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1 Evaluation of XRF Spectra from basics to advanced systems Joint ICTP-IAEA School on Novel Experimental Methodologies for Synchrotron Radiation Applications in Nano-science and Environmental Monitoring Piet Van Espen [email protected] 20 Nov 2014

Evaluation of XRF Spectraindico.ictp.it/event/a13226/session/3/contribution/58/... · 2014. 11. 26. · Resolution of ED-XRF spectrometers Full Width at Half Maximum (FWHM) of a peak

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  • 1

    Evaluation of XRF Spectra

    from basics to advanced systems

    Joint ICTP-IAEA School on Novel Experimental Methodologies for Synchrotron Radiation Applications in Nano-science and Environmental Monitoring

    Piet Van Espen [email protected]

    20 Nov 2014

    mailto:[email protected]

  • 2

    Content

    1. Introduction: some concepts

    2. Simple peak integration

    3. Method of least squares

    4. Fitting of x-ray spectra

    5. Improvements to the model

    6. Final remarks

  • 3

    Some basic concepts

    Nature and science: a personal view

    Nature = Signal + Noise

    Science = Model + Statistics

  • 4 4

    Why spectrum evaluation?

    element concentrations ⇔ net intensity of fluorescence lines

    But: frequent peak overlap presence of a continuum

    Especially in energy-dispersive spectra

    interference free continuum corrected

  • 5

    Spectrum contains • Information: energy and intensity of x-rays 


    • Amplitude noise: due to Poisson statistics 
► fluctuations in the spectrum 


    • Energy noise: finite resolution of the detector ► nearly Gaussian peaks with a width of ~160 eV

    Information content of a spectrum

    the signal

    the noise

  • 6

    Amplitude noise Counting events involves Poisson statistics

    Poisson probability density function:

    The probability to observe N counts if the true number is µ

    Poisson : P(N | µ=3) Normal : P(x | µ=3 σ2 = 3)

    Property:

    Poisson distribution µ ≅

    Normal distribution µ and σ2 = µ

    approximation is very good for µ (or N) ≥ 9

  • 7

    Resolution of ED-XRF spectrometers

    Full Width at Half Maximum (FWHM) of a peak

    Mn Kα @ 5.895 keV FWHMDet = 120 eV FWHMElec = 100 eV => FWHMPeak = 156 eV

    Intrinsic contribution2 Spectrum analysis

    2.35⇥

    �� F � E (9)

    FWHM2Peak = FWHM2Elec + Det

    2Pealk (10)

    2

    ϵ energy to create e-h pair 3.85 eV F Fano factor ~0.114 E x-ray energy in eV

    2 Spectrum analysis

    2.35⇥

    �� F � E (9)

    FWHM2Peak = FWHM2Elec + FWHM

    2Det (10)

    2

    Electronic noise ~100 eV

    Energy Noise

  • 8

    Cr – Mn – Fe overlap at ~20 eV Cr – Mn – Fe overlap at ~160 eV

    Resolution of ED-XRF spectrometers Energy Noise

  • 9

    Without amplitude noise (counting statistics) there would be NO PROBLEM

    But it is part of the nature We can only measure longer or with a more efficient system

    Without energy noise there would be LITTLE PROBLEM

    The natural line width of x-rays is only a few eV!!!

    The observed peak width is the result of the detection process with a fundamental limitation imposed by the Fano factor

  • 10 10

    Information content of a spectrum

    If no energy noise or no amplitude noise ► could determine the “information” unambiguously

    Need methods to extract information in a optimum way These methods rely on “addition” information (knowledge) 
to extract the useful information

    Not the method itself is important (if implemented correctly) 
but the correctness of the additional information.

  • 11

    2. Simple peak integration

  • 12

    Simple peak integration

    Estimate

    Uncertainty

    We have to make assumptions integration limits linear background no interference

    As good as is can get if the assumptions (model) are correct!

  • 13

    3. Method of Least Squares

  • 14

    Need to “estimate” the net peak area with highest possible • correctness (no systematic error) • precision (smallest random error)

    Least-squares estimation (fitting): • unbiased • minimum variance

    Limiting factors: • counting statistical fluctuations (precision) • accuracy of the fitting model

    Method of least squares

  • 15

    Method of least squares, straight line

    2 Spectrum analysis

    2.35p

    �⇥ F ⇥ E (9)

    FWHM2Peak = FWHM2Elec + FWHM

    2Det (10)

    SS =X

    i

    [yi � y(i)]2 =X

    i

    [yi � b0 � b1xi]2 = min (11)

    ⇤SS

    ⇤b0= 0 !

    X

    i

    yi = b0n + b1X

    i

    xi (12)

    ⇤SS

    ⇤b1= 0 !

    X

    i

    xiyi = b0X

    xi + b1X

    i

    x2i (13)

    2

    2 Spectrum analysis

    2.35p

    �⇥ F ⇥ E (9)

    FWHM2Peak = FWHM2Elec + FWHM

    2Det (10)

    SS =X

    i

    [yi � y(i)]2 =X

    i

    [yi � b0 � b1xi]2 = min (11)

    ⇤SS

    ⇤b0= 0 !

    X

    i

    yi = b0n + b1X

    i

    xi (12)

    ⇤SS

    ⇤b1= 0 !

    X

    i

    xiyi = b0X

    xi + b1X

    i

    x2i (13)

    2

    Set of 2 equations in 2 unknowns b0 and b1 Normal equations

    Direct analytical solution

    Data: {xi,yi}, i=1, 2, …, N

    Model: y(i) = b0 + b1xi

    Fitting the model: estimating b0 and b1

    Criterion:

    noise

  • 16

    4. Fitting X-ray Spectra

  • 17

    Least-squares estimate of x-ray spectrum parameters

    Peak described by a Gaussian

    Minimum: No direct analytical solution Search χ2 for minimum

    2

    =

    1

    n2X

    i=n1

    1

    wi[y(i)� yi]2 (1)

    y(i) = y

    Cont

    (i) +

    X

    j

    Aj

    "X

    k

    RijP (i, Eij)

    #(2)

    P = G(i, Ejk) =Gain

    �jk

    p2⇡

    exp

    "�1

    2

    ✓E(i)� Ejk

    �jk

    ◆2

    #(3)

    E(i) = Zero + Gain⇥ i (4)

    �jk =

    "✓Noise

    2

    p2 ln 2

    ◆2

    + ✏ Fano Ejk

    #1/2

    (5)

    T (i, Ejk) =Gain

    2�� exp

    h� 1

    2�2

    iexp

    E(i)� Ejk

    ��

    �erfc

    E(i)� Ejk

    p2

    +

    1p2�

    S(i, Ejk) =Gain

    2Ejkerfc

    E(i)� Ejk

    p2

    P (i, Ejk) = G(i, Ejk) + fSS(i, Ejk) + fT T (i, Ejk) (6)

    fS(Ejk) = µDet(Ejk) (a0 + a1Ejk)

    fTK↵(Ejk) = b0 + b1µDet(Ejk)

    fTK�(Ejk) = c0 + c1µDet(Ejk)

    �(Ejk) = d0 + d1Ejk

    Gain

    �jk

    p2⇡

    K

    E(i)� Ejk

    �jk

    p2

    ,

    ↵L

    2�jk

    p2

    !

    K(x, y) = Re

    ⇥exp(�z2)erfc(�iz)

    ⇤z = x + iy (7)

    1

    y(i) = b + A

    1

    p2⇡

    exp

    (xi � xp)2

    2�

    2

    1

    position

    width

    area

    continuum

    Criterion, agreement between model and data

    linear parameter

    non-linear

  • 18

    We can still apply the concept of least squares minimising the square of the differences between the model and the data

    The sum of squares is a function of the values of the parameters and for a given set of values should be minimum

    In this case SS describes a 4 dimensional hyper-surface in a 5-dimension space

    h

    We can only “see” in 3-dimensions but mathematically we can search in a higher dimensional space to locate the minimum

    Starting from some initial values we can modify the parameter values until the minimum is reached.

    2 = �2(b, h, x0, w) =1⌫

    Pi

    1yi

    [yi � y(xi, b, h, x0, w)]2

    w

  • 19

    General form of such a search algorithm

    1. Select starting values for all parameters bj and calculate the ch-square

    2. Obtain (calculate, guess...) a change (increment or decrement) Δbj such that one moves towards the minimum:

    3. Replace the old parameter values with the new ones 
 b ← b + Δb

    4. repeat step 2 until the “true” minimum is found

    Iterative process

    AXIL = Analysis of X-ray spectra by Iterative Least-squares

    � = �(b)

    �(b+�b) < �(b)

  • 20

    Analytically important parameters: net peak areas

    In general y(i) is non-linear → Marquardt – Leverberg algorithm Gradient search ↔ linearisation Reliable error estimated But unstable

    Statistical optimal estimate: using correct weight (Poisson statistics wi = yi)

    2

    =

    1

    n2X

    i=n1

    1

    wi[y(i)� yi]2 (1)

    y(i) = y

    Cont

    (i) +

    X

    j

    Aj

    "X

    k

    RijP (i, Eij)

    #(2)

    P = G(i, Ejk) =Gain

    �jk

    p2⇡

    exp

    "�1

    2

    ✓E(i)� Ejk

    �jk

    ◆2

    #(3)

    E(i) = Zero + Gain⇥ i (4)

    �jk =

    "✓Noise

    2

    p2 ln 2

    ◆2

    + ✏ Fano Ejk

    #1/2

    (5)

    T (i, Ejk) =Gain

    2�� exp

    h� 1

    2�2

    iexp

    E(i)� Ejk

    ��

    �erfc

    E(i)� Ejk

    p2

    +

    1p2�

    S(i, Ejk) =Gain

    2Ejkerfc

    E(i)� Ejk

    p2

    P (i, Ejk) = G(i, Ejk) + fSS(i, Ejk) + fT T (i, Ejk) (6)

    fS(Ejk) = µDet(Ejk) (a0 + a1Ejk)

    fTK↵(Ejk) = b0 + b1µDet(Ejk)

    fTK�(Ejk) = c0 + c1µDet(Ejk)

    �(Ejk) = d0 + d1Ejk

    Gain

    �jk

    p2⇡

    K

    E(i)� Ejk

    �jk

    p2

    ,

    ↵L

    2�jk

    p2

    !

    K(x, y) = Re

    ⇥exp(�z2)erfc(�iz)

    ⇤z = x + iy (7)

    1

  • 21

    10 peaks ⇒ > 30 parameters !!!! WANT WORK in practice!!!!

    But we can do better

    ⇒ Add additional information to the model

    We known the energies of the x-ray lines (in most cases) Where they are depends on the energy calibration (the same applies to the width of the peaks: resolution calibration)

    y(i) = b + A

    1

    p2⇡

    exp

    (xi � xp)2

    2�

    2

    G(i, E) =

    Gain

    �(E)

    p2⇡

    exp

    (Ei � E)2

    2�

    2(E)

    1

    Gaussian peak shape

    Energy relation:

    Resolution relation:

    y(i) = b + A

    1

    p2⇡

    exp

    (xi � xp)2

    2�

    2

    G(i, E) =

    Gain

    �(E)

    p2⇡

    exp

    (Ei � E(i))2

    2�

    2(E)

    E(i) = Zero + Gain⇥ i

    �(E) =

    "✓Noise

    2

    p2 ln 2

    ◆2+ ✏FanoE

    #1/2

    1

    y(i) = b + A

    1

    p2⇡

    exp

    (xi � xp)2

    2�

    2

    G(i, E) =

    Gain

    �(E)

    p2⇡

    exp

    (Ei � E(i))2

    2�

    2(E)

    E(i) = Zero + Gain⇥ i

    �(E) =

    "✓Noise

    2

    p2 ln 2

    ◆2+ ✏FanoE

    #1/2

    1

    Only 4 non-linear parameters For 10 peaks only 14 parameters

    Need parsimony!!!

  • 22

    Already better, but we know more

    We know (to some extend) the ratio between lines of an element

    y(i) = b + A

    1

    p2⇡

    exp

    (xi � xp)2

    2�

    2

    G(i, E) =

    Gain

    �(E)

    p2⇡

    exp

    (Ei � E(i))2

    2�

    2(E)

    E(i) = Zero + Gain⇥ i

    �(E) =

    "✓Noise

    2

    p2 ln 2

    ◆2+ ✏FanoE

    #1/2

    IK↵2

    IK↵1,

    IK�

    IK↵. . .

    1

    We can group lines together (“peakgroup”) with one “area” and fixed intensity ratios

    Continuum function

    Area Line ratio

    Peak shape

    for j elements (or peak groups)

    y(i) = b + A

    1

    p2⇡

    exp

    (xi � xp)2

    2�

    2

    G(i, E) =

    Gain

    �(E)

    p2⇡

    exp

    (Ei � E(i))2

    2�

    2

    (E)

    E(i) = Zero + Gain⇥ i

    �(E) =

    "✓Noise

    2

    p2 ln 2

    ◆2

    + ✏FanoE

    #1/2

    IK↵2

    IK↵1,

    IK�

    IK↵. . .

    y(i) = y

    Cont

    (i) +

    X

    j

    Aj

    (X

    k

    RjkP (i, Ejk)

    )

    1

    10 elements ⇒ 10 Area’s + 4 calibration parameters

  • 23

    Further refinements: escape peaks Known position (energy) intensity (escape probability)

  • 24

    Sum peaks Known position relative intensity

  • 25

    And more Different background models polynomial exponential polynomial Bremsstrahlung background filter background

    Parameter constraining

    and more...

  • 26

  • 27

    Highly flexible method • Fit individual lines, multiplets, elements… • Different parametric and non-parametric continuum models • Include escape and sum peaks

    Quality criteria • Chi-square of fit • uncertainty estimate of parameters

    Statistically correct • unbiased, minimum variance estimate of the parameters

    “Resolving power” is only limited by the noise (counting statistic) BUT

    THE MODEL MUST BE ACCURATE

  • 28

    5. Improvements to the model

  • 29

    Incorrectness of the model

    Not all peaks follow the energy calibration relation - incoherent (Compton) scatter peaks - spurious peaks (diffraction, γ-rays) - even the relation might not be linear

    Not all peaks follow the resolution calibration relation - incoherent scatter peaks (are wider) - spurious peaks

    Peaks are certainly not perfect Gaussians - shelf (step) due to detector effects (incomplete charge collection) - tailing due to radiative effects and detector effects - deviation due to natural line width (Lorentzian)

  • 30

    Incorrect fitting model biased results

    Solution Adapt the model 
(fitting region, which lines to include...) 


    for each particular case

    Very inconvenient 
when analyzing many spectra

    especially for trace elements

  • 31

    Step

    y(i) = y

    Cont

    (i) +

    X

    j

    Aj

    "X

    k

    RijP (i, Eij)

    #(1)

    P = G(i, Ejk) =Gain

    �jk

    p2⇡

    exp

    "�1

    2

    ✓E(i)� Ejk

    �jk

    ◆2

    #(2)

    E(i) = Zero + Gain⇥ i (3)

    �jk =

    "✓Noise

    2

    p2 ln 2

    ◆2

    + ✏ Fano Ejk

    #1/2

    (4)

    T (i, Ejk) =Gain

    2�� exp

    h� 1

    2�2

    iexp

    E(i)� Ejk

    ��

    �erfc

    E(i)� Ejk

    p2

    +

    1p2�

    S(i, Ejk) =Gain

    2Ejkerfc

    E(i)� Ejk

    p2

    1

    Peak

    y(i) = y

    Cont

    (i) +

    X

    j

    Aj

    "X

    k

    RijP (i, Eij)

    #(1)

    P = G(i, Ejk) =Gain

    �jk

    p2⇡

    exp

    "�1

    2

    ✓E(i)� Ejk

    �jk

    ◆2

    #(2)

    E(i) = Zero + Gain⇥ i (3)

    �jk =

    "✓Noise

    2

    p2 ln 2

    ◆2

    + ✏ Fano Ejk

    #1/2

    (4)

    T (i, Ejk) =Gain

    2�� exp

    h� 1

    2�2

    iexp

    E(i)� Ejk

    ��

    �erfc

    E(i)� Ejk

    p2

    +

    1p2�

    S(i, Ejk) =Gain

    2Ejkerfc

    E(i)� Ejk

    p2

    P (i, Ejk) = G(i, Ejk) + fSS(i, Ejk) + fT T (i, Ejk) (5)

    1

    Adding 1 non-linear and 2 linear parameters

    for each peak!!!

    Tail

    y(i) = y

    Cont

    (i) +

    X

    j

    Aj

    "X

    k

    RijP (i, Eij)

    #(1)

    P = G(i, Ejk) =Gain

    �jk

    p2⇡

    exp

    "�1

    2

    ✓E(i)� Ejk

    �jk

    ◆2

    #(2)

    E(i) = Zero + Gain⇥ i (3)

    �jk =

    "✓Noise

    2

    p2 ln 2

    ◆2

    + ✏ Fano Ejk

    #1/2

    (4)

    T (i, Ejk) =Gain

    2�� exp

    h� 1

    2�2

    iexp

    E(i)� Ejk

    ��

    �erfc

    E(i)� Ejk

    p2

    +

    1p2�

    S(i, Ejk) =Gain

    2Ejkerfc

    E(i)� Ejk

    p2

    P (i, Ejk) = G(i, Ejk) + fSS(i, Ejk) + fT T (i, Ejk) (5)

    1

    Improve the peak profile

    Where is my parsimony gone!!!

    Improvements

  • 32

    Step parameterisation

    Step is a fundamental aspect of the detector 
(charge loss by photo-electrons near the surface of the detector)

    Step fraction fS is related to the MAC of the detector crystal

    Tail fraction parameterisation

    Tail fraction fT is related to the MAC of the detector and the type of radiation (Kα and Kβ)

    The tail has a component due to the detector and a radiative component

  • 33

    Tail width parameterisation

    similar magnitude over the entire energy range

    y(i) = y

    Cont

    (i) +

    X

    j

    Aj

    "X

    k

    RijP (i, Eij)

    #(1)

    P = G(i, Ejk) =Gain

    �jk

    p2⇡

    exp

    "�1

    2

    ✓E(i)� Ejk

    �jk

    ◆2

    #(2)

    E(i) = Zero + Gain⇥ i (3)

    �jk =

    "✓Noise

    2

    p2 ln 2

    ◆2

    + ✏ Fano Ejk

    #1/2

    (4)

    T (i, Ejk) =Gain

    2�� exp

    h� 1

    2�2

    iexp

    E(i)� Ejk

    ��

    �erfc

    E(i)� Ejk

    p2

    +

    1p2�

    S(i, Ejk) =Gain

    2Ejkerfc

    E(i)� Ejk

    p2

    P (i, Ejk) = G(i, Ejk) + fSS(i, Ejk) + fT T (i, Ejk) (5)

    fS(Ejk) = µDet(Ejk) (a0 + a1Ejk)

    fTK↵(Ejk) = b0 + b1µDet(Ejk)

    fTK�(Ejk) = c0 + c1µDet(Ejk)

    �(Ejk) = d0 + d1Ejk

    1

    (compare to Zero, Gain, Noise and Fano)

    ⇒ Fitting parameters a0, a1, b0, b1, c0, c1, d0, d1

  • 34

    improvementFit of a NIST SRM 1106 Brass spectrum (SpecTrace 5000, Rh tube)

  • 35

    To account for peak shift and peak broadening

    Need to make the peak profile still a bit more complicated

    y(i)

    =

    b +A

    1

    p2⇡

    exp

    (xi � xp)2

    2�

    2

    G(i

    , E) =

    Gai

    n

    �(E

    )

    p2⇡

    exp

    (Ei � E(i))2

    2�

    2

    (E)

    E(i

    ) =

    Zer

    o +G

    ain⇥ i

    �(E

    ) =

    "✓N

    oise

    2

    p2 l

    n 2

    ◆2

    +✏F

    anoE

    #1/2

    IK↵2

    IK↵1,

    IK�

    IK↵. .

    .

    y(i)

    =

    y

    Cont

    (i) +

    X

    j

    Aj

    (X

    k

    RjkP (i, Ejk)

    )

    G(i

    , E) =

    Gai

    n

    ��(E

    )

    p2⇡

    exp

    (Ei � E(i) + �E)2

    2��

    2

    (E)

    �Eini ���E �E �Eini + ��E

    �ini ��� � �ini + ��

    1

    γ peak broadening parameter (normally 1.00)

    δE peak shift parameter (normally 0.00)

    These parameters are constrained to vary within a certain range

    y(i) = b + A

    1

    p2⇡

    exp

    (xi � xp)2

    2�

    2

    G(i, E) =

    Gain

    �(E)

    p2⇡

    exp

    (Ei � E(i))2

    2�

    2

    (E)

    E(i) = Zero + Gain⇥ i

    �(E) =

    "✓Noise

    2

    p2 ln 2

    ◆2

    + ✏FanoE

    #1/2

    IK↵2

    IK↵1,

    IK�

    IK↵. . .

    y(i) = y

    Cont

    (i) +

    X

    j

    Aj

    (X

    k

    RjkP (i, Ejk)

    )

    G(i, E) =

    Gain

    ��(E)

    p2⇡

    exp

    (Ei � E(i) + �E)2

    2��

    2

    (E)

    �Eini ���E �E �Eini + ��E

    �ini ��� � �ini + ��

    1

  • 36

    The last step

    Replace Gaussian with the convolution of a Gaussian with a Lorentzian = Voigt profile

    y(i) = y

    Cont

    (i) +

    X

    j

    Aj

    "X

    k

    RijP (i, Eij)

    #(1)

    P = G(i, Ejk) =Gain

    �jk

    p2⇡

    exp

    "�1

    2

    ✓E(i)� Ejk

    �jk

    ◆2

    #(2)

    E(i) = Zero + Gain⇥ i (3)

    �jk =

    "✓Noise

    2

    p2 ln 2

    ◆2

    + ✏ Fano Ejk

    #1/2

    (4)

    T (i, Ejk) =Gain

    2�� exp

    h� 1

    2�2

    iexp

    E(i)� Ejk

    ��

    �erfc

    E(i)� Ejk

    p2

    +

    1p2�

    S(i, Ejk) =Gain

    2Ejkerfc

    E(i)� Ejk

    p2

    P (i, Ejk) = G(i, Ejk) + fSS(i, Ejk) + fT T (i, Ejk) (5)

    fS(Ejk) = µDet(Ejk) (a0 + a1Ejk)

    fTK↵(Ejk) = b0 + b1µDet(Ejk)

    fTK�(Ejk) = c0 + c1µDet(Ejk)

    �(Ejk) = d0 + d1Ejk

    Gain

    �jk

    p2⇡

    K

    E(i)� Ejk

    �jk

    p2

    ,

    ↵L

    2�jk

    p2

    !

    1

    y(i) = y

    Cont

    (i) +

    X

    j

    Aj

    "X

    k

    RijP (i, Eij)

    #(1)

    P = G(i, Ejk) =Gain

    �jk

    p2⇡

    exp

    "�1

    2

    ✓E(i)� Ejk

    �jk

    ◆2

    #(2)

    E(i) = Zero + Gain⇥ i (3)

    �jk =

    "✓Noise

    2

    p2 ln 2

    ◆2

    + ✏ Fano Ejk

    #1/2

    (4)

    T (i, Ejk) =Gain

    2�� exp

    h� 1

    2�2

    iexp

    E(i)� Ejk

    ��

    �erfc

    E(i)� Ejk

    p2

    +

    1p2�

    S(i, Ejk) =Gain

    2Ejkerfc

    E(i)� Ejk

    p2

    P (i, Ejk) = G(i, Ejk) + fSS(i, Ejk) + fT T (i, Ejk) (5)

    fS(Ejk) = µDet(Ejk) (a0 + a1Ejk)

    fTK↵(Ejk) = b0 + b1µDet(Ejk)

    fTK�(Ejk) = c0 + c1µDet(Ejk)

    �(Ejk) = d0 + d1Ejk

    Gain

    �jk

    p2⇡

    K

    E(i)� Ejk

    �jk

    p2

    ,

    ↵L

    2�jk

    p2

    !

    K(x, y) = Re

    ⇥exp(�z2)erfc(�iz)

    ⇤z = x + iy (6)

    1

    with K(...) the complex error function

    For high Z elements the natural line width becomes substantial relative to the detector resolution

  • 37

    Natural line width at high Z elements becomes important e.g. W K ~ 50 eV

    Gaussians Voigts

  • 38

    Original fit of a geological standard (JG1)

  • 39

    Improved fit of the geological standard (JG1)

    Mo secondary target No background

  • 40

    NIST SRM 1155

  • 41

    NIST SRM 1247

  • 42

    More Details

    Handbook of X-ray Spectrometry R. Van Grieken, A. Markowicz Marcel Decker, N.Y. 2002 ISBN: 0-8247-0600-5

    Chapter 4: Spectrum Evaluation

  • 43

    Some final remarks: The future

    Non-linear least-squares works

    if you have a good parsimonious modelif you have TIME

    X-ray fluorescence imaging: 256 x 256 image = 65536 x-ray spectra

    @ 1 s / spectrum= 65536 seconds = 1092 minutes = 18 hours !!!!

    Need to explore new methods Linear models? Multivariate models?

  • 44

    6. Final remarks

  • 45

    Thanks for your attention