LL
L
LL
RR
R
RR
ijR
ijL
EFIE (1)
77
Calculation of Partial Calculation of Partial ImpedancesImpedances
Partial resistancesPartial resistances– The resistance matrix is purely diagonal.The resistance matrix is purely diagonal.
Partial self inductancesPartial self inductances– Coordinates transform for angular coordinates enables Coordinates transform for angular coordinates enables
an analytic integral, and address singular points.an analytic integral, and address singular points. Partial mutual inductancesPartial mutual inductances
– Pre-computation of frequency independent integrals Pre-computation of frequency independent integrals improves efficiency of frequency-sweep simulation.improves efficiency of frequency-sweep simulation.
EFIE (2)
ij ij j i
j i
jijij
z
i
z
ijiimijjnj
V V
minjjnim
dddddzdzww
L
, ,
,*
,
,*
,,
'
1)ˆˆ(),(),(
4
''
1)'()(
4
rrzz
drdrrr
rwrw
Frequency dependentpart
Frequency independentpart
88
Equivalent CircuitEquivalent Circuit Interconnects are Interconnects are
approximated into approximated into cylindrical cylindrical conductor segment conductor segment model.model.
Cylindrical CMBF Cylindrical CMBF are used as global are used as global basis functions.basis functions.
Partial resistances Partial resistances and inductances of and inductances of are computed.are computed.
Combined Combined equivalent circuit is equivalent circuit is constructed.constructed.
“Loops” from
proximity-effect m
odes
“Branches” from skin-effect modes
EFIE (7)
99
GeometryGeometry
X
Y
10 11
5 6 7
1 2
12
Ground
1 Testing ports
m100
m30
m60
5 by 5 Via Array5 by 5 Via Array (1) (1)Examples (1)
1010104
106
108
1010
0.026
0.028
0.03
0.032
0.034
0.036
0.038
0.04
self
loop
indu
ctan
ce (
nH)
frequency (Hz)
L1,1
L2,2
L5,5
L6,6
L7,7
L10,10
L11,11
L12,12
104
106
108
1010
2
4
6
8
10
12
14
16x 10
-3
mut
ual l
oop
indu
ctan
ce (
nH)
frequency (Hz)
5 by 5 Via Array 5 by 5 Via Array (2)(2)
Self & mutual loop inductancesSelf & mutual loop inductances
Group 1
Group 2
Group 3
Group 4
1 2 G
10 11 12
5 6 7
1 2 G
10 11 12
5 6 7
1 2 G
10 11 12
5 6 7
1 2 G
10 11 12
5 6 7
G
1 2 G
10 11 12
5 6 7
1 2 G
10 11 12
5 6 7
1 2 G
10 11 12
5 6 7
1 2 G
10 11 12
5 6 7
- At low frequencies, all inductances are mainly functions of distance between lines.- At high frequencies, inductances decrease variously according different proximity effects.
Examples (2)
1111
GeometryGeometry
10 by 10 Via Array 10 by 10 Via Array (1)(1)
X
Y
m100
m25
m30
Examples (3)
1212
10 by 10 Via Array 10 by 10 Via Array (2)(2)
107 HzAll
conductors are uniformly
excited.108 Hz109 Hz
Examples (4)
1313
10 by 10 Via Array 10 by 10 Via Array (3)(3)
107 Hz108 Hz109 Hz+1 volt
-1 volt
Examples (5)
1414
GeometryGeometry
yx
Class 1
Class 2Class 3
z
y
z
102 Bonding Wires on 3 Stacked Chips 102 Bonding Wires on 3 Stacked Chips (1)(1)
Bonding wires- Material: gold- Diameter: 25 um- Pitch: 60 um
Pack
ag
e h
eig
ht
~ 1
.4 m
m
- Length Class 1: 1.26 mm Class 2: 0.82 mm Class 3: 0.48 mm
Y. Fukui et al., “Triple-Chip Stacked CSP,” Proc. IEEE ECTC, pp. 385-389, 2000.
Examples (6)
1515
Impedances at 10 GHzImpedances at 10 GHz– A wire in class 2 is grounded.A wire in class 2 is grounded.
5 10 15 20 25 300.1
0.2
0.3
0.4
0.5
0.6
0.7
resi
stan
ce (
ohm
)
location index5 10 15 20 25 30
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1
indu
ctan
ce (
nH)
location index
102 Bonding Wires on 3 Stacked Chips 102 Bonding Wires on 3 Stacked Chips (2)(2)
Class 1
Class 2
Class 3
groundedconductor
Examples (7)
Elapsed time for 19 frequency points 81,749 secs (22.7 hrs)
(CPU: Intel Xeon 2.8 GHz, RAM: 2 GB)
Full modeling of 102 bonding wires is not available with existing tools!
1616
ConclusionsConclusions EFIE combined with the cylindrical CMBF’sEFIE combined with the cylindrical CMBF’s
– Captures skin and proximity effects with a small number Captures skin and proximity effects with a small number of basis functions.of basis functions.
– Geometrically suits various 3-D interconnects:Geometrically suits various 3-D interconnects: Wire bonds, connecter pin array, and through hole via Wire bonds, connecter pin array, and through hole via
interconnectsinterconnects Improvements in computation of partial Improvements in computation of partial
impedancesimpedances– Using analytic expressions, pre-computation for Using analytic expressions, pre-computation for
frequency-independent parts, and efficiency frequency-independent parts, and efficiency enhancement schemes.enhancement schemes.
– Large 3-D interconnect structures can be modeled with Large 3-D interconnect structures can be modeled with the proposed method.the proposed method.
Future WorkFuture Work– Inclusion of capacitive coupling and finite ground effect.Inclusion of capacitive coupling and finite ground effect.– Extension of the proposed method for modeling of TSV. Extension of the proposed method for modeling of TSV.
Conclusions (1)
1717
AcknowledgementsAcknowledgementsMixed Signal Design Tools ConsortiumMixed Signal Design Tools Consortium
(MSDT) (MSDT) at the Packaging Research Centerat the Packaging Research Center,,
Georgia Georgia Institute of Institute of TechTechnologynology
MatsushitaMatsushitaEPCOSEPCOS
InfineonInfineonSameerSameer
NXPNXP