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Brief description of IGN Technology Development Center at Yebes Observatory (Spain)
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Phone: (+34) 949290311 Fax: (+34) 949290063
Cerro de la Palera s/n 19141 - Yebes Guadalajara Spain
Phone: (+34) 949290311 Fax: (+34) 949290063
Email: [email protected]
CDTAC
The Center for Technological Developments (CDT) is a
branch of the National Geographic Institute of Spain. The
new anechoic chamber is opened for the R+D community
and antenna engineering companies interested in antenna
design and measurement.
Services Yebes Technological Development
Center
Centro de Desarrollos Tecnológicos de Yebes
Instituto Geográfico Nacional (Spain)
Yebes Technological Development Center
CDTAC Laboratory
AlignmentAlignmentAlignmentAlignment
Touching ProbeTouching ProbeTouching ProbeTouching Probe
The CDT anechoic chamber dimensions are 11.5x5x5 meters
and utilizes a 1.83x1.83 meters planar scanner with a positional
accuracy and planarity after correction selected in order to have
a maximum of λ/16 error at the higher working frequency
(140GHz). A sliding rail allows the AUT displacement from the
OEWG probe used to sample the field in either reception or
transmission, depending on the configuration, in both the near
and far field by up to 5.5 meters. The chamber is constructed
from a modular panel system which guarantees a shielding
performance of at least 90dB at 40GHz. The RF systems
nominal design permits a dynamic range of at least 60-90dB in
the entire 2-140GHz range allowing highly sensitive
measurements to be performed. A completely automated system
both pre and post measurement has been installed to facilitate
the acquisition and processing of data and ensuring a quick
turn-around time.
Antenna Measurements at the Antenna Measurements at the Antenna Measurements at the Antenna Measurements at the
CDTCDTCDTCDT
Anechoic Chamber Overview Positioning system
Radio Frequency System Design
The RF system is based on the following Agilent instrumentation:
E8364B PNA up to 50GHz, 85309A LO/IF distribution unit, 85320A
test mixer module, 85320B reference mixer module. The maximum
measurement frequency is 140GHz . To achieve this value, three
OML microwave heads are used: N5260AW15, N5260AW10 and
N5260AW08.
FeaturesFeaturesFeaturesFeatures XXXX YYYY ZZZZ AUT ZAUT ZAUT ZAUT Z RollRollRollRoll
TravelTravelTravelTravel 1.83m 1.83m 0.25m 5.48m 360º
ResolutionResolutionResolutionResolution 25µm 25µm 6µm 50µm 0.0125º
SpeedSpeedSpeedSpeed 25.4cm/s 38cm/s 1.3cm/s 25.4cm/s 40º/s
AccuracyAccuracyAccuracyAccuracy 50µm 50µm 50µm 50µm 0.05º
PlanarityPlanarityPlanarityPlanarity 25µm rms
X BandX BandX BandX Band
Feeding SystemFeeding SystemFeeding SystemFeeding System WRWRWRWR----8 mm8 mm8 mm8 mm----wave Headswave Headswave Headswave Heads
Acquisition, Processing and Presentation SoftwareAcquisition, Processing and Presentation SoftwareAcquisition, Processing and Presentation SoftwareAcquisition, Processing and Presentation Software
3D Radiation Pattern 3D Radiation Pattern 3D Radiation Pattern 3D Radiation Pattern
Software: NSI 2000 Professional Edition
Advanced scripting features, powerful beam table generator for
multi–beam, multi-frequency measurements, error correction
(drift check, MTI).
RF Components Measurement and Material Characterization
Optical benchOptical benchOptical benchOptical bench
OEWG ProbeOEWG ProbeOEWG ProbeOEWG Probe
E8364B Agilent PNAE8364B Agilent PNAE8364B Agilent PNAE8364B Agilent PNA