IEEE SCC21/P1547.1 Draft Standard Conformance Test ...grouper.ieee.org/groups/scc21/1547.1_revision/mtgMinutes/P1547 1... · IEEE SCC21/P1547.1 Draft Standard Conformance Test Procedures

IEEE SCC21/P1547.1 Draft Standard

Conformance Test Procedures for Equipment

Interconnecting Distributed Energy Resources

with Electric Power Systems and Associated

Interfaces

Working Group Meeting June 16, 2016; Portland OR Facilities Sponsored by Portland General Electric

Chair: Tom Basso; Co-Chair: Sudipta Chakraborty

Secretary: Andy Hoke; Treasurer: Charlie Vartanian

Vice Chairs:

Babak Enayati Karl Schoder Tim Zgonena

IEEE SCC21 Liaison: Mike Kipness

-------------- ------------------- ----------------------- [email protected] 303 275 3753

[email protected] 303 384-7093


SCC21 P1547.1 Standard Conformance Test Procedures for

Equipment Interconnecting Distributed Energy Resources

with Electric Power Systems and Associated Interfaces (IEEE SA Standards Board approved PAR Dec 2014)

Scope This standard specifies the type, production, commissioning and periodic tests, and evaluations that shall be performed to confirm that the interconnection and interoperation functions of equipment and systems interconnecting distributed energy resources with the electric power system conform to IEEE Standard 1547.

2

IEEE P1547.1TM - Standard Conformance Test Procedures for

Equipment Interconnecting Distributed Energy Resources

with Electric Power Systems and Associated Interfaces

Purpose Standardized test and evaluation procedures are necessary to establish and verify compliance with those requirements. These test procedures shall provide both repeatable results, independent of test location, and flexibility to accommodate a variety of DER technologies and functions.

3

Agenda – P1547.1 Working Group Meeting

Time Topic/description

8:15 – 9:00 AM Welcome/logistics; IEEE mandatory slides;

background on IEEE 1547, approval of minutes,

PnP; timeline to ballot (Tom/Sudipta)

9:00 – 10:15 AM Presentations of subgroups’ scope and

background (Subgroup chairs)

10:15 – 10:30 AM 15 minute break

10:30 – 11:45 AM Continue presentations of subgroups’ scope and


11:45 AM – 12:30 PM Lunch (45 minutes)

12:30 – 3:30 PM Subgroup breakouts (subset of subgroups;

includes 15 minutes break)

3:30 – 4:00 PM WG discussions on subgroups’ outcome

4:00 – 4:30 PM Next actions, Adjourn

4

Welcome and Facility Logistics

• Welcome – Tom Basso

• Facility, safety, logistics – Janette Sandberg

5

6

Participants: IEEE Disclosure of Affiliation

Every member and participant in a working group, Sponsor ballot, or other standards development activity shall disclose his or her affiliation(s), which includes employer(s) and any other affiliation(s). An individual is deemed “affiliated” with any individual or entity that has been, or will be, financially or materially supporting that individual’s participation in a particular IEEE standards activity. This includes, but is not limited to, his or her employer(s) and any individual or entity that has or will have, either directly or indirectly, requested, paid for, or otherwise sponsored his or her participation. Failure to disclose every such affiliation(s) may result in complete or partial loss of rights to participate in IEEE-SA activities. An individual is not excused from compliance with this policy by reason of any claim of a conflicting obligation (whether contractual or otherwise) that prohibits disclosure of affiliation(s).

A person who believes that a participant’s disclosure is materially incomplete or incorrect should report that fact to the appropriate Sponsor(s).

Participants, Patents, and Duty to Inform

All participants in this meeting have certain obligations under the IEEE-SA Patent

Policy.

Participants:

-- “Shall inform the IEEE (or cause the IEEE to be informed)” of the identity of each

“holder of any potential Essential Patent Claims of which they are personally

aware” if the claims are owned or controlled by the participant or the entity the

participant is from, employed by, or otherwise represents - “Personal awareness” means that the participant “is personally aware that the holder

may have a potential Essential Patent Claim,” even if the participant is not personally

aware of the specific patents or patent claims

-- “Should inform the IEEE (or cause the IEEE to be informed)” of the identity of

“any other holders of such potential Essential Patent Claims” (that is, third parties

that are not affiliated with the participant, with the participant’s employer, or with

anyone else that the participant is from or otherwise represents)

-- The above does not apply if the patent claim is already the subject of an Accepted

Letter of Assurance that applies to the proposed standard(s) under consideration

by this group

“Quoted text excerpted from IEEE-SA Standards Board Bylaws subclause 6.2”

Early identification of holders of potential Essential Patent Claims is strongly

encouraged

No duty to perform a patent search

7

Patent Related Links

All participants should be familiar with their obligations under the IEEE-SA Policies & Procedures for standards development.

Patent Policy is stated in these sources:

IEEE-SA Standards Boards Bylaws http://standards.ieee.org/guides/bylaws/sect6-7.html#6

IEEE-SA Standards Board Operations Manual

http://standards.ieee.org/guides/opman/sect6.html#6.3

Material about the patent policy is available at

http://standards.ieee.org/board/pat/pat-material.html

8

If you have questions, contact the IEEE-SA Standards Board Patent Committee Administrator at

[email protected] or visit http://standards.ieee.org/board/pat/index.html

This slide set is available at http://standards.ieee.org/board/pat/pat-slideset.ppt

Call for Potentially Essential Patents

If anyone in this meeting is personally aware of the holder of any patent claims that are potentially essential to implementation of the proposed standard(s) under consideration by this group and that are not already the subject of an Accepted Letter of Assurance:

– Either speak up now or

– Provide the chair of this group with the identity of the holder(s) of any and all such claims as soon as possible or

– Cause an LOA to be submitted

9

Other Guidelines for IEEE WG Meetings

10

All IEEE-SA standards meetings shall be conducted in compliance with all applicable laws, including antitrust and competition laws.

•Don’t discuss the interpretation, validity, or essentiality of patents/patent claims.

•Don’t discuss specific license rates, terms, or conditions.

• Relative costs, including licensing costs of essential patent claims, of different technical approaches may be discussed in standards development meetings.

• Technical considerations remain primary focus

•Don’t discuss or engage in the fixing of product prices, allocation of customers, or division of sales markets.

•Don’t discuss the status or substance of ongoing or threatened litigation.

•Don’t be silent if inappropriate topics are discussed … do formally object. ---------------------------------------------------------------

See IEEE-SA Standards Board Operations Manual, clause 5.3.10 and “Promoting Competition and Innovation: What You Need to Know about the IEEE Standards Association's Antitrust and Competition Policy” for more details.

• Energy Policy Act (2005) Cites and requires consideration of IEEE 1547

Standards and Best Practices for Interconnection; all states use or cite 1547.

• Energy Independence and Security Act (2007) IEEE cited as a standards

development organization partner to NIST as Lead to coordinate framework and roadmap for Smart Grid Interoperability standards and protocols {IEEE 1547 & 2030 series being expanded};

• Federal ARRA (2009) Smart Grid & High Penetration DER projects {use IEEE stds}.

11

Putting the Pieces Together: Standards, Testing, and Implementation

12

IEEE 1547 Standards Example Use in USA

13

P1547.1 WG Approvals

14

• P1547.1 March WG meeting minutes (March 10, Juno Beach FL)

Sent to WG on April 8, 2016

To be approved on June 16, 2016

• IEEE P1547.1 Policies and Procedures

Posted on iMeet Central (former CDT) on May 25, 2016

To be approved on June 16, 2016

Tentative Timeline to Ballot for P1547.1

15

Dates ActivitiesJune16,2016 P1547.1WGmeeting–Draft1initiatedSummer2016 P1547.1subgroupsworkandcompleteDraft1September30,2016 P1547.1Draft1postedforWGconsideration

October15,2016 CommentsprovidedtothesubgroupsOctober27-28,2016 P1547.1WGmeeting–Draft1discussed

January2017 P1547.1Draft2postedforWGmeetingFebruary2017 P1547.1WGmeeting–Draft2discussedMay2017 P1547.1Draft3postedforWGmeeting

June2017 P1547.1WGmeeting–Draft3discussedSeptember2017 P1547.1Draft4postedforWGmeetingOctober2017 P1547.1WGmeeting–Draft4discussedJanuary2018 P1547.1Draft5postedforWGmeetingFebruary2018 P1547.1WGmeeting–Draft5discussedMarch15,2018 P1547.1Pre-ballotdraftsenttoWGApril15,2018 P1547.1Commentsheetfeedbackonpre-ballotdraftApril–May2018 P1547.1Subgroupsworkonpre-ballotresolutionJune2018 P1547.1WGmeeting–pre-ballotscommentsresolution

completedJuly2018 P1547.1ToIEEEballot

1.5 days for P1547.1

Fostering Technological Innovation

and Excellence

For The Benefit Of Humanity

Thank You

16

IEEE SCC21/P1547.1 Draft Standard Conformance Test Procedures for Equipment Interconnecting

Distributed Energy Resources with Electric Power Systems and Associated Interfaces

P547.1 Working Group Meeting; June 16, 2016; Portland OR

P1547.1 Subgroups



Vice Chairs:


[email protected] 303 275 3753



18

P1547.1 Subgroups – June 2016 Officer: Sudipta

Chakraborty

Overall document (OD)

General requirements

(GR)

Officer: Tim Zgonena

Abnormal voltage and

frequency tests (V&F)

Voltage and frequency

regulation tests (Reg)

Unintentional islanding tests

(UI)

Power quality tests (PQ)

Ramp rate tests (RR)

Synchronization tests (Sync)

Officer: Karl Schoder

Modeling and simulation

(M&S)

Hardware-in-the-loop tests

(HIL)

Interoperability (Interop)

Officer: Babak

Enayati

Installation, commissioning, periodic tests

(ICP)

DER microgrid capabilities and

microgrid interconnection

devices (MG)

Chair: Tom

Basso

Secretary:

Andy Hoke

19

P1547.1 Subgroups – June 2016

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Officer Sudipta

Chakraborty Sudipta

Chakraborty Tim

Zgonena Tim

Zgonena Tim

Zgonena Tim

Zgonena Tim

Zgonena Tim

Zgonena Karl Schoder Karl Schoder Karl Schoder

Babak Enayati

Babak Enayati

Subgroup Chair(s)

Sudipta Chakraborty

Sudipta Chakraborty

John Berdner

Brian Lydic Sig

Gonzalez Bob White

Delayed start

Marcelo Algrain

Delayed start Karl Schoder Brian Seal Mark Siira Chris Rowe

Marcelo Algrain

Jon Ehlmann

Greg Kern Soonwook

Hong Bob Fox

Wayne Stec

Tom McDermott

Jens

Boemer Aminul Huque

Note: Listing order of subgroup chairs is arbitrary




P1547.1 Subgroup on Overall Document (OD)

Subgroup Chair: Sudipta Chakraborty

Subgroup Co-Chair: TBD

-------------- ------------------- ----------------- P1547.1 officer overseeing subgroup:

Sudipta Chakraborty, [email protected]

Subgroup short title: Overall Document (OD)

Clauses: 1, 2, 3

Subgroup Scope:

Verify conformance to the IEEE P1547 requirements

This subgroup scope addresses Clause 1: Overview, Clause 2: Normative references, Clause 3: Definitions and acronyms. See IEEE 1547.1/1547.1a for each of these clauses. Any other gaps in the overall document, as identified by the P1547.1 Working Group, will be considered for inclusion under this subgroup. Close coordination will be maintained with IEEE P1547 Clause 5 writing group

21

Introduction to P1547.1 Subgroup on Overall Document (OD)

IEEE Std 1547.1/1547.1a {2005/2015} - Contents

22

Introduction to P1547.1 Subgroup on OD (contd.)

How much can we leverage from the existing IEEE 1547.1/1547.1a

Need to keep our objectives technically precise for P1547.1 – this is not a design guide, recommended practice, a business, tariff, contractual, or regulatory and policy document

New references and definitions to be added that are not covered in the existing document - try definitions based on P1547 and IEEE Std. library first

How to address multiple device categories (I,II,III for V/FRT and A,B for V Reg)

PCC and point of DER connection: requirement may be based on PCC but testing at the Point of DER connection (eg. Harmonics testing)

Coordination with IEEE P1547 Clause 5 writing group

23

Introduction to P1547.1 Subgroup on OD (contd.)

Subgroup chair(s):

– Sudipta Chakraborty, [email protected]

– TBD

P1547 officer:


Proposed meeting schedule:

– This subgroup will start later, most likely after October meeting

– Need some details from various P1547.1 subgroups and also from IEEE P1547 Clause 5 writing group

– Feel free to send me comments/ideas in the interim

24

OD Subgroup Logistics

mailto:[email protected]



P1547.1 Volunteers for Subgroup on OD

We did not have this subgroup in our questionnaire sent to the P1547.1 WG

– so no volunteer yet

Please contact Sudipta Chakraborty ([email protected]) if you want to contribute to this subgroup

Also please let me know if you are interested to be a co-chair for this subgroup





P1547.1 Subgroup on General Requirements (GR)

Subgroup Chair: Sudipta Chakraborty

Subgroup Co-Chair: TBD


Sudipta Chakraborty, [email protected]

Subgroup short title: General Requirements (GR)

Clause: 4

Subgroup Scope:

Verify conformance to the IEEE P1547 requirements

This subgroup scope addresses Clause 4: General Requirements (see IEEE 1547.1/1547.1a). This clause will include test results accuracy, testing environment, measurement accuracy and calibration of the testing equipment, product information, test reports, testing equipment requirements and any other general requirements as required by the IEEE P1547

27

Introduction to P1547.1 Subgroup on General Requirements (GR)

IEEE Std 1547.1/1547.1a {2005/2015} - Contents

28

Introduction to P1547.1 Subgroup on GR (contd.)

Test result accuracy

– The test results shall verify that the equipment under test (EUT) meets the requirements of IEEE Std 1547 within the manufacturer’s specified accuracy…

– This may not be sufficient for functions like ride-through and regulations, so, e.g.,

– do we need a bound on manufacturer’s specified accuracy?

– should DER/manufacturer stated accuracy requirements reside in P1547.1?

– how specific should this be without being too prescriptive or constraining?

– Do we need to add more general requirements, e.g., see OSHA NRTL laboratory accreditation requirements?

Measurement accuracy, testing equipment requirements etc.

29

Introduction to P1547.1 Subgroup on GR (contd.)

Subgroup chair(s):


– TBD

P1547 officer:



– This subgroup will start later, most likely after October meeting

Any suggestions on this?

– Need some details from various P1547.1 subgroups and also from IEEE P1547 Clause 5 writing group

– Feel free to send me comments/ideas in the interim

30

GR Subgroup Logistics




P1547.1 Volunteers for Subgroup on GR

Volunteers : – Marcelo Algrain

– Jens Boemer

– Nancy Connelly

– Mamadou Diong

– Andy Hoke

– Soonwook Hong

– Aminul Huque

– Robert Jordan

– Haiwen Liu

– Robert Preus

– John Ruddock

– Brian Seal

– Gary Smullin

– Jim Sprecher

– Tim Zgonena

Please contact Sudipta Chakraborty

([email protected]) if you want to contribute to this

subgroup

Also please let me know if you are interested to be a co-

chair for this subgroup





P1547.1 Subgroup on Abnormal Conditions

(Ride Through)

Subgroup Co-Chair: John Berdner

Subgroup Co-Chair: Jens Boemer

Subgroup Co-Chair: Marcelo Algrain


Tim Zgonena, [email protected]


Subgroup short title: Ride Through

Subgroup Scope. Draft P1547.1 test procedures to verify compliance to P1547 requirements on abnormal voltage and frequency conditions

Seeking input from P1547.1 stakeholders (utilities, system integrators, inverter/PV industry, rotating machine industry, other stakeholders

1547 2003 has little on abnormal operating conditions

– The only response was tripping

1547 Full revision includes multiple new abnormal operating modes

and operating regions

– Much of this testing is addressed in UL 1741 SA and we anticipate building on that effort.

– Some additional testing likely based on new requirements in 1547 which occurred after the development of 1741 SA

33

Introduction to P1547.1 Subgroup on: Abnormal voltage and frequency conditions tests (ride through)

Subgroup chair(s):

– John Berdner, [email protected]

– Jens Boemer, [email protected]

– Marcelo Algrain, [email protected]

P1547 officer:

– Tim Zgonena, [email protected]


– Weekly starting in July 2016, Time TBD

34

Subgroup Logistics





P1547.1 Volunteers for Subgroup on Ride Through

Want to volunteer (but don’t see your name listed)? Contact the subgroup chair.

Volunteers :

Algrain Gebauer Preus Ashton Hoke Ruddock Berdner Hong salas Berntsen Houser Saleem Boemer Huque Smullin BRAVO Jordan Stec

Chakraborty Kansal Sullivan Chen LIU White Diong Lydic Zgonena

Gautam Piekarz




P1547.1 Subgroup on Voltage and Frequency

Regulation

Subgroup Co-Chair: Brian Lydic

Subgroup Co-Chair: Jon Ehlmann

Subgroup Co-Chair: Aminul Huque




Subgroup short title: Voltage and Frequency Regulation

Subgroup Scope. Draft P1547.1 test procedures to verify compliance to P1547 requirements:

– Voltage Regulation 4.1.2 Adjustable Constant power factor (Fixed PF)

Voltage-reactive power (Volt-var)

Active power-reactive power (Watt-var)

Adjustable Constant Reactive power (Fixed var)

Dynamic reactive current (Steady-state response)

Voltage-real power (Volt-watt)

– Frequency Droop Regulation (Freq-watt) 4.2.4.2.6 Small-signal response

Large-signal response

Seeking input from P1547.1 stakeholders (utilities, system integrators, inverter/PV industry, rotating machines, etc.)

37

Introduction to P1547.1 Subgroup on Voltage and Frequency Regulation

Exists in current 1547.1a-2015

– 5.3.3 Over frequency response

– 5.3.4 Under frequency response

– 5.13.1 Variations in Voltage

– 5.13.4 Watt-var

Initial 1547.1 draft will be based of existing standards:

– IEEE 1547.1a-2015, UL 1741-2016b?, VDE-AR-N 4105

– Need to address specific voltage and frequency regulation modes

– Integrate time domain criteria into test procedures

– Develop procedure and criteria for different technology categories

– Look at operation with combinations of voltage regulation modes

– Communication and time scheduling are out of scope

38

Introduction to P1547.1 Subgroup on Voltage and Frequency Regulation

Subgroup chair(s):

– Brian Lydic, [email protected]

– Jon Ehlmann, [email protected]

– Aminul Huque, [email protected]

P1547 officer:



– Starting in 3 weeks

– Option 1: Tuesdays 1-2 ET

– Option 2: Tuesdays 2-3 ET

– Option 3: Thursday 3-4 ET

– Option 4: Thursday 4-5 ET

39

Subgroup Logistics





P1547.1 Volunteers for Subgroup on Volt-VAR

Want to volunteer (but don’t see your name listed)? Contact Brian Lydic: [email protected]

Volunteers :

– Lydic

– Ehlmann

– Aminul

– Algrain

– Ashton

– Berntsen

– Boemer

– Bravo

– Chakraborty

– Chen

– Diong

– Ehlmann

– Furlong

– Hoke

– Hong

– Huque

– Hurtt

– Jordan

– Kansal

– Liu

– Lydic

– Ruddock

– Salas

– Saleem

– Seal

– Smullin

– Stec

– Sullivan

– White

– Zgonena





P1547.1 Subgroup on Unintentional islanding tests

Subgroup Chair: Sigifredo Gonzalez

Subgroup Co-Chair: Greg Kern




Subgroup short title: Unintentional islanding tests

Subgroup Scope. Draft P1547.1 test procedure will verify DER interconnection components or system ceases to energize the area EPS as specified in P1547.

Seeking input from P1547.1 stakeholders (utilities, system integrators, inverter/PV industry, rotating machines, etc.) on topics such as: effectiveness, configurability, methods of testing with GSF enabled, ease/difficulty of testing, repeatability of results, and conformance to interconnection standard and method of documenting results.

The test procedure is designed to be universally applicable to all DRs, regardless of capability and output. Any reactive power from voltage regulation functions delivered by the EUT should remain on during the test and be accounted for in the RLC load balancing.

42

Introduction to P1547.1 Subgroup on “Unintentional islanding test procedures”

Subgroup short title: Unintentional islanding tests

Subgroup Prospective focus:

– Address unintentional islanding duration (2, 3, 5 seconds) in P1547

– RLC circuit adequacy concerns--- does it meet objectives

– Methodologies of quantifying grid support function (GSF) and influence on loss of utility detection

Subgroup Seeks input from abnormal voltage and frequency conditions tests subgroup focusing on: trip and ride-through requirements to best assess and implement these new capabilities in unintentional islanding testing

Subgroup seeks input from the voltage and frequency regulation tests subgroup for proper parameter setting and suggestions that will challenge loss of utility detection capabilities

43

Introduction to P1547.1 Subgroup on “Unintentional islanding test procedures”

Subgroup chair(s):

– Sigifredo Gonzalez, [email protected]

– Greg Kern, [email protected]

P1547 officer:



– Starting week of June 27th and will be referencing draft P1547 and UL 1741SA

– Option 1: Monday 11am Mountain

– Option 2: Monday 1pm Mountain

– Option 3: Wednesday 11am Mountain

44

Subgroup Logistics


P1547.1 Volunteers for Subgroup on Unintentional Islanding Tests


Marcelo Algrain Member Caterpillar Inc.

Dillon Ashton Member Nextronex

George Berntsen Member FuelCell Energy, Inc.

Jens Boemer Member Electric Power Research Institute (EPRI)

RICHARD BRAVO Member SOUTHERN CALIFORNIA EDISON

Sudipta Chakraborty Member NREL

Ke (Kevin) Chen Observer Duke Energy

Nancy Connelly Member Duke Energy

Mamadou Diong Member Dominion Virginia Power

Anthony Eason Member Duke Energy

Gunjan Gautam Member The World Bank

Sig Gonzalez SNL

Andy Hoke Member NREL

Soonwook Hong Member Yaskawa, Solectria Solar

Keith Houser Member Dominion [Virginia and North Carolina Power]

Aminul Huque Member Electric Power Research Institute (EPRI)

James Hurtt Observer Florida Power & Light

Robert Jordan Member NFPA NEC Committee Member Panel 13

P1547.1 Volunteers for Subgroup on Unintentional Islanding Tests


Greg Kern Sunpower

HAIWEN LIU Member Intertek ETL

Brian Lydic Member Fronius USA

Jeannie Piekarz Observer National Grid

Robert Preus Member National Renewable Energy Lab

John Ruddock Member Deep Sea Electronics PLC

Roger salas Member Southern California Edison

Danish Saleem Member Florida international university

Gary Smullin member Smullin Engineering, Inc

Wayne Stec Member Distregen, LLC

Tim Sullivan Member CenterPoint Energy Houston Electric (Utility)

Robert White Member ABB Product Group Solar

Tim Zgonena Member UL LLC




P1547.1 Subgroup on Power Quality

Subgroup Chair: Bob White - ABB

Subgroup Co-Chair: Soonwook Hong - Solectria




Subgroup short title: Power Quality Tests (PQ)

Subgroup Scope. Draft P1547.1 test procedures to verify compliance to P1547 requirements on Power Quality such as DC Injection, Harmonics, Flicker, and other Power Quality Topics as required by P1547 (e.g. TOV). Seeking input from P1547.1 stakeholders (utilities, system integrators, inverter/PV industry, rotating machines, etc.)

This sub-group will be focused mainly on Clause 5.6, 5.11, 5.12 and potential new clause #’s as needed to support IEEE P1547

– Tests currently exist in IEEE 1547.1-2005 sections 5.6, 5.11, 5.12 to support the requirements in IEEE 1547-2003 section 4.3 Power Quality.

Changes have been introduced in P1547 related to two currently covered sections in IEEE 1547.1.

4.3.2 has an added a formula for Plt. Does this require changes in P1457.1? Is this related only to customer flicker measurements?

4.3.3 has added even harmonics specific values, and now goes as high as the 50th harmonic.

48

Introduction to P1547.1 Subgroup on Power Quality

Subgroup chair(s):

– Bob White, [email protected]

– Soonwook Hong, [email protected]

P1547 officer:



– Starting the month of June after the meetings in Portland. No day or time set yet.

– Option 1: Wednesdays at 2:00 PM EDST

– Option 2: Thursdays at 3:00 PM EDST

– Option 3: Thursdays at 4:00 PM EDST

49

Subgroup Logistics




P1547.1 Volunteers for Subgroup on Power Quality


Sub Group Member Representing Affiliation

Bob White ABB MFG

Marcelo Algrain Caterpillar Inc. MFG

Mamadou Diong Dominion UTIL

D. Saleem FIU EDU

Brian Lydic Fronius MFG

Haiwen Liu Intertek LAB

Jeannie Piekarz National Grid UTIL

Sudipta Chakraborty NREL LAB

Andy Hoke NREL LAB

Richard Bravo SCE UTIL

Roger Salas SCE UTIL

Soonwook Hong Solectria MFG

Robert Jordan Sothern Co. UTIL

Zgonena UL LAB

Group Makeup EDU < 1%

LAB 28.5%

MFG 28.5%

UTIL 35.7%




P1547.1 Subgroup on Soft start / ramp rate

(Subgroup start delayed)


[email protected]





P1547.1 Subgroup on Synchronization (5.4)

Subgroup Chair: Marcelo Algrain

Subgroup Co-Chair: open


[email protected]


Subgroup short title: Synchronization

Subgroup Scope. Draft P1547.1 test procedures to verify compliance to P1547 requirements on Synchronization, i.e. seemless/bumpless DER connection to grid

Seeking input from P1547.1 stakeholders (utilities, system integrators, inverter/PV industry, rotating machines, legacy technology, e.g. DFIG)

– There is a good foundation from 1547.1-2005?

– Need to confirm that induction generators are properly represented

– Need to confirm harmonization with UL 1741

53

Introduction to P1547.1 Subgroup on Synchronization (clause 5.4)

Subgroup chair(s):

– Marcelo Algrain, Caterpillar Inc., [email protected] (309) 578-1274

P1547 officer:



– Starting week of June 20

– Option 1: Tuesdays at 1 pm Central (flexible noon-4 pm)

– Option 2: Wednesdays in the afternoon

– Option 3: Monday afternoons

– Please report time conflicts to Marcelo Algrain

54

Subgroup Logistics



P1547.1 Volunteers for Subgroup on Synchronization

Want to volunteer (but don’t see your name listed)? Contact Marcelo Algrain ([email protected])

Volunteers :

– Algrain, Marcelo

– Bravo, Richard

– Diong, Mamadou

– Hong, Soonwook

– Jordan, Robert

– Liu, Haiwen

– Piekarz, Jeannie

– Ruddock, John

– Saleem, Danish

– White, Robert (Bob)

– Zgonena, Tim




P1547.1 Subgroup on Modeling and Simulation

(delayed start for this subgroup)


Karl Schoder, [email protected]




P1547.1 Subgroup on Hardware-in-the-Loop Testing

Subgroup Chair: Karl Schoder



Subgroup short title: HIL Testing

Subgroup Scope. Draft P1547.1 tests to verify compliance to P1547 requirements using Hardware-in-the-Loop approach


58

Introduction to P1547.1 Subgroup on Hardware-in-the-Loop (HIL) Testing

Initial scope:

– Approach to testing not specifically call-out in current 1547.1-2005

Add possibility of using HIL for testing requirements were appropriate

Currently: Specific test procedures can be agreed to between NRTL and manufacturer (next slide)

– Currently not addressed in UL 1741 SA

– Extension of “signal injection” and “grid simulator” approaches What is different: (extended) model behind interfacing signals with two options …

Controller HIL: interfacing to embedded controls, simulating power circuit

– Examples: testing excitation or inverter controls

Power HIL: interfacing to power device, simulating “rest-of-system”

– Examples: Connecting device to simulated source model (e.g., voltage source behind reactance/transformer)

59


Initial scope (continued): from current 1547.1 …

Where the EUT cannot be evaluated using one or more of the test regimens specified in this standard, alternative test regimens agreed to by the manufacturer and the testing agency and accomplishing the same measurements with the same accuracy may be used. When used, the details of such alternative test regimens shall be recorded in the test report along with an explanation of why the alternative test regimen was used.

Within type tests: Signal injection test methods may be used to conduct tests in 5.1, 5.2, 5.3, 5.4, 5.8, and 5.10.

Where testing allows the use of a simulated area EPS source, the following requirements shall be met:

The simulated area EPS source shall be capable of confirming the manufacturer’s stated performance.

The voltage harmonics of the simulated area EPS source shall be less than 2.5% total harmonic distortion.

The individual voltage harmonics of the simulated utility shall be less than 50% of the limits in Table 3 of IEEE Std 1547.

During the tests, the steady-state voltage of the simulated area EPS source shall not vary by more than ± 1% of the nominal voltage.

For voltage trip magnitude tests, the voltage change resolution of the simulated utility source shall be within 0.5a of the nominal voltage, where a is the manufacture’s stated accuracy.

For frequency trip magnitude tests, the frequency change resolution of the simulated utility source shall be within 0.5a of the nominal frequency, where a is the manufacture’s stated accuracy.

60


Subgroup chair(s):

– Karl Schoder

– <name 2, email 2>

P1547 officer:

– Karl Schoder, [email protected]


– Starting and/but waiting for firm(er) P1547.1 test procedures

– Option 1: <e.g. Tuesdays at 3 Eastern>

– Option 2: <e.g. Mondays at noon Eastern>

– Option 3: <….>

61

Subgroup Logistics <one slide>

P1547.1 Volunteers for Subgroup on HIL Testing

Want to volunteer? Contact the subgroup chair.

Volunteers :

– Marcelo Algrain

– Sudipta Chakraborty

– Mamadou Diong

– Andy Hoke

– Soonwook Hong

– Prashant Kansal

– Haiwen Liu

– Sanish Saleem

– Tim Zgonena




P1547.1 Subgroup on Interoperability Tests

Subgroup Chair: Brian Seal

Subgroup Co-Chair: Bob Fox



Subgroup short title: Interoperability Tests

Subgroup Scope. Draft P1547.1 test procedures to verify compliance to P1547 requirements on communication


Additional Information

– This test is new, does not exist in 1547.1-2005

– Goal is to enable the 1547-specified functionality to be successfully accessed and utilized in field installations

– In scope: DER communication interface compliance

Assurance that DER properly interpret communications and act as intended

– Out of scope: Multi-DER interference/interactions

Tests for communication networks that might be used to connect to DER

64

Introduction to P1547.1 Subgroup on Interoperability Tests

Subgroup chair(s):

– Brian Seal, [email protected]

– Bob Fox, [email protected]

P1547 officer:

– Karl Schoder, [email protected]


– Initial discussion regarding approach and goals starting July

– Potentially pausing, then resuming when P1547 WG4 content is firm

– Possible time slots: Thursdays at noon Eastern

Wednesdays at 4:00 PM Eastern

65

Subgroup Logistics

P1547.1 Volunteers for Subgroup on Interoperability Tests


Volunteers :

– Algrain

– Diong

– Fox

– Hoke

– Hong

– Houser

– Jordan

– LIU

– Lydic

– Saleem

– Seal

– Siira

– Smullin

– Stec

– Zgonena


and Excellence


Thank You

67




P1547.1 Subgroup on Installation, Commissioning and

Periodic Testing

Subgroup Chair: Mark Siira

Subgroup Co-Chair: Wayne Stec


Babak Enayati, [email protected]

Subgroup short title: Installation, Commissioning & Periodic Testing

Subgroup Scope. Draft P1547.1 test procedures to verify compliance to P1547 requirements on installation testing, commissioning of equipment and systems, and periodic testing.


Existing 1547.1 content:

– Installation: No present content. (Presently included in Commissioning)

– Commissioning - Several pages covering:

Verifications & inspections

Field conducted type and production tests

Unintentional islanding functionality test

Cease to Energize functionality test

Verification of revised settings

– Periodic Testing: Two paragraphs referencing manufacturer requirements and when to re-test for changes to equipment and system

69

Introduction to P1547.1 Subgroup on Installation, Commissioning & Periodic Testing

Vision for new content:

– Installation: Expanded section including tests to be completed during the installation process OR Combine with Commissioning

May also include reference to site verification (Checklist for settings, etc.)

– Commissioning: Expanded section including more detail on new requirements created by new clauses in 1547 (e.g. ride-through)

May require classification matrix into categories similar to 4.2.3.2 Mandatory Voltage Tripping Requirements

Implications of Simulation and Modeling

Implications for simulation and modeling (simultaneous verification with other tests)

– Periodic Testing: To be determined by group discussion on the level of detail needed to meet requirements identified in 1547 clause 5 due to more detailed periodic test requirements and interconnection installation evaluation

70


Why change content from previous revision?

Changes in 1547 requirements (under development) will result in changed testing regimes

New Interconnection Installation Evaluation clauses in 1547 may require additional installation, commissioning and/or periodic testing

Commissioning processes getting more visibility in all industries

Consistency is important

71


Subgroup chair(s):

– Mark Siira, [email protected]

– Wayne Stec, [email protected]

P1547.1 officer:

– Babak Enayati, [email protected]>


– Starting next week to continue ideas generated in Portland

– Bi-weekly schedule after July 4th holiday

– Day and Time: ??

72

Subgroup Logistics

P1547.1 Volunteers for Subgroup on Installation, Commissioning & Periodic Testing


Volunteers : – Algrain

– Berntsen

– Boemer

– Chen

– Diong

– Harley

– Hong

– Houser

– Huque

– Jordan

– Liu

– Lydic

– Meyer

– Piekarz

– Saleem

– Smullin

– Sprecher

– White

– Zgonena




P1547.1.400 Subgroup on

Microgrid Capable DER and Devices

Subgroup Chair: Chris Rowe, [email protected]

Subgroup Co-Chair: Tom McDermott, [email protected]


Babak Enayati,

[email protected]


Subgroup short title: Microgrid Capable DER and Devices

Subgroup Scope. Draft P1547.1 test procedures to verify compliance to P1547 requirements on DER designed for Microgrid Island (MI) operation and Microgrid Interconnection Devices.

Seeking input from P1547.1 stakeholders (microgrid developers, microgrid operators, utilities, system integrators, inverter/PV industry, generator manufacturers.)

Need: There is a need to certify DER for MI operation and Microgrid Interconnect Devices.

75

Introduction to P1547.1 Subgroup on: DER microgrid capabilities and microgrid interconnection

Testing:

– To a large degree the testing methods exist in UL1741, the SA and 1547 D4.0, Section 5.

– There is a need to come to an agreement on test parameters and clearly and correctly reference the test methods of other sections (for example Ride-Through tests, and interconnection requirements).

– This test will be interrelated to the “Interconnections Systems” described in UL 1741 SA.

– May need to clarify the referencing and track other section changes closely.

– The direct scope is DER requirements (settings) and Device tests, such as the MID.

76

Introduction to P1547.1 Subgroup on: DER microgrid capabilities and microgrid interconnection

Subgroup chair(s):

– Chris Rowe, [email protected]

– Tom McDermott, [email protected]

P1547 officer:

– Babak Enayati, [email protected]


– Starting: 2 weeks.

– Option 1: Tuesday at 11am Eastern (8am PST)

– Option 2: Wednesday at 11am Eastern (8am PST)

– Option 3: Thursday at 11am Eastern (8am PST)

77

Subgroup Logistics


P1547.1 Volunteers for Subgroup on Microgrid Capable DER and Devices


Volunteers :

Algrain Connelly Houser Lydic

Berntsen Diong Huque Seal

BRAVO Gautam Hurtt Preus

Chakraborty Hoke Jordan Zgonena

Chen Hong LIU Saleem


and Excellence


Thank You

79




Subgroup Breakout Sessions



Vice Chairs:






(Modified onsite 6/16) Time Topic/description







10:15 – 12:10 AM Subgroup breakouts (subset of subgroups)

12:10 PM – 1:10 PM Lunch (1 hour)


continued, including 15 min. break)


3:15 – 4:00 PM Open discussions, comments, concerns


81

Logistics for Subgroup Breakout Session

(Modified onsite 6/16)

82

Time Slot Subgroup 1 Subgroup 2 Description

10:15 – 10:20 PM Introduction to agenda

10:20 – 11:10 PM V&F Interop Two parallel sessions, duration 50 Minutes

11:10 – 11:20 PM 10 minutes break

11:20 – 12:10 PM UI HIL Two parallel sessions, duration 50 Minutes

12:10 – 1:10 PM Lunch (1 hour)

1:10 – 2:00 PM PQ ICP

Two parallel sessions, duration 50 Minutes

2:00 – 2:10 PM 10 minutes break

Logistics for Subgroup Breakout Session

83

• Each subgroups report back with 5-10 minutes presentation showing:

o What was accomplished in the breakout

o Identify gaps (if any)

o How will the writing proceed in summer

o Any additional input needed from the WG

o Order of presentation: 1. V&F

2. UI

3. PQ

4. Reg

5. HIL

6. Interop

7. ICP


and Excellence


Thank You

84




Next Actions



Vice Chairs:






Time Topic/description







10:30 – 11:45 AM Continue presentations of subgroups’ scope and


11:45 AM – 12:30 PM Lunch (45 minutes)


includes 15 minutes break)



86

Next Steps

87

June 16, 2016

• P1547.1 WG meeting – Draft 1 initiated

Summer 2016

• P1547.1 subgroups work and complete Draft 1

September 30, 2016

• P1547.1 Draft 1 posted in iMC for WG consideration

October 15, 2016

• Comments provided to the subgroups

October 27-28, 2016

• P1547.1 WG meeting – Draft 1 discussed

• Next meeting at Chicago, 1.5 days for P1547.1

Next Steps

88

• Develop a weekly meeting timetable (similar to the one in IEEE P1547)

• Setup recurring calls (monthly/bi-weekly) with P1547.1 officers and subgroup chairs/co-chairs

• IEEE tools (iMeet Central, listserv etc.)

• Adjourn


and Excellence


Thank You

89

Documents

IEEE SCC21/P1547.1 Draft Standard Conformance Test ...grouper.ieee.org/groups/scc21/1547.1_revision/mtgMinutes/P1547 1... · IEEE SCC21/P1547.1 Draft Standard Conformance Test Procedures