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© Copyright 2015 Ushio Group. All Rights Reserved. 1
Yusuke Teramoto, Bárbara Santos, Guido Mertens, Ralf Kops,
Margarete Kops, Hironobu Yabuta, Akihisa Nagano, Noritaka
Ashizawa, Takahiro Shirai, Kunihiko Kasama
Ushio Inc. / BLV Licht- und Vakuumtechnik GmbH
Alexander von Wezyk, Klaus Bergmann
Fraunhofer ILT
High-radiance LDP source:
clean, stable and reliable EUV source for
mask inspection
© Copyright 2015 Ushio Group. All Rights Reserved. 2015 International Workshop on EUV and Soft X-Ray Sources, Dublin, Ireland, November 10, 2015 2
Basic principle and characteristics
Key performances
Cleanliness
Stability and reliability
Summary
O U T L I N E
© Copyright 2015 Ushio Group. All Rights Reserved. 2015 International Workshop on EUV and Soft X-Ray Sources, Dublin, Ireland, November 10, 2015 3
Laser-assisted Discharge-produced Plasma
Liquid Tin Bath
(circulated)
Capacitor
Tin Film
Cooling
Laser
EUV
Tin Supply Disc
Tin Supply Disc
Current
• High brightness
• Appropriate plasma size (broad profile)
• Stable: no spatial and timing synchronization needed
• Reliable: 24/7 operation
• Clean: powerful debris shield
© Copyright 2015 Ushio Group. All Rights Reserved. 2015 International Workshop on EUV and Soft X-Ray Sources, Dublin, Ireland, November 10, 2015 4
Emission spectrum: similar to CO2 laser-driven LPP
0
0.2
0.4
0.6
0.8
1
1.2
11 12 13 14 15 16 17 18 19 20 21
Inte
nsit
y
Wavelength (nm)
Measured behind debris shield, not spatially resolved.
𝐼 𝜆 𝑑𝜆13.635 𝑛𝑚
13.365 𝑛𝑚
𝐼 𝜆 𝑑𝜆21 𝑛𝑚
10 𝑛𝑚
× 100 = 12.6 %
Similar spectrum to Sn-LPP
Beneficial in inspection and other applications
© Copyright 2015 Ushio Group. All Rights Reserved. 2015 International Workshop on EUV and Soft X-Ray Sources, Dublin, Ireland, November 10, 2015 5
Plasma shape: litho vs inspection
Plasma for mask inspection source
L: ~450 mm
D: ~200 mm
Low~medium pulse energy
1 mm
Plasma for lithography beta source
L: ~500 mm
D: ~230 mm
High pulse energy
XTREME technologies
© Copyright 2015 Ushio Group. All Rights Reserved. 2015 International Workshop on EUV and Soft X-Ray Sources, Dublin, Ireland, November 10, 2015 6
High radiance, appropriate plasma size
Diameter: 200 mm (FWHM)
Length: 450 mm (FWHM)
10 kHz, continuous operation
Very high peak radiance at
plasma
Plasma size smaller than DPP,
larger than LPP: good spatial
stability
© Copyright 2015 Ushio Group. All Rights Reserved. 2015 International Workshop on EUV and Soft X-Ray Sources, Dublin, Ireland, November 10, 2015 7
Radiance vs diameter (etendue)
0
10
20
30
40
50
60
70
0.0E+00 5.0E-03 1.0E-02 1.5E-02
Rad
ian
ce (
W/m
m2/s
r)
Etendue (mm2sr)
s=3.0 %
0
0.2
0.4
0.6
0.8
1
1.2
0 1 2 3 4 5
Rela
tiv
e r
ad
ian
ce
Time (minute)
s=3.1 %
0
0.2
0.4
0.6
0.8
1
1.2
0 1 2 3 4 5
Rela
tiv
e r
ad
ian
ce
Time (minute)
0
0.2
0.4
0.6
0.8
1
1.2
0 1 2 3 4 5
Rela
tiv
e r
ad
ian
ce
Time (minute)
s=3.4 %
© Copyright 2015 Ushio Group. All Rights Reserved. 2015 International Workshop on EUV and Soft X-Ray Sources, Dublin, Ireland, November 10, 2015 8
Stable timing and no misfire
No missing pulse.
No misfire.
-3
-2.5
-2
-1.5
-1
-0.5
0
0.5
0 200 400 600 800 1000
Vo
ltag
e (
kV
)
Time (ms)
Frequency is constant.
Defined by laser pulse.
© Copyright 2015 Ushio Group. All Rights Reserved. 2015 International Workshop on EUV and Soft X-Ray Sources, Dublin, Ireland, November 10, 2015 9
Radiance at plasma: 140 W/mm2/sr
0
20
40
60
80
100
120
140
160
0 2000 4000 6000 8000 10000
Rad
ian
ce (
W/m
m2/s
r)
Pulse repetition rate (Hz)
Averaged radiance in f200 mm
Peak radiance: 180 W/mm2/sr
Area-averaged radiance: 140 W/mm2/sr
15 kW (10 kHz)
© Copyright 2015 Ushio Group. All Rights Reserved. 2015 International Workshop on EUV and Soft X-Ray Sources, Dublin, Ireland, November 10, 2015 10
Mechanical debris shield concept
Laser Ions Neutrals
Debris shield
Clean EUV
Neutrals (Macro/microscopic particles and vapor)
- Completely stopped by debris shield
Charged particles (fast ions)
- Mostly stopped by debris shield
- Slow down in debris shield
Liquid Sn
© Copyright 2015 Ushio Group. All Rights Reserved. 2015 International Workshop on EUV and Soft X-Ray Sources, Dublin, Ireland, November 10, 2015 11
Cleanliness evaluation
Buffer gas
500 mm
Debris shield
Ru mirror sample
Plasma
Frequency
Discharge frequency: 5, 7 and 9 kHz
Buffer gas: Variable
Sample: 8-nm-thick Ru on Si
Source-sample distance: 500 mm
Incidence angle: 90˚, 15˚
Analysis: XRF
After 100~500M pulse
© Copyright 2015 Ushio Group. All Rights Reserved. 2015 International Workshop on EUV and Soft X-Ray Sources, Dublin, Ireland, November 10, 2015 12
Cleanliness: influence of frequency
0
5
10
5 kHz 7 kHz 9 kHz
Ru sputter rate (nm/Bpulse)
0
0.5
1
5 kHz 7 kHz 9 kHz
Sn deposition (nm)
• There is erosion due to
ions passing through the
debris shield.
• There is a weak
relationship between
sputter rate and
frequency.
• There is a slight
deposition of Sn.
• However, according to the
experiments done so far,
it does not grow and
stops around at
© Copyright 2015 Ushio Group. All Rights Reserved. 2015 International Workshop on EUV and Soft X-Ray Sources, Dublin, Ireland, November 10, 2015 13
Cleanliness: influence of number of pulses
0
0.1
0.2
0 50 100 150 200 250 300
Rela
tive
thic
kn
ess (
nm
)
Accumulated pulse (Mpulse)
Sn
-2
-1.5
-1
-0.5
0
0 50 100 150 200 250 300
Rela
tive
thic
kn
ess (
nm
)
Accumulated pulse (Mpulse)
Ru
Grazing incidence
Sn layer does not grow in proportion to
the number of pulses.
Ru is sputtered at constant rate.
Further reduction is under development.
© Copyright 2015 Ushio Group. All Rights Reserved. 2015 International Workshop on EUV and Soft X-Ray Sources, Dublin, Ireland, November 10, 2015 14
Radiance behind debris shield: 120 W/mm2/sr
Measured behind debris shield as clean EUV photon
Peak radiance: 145 W/mm2/sr
Area-averaged radiance: 120 W/mm2/sr
0
20
40
60
80
100
120
140
0 2000 4000 6000 8000 10000
Rad
ian
ce (
W/m
m2/s
r)
Pulse repetition rate (Hz)
Averaged radiance in f200 mm
This is what the
industry wants.
This is the
need.
20 % brighter than wanted
© Copyright 2015 Ushio Group. All Rights Reserved. 2015 International Workshop on EUV and Soft X-Ray Sources, Dublin, Ireland, November 10, 2015 15
Energy stability:
© Copyright 2015 Ushio Group. All Rights Reserved. 2015 International Workshop on EUV and Soft X-Ray Sources, Dublin, Ireland, November 10, 2015 16
Position stability: ~6 mm
-30
-20
-10
0
10
20
30
0 1 2 3 4 5
Dis
pla
cem
en
t (m
m)
Time (minute)
Measured with camera placed on optical axis
Exposure time: 5 ms
Standard deviation: 6.0~6.4 mm
© Copyright 2015 Ushio Group. All Rights Reserved. 2015 International Workshop on EUV and Soft X-Ray Sources, Dublin, Ireland, November 10, 2015 17
Reliability: tests ongoing
0
20
40
60
80
100
120
140
160
0 20 40 60 80 100 120
Rad
ian
ce (
W/m
m2/s
r)
Time (hour)
Nov2013 R&D Source
Oct2014 R&D Source
Feb2015 R&D Source
Sep2015 Prototype
The prototype machine is dedicated to days-long non-interrupted
operation test.
Several 5-day operations were carried out.
Output radiance will be increased by (1) increasing operation frequency
and (2) parameter optimization, and stabilized by (3) applying
stabilization control.
System adjustments
© Copyright 2015 Ushio Group. All Rights Reserved. 2015 International Workshop on EUV and Soft X-Ray Sources, Dublin, Ireland, November 10, 2015 18
Prototype LDP machine
© Copyright 2015 Ushio Group. All Rights Reserved. 2015 International Workshop on EUV and Soft X-Ray Sources, Dublin, Ireland, November 10, 2015 19
Summary
R&D source Energy stability and position stability have been
improved.
Sample exposure experiments are being performed.
Improved version of the debris shield has been
designed and will be tested early 2016.
It has an improved gas distribution leading to
better mitigation performance.
Prototype source 5-day non-interrupted operations have been carried
out several times.
Successful 5-day-long non-stop operations.
Aiming at system/module reliability improvement.
Stabilization control will be implemented.
© Copyright 2015 Ushio Group. All Rights Reserved. 2015 International Workshop on EUV and Soft X-Ray Sources, Dublin, Ireland, November 10, 2015 20
Performance summary
Item Performance Remark
Pulse repetition frequency up to 10 kHz variable
Duty cycle 100 %
Input power up to 15 kW variable
In-band EUV power up to 300 W/2psr at plasma
Radiance 120 W/mm2/sr*
* value measured behind debris shield
9 kHz
200-mm area averaged
Plasma size 200×450 mm FWHM typical value
Energy stability
Pulse: ~10 %
Dose: 0.1**~3 %
** with feedback control
Radiance stability 5.8 %***
***from 1.5-ms-exposure observation
10 kHz
Position stability 6~10 mm