<<GenRad 228x debug technique>>

*Be careful not to reverse--bias polarized capacitors.

*Use the SWAP command only on non--polarized capacitors.

*Use the RER=NN Debug command to determine the stability of the test.

*Use the SURROUND command to obtain a list of surrounding components.

*Guarding components connected to the source side of the measurement usually

produces

desired results. Guarding components on the measure side usually makes things

worse. This is not always the case, so try as many combinations as possible.

*If changing guard points does not improve stability, try switching from a CS to a

CP

The diode forward voltage value defaults to 650 mV and the dynamic resistance

defaults to 20 ohms unless you specify a different value in the diode circuit

description files.

The SWAP and GUARD commands permit you to easily swap the source and

measure nodes

and modify the guard node list for 4--terminal tests. SWAP swaps the Channel A

(Source node) and Channel B (Measure node) nail lists and removes any guard

nails. Use the GUARD command to easily add guard nails to the Channel C and

GND channels.

The + character is an indicator to the Run--Time System (RTS) that the specified

nail or nails are to be added to the current list of nails. Using this character is a

shorthand method of adding nails and nodes to an existing list without having to

enter all the nails. The RTS also accepts the minus (--) character as a shorthand

method of specifying that the nails or nodes are to be removed from an existing

list.

Channel A (Source node), Channel B (Measure node), Channel C/D guard.

Use the GUARD command to easily add guard nails to the Channel C and GND

channels.

Use SWAP swaps the Channel A (Source node) and Channel B (Measure node)

nail lists and removes any guard nails.

To display the test program statements that correspond to the steps of

the digital display, type:

UNTRA

These test statements display:

1: IC(66,11) IL(66,11) OS(7) OH(7);

2: IH(11);

3: IH(66) OL(7);

4: IL(11);

DEBUG]>

To rerun the burst n times, you can type the following at the Debug prompt:

RER=n

Correct statement 4 by typing the following debug command:

4 OH(7)

Debug command:

Rer n,

rerun

Ctrl+z, abrot

Ctrl+e

ABSOLUTE,

ACCEPT

Force

PU, PD, PB, and PN

ALLFAULT

ALLFAULT [[/DELAY=msecs] | [/MAXDLY=msecs]] [/FULL] [/OR_BIDIR]

[/DIAG][/APPEND] [/NOBUS] [/NODIGF]

[/NORERUN] [RERUNS=nn] [/SHOWRERUNS][/NOFAULT]

[/NODIAG][file_name]

FAULT

[/PIN=pnum,pnum...][/ALL][/DEVICE=component name] [DELAY=msecs][/OR_BIDIR]

[/DIAG] [/NOAPPEND] [/NOFAULT] [/NODIAG] [file-name]

ARITH

ASSIGN LGC

BSDEBUG

BURST

BURST = ntimes

BUSTEST

BUSUNTRA

CALLS

CANCEL

CHECKPOINT = number

CHECKPOINT = number

CLOCK

CLOCK [TSn]

COF

Takes all subsequent bursts out of SOF (stop--on--failure) mode

COMPONENT

COMPONENT = name

CONTACT

FREE

This command prints to the MESfile a list of nails that are not being used in the

current test and

that do not cause mux conflicts with any nails in the current test. The FREE nail

command,

HD (Hold)

HD (nail[s])

Allows the specified nails to remain in their last assigned runtime state.

MONITOR

NAIL

NAIL = nail number

NN

NODE

NODE = nodename

NOS

OL (Output Low)

OL (nail[s])

OH (Output High)

OH (nail[s])

Example:

OH(78,89)

Makes the expected output state high for the specified nail(s).

OPENS

The TEST OPENS statement checks to make sure that all nails in the specified nail

list are shorted together, that is, the impedance between the nails must be less

than the value pecified

by R=. A failure is reported if any of the nails in the list are not shorted.

OS (Output Sense)

OS (nail[s])

PROBE

PROBE = name

PS

! 7 volts at 15 amps

! 20 volts at 8 amps

! 60 volts at 2.5 amps

GR228X software allows the programmer to control them using high level SET PS,

TEST PS,

MEAS PS, and CLEAR PS programming statements.

PWRCHK

The PWRCHK test measures the voltage on the power nodes at the beginning of

test execution to make sure the voltage is less than 200 mV. If the measured

voltage is greater than 200 mV, the RTS branches to the end of the program and

asks you to make sure UUT voltages are discharged properly before testing

begins. Executing analog tests with voltages above 200 mV may cause damage to

the tester’s scanner relays.

RESET

Causes the test program to halt, and returns the system to the Reset or Waiting--

for--Start state.

Press the Reset key for the same effect. Unlike the MONITOR and ABORT

commands, this

command does not return you to the monitor.

SHORTS

The TEST SHORTS statement checks to make sure that all nails in the specified

nail list are not shorted together; the impedance between the nails must be

greater than the value specified by R=. A failure is reported if any of the nails in

the list are shorted.

SIC Command(Single Input Connect)

25 SIC 93<RET> connects nail 93 at step 25 and disconnect it at step 26:

SID Command(Single Input Disconnect)

SIH Command(Single Input High)

SIL Command(Single Input Low)

SHD Command(Single Hold)

SOH Command(Single Output High)

SOL Command(Single Output Low)

SOI Command(Single Output Ignore)

SOS Command(Single Output Sense)

SOF Command(Stop--On--Fail)

STM

The STM commands allow you to control and monitor the various devices on the

system’s self

test module.

SURROUND

SURROUND nail#

Prints the names of all the components connected to the specified nail and lists

the nails connected to the other pins of the components. For example, if nail 5

connects to U31 pin 1 and U12 pin 2, nail 2 connects to U31 pin 2, and so on, the

following command prints a message that lists the U31--1 and U12--2 connections

to pin 5, and so on.

DEBUG]> SUR = 5

SWAP

SYNC

TIME

UNTRANSLATE

Changes the display from digital debug timing display to the burst display. The

Untranslate mode allows you to make changes to any of the digital test

statements.

WD

WD [UP,DOWN,LEFT,RIGHT,PRINT,PRIALL,<test step>]