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CHARACTERIZATION OF POLYCRYSTALLINE MATERIALS AND
TEXTURE ANALYSIS SERVICE REQUEST FORM
Dr. Cristóbal Verdugo Escamilla Factoría de Cristalización
Avenida de Las Palmeras, nº4 18100 Armilla ‐ Granada (Spain)
Phone: +34 958230000; Ext. 190009 Fax: +34 958552620
[email protected] http://lafactoria.lec.csic.es
Equipment: Two Panalytical diffractometers: X’Pert Pro MPD (Multi Purpose Diffractometer) with programmable slits in transmission and reflection modes. A Materials Research Diffractometer (MRD) especially adapted for thin films, single crystal multilayer diffraction and textural analysis.
USER INFORMATION
NAME: TITLE:
E‐MAIL: TEL.:
DATE (DD/MM/YYYY): FAX:
DEPARTMENT: INTERNAL ID NUMBER:
COMPANY/INSTITUTION: (To be filled by La Factoría de Cristalización)
SAMPLE INFORMATION
SAMPLE ID*: NUMBER OF SAMPLES:
*(if you send more than one sample, please fill in the table in the next page)
CHEMICAL COMPOSITION (if known):
TWO THETA RANGE: (FROM: TO: )
STEP SIZE (°):
SCAN RATE (°/min):
REFLECTIONS TO STUDY (only for the case of texture analysis) :
SAFETY AND HANDLING RISKS (toxic, corrosive, irritating,…):
DOES IT NEED PROTECTION? : MSDS AVAILABLE? : RETRIEVE THE SAMPLE? :
CHARACTERIZATION OF POLYCRYSTALLINE MATERIALS
NAME DESCRIPTION CHOOSE
SAMPLE PREPARATION
For Reflection measurements
For Transmission measurements
For Grazing angle measurements
DIFFRACTOGRAM DATA COLLECTION Data collection only
GRAZING ANGLE MEASUREMENT Small angle measurement only
QUALITATIVE ANALYSIS Interpretation of data and phase identification
QUANTITATIVE ANALYSIS Composition analysis by the Rietveld method
SIZE‐STRAIN ANALYSIS Domain crystal size and strain
TEXTURE CHARACTERIZATION
NAME DESCRIPTION CHOOSE
TEXTURE MEASUREMENT Sample preparation and data collection
RESIDUAL STRESS MEASUREMENT Sample preparation and data collection
LIST OF SAMPLES
Nº SAMPLE ID INTERNAL SAMPLE ID
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