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ELECTRO-MECHANICS,INC.'ew

Britain, Connecticut

RPS MATRIX MOCK-UP FAULT ISOLATION

AND

SURGE WITHSTAND QUALIFICATION TEST REPORT

Florida Power 5 LightSt. Lucie Unit 2

Test Report TS 8021-1

8211040177 821029 '!PDR ADOCK 05000389A ",PDR ~~

TABLE OF CONTENTS

Section No. Title ~Pe e No.

U

1.02.03.00.05.06.0

ABSTRACT

REFERENCES

SCOPE

SURGE WITHSTAND TESTING RESULTS

FAULT ISOLATION TESTiNG RESULTS

CONCLUSIONS

2

3

6

9

15

Appendix A

Appendix B

EM 'ZP 8021-1, Rev. B, Test Procedure

EM TR 8021-1, Rev. B, Test Record (Data)

Rev. A

'i

Vr

RPS Matrix Mock-Up Fault Isolationand

ur-'ga —Withstand —Quakification Test Report

1.0 ABSTRACT

The RPS matrtix circuit with associafed Bistable Trip.Unite., -power..supplies;-relays,- fuses, clamp circuits and'

~

oCher'- items as defined by Ref. 2.1 and in Appendix A, was-constructed as a mock-up using components and materials as

used in the actual RPS. This circuit was subjected tohigh 'frequency transient surges and high voltage main-tained faults, as defined in Ref. 2.1'and Appendix A. Inall tests, the monitored simulated vital buss voltage wasnot-. disturbed beyond its allowable limit (+10+) and theBistable Trip Units and Trip Path Relays did ocr form theirreouired ~safet. funotion (oontaots opened and remained

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open). Testing was performed by and at Electro-Mech-anics, Inc., New Britain, CT.

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2.0 REFERENCES

2..1-- CE.Yi0"89230084 .(No Rev).

2.2 IEEE Std. 472-1974 (As modified by Ref. 2. 1)

2 3-:.C7. 13172-ICE-3001 (Rev. 02) RPS Spec.

2.4 CE-.OOOOO-ICE-3001-'('Rm. 01)'TQ Spec.

2.5 EM 34709 (Rev. D) RPS P/S Schematic

3.0 SCOPE

The intent of this testing was to demonstrate the abilityof the RPS matrix and associated protective circuits tolimit the propagation of high frequency transients fromone plant vital buss to another when that transient is ap-plied in transverse mode (between hot and neutral lines ofbuss) or in common mode (either hot or neutral line toearth — chassis).

Further, it was intended to demonstrate that when 600 UAC

or'400 VDC faults are applied in transverse mode (acrossthe output of the matrix power supply fault isolation

1 clamp circuit;) and in common mode (matrix power supplypositive output to earth '- chassis - and negative outputto chassis), the remaining matrixes will perform as de-signed to initiate a reactor trip when required.

To accomplish'these ends, a mock-up was con tructed on a

plywood base consisting of bistable trip units, matrixpower supplies', power supply fault clamp circuits, fuses,matrix relay cards,- trip path relays and all associatedinterbay isolation fuses and vital buss line fuses, inter-wired to simulate the Bay A and Bay B portions of the RPS

AB matrix circuit. Vital AC busses were simulated by120 volt to 120 volt isolation transformers.'he exactcircuit is shown as Figure 1 in Appendix A. Prior totesting, the tripping accuracy cf each BTU is .-.easured and

the correct operation of,the trip path relays is ver if'ed.

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3. 1 SURGE TEST SUMMARY

For surge withstand testing, a Velonex type 510 XEEE-type surge transient generator capable of producing1MHz oscillatory decaying transients was used tocreate the required voltage pulses of 300 volt peak-to-peak amplitude for. the first full cycle. Thesewere appled through a Velonex type -V2538 isolator tothe'imulated vital buss "B" (the is'olator preventsloading of the pulse generator by the- line source im-pedance). The vital buss was adjusted to rated max-

~ imum of 132 Vrms with a variable autotransformer.The pulse was synchronized to occur at the positiveline voltage peak, so as to produce a net peak volt-age of at least 337 volts (the sum of peak line volt-.age and peak surge voltage).

Xn transverse mode, these pulses were applied di-rectly to the "B" vital buss. Two (2) oscilloscopephotos were obtained clearly indicating the required-levels were attained.

While the pulses were being applied, the Bay B andBay A BTU's were tested for tripping accuracy,three. (3) oscilloscope photos were obtained of thesimulated "A" vital buss and the trip path relayswere observed to trip as required. For additionalinformation, the matrix relay coil voltage for bay"A" was also photographed from an oscilloscope wave-form,

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I., common mode, the pulses were applied separatelybetween each line of the "B" vital buss and the "B»

matrix po~er supply chassis (earth). The same dataand photographs were obtained as for transverse mode

testing.

Subsequent to the surge testing, the BTU"s were againtested for tripping accuracy and all components wereexamined or tested for permanent damage or degra-dation.

3.'2 . FAULT TEST SUMMARY

Fault testing was accomplished with the use of a 30KM

power source capable of delivering greate. than600 VAC and 000 VDC at 50 amperes (the equipment wasbuilt by Electro-Mechanics and is designated as TE-273N). 'In transverse mode, the fault was applied tothe output side of the Bay A matrix power supplyfault isolation clamp circQit, which is also acrossthe "A" matrix relay coil, through isolation fuses.In common mode, the fault was applied first betwenthe "A" matrix power supply positive output and itschassis, then between its negative output and itschassis.

Monitoring was accomplished with oscillographic re-corder s. -During each test, one recorder chan. el con-tinuously monitored the fault source voltage at a de-'flection factor of approxima"ely 1950 volts perinch. A second recorder monitored any fault current

that @i~hi flow, at a de Rsat30rr factor of 5"A perinch (c amped at. approxiuat.eely 7'axi "ua indica»tion) The simulated Bay A v'ta' ss v"s also -;"on-

e tored to deter"inc the ~axe."-u. distu",)ance due toth>e faud.t, at n deflection factor of appr oxi~ate3.y7~0 volts per inch. Ho greater 'han 10$ variationsdurir>g the fault test was allowed.

An additicnE1 two (2} Channel> tnonitor ed the statusof the AG/AD and BC/BD r;atrix-a sociated trip con-tacts in the Bay A and Bay B BTU's, re pectively.Puring each fault test, the BTU's we~e required toenter a tripped condition when the signal level ex-ceeded the tr'ip sebpoints. Trippkag accuracg was de-

. -ter mined,.

For "he trsnsver se mode tests only, an additional,channel monitored the Bay A r.atria power supply DC

output at a deflection factor of approximately2< vo 'ts per inch. This channel was for referenceonly vXth no failure c-.iterian est,ablistiea.

Each teat maintained the f'suit condition for five (5)minutes. At. the end of each t,est, the circa)t ~ock-up was tested and examined f'r damage resu}.t'ir>g f".onthe fault spph.feat ton < The failed par ts were re-corded, alonE uLth the nature of the sieur e, in theTest Record.

Zn summary, the acceptance cr iteria are:

I. Surge >Jithstand

A-.

B.

Ability of BTU s to maintain required trip-ping accuracy during surge (~10mV).Variation in unpulsed vit,al buss voltageduring surge less than +10'~16.96V).

II. Fault,

A.

B.

Ability of BTU's to attain and maintain trip-ped status in unfaulted. matrixes with trip-ping accuracy of +10mV.

Variation 'in vital buss voltage during faultless than +10~ (+16.96V) .

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4.0 SURGE WITHSTAND TEST RESULTS (See Photos, Appendix B)

4. 1 PULSED VITAL BUSS DATA (INPUT)

For each mode, that is, transverse, common-hot andcommon-neutral, peak line voltage was approximately200 volts and the transient peak voltage was greaterthan 150 volts over line peak voltage, thus exceedingthe minimum required input amplitude of 338 volts.

4.2 TEST RESULTS

4.2.1 Transverse Mode

The maximum observed variation in the unpulsed vitalbuss was 3.7V peak-to-peak around the line voltagepeak. This is within the defined limit of +10+ ofinstantaneous line voltage (+16.96 volts). The un-pulsed vital buss voltage was 120 Vrms or 170 voltspeak.

4.2.1.2 The input of the "A" matrix power supply was discon-nected from the unpulsed vital buss to eliminate lineattenuation of whatever surge was present. The same

acceptance criteria applies to the open circuit aswas applied to the normal configuration. This photo-graph is included in Appendix B.

4.2.1.3 For reference purposes on'y, a photograph of the "A"matrix relay coil voltage was also included in Appen-dix B. Variations greater than 28 volts peak-to-peak were observed.

4.2.1.4 Both BTU's tripped within +0.010mV of their unsurgedtripping voltages during the surge application.

4.2.2 Common Mode — Hot

4.2.2.1 The maximum observed variation in the unpulsed vitalbuss (matrix power supply AC-input), with the lineconnected or disconnected, was 5.1 volts peak-to-peak around the peak line vo'age, within the +10)limit (+16.96 volts).

4.2.2.2 The "A" matrix relay coil voltage had variations ofabout 18 volts peak-to-peak. This data is for refer-ence only.

4.2.2.3 Both BTU's tripped within +0.010mV of their unsurgedtripping voltages during the surge application.

4.2.3 Common Mode — Neutral

4.2.3. 1 The maximum variation in the unpulsed vital buss withthe line disconnected or normal was 3.8 volts peak-to-peak around the line voltage peak. This is withinthe allowed limit of +10~~ or +16.96 volts.

4.2.3.2 The "A" matrix relay coil voltage had var iations ofabout 18 volts peak-to-peak. This data is for refer-ence only;

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4.2.3.3 Both BTU's tripped within +0.010mV of their unsurged

tripping voltage during the surge application.

4.2.4 General

4.2.4. 1 Subsequent to all surge testing, the matrix mock-up

~ I 1

—.' ..-continued to function normally.. There was

dence of .component degradation or failure.r ~

no evi-

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5.0 FAULT TEST RESULTS

5.1 The fault voltage sour ce was ver ified prior to test.by applying known load resistors and measuring theoutput voltages to be 628 VAC rms and 022 VDC, eachat 50 amperes.

5.2 TEST RESULTS

5.2.1 Transverse Mode — 600 UAC

5.2. 1..7 .During the five (5) minute duration of the fault', no

deviation of the "A" vital .buss was observed.Approximately halfway through'he fault, the BTU'swere tripped by increasing their signal levels. The

recorder charts indicated that the matrix contactsnot associated with the faulted matrix did indeed at-tain and maintain tripped status thru the remainderof the test. The BTU's tripped within their requiredaccuracy.

H

5.2.1.2 Subsequent to the test, the circuit mock-up was in-spected for damages. The following defective com-

ponents were found (refer to Figure 1, Appendix A,for component designations):

b.

Fuses F6, F8, F13, F15 and F21 opened, as istheir .function, to isolate the ~ ault.

'I

On the "A" matrix relay card, the series 'nputresistor failed open and th relay coil sup-pression diode failed short.

5. 2. 2 Transver se Mode — +400 VDC

5.2.2. 1 As for the 600 VAC test, no deviation of the vitalbuss voltage was observed. Both BTU's tripped theirunfaulted matrix*contacts within rated accuracy.

5.2.2.2 The following damage was found:

a. Fuses F8, F13 and F15 opened.b. The "A" matrix relay .card input resistor opened.

5.2.3. Transverse Mode — -400 VDC

5.2.3.1 There was no deviation of the vital buss — both BTU'ssuccessfully tripped their unfaulted matrixes withinrequired accuracy.

5.2.3.2 The following damage was found:

a. Fuses F6, FS, F13, F15 and F20 opened.-b. The "A" matrix relay card input resistor opened.

5.2.4 Common Node Tests — 600 VAC and +400 VDC

5.2.4.1 With the fault applied either between the "A" matrixpower supply positive output to chassis or to thenegative ouptut to chassis, no discernable variationoccurred on the vital buss voltage.

5.2.4.2 For all tests, the unfaulted BTU matrix contacts at-tained and maintained tripped status with the re-quired accuracy.

5.2.4.3 There was no evidence of damage to any component as a

result of these tests.

6.O CONCLUSIONS

6.1 "The RPS matr ix circuits, as mocked-up, act to atten-uate transient surges applied to one of its vitalbuss inputs to values below the defined limits whenmeasured at another vital bus while maintaining fullrated accuracy of its safety monitoring function.

6.2 The RPS matrix circuit, as mocked-up, acts to isolatehigh level fault voltages from the vital busses whilemaintaining ability to sustain its safety function(tripped status) in unfaulted matrixes during anda ter fault application within„, full rated accuracy.

APPENDIX A

~I

ELECTRO-MECHANICS, INC.New Britain, Connecticut

Florida Power 6 LightSt. Lucie Unit II

F-

Reactor Protective System

MATRIX MOCK-UP FAULT ISOLATION

andSURGE WITHSTAND QUALIFICATION TEST PROCEDURE

Test Procedure TP 8021-1

~ C 0 ~

p 0Matrix Mock-Up Fault Isolation

ar.dSurge Nithstand Qualification Test Procedure

1.0 SCOPE

lt will be shown that before, dur ing and after a surge orfault application, the BTU in the RPS matrix mock-up willperform its required safety function (i.e. provide a tripactuation to unsurged/unfaulted matrices within requiredaccuracy).

1.1 To demonstrate the ability of the HPS. matrix circuit(Figure 1) to isolate 000 VDC and 600 VAC .aults,.applied as shown in Figure 2 .rom the remaining ma-

trices. The acceptance criteria is defined as: 1)

Ho disturbance of the redundant vital AC bus voltagegreater than +105 as monitored on an oscillographicrecorder, and 2) The ability of the unfaulted BTU r c-lays associated with the AC, AD, BC and BD matrixesto perform required safety functions (i.e., to openBTU bistable contacts) during and subsequent to thefault.

,1 ~ 2 To demonstrate the ability of the HPS matrix circuit(Figure 1) to operate normally (i.e., trip within. ated accur"cy) during and aft r application of a

transier.t surge as shown in Figur 3. Acceptancecriteria are: 1) The BTU operating on the vital,busbeing surge tested must trip within +10mU of its pre-test setpoint, and 2) the opposit vital bus voltagemus" not vary more than ~ 10$ at any insta'nt of time

Rev. BTP SG21- '1

Page 2 cont. on 3

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2.0 REFERENCES

. I CE C~cn r ac>,gc23008I /13172 (Including EPE-RFE-023)

2.2 EM Dwg. TE-273N (Fault Test Apparatus Schematic)

2 g EM Dwg. 834860, Rev. G (BTU A sembly)

~ \2.4 ZH 'Dwg. -8'34610,.1Rev..': C" (Matrix Relay Card Assemblv)

2

2.5 EM Dwg. 834705, No Rev. (Fault Prot. Trigger Cardassembly)

2.6 EM Dwg. 834707, Rev. C

Assembly)(Fault Component Brkt.

3.0 TEST EQUIPMENT (Record manufacturer, model/serial num-bers and calibration dates in Test"Record.)

3.1 TE-273N Fault Voltage Source (.400 VDC, 600 VAC)

3.2 Two (2) Honeywell Model 1858 Oscillographic Re-. orders with at least Six (6) Amplifier Modules

3.3 Velonex Type 510 Transient Surge Generator

3.4 Velonex Type V2538 Line Isolator

Rev'. ATP 8021-1Page 3 cont. on

pp3.5 Oscilloscope, Tekt,ronix Type 7633 with two (2) 7A15A

Ver tioal Plug-Ina and One (1) 7B53A Horizontal Plug-

3e6 Oscilloscope Camera, Tektr onix C51P with at leastEighteen (18) Exposures or equivalent

4.0 TEST SET-UP~ r

4.1 'Refer to Figure 1 for detailed mock-up schematic.

4.2 Test is to be pe. formed at normal room atmosphere.

4.3 Fault testing is to be performed with a.pparatus con-nected as shown in Figure 2.

Surge testing is o be performed with apparatus con-nected as shown in Figure 3.--

5. 0 SURGE TESTING

I

5.1 Energize the four (4) isolation transformers. Set. variable. autotransformer output to 132 VAC. Adjust

both BTU trip setpoints to +3.000 UDC (pretrips may

be +5 VDC). Increase the signal voltage to the"Bay A" BTU and record its tripping volt,age(+3.000+0.010 VDC). Leaving "A" tripped, trip "B" inthe same manner and record the voltage. Verify that

Rev. ATP 8021-1Page 4 cont. on 5

the UV relays have de-energized. Reset both signalto +2.500 VDC and reset the trip indicators. The U

relays..wil1...re-erergize.. Tripping of the BTU is-indicated when its trip status lamp just illuminates.

5.2 The scope is to be triggered in the "EXT" mode by th.Velonex 510 "EXT" trigger jack for all tests.

-- 5 ~ 3 TRANSVERSE YiODH * ~".':

5.3;1 Connect scope to terminals A and B as'hown in Fig.,ure' (Channel B simulated vital bus). Set, scope deflection to 100V/div., AC coupling, with a sweespeed of 5msec/div. Adjust trace position so thazero reference is, centered on the graticule.

-5.3..2 With the Velonex 510 Surge Generat,or -mplitude con....trol set to minimum, set the'imer to "Continuous"

mode to "Line", source impedance to " 100A" and phasto "90'". Mhile observing the scope waveform, incr ease.. the.. amplitude .control. of Xhe,.5.10. A transienwill appear at the positive line voltage peak. Conz,inue adjusting until the amplitude of this spikreaches 350 volts over zero reference. See r™igure 0-a for required waveform.'hotograph this tracfor inclusion in the Test Report.

Rev. ATP 8021-1Page 5 cont. on

5.3.3 Reset the scope sweep speed to lpsec/div. and photogr aph. Refer to Figure 4-b for r equired waveform.The peak-to-peak value "of spike should be greatethan 300V riding on the approximately 200V line volt-age peak.

5.3.4 Reconnect scope to terminals J and K as shown in Fig-ure 3. Take photographs of wavefcrm with scope sweepspeeds of 5ms/div. and 1psec/div. Required waveformsare shown in Figures 4-c and 4-d. The limit of thespike amplitude is to be less than + 16."96 volts rela-

"tive to the peak line voltage (~10$ of instantaneousline voltage).

5.3.5 Disconnect all circuits from terminals J and

the 28 VDC supply and tne scope. Photographat 1 volt/div. and 1psec/div. sweep speed.limits apply as for 5.3.4. See Figureexpec"ed results.'

exceptwaveformThe sam

4-e for

50306 Reconnect th circuits discornected in 5.3.5 and

connect scope. to terminals D and E from Figure 3.Photograph the waveform at 5 volt/div. and 1 or2psec/div. This is for reference only and no limitsapply. See Figure 4-f for expected results.

5.3.7 Repeat step 5.1 while surge is applied.

~~ g ~ o Discontinue the surge. Repeat step 5.1. Examine

IK

circuit components and list any that have failedalong with the nature of the .ailur e on remarkssheet.

Rev. 8TP 8021-1Page'6 con". on 7

'5. 4 COMMON MODE

.3leconfigure-the -test set-up for common mode — hotshown in Figure 3. Repeat 5.3. All limits and

pho'eferencesapply.

5.4~ Zeconfigure the test set-up for common mode —,neuteras shown an. Figure 3. Repeat 5..3. All limits a

photo ref'erin'ces -gply-.rr «~ « ~

6.0 FAULT TESTING

h

6.1 Using its internal test loads, verify the TE-273Nability to deliver 50 amps at 400 VDC and 600 VA

Record load voltage and current in Test, Record. R

reference recorder charts to demonstrate normwaveforms using test resistance with values and co

....nections as shown in Figure 2.

6.2 There are nine (9) fault tests-,to be performed.

6.2.1 Transverse Mode, 600 VAC, fault appl'ed to te.minaD and E in Figure 2, test 1-A.

6.2.2 Transverse Mode, +400 VDC, fault applied to termnals D and E in Figure 2, test 1-B.

Rev. ATP 6021-,1Page 7 cont. on 8

6.2.3 Transverse Mode, -400 VDC, fault applied to terminals D and E in Figure 2, test 1-C.

a

6.2.4 Common Mode, 600 VAC, fault applied to terminalsand G in Figure 2, test 2-A.

6.2Q Common Mode, +400 VDC, faultand G in Figure 2, test 2-B.

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6.2.6 Common Mode, -400 VDC, fault.and G in Figure 2, test 2-C.

applied to terminals

applied toterminals'.2.7

Common Mode, 600 VAC, fault applied to terminalsand G in Figure 2, test 3-A.

6.2.8'Common'ode, +400 VDC, fault applied to terminalsand G in Figure 2, test 3-B.

6.2..9 Common Mode, -400 VDC, fault applied to terminalsand G in Figure 2, test 3-C.

6.3 For each of the above tests,'he sequence will be a

. WoI'lows:.

6.3.1 Repeat step 5.1.

6.3.2 With recorder(s) running continuously, apply faulvoltage, maintaining for five (5) minutes.

Rev. ATP 8021-1Page 8 cont. on 9

6.3.3 Appr oximately 1/2 way thr u test, repeat 5.1.

6.3.4 After test, repeat 5.1.

6 .3.5 Examine all circuit components (fuses, relays,BTU's, P/S's, etc.). List each failed component and

the nature of the failure on the remarks sheet.

6.3.6 Replace any defective co...ponents prior to next testmode.

6.3.7 .The acceptance criteria are: 1) The BTU's must tripas indicated by Channels 4 and. 5 of Recorder !t1,2) There must be no greater than +10+ variation ofthe line voltage of vital bus A as indicated on Re-

corder ki1, Channel 3.

Rev. BTP 8021-1Page 9 cont. on l0

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Rev. ATP 8021-1Page 13 con

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APPENDIX B

ELECTRO-~!ECHANICS, INC.New Britain, Connecticut

Test Record TR 8021-1

~Q cr iption

Matrix Mock-Up Fault Isolationand Surge Withstand QualificationTest Procedure Part No 7q <'(n

TEST RECORD

1.0 R" CORDED DATA REQUIRED

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p s zz. l L/F s'0

~ TR S021-1Page 2 cont. on

~ 0 ~ ~

t

I '

TEST RECORD

, 1.0 RECORDED DATA REQUIRED

Record test equipment; model 'umber, serial number and

- - -- -"'-'-calibration-date(s). '---:"-~ ~ ~

rrr ~

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F 1 v P~ ~ gag

I

ec k~a

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TH 6021-1I

Page 2Acont. cn 3

~ ~

5.0 SURGE TESTlNGee

Data

- --Su~eHode

Transver se Common — Hot Common - Neut.

PretestTrip-A. Z.'I 5g

~retest:.trip 3

~ .+. s»

~>ip- A

TI ip

ScopeMaximumVariation(Tare. J 5 K)

3 oos-

2'%8C7, os

z.7 V C'-P~

-- Xd'o5

Z.'I '1 4

Z Oo+

a (

v'-F''.oo+

Z. ClZZ.oo/-

Z8 v P-P

UV RelaysTripped (?) Yej

Post TestTrip A

- Z<S5Post, Test

~: - -~ r1-gi=d=— 2, 0'Dp

Acceptance Criteria: 1) The STU. operating on the vital busbeing surged must trip within ~10mV of its pretest setpoint,and 2) the oppo'site vi.tal bus voltage must not vary mor e than«10+ at any instant from normal voltage at that instant,

and')

UV relays must drqp out when both BTU's trip.

NOTE: Photographs aod recorder char ts become part of Test Re-cord. Annotate each with TP 8021-1 and the individualtest description along with deflection factors, sweep

speed, date and initials .. Note the maximum anomaly.

Rev. ATR 8021-1Page 3 cont. on 4

0 ~

6.0 FAULT TESTING

Data

TestMode '-A 1-B 1-C 2-A 2-B 2-C 3-A 3-C

!Loaded FaultVoltage

Loaded Fault'- Cur rent

PretestTrip A

PretestTrip B

;> 'f'}7

Ix5'~58 I

I

>.Qcg 3.cog ~ 0(-"I

'

BTU ' Tr ip(Rec. 1,

, C}1. 4 E 5)

ActualA Tr i 4'.'1'f 7 ) ~., (

ActuaB Trip g.co5 3.~o

Z.'i'> Z"('{7

3..0c5

7 c~ c/ ~ '1 ( gg (p(.tta C1(( g ~ j(

I Recorder'hannel 3I Variation,! Maximum O 0 0

Post TestTrip A Z.'f'l7, Z 'I'.I a Cf&7

Post TestTrip B pOV'f > cd ),oc f <og ~ /OS >,Cop 5 c'o '(

Acceptance Criteria: 1) No d'turbance of the vital bus volt-age greater than +10+, and 2) the ability of'he BTJ's tomaintain trip condition (i.e., cpen bistable contacts) subse-quent to and during the fault (Channels 4 & 5, Recorder b 1)

within required accuracy, +0.010 v 'its of "retest se"point.

Rev. BTR o021-1Page 4 cont. on 5

s ee7.0 REMARKS AND REVXSIOVS (Make as many copies as required.)

,es+ ~S+ ew. I yW:s.--- "—

z,l F s e se Nolle peso >Ac (~s4 H)Fd F8'(3 Ft5. „3, F'z)

'L+ ~ I D "~ hg.- '-~X„".'.C„„th.==~(q~. Zqg(P--y/P Q.Zygo. CR.t S4=rQ, Wh ~'

~ ~ ~ ~ e ~'""~<essePe.die„'ko Qg" "'j'~ j:-'~'-'):--——- "——s

F 8' (3 .~„g F (5 0g„~gee ss

I. 8 W.+.:y re(,y c.,J, p,t ~,„,g

Sssse f'sL'e(> Qps. P~ g ( C)

~. FG„F'8' ls F.(>- „„„tI Fzgse

b."A'" Q.Ar,'V ge(~f ckr'Kg Pl Qjgwpt'.4

:~as Cj k.lg;,~.:g„1'~ QSg',;„,

~ --.Pde~4r"y P$ . g „g ge

."P 4-

~> "~, F~~ -8. Fir-= K Lm-9FzoVz I = F wq-ro

II/

~ w ~.;~ 4(.,c,J-- Ri = pc-i-k-Y-ew-cL.=A I+I=

TR 8021-1Page 5 cont. on 6

taala

l

+VV~V

V

Pho gl~Test Mode: Transverse SurgeTerminals Monitored: A 6 BSurge Applied: Term. A & B

'Peak Line Voltage: 200VPeak Surge Voltage: 350VZero Ref.: Center of Graticul

Ref.: TP 8021-1, Fig. 4-a

Photo,",2Test Mode: Transverse SurgeTerminals Monitored: A u BSurge Applied: Term. A 6 BPeak Line Voltage: 200VPeak Surge Voltage: 350VZero Ref.: Center of Graticule

Ref.: TP 8021-1, Fig. 4-b

a

~W+QVT~~v , „l

@KRAK,VZ%PEJECT.'K5KF NE

Photo t3Test Mode: Transverse SurgeTerminals Monitored: J & KSurge Applied: Term. A 6 BPeak Line Voltage: Approx.

1'eakSurge Voltage: Less tha~3.7V (Ovli

Zero Ref.: Center ofGraticu,'ef.:

TP 8021-1, Fig. 4-c

TR 8021-1Page '6 cont. on

~ OPhoto jP4

Test Mode: Transverse Su geTerminals Monitored J 6 KSurge Applied: Term. A 6 BPeak Line Voltage: Approx.

170VPeak Surge Voltage: Less, than

3.7V(Over line

Zero Ref.: Center of Grati'cul

M

=R<='" TP 8021-1, Fig. 4-d

Photo jj5Test Mode: Transverse SurgeTerminals Monitored: J 6 K

(With transformers aridBTU power supply dis-connected)

Surge Applied: Term. A 6 BPeak Line Voltage: 0 (Line

disconnected)Peak Surge Voltage: Less'han

3.7V

~f.: - TP 8021-1, Fig. 4-e

EWE .

RRE

m%m.vmv

IISR

Photo g6Test, Mode: Transverse SurgeTerminals Monitored: E 6 DSurge Applied: Term. A 6 BBase Voltage: 28 VDC (Matrix

coil)Surge Voltage: 29.5 Volts

—Z'er~ef.: Center of-Grat4eule(AC Coupling)

Ref.: TP 8021-1, Fig. 4-fTR 8021-1Page 7 cont. o

--- t 'R

~,

Photo g7Test Mode: Common, Surge, "Hot"Terminals Monitored: A 6 B

Surge Applied: Term. A 6 CPeak Line Voltage: 200VPeak Surge Voltage: 350VZero Ref.: Center of Graticule

Ref.: TP 8021-1", Fig. 4-a

~ ~

Photo gj8

Tes t Mode: Common, Sux ge, "Hot"Terminals Monitored: A 6 BSurge Applied: Term. A 6 C

Peak Line Voltage: 200UPeak Surge Voltage: 350VZero Ref.: Center of Graticule

Re f.: TP 8021-1, Fig. 4-b

~i@KRBf~-

Photo g9

Test Mode: Common, Surge, "HTerminals Monitored: J & KSurge Applied: Term. A 6 C

Pea%,'.'I.ine Voltage: 170V.Zeal Surge Voltape: 4.. ~V.

(Overline)Zero Ref.: Center of Grat cu

Ref .: TP 8021-1, Fig. 4-c

TR 8021-1Page 8 cont ~ on

~ ~ ~ ~ P

~ I

'Photo. $10

Test Mode: Common, Surge,"Hot'erminalsMonitored: J 6 K

Surge'Applied: Term. A & CPeak Line Voltage: 170 VoltsPeak Surge Voltage: 5.1 Volts

(Qverline)Zero Ref.: Center of Graticule

Ref.: TP 8021-1, Fig. 4-d

Photo jjllTest Mode: Common, Surge, "Hot"Terminals Monitored: J 6 K

(Pith transformers andBTU P/S disconnected)

Surge Applied: Term. A 6 C'eakLine Voltage: 0 (Line

disconnected)Peak Surge Voltage: 5.1 VoltsZero Ref.: Center of Graticule

Ref.„- TP 8021-1, Fig..h-e

Photo,'j12Test.Hode: Common, Surge, "HotTerminals Monitored: E 6 DSuz~Mpp lied': Terms..'~~~.ZBa's'e'oltage: 28 VDC (KaTrxx.—-Mo~)Peak Surge Voltag'e: 18 VoltsZero Ref.: Center of Graticule

(AC Coupling)Ref.: TP 8021-1, Fig. 4-f

I

TR 8021-1Page 9 cont. on 10

»

RBF.Egg

Ih* ~ggg%3@ %63Q=. ~

0 y""Photo- $13r'est Mode: Common, Surge, "ScutTerminals Monitored: A 6 BSurge Applied: Term. B & CPeak Line Voltage: 200 VoltsPeak Surge Voltage: 350 VoltsZero Ref.: Center of Graticule

«pygmy,'RMQE 32BBg "

Q@mm

Ref.: TP 8021-1, Fig. 4-a

TP 8021-1, Fig. 4-a

13

Photo f14Test Mode: Common, Surge„ '2leut"Terminals Monitored: A 6 BSurge Applied: Term. B-.& CPe'ak.Line Voltage:'200'VoltsPeak Surge Voltage: 350 VoltsZero Ref.: Center of Graticule

Ref.: TP 8021-1, Fig. 4-b

~ . Tr r

TP 8021-1, -Fig. 4-b IRI »»

'..~ERKEF. '.

RKE'~EgRR,

28EE.- Q~ ox

Pho to,"j15

Test Mode: Common, Surge, "HTerminals Monitored: J & KSurge Applied: B &, CPeak Line Voltage: 170 VoltsBpak,Surge Voltage:--~ Vol.ts

(Overline)ZermRef.: Center o --Gr"~uRef.: TP 8021-1, Fig. 4-c

TR 8021-1Page 10 cont. on 11

~ ~ 0 4

gg~RRS

Photo jj16Test Mode: Common, Surge,

"Neut'erminalsMonitored: J 6 KSurge Applied: B 6 CPeak Line Voltage: 170 Volts .

Peak Surge Voltage: 3.8 Volts(Overline)

Zero Ref.: Center of Graticulel

Ref.: TP 8021-1, Fig.. 4-d

Photo $ 17

Test Mode: Common, Surge, "Neut"Terminals Monitored: J 6 K

(With transformers and BTUP/S disconnected)

Surge Applied: Term. B 6 CZaak Line Voltage.

(Line Dis'conne~~~Beak. Surge.. Voltaze-Zero Ref .: Center of Graticule

Ref.: TP 8021-1,. Fig. 4-e

EkSRRRRRRR

IJhZR83EQREERH

GSEEBKBEHKfE

flIII

fl%5kl

HINEGR3ESBEQQEEHESSE3EHHHER

IPIHEBBNHBEHBII .

'flFSiYY.F.P~~~) gt)~QQ@Q~ggg~BEfRCtRRBHE553ERIM

Pho to j,'18Test Node: Common, Surge,

"Neut'TerminalsMonitored: E 6 DSurge Applied: Term. B 6 C

Base Voltage: 28 VDC (Matrix~il;Peak Surge Voltage: 19 VoltsZero Ref.: Center oZ Graticu

(AC Coupling)

Ref.: TP 8021-1, Fig. 4-f

TR 8021-1Page'l cont. on

~ '0

~C