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Haga clic para modificar el estilo de texto del patrón Si sensor developments at CNM Manuel Lozano

Hagaclicpara modificarel estilode textodel patrón Si ... · Hagaclicpara modificarel estilode textodel patrónSi sensor developments at CNM Manuel Lozano. 6th SILCMeeting. ... Test

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Page 1: Hagaclicpara modificarel estilode textodel patrón Si ... · Hagaclicpara modificarel estilode textodel patrónSi sensor developments at CNM Manuel Lozano. 6th SILCMeeting. ... Test

Haga clic para modificar el estilo de texto del patrónSi sensor developmentsat CNM

Manuel Lozano

Page 2: Hagaclicpara modificarel estilode textodel patrón Si ... · Hagaclicpara modificarel estilode textodel patrónSi sensor developments at CNM Manuel Lozano. 6th SILCMeeting. ... Test

6th SILC Meeting. Torino, December 2007

Si sensor development at CNMManuel Lozano

Last developments relevant for SILC

� IR transparent detectors

� 3D technology

� Alibava Readout System

� Edgeless detectors

Page 3: Hagaclicpara modificarel estilode textodel patrón Si ... · Hagaclicpara modificarel estilode textodel patrónSi sensor developments at CNM Manuel Lozano. 6th SILCMeeting. ... Test

6th SILC Meeting. Torino, December 2007

Si sensor development at CNMManuel Lozano

IR transparent detectors

� Not much developments during last months

� CNM Clean Room closed due to expansion works

� Lack of high resistivity double side polished wafers

� Common purchase from CERN

� Last week new wafers arrived

� More than one year delay

� New process run for material characterization already started

IFCA

Page 4: Hagaclicpara modificarel estilode textodel patrón Si ... · Hagaclicpara modificarel estilode textodel patrónSi sensor developments at CNM Manuel Lozano. 6th SILCMeeting. ... Test

6th SILC Meeting. Torino, December 2007

Si sensor development at CNMManuel Lozano

3D technology

� Due to the low field problem of Single Sided 3D detectors, CNM decided to develop a two-side 3D technology.

� In collaboration with Glasgow University that are doing the simulations

� New mask set designed

� Technology developed

� First wafers already finished, only N-type, good results.

� 2nd and 3rd process runs started, N-type and P-type

� Very interesting for LHC pixels, very high radiation hardness. Useful for LC?

Page 5: Hagaclicpara modificarel estilode textodel patrón Si ... · Hagaclicpara modificarel estilode textodel patrónSi sensor developments at CNM Manuel Lozano. 6th SILCMeeting. ... Test

6th SILC Meeting. Torino, December 2007

Si sensor development at CNMManuel Lozano

3D technology

� Schematic technology cross section

Passivation

n+ doped

55um pitch

50-0um

300-250ump- type substrate

p+ doped

10um

Oxide0.4um

1um

p+ doped

Metal

Poly 3um

OxideMetal

P-stop p+

50-0um TEOS 2um

5um

High resistivitySemiconductor

Pixel readout

Electronics chip

Solder bump

PN N

Page 6: Hagaclicpara modificarel estilode textodel patrón Si ... · Hagaclicpara modificarel estilode textodel patrónSi sensor developments at CNM Manuel Lozano. 6th SILCMeeting. ... Test

6th SILC Meeting. Torino, December 2007

Si sensor development at CNMManuel Lozano

Simulations using ISE-TCAD

X (um)

Y(u

m)

0 10 200

5

10

15

20

25

80000

70000

60000

50000

40000

30000

20000

10000

0

Electric field (V/cm) in cross-sectionof double-sided detector at 100V bias

n+

p+

Electricfield (V/cm)

� 8V full depletion

(50V for planar)

Saturation at 70fF/pixel, i.e.

2.3nF/cm2 0 5 10 15 200.00

0.05

0.10

0.15

0.20

0.25

0.30

0.35

Simulated C-V characteristics of 3D detectors

Capacitance per pixel (pF)

Bias (V)

Double-sided 3D

Standard 3D

Page 7: Hagaclicpara modificarel estilode textodel patrón Si ... · Hagaclicpara modificarel estilode textodel patrónSi sensor developments at CNM Manuel Lozano. 6th SILCMeeting. ... Test

6th SILC Meeting. Torino, December 2007

Si sensor development at CNMManuel Lozano

Charge collection simulation

� Simulated minimum ionizing particle

� Double-sided 3D: 2.5ns collection time

� Standard 3D: 0.5ns

� Planar detector: 10-20ns

Uniform deposition

along track0.0 0.5 1.0 1.50

2

4

6

8

10

12

14

16

18

20

22

24

MIP signals in double-sided and standard 3D at 100V

Electrode current (µΑ)

Time (ns)

Double-sided detector

Standard 3D detector

Page 8: Hagaclicpara modificarel estilode textodel patrón Si ... · Hagaclicpara modificarel estilode textodel patrónSi sensor developments at CNM Manuel Lozano. 6th SILCMeeting. ... Test

6th SILC Meeting. Torino, December 2007

Si sensor development at CNMManuel Lozano

Medipix2

Diodes 2D

spreading

Test structures

Atlas pixel

3d pads

strips

Long strip

10x10 matrix

MOS

Test for SEM

3x3 matrix

Pilatus

Mask design

Page 9: Hagaclicpara modificarel estilode textodel patrón Si ... · Hagaclicpara modificarel estilode textodel patrónSi sensor developments at CNM Manuel Lozano. 6th SILCMeeting. ... Test

6th SILC Meeting. Torino, December 2007

Si sensor development at CNMManuel Lozano

First wafers

Page 10: Hagaclicpara modificarel estilode textodel patrón Si ... · Hagaclicpara modificarel estilode textodel patrónSi sensor developments at CNM Manuel Lozano. 6th SILCMeeting. ... Test

6th SILC Meeting. Torino, December 2007

Si sensor development at CNMManuel Lozano

Medipix2 pixel configuration

Polysilicon contactOpening in the passivation

P-type Hole Metal

Page 11: Hagaclicpara modificarel estilode textodel patrón Si ... · Hagaclicpara modificarel estilode textodel patrónSi sensor developments at CNM Manuel Lozano. 6th SILCMeeting. ... Test

6th SILC Meeting. Torino, December 2007

Si sensor development at CNMManuel Lozano

Holes filled with poly and doped

Holes: 240um deepDoped polysilicon at

the bottom of the hole

Page 12: Hagaclicpara modificarel estilode textodel patrón Si ... · Hagaclicpara modificarel estilode textodel patrónSi sensor developments at CNM Manuel Lozano. 6th SILCMeeting. ... Test

6th SILC Meeting. Torino, December 2007

Si sensor development at CNMManuel Lozano

SEM images of top part of holes

Polysilicon layerColumnar electrode

Metal trackPolysilicon contact

Page 13: Hagaclicpara modificarel estilode textodel patrón Si ... · Hagaclicpara modificarel estilode textodel patrónSi sensor developments at CNM Manuel Lozano. 6th SILCMeeting. ... Test

6th SILC Meeting. Torino, December 2007

Si sensor development at CNMManuel Lozano

StripsPilatus

Pixels size= 172 x 172 um

Matrix = ?x?

80 um pitch

128 channels

DC coupled

Other configurations

Page 14: Hagaclicpara modificarel estilode textodel patrón Si ... · Hagaclicpara modificarel estilode textodel patrónSi sensor developments at CNM Manuel Lozano. 6th SILCMeeting. ... Test

6th SILC Meeting. Torino, December 2007

Si sensor development at CNMManuel Lozano

Electrical characteristics

0 20 40 60 80 1001E-9

1E-8

1E-7

1E-6

1E-5C

urr

en

t (A

)

Reverse Bias (V)

0,10 0,15 0,20 0,25 0,30 0,35

10-8

10-7

10-6

10-5

Cu

rren

t (A

)

Forward Bias (V)

0 5 10 15 20 25 30

2,0x10-10

4,0x10-10

6,0x10-10

8,0x10-10

1,0x10-9

1,2x10-9

1,4x10-9

1,6x10-9

1,8x10-9

2,0x10-9

2,2x10-9

Capacitance (F)

Bias(V)

Full depletion occurs at 2-3 V since the electrode pitch is 55µm

0 10 20 30 40 501E-10

1E-9

1E-8

1E-7

Current(A)

Reverse bias(V)

pad 1

pad 2

pad 3

pad 4

pad 5

55um pitch

Page 15: Hagaclicpara modificarel estilode textodel patrón Si ... · Hagaclicpara modificarel estilode textodel patrónSi sensor developments at CNM Manuel Lozano. 6th SILCMeeting. ... Test

6th SILC Meeting. Torino, December 2007

Si sensor development at CNMManuel Lozano

ALIBAVA: A readout system for microstripsilicon sensors

� Joint development of Liverpool Univ., IFIC-Valencia and CNM-Barcelona

� Need of a simple and cheap system for detector charge collectionperformance characterization

� Difficulty for obtaining this type of measurements:

� Required equipment is expensive

� A large number of channels has to be monitored

� Many different approaches: NIM, CAMAC, VME or custom electronic module

� Testing with an electronic system as similar as possible to those used at LHC experiments:

� LHC front end readout chip should be used

� Analog readout is preferred for pulse shape reconstruction

Page 16: Hagaclicpara modificarel estilode textodel patrón Si ... · Hagaclicpara modificarel estilode textodel patrónSi sensor developments at CNM Manuel Lozano. 6th SILCMeeting. ... Test

6th SILC Meeting. Torino, December 2007

Si sensor development at CNMManuel Lozano

System characteristics

� The system is compact and portable.

� Two triggering options:

� External trigger input from one or two photomultipliers (radioactive source).

� Synchronized external trigger output for pulsing an external excitation source (laser system).

� Uses one or two front-end readout chips (Beetle, LHCb) to acquire the detector signals

� Communicates with a PC via USB,

� The system is controlled from a PC application in communication with a FPGA which interpret and execute the orders.

� It has its own power supply system, from AC mains (not HV).

Motherboard prototypeprototype

Test box” (DB + fanins + detector)

Page 17: Hagaclicpara modificarel estilode textodel patrón Si ... · Hagaclicpara modificarel estilode textodel patrónSi sensor developments at CNM Manuel Lozano. 6th SILCMeeting. ... Test

6th SILC Meeting. Torino, December 2007

Si sensor development at CNMManuel Lozano

Edgeless detectors

� RIE cut trenches reduces inactive detector area due to gurad rings

� With trenches and saw cut, we estimate inactive are in the order of 100 µm

� Using Current Terminating Ring (CTR) to collect current, as small as 25 µm

� Important for detector tiling

Strips Guard ring Current Terminating Ring

25µm

Page 18: Hagaclicpara modificarel estilode textodel patrón Si ... · Hagaclicpara modificarel estilode textodel patrónSi sensor developments at CNM Manuel Lozano. 6th SILCMeeting. ... Test

6th SILC Meeting. Torino, December 2007

Si sensor development at CNMManuel Lozano

Final remarks

� We can manufacture detectors for the SILCcollaboration

� Only 4’’ wafers

� Even with two metals

� Good option to test new ideas

� Easy access through the Spanish “Access to Large Facilities” Program

http://www.cnm.es/gicserv/index.htm

� Deadline of next call: 31 January 2008