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INSIDE BINDING EDGE NOVEMBER 2011 COPYRIGHT © LAB MANAGER MAGAZINE® The emergence and rapid evolution of the field of nanotechnology has created a requirement for particle characterization instruments capable of measuring particle sizes on the nanometer scale. Considerable effort has been devoted to developing instruments capable of measuring smaller and smaller particles, and a number of these are able to measure particles only nanometers in size. NANOPARTICLE CHARACTERIZATION TSI 3936 Nanosight LM10 Nanosight NS200 Microtrac Nanotrac Wave Fritsch Nanotec Plus Brookhaven Instruments 90Plus Brookhaven Instruments ZetaPlus Brookhaven Instruments BI-200SM Brookhaven Instruments BioDLS Brookhaven Instruments FOQELS Brookhaven Instruments NanoDLS Brookhaven Instruments BI-DCP Brookhaven Instruments ZetaPALS Brookhaven Instruments ACOS Brookhaven Instruments BI-XDC IZON qNano Nanosight LM20 Nanosight NS500 Bettersize Instruments BT-90 Beckman Coulter Delsa Nano C Beckman Coulter Delsa Nano Z Particle Sizing Systems Nicomp 380 Beckman Coulter Delsa Nano S Beckman Coulter Delsa Nano HC Fritsch 12 DynaSizer Horiba SZ-100 Surface area spectroscopy determines the way a solid interacts with its surroundings, and is the most widely used means of characterizing porous materials. Since the surface area corresponds to the roughness of the particle exterior and its porous interior, gas sorption is the preferred technique to measure particle surface area. SURFACE AREA SPECTROSCOPY Micromeritics SMS Surface Energy Analyzer Kunash Tristar 3020 Kunash ASAP 2420 Kunash ASAP 2050 Quantachrome Instruments IQ Series Kunash ASAP 2020 Kunash Flowsorb III Merrow Scientific BELSORP AIM AS-3012 Kunash Gemini 2390 Laser diffraction can be used for the non-destructive analysis of wet or dry samples, with particles in the size range of 0.02 to 2000 microns, and has inherent advantages that make it preferable to other options for many different materials. Laser diffraction techniques are useful if only the particle size needs to be investigated. LASER DIFFRACTION A Portable systems Portable particle characterization instruments are useful when bench space is limited; offering efficient use of bench space, while preserving accuracy, precision, and resolution. B Standard systems Standard systems are the mainstay of laser diffraction for the measurement of particle size. C Spray droplet size systems Measurement of droplet characterization in sprays and aerosols relies on a specific form of laser diffraction requiring dedicated instrumentation. Horiba LA-300 Malvern Mastersizer micro Horiba LA-950 Malvern Spraytec Malvern Mastersizer 2000E MicroTrac DIA Cilas CILAS 990 Oxford Lasers VisiSizer portable Dantec Dynamics IPI Particle Sizing Systems Accusizer 780 APS Cilas CILAS 1190 Bettersize Instruments 9300Z Bettersize Instruments 9300S Bettersize Instruments 2002 Sympatec Helox Beckman Coulter LS 13 320 MW Beckman Coulter LS 200 Malvern Mastersizer 2000 MicroTrac Aerotrac Malvern Insitec Oxford Lasers VisiSizer D30 Cilas CILAS 1090 Oxford Lasers VisiSizer S200 Bettersize Instruments 2000 Bettersize Instruments 9300ST Bettersize Instruments 2001 Bettersize Instruments 2003 Fritsch MicroTec Plus Beckman Coulter LS 13 320 SW Particle Sizing Systems AccuSizer 780AD Image analysis is becoming an increasingly popular tool for particle size and shape analysis of powders. Modern image analysis systems for particle characterization are capable of analyzing tens of thousands of particles in a matter of minutes with sensitivity down to below 1 µm. Image analysis can be dynamic or static, both of which are used in many industrial applications. IMAGE ANALYSIS A Dynamic In dynamic image analysis, particles flow past one or more cameras. Dynamic image analysis generally has lower sensitivity than static systems. Horiba CAMSIZER Horiba PSA300 Horiba CAMSIZER-XT Malvern Sysmex FPIA-3000 Clemex PSA Sympatec PICTIS B Static In static image analysis, particles sit on a slide moved by an automated stage for inspection by camera and microscope. Static image analysis systems provide greater sensitivity and operate on more sophisticated software for more complex investigations. Micrometrics Particle Insight Sympatec PICTOS Spectro SpectroNF Q200 Particle size characterization Accurate particle size characterization is essential in many processes in a large number of industries and research areas, including pharmacology, cosmetics, nanotechnology, paints, pigments, food science, ceramics, textiles, geological science, polymer science, environmental science, catalysis and powder metallurgical science. The term “particle size characterization” can be used to cover size measurement only, or any combination of size, shape, zeta potential, surface area and other parameters. A wide range of instruments is available to facilitate particle size characterization and tailored according to individual needs and requirements. This purchasing guide attempts to simplify the range of available particle characterization instruments by categorizing them according to type and function. Particle size characterization The accurate measurement of particle characteristics is essential in many industrial and research processes. A large number of particle characterization instruments are available, offering a wide range of options and functions. It is important to select the appropriate instrument for your specific needs in order to ensure optimal results. When purchasing a particle characterization instrument the first consideration should be what characteristics need to be measured. Laser diffraction instruments are widely used for size measurements only, image analysis instruments tend to be used for size and shape data, while acoustic spectroscopy instruments can be used to measure both size and zeta potential. INTRODUCTION: Acoustic spectroscopy is useful if both particle size and zeta-potential need to be investigated. Acoustic spectroscopy measures the attenuation and sound speed of ultrasound pulses as they pass through concentrated slurries. The measurements are made over a wide range of frequencies and the resulting spectra are used to calculate the particle size distribution over a range from 10 nanometers to more than 10 micrometers. ACOUSTIC SPECTROSCOPY Horiba DT-1201 Dispersion Technology DT-100 Matec APS-100 Matec ZA500 Dispersion Technology DT-300 Matec zetafinder Matec Zeta-APS Particle Sizing Systems 380ZLS Light scattering is a popular technique for determining particle size. Dynamic light scattering can be used to measure smaller particles (less than a few microns) than is possible using static light scattering techniques. LIGHT SCATTERING A Dynamic Dynamic light scattering works by observing the Doppler shift of the incident light due to the Brownian motion of the suspended particulates. When a coherent light source shines on these particles, light will be scattered from the particles, but the frequency will be shifted because the particles are in motion (Doppler shift). The speed of the particles determines how much the frequency is shifted. Micromeritics Vasco DLS Brookhaven Instruments BI-MwA Brookhaven Instruments BI-200SM Brookhaven Instruments 90Plus Brookhaven Instruments ACOS Brookhaven Instruments FOQELS Brookhaven Instruments NanoDLS Brookhaven Instruments BioDLS Brookhaven Instruments BI-200SM Wyatt Technology WyattQELS Wyatt Technology MiniDawn Treos Microtrac S3500 AIM AS-2012 Kunash Saturn Digisizer 5205 Wyatt Technology Dawn Heleos II Wyatt Technology Dynapro Nanostar Dantec Dynamics PDA HiDense Dantec Dynamics FiberPDA system Dantec Dynamics DualPDA Wyatt Technology Dynapro Plate Reader Microtrac Bluewave AIM AS-2011 B Static Modern static light scattering instruments have become the method of choice in most industries due to their analysis speed, wide size range, ease of use, flexibility, and reproducibility. Static light scattering measures particle size by scattering light from the edge of the particle at an angle which is dependent on the size of the particle. Larger particles scatter light at relatively smaller angles than light scattered from smaller particles. From observing the intensity of light scattered at different angles, it is possible to determine the relative amounts of different sized particles. START HERE

INSDEN NBGOUTD GG G DB GDD ONT BD NO … · INSDEN NBGOUTD GG G DB GDD ONT BD NO IGDN NI T T NO IGD NONGO N D TOEG T ... CAMSIZER Horiba PSA300 CAMSIZER-XT Malvern Sysmex FPIA-3000

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Page 1: INSDEN NBGOUTD GG G DB GDD ONT BD NO … · INSDEN NBGOUTD GG G DB GDD ONT BD NO IGDN NI T T NO IGD NONGO N D TOEG T ... CAMSIZER Horiba PSA300 CAMSIZER-XT Malvern Sysmex FPIA-3000

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Lab Manager's Independent guIde to purchasIng partIcLe anaLysIs/partIcLe characterIzatIon InstruMents November 2011 Copyright © lab maNager magaziNe®

Author: John Buie

the emergence and rapid evolution of the field of nanotechnology has created a requirement for particle characterization instruments capable of measuring particle sizes on the nanometer scale. Considerable effort has been devoted to developing instruments capable of measuring smaller and smaller particles, and a number of these are able to measure particles only nanometers in size.

NaNoparticle characterizatioN

TSI3936

NanosightLM10

NanosightNS200

MicrotracNanotrac Wave

FritschNanotec Plus

Brookhaven Instruments90Plus

Brookhaven InstrumentsZetaPlus

Brookhaven InstrumentsBI-200SM

Brookhaven InstrumentsBioDLS

Brookhaven InstrumentsFOQELS

Brookhaven InstrumentsNanoDLS

Brookhaven InstrumentsBI-DCP

Brookhaven InstrumentsZetaPALS

Brookhaven InstrumentsACOS

Brookhaven InstrumentsBI-XDC

IZONqNano

NanosightLM20

NanosightNS500

Bettersize InstrumentsBT-90

Beckman CoulterDelsa Nano C

Beckman CoulterDelsa Nano Z

Particle Sizing SystemsNicomp 380

Beckman CoulterDelsa Nano S

Beckman CoulterDelsa Nano HC

Fritsch12 DynaSizer

HoribaSZ-100

Surface area spectroscopy determines the way a solid interacts with its surroundings, and is the most widely used means of characterizing porous materials. Since the surface area corresponds to the roughness of the particle exterior and its porous interior, gas sorption is the preferred technique to measure particle surface area.

Surface area SpectroScopy

MicromeriticsSMS Surface Energy Analyzer

KunashTristar 3020

KunashASAP 2420

KunashASAP 2050

Quantachrome InstrumentsIQ Series

KunashASAP 2020

KunashFlowsorb III

Merrow ScientificBELSORP

AIMAS-3012

KunashGemini 2390

laser diffraction can be used for the non-destructive analysis of wet or dry samples, with particles in the size range of 0.02 to 2000 microns, and has inherent advantages that make it preferable to other options for many different materials.

laser diffraction techniques are useful if only the particle size needs to be investigated.

laSer diffractioN

a Portable systems portable particle characterization instruments are useful when bench space is limited; offering

efficient use of bench space, while preserving accuracy, precision, and resolution.

B Standard systemsStandard systems are the mainstay of laser diffraction for the measurement of particle size.

c Spray droplet size systemsmeasurement of droplet characterization in sprays and aerosols relies on a specific form

of laser diffraction requiring dedicated instrumentation.

HoribaLA-300

MalvernMastersizer micro

HoribaLA-950

MalvernSpraytec

MalvernMastersizer 2000E

MicroTracDIA

CilasCILAS 990

Oxford LasersVisiSizer portable

Dantec DynamicsIPI

Particle Sizing SystemsAccusizer 780 APS

CilasCILAS 1190

Bettersize Instruments9300Z

Bettersize Instruments9300S

Bettersize Instruments2002

SympatecHelox

Beckman CoulterLS 13 320 MW

Beckman CoulterLS 200

MalvernMastersizer 2000

MicroTracAerotrac

MalvernInsitec

Oxford LasersVisiSizer D30

CilasCILAS 1090

Oxford LasersVisiSizer S200

Bettersize Instruments2000

Bettersize Instruments9300ST

Bettersize Instruments2001

Bettersize Instruments2003

FritschMicroTec Plus

Beckman CoulterLS 13 320 SW

Particle Sizing SystemsAccuSizer 780AD

image analysis is becoming an increasingly popular tool for particle size and shape analysis of powders. modern image analysis systems for particle characterization are capable of analyzing tens of thousands of particles in a matter of minutes with sensitivity down to below 1 µm.

image analysis can be dynamic or static, both of which are used in many industrial applications.

image aNalySiS

a Dynamicin dynamic image analysis, particles flow past one or more

cameras. Dynamic image analysis generally has lower sensitivity than static systems.

HoribaCAMSIZER Horiba

PSA300

HoribaCAMSIZER-XT Malvern

Sysmex FPIA-3000ClemexPSA Sympatec

PICTIS

B Staticin static image analysis, particles sit on a slide moved by an

automated stage for inspection by camera and microscope. Static image analysis systems provide greater sensitivity and operate on more sophisticated software for more complex investigations.

MicrometricsParticle Insight Sympatec

PICTOSSpectroSpectroNF Q200

Particle size characterization

accurate particle size characterization is essential in many processes in a large number

of industries and research areas, including pharmacology, cosmetics, nanotechnology,

paints, pigments, food science, ceramics, textiles, geological science, polymer science,

environmental science, catalysis and powder metallurgical science.

the term “particle size characterization” can be used to cover size measurement only,

or any combination of size, shape, zeta potential, surface area and other parameters.

a wide range of instruments is available to facilitate particle size characterization and

tailored according to individual needs and requirements.

this purchasing guide attempts to simplify the range of available particle

characterization instruments by categorizing them according to type and function.

Particle size characterization

the accurate measurement of particle characteristics is essential in many industrial and research processes. a large

number of particle characterization instruments are available, offering a wide range of options and functions. it is

important to select the appropriate instrument for your specific needs in order to ensure optimal results.

When purchasing a particle characterization instrument the first consideration should be what characteristics need

to be measured. laser diffraction instruments are widely used for size measurements only, image analysis instruments

tend to be used for size and shape data, while acoustic spectroscopy instruments can be used to measure both size

and zeta potential.

iNtroductioN:

acoustic spectroscopy is useful if both particle size and zeta-potential need to be investigated.

acoustic spectroscopy measures the attenuation and sound speed of ultrasound pulses as they pass through concentrated slurries. the measurements are made over a wide range of frequencies and the resulting spectra are used to calculate the particle size distribution over a range from 10 nanometers to more than 10 micrometers.

acouStic SpectroScopy

HoribaDT-1201

Dispersion TechnologyDT-100

MatecAPS-100

MatecZA500

Dispersion TechnologyDT-300

Mateczetafinder

MatecZeta-APS

Particle Sizing Systems380ZLS

light scattering is a popular technique for determining particle size. Dynamic light scattering can be used to measure smaller particles (less than a few microns) than is possible using static light scattering techniques.

light ScatteriNg

a DynamicDynamic light scattering works by observing the Doppler shift of the incident light due to the

brownian motion of the suspended particulates. When a coherent light source shines on these particles, light will be scattered from the particles, but the frequency will be shifted because the particles are in motion (Doppler shift). the speed of the particles determines how much the frequency is shifted.

MicromeriticsVasco DLS

Brookhaven InstrumentsBI-MwA

Brookhaven InstrumentsBI-200SM

Brookhaven Instruments90Plus

Brookhaven InstrumentsACOS

Brookhaven InstrumentsFOQELS

Brookhaven InstrumentsNanoDLS

Brookhaven InstrumentsBioDLS

Brookhaven InstrumentsBI-200SM

Wyatt TechnologyWyattQELS

Wyatt TechnologyMiniDawn Treos

MicrotracS3500

AIMAS-2012

KunashSaturn Digisizer 5205

Wyatt TechnologyDawn Heleos II

Wyatt TechnologyDynapro Nanostar

Dantec DynamicsPDA HiDense

Dantec DynamicsFiberPDA system

Dantec DynamicsDualPDA

Wyatt TechnologyDynapro Plate Reader

MicrotracBluewave

AIMAS-2011

B Staticmodern static light scattering instruments have become the method of choice in most

industries due to their analysis speed, wide size range, ease of use, flexibility, and reproducibility.

Static light scattering measures particle size by scattering light from the edge of the particle at an angle which is dependent on the size of the particle. larger particles scatter light at relatively smaller angles than light scattered from smaller particles. From observing the intensity of light scattered at different angles, it is possible to determine the relative amounts of different sized particles.

STARTHERE

Page 2: INSDEN NBGOUTD GG G DB GDD ONT BD NO … · INSDEN NBGOUTD GG G DB GDD ONT BD NO IGDN NI T T NO IGD NONGO N D TOEG T ... CAMSIZER Horiba PSA300 CAMSIZER-XT Malvern Sysmex FPIA-3000

LAB MANAGER MAGAZINE’S INDEPENDENTGUIDE TO PURCHASINGPARTICLE ANALySIS/ PARTICLE CHARACTERIZATION

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Particleanalysis/ Particlecharacterizationinstruments

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