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EV76C771 2 Mpixels B&W and Color CMOS Image sensor e2vsemiconductors SAS 11/09/2014 FEATURES 2 million (1920 x 1080) pixels, 5.3 μm square pixels with shifted micro-lens Optical format 2/3” Aspect Ratio : 16/9 - Full HD 300 fps @ full resolution & 10 bits / 55fps@ full resolution&14 bits Output format true 8 / 10 / 12 / 14 bits LVDS and synchronization SPI controls Control input pins: Trigger In, Reset Light control output Trigger out 3.3 V and 1.8 V power supplies 80 MHz input clock Embedded functions: Image Statistics and Context output Sub-sampling (Vertical) Two PLL for LVDS and ADC frequencies generation Wide Dynamic Range capabilities Time to Read improvement (good first image, abort image) Timing modes: Global shutter in Serial and Overlap modes Rolling shutter and Global Reset modes PERFORMANCE CHARACTERISTICS High sensitivity at low light level Operating temperature [-30° to +65°C] Peak QE>60% AVAILABLESENSOR TYPES Monochrome Color (Bayer arrangement) APPLICATIONS Scientific imaging / Astronomy Surveillance and security cameras Industrial machine vision Biometrics/Medical Imaging Broadcast cameras 2D barcode scanners INTRODUCTION The EV76C771 is a 2 million pixels CMOS image sensor, Full HD resolution, designed with e2v's proprietary CMOS imaging technology. It is ideal for many different types of application where superior performance is required. The innovative pixel design offers excellent performance in low-light conditions with an electronic global shutter (true snapshot), and offers a high-readout speed at 60 fps in full resolution and 14bits.

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Page 1: EV76C771 2 Mpixels B&W and Color CMOS Image sensor

EV76C771 2 Mpixels B&W and Color CMOS Image sensor

e2vsemiconductors SAS 11/09/2014

FEATURES 2 million (1920 x 1080) pixels, 5.3 µm square pixels with shifted micro-lens

Optical format 2/3”

Aspect Ratio : 16/9 - Full HD

300 fps @ full resolution & 10 bits / 55fps@ full resolution&14 bits

Output format true 8 / 10 / 12 / 14 bits LVDS and synchronization

SPI controls

Control input pins: Trigger In, Reset

Light control output – Trigger out

3.3 V and 1.8 V power supplies

80 MHz input clock Embedded functions:

Image Statistics and Context output

Sub-sampling (Vertical)

Two PLL for LVDS and ADC frequencies generation

Wide Dynamic Range capabilities

Time to Read improvement (good first image, abort image) Timing modes:

Global shutter in Serial and Overlap modes

Rolling shutter and Global Reset modes

PERFORMANCE CHARACTERISTICS High sensitivity at low light level

Operating temperature [-30° to +65°C]

Peak QE>60%

AVAILABLESENSOR TYPES Monochrome

Color (Bayer arrangement)

APPLICATIONS Scientific imaging / Astronomy

Surveillance and security cameras

Industrial machine vision

Biometrics/Medical Imaging

Broadcast cameras

2D barcode scanners

INTRODUCTION The EV76C771 is a 2 million pixels CMOS image sensor, Full HD resolution, designed with e2v's proprietary CMOS imaging technology. It is ideal for many different types of application where superior performance is required. The innovative pixel design offers excellent performance in low-light conditions with an electronic global shutter (true snapshot), and offers a high-readout speed at 60 fps in full resolution and 14bits.

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1. TYPICAL PERFORMANCE DATA

Table 1: Typical electro-optical performances @ 25°C and 65°C, nominal pixel clock (80MHz)

Parameter(PRELIMINARY) Unit Typical Value

Sensor characteristics

Resolution pixels 1920 (H) x 1080 (V)

Image size mm inches

10.2 (H) x 5.7 (V) – 11.7 (diagonal) 2/3

Pixel size (square) µm² 5.3 x 5.3

Aspect ratio 16/9

Max frame rate fps 55 @ full resolution – 14 bits 300 @ full resolution – 10 bits

Pixel rate Mpixels / s 622 @10bits

Bit depth bits 8 – 10 – 12 - 14

Pixel performance

@ TA25°C @ TA65°C

Dynamic range dB >(1b)

> 76(1a)

Qsat / SNR max ke- / dB 18 / > 43 “

Readout Noise e- (ERS/GS/DDS) 3.5 / 18 / 7

MTF at Nyquist, =550 nm % 63

Dark signal(2)

LSB10 /s 5 e-/s 700 e-/s

DSNU(2)

LSB10 /s 15 e-/s 1500 e-/s

PRNU (3)

(RMS) % < 1

Responsivity (4)

LSB10 /(lux/s)

Electrical interface

Power supplies V 3.3 & 1.8

Power consumption : Functional

(5)

Standby

mW µW

<900 330

(1a): in electronic rolling shutter (ERS) mode (1b): in global shutter (GS) mode (2): min gain, 12 bits (3): measured @ Vsat/2, min gain (4): 3200K, window with AR coating, IR cutoff filter BG38 2 mm (5): @ 180 fps, 12bits, 2 ADCs & full format & with 10 pF on each output

Figure 1: EV76C771 Quantum efficiency

Quantum Efficiency - EV76C771

0.0%

10.0%

20.0%

30.0%

40.0%

50.0%

60.0%

70.0%

80.0%

400 450 500 550 600 650 700 750 800 850 900 950 1000 1050 1100

Wavelength (nm)

Q.E

. (%

)

Monochrome

Red

Green

Blue

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2. SENSOR OVERVIEW

The EV76C771 image sensor is divided in 2 sections, arranged symmetrically around the horizontal axis. Each-sub-section has individual and independent inputs and outputs. The active area is 1936 x 1096 pixels and the useful pixel area is 1920 x 1080 pixels. Figure 2: Block diagram

SCK

MISO

SEQUENCER

+

POWER

MANAGEMENT

MOSI

P

L

L

CLK_N

LVD

S

CLK_P

8 x LVDS_N

<5 :0>

8 x LVDS_P

<5 :0>

SYNC_N

SYNC_P

RESET

N TRIG_IN

CLK

SEQUENCER

+

POWER

MANAGEMENT

SPI

P

L

L

CS_T

CLK_N

LVDS

CLK_P

8 x LVDS_N

<5 :0> 8 x LVDS_P

<5 :0> SYNC_N

SYNC_P

14

CS_B

RESET

N

TRIG_IN

CLK

TRIG_OUT

RESET

N TRIG_IN

CLK

TRIG_OUT

MISO

MISO

MOSI

MOSI

SCK

SCK

TEST TEST

THERMO

THERMO

TEST TEST

PIXEL ARRAY

1920 x 540

PIXEL ARRAY

1920 x 540

SYNCHRO

PATTERN GEN

CLAMP

CDS

HDR

GAIN

HISTOS

CONTEXT

MULTPLEXER

SERIALIZER

SDATA

14

SYNCHRO

PATTERN GEN

CLAMP

CDS

HDR

GAIN

HISTOS

CONTEXT

MULTPLEXER

SERIALIZER

SPI

SDATA

ANALOG GAIN

ADC 8…14 BITS

ANALOG GAIN

ADC 8…14 BITS

LINE

DECODER

LINE

DECODER

LINE

DECODER

LINE

DECODER

PLL

PLL

TRIG_OUT

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3. APPLICATION INFORMATION

This paragraph gives the top view pinout, the pin list and the power supplies decoupling. Figure 3:Pinout Top View

TOP VIEW

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Table 2 : Pinout Table

Pin Number

Pin Number

Name Type Top/

Bottom Electrical level

1 A1 CLK_EXT_T Input Clock Top VDDIO

2 A2 VDDIO_T IO Power Supply Top 1.8V – 3.3V

3 A3 VSS1833D_T Digital Ground Top Ground

4 A4 N_LVDS0_T Negative LVDS data 0 Top LVDS

5 A5 N_LVDS1_T Negative LVDS data 1 Top LVDS

6 A6 VSS1833D_T Digital Ground Top Ground

7 A7 N_LVDS2_T Negative LVDS data 2 Top LVDS

8 A8 N_LVDS3_T Negative LVDS data 3 Top LVDS

9 A9 N_LVDS_CLK_T Negative LVDS Clock Top LVDS

10 A10 P_LVDS_CTRL_T Positive LVDS Control Top LVDS

11 A11 P_LVDS4_T Positive LVDS data 4 Top LVDS

12 A12 P_LVDS5_T Positive LVDS data 5 Top LVDS

13 A13 VSS1833D_T Digital Ground Top Ground

14 A14 P_LVDS6_T Positive LVDS data 6 Top LVDS

15 A15 P_LVDS7_T Positive LVDS data 7 Top LVDS

16 A16 VSS1833D_T Digital Ground Top Ground

17 A17 VSS18A_PLL_T Analog Ground Top Ground

18 A18 MOSI_T SPI MOSI Top VDDIO

19 B1 RESET_N_T SPI Reset Top VDDIO

20 B2 TRIG_IN_T Trigger In Top VDDIO

21 B3 VDD33D_TL Digital power supply Top 3.3V

22 B4 P_LVDS0_T Positive LVDS data 0 Top LVDS

23 B5 P_LVDS1_T Positive LVDS data 1 Top LVDS

24 B6 VDD18D_TL Digital power supply Top 1.8V

25 B7 P_LVDS2_T Positive LVDS data 2 Top LVDS

26 B8 P_LVDS3_T Positive LVDS data 3 Top LVDS

27 B9 P_LVDS_CLK_T Positive LVDS Clock Top LVDS

28 B10 N_LVDS_CTRL_T Negative LVDS Control Top LVDS

29 B11 N_LVDS4_T Negative LVDS data 4 Top LVDS

30 B12 N_LVDS5_T Negative LVDS data 5 Top LVDS

31 B13 VDD18D_TR Digital power supply Top 1.8V

32 B14 N_LVDS6_T Negative LVDS data 6 Top LVDS

33 B15 N_LVDS7_T Negative LVDS data 7 Top LVDS

34 B16 VDD33D_TR Digital power supply Top 3.3V

35 B17 NC Top

36 B18 MISO_T SPI MISO Top VDDIO

37 C1 TRIG_OUT_T Trigger Out Top VDDIO

38 C2 SCAN_MODE_T Test Pin Top VDDIO

39 C17 CS_N_T Chip Select Top VDDIO

40 C18 SCK_T SPI Clock Top VDDIO

41 D1 NC Top

42 D2 VSS18A_ADC_T Analog Ground Top Ground

43 D17 DTEST0_T Digital Test Pin Top VDDIO

44 D18 DTEST1_T Digital Test Pin Top VDDIO

45 E1 VSS18A_RAM_TL Analog Ground Top Ground

46 E2 VDD18A_RAM_TL Analog power supply Top 1.8V

47 E17 VDD18A_RAM_TR Analog power supply Top 1.8V

48 E18 VSS18A_RAM_TR Analog Ground Top Ground

49 F1 VSS33A_ADC_TL Analog Ground Top Ground

50 F2 VDD33A_ADC_TL Analog power supply Top 3.3V

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Pin Number

Pin Number

Name Type Top/

Bottom Electrical level

51 F17 VDD33A_ADC_TR Analog power supply Top 3.3V

52 F18 VSS33A_ADC_TR Analog Ground Top Ground

53 G1 VDD_MAT_TL Analog power supply Top 3.3V

54 G2 VSS_MAT_TL Analog Ground Top Ground

55 G17 VSS_MAT_TR Analog Ground Top Ground

56 G18 VDD_MAT_TR Analog power supply Top 3.3V

57 H1 ATEST0_T Analog Test Pin Top 0 – 3.3V

58 H2 ATEST1_T Analog Test Pin Top 0 – 3.3V

59 H17 VDD33A_REG_T Analog power supply Top 3.3V

60 H18 VSS33A_REG Analog Ground Top Ground

61 J1 VLR_MEM_T (optional external

power supply) Top

62 J2 VLR_PH_T (optional external

power supply) Top

63 J17 VHR_MEM_T (optional external

power supply) Top

64 J18 VDD_DL_T Analog power supply Top 3.3V

65 K1 VLR_MEM_B (optional external

power supply) Bottom

66 K2 VLR_PH_B (optional external

power supply) Bottom

67 K17 VHR_MEM_B (optional external

power supply) Bottom

68 K18 VDD_DL_B Analog power supply Bottom 3.3V

69 L1 ATEST0_B Analog Test Pin Bottom

70 L2 ATEST1_B Analog Test Pin Bottom

71 L17 VDD33A_REG_B Analog power supply Bottom 3.3V

72 L18 VSS33A_REG Analog Ground Bottom Ground

73 M1 VDD_MAT_BL Analog power supply Bottom 3.3V

74 M2 VSS_MAT_BL Analog Ground Bottom Ground

75 M17 VSS_MAT_BR Analog Ground Bottom Ground

76 M18 VDD_MAT_BR Analog power supply Bottom 3.3V

77 N1 VSS33A_ADC_BL Analog Ground Bottom Ground

78 N2 VDD33A_ADC_BL Analog power supply Bottom 3.3V

79 N17 VDD33A_ADC_BR Analog power supply Bottom 3.3V

80 N18 VSS33A_ADC_BR Analog Ground Bottom Ground

81 P1 VSS18A_RAM_BL Analog Ground Bottom Ground

82 P2 VDD18A_RAM_BL Analog power supply Bottom 1.8V

83 P17 VDD18A_RAM_BR Analog power supply Bottom 1.8V

84 P18 VSS18A_RAM_BR Analog Ground Bottom Ground

85 R1 NC Bottom

86 R2 VSS18A_ADC_B Analog Ground Bottom Ground

87 R17 DTEST0_B Digital Test Pin Bottom VDDIO

88 R18 DTEST1_B Digital Test Pin Bottom VDDIO

89 T1 TRIG_OUT_B Trigger Out Bottom VDDIO

90 T2 SCAN_MODE_B Test Pin Bottom VDDIO

91 T17 CS_N_B Chip Select Bottom VDDIO

92 T18 SCK_B SPI Clock Bottom VDDIO

93 U1 RESET_N_B SPI Reset Bottom VDDIO

94 U2 TRIG_IN_B Trigger In Bottom VDDIO

95 U3 VDD33D_BL Digital power supply Bottom 3.3V

96 U4 P_LVDS0_B Positive LVDS data 0 Bottom LVDS

97 U5 P_LVDS1_B Positive LVDS data 1 Bottom LVDS

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Pin Number

Pin Number

Name Type Top/

Bottom Electrical level

98 U6 VDD18D_BL Digital power supply Bottom 1.8V

99 U7 P_LVDS2_B Positive LVDS data 2 Bottom LVDS

100 U8 P_LVDS3_B Positive LVDS data 3 Bottom LVDS

101 U9 P_LVDS_CLK_B Positive LVDS Clock Bottom LVDS

102 U10 N_LVDS_CTRL_B Negative LVDS Control Bottom LVDS

103 U11 N_LVDS4_B Negative LVDS data 4 Bottom LVDS

104 U12 N_LVDS5_B Negative LVDS data 5 Bottom LVDS

105 U13 VDD18D_BR Digital power supply Bottom 1.8V

106 U14 N_LVDS6_B Negative LVDS data 6 Bottom LVDS

107 U15 N_LVDS7_B Negative LVDS data 7 Bottom LVDS

108 U16 VDD33D_BR Digital power supply Bottom 3.3V

109 U17 NC Bottom

110 U18 MISO_B SPI MISO Bottom VDDIO

111 V1 CLK_EXT_B Input Clock Bottom VDDIO

112 V2 VDDIO_B IO Power Supply Bottom 1.8V – 3.3V

113 V3 VSS1833D_B Digital Ground Bottom Ground

114 V4 N_LVDS0_B Negative LVDS data 0 Bottom LVDS

115 V5 N_LVDS1_B Negative LVDS data 1 Bottom LVDS

116 V6 VSS1833D_B Digital Ground Bottom Ground

117 V7 N_LVDS2_B Negative LVDS data 2 Bottom LVDS

118 V8 N_LVDS3_B Negative LVDS data 3 Bottom LVDS

119 V9 N_LVDS_CLK_B Negative LVDS Clock Bottom LVDS

120 V10 P_LVDS_CTRL_B Positive LVDS Control Bottom LVDS

121 V11 P_LVDS4_B Positive LVDS data 4 Bottom LVDS

122 V12 P_LVDS5_B Positive LVDS data 5 Bottom LVDS

123 V13 VSS1833D_B Digital Ground Bottom Ground

124 V14 P_LVDS6_B Positive LVDS data 6 Bottom LVDS

125 V15 P_LVDS7_B Positive LVDS data 7 Bottom LVDS

126 V16 VSS1833D_B Digital Ground Bottom Ground

127 V17 VSS18A_PLL_B Analog Ground Bottom Ground

128 V18 MOSI_B SPI MOSI Bottom VDDIO

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Table 3 : Power Supply Decoupling

(1)Optional: VDD_DL and VDD_MAT are used if external power supply is needed.

Note 1:VDDIO is used for all SPI, TRIG IN/OUT, RESETN and CLK_EXT pins Note 2: It is recommended to use X7R for all the 100nF capacitors.

4. PACKAGE SPECIFICATION

This paragraph gives the package drawing and the window characteristics. Table 4 : Window Characteristics

Parameters Specification

Window material SCHOTT D263 EcoT

Window thickness 0.55 +/-0.05 mm

Window index ne = 1.5255

AR Coating Transmittance (400-900nm) > 97%

Pins NameDecoupling

(per pin )

Power

ConsumptionComments

J18, K18 VDD_DL (1) 20µF /

100nF (optional)

0

150mA peak

- Left floating by defaut (internal regulator)

- // 100nF if external regulator

G1, G18, M1, M18 VDD_MAT (1) 10µF /

100nF (optional)

12mA

250mA peak

- Left floating by defaut (internal regulator)

- // 100nF if external regulator

B17, D1, R1, U17 VDD18A 1µF // 100nF16mA

50mA peakAnalog 1,8 V ( PLL, ADC)

B6, B13, E2, E17, P2, P17,

U6, U13VDD18D 1µF // 100nF

300mA

800mA peakDigital 1,8V (RAM, ...)

F2, F17, H17, L17, N2, N17 VDD33A 1µF // 100nF300 mA

400mA PeakADC and Internal regulators

B3, B16, U3, U16 VDD33D 1µF // 100nF75mA

90mALVDS output

A2, V2 VDDIO 1µF // 100nF 1mA to be connected to FPGA outputs (1.8V to 3.3V)

J17, K17 VHR_MEM 100nF (optional)- Left floating by defaut

- // 100nF if external regulator

J1, K1 VLR_MEM 100nF (optional)- Left floating by defaut

- // 100nF if external regulator

J2, K2 VLR_PH 100nF (optional)- Left floating by defaut

- // 100nF if external regulator

A17, D2, F1, F18, G2, G17,

H18, L18, M2, M17, N1, N18,

R2, V17

VSS_18_33A Analog Ground

A3, A6, A13, A16, E1, E18,

P1, P18, V3, V6, V13, V16VSS_18_33D Digital Ground

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Figure 4 : µPGA 128 Pins Package Drawing

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5. SENSOR OPERATING STATES

The sensor has different operating states as described below.

5.1 Stand By state

The Stand By state is the lowest power consumption state. The SPI registers can be programmed during the Stand By state.

5.2 Idle state

The Idle state is equivalent to a “break” mode where the sensor is waiting for a trigger. The power consumption is low but the sensor is still active.

5.3 Free Run state

In the “Free Run” mode, the sensor output frames without any user’s action. The frame rate is controlled by the integration time, the waiting time, specific functions and/or the clocks supplied to the sensor.

5.4 Trigger state

The sensor can be triggered using an external signal and/or by SPI registers. A single pulse launches an acquisition composed by consecutive integration time + readout time + optional wait time. A continuous trigger signal is equivalent to the free run mode. The sensor also provides a “pipelined” trigger mode for frame rate improvement, and an Integration Time Control (exposure controlled by the trigger).

6. READOUT MODES DESCRIPTION

The sensor offers several readout modes: - Global Shutter - Electronic Rolling Shutter - Digital Double Sampling (in Global Shutter) - Serial / Overlap modes - Video mode

6.1 Electronic Rolling Shutter mode (ERS)

The Electronic Rolling Shutter mode allows integration and readout line by line. The ERS introduces readout distortion, but the readout noise is as low as possible. A True Rolling Shutter mode is possible, with the top semi-matrix readout followed by the bottom one.

6.2 Global Shutter mode (GS)

The Global Shutter mode allows true snapshot readout. The GS does not introduce any distortion during the integration and readout. The readout noise is higher compared to the ERS mode (except if DDS mode is used; see below).

6.3 Digital Double Sampling (DDS)

The Digital Double Sampling (DDS) is a function similar to the Correlated Double Sampling (CDS) but done in the digital domain (after the signal is converted by the ADC) rather than in the analog main (before the ADC). It allows a readout noise reduction especially when the Global Shutter mode is used.

The sensor outputs 2 consecutive images: a first image with the all the pixel reference levels followed by an image with all the pixel signal levels. Subtraction product of these two images will generate a low readout noise global shutter image. An off-chip image processing with external memory will be required to perform this subtraction. Figure 5 : Digital Double Sampling timing

Integration time Image 1 Image 2 Image 3 Reference Data Ref 1 Ref 2 Ref 3 Signal Data S1 S2

Image memory Mem. Ref 1 Mem. Ref 2 Mem. Ref 3 Processing image Image 1 = S1 – Mem Ref 1 Image 2 = S2 – Mem Ref 2

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6.4 Serial and Overlap mode

A sensor acquisition is composed of an integration time followed by a readout time. When the sensor is in free run mode or in video mode, there are 2 ways to output images: - The Serial mode outputs each acquisition one after the other. The frame rate in this case is dependent on the integration time and readout time (ROI size). - The Overlap mode allows the overlapping of readout time and integration time. In this mode, the highest frame rate can be achieved. Frame rate remains the same while the integration time is lower than the readout time. Figure 6 : Overlap and Serial modes

6.5 Video mode

In Video mode, the frame rate is fixed and programmed through dedicated registers. In this mode, the “wait time” between frames is calculated automatically, based on the integration and readout times (Int and Read in figures below). Figure 7 : Video mode in Serial

In serial mode, the really first frame is always in serial mode. Figure 8 : Video mode in Overlap

Serial mode

Overlap mode

Int 1 Read 1 Int 2 Read2 Int 3 Read 3 …

Int 1 Read 1

Int 2 Read2

Frameperiod 1 Frameperiod2 Frameperiod 3

Int 4 Read 4 …

Int 3 Read3

SameFrame period DifferentFrame period

Video mode

(Serial) Int 1 Read

Fixed Frame Period

Wait 1 Int 2 Read Wait2 Int 3 Read

Video mode

(Overlap) Int 1 Read

Fixed Frame Period

Wait 1

Int 2 Read Wait2

Int 3 Read Wait 3

Int 4 Read

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7. ON-CHIP FUNCTIONS DESCRIPTION

The EV76C771 sensor has several on-chip analog and digital features for user convenience or to achieve higher performances.

7.1 Flip

The readout can be flipped in vertical (row flip), through SPI register programming. The horizontal flip can be achieved during the external image reconstruction. This allows easy system integration, depending on lens and optics.

7.2 Region Of Interest

The Region Of Interest (ROI) feature controls the number of columns and rows in a given frame. This operation is performed after the image flip but before sub-sampling and defect correction. Reducing the number of lines of the ROI increases the frame rate.

7.3 Sub sampling

The sub sampling allows faster sensor readout by sampling, in horizontal and vertical, 1 pixel over 2, 4 or 8. The interest is that the field of view is fully preserved.

7.4 Trigger Out

The “Trig Out” pin outputs the exposure period used in the sensor. The top “Trig Out” can be routed on the bottom “Trig In” to achieve the True rolling Shutter mode.

7.5 Trigger In

The “Trig In” pin is used to trigger the sensor. When triggered, the sensor launches acquisition sequence.

7.6 Integration Time Control (ITC)

The ITC mode uses the Trig In to launch an acquisition with the integration time corresponding to active level of the input signal.

7.7 Output Patterns

Output patterns are digitally generated, to test the acquisition system. They can be also configured using the registers.

7.8 Analog To Digital Converter (ADC)

The Analog to Digital Converter can convert 2 rows at a time, in true 8bits, 10bits, 12bits or 14bits. Each semi-matrix has its own ADC: one Top ADC and one Bottom ADC.

7.9 Clock tree

The input clock is 80MHZ, by default. This clock will be directly used for internal propose and by the two internal PLLs, dedicated to LVDS and sequencer.

7.10 Wide Dynamic Range functions

The sensor offers 2 different Wide Dynamic Range modes: Logarithmic and Global Shutter Bi-exposure.

7.10.1 Logarithmic

This mode sets the sensor in logarithmic response. Depending on the logarithmic adjustment, the dynamic range can reach up to 120dB.

7.10.2 Bi-Exposure

The sensor can output two consecutive images, with two different exposures. Then, with external memories and image processing, a wide dynamic range image can be achieved. The ratio between the two exposures will define the wide dynamic range value.

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7.11 Context

The Context provides additional information on sensor state and some statistics. It is composed of a “Header”, output before the data, and a “Footer”, output after the data.

7.12 Temperature Sensor

The EV76C771 contains two embedded temperature sensors, one for each semi-sensor. The temperature reading is accessible through dedicated SPI registers or through analog outputs. The temperature range is [-40°c; +85°C] and a digital calibration will be needed.

8. INTERFACE DESCRIPTION

8.1 LVDS output

Each semi-sensor (Top and Bottom) has its own dedicated pixel clock and synchronization signals, and is divided in 8 blocks of 256 columns by 582 rows. A LVDS pair is dedicated to each block for Data output. The LVDS common voltage is 1.2V with 350mV differential level and sub-LVDS is 0.9V with 175mV differential level. One semi-sensor owns 10 LVDS pairs as described below:

- 8 LVDS pairs for pixel data - 1 LVDS pair for synchronization - 1 LVDS pair for pixel clock

Then, for the entire sensor, there are 20 LVDS pairs arrange as below:

- 2 x 8 LVDS pairs for pixel data - 2 x 1 LVDS pairs for synchronization - 2 x 1 LVDS pairs for pixel clock

Figure 9 : LVDS pairs organization

Top Sensor

Bottom Sensor

Block T0

Block T1

Block T2

Block T3

Block T4

Block T5

Block T6

Block T7

Block B0

Block B1

Block B2

Block B3

Block B4

Block B5

Block B6

Block B7

256 columns

LVDS B0

LVDS B1

LVDS B2

LVDS B3

LVDS B4

LVDS B5

LVDS B6

LVDS B7

LVDS T0

LVDS T1

LVDS T2

LVDS T3

LVDS T4

LVDS T5

LVDS T6

LVDS T7

582 rows

LVDS Synchro B

LVDS Pixel clk B

LVDS Synchro T

LVDS Pixel clk T

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The Data and Synchronization Channel are organized as described below. Figure 10 : LVDS Data organization

Data Filling HEADER Data Filling

Data Filling IMAGE Data Filling

Data Filling FOOTER Data Filling

Data Filling

Note: Data filling can be changed using the SPI registers. Figure 11 : LVDS Synchronization signal

HEADER IDLE

SOF EOL

IDLE SOL IDLE

BLANKING LINE

= IDLE

EOL EOF

FOOTER

BLANKING FRAME

= IDLE

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8.2 Serial Peripheral Interface

The EV76C771 contains internal registers used for the sensor operation. These registers can be programmed using the Serial Peripheral Interface (SPI). Each semi-sensor has its own registers, controlled by individual SPI (MOSI, MISO and SCK).

9. SENSOR OPTIONS

The EV76C771 sensor is available in two versions:

Monochrome

RGB Bayer filter

Others : contact e2v marketing

10. STANDARDS COMPLIANCE

The EV76C771 sensor conforms to the following standards:

RoHS compliant

Product qualification according to JEDEC JESD47

MSL 3 compliant

11. ORDERING CODES

11.1 Standard version with protective foil

EV76C771ABT-EQTR Monochrome product,

EV76C771ACT-EQTR Color Bayer product. For other packaging, please contact e2v. The sensors are delivered in Jedec trays of 44 units each.

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TABLE OF CONTENTS

1. TYPICAL PERFORMANCE DATA .................................................................................................................2

2. SENSOR OVERVIEW .....................................................................................................................................3

3. APPLICATION INFORMATION ......................................................................................................................4

4. PACKAGE SPECIFICATION ..........................................................................................................................8

5. SENSOR OPERATING STATES ................................................................................................................. 10

5.1 STAND BY STATE ..................................................................................................................................... 10 5.2 IDLE STATE .............................................................................................................................................. 10 5.3 FREE RUN STATE ..................................................................................................................................... 10 5.4 TRIGGER STATE ....................................................................................................................................... 10

6. READOUT MODES DESCRIPTION ............................................................................................................ 10

6.1 ELECTRONIC ROLLING SHUTTER MODE (ERS) .......................................................................................... 10 6.2 GLOBAL SHUTTER MODE (GS) ................................................................................................................. 10 6.3 DIGITAL DOUBLE SAMPLING (DDS) .......................................................................................................... 10 6.4 SERIAL AND OVERLAP MODE .................................................................................................................... 11 6.5 VIDEO MODE ............................................................................................................................................ 11

7. ON-CHIP FUNCTIONS DESCRIPTION ....................................................................................................... 12

7.1 FLIP ........................................................................................................................................................ 12 7.2 REGION OF INTEREST .............................................................................................................................. 12 7.3 SUB SAMPLING ........................................................................................................................................ 12 7.4 TRIGGER OUT ......................................................................................................................................... 12 7.5 TRIGGER IN ............................................................................................................................................. 12 7.6 INTEGRATION TIME CONTROL (ITC) .......................................................................................................... 12 7.7 OUTPUT PATTERNS ................................................................................................................................. 12 7.8 ANALOG TO DIGITAL CONVERTER (ADC) .................................................................................................. 12 7.9 CLOCK TREE............................................................................................................................................ 12 7.10 WIDE DYNAMIC RANGE FUNCTIONS .......................................................................................................... 12 7.11 CONTEXT ................................................................................................................................................ 13 7.12 TEMPERATURE SENSOR ........................................................................................................................... 13

8. INTERFACE DESCRIPTION ....................................................................................................................... 13

8.1 LVDS OUTPUT ........................................................................................................................................ 13 8.2 SERIAL PERIPHERAL INTERFACE ............................................................................................................... 15

9. SENSOR OPTIONS ..................................................................................................................................... 15

10. STANDARDS COMPLIANCE ...................................................................................................................... 15

11. ORDERING CODES .................................................................................................................................... 15

11.1 STANDARD VERSION WITH PROTECTIVE FOIL.............................................................................................. 15

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For details of our global offices, please visit:

http://www.e2v.com/sales-contacts

For details of our products, please visit:

http://www.e2v.com/imaging

Whilst e2v has taken care to ensure the accuracy of the information contained herein it accepts no responsibility for the consequences of any use thereof and also reserves the right to change the specification of goods without notice. e2v accepts no liability beyond that set out in its standard conditions of sale in respect of infringement of third party patents arising from the use of tubes or other devices in accordance with information contained herein.