Challenging convention – outperforming expectations

Epsilon 3X spectrometers

Ultimate light-element performance

Built upon the experience and success of their predecessors,

Epsilon 3X instruments are benchtop energy dispersive X-ray

fluorescence (EDXRF) spectrometers, powered by the latest

advances in excitation and detection technology. Designed

to be reliable and simple to operate, they have outstanding

analytical performance, right across the periodic table.

Enhanced by a variety of software modules, for state-of-the-

art standardless analysis, oil analysis, rapid identification

fingerprinting, multi-layer analysis or regulatory compliance,

Epsilon 3X spectrometers are affordable, highly flexible

analytical tools suitable for a wide range of applications.

Epsilon 3X and Epsilon 3XLE versions

• High sensitivity through smart design of excitation and detection

• Market-leading light-element performance

• X-ray safety assured

• Full data traceability

• Regulatory compliance

• Unattended batch analysis

• Worldwide on-line support

• Highly flexible analytical tools suitable for a wide range of applications:

- Epsilon 3X – used for elemental analysis (F - Am) in areas from R&D through to process control

- Epsilon 3XLE – used for higher sample throughput with improved and extended light element capabilities (C – Am)

Simple, accessible elemental analysis Ready for any sampleMaterial characterization through chemical analysis is usually

part of a more complex activity undertaken by a researcher

or process and quality control engineer. The simplicity with

which the Epsilon 3X spectrometers can be operated, installed

and maintained frees the professional to focus on other

important tasks.

Measure in your own language

1. Load your sample

2. Select required method

3. Enter relevant sample information

4. Just click Measure 测量 測定 Mesurer Messung Mesure Zmierzyc Medida Измерить Médir

Epsilon 3X spectrometers can handle a large variety of sample

types; including solids, pressed and loose powders, liquids

and filters, weighing from a few milligrams to larger bulk

samples.

´

Petrochemicals• Compliant with relevant ASTM, ISO and IP norms• Oil-Trace for fuel-biofuel mixtures and wear metals

analysis in lubricating oils• Certified oil and fuels standards from VHG Labs• On-line Performance Testing Program (PTP) for

immediate round robin results• Omnian standardless analysis for unknown samples

Plastics and polymers• ASTM F2617 compliant (RoHS 2)• Plastics sorting with FingerPrinting• Additive elements in polyethylene (ADPOL) certified standards• Dedicated solutions for additives and toxic elements in polymers • Heavy metal contaminants in polyethylene (TOXEL) and PVC

certified standards• Restricted toxic elements in polyethylene (RoHS) certified

standards• Omnian standardless analysis for unknown samples

Environmental• Contaminated soils analysis• EPA IO 3-3 Inorganic compounds in ambient air• Waste water analysis• Omnian standardless analysis for unknown

samples

Pharmaceuticals • USP <735> and <233> compliant• Catalyst and metals residues in API and excipients • PASS/FAIL analysis of counterfeit drugs with FingerPrinting• FDA CFR 21 Part 11 Enhanced Data Security software • Installation and operational quantification packages

(IQ and OQ) • Omnian standardless analysis for unknown samples• Multiple user walk-up system

Industry solutions

Mining & minerals• Rocks, ores and drill cores with max. sample height

of 10 cm• Minerals beneficiation• Material characterization with FingerPrinting• Can be automated for at-line process control• Omnian standardless analysis for unknown samples

Building materials• ASTM C114 and ISO 29581-2 compliant• Process and quality control of cement, clinker

and raw materials• Alternative fuels analysis (AFR)• Fusion-based reference standards (CEMOXI) • Can be automated for at-line process control

Research & education• Quantify any type of sample• Stratos multilayer analysis software• Material characterization with FingerPrinting• Ideal education tool• Omnian standardless analysis for unknown samples• Multiple user walk-up system

Metals• Stratos multi-layer analysis software• Metals sorting with FingerPrinting and PASS/FAIL reporting• Ferrous and non-ferrous analysis• Slag analysis• Omnian standardless analysis for unknown

samples

Food & cosmetics• Quantification of nutrients• Process control of food, animal feed and cosmetics• Robust and accurate quantification of milk powder• PASS/FAIL analysis of incoming goods with FingerPrinting• FDA CFR 21 Part 11 Enhanced Data Security software • Omnian standardless analysis for unknown samples

Oil-Trace

For heavily regulated environments like the pharmaceutical

industry, the installation and operation of Epsilon 3X

spectrometers are strictly prescribed, and the software

handling and data security comply with the requirements of

the FDA CFR 21 Part 11 regulations.

Advanced standardless analysisPANalytical’s powerful Omnian software is ideal when there is no conventional calibration established for materials that require analysis. When faced with non-routine samples or materials for which there are no certified reference materials, Omnian provides excellent insight into the elemental composition.

Designed to provide fast and reliable quantification, Omnian’s advanced fundamental parameters (FP) algorithm automatically deals with the analytical challenges posed by samples of widely differing types.

Oil-Trace is an innovative package for the challenges often

faced in the analysis of oils and petrochemicals. Oil-Trace

offers a universal solution for a range of elements in a wide

variety of fuel-biofuel mixtures to new and used lubricating

oils.

Analysts benefit from a simplification of application

maintenance and analytical procedure, and from cost

savings through the use of simple and relatively inexpensive

standards.

The Stratos module features an algorithm which enables

simultaneous determination of chemical composition and

thickness of layered materials. The software provides a rapid,

simple and non-destructive means of analyzing coatings,

surface layers and multi-layered structures.

Accurate results are achieved by using conventional bulk

standards, or reference samples whose composition and layer

structure differ from those of the unknowns.

FingerPrint is a material type confirmation routine that uses a

rapid statistical analysis of the spectrum for a simple

Yes/No answer. Spectra used for the FingerPrint routine can

also be used for conventional compositional determination

and for a more complete diagnostic analysis

Analysisstrategy

Known material type Unknown materials

Conventionalcalibration

Standardlessanalysis

Dedicated industrysoftware options

Omnian?OMNIAN OIL-TRACE STRATOS FINGERPRINT DATA SECURITY

! ?OMNIAN OIL-TRACE STRATOS FINGERPRINT DATA SECURITY

!

?OMNIAN OIL-TRACE STRATOS FINGERPRINT DATA SECURITY

!

?OMNIAN OIL-TRACE STRATOS FINGERPRINT DATA SECURITY

!

?OMNIAN OIL-TRACE STRATOS FINGERPRINT DATA SECURITY

!

Fingerprint

Enhanced Data Security

Stratos

Increased performance by technology push

1995

High-powerWDXRF

performance

Low-powerWDXRF

performance

EDXRFperformance

Time2000 2005 2011 2014

MiniPal 2

MiniPal

MiniMate

MiniPal 4

Epsilon 3 Epsilon 3X

Epsilon 3 XL

Epsilon 3XLE

Relative performance of benchtop spectrometers over time

Well-defined fluorescent peak from 85% carbon in a polymer sample. Ultra-thin windows on both X-ray tube and detector enable carbon, nitrogen, oxygen and fluorine analysis with Epsilon 3XLE.

Combining the latest excitation and detection technology

with a smart design, the analytical performance of

Epsilon 3XLE moves closer to that of larger, more powerful

spectrometers. Selective excitation and careful matching of

the X-ray tube output to the capabilities of the detection

system underlie system performance.

Excitation

A high-performance, metal-ceramic X-ray tube has been

specially developed for the Epsilon 3X spectrometers at

PANalytical’s tube manufacturing facility. A choice of anode

materials (Rh, Ag or Mo), flexible voltage settings from 4.0 to

50 kV and a maximum current setting of 3.0 mA can be used

to define optimum application-specific excitation conditions

across the periodic table.

Detection

Epsilon 3X spectrometers are equipped with the latest in

silicon drift detector technology. Pulse reset electronics give

a linear count rate capacity to over 200,000 cps and a count

rate independent resolution typically better than 135 eV for

better separation of analytical lines in the spectrum.

The SDDUltra silicon drift detector fitted in Epsilon 3XLE

enables ultra-light element analysis of even carbon, nitrogen

and oxygen.

Advantages of XRFXRF spectroscopy does not require sample dissolution.

By avoiding the potential for inaccuracies caused by

incomplete dissolution, the complete analysis offered by

XRF helps to ensure the accuracy and reliability of results.

• Non-destructive

• Suitable for solids, liquids and powders

• Simple, fast and safe sample preparation

• Accurate, highly reproducible data

• No need for daily re-calibration

• Wide analytical concentration range (from a few ppm

to 100%)

• Very low running costs

• Accurate, precise and reliable analysis

Fluorine analysis in fluorite, prepared as (10:1) fused beads

F concentration (wt%)

Co

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ted

inte

nsi

ty

20 24 28 32 36 40 44 48

Quick and easy sample preparation

Powders Solids Liquids

Compared to other analytical techniques XRF requires little

or no sample preparation.

Epsilon 3X spectrometers can handle a large variety of sample

types weighing from a few milligrams to larger bulk samples.

Samples can be measured as:

• Solids • Slurries

• Pressed powders • Granules

• Loose powders • Filters

• Liquids • Films and coatings

• Fused beads

Larger samples

Measure unprepared samples, large or irregularly shaped objects - in complete safety - no open source high-energy X-rays

Quality data through mature software

Accurate and precise data are obtained

through advanced spectrum processing

and state-of-the-art correction and

quantification algorithms.

• Accurate intensities through

unmatched spectrum deconvolution

• Automatic line-overlap and matrix

corrections

• Constant read-out of temperature and

air pressure sensors in software

• Easy application setup and condition

optimizer

• Software available in many languages

Although diligent care has been used to ensure that the information herein is accurate, nothing contained herein can be construed to imply any representation or warranty as to the accuracy, currency or completeness

of this information. The content hereof is subject to change without further notice. Please contact us for the latest version of this document or further information. © PANalytical B.V. 2014. 9498 707 43812 PN10217

Global and near PANalytical B.V.

Lelyweg 1, 7602 EA Almelo

P.O. Box 13, 7600 AA Almelo

The Netherlands

T +31 546 534 444

F +31 546 534 598

info@panalytical.com

www.panalytical.com

Regional sales offices

Americas

T +1 508 647 1100

F +1 508 647 1115

Europe, Middle East, Africa

T +31 546 834 444

F +31 546 834 969

Asia Pacific

T +65 6741 2868

F +65 6741 2166

www.panalytical.com/epsilon3xspectrometers

Care AgreementsOur customer support solutions have been developed with your business in mind. They are formulated as a family of four Care Agreements which can be tailored to your specific needs and provide fast, secure and reliable support.

• ECONOMY: indispensable coverage for self-sufficient operations

• ADVANCED: cost-effective support for routine usage

• PREMIUM: flexible package for high equipment usage

• ELITE: most comprehensive package

for demanding environments

About PANalyticalPANalytical’s mission is to enable people to get valuable insight into their materials and processes. Our customers can be found in virtually every industry segment, from building materials to pharmaceuticals and from metals and mining to nanomaterials. The combination of our software and instrumentation, based on X-ray diffraction (XRD), X-ray fluorescence (XRF) and near-infrared (NIR) spectroscopy as well as pulsed fast thermal neutron activation (PFTNA), provides our customers with highly reliable and robust elemental and structural information on their materials and is applied in scientific research and industrial process and quality control.

PANalytical employs over 1,000 people worldwide. The company’s headquarters are in Almelo, the Netherlands. Fully equipped application laboratories are established in Japan, China, the US, Brazil, and the Netherlands. PANalytical’s research activities are based in Almelo (NL) and on the campus of the University of Sussex in Brighton (UK). Supply and competence centers are located on two sites in the Netherlands: Almelo (X-ray instruments) and Eindhoven (X-ray tubes), in Nottingham, UK (XRF applications and standards), in Quebec, Canada (fusion sample preparation) and in Boulder CO, US (near-infrared instruments).

PANalytical is active in all but a few countries of the world. This worldwide sales and service network ensures unrivalled levels of customer support. The company is certified in accordance with ISO 9001 and ISO 14001.

Visit www.panalytical.com for more information about our activities.

PANalytical is part of Spectris plc, the productivity-enhancing instrumentation and controls company.

Access to expertiseWith the largest service network we are able

to offer the most comprehensive support

package possible.

Expertise:

• On-site training available

• XRF training courses

• Performance optimization

• Customizable expertise programs

• Assistance with multi-laboratory

standardization