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Haga clic para modificar el estilo de texto del patrónSi sensor developmentsat CNM
Manuel Lozano
6th SILC Meeting. Torino, December 2007
Si sensor development at CNMManuel Lozano
Last developments relevant for SILC
� IR transparent detectors
� 3D technology
� Alibava Readout System
� Edgeless detectors
6th SILC Meeting. Torino, December 2007
Si sensor development at CNMManuel Lozano
IR transparent detectors
� Not much developments during last months
� CNM Clean Room closed due to expansion works
� Lack of high resistivity double side polished wafers
� Common purchase from CERN
� Last week new wafers arrived
� More than one year delay
� New process run for material characterization already started
IFCA
6th SILC Meeting. Torino, December 2007
Si sensor development at CNMManuel Lozano
3D technology
� Due to the low field problem of Single Sided 3D detectors, CNM decided to develop a two-side 3D technology.
� In collaboration with Glasgow University that are doing the simulations
� New mask set designed
� Technology developed
� First wafers already finished, only N-type, good results.
� 2nd and 3rd process runs started, N-type and P-type
� Very interesting for LHC pixels, very high radiation hardness. Useful for LC?
6th SILC Meeting. Torino, December 2007
Si sensor development at CNMManuel Lozano
3D technology
� Schematic technology cross section
Passivation
n+ doped
55um pitch
50-0um
300-250ump- type substrate
p+ doped
10um
Oxide0.4um
1um
p+ doped
Metal
Poly 3um
OxideMetal
P-stop p+
50-0um TEOS 2um
5um
High resistivitySemiconductor
Pixel readout
Electronics chip
Solder bump
PN N
6th SILC Meeting. Torino, December 2007
Si sensor development at CNMManuel Lozano
Simulations using ISE-TCAD
X (um)
Y(u
m)
0 10 200
5
10
15
20
25
80000
70000
60000
50000
40000
30000
20000
10000
0
Electric field (V/cm) in cross-sectionof double-sided detector at 100V bias
n+
p+
Electricfield (V/cm)
� 8V full depletion
(50V for planar)
Saturation at 70fF/pixel, i.e.
2.3nF/cm2 0 5 10 15 200.00
0.05
0.10
0.15
0.20
0.25
0.30
0.35
Simulated C-V characteristics of 3D detectors
Capacitance per pixel (pF)
Bias (V)
Double-sided 3D
Standard 3D
6th SILC Meeting. Torino, December 2007
Si sensor development at CNMManuel Lozano
Charge collection simulation
� Simulated minimum ionizing particle
� Double-sided 3D: 2.5ns collection time
� Standard 3D: 0.5ns
� Planar detector: 10-20ns
Uniform deposition
along track0.0 0.5 1.0 1.50
2
4
6
8
10
12
14
16
18
20
22
24
MIP signals in double-sided and standard 3D at 100V
Electrode current (µΑ)
Time (ns)
Double-sided detector
Standard 3D detector
6th SILC Meeting. Torino, December 2007
Si sensor development at CNMManuel Lozano
Medipix2
Diodes 2D
spreading
Test structures
Atlas pixel
3d pads
strips
Long strip
10x10 matrix
MOS
Test for SEM
3x3 matrix
Pilatus
Mask design
6th SILC Meeting. Torino, December 2007
Si sensor development at CNMManuel Lozano
First wafers
6th SILC Meeting. Torino, December 2007
Si sensor development at CNMManuel Lozano
Medipix2 pixel configuration
Polysilicon contactOpening in the passivation
P-type Hole Metal
6th SILC Meeting. Torino, December 2007
Si sensor development at CNMManuel Lozano
Holes filled with poly and doped
Holes: 240um deepDoped polysilicon at
the bottom of the hole
6th SILC Meeting. Torino, December 2007
Si sensor development at CNMManuel Lozano
SEM images of top part of holes
Polysilicon layerColumnar electrode
Metal trackPolysilicon contact
6th SILC Meeting. Torino, December 2007
Si sensor development at CNMManuel Lozano
StripsPilatus
Pixels size= 172 x 172 um
Matrix = ?x?
80 um pitch
128 channels
DC coupled
Other configurations
6th SILC Meeting. Torino, December 2007
Si sensor development at CNMManuel Lozano
Electrical characteristics
0 20 40 60 80 1001E-9
1E-8
1E-7
1E-6
1E-5C
urr
en
t (A
)
Reverse Bias (V)
0,10 0,15 0,20 0,25 0,30 0,35
10-8
10-7
10-6
10-5
Cu
rren
t (A
)
Forward Bias (V)
0 5 10 15 20 25 30
2,0x10-10
4,0x10-10
6,0x10-10
8,0x10-10
1,0x10-9
1,2x10-9
1,4x10-9
1,6x10-9
1,8x10-9
2,0x10-9
2,2x10-9
Capacitance (F)
Bias(V)
Full depletion occurs at 2-3 V since the electrode pitch is 55µm
0 10 20 30 40 501E-10
1E-9
1E-8
1E-7
Current(A)
Reverse bias(V)
pad 1
pad 2
pad 3
pad 4
pad 5
55um pitch
6th SILC Meeting. Torino, December 2007
Si sensor development at CNMManuel Lozano
ALIBAVA: A readout system for microstripsilicon sensors
� Joint development of Liverpool Univ., IFIC-Valencia and CNM-Barcelona
� Need of a simple and cheap system for detector charge collectionperformance characterization
� Difficulty for obtaining this type of measurements:
� Required equipment is expensive
� A large number of channels has to be monitored
� Many different approaches: NIM, CAMAC, VME or custom electronic module
� Testing with an electronic system as similar as possible to those used at LHC experiments:
� LHC front end readout chip should be used
� Analog readout is preferred for pulse shape reconstruction
6th SILC Meeting. Torino, December 2007
Si sensor development at CNMManuel Lozano
System characteristics
� The system is compact and portable.
� Two triggering options:
� External trigger input from one or two photomultipliers (radioactive source).
� Synchronized external trigger output for pulsing an external excitation source (laser system).
� Uses one or two front-end readout chips (Beetle, LHCb) to acquire the detector signals
� Communicates with a PC via USB,
� The system is controlled from a PC application in communication with a FPGA which interpret and execute the orders.
� It has its own power supply system, from AC mains (not HV).
Motherboard prototypeprototype
Test box” (DB + fanins + detector)
6th SILC Meeting. Torino, December 2007
Si sensor development at CNMManuel Lozano
Edgeless detectors
� RIE cut trenches reduces inactive detector area due to gurad rings
� With trenches and saw cut, we estimate inactive are in the order of 100 µm
� Using Current Terminating Ring (CTR) to collect current, as small as 25 µm
� Important for detector tiling
Strips Guard ring Current Terminating Ring
25µm
6th SILC Meeting. Torino, December 2007
Si sensor development at CNMManuel Lozano
Final remarks
� We can manufacture detectors for the SILCcollaboration
� Only 4’’ wafers
� Even with two metals
� Good option to test new ideas
� Easy access through the Spanish “Access to Large Facilities” Program
http://www.cnm.es/gicserv/index.htm
� Deadline of next call: 31 January 2008