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Depth Depth P P rofiling rofiling Rick Comtois, Rick Comtois, Judit Jeney* Judit Jeney* Austin AI Inc, Austin AI Inc, Austin/Texas, USA Austin/Texas, USA www.austinai.com www.austinai.com *GreenLab *GreenLab Europe Europe Ltd, Ltd, Budapest/Hungary Budapest/Hungary [email protected] [email protected]

Elemental Analytical Probe for On-Field Depth Profiling Rick Comtois, Judit Jeney* Austin AI Inc, Austin/Texas, USA *GreenLab Europe Ltd,

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Elemental Analytical Probe for On-Field Depth Profiling Rick Comtois, Judit Jeney* Austin AI Inc, Austin/Texas, USA www.austinai.com *GreenLab Europe Ltd, Budapest/Hungary [email protected] Slide 2 Introduction of a Revolutionary Direct Push Device CP-1000 XRF Cone Penetrometer Slide 3 The EDXRF Underground Soils Soils Sediments Sediments Sludge Sludge And Many More And Many More CP-1000The Worlds Only Tube Based Spectrometer Capable of Being Pushed Into Slide 4 Statement of Opportunity Cone Penetrometer Miscalculation Miscalculation Excavation & Sampling (example: Super-Fund Site Clean Up) Excavation & Sampling (example: Super-Fund Site Clean Up) Sub-surface characterization of soils and minerals is a necessary step in planning field activities. It is costly and often environmentally unfriendly. Inexpensive field solutions are desired to reduce costs. Additional Cost = Equipment Usage & Remobilization Additional Cost = Equipment Usage & Remobilization Creates Hazard Creates Hazard Disturbs Site Disturbs Site Wait On Lab Results Wait On Lab Results Others Others Extended CEMS Usage Site Expansion Workers Comp/ Exposure Liability Slide 5 Current Status of In Situ Soil Analysis Physical Data Probes Physical Data Probes EC Soil Typing HC Organic Compound Probes Organic Compound Probes MIP LIF Push Probe Equipment Push Probe Equipment Trucks Trailers Elemental Analysis Probes Elemental Analysis Probes None! Take Sample & Send To Lab Slide 6 CP-1000 Overview 3-D Sub-surface Characterization 3-D Sub-surface Characterization Stress Resistant Components & Enclosure Stress Resistant Components & Enclosure Miniaturized X-ray Tube Miniaturized X-ray Tube Si-PIN Diode Detector Si-PIN Diode Detector Patented Window Analysis Patented Window Analysis Developed by the Naval Research Lab (NRL) for soil profiling in remediation of superfund clean up sites. Under Cooperative Research and Development Agreement (CRADA) with NRL, inventor Dr. Tim Elam is partnered with Austin AI to further develop the probe for commercial applications. Markets Served: Environmental Monitoring/Remediation Environmental Monitoring/Remediation Mining/Exploration Mining/Exploration Agriculture Agriculture Slide 7 CP-1000 Capabilities EPA Method 6200 EPA Method 6200 Metals Detected Metals Detected EN 15309 2007 EN 15309 2007 Detection Limits Detection Limits Modes of Operation Modes of Operation Push Rate Push Rate Field Portable X-ray Fluorescence Field Portable X-ray Fluorescence RCRA Metals: As, Cd, Pb, Hg, Se, Ag, Sb, Cr, Co, Fe, Mn, Ni, Cu, Zn, In, Sn, Most others RCRA Metals: As, Cd, Pb, Hg, Se, Ag, Sb, Cr, Co, Fe, Mn, Ni, Cu, Zn, In, Sn, Most others Characterization of waste & soil XRF Characterization of waste & soil XRF