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© Copyright 2015 Ushio Group. All Rights Reserved. 1 Yusuke Teramoto, Bárbara Santos, Guido Mertens, Ralf Kops, Margarete Kops, Hironobu Yabuta, Akihisa Nagano, Noritaka Ashizawa, Takahiro Shirai, Kunihiko Kasama Ushio Inc. / BLV Licht- und Vakuumtechnik GmbH Alexander von Wezyk, Klaus Bergmann Fraunhofer ILT High-radiance LDP source: clean, stable and reliable EUV source for mask inspection

High-radiance LDP source · Title: 2015 Source Workshop Ushio Author: [email protected] Created Date: 11/9/2015 10:32:51 PM

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  • © Copyright 2015 Ushio Group. All Rights Reserved. 1

    Yusuke Teramoto, Bárbara Santos, Guido Mertens, Ralf Kops,

    Margarete Kops, Hironobu Yabuta, Akihisa Nagano, Noritaka

    Ashizawa, Takahiro Shirai, Kunihiko Kasama

    Ushio Inc. / BLV Licht- und Vakuumtechnik GmbH

    Alexander von Wezyk, Klaus Bergmann

    Fraunhofer ILT

    High-radiance LDP source:

    clean, stable and reliable EUV source for

    mask inspection

  • © Copyright 2015 Ushio Group. All Rights Reserved. 2015 International Workshop on EUV and Soft X-Ray Sources, Dublin, Ireland, November 10, 2015 2

    Basic principle and characteristics

    Key performances

    Cleanliness

    Stability and reliability

    Summary

    O U T L I N E

  • © Copyright 2015 Ushio Group. All Rights Reserved. 2015 International Workshop on EUV and Soft X-Ray Sources, Dublin, Ireland, November 10, 2015 3

    Laser-assisted Discharge-produced Plasma

    Liquid Tin Bath

    (circulated)

    Capacitor

    Tin Film

    Cooling

    Laser

    EUV

    Tin Supply Disc

    Tin Supply Disc

    Current

    • High brightness

    • Appropriate plasma size (broad profile)

    • Stable: no spatial and timing synchronization needed

    • Reliable: 24/7 operation

    • Clean: powerful debris shield

  • © Copyright 2015 Ushio Group. All Rights Reserved. 2015 International Workshop on EUV and Soft X-Ray Sources, Dublin, Ireland, November 10, 2015 4

    Emission spectrum: similar to CO2 laser-driven LPP

    0

    0.2

    0.4

    0.6

    0.8

    1

    1.2

    11 12 13 14 15 16 17 18 19 20 21

    Inte

    nsit

    y

    Wavelength (nm)

    Measured behind debris shield, not spatially resolved.

    𝐼 𝜆 𝑑𝜆13.635 𝑛𝑚

    13.365 𝑛𝑚

    𝐼 𝜆 𝑑𝜆21 𝑛𝑚

    10 𝑛𝑚

    × 100 = 12.6 %

    Similar spectrum to Sn-LPP

    Beneficial in inspection and other applications

  • © Copyright 2015 Ushio Group. All Rights Reserved. 2015 International Workshop on EUV and Soft X-Ray Sources, Dublin, Ireland, November 10, 2015 5

    Plasma shape: litho vs inspection

    Plasma for mask inspection source

    L: ~450 mm

    D: ~200 mm

    Low~medium pulse energy

    1 mm

    Plasma for lithography beta source

    L: ~500 mm

    D: ~230 mm

    High pulse energy

    XTREME technologies

  • © Copyright 2015 Ushio Group. All Rights Reserved. 2015 International Workshop on EUV and Soft X-Ray Sources, Dublin, Ireland, November 10, 2015 6

    High radiance, appropriate plasma size

    Diameter: 200 mm (FWHM)

    Length: 450 mm (FWHM)

    10 kHz, continuous operation

    Very high peak radiance at

    plasma

    Plasma size smaller than DPP,

    larger than LPP: good spatial

    stability

  • © Copyright 2015 Ushio Group. All Rights Reserved. 2015 International Workshop on EUV and Soft X-Ray Sources, Dublin, Ireland, November 10, 2015 7

    Radiance vs diameter (etendue)

    0

    10

    20

    30

    40

    50

    60

    70

    0.0E+00 5.0E-03 1.0E-02 1.5E-02

    Rad

    ian

    ce (

    W/m

    m2/s

    r)

    Etendue (mm2sr)

    s=3.0 %

    0

    0.2

    0.4

    0.6

    0.8

    1

    1.2

    0 1 2 3 4 5

    Rela

    tiv

    e r

    ad

    ian

    ce

    Time (minute)

    s=3.1 %

    0

    0.2

    0.4

    0.6

    0.8

    1

    1.2

    0 1 2 3 4 5

    Rela

    tiv

    e r

    ad

    ian

    ce

    Time (minute)

    0

    0.2

    0.4

    0.6

    0.8

    1

    1.2

    0 1 2 3 4 5

    Rela

    tiv

    e r

    ad

    ian

    ce

    Time (minute)

    s=3.4 %

  • © Copyright 2015 Ushio Group. All Rights Reserved. 2015 International Workshop on EUV and Soft X-Ray Sources, Dublin, Ireland, November 10, 2015 8

    Stable timing and no misfire

    No missing pulse.

    No misfire.

    -3

    -2.5

    -2

    -1.5

    -1

    -0.5

    0

    0.5

    0 200 400 600 800 1000

    Vo

    ltag

    e (

    kV

    )

    Time (ms)

    Frequency is constant.

    Defined by laser pulse.

  • © Copyright 2015 Ushio Group. All Rights Reserved. 2015 International Workshop on EUV and Soft X-Ray Sources, Dublin, Ireland, November 10, 2015 9

    Radiance at plasma: 140 W/mm2/sr

    0

    20

    40

    60

    80

    100

    120

    140

    160

    0 2000 4000 6000 8000 10000

    Rad

    ian

    ce (

    W/m

    m2/s

    r)

    Pulse repetition rate (Hz)

    Averaged radiance in f200 mm

    Peak radiance: 180 W/mm2/sr

    Area-averaged radiance: 140 W/mm2/sr

    15 kW (10 kHz)

  • © Copyright 2015 Ushio Group. All Rights Reserved. 2015 International Workshop on EUV and Soft X-Ray Sources, Dublin, Ireland, November 10, 2015 10

    Mechanical debris shield concept

    Laser Ions Neutrals

    Debris shield

    Clean EUV

    Neutrals (Macro/microscopic particles and vapor)

    - Completely stopped by debris shield

    Charged particles (fast ions)

    - Mostly stopped by debris shield

    - Slow down in debris shield

    Liquid Sn

  • © Copyright 2015 Ushio Group. All Rights Reserved. 2015 International Workshop on EUV and Soft X-Ray Sources, Dublin, Ireland, November 10, 2015 11

    Cleanliness evaluation

    Buffer gas

    500 mm

    Debris shield

    Ru mirror sample

    Plasma

    Frequency

    Discharge frequency: 5, 7 and 9 kHz

    Buffer gas: Variable

    Sample: 8-nm-thick Ru on Si

    Source-sample distance: 500 mm

    Incidence angle: 90˚, 15˚

    Analysis: XRF

    After 100~500M pulse

  • © Copyright 2015 Ushio Group. All Rights Reserved. 2015 International Workshop on EUV and Soft X-Ray Sources, Dublin, Ireland, November 10, 2015 12

    Cleanliness: influence of frequency

    0

    5

    10

    5 kHz 7 kHz 9 kHz

    Ru sputter rate (nm/Bpulse)

    0

    0.5

    1

    5 kHz 7 kHz 9 kHz

    Sn deposition (nm)

    • There is erosion due to

    ions passing through the

    debris shield.

    • There is a weak

    relationship between

    sputter rate and

    frequency.

    • There is a slight

    deposition of Sn.

    • However, according to the

    experiments done so far,

    it does not grow and

    stops around at

  • © Copyright 2015 Ushio Group. All Rights Reserved. 2015 International Workshop on EUV and Soft X-Ray Sources, Dublin, Ireland, November 10, 2015 13

    Cleanliness: influence of number of pulses

    0

    0.1

    0.2

    0 50 100 150 200 250 300

    Rela

    tive

    thic

    kn

    ess (

    nm

    )

    Accumulated pulse (Mpulse)

    Sn

    -2

    -1.5

    -1

    -0.5

    0

    0 50 100 150 200 250 300

    Rela

    tive

    thic

    kn

    ess (

    nm

    )

    Accumulated pulse (Mpulse)

    Ru

    Grazing incidence

    Sn layer does not grow in proportion to

    the number of pulses.

    Ru is sputtered at constant rate.

    Further reduction is under development.

  • © Copyright 2015 Ushio Group. All Rights Reserved. 2015 International Workshop on EUV and Soft X-Ray Sources, Dublin, Ireland, November 10, 2015 14

    Radiance behind debris shield: 120 W/mm2/sr

    Measured behind debris shield as clean EUV photon

    Peak radiance: 145 W/mm2/sr

    Area-averaged radiance: 120 W/mm2/sr

    0

    20

    40

    60

    80

    100

    120

    140

    0 2000 4000 6000 8000 10000

    Rad

    ian

    ce (

    W/m

    m2/s

    r)

    Pulse repetition rate (Hz)

    Averaged radiance in f200 mm

    This is what the

    industry wants.

    This is the

    need.

    20 % brighter than wanted

  • © Copyright 2015 Ushio Group. All Rights Reserved. 2015 International Workshop on EUV and Soft X-Ray Sources, Dublin, Ireland, November 10, 2015 15

    Energy stability:

  • © Copyright 2015 Ushio Group. All Rights Reserved. 2015 International Workshop on EUV and Soft X-Ray Sources, Dublin, Ireland, November 10, 2015 16

    Position stability: ~6 mm

    -30

    -20

    -10

    0

    10

    20

    30

    0 1 2 3 4 5

    Dis

    pla

    cem

    en

    t (m

    m)

    Time (minute)

    Measured with camera placed on optical axis

    Exposure time: 5 ms

    Standard deviation: 6.0~6.4 mm

  • © Copyright 2015 Ushio Group. All Rights Reserved. 2015 International Workshop on EUV and Soft X-Ray Sources, Dublin, Ireland, November 10, 2015 17

    Reliability: tests ongoing

    0

    20

    40

    60

    80

    100

    120

    140

    160

    0 20 40 60 80 100 120

    Rad

    ian

    ce (

    W/m

    m2/s

    r)

    Time (hour)

    Nov2013 R&D Source

    Oct2014 R&D Source

    Feb2015 R&D Source

    Sep2015 Prototype

    The prototype machine is dedicated to days-long non-interrupted

    operation test.

    Several 5-day operations were carried out.

    Output radiance will be increased by (1) increasing operation frequency

    and (2) parameter optimization, and stabilized by (3) applying

    stabilization control.

    System adjustments

  • © Copyright 2015 Ushio Group. All Rights Reserved. 2015 International Workshop on EUV and Soft X-Ray Sources, Dublin, Ireland, November 10, 2015 18

    Prototype LDP machine

  • © Copyright 2015 Ushio Group. All Rights Reserved. 2015 International Workshop on EUV and Soft X-Ray Sources, Dublin, Ireland, November 10, 2015 19

    Summary

    R&D source Energy stability and position stability have been

    improved.

    Sample exposure experiments are being performed.

    Improved version of the debris shield has been

    designed and will be tested early 2016.

    It has an improved gas distribution leading to

    better mitigation performance.

    Prototype source 5-day non-interrupted operations have been carried

    out several times.

    Successful 5-day-long non-stop operations.

    Aiming at system/module reliability improvement.

    Stabilization control will be implemented.

  • © Copyright 2015 Ushio Group. All Rights Reserved. 2015 International Workshop on EUV and Soft X-Ray Sources, Dublin, Ireland, November 10, 2015 20

    Performance summary

    Item Performance Remark

    Pulse repetition frequency up to 10 kHz variable

    Duty cycle 100 %

    Input power up to 15 kW variable

    In-band EUV power up to 300 W/2psr at plasma

    Radiance 120 W/mm2/sr*

    * value measured behind debris shield

    9 kHz

    200-mm area averaged

    Plasma size 200×450 mm FWHM typical value

    Energy stability

    Pulse: ~10 %

    Dose: 0.1**~3 %

    ** with feedback control

    Radiance stability 5.8 %***

    ***from 1.5-ms-exposure observation

    10 kHz

    Position stability 6~10 mm