In-Circuit Testing Printed Circuit Board Testing · In-Circuit Testing Probes In-Circuit Testing Printed Circuit Board Testing. TABLE OF CONTENT About Us CCP Probe Series Probe Tip

C.C.P. CONTACT PROBES

In-Circuit Testing ProbesIn-Circuit Testing Printed Circuit Board Testing

TABLE OF CONTENTTABLE OF CONTENT

About Us

CCP Probe Series

Probe Tip Type

P Series List - Probe

R Series List - Receptacle

T Series List - Thru-Hole Probe

Structure

01040506101214

Quality Management15

C.C.P. Contact Probes Co., Ltd. is a leading global

manufacturer of Contact Probes, Pogo Pins, Testprobes,

Springloaded Connectors, and Crown Spring Connectors.

In 1986 we began as a specialized provider of test probes and socket

auxiliary solutions and slowly expanded our product portfolio in related

industries such as electronic components manufacturing. Among our

customers are renowned brands like Apple and Amazon and our products are

revered by our customers for their exceptional reliability and superior quality.

Our research and development teams are continuously improving our existing products and

bringing new innovations to the market to meet the growing demands of our clients. Since 2001

CCP Contact Probes has been a public traded company listed on the Taiwan Stock Exchange. Today

CCP has subsidiaries in the United States, China, Germany, India, Japan and Singapore, meeting the needs

of our customers around the world.

LocationsLocations

Selected CustomersSelected Customers

USAUSA

JAPAN

CHINA:CHINA:

TAIWAN:

INDIAINDIA

SINGAPORE

ABOUT USABOUT USIntroductionIntroduction

0101

GERMANYGERMANY

Dongguan HumenShenzhenBeijingKunshanChengduHongkongChongqingWuhan

TaipeiKaohsiungHsinchu

KOREA

Company Culture

Yearly Home Visit

Employee’s Children Summer Camp

Tuition Subsidy for Employee’s Children

HistoryHistory

0202

ABOUT USABOUT USHistoryHistory

2016 High Current Connector Product Line

2014 CCP USA Established

2003 Listed on Taiwan Stock Market (TW. 6217))

2002 Commercial Connector Product Line

2001 CCP Dongguan Factory Established

1986 CCP Established/ Testing Product Line

2018 CCP Germany, Singapore & India Established

Product LinesProduct Lines

Agile and Flexible Design Process with Self-owned Turning and Plating Factory

A Proven Track-record of Reliability, an Industry Certified QualityManagement System, and State-of-the-art Production Equipment

Industrial Connector Solutions

Industrial Connector Solutions

TestingSolutionsTestingSolutions

High Current Connector SolutionsHigh Current

Connector SolutionsCommercial

Connector SolutionsCommercial

Connector Solutions

0303

ABOUT USABOUT USAdvantagesAdvantages

Over 30 Years of Product Development ExperienceServicing Industry-leading Clients

0404

STRUCTURE

PlungerPlunger

RecepticalReceptical

BarrelBarrel

SpringSpring

Beryllium Copper or SK4 Alloywith Gold or Rhodium Plating

Brass or Phosphor BronzeAlloy with Gold Plating.

Stainless Steel Alloyor Music Wire withGold Plating

Brass or Phosphor BronzeAlloy with Gold Plating

Probe Series(P Series)

Receptacle Series(R Series)

OPENING OPTIONS

FreeStateFreeState CompressedCompressed

FreeStateFreeState

CompressedCompressed

Soldered WireSoldered Wire Wired TerminalWired TerminalCup TailCup Tail

Normal OpeningNormal Opening Wide OpeningWide Opening

Crimped TailCrimped Tail

MOUNTING OPTIONSMOUNTING OPTIONS

Thru-Hole Probe Series(T Series)

0505

P Series R Series T Series

CCP PROBE SERIES

Used to test lands and pads. Needles can penetrate thin layers of oxides or contaminations.

Large 9 Points

L9

LN3Used to test lands and pads. Needles can penetrate thin layers of oxides or contaminations.

Large Needle 3

LN7Large Needle 7

PROBE TIP TYPEPROBE TIP TYPE

LSUsed to penetrate through holes, pads and gold edge fingers. Will not be contaminated by dust.

Used to test long leads, terminals, wire wrap posts and pads.

Large Star

L7Used to test lands, terminals, and wire wrap posts.

Large 7 Points

0606


Used to tes lands, terminals, and wire wrap posts.

Large 7 Points with Large Middle Center

L7M

Used to test through holes, pads and gold edge fingers.

Medium 3 Side Chiseled

M3C

L3CUsed to test through holes, pads and gold edge fingers.

Large 3 Side Chiseled

M4CUsed to test through holes, pads and gold edge fingers.

Medium 4 Side Chiseled

L4CUsed to test through holes, pads and gold edge fingers.

Large 4 Side Chiseled

0707

MCUsed to test long leads, terminals and wire wrap posts.

Medium Cup

LCUsed to test long leads, terminals and wire wrap posts.

Large Cup

MAMedium Awl

MRUsed to test gold edge fingers and gold pads. Leaves no marks or indentations.

Medium Round

Used to test gold edge fingers and gold pads. Leaves no marks or indentations.

LRLarge Round


0808

Used to test through holes, pads and gold edge fingers.

LAUsed to test through holes, pads and gold edge fingers.

Large Awl

M4Used to test narrow lands. Will not be contaminated by dust.

Medium 4 Points

L4Used to test narrow lands. Will not be contaminated by dust.

Large 4 Points

S4Used to test narrow lands. Will not be contaminated by dust.

Small 4 Points

MFFor testing pads and gold edge-fingers.Contact leaves no marks or indentations.

Medium Flat

LFFor testing pads and gold edge-fingers.Contact assured leaves no marks or indentations.

Large Flat


0909

1010

P SERIES LIST

a

Coding Rule: Example:

ICT-P: a-b-c-d-e : f-g-h-i ICT-P: 020-1150-1000-0150-E : BC-Au-BR-Au

Barrel Diameterin mm

0.20

0.26

0.30

0.35

0.380.38

0.480.48

0.580.58

0.680.680.68

11.50

12.50

11.50

12.50

12.0012.50

12.0012.60

15.0015.60

16.3516.5524.70

10.00

11.00

10.00

11.00

10.0010.00

10.0010.00

13.0013.00

13.0013.0018.50

01.50

01.50

01.50

01.50

02.0002.00

02.0002.00

02.0002.00

03.3502.6504.20

bFull Lengthin mm

cBarrel Lengthin mm

dFull Strokein mm

b

c

d

a

Tip TypeSee Tip Type Page

e

Plunger BaseBC: Beryllium CopperSK4: High Carbon Steel

f

gPlunger PlatingAu: GoldRh: RhodiumNA: None

Barrel BasePB: Phosphor BronzeBR: Brass

h

Barrel PlatingAu: Gold

i

P Series Dimensions Materials P Series Dimensions Materials

e

Recommended Pitch 0.45mm








11

Recommended Pitch 1.90 mm




P SERIES LIST

aBarrel Diameterin mm

1.011.011.011.011.01

1.361.361.361.361.371.37

2.00

2.36

16.3517.0424.2033.3038.30

23.5024.7033.3038.3009.7010.00

33.35

34.10

13.0013.0018.5025.0025.00

18.5018.5025.0025.0007.5007.50

25.00

25.00

03.3502.5404.2006.3006.30

03.0004.2006.3006.3002.2001.50

06.35

06.60

bFull Lengthin mm

cBarrel Lengthin mm

dFull Strokein mm


e

Plunger BaseBC: Beryllium CopperSK4: High Carbon Steel

f

gPlunger PlatingAu: GoldRh: RhodiumNA: None

Barrel BasePB: Phosphor BronzeBR: Brass

h

Barrel PlatingAu: Gold

i

12

0.20

0.26

0.30

0.350.35

0.38

0.48

0.58

0.680.680.680.68

0.32

0.35

0.40

0.430.45

0.53

0.62

0.72

0.860.860.860.86

09.00

10.30

09.00

10.0010.00

09.00

09.00

12.00

12.7512.7518.5018.50

-

-

-

--

-

-

-

-2.5-2.5









cd

e

R SERIES LIST

a


ICT-R:a-b-c-d-e:f-g ICT-R:020-032-0900-00-e:g-h

Probe Barrel Diameterin mm

bReceptacleDiameterin mm

cProbe HoldingLengthin mm

dCollar Distancein mm

Tail TypeN: No TailC: Cup TailW9: Square Tail for Wire Wrapping Tail Length 9mmT5: Round Tail for Crimped Terminal Tail Length 5mmS: Soldered Wire

e

Receptacle BasePB: Phosphor BronzeBR: Brass

f

gReceptacle PlatingAu: Gold

R Series Dimensions Materials R Series Dimensions Materials

a

b

1.011.011.011.011.011.011.011.01

1.361.361.361.361.361.361.361.371.37

2.002.00

2.362.36

1.311.311.311.311.311.311.311.31

1.661.661.661.661.661.661.661.661.66

2.362.36

2.692.69

12.7012.7012.7018.5018.5018.5025.0025.00

18.5018.5018.5025.0025.0025.0025.0007.5007.50

25.0025.00

24.7024.70

-4.02.5

2.54.0-7.5

-2.55.5-2.55.07.52.5-

-7.5

-7.6





13

aProbe Barrel Diameter

in mm

bReceptacleDiameter

cProbe HoldingLength

dCollar Distancein mm

R SERIES LISTR SERIES LISTR SERIES LIST


e

Receptacle BasePB: Phosphor BronzeBR: Brass

f

gReceptacle PlatingAu: Gold

in mm in mm


ICT-T:a-b-c-d-e-f:g-h-i-j ICT-T:098-2050-0700-0450-LA-T5:BC-Au-PB-Au

b

c

d

ef


e


f

Plunger BaseBC: Beryllium CopperPB: Phosphor BronzeSK4: High Carbon Steel

g

hPlunger PlatingAu: GoldRh: RhodiumNi: NickelNA: None

Barrel BasePB: Phosphor BronzeBR: BrassPOM: Polyoxymethylene

i

Barrel PlatingAu: GoldNA: None

j

T SERIES LISTT SERIES LISTT SERIES LIST

T Series Dimensions Materials T Series Dimensions Materials

a

0.98

1.34

1.832.002.00

2.33

3.003.003.00

3.23

20.50

27.00

36.0043.0050.00

38.00

50.0054.0054.00

38.00

07.00

10.00

16.0016.0023.00

16.00

16.0020.0023.00

16.00

04.50

06.00

12.0006.0006.00

10.50

06.0006.0006.00

10.00







aBarrel Diameterin mm

bFull Lengthin mm

cBoard to TipLengthin mm

dFull Strokein mm

14

Quality Assurance

Quality System

ISO 9001: 2015Quality Management System

ISO 14001: 2015Environmental Management System

IATF 16949: 2016Automotive Quality Management System

QC 080000 Hazardous Substance Process Management

Customer Complaint Management

IQC

IPQC

FQC

OQC

Reliability Test

QUALITY MANAGEMENT

15

[email protected]

C.C.P. CONTACT PROBES

Dongguan+86-769-85151668

Beijing+86-10-53856584

Chengdu+86-28-87440813

Chongqing+86-158-23468769

Shenzhen+86-755-82794229

Kunshan+86-512-57378981

Wuhan+86-139-73919421

Hongkong+852-23014671

HaNoi+843-8805-1121

San Jose+1-408-3341981

Frankfurt+49-171-3669549

Bangalore+91-7619689680

Singapore+65-81391296

Seoul+070-7543-2531

Tokyo+81-5295-7090

Taipei HQ+886-2-29612525

Kaohsiung+886-7-3601161

Zhubei+886-3-5506368

Documents

In-Circuit Testing Printed Circuit Board Testing · In-Circuit Testing Probes In-Circuit Testing Printed Circuit Board Testing. TABLE OF CONTENT About Us CCP Probe Series Probe Tip