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Fast Yield-Driven Fracture for Variable Shaped-Beam Mask Writing Andrew B. Kahng 1 , Xu Xu 1 , and Alex Z. Zelikovsky 2 1. CSE Dept. University of California, San Diego 2. CS Department, Georgia State University. Fracture in Mask Data Process. ABSTRACT. Gain Based Selection Heuristics. - PowerPoint PPT Presentation
Citation preview
• Grid graph : :Draw two rays from each concave point• Rays are divided into non-intersected ray-segments
Conflict pair: two ray segments from the same point• Rule 1: One of ray segments from any concave point must be used
• Rule 2: At most one ray segment in each conflict pair can be used
• Rule 3: No internal concave points Rule 3: No internal concave points
• Fracture = select ray segments obeying the rules
Fast Yield-Driven Fracture for Variable Shaped-Beam Mask WritingAndrew B. Kahng1, Xu Xu1, and Alex Z. Zelikovsky2
1. CSE Dept. University of California, San Diego 2. CS Department, Georgia State University
The aggressive use of RET techniques with each successive process generation have presented new challenges for current fracture tools, which are at the heart of layout data preparation. One main challenge is to reduce the number of small dimension trapezoids (slivers) to improve mask yield. Some commercial tools are available for handling the sliver minimization problem in fracture. The integer linear programming (ILP) method can significantly reduce sliver number at the expense of long runtime.
In this work, we propose a new ray-segment selection heuristic which can find a near-optimal fracture solution in practical time while being flexible enough to take into account all specified requirements. We also extend the heuristics with the introduce of auxiliary ray-segments. Compared with state-of-art sliver-driven fracturing tools, the proposed method reduces the number of slivers in the fractures of two industry testcases by 76.7% and 58.6%, respectively, without inflating the runtime and shot count. Similarly, compared with the previous ILP based fracture, the new method
reduces the number of slivers by 56.1% and 2.2% respectively, with more than 60X speedup and negligent shot count overhead.
Fracture: Decompose a list of polygons into trapezoids (shots)
ABSTRACTFracture in Mask Data Process
• Sliver : : A shot whose minimum dimension <
• Sliver number
Mask CD variation Mask yield
Sliver Minimization Challenge
Gain Based Selection Heuristics For any ray segment i, weight of i W(i)= increased sliver number after using i For any conflict pair (i, j), gain of i G(i)=W(j)-W(i) = sliver number saved by using I
• Initially, the set S = {All ray
segments from concave points}
• While (S≠Ø)
- Choose one ray segment i with
the largest gain, delete its
conflict pair from the S
- If there is a ray segment j connected
with i, add j into S
- Update the gains of ray segments
in S
• Kahng et al., “Yield- and Cost-Driven Fracturing for Variable Shaped-Beam Mask Writing”, BACUS 2004 • Nakao et al. “A new figure fracturing algorithm for variable-shaped EB exposure-data generation” , ECJ 2003• Cobb et al. “High performance Hierarchical fracturing” SPIE 4754• Cobb et al. “Hierarchical GDSII based fracturing and job deck system” SPIE 4562
Experimental Results
CONCLUSIONS
BIBLIOGRAPHY
• Compared with two commercial fracture tools: - Reduce sliver number by 76.7% and 58.6% - No runtime overhead • Compared with previous ILP method: - Reduce sliver number by 28.9% - 60x speedup• Future work: fracture-friendly OPC
Yield Driven Fracture
Yield Driven Fracture ProblemGiven: • List of rectilinear polygons P • Slivering size Partition: P into non-overlapping trapezoidal shotsTo minimize: Number of shots and number of slivers
Layout ExtractionRET
Circuit Design
Tape OutJob Decomposition
Mask Data Preparation
Mask Making
Writing
Inspection
Metrology
Tonality
PEC Fracture
Job Finishing
Fracture
<
2 shots
Ray-Segment Selection Formulation
concave point
raysray segments
No sliver with good fracture
Conflict pair concave points convex points
0
1 -10
-110
-11
1
In SChosen
Auxiliary Ray Segments
Sliver number may be reduced with the introduction of auxiliary ray segments
Auxiliary ray segment addition rule: If two rays form a sliver whose length grater than 3, and no rays partition the sliver in the middle, add one auxiliary ray in the middle.
MethodDesign A Design B
shots slivers CPU shots slivers CPU
Tool A 10754 6111 0 17335 11572 0
Tool B 10455 4451 0 17130 10797 0
Tool C 9755 786 2 17195 6502 3
ILP 9750 417 134 17684 2750 222
Proposed 9786 183 1 17656 2691 4
0 sliversliver
>3