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Phone: (+34) 949290311 Fax: (+34) 949290063 Cerro de la Palera s/n 19141 - Yebes Guadalajara Spain Phone: (+34) 949290311 Fax: (+34) 949290063 Email: [email protected] CDTAC The Center for Technological Developments (CDT) is a branch of the National Geographic Institute of Spain. The new anechoic chamber is opened for the R+D community and antenna engineering companies interested in antenna design and measurement. Services Yebes Technological Development Center Centro de Desarrollos Tecnológicos de Yebes Instituto Geográfico Nacional (Spain) Yebes Technological Development Center CDTAC Laboratory Alignment Alignment Alignment Alignment Touching Probe Touching Probe Touching Probe Touching Probe

IGN Yebes Technology Development Center

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Brief description of IGN Technology Development Center at Yebes Observatory (Spain)

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Page 1: IGN Yebes Technology Development Center

Phone: (+34) 949290311 Fax: (+34) 949290063

Cerro de la Palera s/n 19141 - Yebes Guadalajara Spain

Phone: (+34) 949290311 Fax: (+34) 949290063

Email: [email protected]

CDTAC

The Center for Technological Developments (CDT) is a

branch of the National Geographic Institute of Spain. The

new anechoic chamber is opened for the R+D community

and antenna engineering companies interested in antenna

design and measurement.

Services Yebes Technological Development

Center

Centro de Desarrollos Tecnológicos de Yebes

Instituto Geográfico Nacional (Spain)

Yebes Technological Development Center

CDTAC Laboratory

AlignmentAlignmentAlignmentAlignment

Touching ProbeTouching ProbeTouching ProbeTouching Probe

Page 2: IGN Yebes Technology Development Center

The CDT anechoic chamber dimensions are 11.5x5x5 meters

and utilizes a 1.83x1.83 meters planar scanner with a positional

accuracy and planarity after correction selected in order to have

a maximum of λ/16 error at the higher working frequency

(140GHz). A sliding rail allows the AUT displacement from the

OEWG probe used to sample the field in either reception or

transmission, depending on the configuration, in both the near

and far field by up to 5.5 meters. The chamber is constructed

from a modular panel system which guarantees a shielding

performance of at least 90dB at 40GHz. The RF systems

nominal design permits a dynamic range of at least 60-90dB in

the entire 2-140GHz range allowing highly sensitive

measurements to be performed. A completely automated system

both pre and post measurement has been installed to facilitate

the acquisition and processing of data and ensuring a quick

turn-around time.

Antenna Measurements at the Antenna Measurements at the Antenna Measurements at the Antenna Measurements at the

CDTCDTCDTCDT

Anechoic Chamber Overview Positioning system

Radio Frequency System Design

The RF system is based on the following Agilent instrumentation:

E8364B PNA up to 50GHz, 85309A LO/IF distribution unit, 85320A

test mixer module, 85320B reference mixer module. The maximum

measurement frequency is 140GHz . To achieve this value, three

OML microwave heads are used: N5260AW15, N5260AW10 and

N5260AW08.

FeaturesFeaturesFeaturesFeatures XXXX YYYY ZZZZ AUT ZAUT ZAUT ZAUT Z RollRollRollRoll

TravelTravelTravelTravel 1.83m 1.83m 0.25m 5.48m 360º

ResolutionResolutionResolutionResolution 25µm 25µm 6µm 50µm 0.0125º

SpeedSpeedSpeedSpeed 25.4cm/s 38cm/s 1.3cm/s 25.4cm/s 40º/s

AccuracyAccuracyAccuracyAccuracy 50µm 50µm 50µm 50µm 0.05º

PlanarityPlanarityPlanarityPlanarity 25µm rms

X BandX BandX BandX Band

Feeding SystemFeeding SystemFeeding SystemFeeding System WRWRWRWR----8 mm8 mm8 mm8 mm----wave Headswave Headswave Headswave Heads

Acquisition, Processing and Presentation SoftwareAcquisition, Processing and Presentation SoftwareAcquisition, Processing and Presentation SoftwareAcquisition, Processing and Presentation Software

3D Radiation Pattern 3D Radiation Pattern 3D Radiation Pattern 3D Radiation Pattern

Software: NSI 2000 Professional Edition

Advanced scripting features, powerful beam table generator for

multi–beam, multi-frequency measurements, error correction

(drift check, MTI).

RF Components Measurement and Material Characterization

Optical benchOptical benchOptical benchOptical bench

OEWG ProbeOEWG ProbeOEWG ProbeOEWG Probe

E8364B Agilent PNAE8364B Agilent PNAE8364B Agilent PNAE8364B Agilent PNA