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Center for the Advancement of Natural Discoveries using Light
Emission
Samvel Zakaryan
Electromagnetic waves in laminated structures and particle
bunching
Thesis
to take a candidate degree in physical and mathematical sciences 01.04.20
“Charged Particle Beam Physics and Accelerator Technology”
Scientific supervisor:
Doctor of Physical and Mathematical Sciences
Mikayel Ivanyan
Yerevan 2017
- 2 -
Contents
Introduction ............................................................................................. - 4 -
Chapter 1: Slow waves in laminated structures .................................. - 10 -
1.1 Introduction ..................................................................................................................... - 10 -
1.2 Slow waves in cylindrical structures ........................................................................ - 10 -
1.3 Attenuation parameter .................................................................................................. - 13 -
1.4 Longitudinal impedance and radiation pattern ...................................................... - 14 -
1.4. Slow waves in flat structures .................................................................................... - 16 -
1.5 Summary .......................................................................................................................... - 24 -
Chapter 2: Accelerating structures with flat geometry ....................... - 26 -
2.1 Introduction ..................................................................................................................... - 26 -
2.2 Multilayer flat structure ................................................................................................ - 27 -
2.3 Two-layer flat structure ................................................................................................ - 35 -
2.4 Impedance of two-layer symmetrical flat structure .............................................. - 37 -
2.5 Approximate analytical representation of impedance ......................................... - 47 -
2.6 Summary .......................................................................................................................... - 53 -
Chapter 3: Rectangular resonator with two-layer vertical walls ........ - 55 -
3.1 Introduction ..................................................................................................................... - 55 -
3.2 IHLCC cavity with ideally conductive walls ............................................................ - 56 -
3.3 Pure copper cavity. Measurements and interpretation ....................................... - 60 -
3.4 IHLCC cavity resonance frequency comparison with experimental results .. - 62 -
3.5 Summary .......................................................................................................................... - 67 -
Chapter 4: Electron bunch compression in single-mode structure ... - 68 -
4.1 Introduction ..................................................................................................................... - 68 -
4.2 Wakefields and Impedances ....................................................................................... - 69 -
4.3 Ballistic bunching .......................................................................................................... - 71 -
4.4 Energy modulation, bunch compression and microbunching in cold neutral
plasma ..................................................................................................................................... - 73 -
4.5 Energy modulation, bunch compression and microbunching in internally
coated metallic tube ............................................................................................................. - 81 -
- 3 -
4.6 Summary .......................................................................................................................... - 88 -
Summary ................................................................................................ - 90 -
Acknowledgements ............................................................................... - 93 -
References ............................................................................................. - 94 -
- 4 -
Introduction
The investigation of new acceleration structures and high frequency, high brightness
coherent radiation sources is an important research area in modern accelerator physics [1-
7]. High brightness and high intensity radiation in 𝑇𝐻𝑧 region opens opportunities of
researches in wide range of areas [8-11]. European XFEL, SwissFEL accelerators are
constructed to obtain such radiation [12, 13]. To emit the 𝑇𝐻𝑧 radiation, one needs to
generate ultrashort, intensive bunches [12, 14-21]. When lengths of microbunches become
smaller than the synchronous mode wavelength (𝜎𝑧 < 𝜆), the large number of electrons
starts to radiate coherently and the intensity of the radiation field grows quadratically with
the number of particles [22].
The direct generation of sub-ps bunches in RF guns is limited due to technical
characteristics of photocathodes and lasers. Because of that reason, sub-ps bunches are
usually formed by initial long bunches shortening. One of the main principles to obtain
ultrashort bunches is to use SASE process [23, 24], which is widely used in modern
accelerators (FELs) [12, 13]. Also it is possible to use additional external laser field to have
a stronger microbunching []. The main principle to generate ultrashort bunches is to obtain
energy modulation within the bunch and convert it into charge density modulation [19]. For
the high energy bunches magnetic chicanes and for low energy bunches velocity bunching
are used to generate sub-ps bunches [25-29]. Energy modulation within the bunch can be
obtained via bunch interaction with its own radiated wakefield or wakefield emitted from
bunches in front of it []. For such a process disc loaded or dielectric loaded structures are
widely used [30-35]. Both structure types are characterized by the high order modes,
excited during the beam passage through them [35-46]. These high order modes play
parasitic role in particle acceleration processes.
Unlike disc and dielectric loaded structures, in the single mode structures like
plasma and circular waveguide with two-layer metallic walls (ICMT) there are no parasitic
high order modes [47-50]. In the dissertation the microbunching processes are studied in
single mode structure.
- 5 -
Theoretically is shown that ICMT has a single slowly propagating high frequency
mode [40]. At appropriate structure geometry, a charged particle moving along the
structure axis radiates in the terahertz frequency region [50]. While the theoretical study of
ICMT shows that for certain conditions it is a single-mode structure, the experiment on it is
related to some technical difficulties. To serve as a high frequency single-mode structure,
ICMT requires high accuracy, 𝜇𝑚 – sub-𝜇𝑚 low conductivity internal coating, and an inner
diameter in the order of several 𝑚𝑚 [50], which is technically complex problem. Because
of these problems, it is preferable to do an experiment on a structure which is similar to
ICMT and is more simple in mechanical means. As such a structure, multilayer flat metallic
structure is considered. For appropriate parameters these two structures are similar, and it
is expected that two-layer flat structure should be single-mode, high frequency too.
The thesis consists of introduction, four chapters, summary and bibliography.
In introduction the short review of the actuality of the problems and the main results of the
thesis are given.
In the first chapter of the dissertation is devoted to the study of slow waves in
laminated structures. The study of high frequency accelerating structures is an important
issue for the development of future compact accelerator concepts [51, 52]. The laminated
structures are widely used in advanced accelerators to meet the technical specifications
like high vacuum performance, cure of static charge, reduction of the impedance, etc. [53].
The electrodynamic properties of two-layer structures, based on field matching technique,
have been studied in Refs. [54–57]. For the internally coated metallic tube (ICMT), with
coating thickness smaller than the skin depth, the longitudinal impedance has a narrow
band resonance at high frequency [57], which is conditioned by the synchronous 𝑇𝑀01
fundamental mode [50]. In the first chapter, the peculiarities of high frequency 𝑇𝑀01 mode,
slowly propagating in ICMT structure, is analyzed both numerically and analytically. The
TM modes dispersion curves and the 𝑇𝑀01 mode attenuation constant are given.
Dispersion relations of flat two-layer structure is investigated. The longitudinal impedance
and the radiation patterns for large aperture ICMT structures are discussed.
The main results of the first chapter are
- 6 -
The single slow propagating mode properties in laminated structures are
studied. It is shown that two-layer cylindrical structure has single slowly traveling
mode (𝑇𝑀01) in 𝑇𝐻𝑧 frequency range.
Explicit expression for attenuation constant of two-layer structure’s 𝑇𝑀01 mode
is obtained.
Dispersion relations of flat two-layer structure are derived.
The second chapter of the thesis is devoted to study of electrodynamic properties
of multilayer two infinite metallic parallel plates. A bunch traveling through the structure
excites wakefields. The longitudinal component of the wakefield produces extra voltage for
the trailing particles in the bunch. The Fourier transformation of the wake potential for the
point driving charge is an impedance of the structure, which presents the excited
electromagnetic field in frequency domain [37]. For ultrarelativistic particles the impedance
is independent of the beam parameters and can describe a structure in frequency domain.
The field matching technique, based on matching the tangential components of the
electromagnetic fields at the borders of layers, is used to calculate electromagnetic fields.
Matrix formalism is developed to couple electromagnetic field tangential components in
two borders of layers. Fourier transformed electromagnetic fields excited by a relativistic
point charge are obtained analytically for two-layer unbounded two parallel infinite plates.
As a special cases of the above, electromagnetic fields of single-layer unbounded
structure and two-layer structure with perfectly conducting outer layer are obtained.
Longitudinal impedance of two-layer structure with outer perfectly conducting layer, excited
by an ultrarelativistic particle is calculated numerically. It is shown that for low conductivity
inner layer the driving particle radiation has a narrow-band resonance. The resonance
frequency is well described by the formula 𝑓𝑟𝑒𝑠 =𝑐
2𝜋√
1
𝑎 𝑑, where 𝑎 is a half-height of a
structure, 𝑑 is a layer thickness and 𝑐 is the velocity of light in vacuum. The longitudinal
wake potential is calculated and it is shown that it is a quasi-periodic function with the
period Δs given by the resonant frequency Δs =c
𝑓𝑟𝑒𝑠.
The main results of the second chapter are
- 7 -
Method of calculating point charge excited electromagnetic fields in multilayer
infinite parallel plates is developed.
Expressions of radiation fields in two-layer parallel plates are derived analytically.
Longitudinal impedance and dispersion relations of symmetrical two-layer
parallel plates with perfectly conducting outer layer is derived.
Comparison of two-layer parallel plates’ electro-dynamic properties and ICMT’s
electro-dynamic properties are performed.
Conditions in which the point charge radiation in two-layer parallel plates has a
narrow-band resonance are obtained.
Wakefields generated by a point charge traveling through the center of the two-
layer parallel plates with outer perfectly conducting material are calculated.
In the third chapter theoretical study of rectangular cavity with laminated walls and
comparison with experimental results is presented. On the second chapter it is shown that
for appropriate parameters two-layered parallel infinite plates have a distinct, narrow band
resonance. In this chapter, a real, limited structure, which is similar to the parallel plates, is
studied. As such a structure a rectangular cavity with laminated horizontal walls is
considered. For the cavity with vertical dimensions much bigger than horizontals, the
electrodynamic characteristics are expected to be similar to the ones for parallel plates. In
the case of resonator, unlike the parallel plates’ case, one has a discrete set of
eigenfrequencies in all three degrees of freedom. To be able to distinguish the main
resonance from secondary ones, finite wall resonator model (perfectly conducting
rectangular cavity with inner low conductivity layers at the top and bottom walls) is
developed and resonances of the model are studied.
Comparison of resonant frequencies of resonator model with resonances of the test
copper cavity with inner germanium layers and parallel two-layer plates is done. Good
agreement between these results is obtained (Δ𝑓 𝑓𝑟𝑒𝑧 < 0.03⁄ ). Experimental results show
the presence of the fundamental resonance which is caused by the two-layer horizontal
cavity walls. The measured fundamental frequencies are close to those calculated for the
- 8 -
two-layer parallel plates, their values are subjected to the laws specific to this kind of
structures: they are decreasing with cavity height increase.
The main results of the third chapter are
The resonance properties of a copper rectangular resonator and a copper
resonator with an internal germanium coating are experimentally investigated
and theoretically substantiated.
Theoretical model of a rectangular cavity with horizontal laminated walls is
created and electro-dynamical properties of the model are studied.
The good correlation between resonance frequencies of the model and test
facility is fixed: all resonances of the test structure corresponds to the modes of
the model.
It is shown that for a resonator with vertical dimensions much bigger than
horizontal ones, the resonance frequencies are in good agreement with
resonances of two-layer infinite parallel plates.
The forth chapter of the dissertation is devoted to the generation of sub-ps bunches
via bunch compression and microbunching processes in single-mode structures.
Wakefields, generated by electron bunch, propagating through a structure, act back on the
bunch particles or the particles traveling behind it producing energy modulation or
transverse kick [36-38, 59-61]. For appropriate parameters, this process can lead to
energy modulation within the bunch, which than can be transformed into charge density
modulation. For non-ultrarelativistic (10 𝑀𝑒𝑉) electron bunches, the energy modulation
causes velocity modulation and for proper ballistic distance leads to bunch compression or
microbunching.
Single-mode structures, due to absence of high order parasitic modes, are ideal
candidates for this process. Plasma channel and internally coated metallic tube are
observed as an example of single-mode structures. Ballistic bunching method is used: the
bunch is considered rigid in a structure and only energy modulations occur, than in the drift
space the energy modulation leads to charge redistribution.
The main results of the forth chapter are
- 9 -
It is shown that the Gaussian distributed bunch interaction with single mode
structure leads to its compression. For appropriate bunch and structure
parameters 8 and 12 times bunch compression is reached for plasma and ICMT,
respectively.
It is shown that microbunching of non-Gaussian bunches is possible in single
mode structures. For parabolic distributed bunches 20 𝜇𝑚 and 3 𝜇𝑚
microbunches and for rectangular distributed bunches 40 𝜇𝑚 and 8 𝜇𝑚
microbunches can be formed for plasma and ICMT, respectively.
The relations between the bunch length, structures parameters and microbunch
formation distance are analyzed for various bunch shapes. The optimal
parameters for structures and drift space distances are obtained.
The main results of the dissertation are the following:
The single slowly propagating mode properties in laminated structures are
studied.
The electromagnetic fields of multilayer parallel plates are analytically derived.
Dispersion relations of two-layer parallel plates is derived and single resonance
frequency is obtained.
The narrow-band high frequency longitudinal impedance and longitudinal wake
function of two-layer parallel plates are calculated.
Resonance frequencies of rectangular cavity with horizontal double-layer
metallic walls are derived.
Good agreement between theoretical results and experiment is fixed.
It is shown that generation of ultrashort bunches (~10 𝜇𝑚 ) in single-mode
structures is possible via ballistic bunching.
The results of the study have been reported at international conference, during the
seminars at CANDLE Synchrotron Research Institute, Yerevan State University, DESY,
Paul Scherrer Institute and are published in the scientific journals.
- 10 -
Chapter 1: Slow waves in laminated structures
1.1 Introduction
In this chapter the conditions in which slowly propagating free oscillations are
formed in cylindrical and flat two-layer metallic structures are studied. The importance of
establishing the presence of such oscillations is due to the fact that the radiation of a
moving particle in accelerating structures is synchronous (or is synphase) with its motion.
In particular, for an ultrarelativistic particle moving at the speed of light, the phase velocity
of the emitted wave is equal to the speed of light.
As is known, an arbitrary field, generated or propagating in a closed structure can
be expressed with the help of a superposition of the eigen-oscillations of a given structure.
The field generated by a particle must contain only synchronous components of its own
oscillations.
In this chapter, we consider mechanisms of the formation of a synchronous mode in
two-layer cylindrical and planar structures and demonstrate their connection with
longitudinal impedances. In particular, for a plane structure, a relationship between the
eigenvalues of the synchronous mode and the poles of the impedance integral is
established.
1.2 Slow waves in cylindrical structures
Consider a round metallic two-layer hollow pipe of inner radius 𝑎 with perfectly
conducting outer layer and the metallic inner layer of conductivity 𝜎 and thickness 𝑑 = 𝑏 −
𝑎 (Figure 1.1).
- 11 -
Figure 1.1: The geometry of the internally coated metallic tube.
In axially symmetric geometry, the frequency domain non zero electromagnetic field
components (𝐸𝑧, 𝐸𝑟, 𝐻𝜃) of the axially symmetric monopole TM modes are proportional to
𝑒𝑥𝑝(𝑗𝛽0𝑛𝑧 − 𝑗𝜔𝑡) , where 𝛽0𝑛 = √𝑘2 − 𝜈0𝑛
2 and 𝜈𝑛 are the longitudinal and radial
propagation constants, respectively, 𝑘 = 𝜔 𝑐⁄ is the wave number, 𝜔 is the frequency and 𝑐
is the velocity of light. The dispersion relation for the modes is derived by the matching of
electromagnetic field tangential components (𝐸𝑧, 𝐻𝜃) at the layers boundaries. Omitting the
factor 𝑒𝑥𝑝(𝑗𝛽0𝑛𝑧 − 𝑗𝜔𝑡), the tangential components of electromagnetic fields in vacuum
(𝑟 < 𝑎) and metallic wall (𝑎 ≤ 𝑟 ≤ 𝑏) regions are given as
𝐸𝑧(𝑟, 𝑧) = 𝐴𝐽0(𝜈0𝑛𝑟)
𝐻𝜃(𝑟, 𝑧) = 𝐴𝑗𝜔𝜀0
𝜈0𝑛𝐽1(𝜈0𝑛𝑟)
𝐸𝑧(𝑟, 𝑧) = 𝐵𝐽0(𝜆0𝑛𝑟) + 𝐶𝐻0(1)(𝜆0𝑛𝑟)
𝐻𝜃(𝑟, 𝑧) =𝑗𝜔𝜀1
𝜆0𝑛[𝐵𝐽1(𝜆0𝑛𝑟) + 𝐶𝐻1
(1)(𝜆0𝑛𝑟)]
for
𝑟 < 𝑎
𝑎 ≤ 𝑟 ≤ 𝑏
(1.1)
where 𝜆0𝑛 = √𝜈0𝑛2 − 𝜒2, 𝜒 = 𝑗 √2 𝛿
⁄ is the radial propagation constant in metallic internal
layer, 𝛿 = 𝑐 (2휀0
𝜎𝜔⁄ ) is the skin depth, 휀0 and 휀1 = 휀0 +𝑗𝜎𝜔⁄ are the vacuum and metal
dielectric constants, respectively, 𝐽0,1(𝑥), 𝐻0,1(1)(𝑥) are the zero and first order Bessel and
Hankel functions respectively.
The unknown coefficients 𝐴, 𝐵, 𝐶 are defined by the matching of tangential
components (𝐸𝑧 , 𝐻𝜃 ) at (𝑟 = 𝑎) and the vanishing of the electric field 𝐸𝑧 at the perfect
- 12 -
conducting outer wall (𝑟 = 𝑏). Non-zero solution is provided by zero determinant of three
linear algebraic equations system, which in its turn defines the eigenvalue equation.
𝜀0𝐽1(𝜈0𝑛𝑎)
𝜀1𝐽0(𝜈0𝑛𝑎)=𝜈0𝑛𝐽1(𝜆0𝑛𝑎)𝐻0
(1)(𝜆0𝑛𝑏)−𝐽0(𝜆0𝑛𝑏)𝐻1
(1)(𝜆0𝑛𝑎)
𝜆0𝑛𝐽0(𝜆0𝑛𝑎)𝐻0(1)(𝜆0𝑛𝑏)−𝐽0(𝜆0𝑛𝑏)𝐻0
(1)(𝜆0𝑛𝑎)
(1.2)
In high frequency range, where the inequalities |𝜒| ≫ |𝜈0𝑛| (|𝜆0𝑛| ≈√2
𝛿⁄ ), |𝜆0𝑛|𝑎 ≫
1 and 𝛿 ≪ 𝑎 are hold, Eq. 1.2 is modified to
𝜀0𝐽1(𝜈0𝑛𝑎)
𝜈0𝑛𝐽0(𝜈0𝑛𝑎)=
𝜀1
𝜆0𝑛cot(𝜆0𝑛𝑑) (1.3)
For the inner metallic layer thickness 𝑑, less than the skin depth 𝛿 (𝑑 ≪ 𝛿), and not
very high frequencies 𝜔 ≪ 𝜎휀0⁄ (휀1 ≈
𝑗𝜎𝜔⁄ ), the Eq. 1.3 is expressed as
1
𝜈0𝑛𝑎
𝐽1(𝜈0𝑛𝑎)
𝐽0(𝜈0𝑛𝑎)=
1
𝑘2𝑎𝑑 (1.4)
In the frequency range of interest (THz), the inequality 𝜔 ≪ 𝜎휀0⁄ holds well for
practically all metals (for copper, e.g. 𝜎 휀0⁄ ≈ 105 𝑇𝐻). The frequency range of applicability
for expression (1.4) is given as 𝑑 ≪ 𝛿 ≪ 𝑎.
The analysis of the Eq. 1.4 shows that the radial propagation constants 𝜈0𝑛 of high
𝑇𝑀0𝑛 (𝑛 > 1) modes are purely real and nonzero. Therefore, the high order modes phase
velocity 𝜈𝑝ℎ =𝑐𝑘𝛽0𝑛⁄ is higher than velocity of light. For fundamental 𝑇𝑀01 mode, the
parameter 𝜈01 vanishes (𝜈01 = 0) at frequency 𝑘0 = √2/𝑎𝑑 (𝜈𝑝ℎ = 𝑐), 𝜈01 is purely real
for frequencies 𝑘 < 𝑘0 (𝜈𝑝ℎ > 𝑐) and 𝜈01 is purely imaginary for frequencies 𝑘 > 𝑘0 (𝜈𝑝ℎ <
𝑐). Thus, the structure under consideration is characterized by a single slowly propagating
𝑇𝑀01mode at high frequency. Figure 1.2 shows the dispersion curves for the fundamental
𝑇𝑀01 and high order 𝑇𝑀0𝑛 (𝑛 > 1) modes. As is seen, only the fundamental mode crosses
the synchronous line 𝛽 = 𝑘 (𝜈𝑝ℎ = 𝑐) at a resonant frequency of 𝑘 = 𝑘0 = √2/𝑎𝑑.
- 13 -
Figure 1.2: Dispersion curves for fundamental 𝑇𝑀01 and high order 𝑇𝑀0𝑛 (𝑛 > 1) modes.
1.3 Attenuation parameter
To evaluate the 𝑇𝑀01 mode attenuation constant 𝛼01 = 𝐼𝑚(𝛽01) for thin inner layer
(𝑑 ≪ 𝛿), the second term in expansion of formula 1.3 should be taken into account, i.e.
cot(𝜒) ≈ 1 𝜒⁄ −𝜒3⁄ ,
𝐽1(𝜈01𝑎)
𝜈01𝑎𝐽0(𝜈01𝑎)=
𝑘02
2𝑘2− 𝑗
𝜂
𝑘𝑎 (1.5)
where 휂 = (𝜍 + 𝜍−1)/√3 , 𝜍 = 𝑍0𝑑𝜎/√3 . The numerical solutions for real and
imaginary parts of 𝑇𝑀01 mode transverse propagation constant are presented on Figure
1.3 (𝑑 𝑎⁄ = 10−3 , 𝜍 = 1 ). For small arguments of Bessel functions |𝜈01|𝑎 ≪ 1 one can
obtain the following approximate expression
𝜈012 ≈
16
𝑎2(−
1
2+
𝑘02
2𝑘2− 𝑗
𝜂
𝑘𝑎) (1.6)
Note, that the real and imaginary parts of transverse propagation constant 𝜈01 at
the resonance frequency 𝑘 = 𝑘0 = √2𝑎𝑑⁄ are given as
𝑅𝑒(𝜈01) = −𝐼𝑚(𝜈01) =1
𝑎√8𝜂
𝑘0𝑎 (1.7)
- 14 -
and the relation |𝜈01|𝑎 ≪ 1 well hold around the resonance frequency. For high frequency
𝑘 ≫ |𝜈01|, the longitudinal propagation constant 𝛽01 = √𝑘2 − 𝜈012 is given as
𝛽 ≈ 𝑘 +4
𝑘3𝑎2(𝑘2 − 𝑘0
2) +8𝜂
𝑎(𝑘𝑎)2 (1.8)
The attenuation constant at resonance frequency (𝑘 = 𝑘0) is then given as 𝛼01 =
4𝑑휂/𝑎2.
Figure 1.3: Real (solid) and imaginary (dashed) parts of 𝑇𝑀01 mode transverse eigenvalue 𝜈 =
𝜈01𝑎.
1.4 Longitudinal impedance and radiation pattern
Consider a relativistic charge traveling along the axis of a round metallic two-layer
hollow pipe (Fig. 1.1). The excited nonzero electromagnetic field components (𝐸𝑧, 𝐸𝑟, 𝐻𝜃)
of the axially symmetric monopole mode in the vacuum region can be derived based on
the field matching technique [53]. A good analytical approximation for metallic type two-
layer tube longitudinal impedance can be obtained in high frequency range, when the skin
depths 𝛿 are much smaller than the tube radius a, i.e. 𝛿 ≪ 𝑎 [57].
𝑍∥0 = 𝑗
𝑍0
𝜋𝑘𝑎2(1 +
2
𝑎
𝜀
𝜀0𝜒𝑐𝑡ℎ(𝜒𝑑))
−1
(1.9)
- 15 -
where 𝑍0 = 120𝜋 Ω is the impedance of free space. For the layer thickness 𝑑 smaller with
respect to skin depth 𝛿 (𝑑 ≪ 𝛿) and not very high frequencies (𝜔 ≪ 𝜎/휀0) the impedance
can be presented in a form of the impedance of parallel resonance circuit
𝑍∥0 = 𝑅 [1 + 𝑗𝑄 (
𝜔0
𝜔−
𝜔
𝜔0)]−1
(1.10)
where 𝜔0 = 𝑐√2/𝑎𝑑 is the resonant frequency, 𝑅 = 𝑍0(2𝜋𝑎휂)−1 is the shunt impedance,
𝑄 = 𝜔0𝑎(2𝑐휂)−1 is the quality factor.
Figure 1.4: Longitudinal impedance for Cu, LCM (solid) and Cu-LCM (dashed) tubes.
Figure 1.4 presents the field matching based exact numerical simulations of
longitudinal impedance for copper (Cu, 𝜎1 = 5.8 × 107 Ω−1𝑚−1) tube internally coated by
the low conductivity metal (LCM, 𝜎1 = 5 × 103 Ω−1𝑚−1 ) of 𝑑 = 1 𝜇𝑚 and 𝑑 = 0.25 𝜇𝑚
thickness. The radius of tube is 𝑎 = 1 𝑐𝑚. As is seen, in the transition region for thin LCM
layer the impedance modified to narrow band resonance at the frequency 𝑓0 = 𝜔0/2𝜋,
corresponding to 𝑓0 = 0.675 𝑇𝐻𝑧 for 𝑑 = 1 𝜇𝑚 and 𝑓0 = 1.35 𝑇𝐻𝑧 for 𝑑 = 0.25 𝜇𝑚 . The
impedance has a different nature for single and two-layer tubes. It has a broadband
maximum for the single layer tube and narrow band resonance at high frequency ω for
two-layer tube. An important feature is that the resonance is observed when the inner layer
thickness is less than the layer skin depth. Thus, the resonance is conditioned by the
interference of scattered electromagnetic fields from the inner and outer layers.
- 16 -
The radiation pattern at the open end of the waveguide can be evaluated by using
from near to far fields transformation technique.
Figure 1.5: Radiation pattern for frequencies 𝑓 = 1.35 𝑇𝐻𝑧 (solid) and 𝑓 = 4.7 𝑇𝐻𝑧 (dashed).
Fig. 1.5 presents the angular distribution of the normalized radiation intensity with
respect to waveguide axis 휃 = 0 for the internal layer thickness of 𝑑 = 0.25 𝜇𝑚 and
resonant frequencies 𝑓 = 4.7 𝑇𝐻𝑧 (𝑎 = 1 𝑚𝑚) and 𝑓 = 1.35 𝑇𝐻𝑧 (𝑎 = 1 𝑐𝑚). The radiation
pattern is zero at 휃 = 0 and reaches its maximum value at 휃 = 𝑎𝑟𝑐𝑠𝑖𝑛(2.3√𝑑/2𝑎).
1.4. Slow waves in flat structures
In this section, we determine the dispersion relations that determine the
eigenfrequencies of the electromagnetic oscillations of the structure consisting of two
infinite parallel planes, each of which is covered from the inside by a thin conducting layer.
The metal layers are identical: with a thickness 𝑑 and a conductivity 𝜎. The permittivity of
the layers is characterized by the expression 휀 = 휀′ + 𝑗 𝜎 𝜔⁄ , where 휀′ the static permittivity
of the metal (for most metals 휀′ = 휀0, where 휀0 is the permittivity of vacuum, for germanium
휀′ = 16휀0) and 𝜔 is a frequency. The distance between the inner surfaces of the plates 2𝑎.
The solution for the natural electromagnetic oscillations (eigen-oscillations) of the
structure is sought by the method of partial regions. In the case under consideration, we
can distinguish three regions: the region of the upper (𝑎 ≤ 𝑦 ≤ 𝑎 + 𝑑, 𝑖 = 1) and lower
(−𝑎 − 𝑑 ≤ 𝑦 ≤ 𝑎, 𝑖 = −1) metal layer and the vacuum region between the plates (−𝑎 ≤
- 17 -
𝑦 ≤ 𝑎, 𝑖 = 0). In the outer ideally conducting layers, the fields and currents are absent.
Since all three regions have finite dimensions along the transverse direction, in each of
them can propagate quasi-plane waves with both damped and increasing amplitudes.
Thus, in each of the three regions, the fields can be written in an identical form. In
particular, electrical components in each of the three regions (𝑖 = 0, ±1) are written as:
𝐸𝑥,𝑦,𝑧(𝑖)
= 𝐸1,𝑥,𝑦,𝑧(𝑖)
+ 𝐸2,𝑥,𝑦,𝑧(𝑖)
(1.11)
with
𝐸1,2,𝑥,𝑦,𝑧(𝑖) (𝑟) = ∫ ∫ �̃�1,2,𝑥,𝑦,𝑧
(𝑖)𝑑𝑘𝑥𝑑𝑘𝑧𝑑𝑘
∞
−∞
∞
−∞ (1.12)
where
�̃�1,2,𝑥(𝑖)
= 𝐴1,2,𝑥 {𝑆ℎ (𝑘𝑦
(𝑖)𝑦)
𝐶ℎ (𝑘𝑦(𝑖)𝑦)} 𝑒𝑗(𝑘𝑥𝑥+𝑘𝑧𝑧−𝜔𝑡)
�̃�1,2,𝑦(𝑖)
= 𝐴1,2,𝑦 {𝐶ℎ (𝑘𝑦
(𝑖)𝑦)
𝑆ℎ (𝑘𝑦(𝑖)𝑦)} 𝑒𝑗(𝑘𝑥𝑥+𝑘𝑧𝑧−𝜔𝑡)
�̃�1,2,𝑧(𝑖)
= 𝐴1,2,𝑧 {𝑆ℎ (𝑘𝑦
(𝑖)𝑦)
𝐶ℎ (𝑘𝑦(𝑖)𝑦)} 𝑒𝑗(𝑘𝑥𝑥+𝑘𝑧𝑧−𝜔𝑡)
(1.13)
Here 𝐴1,2,𝑥,𝑦,𝑧 are arbitrary weight coefficients (amplitudes) and 𝜔 = 𝑘𝑐 . The
magnetic field components are determined from electrical field components with the help
of Maxwell equations:
�⃗⃗�1,2(𝑖)(𝑟) =
1
𝑗𝜔𝑟𝑜𝑡 �⃗⃗�±
(𝑖)(𝑟) (1.14)
whence
- 18 -
�̃�1,2,𝑥(𝑖) =
1
𝑗𝜔(𝑘𝑦
(𝑖)𝐴1,2,𝑧(𝑖) − 𝑗𝑘𝑧𝐴1,2,𝑦
(𝑖) ) {𝐶ℎ(𝑘𝑦
(𝑖)𝑦)
𝑆ℎ(𝑘𝑦(𝑖)𝑦)} 𝑒𝑗(𝑘𝑥𝑥+𝑘𝑧𝑧−𝜔𝑡)
�̃�1,2,𝑦(𝑖) = −
1
𝜔(𝑘𝑥𝐴1,2,𝑧
(𝑖) − 𝑘𝑧𝐴1,2,𝑥(𝑖) ) {
𝑆ℎ(𝑘𝑦(𝑖)𝑦)
𝐶ℎ(𝑘𝑦(𝑖)𝑦)
} 𝑒𝑗(𝑘𝑥𝑥+𝑘𝑧𝑧−𝜔𝑡)
�̃�1,2,𝑥(𝑖)
= −1
𝑗𝜔(𝑘𝑦
(𝑖)𝐴1,2,𝑥(𝑖)
− 𝑗𝑘𝑧𝐴1,2,𝑦(𝑖) ) {
𝐶ℎ(𝑘𝑦(𝑖)𝑦)
𝑆ℎ(𝑘𝑦(𝑖)𝑦)
} 𝑒𝑗(𝑘𝑥𝑥+𝑘𝑧𝑧−𝜔𝑡)
(1.15)
The relationship between the amplitudes 𝐴1,2,𝑧(𝑖)
and 𝐴1,2,𝑥(𝑖) , 𝐴1,2,𝑦
(𝑖) is determined from
the Maxwell equation
𝑑𝑖𝑣�⃗⃗�1,2(𝑖)= 0 (1.16)
whence
𝐴1,2,𝑧(𝑖)
=1
𝑘𝑧(𝑗𝑘𝑦
(𝑖)𝐴1,2,𝑥(𝑖)
− 𝑘𝑥𝐴1,2,𝑥(𝑖)
) (1.17)
To determine the relationship between wave numbers and frequency we use the
identity, which follows from Eq. 1.13
𝑟𝑜𝑡 𝑟𝑜𝑡�⃗⃗�1,2(𝑖)= (𝑘𝑥
2 − (𝑘𝑦(𝑖))2+ 𝑘𝑧
2) �⃗⃗�1,2(𝑖)(𝑘𝑥, 𝑘𝑧, 𝑘, 𝑟) (1.18)
and the equation, which is a consequence of Maxwell's equations:
𝑟𝑜𝑡 𝑟𝑜𝑡�⃗⃗�±(𝑖)= 𝑘2휀𝑖
′𝜇𝑖′�⃗⃗�±(𝑖)
(1.19)
with 휀𝑖′, 𝜇𝑖
′ relative electric and magnetic permeability in the respective regions (휀±1′ = 1 +
𝑗 𝜎 휀0𝜔, 𝜇±1′ = 1⁄ ; 휀0
′ = 𝜇0′ = 1), and 𝑘 = 𝜔 𝑐⁄ .
Comparing Eq. 1.18 and Eq. 1.19, we obtain
𝑘𝑦(𝑖)= √−𝑘2휀𝑖
′𝜇𝑖′ + 𝑘𝑥
2 + 𝑘𝑧2 (1.20)
For inner (vacuum) part of structure
𝑘𝑦(0)= √−𝑘2 + 𝑘𝑥
2 + 𝑘𝑧2 (1.21)
- 19 -
To construct the dispersion relations (relationship between 𝑘𝑥 and k) one should set
up a system of linear equations based on fields matching at the boundaries of the structure
areas:
1. 𝐸𝑥(1)= 0, 𝐸𝑧
(1)= 0 at 𝑦 = 𝑎 + 𝑑
(1.22)
2. 𝐸𝑥(1) = 𝐸𝑥
(0), 𝐸𝑧(1) = 𝐸𝑧
(0); 𝐵𝑥(1) = 𝐵𝑥
(0), 𝐵𝑧(1) = 𝐵𝑧
(0) at 𝑦 = 𝑎
3. 𝐸𝑥(−1) = 𝐸𝑥
(0), 𝐸𝑧(−1) = 𝐸𝑧
(0); 𝐵𝑥(−1) = 𝐵𝑥
(0), 𝐵𝑧(−1) = 𝐵𝑧
(0) at 𝑦 = −𝑎
4. 𝐸𝑥(−1)
= 0, 𝐸𝑧(−1)
= 0 at 𝑦 = −𝑎 − 𝑑
As a result, a system of 12 equations containing 12 unknown amplitudes is obtained.
Dispersion relations are determined by equating to zero the determinant of this system,
which takes the form consisting of the product of four factors:
𝐷 = ∏ 𝑇𝑖4𝑖=1 = 0 (1.23)
where
𝑇1 = 𝑘𝑦(1)𝐶ℎ (𝑑𝑘𝑦
(1))𝑆ℎ (𝑎𝑘𝑦(0)) + 𝑘𝑦
(0)𝑆ℎ (𝑑𝑘𝑦(1))𝐶ℎ (𝑎𝑘𝑦
(0))
𝑇2 = 𝑘𝑦(1)𝐶ℎ (𝑑𝑘𝑦
(1))𝐶ℎ (𝑎𝑘𝑦(0)) + 𝑘𝑦
(0)𝑆ℎ (𝑑𝑘𝑦(1))𝑆ℎ (𝑎𝑘𝑦
(0))
𝑇3 = 𝑘𝑦(0)(𝑘𝑦(1)2
− 𝑘𝑥2 − 𝑘𝑧
2)𝐶ℎ (𝑑𝑘𝑦(1)) 𝑆ℎ (𝑎𝑘𝑦
(0)) + 𝑘𝑦
(1)(𝑘𝑦(0)2
− 𝑘𝑥2 − 𝑘𝑧
2) 𝑆ℎ (𝑑𝑘𝑦(1))𝐶ℎ (𝑎𝑘𝑦
(0))
𝑇4 = 𝑘𝑦(0) (𝑘𝑦
(1)2 − 𝑘𝑥2 − 𝑘𝑧
2)𝐶ℎ (𝑑𝑘𝑦(1))𝐶ℎ (𝑎𝑘𝑦
(0)) + 𝑘𝑦(1) (𝑘𝑦
(0)2 − 𝑘𝑥2 − 𝑘𝑧
2)𝑆ℎ (𝑑𝑘𝑦(1)) 𝑆ℎ (𝑎𝑘𝑦
(0))
(1.24)
Taking into account 𝑘𝑦(𝑖) = √−𝑘2휀𝑖
′𝜇𝑖′ + 𝑘𝑥2 + 𝑘𝑧2 from Eq. 1.18, instead of 𝑇3 and 𝑇4
we can write
𝑇3 = −𝑘𝑦(0)𝑘2휀𝑖
′𝜇𝑖′𝐶ℎ(𝑑𝑘𝑦
(1))𝑆ℎ(𝑎𝑘𝑦(0)) − 𝑘𝑦
(1)𝑘2𝑆ℎ(𝑑𝑘𝑦
(1))𝐶ℎ(𝑎𝑘𝑦(0))
𝑇4 = −𝑘𝑦(0)𝑘2휀𝑖
′𝜇𝑖′𝐶ℎ(𝑑𝑘𝑦
(1))𝐶ℎ(𝑎𝑘𝑦(0)) − 𝑘𝑦
(1)𝑘2𝑆ℎ(𝑑𝑘𝑦(1))𝑆ℎ(𝑎𝑘𝑦
(0)) (1.25)
The equality to zero of each of the factors (𝑇𝑖 = 0, 𝑖 − 1,2,3,4) determines an
independent system of natural oscillations of the structure.
The radiation generated by a particle is synchronous with its motion. The spectral
components of its radiation field have a phase velocity equal to the speed of light 𝑣𝑝ℎ =
𝜔 𝑘⁄ = 𝑐. In this case, the direction of motion of the particle (direction along the z axis) is
- 20 -
distinguished. In the case of natural electromagnetic oscillations, determined in the
absence of a particle or some other source of radiation, the directions along both
horizontal axes �⃗� and 𝑧 are equivalent. This circumstance manifests itself in a symmetrical
form of the dependence of the frequency 𝑘 = 𝜔 𝑐⁄ on the wave numbers 𝑘𝑥 and 𝑘𝑧 (1.21):
𝑘 = √𝑘𝑥2 + 𝑘𝑧
2 − 𝑘𝑦(0)2
(1.26)
The phase velocity of the eigenfunctions of the structure has the form:
𝑣𝑝ℎ = 𝜔 𝑘𝑧⁄ =𝑘
𝑘𝑧𝑐 =
√𝑘𝑥2+𝑘𝑧
2−𝑘𝑦(0)2
𝑘𝑧𝑐 (1.27)
As can be seen from Eq. 1.27, the phase velocity of the natural oscillations is equal
to the velocity of the particle (the speed of light in a vacuum) under condition 𝑘 = 𝑘𝑧. The
amplitudes 𝐴1,2,𝑥,𝑦,𝑧 are then written in a form containing the Dirac delta function: 𝐴1,2,𝑥,𝑦,𝑧 =
�̃�1,2,𝑥,𝑦,𝑧𝛿(𝑘 − 𝑘𝑧). Taking into account 𝑘 = 𝑘𝑧 the vertical wave numbers 𝑘𝑦(𝑖)
will take the
form 𝑘𝑦(𝑖) = √𝑘2(1 − 휀𝑖
′𝜇𝑖′) + 𝑘𝑥2 + 𝑘𝑧2 for 𝑖 = ±1 (in layers) and 𝑘𝑦
(0) = 𝑘𝑥 at 𝑖 = 0 (in the
inner vacuum region)
Thus, for synchronous eigenmodes generated by a particle, instead of (1.24, 1.25),
one can write (by replacing 𝑘𝑦(0)
with 𝑘𝑥)
𝑇1 = 𝑘𝑦(1)𝐶ℎ (𝑑𝑘𝑦
(1)) 𝑆ℎ(𝑎𝑘𝑥) + 𝑘𝑥𝑆ℎ (𝑑𝑘𝑦
(1)) 𝐶ℎ(𝑎𝑘𝑥)
𝑇2 = 𝑘𝑦(1)𝐶ℎ (𝑑𝑘𝑦
(1))𝐶ℎ(𝑎𝑘𝑥) + 𝑘𝑥𝑆ℎ (𝑑𝑘𝑦
(1)) 𝑆ℎ(𝑎𝑘𝑥)
𝑇3 = −𝑘𝑥𝑘2휀𝑖′𝜇𝑖′𝐶ℎ (𝑑𝑘𝑦
(1)) 𝑆ℎ(𝑎𝑘𝑥) − 𝑘𝑦
(1)𝑘2𝑆ℎ (𝑑𝑘𝑦
(1)) 𝐶ℎ(𝑎𝑘𝑥)
𝑇4 = −𝑘𝑥𝑘2휀𝑖′𝜇𝑖′𝐶ℎ (𝑑𝑘𝑦
(1))𝐶ℎ(𝑎𝑘𝑥) − 𝑘𝑦
(1)𝑘2𝑆ℎ (𝑑𝑘𝑦
(1)) 𝑆ℎ(𝑎𝑘𝑥)
(1.28)
Let us compare the obtained expressions 1.28 with the denominators of the
impedance (Eq. 2.45) obtained in Chapter 2 writing them in a form convenient for
comparison
- 21 -
𝑅1𝐶
𝑅2𝐶} = ±{
𝑘𝑦(1)
𝑘𝑥𝑘2휀𝑖′𝜇𝑖′}𝐶ℎ(𝑘𝑦
(1)𝑑)𝐶ℎ(𝑘𝑥𝑎1) ± {𝑘𝑥
𝑘𝑦(1)𝑘2} 𝑆ℎ(𝑘𝑦
(1)𝑑)𝑆ℎ(𝑘𝑥𝑎1)
𝑅1𝑆
𝑅2𝑆} = ±{
𝑘𝑦(1)
𝑘𝑥𝑘2휀𝑖′𝜇𝑖′}𝐶ℎ(𝑘𝑦
(1)𝑑)𝑆ℎ(𝑘𝑥𝑎1) ± {𝑘𝑥
𝑘𝑦(1)𝑘2} 𝑆ℎ(𝑘𝑦
(1)𝑑)𝐶ℎ(𝑘𝑥𝑎1)
(1.29)
The comparison gives a complete coincidence of the expressions 1.28 and 1.29
𝑇1 = 𝑅1𝑆, 𝑇2 = 𝑅1
𝐶 , 𝑇3 = 𝑅2𝑆, 𝑇4 = 𝑅2
𝐶 (1.30)
Thus, the complex roots of the dispersion equations (𝑇𝑖 = 0, 𝑖 = 1,2,3,4) are the
poles of impedance function on the complex plane 𝑘𝑥. When the particle moves along the
symmetry plane of the structure (Δ𝑦 = 0), only two dispersion equations are realized: 𝑇2 =
0 and 𝑇4 = 0. With a parallel offset of the particle from the horizontal plane of symmetry
(Δ𝑦 ≠ 0), all four dispersion equations are realized: 𝑇𝑖 = 0, 𝑖 = 1,2,3,4.
In the approximation 𝑘𝑥2 ≪ 𝑍0𝜎𝑘𝑧 or 𝑘𝑦
(1) ≈ √−𝑗𝑍0𝜎𝑘𝑧 , (in the cylindrical case this
approximation is equivalent to approximation for the permittivity of the metal 휀 ≈ 𝑗 𝜎 𝜔⁄ ,
which is valid for not very large frequencies), the expressions (1.28) or (1.29) become
analytic on the complex plane 𝑘𝑥 , which allows us to calculate directly the integral
functions through which the impedance is expressed using the residue theorem [62].
The final form of the second and fourth equations (1.28) is
𝑘𝑥𝑇ℎ(𝑎𝑘𝑥) = −√−𝑗𝑍0𝜎𝑘𝐶𝑡ℎ(𝑑√−𝑗𝑍0𝜎𝑘)
𝑇ℎ(𝑎𝑘𝑥)
𝑘𝑥=√−𝑗𝜎𝑍0𝑘
𝑘2𝐶𝑡ℎ(𝑑√−𝑗𝜎𝑍0𝑘)
(1.31)
At a fixed frequency, the right-hand sides of Eq. 1.31 are constant (independent of
the wave number 𝑘𝑥 to be determined). Equations (1.31) can be expressed through
dimensionless parameters �̃�𝑥 = 𝑎𝑘𝑥 , �̃� = 𝑘𝑑, �̃� = 𝑑 𝑎⁄ and 𝜉 = 𝑍0𝜎𝑑:
𝐶𝑡ℎ(�̃�𝑥)
�̃�𝑥= −�̃�
𝑡ℎ(√−𝑗𝜉�̃�)
√−𝑗𝜉�̃� (1.32a)
𝑇ℎ(�̃�𝑥)
�̃�𝑥= �̃�√−𝑗𝜉�̃� 𝐶𝑡ℎ (√−𝑗𝜉�̃�) �̃�2⁄ (1.32b)
- 22 -
Fig.1.6. Eigenvalues of a planar two-layer structure. Solutions of equation 1.32a (left) and 1.32b
(right) for the different values of parameter 𝜉 (𝜉 = 1, 2 𝑎𝑛𝑑 5) at a resonance frequency �̃� =
𝑘𝑟𝑒𝑧�̃� = √𝑑 𝑎⁄ , �̃� = 10−4.
Fig.1.7. Eigenvalues of a planar two-layer structure. Solutions of equation 1.32a (left) and 1.32b
(right) in the case of 𝜉 = 1 for the several values of frequency: �̃� = 𝑘𝑟𝑒𝑧�̃� = √𝑑 𝑎⁄ , �̃� = 0.5√𝑑 𝑎⁄ <
𝑘𝑟𝑒𝑧�̃� and �̃� = 1.5√𝑑 𝑎⁄ > 𝑘𝑟𝑒𝑧�̃�; �̃� = 10−4.
Figures 1.6 and 1.7 show the eigenvalue distributions of the synchronous mode of a
two-layered planar structure. On the horizontal and vertical axes, respectively, the
imaginary and real components of the eigenvalues are plotted on the graphs. The graphs
are the result of the exact solution of Equations (1.32a, b). For small right-hand sides of
equations (1.32), their asymptotic solution can be represented as the sum of the solution
for ideally conducting plates (𝑘𝑥0𝑎 = 𝑗 𝜋 2⁄ + 𝑗𝜋(𝑛 − 1) for Equation (1.32a) and 𝑘𝑥0𝑏 = 𝑗𝜋𝑛
for Equation (1.32b), 𝑛 = 1,2,4, … ) and a small additive 𝛼𝑎(𝑏) , taking into account the
presence of the inner coating:
- 23 -
𝑘𝑥𝑎(𝑏) = 𝑗𝑘𝑥0𝑎(𝑏) + 𝛼𝑎(𝑏), 𝛼𝑎(𝑏) = −𝑗𝑑𝑎(𝑏)𝑘0𝑎(𝑏)
1±𝑑𝑎(𝑏) (1.33)
where
𝑑𝑎 = �̃� 𝑡ℎ (√−𝑗𝜉�̃�) √−𝑗𝜉�̃�⁄ , 𝑑𝑏 = �̃�√−𝑗𝜉�̃� 𝐶𝑡ℎ (√−𝑗𝜉�̃�) �̃�2⁄ (1.34)
The smallness of the parameters 𝑑𝑎(𝑏) (1.34) is conditioned by not only due to the
smallness of the relative thickness of the layer �̃�, but also to the smallness of the other
factors included in this parameter. Thus, for �̃� = 10−4 and 𝜉 = 1 at the resonant frequency
�̃� = √𝑑 𝑎⁄ , the parameter 𝑑𝑏 is of the order of unity (⌊𝑑𝑏⌋ ≈ 1).
The eigenvalues 𝑘𝑥𝑎 (solutions of the equation (1.32a)) within the parameters
shown in Figures 1.6, 1.7 (left), are approximated rather well by the formula (1.33). They
are characterized by imaginary components closed enough to the eigenvalues of the
structure consisting of two parallel ideally conducting planes (𝐼𝑚𝑘𝑥𝑎 ≈ 𝑘𝑥𝑎0), and by small
real additions, whose values decrease with increasing parameter 𝜉 (Fig.1.6, left). We note
that for fixed values of the parameter 𝜉 , small real corrections increase linearly with
increasing imaginary components (Fig. 1.6, 1,7, left) on x axis and decreases with
increasing frequency (Fig. 1,7, left).
The behavior of sequences of eigenvalues 𝑘𝑏 (solutions of equation (1.32б)) is
much more complicated. Their real components are two or three orders of magnitude
smaller than the corresponding roots of equation (1.32a). For small 𝜉 (𝜉 = 1 and 𝜉 = 2 on
Figure 1.6, right) they decrease exponentially with increasing imaginary components,
deposited on the horizontal axis. With an increase of the parameter 𝜉, the lower values
begin to increase to a certain limit, and then the increase goes down (𝜉 = 5 on Figure 1.6,
right). In contrast to the eigenvalues of 𝑘𝑎 (solutions of equation (1.32a)), there is a
general increase of the real components of eigenvalues with increasing of parameter 𝜉
(Figure 1.6, right). The reverse order is also valid for fixed values of 𝜉: lower frequencies
correspond to smaller values of the real components of the eigenvalues 𝑘𝑏. In contrast to
the real values of 𝑘𝑎, they increase with increasing frequency (Fig. 1.7, right).
- 24 -
The essential difference between the imaginary components of the eigenvalues 𝑘𝑏
and the corresponding values for ideally conducting parallel planes is explained by the
magnitude of the parameter 𝑑𝑏 (1.34): its smallness is ensured at very low relative
thicknesses of the metallic layer �̃� (�̃� ≪ 1)or at sufficiently high frequencies (�̃� ≫ �̃�𝑟𝑒𝑧).
1.5 Summary
The first chapter establishes the connection between the radiation of a charged
particle and the synchronous electromagnetic eigenmodes of two-layer cylindrical and flat
metal structures.
For a two-layered metal cylindrical waveguide, it is shown, that a single slowly-
propagated (with phase velocity equal to the speed of light) 𝑇𝑀01 mode at certain
frequency (resonant frequency 𝑘 = √1 𝑟0𝑑⁄ , 𝑟0 inner radius of waveguide, 𝑑 inner layer
thickness) is in phase with a radiation field of a charged particle and synchronized with the
ultra-relativistic particle, moving along the waveguide axis. This circumstance is clearly
demonstrated in Figure 1.2, where only one dispersion curve corresponding to the above-
mentioned mode intersects a line describing the phase velocity equal to the speed of light.
The important results of this Chapter also include the calculation of the attenuation
coefficient of the synchronous mode for the resonance frequency (Eq. 1.8), which is
defined as the real component of its phase.
The remarkable properties of the phase of the synchronous mode, presented on
Figure 1.3, are also determined.
The second main direction of this chapter is to investigate the mechanism of
synchronization of the electromagnetic eigen-oscillations of a two-layer flat metallic
structure.
Equations for the eigenvalue numbers of free vibrations in the structure under
consideration are obtained. A subsystem of free oscillations, synchronous with a particle,
moving along a rectilinear trajectory parallel to the symmetry plane of structure, is
distinguished from the complete set of free oscillations. Equations for eigenvalues are
obtained both for a complete system of free oscillations and for their synchronous
- 25 -
subsystem. A unique relationship is established between the roots of the equations for
synchronous oscillations and the complex poles of the integrand for the longitudinal
impedance. Based on graphic constructions, the regularities of the behavior of eigenvalues
are analyzed.
Important difference between the mechanisms of formation of synchronous
oscillations for two-layered cylindrical and planar structures should be mentioned. In the
first case, we have a single synchronous mode, with synchronization being achieved only
at the resonant frequency 𝑘 = √2 𝑟0𝑑⁄ . In the second case, there is an infinite set of eigen-
oscillations, synchronous on the entire infinite frequency range. The radiation field of a
particle is formed by the total contribution of the entire infinite sequence of natural
synchronous oscillations of the structure.
As will be shown in the Second Chapter, the result of the total contribution of
synchronous oscillations is radiation with a narrow-band frequency spectrum and a single
resonant frequency 𝑘 = √1 𝑎𝑑⁄
- 26 -
Chapter 2: Accelerating structures with flat geometry
2.1 Introduction
Impedances and wake functions in multilayer cylindrical structure are studied in [55].
It is shown that under certain conditions there is a narrow-band longitudinal impedance in
the structure. The study of dispersive relations of a two-layer cylindrical structure shows
that in the same conditions the structure becomes a high frequency single slowly (𝑣 < 𝑐)
traveling wave structure. Single-mode structures are good candidates both for novel
accelerating structures and as a source of high frequency monochromatic radiation. As it
is shown in previous chapter, a single-mode structure can be used also for bunch
compression and for microbunching. To be a high frequency single-mode structure, it
requires a high accuracy 𝜇𝑚 – sub-𝜇𝑚 low conductivity internal coating, and an inner
diameter of order of several 𝑚𝑚, which is technically complex problem for structures with
𝑚𝑚 diameters.
In this chapter multilayer flat metallic structure is studied as an alternative of the
abovementioned cylindrical structure. Longitudinal impedance and dispersive relations of
the structure are presented, wake fields generated by a particle travelling through the
structure are observed. Analysis of symmetrical and asymmetrical multilayer flat
waveguides are performed. Conditions in which the longitudinal impedance has a narrow-
band resonance are obtained. Comparison of properties of multilayer flat metallic structure
with cylindrical structure are done.
To calculate electromagnetic fields the field matching technique that implies the
continuity of the tangential components of electric and magnetic fields at the borders of
the layers is used for solving Maxwell equation. The matrix formalism described in [55] is
used to couple electromagnetic field tangential components in two borders of a layer.
Longitudinal impedance of the structure and wake fields in it are obtained via Fourier
inverse transformation of electromagnetic fields.
- 27 -
2.2 Multilayer flat structure
We will start with the most general case: structure consists of two parallel multilayer
infinite plates (Figure 2.1). The boundaries between layers are infinite parallel planes. The
number of layers in the top 𝑛(𝑡) and bottom 𝑛(𝑏) plates can generally be unequal (𝑛(𝑡) ≠
𝑛(𝑏)). The filling of layers may be both dielectric or metallic and in general is characterized
by a static complex dielectric permittivity 휀𝑖(𝑢), 𝑖 = 1,2, . . 𝑛(𝑢), 𝑢 = 𝑡, 𝑏, magnetic permeability
𝜇𝑖(𝑢)
and conductivity 𝜎𝑖(𝑢)
. The dielectric constant material layer can be written as 휀�̃�(𝑢) =
휀𝑖(𝑢) + 𝑗 𝜎𝑖
(𝑢) 𝜔⁄ , where 𝜔 is frequency. For the majority of highly conductive metal generally
accepted 휀𝑖(𝑢) = 휀0; for non-magnetic materials 𝜇𝑖
(𝑢) = 𝜇0 (휀0, 𝜇0 permittivity and magnetic
permeability of vacuum). The thickness of 𝑖-th layer is 𝑑𝑖(𝑢)
. The distance from the plane of
symmetry of the vacuum chamber to the boundary planes, separating layers are equal to
𝑎𝑖(𝑢)
; 𝑎𝑖+1(𝑢) = 𝑎𝑖
(𝑢) + 𝑑𝑖(𝑢), 𝑖 = 1,2,3, …𝑛(𝑢) (for upper half-space).The upper and lower
unbounded regions can be filled by an arbitrary medium, electromagnetic properties of
which are characterized by parameters 휀�̃�(𝑢)+1
(𝑢)= 휀
𝑛(𝑢)+1
(𝑢)+ 𝑗 𝜎
𝑛(𝑢)+1
(𝑢)𝜔⁄ , 𝜇
𝑛(𝑢)+1
(𝑢)= 𝜇0.
The point-like charge is traveling through layered metallic tube with velocity 𝒗
parallel to the 𝑧-axis at vertical offset Δ.
Figure 2.1: Geometry of multilayer flat metallic structure.
- 28 -
Maxwell’s equations must be solved to calculate EM fields excited by the point
charge. Cartesian coordinates 𝑟 = (𝑥, 𝑦, 𝑧) are used, where 𝑦 is a direction of vertical axis.
For (𝑛(𝑡), 𝑛(𝑏)) layered tube there are 𝑛(𝑡) + 𝑛(𝑏) + 3 regions (including inner region and
two outer regions of the structure) and 𝑛(𝑡) + 𝑛(𝑏) + 2 borders. The complete number of
matching equations is 4(𝑛(𝑡) + 𝑛(𝑏) + 2) with 4(𝑛(𝑡) + 𝑛(𝑏) + 2) unknown coefficients as in
each border there are four boundary conditions that match tangential (𝐸𝑥, 𝐸𝑧 , 𝐵𝑥, 𝐵𝑧)
components of electromagnetic fields.
Radiation fields are searched by the method of partial areas [64]. The geometry of
the problem divides into three regions where the fields are presented in different ways:
charge existing region −𝑎−1 ≤ 𝑦 ≤ 𝑎1, metallic layers of the structure −𝑎−n(𝑏) < 𝑦 < −𝑎−1
and 𝑎1 < 𝑦 < 𝑎n(𝑡) and outer vacuum region 𝑦 < −a−n(𝑏) and 𝑦 > an(𝑡). In all regions the
solution is sought in the form of the general solution of the homogeneous Maxwell
equations except for the area between the plates, which, to the general solution of the
homogeneous Maxwell equations is added a particular solution of inhomogeneous
Maxwell's equations.
Electromagnetic fields and point charge are presented via Fourier transformation as
𝐸(𝑥, 𝑦, 𝑧) = ∫ �̃�(𝑘𝑥, 𝑦, 𝑘𝑧)𝑒𝑖𝑘𝑥𝑥𝑒𝑖𝑘(𝑧−𝑐𝑡)𝑑𝑘𝑥𝑑𝑘𝑧
∞
−∞
𝜌(𝑥, 𝑦, 𝑧) = ∫ �̃�(𝑘𝑥, 𝑦, 𝑘𝑧)𝑒𝑖𝑘𝑥𝑥𝑒𝑖𝑘𝑧𝑧𝑑𝑘𝑥𝑑𝑘𝑧
∞
−∞
(2.1)
where 𝑘 = 𝜔 𝑡⁄ is the wave number.
Boundary conditions states that tangential components of full electric and magnetic
fields should be continues at layers boundaries.
E𝑥𝑖 (±𝑎𝑖) = E𝑥
𝑖+1(±𝑎𝑖)
E𝑧𝑖 (±𝑎𝑖) = E𝑧
𝑖+1(±𝑎𝑖)
B𝑥𝑖 (±𝑎𝑖) = B𝑥
𝑖+1(±𝑎𝑖)
B𝑧𝑖 (±𝑎𝑖) = B𝑧
𝑖+1(±𝑎𝑖)
(2.2)
where + and − signs corresponds for layer boundaries in the upper and lower regions,
respectively.
- 29 -
An electric charge traveling in the structure produces electromagnetic field which
can be presented as a sum of two parts
𝑬𝒕𝒐𝒕 = 𝑬𝒑 + 𝑬, 𝑩𝒕𝒐𝒕 = 𝑩𝒑 +𝑩 (2.3)
where 𝑬𝐩, 𝑩𝐩 are electric and magnetic fields in the case of perfectly conducting plates and
𝑬,𝑩 are solutions of source free Maxwell’s equations with a metallic current 𝒋 = 𝜎𝑬. The
last ones’ dependence on the source particles comes only with boundary conditions.
Firstly electric 𝑬𝐩 and magnetic 𝑩𝐩 fields in the perfectly conducting parallel plates
with a static charge in the structure are calculated, then fields when there is a charge
traveling in the direction of structure axis can be obtained via Lorentz transformation [64].
Maxwell’s equations for the structure with a static charge 𝜌 in it are
∇ ∙ 𝑬𝒑 =𝜌
𝜀0
∇ ∙ 𝑩𝒑 = 0
∇ × 𝑬𝒑 = 0
∇ × 𝑩𝒑 = 0
(2.4)
where ∇ is a nabla operator.
Using Fourier transformation in Maxwell’s equations and expressing electric field 𝑥
and 𝑦 components via 𝑧 component, the wave equation for a point charge can be derived
𝜕2𝐸𝑝𝑧
𝜕𝑦2− 𝛼2𝐸𝑝𝑧 =
𝑞
4𝜋2𝜀0𝑖𝑘𝑧𝛿(𝑦 − Δ) (2.5)
where 𝛼 = √𝑘𝑥2 + 𝑘𝑧
2 and Δ is the point charge deviation from the center of 𝑦 axis.
The solution of Eq. 2.5 is a sum of homogenous equation solution (�̃�𝑧,ℎ) and a
particular solution (�̃�𝑧,𝑝).
Presenting the solution of homogenous part as a sum of hyperbolic cosine and sine
with unknown coefficients and finding a particular solution by integrating two parts of the
wave equation, its full solution can be obtained.
𝐸𝑝𝑧±(𝑘𝑥, 𝑦, 𝑘𝑧) = −
𝑞𝑖𝑘𝑧
4𝜋2𝛼𝜀0
sinh(𝛼(𝑎±Δ)) sinh(𝛼(𝑎∓𝑦))
sinh(2𝛼𝑎) (2.6)
- 30 -
where + sign stand for an electric field in upper part of the structure (𝑦 > Δ ) and – for an
electric field in lower part (𝑦 < Δ ).
𝑥 and 𝑦 component of the electric field can be obtained via Faraday’s low and
magnetic field is zero for a static charge.
𝐸𝑝𝑥±(𝑘𝑥, 𝑦, 𝑘𝑧) = −
𝑞𝑖𝑘𝑥
4𝜋2𝛼𝜀0
𝑠𝑖𝑛ℎ(𝛼(𝑎∓𝑦)) 𝑠𝑖𝑛ℎ(𝛼(𝑎±𝛥))
𝑠𝑖𝑛ℎ(2𝛼𝑎)
𝐸𝑝𝑦±(𝑘𝑥, 𝑦, 𝑘𝑧) = ±
𝑞
4𝜋2𝜀0
𝑐𝑜𝑠(𝛼(𝑎∓𝑦)) 𝑠𝑖𝑛ℎ(𝛼(𝑎±𝛥))
𝑠𝑖𝑛ℎ(2𝛼𝑎)
(2.7)
The Fourier components of the electromagnetic fields of a moving charge can be
obtained via Lorentz transformation
𝐸𝑝𝑧±(𝑘𝑥, 𝑦, 𝑘𝑧) = −
1
𝛾2𝑞𝑗𝑘𝑧
4𝜋2𝑘𝑥𝜀0
sinh(𝑘𝑥(𝑎±Δ)) sinh(𝑘𝑥(𝑎∓𝑦))
sinh(2𝑘𝑥𝑎)
𝐸𝑝𝑥±(𝑘𝑥, 𝑦, 𝑘𝑧) = 𝛾
2 𝑘𝑥
𝑘𝑧𝐸𝑝𝑧± (𝑘𝑥, 𝑦, 𝑘𝑧)
𝐸𝑝𝑦±(𝑘𝑥, 𝑦, 𝑘𝑧) = ±𝛾
2𝑗𝑘𝑥
𝑘𝑧coth(𝑘𝑥(𝑎 ∓ 𝑦))𝐸𝑝𝑧
± (𝑘𝑥, 𝑦, 𝑘𝑧)
𝐵𝑝𝑧±(𝑥, 𝑦, 𝑧) = 0
𝐵𝑝𝑥±(𝑘𝑥, 𝑦, 𝑘𝑧) =
𝑣
𝑐2𝐸𝑝𝑦± (𝑘𝑥, 𝑦, 𝑘𝑧)
𝐵𝑝𝑦±(𝑘𝑥, 𝑦, 𝑘𝑧) = −
𝑣
𝑐2𝐸𝑝𝑥± (𝑘𝑥, 𝑦, 𝑘𝑧)
(2.8)
note that variable of integration is replaced by 𝑘𝑧 → 𝑘𝑧′ 𝛾⁄ and 𝛼 = √𝑘𝑥
2 + (𝑘𝑧′
𝛾)2
≈ 𝑘𝑥.
We write fields in Eq. 2.8 in the form of plane waves
𝐸𝑝𝑥,𝑦,𝑧 = 𝐸1,𝑝𝑥,𝑦,𝑧 + 𝐸2,𝑝𝑥,𝑦,𝑧 = 𝐴1,𝑥,𝑦,𝑧(±)
𝑒(∓)𝑘𝑎𝑒−𝑘𝑦 + 𝐴2,𝑥,𝑦,𝑧(±)
𝑒(±)𝑘𝑎𝑒−𝑘𝑦
𝐵𝑝𝑥,𝑦,𝑧 = 𝐵1,𝑝𝑥,𝑦,𝑧 + 𝐵2,𝑝𝑥,𝑦,𝑧 = 𝐵1,𝑥,𝑦,𝑧(±)
𝑒(∓)𝑘𝑎𝑒−𝑘𝑦 + 𝐵2,𝑥,𝑦,𝑧(±)
𝑒(±)𝑘𝑎𝑒−𝑘𝑦 (2.9)
where
𝐴1,𝑧(±)= −𝑗𝛾−2
𝑞𝑘𝑧
8𝜋2𝜀0𝑘cosh(2𝑘𝑎) sinh(𝑘(𝑎 ± ∆)) 𝐴2,𝑧
(±)= −𝐴1,,𝑧
(±)
𝐴1,𝑥(±)= −𝑗
𝑞𝑘𝑥
8𝜋2𝜀0𝑘𝐶𝑠ℎ(2𝑘𝑎)𝑆ℎ{𝑘(𝑎 ± ∆)} = 𝛾2𝐴1,𝑧
(±)𝐴2,𝑧(±)= −𝐴2,𝑧
(±)
𝐴1,𝑦(±)= ±
𝑞
8𝜋2𝜀0𝐶𝑠ℎ(2𝑘𝑎)𝑆ℎ{𝑘(𝑎 ± ∆)} 𝐴2,𝑦
(±)= 𝐴2,,𝑦
(±)
(2.10)
On the metallic surfaces the electromagnetic field components are
- 31 -
𝐸𝑝𝑥(𝑘𝑥, ±𝑎, 𝑘𝑧) = 𝐸𝑝𝑧
(𝑘𝑥, ±𝑎, 𝑘𝑧) = 0
𝐸𝑝𝑦(𝑘𝑥, ±𝑎, 𝑘𝑧) =
𝑞
4𝜋2𝜀0
sinh(𝑘𝑥(Δ±𝑎))
sinh(2𝑘𝑥𝑎)
𝐵𝑝𝑥(𝑘𝑥, ±𝑎, 𝑘𝑧) =
𝑞
4𝜋2𝜀0
𝑣
𝑐2
sinh(𝑘𝑥(Δ±𝑎))
sinh(2𝑘𝑥𝑎)
𝐵𝑝𝑦(𝑘𝑥, ±𝑎, 𝑘𝑧) = 𝐵𝑝𝑧
(𝑘𝑥, ±𝑎, 𝑘𝑧) = 0
(2.11)
The only non-zero tangential component at the boundaries 𝑦 = ±𝑎 is a component
𝐵𝑝𝑥, which in ultrarelativistic approximation (𝑣 → 𝑐) is
𝐵𝑝𝑥(𝑘𝑥, ±𝑎, 𝑘𝑧) =
𝑞
4𝜋2𝜀0𝑐
sinh(𝑘𝑥(Δ±𝑎))
sinh(2𝑘𝑥𝑎) (2.12)
As it was mentioned, the total electromagnetic field excited by a point charge
traveling in the multilayer structure was presented as a sum of two parts. Now the second
part of total electromagnetic field will be calculated, i.e. solutions of the source free
Maxwell’s equations with a metallic current 𝒋 = 𝜎𝑬. The solution inside layers is sought in
the form of the general solution of the homogenous Maxwell’s equations.
𝑬(𝑖)(𝑥, 𝑦, 𝑧) = 𝑬1(𝑖)(𝑥, 𝑦, 𝑧) + 𝑬2
(𝑖)(𝑥, 𝑦, 𝑧)
𝑩(𝑖)(𝑥, 𝑦, 𝑧) = 𝑩1(𝑖)(𝑥, 𝑦, 𝑧) + 𝑩2
(𝑖)(𝑥, 𝑦, 𝑧) (2.13)
where
𝑬1,2(𝑖)(𝑥, 𝑦, 𝑧) = ∫ ∫ 𝑬1,2
(𝑖)(𝑘𝑥, 𝑦, 𝑘𝑧)𝑒𝑗(𝑘𝑥𝑥+𝑘𝑧(𝑧−𝑣𝑡))
∞
−∞𝑑𝑘𝑥𝑑𝑘
∞
−∞
𝑩1,2(𝑖)(𝑥, 𝑦, 𝑧) = ∫ ∫ 𝑩1,2
(𝑖)(𝑘𝑥, 𝑦, 𝑘𝑧)𝑒𝑗(𝑘𝑥𝑥+𝑘𝑧(𝑧−𝑣𝑡))
∞
−∞𝑑𝑘𝑥𝑑𝑘
∞
−∞
(2.14)
with
𝑬1,2(𝑖)(𝑘𝑥, 𝑦, 𝑘𝑧) = 𝑨1,2
(𝑖)𝑒∓𝑘𝑦
(𝑖)𝑦
𝑩1,2(𝑖)(𝑘𝑥, 𝑦, 𝑘𝑧) =
𝑒−𝑗(𝑘𝑥𝑥+𝑘𝑧(𝑧−𝑣𝑡))
𝑗𝑘𝑧𝑣𝑟𝑜𝑡 [𝑬1,2
(𝑖)(𝑘𝑥, 𝑦, 𝑘𝑧)𝑒𝑗(𝑘𝑥𝑥+𝑘𝑧(𝑧−𝑣𝑡))]
(2.15)
For the inner region (−𝑎−1 < 𝑦 < 𝑎1) we should add the partial solution (𝑬𝑝, 𝑩𝑝) of
inhomogeneous Maxwell’s equation (Eq. 2.8) to the general solution of homogeneous
Maxwell’s equation
- 32 -
𝑬(0)(𝑥, 𝑦, 𝑧) = 𝑬1(𝑖)(𝑥, 𝑦, 𝑧) + 𝑬2
(𝑖)(𝑥, 𝑦, 𝑧) + 𝑬𝑝(𝑥, 𝑦, 𝑧)
𝑩(0)(𝑥, 𝑦, 𝑧) = 𝑩1(𝑖)(𝑥, 𝑦, 𝑧) + 𝑩2
(𝑖)(𝑥, 𝑦, 𝑧) + 𝑩𝑝(𝑥, 𝑦, 𝑧) (2.16)
Finally, for the upper and lower outer regions fields are sought in the form of
vanishing at infinity (at 𝑦 → ±∞)
𝑬(𝑛(𝑡)+1)(𝑥, 𝑦, 𝑧) = 𝑬1
(𝑛(𝑡)+1)(𝑥, 𝑦, 𝑧)
𝑩(𝑛(𝑡)+1)(𝑥, 𝑦, 𝑧) = 𝑩1
(𝑛(𝑡)+1)(𝑥, 𝑦, 𝑧)
𝑬(−𝑛(𝑏)−1)(𝑥, 𝑦, 𝑧) = 𝑬2
(−𝑛(𝑏)−1)(𝑥, 𝑦, 𝑧)
𝑩(−𝑛(𝑏)−1)(𝑥, 𝑦, 𝑧) = 𝑩2
(−𝑛(𝑏)−1)(𝑥, 𝑦, 𝑧)
(2.17)
for top (𝑦 > 𝑎𝑛(𝑡)+1) and bottom (𝑦 < −𝑎−𝑛(𝑏)−1) regions, respectively.
As it is mentioned, we obtain a system of 4(𝑁 +𝑀 + 2) equations for the same
number of unknown amplitudes. Amplitudes 𝐴𝑧,1𝑖 and 𝐴𝑧,2
𝑖 can be presented by 𝐴𝑥,1𝑖 , 𝐴𝑦,1
𝑖
and 𝐴𝑥,2𝑖 , 𝐴𝑦,2
𝑖 𝐴𝑥,1 via Gauss’s low
𝐴𝑧,1𝑖 = −
𝑘𝑥𝐴𝑥,1𝑖 +𝑖𝑘𝑦
𝑖 𝐴𝑦,1𝑖
𝑘𝑧
𝐴𝑧,2𝑖 = −
𝑘𝑥𝐴𝑥,2𝑖 −𝑖𝑘𝑦
𝑖 𝐴𝑦,2𝑖
𝑘𝑧
(2.18)
and magnetic field components can be derived via Faraday’s low.
To determine the electromagnetic field we will use the field matching technique that
implies the continuity of the tangential components of electromagnetic fields at the borders
of layers (𝑦 = ±𝑎𝑖). We are interested in tangential components of fields, so we will
introduce the tangential field vector �̂�𝑖(𝐸𝑥𝑖, 𝐸𝑧
𝑖 , c𝐵𝑥𝑖 , c𝐵𝑧
𝑖). We will use the matrix approach
introduced in [63] to obtain electromagnetic fields in the vacuum region.
Connection between the components of the fields and amplitudes is realized by
using the basic transformation matrixes
- 33 -
�̂�1(𝑖)(𝑦) =
𝑒−𝑘𝑦𝑖 𝑦
𝑘𝑧2
(
𝑘𝑧2 0 0 0
−𝑘𝑥𝑘𝑧 −𝑖𝑘𝑦𝑖 𝑘𝑧 0 0
−𝑖𝑘𝑦𝑖 𝑘𝑥 𝑘𝑦
𝑖 2 − 𝑘𝑧2 0 0
−𝑖𝑘𝑦𝑖 𝑘𝑧 𝑘𝑥𝑘𝑧 0 0)
(2.19)
�̂�2(𝑖)(𝑦) =
𝑒𝑘𝑦𝑖 𝑦
𝑘𝑧2
(
0 0 𝑘𝑧2 0
0 0 −𝑘𝑥𝑘𝑧 −𝑖𝑘𝑦𝑖 𝑘𝑧
0 0 𝑖𝑘𝑦𝑖 𝑘𝑥 𝑘𝑦
𝑖 2 − 𝑘𝑧2
0 0 −𝑖𝑘𝑦𝑖 𝑘𝑧 𝑘𝑥𝑘𝑧 )
(2.20)
�̂�(𝑖)(𝑦) = �̂�1(𝑖)(𝑦)+�̂�2
(𝑖)(𝑦) (2.21)
where 𝑘𝑦(𝑖) = 𝑘𝑥
2 + (1 − 휀(𝑖)𝜇(𝑖)𝑣2)𝑘𝑧2.
Let's establish a connection between the values of the fields on the lower borders of
the neighboring layers. The fields on the upper and lower borders of the 𝑖-th layer of the
upper half-space can be expressed in terms of the values of the same amplitudes:
�̂�𝑖(𝑎𝑖) = �̂�1𝑖(𝑎𝑖)�̂�
𝑖
�̂�𝑖(𝑎𝑖+1) = �̂�1𝑖(𝑎𝑖+1)�̂�
𝑖⇒ �̂�𝑖(𝑎𝑖+1) = �̂�1
𝑖(𝑎𝑖+1)�̂�1𝑖(𝑎𝑖)
−1�̂�𝑖(𝑎𝑖) (2.22)
From field tangential components equality on layer borders (�̂�𝑖+1(𝑎𝑖+1) = �̂�𝑖(𝑎𝑖+1))
one obtains
�̂�𝑖+1(𝑎𝑖+1) = �̂�1𝑖(𝑎𝑖+1)�̂�1
𝑖(𝑎𝑖)−1�̂�𝑖(𝑎𝑖) (2.23)
Consistent application of (2.23) for upper half-spaces gives
�̂�𝑛(𝑡)+1(𝑎𝑛(𝑡)+1) = 𝑄
(𝑡)�̂�0(𝑎1) (2.24)
where 𝑄(𝑡) = ∏ 𝑄𝑖(𝑡)𝑛(𝑡)
𝑖=1 and 𝑄𝑖(𝑡) = �̂�(𝑖)(𝑎𝑖+1)�̂�
(𝑖)(𝑎𝑖)−1.
Similar relation can be obtained for lower half-space
�̂�(−(𝑛(𝑏)+1))
(−𝑎−(𝑛(𝑏)+1)) = 𝑄(𝑏)�̂�(0)(−𝑎−1) (2.25)
where 𝑄(𝑏) = ∏ 𝑄𝑖(𝑏)𝑛(𝑏)
𝑖=1 , 𝑄𝑖(𝑏) = �̂�(−𝑖)(−𝑎−(𝑖+1))�̂�
(−𝑖)(−𝑎−𝑖)−1.
- 34 -
For the symmetrical case 𝑄𝑖(𝑏) = 𝑄𝑖
(𝑡)−1 and, respectively, 𝑄(𝑏) = ∏ 𝑄𝑖
(𝑡)−1𝑛𝑖=1 .
Given the matching conditions on the borders of the plates, we have finally
�̂�1(𝑛(𝑡)+1)
(𝑎𝑛(𝑡)+1)�̂�(𝑡𝑏) = 𝑄𝑡[�̂�(0)(𝑎1)�̂�
(0) + �̂�(𝑡)] (2.26)
�̂�2(−(𝑛(𝑏)+1))
(−𝑎−(𝑛(𝑏)+1)) �̂�(𝑡𝑏) = 𝑄𝑏[�̂�(0)(−𝑎−1)�̂�
(0) + �̂�(𝑏)] (2.27)
where �̂�(𝑡,𝑏) and �̂�(𝑡,𝑏) are the single-column matrixes
�̂�(𝑡,𝑏) = {{0}, {0}, {2𝑘𝑦(0)𝑣 csch (2𝑘𝑦
(0)𝑎) sinh [𝑘𝑦
(0)(∆ ± 𝑎1)]} , {0}}
�̂�(𝑡𝑏) = {{𝐴𝑥,1(𝑛(𝑡)+1)
} , {𝐴𝑦,1(𝑛(𝑡)+1)
} , {𝐴𝑥,2(−(𝑛(𝑏)+1))
} , {𝐴𝑦,2(−(𝑛(𝑏)+1))
}} (2.28)
On the Eq. 2.9 and Eq. 2.10 condition that fields are vanishing on 𝑦 = ±∞ is taken
into account.
The amplitudes �̂�(0) may be expressed in terms of amplitudes �̂�(𝑡𝑏) using Eq. 2.26
and Eq. 2.27
�̂�(0) = �̂�𝑡�̂�(𝑡𝑏) − �̂�(0)(𝑎1)−1�̂�(𝑡)
�̂�(0) = �̂�𝑏�̂�(𝑡𝑏) − �̂�(0)(−𝑎−1)−1�̂�(𝑏)
(2.29)
where
�̂�𝑡 = �̂�(0)(𝑎1)−1𝑇𝑡
−1�̂�1(𝑛(𝑡)+1)
(𝑎𝑛(𝑡)+1)
�̂�𝑏 = �̂�(0)(−𝑎−1)−1𝑇𝑏
−1�̂�2(−(𝑛(𝑏)+1))
(−𝑎−(𝑛(𝑏)+1)) (2.30)
Eliminating the outer layer coefficients we obtain explicit expressions for the
amplitudes of the radiation field of the particle in the space between the plates
�̂�(0) =1
2(�̂�(+)�̂�(−)
−1�̂�(−) − �̂�(+)) (2.31)
with
�̂�(±) = �̂�𝑡 ± �̂�𝑏, �̂�(±) = �̂�(0)(𝑎1)−1�̂�(𝑡) ± �̂�(0)(−𝑎−1)
−1�̂�(𝑏) (2.32)
- 35 -
Amplitudes of the radiation field for the structure with an arbitrary number of layers
in each of the plates can be obtained by Eq. 2.31 numerically. The particle velocity can
also be arbitrary.
2.3 Two-layer flat structure
Note that in the symmetric case (𝑎𝑖 = 𝑎−𝑖, 𝑘𝑦(𝑖) = 𝑘𝑦
(−𝑖), 𝑛(𝑡) = 𝑛(𝑏)) 𝑈𝑖(𝑏) = 𝑈𝑖
(𝑡)−1 and
𝑄(𝑏) = 𝑄(𝑡)−1
. For some important special cases, it is possible to obtain explicit
expressions.
Figure 2.2: Two-layer flat structure. Geometry and electromagnetic parameters.
An important special case is a symmetrical two-layer structure with unbounded
external walls (Figure 2.2). We write the amplitudes of the longitudinal electric component
of the radiation field of the particles in the vacuum region between the plates (corresponds
to Eq. 2.15 for 𝑖 = 0)
𝐴𝑧,1,2(0)
= 𝐴𝐶 cosh (𝑘𝑦(0)Δ) ∓ 𝐴𝑆 sinh (𝑘𝑦
(0)Δ) (2.33)
where
𝐴𝐶 = 𝑗𝑞𝑘𝑧
16𝜋2𝜀0
𝑣2
𝑐2 𝐴+𝐵 tanh(𝑘𝑦
(0)𝑎1)
𝐷1𝐶𝐷2
𝐶 , 𝐴𝑆 = 𝑗𝑞𝑘𝑧
16𝜋2𝜀0
𝑣2
𝑐2 𝐴+𝐵 coth(𝑘𝑦
(0)𝑎1)
𝐷1𝑆𝐷2
𝑆 (2.34)
The following notations are made in Eq. 2.34
𝐴 = 𝑘𝑦(0)[(𝑘𝑦
(1)2− 𝑘𝑦
(2)2) (𝑘𝑥
2𝐾12 − 𝑘𝑦
(1)2𝑘𝑧2) + (𝑘𝑦
(1)2− 𝑘𝑥
2) 𝑃]
휀1, 𝜎1
휀1, 𝜎1
휀2, 𝜎2
휀2, 𝜎2
- 36 -
𝐵 = 2𝑘𝑦(1)(𝑘𝑥
2 − 𝑘𝑦(0)2) 𝑆1�̃�2
𝐷1𝐶 = 𝑘𝑦
(1)𝑆2 cosh (𝑘𝑦
(0)𝑎1) + 𝑘𝑦
(0)𝑆1 sinh (𝑘𝑦
(0)𝑎1)
𝐷1𝑆 = 𝑘𝑦
(1)𝑆2 sinh (𝑘𝑦
(0)𝑎1) + 𝑘𝑦
(0)𝑆1 cosh (𝑘𝑦
(0)𝑎1)
𝐷2𝐶 = 𝑘𝑦
(0)𝐾12�̃�1 cosh (𝑘𝑦
(0)𝑎1) + 𝑘𝑦
(1)𝐾02�̃�2 sinh (𝑘𝑦
(0)𝑎1)
𝐷2𝑆 = 𝑘𝑦
(0)𝐾12�̃�1 sinh (𝑘𝑦
(0)𝑎1) + 𝑘𝑦
(1)𝐾02�̃�2 cosh (𝑘𝑦
(0)𝑎1) (2.35)
𝑆1 = 𝑘𝑦(1) cosh(𝑘𝑦
(1)𝑑) + 𝑘𝑦(2) sinh(𝑘𝑦
(1)𝑑) 𝑆2 = 𝑘𝑦(2) cosh(𝑘𝑦
(1)𝑑) + 𝑘𝑦(1) sinh(𝑘𝑦
(1)𝑑)
�̃�1 = 𝑘𝑦(1)𝐾2
2 cosh(𝑘𝑦(1)𝑑) + 𝑘𝑦
(2)𝐾12 sinh(𝑘𝑦
(1)𝑑) �̃�2 = 𝑘𝑦(2)𝐾1
2 cosh(𝑘𝑦(1)𝑑) + 𝑘𝑦
(1)𝐾22 sinh(𝑘𝑦
(1)𝑑)
𝑃 = (𝑘𝑦(2)2𝐾1
2 + 𝑘𝑦(1)2𝐾2
2) cosh(2𝑘𝑦(1)𝑑) + 𝑘𝑦
(1)𝑘𝑦(2)(𝐾1
2 + 𝐾22) sinh(2𝑘𝑦
(1)𝑑)
𝐾𝑖2 = 𝑘𝑦
(𝑖)2− 𝑘𝑥
2 − 𝑘𝑧2, 𝑖 = 0,1,2
Result of Eq. 2.33 – Eq. 2.35 is a generalization of the well-known result [64] on the
two-layer structure for an arbitrary velocity of the particle. In the transition to single-layer
unbounded plates (𝑘𝑦(1) = 𝑘𝑦
(2)) the first term in 𝐴 vanishes. In the transition to ultra-
relativistic approximation (𝑘𝑦(0) = 𝑘𝑥) factor 𝐵 in vanishes. The following are the values of
the field amplitudes for the structure, consisting of two unbounded parallel plates and the
arbitrary particle velocity.
𝐴𝐶 = 𝑗𝑞𝑘𝑧
8𝜋2𝜀0
𝑣2
𝑐2
(𝑘𝑥2−𝑘𝑦
(1)2)𝑘𝑦(0)+𝑘𝑦
(1)(𝑘𝑥2−𝑘𝑦
(0)2) tanh(𝑘𝑦
(0)𝑎1)
(𝑘𝑦(1)cosh(𝑘𝑦
(0)𝑎1)+𝑘𝑦
(0)sinh(𝑘𝑦
(0)𝑎1))(𝑘𝑦
(0)𝐾12 cosh(𝑘𝑦
(0)𝑎1)+𝑘𝑦
(1)𝐾02 sinh(𝑘𝑦
(0)𝑎1))
𝐴𝑆 = 𝑗𝑞𝑘𝑧
8𝜋2𝜀0
𝑣2
𝑐2
(𝑘𝑥2−𝑘𝑦
(1)2)𝑘𝑦(0)+𝑘𝑦
(1)(𝑘𝑥2−𝑘𝑦
(0)2) coth(𝑘𝑦
(0)𝑎1)
(𝑘𝑦(0)cosh(𝑘𝑦
(0)𝑎1)+𝑘𝑦
(1)sinh(𝑘𝑦
(0)𝑎1))(𝑘𝑦
(1)𝐾02 cosh(𝑘𝑦
(0)𝑎1)+𝑘𝑦
(0)𝐾12 sinh(𝑘𝑦
(0)𝑎1))
(2.36)
At 𝑘𝑦(0) = 𝑘𝑥 and 𝑣 = 𝑐 amplitudes Eq. 2.36 coincide with the corresponding
amplitudes in [64], obtained in the ultra-relativistic approximation.
- 37 -
In the case of the high conductivity of outer layer, it can be considered as a perfect
conductor. Transition to this case is made by means of equating to infinity in Eq. 2.34 the
wave number 𝑘𝑦(2)
. In this case the field amplitudes are
𝐴1𝐶 = 𝑗𝑞𝑘𝑧
16𝜋2𝜀0
𝑣2
𝑐2
(𝑘𝑥2−𝑘𝑦
(1)2)𝑘𝑦(0)sinh(2 𝑘𝑦
(1)𝑑)+2𝑘𝑦
(1)(𝑘𝑦(0)2
−𝑘𝑥2) sinh2(𝑘𝑦
(1)𝑑) tanh(𝑘𝑦
(0)𝑎1)
𝑅1𝐶𝑅2
𝐶
𝐴1𝑆 = 𝑗𝑞𝑘𝑧
16𝜋2𝜀0
𝑣2
𝑐2
(𝑘𝑥2−𝑘𝑦
(1)2)𝑘𝑦(0)sinh(2 𝑘𝑦
(1)𝑑)+2𝑘𝑦
(1)(𝑘𝑦(0)2
−𝑘𝑥2) sinh2(𝑘𝑦
(1)𝑑) coth(𝑘𝑦
(0)𝑎1)
𝑅1𝑆𝑅2𝑆
(2.37)
where the following notations are made
𝑅1𝐶 = 𝑘𝑦
(1) cosh(𝑘𝑦(1)𝑑) cosh(𝑘𝑦
(0)𝑎1) + 𝑘𝑦(0) sinh(𝑘𝑦
(1)𝑑) sinh(𝑘𝑦(0)𝑎1)
𝑅1𝑆 = 𝑘𝑦
(1)cosh(𝑘𝑦
(1)𝑑) sinh(𝑘𝑦
(0)𝑎1) + 𝑘𝑦
(0)sinh(𝑘𝑦
(1)𝑑) cosh(𝑘𝑦
(0)𝑎1)
𝑅2𝐶 = 𝑘𝑦
(0)𝐾12 cosh(𝑘𝑦
(1)𝑑) cosh(𝑘𝑦(0)𝑎1) + 𝑘𝑦
(1)𝐾02 sinh(𝑘𝑦
(1)𝑑) sinh(𝑘𝑦(0)𝑎1)
𝑅2𝑆 = 𝑘𝑦
(0)𝐾12 cosh(𝑘𝑦
(1)𝑑) sinh(𝑘𝑦(0)𝑎1) + 𝑘𝑦
(1)𝐾02 sinh(𝑘𝑦
(1)𝑑) cosh(𝑘𝑦(0)𝑎1)
(2.38)
Below the longitudinal electric field in case of asymmetric filling of plates is
presented. A structure with perfectly conducting plates, and only one of them covered with
a layer of finite conductivity material is considered.
𝐸𝑧 = 𝑗
𝑞𝑘𝑧
16𝜋2𝜀0{𝐴1𝑧𝑒
−𝑘𝑥𝑎1 + 𝐴2𝑧𝑒𝑘𝑥𝑎1} = 𝑗
𝑞𝑘𝑧𝐴0
8𝜋2𝜀0𝐶ℎ(2𝑘𝑥𝑎1)
𝐴1,2𝑧 = −𝐴0𝑆ℎ{𝑘𝑥(𝑎 + ∆)}𝑒∓𝑘𝑥𝑎1
(2.39)
with
𝐴0 = 𝑘𝑥 (𝑘𝑦(1)2 − 𝑘𝑥
2) 𝑆ℎ(2𝑑𝑘y(1)) {(𝑘𝑥𝐶ℎ(2𝑎1𝑘𝑥)𝑆ℎ(𝑑𝑘𝑦
(1)) + 𝑘𝑦(1)𝑆ℎ(2𝑎1𝑘𝑥)𝐶ℎ(𝑑𝑘𝑦
(1)))
(𝑘𝑦(1)𝑘𝑧
2𝐶ℎ(2𝑎1𝑘𝑥)𝑆ℎ(𝑑𝑘𝑦(1)) − 𝑘𝑥𝐾1
2𝑆ℎ(2𝑎1𝑘𝑥)𝐶ℎ(𝑑𝑘𝑦(1)))}
(2.40)
2.4 Impedance of two-layer symmetrical flat structure
As it is mentioned in the first chapter, the longitudinal impedance is a Fourier
transformation of normalized longitudinal component of Lorentz force. General expression
of Lorentz force is
𝑭(𝑥, 𝑦, 𝑧) = 𝑞[𝑬(𝑥, 𝑦, 𝑧) + 𝒗 × 𝑩(𝑥, 𝑦, 𝑧)] (2.41)
- 38 -
The longitudinal (𝑧 direction) impedance 𝑍∥(𝑥, 𝑦, 𝑘𝑧) is a Fourier transformation of
normalized longitudinal component of Lorenz force 𝐹𝑧(𝑘𝑥, 𝑦, 𝑘𝑧) . In the case, when a
charge 𝑞 is traveling along 𝑧 axis, the longitudinal component of Lorentz force becomes
𝐹𝑧(𝑘𝑥, 𝑦, 𝑘𝑧) = 𝑞𝐸𝑧(𝑘𝑥, 𝑦, 𝑘𝑧) (2.42)
and consequently the longitudinal impedance becomes
𝑍∥(𝑥, 𝑦, 𝑘𝑧) = −1
𝑞𝑐∫ 𝐸𝑧(𝑘𝑥, 𝑦, 𝑘𝑧)𝑒
−𝑖𝑘𝑥𝑥𝑑𝑘𝑥∞
−∞ (2.43)
Consider the most important and at the same time quite simple special case:
symmetrical two-layer flat structure. In the case of the perfectly conductive outer layer
(𝑘𝑦(2) → ∞) and the particle velocity equal to the velocity of light (𝑘𝑦
(0) = 𝑘𝑥, 𝑣 = 𝑐), the
formulae Eq. 2.37 are simplified to the form
𝐴1𝐶(𝑆) = 𝑗𝑞𝑘𝑧𝑘𝑦
(1)
16𝜋2𝜀0
(𝑘𝑥2−𝑘𝑦
(1)2) sinh(2𝑘𝑦
(1)𝑑)
𝑅1𝐶(𝑆)𝑅2
𝐶(𝑆) (2.44)
where
𝑅1𝐶
𝑅2𝐶} = {
𝑘𝑦(1)
𝑘𝑥𝐾12} 𝐶ℎ(𝑘𝑦
(1)𝑑)𝐶ℎ(𝑘𝑥𝑎1) ± {𝑘𝑥
𝑘𝑦(1)𝑘𝑥2} 𝑆ℎ(𝑘𝑦
(1)𝑑)𝑆ℎ(𝑘𝑥𝑎1)
𝑅1𝑆
𝑅2𝑆} = {
𝑘𝑦(1)
𝑘𝑥𝐾12} 𝐶ℎ(𝑘𝑦
(1)𝑑)𝑆ℎ(𝑘𝑥𝑎1) ± {𝑘𝑥
𝑘𝑦(1)𝑘𝑥
2} 𝑆ℎ(𝑘𝑦(1)𝑑)𝐶ℎ(𝑘𝑥𝑎1)
(2.45)
This case is fairly well simulates the highly conducting outer wall and is a two-
dimensional analogue of a two-layer cylindrical tube, the unique resonant properties were
discovered earlier. In the cylindrical waveguide with two-layer metal walls under high
conductivity of the thick outer wall and the relatively low conductivity of the thin inner layer,
the radiation of the driving particles has a narrow-band resonance. Resonance is the sole,
and formed by single slowly propagating waveguide mode. We show that the same is true
of the two-dimensional two-layer metal structure.
In the cylindrical case, the resonance frequency is equal to 𝑘𝑧,𝑟𝑒𝑧 = √2 𝑎1𝑑⁄ (𝑎1
waveguide inner radius, 𝑑 inner layer thickness). Minimum damping (in the case of perfect
- 39 -
conductor outer layer) is provided by the condition 휁 =1
√3𝑍0𝜎1𝑑 (𝑍0 = 120𝜋 Ω, 𝜎1 -inner
layer conductivity).
Let us demonstrate in the first step the single narrow-band extremal nature of the
longitudinal impedance of the two-dimensional two-layer structure.
Figure 2.3: Real (left) and imaginary (right) parts of the longitudinal impedance of two-layer flat
structure. On the graphs, the thicknesses of the inner layer in micrometers are shown.
Figure 2.3 shows a series of distributions of real and imaginary components of the
longitudinal impedance of a two-layer planar structure with a perfectly conductive outer
layer (Figure4). The distance between the plates is 2 𝑐𝑚 (half-height 𝑎1 = 1 𝑐𝑚) and the
conductivity of the inner layer is 2 × 103 Ω−1𝑚−1 The numbers on the curves in the graph
indicate the thickness of the inner layer (𝜇𝑚): "1" (1𝜇𝑚), "2" (2𝜇𝑚) and so on. As we see,
the longitudinal impedance has a single narrow-band resonance with a resonance
frequency dependent on the thickness of the inner layer. As is shown in Table 1, it is quite
well defined by the formula
𝑓𝑟𝑒𝑧 =𝑐
2𝜋√
1
𝑎1𝑑 (2.46)
where 𝑎1 = 𝑎 2⁄ is a half-height of a structure.
- 40 -
𝑑 (𝜇𝑚) 1 2 3 4 5 6 7 8 10 16
𝑓𝑟𝑒𝑧 (𝑇𝐻𝑧) 0.477 0.338 0.276 0.239 0.214 0.195 0.180 0.169 0.151 0.119
𝑓𝑚𝑎𝑥 (𝑇𝐻𝑧) 0.479 0.339 0.277 0.241 0.215 0.197 0.183 0.171 0.154 0.124
𝑓0 (𝑇𝐻𝑧) 0.479 0.503 0.277 0.241 0.215 0.197 0.183 0.171 0.154 0.124
𝜍𝑖 0.251 0.339 0.754 1.001 1.257 1.508 1.760 2.011 2.513 4.021
Table 2.1: Resonance frequencies of two-layer flat structure calculated analytically (𝑓𝑟𝑒𝑧),
numerically (𝑓𝑚𝑎𝑥), impedance imaginary component vanishing frequency (𝑓0) and a
parameter 𝜍𝑖.
In Table 2.1: line 𝑓𝑟𝑒𝑧 shows the resonance frequency calculated by Eq. 2.46; in line
𝑓𝑚𝑎𝑥 the resonance frequencies calculated numerically by the exact formulae are given;
line 𝑓0 shows the frequency values in which the imaginary components of the impedance
vanish; in the last row given the values of the parameter 𝜍𝑖 =1
3𝑍0𝜎1𝑑𝑖. As the table shows,
there is a good coincidence between the frequency values 𝑓𝑟𝑒𝑧 and 𝑓𝑚𝑎𝑥 . Thus, the
resonant frequency in a flat two-layer metal structure, in contrast to the corresponding
cylindrical structure, is defined by Eq. 2.46. In cylindrical case 𝑓𝑟𝑒𝑧 =𝑐
2𝜋√
2
𝑎1𝑑., i.e. in √2
times higher. There is also a complete coincidence of frequencies 𝑓𝑚𝑎𝑥 and 𝑓0, i.e. the
maximum value of the impedance is purely real. Comparing the maximum values of the
real component of impedance distributions (Figure 2.3, left) with the corresponding
parameter 𝜍𝑖 values, we note the following regularities: impedance reaches the highest
value at 𝑑 = 4 𝜇𝑚 , which corresponds to value of parameter 𝜍𝑖 equal to unity. The
maximum values of the other curves (Figure 2.3, left) on either side of it, decrease as the
distance.
As it is shown in Figure 2.3 (left), there are a pair of curves, maximum values of
which are located on a same level. These curves correspond to a pair of mutually 𝜍𝑖
parameter reverse values. Thus, as it follows from Figure 2.3 and Table 1: 𝜍1 ≈ 1 𝜍16⁄ and
𝜍2 ≈ 1 𝜍8⁄ . Similar phenomena occur also in a two-layer cylindrical waveguide. The
difference is in the value of the parameter 𝜍𝑖: 𝜍 =1
3𝑍0𝜎1𝑑 for planar and 𝜍 =
1
√3𝑍0𝜎1𝑑 for
cylindrical cases, i.e. √3 times less. Recall that the resonance frequencies in the planar
case to √2 times less than in the corresponding cylindrical: 𝜔𝑟𝑒𝑧 = 𝑐√1 𝑎1𝑑⁄ (𝑎1 inner half
- 41 -
height of planar structure) instead of 𝜔𝑟𝑒𝑧 = 𝑐√2 𝑎1𝑑⁄ (𝑎1 inner radius of cylinder). Such
relations for broadband resonance frequencies have been identified in [65] for the single-
layer resistive two-dimensional flat and cylindrical structures (Figure 2.4). For comparison,
Figure 2.4 shows the longitudinal impedance distributions for a two-layer metal tube with
an ideally conducting outer layer. Its geometric and electromagnetic parameters are
brought into correspondence with the parameters of the flat two-layer metal structure
considered above. The internal radius of the cylinder 𝑟0 = 1 𝑐𝑚, the conductivity of the
inner layer is 𝜎 = 2 × 103 Ω−1𝑚−1, and its thickness varies between 1 𝜇𝑚 and 5 𝜇𝑚.
Figure 2.4: Real (left) and imaginary (right) parts of the longitudinal impedance of two-layer
cylindrical structure. On the graphs, the thicknesses of the inner layer in microns are shown.
The wake potential is defined as the inverse Fourier transform of impedance (2.43)
𝑊∥(𝑥, 𝑦, 𝑠) = ∫ 𝑍∥(𝑥, 𝑦, 𝑘)∞
−∞𝑒−𝑗𝑘𝑠𝑑𝑠, 𝑠 = 𝑧 − 𝑣𝑡 (2.47)
Figure 2.5 shows the distribution of the longitudinal wake potential for three different
thicknesses of the inner layer at the fixed conductivity. In all three cases the wake
potentials are quasi-periodic functions with the period Δ𝑠 given by the resonant frequency
Δ𝑠 = 𝑐 𝑓𝑟𝑒𝑧⁄ , 𝑓𝑟𝑒𝑧 =𝑐
2𝜋√1
𝑎𝑑. The latter indicates the particle radiation monochromaticity
similar to two-layer cylindrical metal waveguide [50].
- 42 -
Figure 2.5: Longitudinal wake potential of the two-layer flat structure for different values of
the thickness of the inner layer and the fixed conductivity 𝜎 = 2 × 103 Ω−1𝑚−1; half-height of
structure 𝑎 = 1 𝑐𝑚. For comparison, the wake function for two unbounded infinite single-layer
plates with halt-width 𝑎 = 1 𝑐𝑚 and 𝜎 = 2 × 103 Ω−1𝑚−1 is given (dashed curve).
Figure 2.6 shows the wake potential distributions for a two-layer cylindrical structure.
Figure 2.6: Longitudinal wake potential of the two-layer cylindrical waveguide for different
values of the thickness of the inner layer and the fixed conductivity 𝜎 = 2 × 103 Ω−1𝑚−1;
inner radius of cylinder is equal to half height of flat structure (Figure 2.5) 𝑟0 = 𝑎 = 1 𝑐𝑚. The
designations of the curves correspond to the thicknesses of the inner coating in microns. The
wake potential for unbounded single-layer resistive cylinder with radius 𝑟0 = 1 𝑐𝑚 and 𝜎 =
2 × 103 Ω−1𝑚−1 is given in addition (dashed curve).
- 43 -
As in the plane case, the wake function of a cylindrical structure is a quasi-
monochromatic oscillating damped function with a single oscillation frequency 𝑓𝑟𝑒𝑧 =𝑐
2𝜋√2
𝑎𝑑.
The period of the oscillations is Δ𝑠 = 𝑐 𝑓𝑟𝑒𝑧⁄ (√2 times less of one of flat case).
Comparing the curves for impedances and wake potentials for a two-layered
cylindrical structure, we notice from Figure 2.4 (curve with label “2.5”), that in the
frequency representation the maximum quality factor (maximum amplitude) of the
impedance reaches at the thickness of the inner coating equal to 2.5 𝜇𝑚. In the space-time
representation this correlates with the minimum attenuation of the wake (Figure 2.6, curve
with label “2.5”). In the cylindrical case, the attenuation coefficient is proportional to the
value of 휁 = 𝜉 + 𝜉−1, with 𝜉 =1
√3𝑍0𝑑𝜎 and attains its minimum value at 𝜉 = 1 [50].
The above patterns (Figure 2.3 and Figure 2.5) are revealed in the case of fixed
value of the inner layer conductivity. The regularities of the structure with a fixed thickness
of the inner layer, are denoted in Figure 2.7. The Figure shows the distribution of the
amplitude values of the impedance curve at 𝑑 = 1𝜇𝑚 and 1500 Ω−1𝑚−1 < 𝜎 <
11000 Ω−1𝑚−1, which corresponds to the range of variation of the parameter 𝜉 =1
√3𝑑𝜎𝑍0
within 0.3 < 𝜉 < 2.5.
- 44 -
Figure 2.7: Distribution of resonance values of the two-layer flat structure impedance as a function
of the conductivity 𝜎 of the inner layer for fixed geometric parameters of the structure (𝑎 =
1𝑐𝑚, 𝑑 = 1 𝜇𝑚). The horizontal dashed lines indicate the mutually conjugate values of the
conductivities 𝜎𝑎 and 𝜎𝑏 for which 휁𝑏 = 1 휁𝑎⁄ with 휁𝑎(𝑏) = 3−1 2⁄ 𝑑𝑍0𝜎𝑎(𝑏). Vertical dashed line
indicates the maximum possible level of impedance for a given thickness of the inner layer 𝑑 =
1𝜇𝑚.
A significant difference between the cylindrical and flat cases is that in the first case
the optimal condition (in the sense of the maximum Q of the system) is the fulfillment of
equality 𝜉 =1
√3𝑍0𝜎𝑑 = 1. In the second case, when fixing the conductivity value of the
inner layer σ, the condition for optimizing the structure is the equality 𝜉 =1
3𝑍0𝜎𝑑 = 1, i.e.
the optimum layer thickness in this case is determined through its conductivity 𝜎 by the
expression 𝑑 =3
𝑍0𝜎. In other hand, fixation of the thickness of the inner layer 𝑑 leads to the
optimization condition 𝜉 =1
√3𝑍0𝜎𝑑 = 1 and to the optimal conductivity of the layer 𝜎 =
√3
𝑍0𝑑.
Thus, for a given conductivity of the inner layer, in order to select the optimum thickness of
the layer, it is necessary to use the relation 𝑑 =3
𝑍0𝜎, and for a given layer thickness d, its
optimal conductivity is determined by the expression 𝜎 =√3
𝑍0𝑑.
- 45 -
Figure 2.8: Optimization of the parameters of a two-dimensional two-layer metal structure with the
initial fixation of the thickness 𝑑 = 1𝜇𝑚 of the inner layer.
Figure 2.8 shows the results of the sequential optimization process with the initial
fixation value of the thickness of the inner layer at the level of 𝑑 = 1𝜇𝑚. The figure shows
5 curves depicting the distribution of longitudinal impedances for the half-height of
structure 𝑎 = 1𝑐𝑚. Curve 1 (black solid curve) is plotted for the thickness of the inner layer
𝑑 = 1 𝜇𝑚 with a conductivity 𝜎 = 4594 Ω−1𝑚−1 , determined by the formula 𝜎 =√3
𝑍0𝑑, i.e.
curve 1 represents the impedance with the highest possible amplitude level, achievable at
𝑑 = 1 𝜇𝑚 by means of the corresponding selection of the conductivity of the inner layer.
Fixing, then, the received value of conductivity, by the formula 𝑑2 =3
𝑍0𝜎 we determine for it
the optimum value of layer thickness 𝑑2 = 1.732 𝜇𝑚 , wich is optimal for this value of
conductivity. As a result, we obtain curve 2 (red solid curve). Optimization leads to an
increase in the thickness of the inner layer and, consequently, to a decrease in the
resonant frequency. Further optimization again assumes the use of the formula 𝜎2 =√3
𝑍0𝑑.
As a result we have curve 3 with reduced conductivity 𝜎3 = 2653 Ω−1𝑚−1 and a resonance
conserved frequency. This procedure, consisting in the successive application of the
formulas 𝑑𝑖 =3
𝑍0𝜎𝑖 and 𝜎𝑖+1 =
√3
𝑍0𝑑𝑖, can be repeated many times, successively increasing
the thickness of the inner layer and its conductivity and decreasing the resonance
frequency (Figure 2.8).
- 46 -
An alternative way to perform a series of optimizations is shown in Figure 2.9. It is
obtained by first fixing the conductivity of the inner layer of the structure. In the figure,
curve “1” corresponds to the originally selected conductivity of the inner layer 𝜎 = 2 ×
103 Ω−1𝑚−1. Its thickness is optimized using the formula 𝑑 =3
𝑍0𝜎= 3.98 𝜇𝑚. Curve “2” (red,
dashed) is obtained by optimizing the conductivity for the resulting length: 𝜎2 =√3
𝑍0𝑑=
1154 Ω−1𝑚−1 . The resonant frequency does not change in this case. The further
optimization step, corresponding to curve “3”, is carried out using the formula 𝑑2 =3
𝑍0𝜎2=
6.89 𝜇𝑚. This optimization stage is accompanied by an increase in the thickness of the
inner layer and by a decrease of resonant frequency. At the next stage, the optimum
conductivity value is determined for the layer new thickness 𝜎3 =√3
𝑍0𝑑2= 385 Ω−1𝑚−1 (curve
“3”) and so on.
Figure 2.9: Optimization of the parameters of a two-dimensional two-layer metal structure with the
initial fixation of the inner layer conductivity 𝜎 = 2 × 103 Ω−1𝑚−1.
Thus, there are two different possibilities to optimize a two-dimensional two-layer
metal structure: the first (Figure 2.8) is accompanied by an increase of the conductivity of
the material of the inner layer, while the second (Figure 2.9) lowers it.
The practical significance of the above study is the ability to correctly select the
thickness of the inner layer and the electromagnetic characteristics of the material filling it.
- 47 -
This, for example, was successfully done during of experimentally testing the resonant
properties of a two-layer metal structure [67] with severe limitations on the measuring
equipment, whose frequency range was limited by 14 GHz bandwidth.
Figure: 2.10: Longitudinal impedance of cylindrical pipe with optimized parameters: optimal inner
layer width 𝑑 = 2.3𝜇𝑚 for given conductivity 𝜎 = 2000 Ω−1𝑚−1 (red); optimal inner layer
conductivity 𝜎 = 4600 Ω−1𝑚−1 for given layer width 𝑑 = 1𝜇𝑚 (black).
In the case of a two-layered cylindrical structure, the picture is much simpler. In this
case, the narrow-band resonance character of the impedance curve is completely due to
the proximity to the unity of the parameter 𝜉 =1
√3𝑍0𝜎𝑑 [50]. The impedance curve is
completely determined by setting two parameters (𝜉, 𝜎; 𝜉, 𝑑 or 𝜎, 𝑑) of three (𝜉, 𝜎, 𝑑).
2.5 Approximate analytical representation of impedance
The integral representation of the longitudinal impedance (Eq. 2.43 – Eq. 2.45) is
accurate (exact) and, as was shown above, it is possible in principle to calculate both the
impedance and the wake potential (represented in the form of a double integral (Eq. 2.47)).
For calculation, a corresponding software package has been developed by using the
software package Mathematica8. The integral form of the expressions for the impedance
and the wake function, as well as the complexity of the integrand expression, leads,
however, to some difficulties in interpreting them. Integration by means of deformation of
the contour of integration and its transfer to the complex plane is associated with taking
- 48 -
into account, in addition to complex poles of denominator, also integration along the cuts
on the Riemann surface. The latter circumstance is connected with the non-analyticity of
the function 𝑘𝑦(1) = √𝑘𝑥2 + (1 − 휀
(1)𝜇(1)𝑐2)𝑘2, which leads to the non-analyticity of the
denominator of the integrand as a whole.
The analytizing of the integrand in (Eq. 2.43) is performed taking into account the
smallness of the parameter 𝑑 (𝑑 ≪ 𝑎), characterized the thickness of the inner layer. For
this purpose, we rewrite the function 𝐴1𝐶 (Eq. 2.44) in the form
𝐴1𝐶 =𝑞𝑍0𝑘𝑥
8𝜋2𝑍0𝜎𝑘
�̃�, �̃� = �̃�1
𝐶�̃�2𝐶 (2.48)
where now
�̃�1𝐶 = 𝑘𝑦
(1)𝐶ℎ(𝑘𝑥𝑎)𝐶𝑡ℎ (𝑘𝑦
(1)𝑑) + 𝑘𝑥𝑆ℎ(𝑘𝑥𝑎)
�̃�2𝐶 = 𝑘𝑥(𝑘 + 𝑗 𝑍0𝜎)𝐶ℎ(𝑘𝑥𝑎) + 𝑘𝑘𝑦
(1)𝑆ℎ(𝑘𝑥𝑎)𝑇ℎ (𝑘𝑦
(1)𝑑)
(2.49)
After multiplication, the denominator in Eq. 2.48 takes the form
�̃� = 𝑘𝑦(1)𝑘𝑥(𝑘+ 𝑗 𝑍0𝜎)𝐶ℎ
2(𝑘𝑥𝑎)𝐶𝑡ℎ (𝑘𝑦
(1)𝑑)+
1
2(𝑘𝑦
(1)2𝑘+ 𝑘𝑥
2(𝑘+ 𝑗 𝑍0𝜎))𝑆ℎ(2𝑘𝑥𝑎)+𝑘𝑦
(1)𝑘𝑥𝑘𝑆ℎ
2(𝑘𝑥𝑎)𝑇ℎ (𝑘𝑦
(1)𝑑)
(2.50)
Further, we expand �̃� in a series with respect to the small parameter 𝑑 and leave
the first three terms of the expansion (𝑑−1, 𝑑0 and 𝑑). As a result, we get
�̃� ≈ 𝑢−1 𝑑⁄ + 𝑢0 + 𝑢1𝑑 (2.51)
where
𝑢1 =1
3𝑘𝑦(1)2𝑘𝑥 ((𝑘 + 𝑗 𝑍0𝜎)𝐶ℎ
2(𝑘𝑥𝑎) + 3𝑘𝑆ℎ2(𝑘𝑥𝑎))
𝑢0 =1
2(𝑘𝑦
(1)2𝑘 + 𝑘𝑥
2(𝑘 + 𝑗 𝑍0𝜎))𝑆ℎ(2𝑘𝑥𝑎)
𝑢−1 = 𝑘𝑥(𝑘 + 𝑗 𝑍0𝜎)𝐶ℎ2(𝑘𝑥𝑎)
(2.52)
Expression 2.51 with taking into account Eq. 2.52 no longer contains square roots
of the integration variables and is analytical.
- 49 -
Believing, further 𝑘𝑥2 ≪ 𝑍0𝜎𝑘, (in the cylindrical case this approximation is equivalent
to approximation for the permittivity of the metal 휀 ≈ 𝑗 𝜎 𝜔⁄ , which is valid for not very large
frequencies) we have:
𝑘𝑦(1)2
≈ −𝑗𝑍0𝜎𝑘 (2.53)
and instead of Eq. 2.52, we can write
𝑢1 = −1
3𝑗𝑍0𝜎𝑘𝑘𝑥((𝑘 + 𝑗 𝑍0𝜎)𝐶ℎ
2(𝑘𝑥𝑎) + 3𝑘𝑆ℎ2(𝑘𝑥𝑎))
𝑢0 =1
2(𝑘𝑘𝑥
2 + 𝑗 𝑍0𝜎(𝑘𝑥2 − 𝑘2))𝑆ℎ(2𝑘𝑥𝑎)
𝑢−1 = 𝑘𝑥(𝑘 + 𝑗 𝑍0𝜎)𝐶ℎ2(𝑘𝑥𝑎)
(2.54)
Figures (2.11–2.15) show comparison of calculations for exact formulae and in
approximation (Eq. 2.51 – Eq. 2.54) for three different half-widths of a plane structure: 𝑎 =
10 𝑐𝑚 (Figure 2.11 and Figure 2.12), 𝑎 = 1𝑐𝑚 (Figure 2.13 and Figure 2.14) and 𝑎 = 1 𝑚𝑚
(Figure 2.15). The thickness of the inner layer is chosen equal to 7 𝜇𝑚. Dashed red curves
represent the results obtained from exact formulae. The approximate results are
represented by solid black curves.
Fig. 2.11. Real (left) and imaginary (right) components of the longitudinal impedance of a
two-layer metal structure, calculated by exact formulae (red, dashed) and using the approximation
(2.48, 2.51) (black, solid): 1 - 𝜎 = 2 × 104 Ω−1𝑚−1, 휁 = 30.5; 2 - 𝜎 = 2 × 103 Ω−1𝑚−1, 휁 = 3.05; 3 -
𝜎 = 656 Ω−1𝑚−1, 휁 = 1; 𝑎 = 10 𝑐𝑚, 𝑑 = 7 𝜇𝑚.
- 50 -
Fig. 2.13. Real (left) and imaginary (right) components of the longitudinal impedance of a two-layer
metal structure, calculated by exact formulae (red, dashed) and using the approximation (2.48,
2.51) (black, solid): 1 - 𝜎 = 2 × 104 Ω−1𝑚−1, 휁 = 30.5; 2 - 𝜎 = 2 × 103 Ω−1𝑚−1, 휁 = 3.05; 3 - 𝜎 =
656 Ω−1𝑚−1, 휁 = 1; 𝑎 = 1 𝑐𝑚, 𝑑 = 7 𝜇𝑚.
As can be seen from Figure 2.11 and Figure 2.13, for relatively large values of the
half-widths of the structure (1 𝑐𝑚 ≤ 𝑎 ≤ 10 𝑐𝑚) there is a complete coincidence of the
approximation calculations with the exact ones even for much larger (in comparison with
unity) values of the parameter 휁 =1
√3𝑍0𝑑 (up to 휁~30). Significant discrepancies occurs at
large values of this parameter 휁~100 (Figure 2.12 and Figure 2.14).
Fig. 2.12. Real (left) and imaginary (right) components of the longitudinal impedance of a two-layer
metal structure, calculated by exact formulae (red, dashed) and using the approximation (2.48,
2.51) (black, solid): 1 - 𝜎 = 2 × 105 Ω−1𝑚−1, 휁 = 135 ; 2 - 𝜎 = 2 × 106 Ω−1𝑚−1, 휁 = 1523 ; 𝑎 =
10 𝑐𝑚, 𝑑 = 7 𝜇𝑚.
- 51 -
Fig. 2.14. Real (left) and imaginary (right) components of the longitudinal impedance of a two-layer
metal structure, calculated by exact formulae (red, dashed) and using the approximation (2.48,
2.51) (black, solid): 1 - 𝜎 = 2 × 105 Ω−1𝑚−1, 휁 = 135 ; 2 - 𝜎 = 2 × 106 Ω−1𝑚−1, 휁 = 1523 ; 𝑎 =
1 𝑐𝑚, 𝑑 = 7 𝜇𝑚.
As follows from the Figure 2.15, a decrease in the gap between the plates leads to
a toughening of the requirement of 휁 be close to unity. Thus, for 휁 = 30 (curve “1” on
Figure 2.15) already there is an essential discrepancy between the exact and approximate
solution, whereas for 휁 = 7.6 (curve “2” on Figure 2.15) they practically coincide.
Fig. 2.15. Real (left) and imaginary (right) components of the longitudinal impedance of a two-layer
metal structure, calculated by exact formulae (red, dashed) and using the approximation (2.48,
2.51) (black, solid): 1 - 𝜎 = 2 × 104 Ω−1𝑚−1, 휁 = 30.5; 2 - 𝜎 = 5 × 103 Ω−1𝑚−1, 휁 = 7.6. 𝑎 = 1 𝑚𝑚,
𝑑 = 7 𝜇𝑚.
Further simplification of the integrand (Eq. 2.50 – Eq. 2.53) is achieved by replacing
the hypergeometric functions by their decomposition. The expansions in a series of
hypergeometric functions 𝑆ℎ(𝑥) and 𝐶ℎ(𝑥) have the form [68]
- 52 -
𝑆ℎ(𝑥) = ∑𝑥2𝑛−1
(2𝑛−1)!∞𝑛=1 , 𝐶ℎ(𝑥) = ∑
(𝑥)2𝑛−2
(2𝑛)!∞𝑛=1 (2.55)
Substituting Eq. 2.55 in Eq. 2.53 and leaving the first N terms of the expansion in
them, we have instead of Eq. 2.48
𝐴1𝐶 =𝑞𝑍0
8𝜋2𝑍0𝜎𝑘
�̃�′ (2.56)
where
�̃�′ ≈ 𝑢−1′ 𝑑⁄ + 𝑢0
′ + 𝑢1′𝑑 (2.57)
and
𝑢1′ =
1
6𝑗𝑘𝜎𝑍0((2𝑘 − 𝑖𝜎𝑍0) − (4𝑘 + 𝑖𝜎𝑍0)𝐶ℎ𝑁(2𝑎𝑘𝑥))
𝑢−1′ =
1
2(𝑘 + 𝑗 𝑍0𝜎)(1 + 𝐶ℎ𝑁(2𝑎𝑘𝑥)
𝑢0′ =
1
2(𝑘𝑘𝑥
2 + 𝑗 𝑍0𝜎(𝑘𝑥2 − 𝑘2))
𝑆ℎ𝑁(2𝑘𝑥𝑎)
𝑘𝑥
(2.58)
with
𝑆ℎ𝑁(𝑥) = ∑𝑥2𝑛−1
(2𝑛−1)!𝑁𝑛=1 , 𝐶ℎ𝑁(𝑥) = ∑
𝑥2𝑛−2
(2𝑛)!𝑁𝑛=1 (2.59)
In this approximation, the denominator (Eq. 2.57) is represented in the form of an
algebraic polynomial of 2N-th order in powers of 𝑘𝑥
�̃�′ = ∑ 𝑎𝑛𝑘𝑥𝑛2𝑁
𝑛=0 (2.60)
and can be written in a form containing its complex roots 𝑥𝑖 , 𝑖 = 1,2, … 2𝑁
�̃�′ = 𝑎2𝑁∏ (𝑘𝑥 − 𝑥𝑖)2𝑁𝑖=1 (2.61)
Thus, Eq. 2.56 can be rewritten as follows
𝐴𝐶 =𝑞𝑍0
8𝜋2𝑍0𝜎𝑘
𝑎2𝑁∏ (𝑘𝑥−𝑥𝑖)2𝑁𝑖=1
(2.62)
The longitudinal impedance, which is an integral of this expression over 𝑘𝑥, can be
expressed explicitly in terms of the roots 𝑥𝑖 of the equation �̃�′(𝑘𝑥) = 0
- 53 -
𝑍|| = ∫ 𝐴𝐶𝑑𝑘𝑥∞
−∞= −
𝑍02𝜎𝑘
4𝜋2𝑎2𝑁∑
𝑙𝑛{−𝑥𝑛}
∏ (𝑥𝑛−𝑥𝑖)2𝑁𝑖=1𝑖≠𝑛
2𝑁𝑛=1 (2.63)
The roots 𝑥𝑖 of the equation �̃�′(𝑘𝑥) = 0 are determined numerically for an arbitrary
value of N with the help of the software package Mathematica.
Longitudinal impedance of a two-layer metal structure calculated by exact and
approximate formulas formulae is presented in Figure 2.16. In the figure black solid
impedance curves are calculated using the approximate equations 2.51 and 2.53, blue
dashed ones are from Eq. 2.63 for 𝑛 = 5 and red dashed ones are for calculated by exact
formula.
Fig. 2.16. Real (left) and imaginary (right) components of the longitudinal impedance of a two-layer
metal structure, calculated by exact formulae (red, dashed), using the approximation (2.48, 2.51)
(black, solid) and using approximation (2.60) for n=5 (blue, dashed): 1 - 𝜎 = 2 × 104 Ω−1𝑚−1, 휁 =
30.5; 2 - 𝜎 = 5 × 103 Ω−1𝑚−1, 휁 = 7.6; 𝑎 = 1 𝑚𝑚, 𝑑 = 7 𝜇𝑚.
In Figure 2.16, the impedance curves calculated using the asymptotic (Eq. 2.62) are
superimposed on the impedance curves shown in Fig. 2.15.
2.6 Summary
Method of calculating the longitudinal impedance of a multilayer two-dimensional
flat structure is presented. The matrix formalism that allows to couple electromagnetic field
components in the inner and outer regions of the structure has been developed. Non-
ultrarelativistic particle radiation fields in the multilayer flat symmetric and asymmetric
structure are obtained. Explicit expressions of the radiation fields in two-layer structure
- 54 -
with unbounded external walls and in single-layer unbounded structure are derived as a
special case of fields in multilayer structure.
An ultrarelativistic particle radiation in a symmetrical two-layer flat structure with
perfectly conducting outer layer is derived. Longitudinal impedance of this structure with
low conductivity thin inner layer and high conductivity thick outer layer wall is obtained
numerically. It is shown that the impedance has a narrow-band resonance. The resonance
frequency dependence of a structure parameters is obtained. Parameter 𝜍𝑖 =1
3𝑍0𝜎1𝑑𝑖 is
introduced, which describes maximum values of impedance. It is shown that impedances
of structures with reverse 𝜍 parameters (𝜍𝑖 ∗ 𝜍𝑗 = 1) has the same maximum values and it
reaches the highest maximum when 𝜍𝑗 is equal to unity.
- 55 -
Chapter 3: Rectangular resonator with two-layer vertical walls
3.1 Introduction
In this chapter, dispersion relations are obtained for the electromagnetic eigen-
oscillations in a rectangular resonator with ideally conducting walls. The horizontal (top
and bottom) walls of this resonator are covered from the inside by a thin low-conductive
layer.
On the second Chapter it is shown that double-layered parallel plates for appropriate
parameters have a distinct, narrow band resonance. In this Chapter rectangular copper
cavity with double-layered horizontal walls is observed. Here, unlike of the parallel plates,
one has a discrete set of wavenumbers in all three degree of freedom. Compared with
two-dimensional structure, the pattern of modal frequency distribution in such a resonator
is distorted: in addition to the fundamental resonance frequency, a set of secondary
resonances caused by side walls exists. It is important to note the presence of the
fundamental resonance, fixed by measurements, and caused by the two-layer horizontal
cavity walls. To be able to distinguish the main mode from secondary resonances, finite
wall resonator model is developed and resonance frequencies of the resonator are
calculated.
In this Chapter secondary resonances caused by side walls are obtained. Criterions
of resonator materials choice are interpreted and resonance frequencies are predicted via
the resonator model with ideal conducting walls. The choice is conditioned by the
frequency bandwidth of the experimental set-up ( 14 𝐺𝐻𝑧 ) and the predicted single
resonance for two parallel laminated plates (chapter 2). The electro-dynamical properties
of test resonator model (perfectly conducting rectangular cavity with inner low conducting
layers) are studied. Resonance frequencies of the test structure are measured
experimentally and comparison with predicted resonant frequencies of resonator model
and two parallel double-layer plates is done. Good agreement between these results is
obtained.
- 56 -
Experimentally obtained resonance frequencies are subjected to the laws specific to
this kind of structures: their value decreases with increasing height of the cavity. At the
same time, the difference between the measured and calculated values increases.
Decreasing a structure height, the contribution of its sidewalls also decrease, that’s why for
a structures with small height there is a good agreement between experimental and
theoretical resonant frequencies.
3.2 IHLCC cavity with ideally conductive walls
To obtain dispersion relations analytically for a tested cavity, a simplified resonator
model is studied. It is assumed that all four sidewalls of IHLCC cavity are ideally
conductive materials and upper and lower ideally conductive walls are covered with a thin
layer of low-conductive material (Fig 3.1).
Figure 3.1: IHLCC cavity shape.
This model is very close to the cavity with copper walls, so it is expected that
analytical results would be in a good agreement with tested cavity results. Exact dispersion
equations may be obtained for a similar structure by the method of partial areas. In this
case, three regions may be distinguished:
1. 0 ≤ 𝑥 ≤ 𝑏, 0 ≤ 𝑧 ≤ 𝑙 top low conductivity material plate
(3.1) 2. 0 ≤ 𝑥 ≤ 𝑏, 0 ≤ 𝑧 ≤ 𝑙 vacuum chamber of cavity
3. 0 ≤ 𝑥 ≤ 𝑏, 0 ≤ 𝑧 ≤ 𝑙 lower low conductivity material plate
- 57 -
Electric and magnetic fields of cavity in each of the three regions are sought in the
following form
�⃗⃗�𝑖 = �⃗⃗�𝑖(1)+ �⃗⃗�𝑖
(2), �⃗⃗�𝑖 = (𝑗𝑘𝑐)
−1𝑟𝑜𝑡�⃗⃗�𝑖, 𝑖 = 1,2,3 (3.2)
with
𝐸𝑥,𝑖(1)
𝐸𝑥,𝑖(2)} = {
𝐴𝑥,𝑖(1)𝐶ℎ(𝑄𝑖𝑦)
𝐴𝑥,𝑖(2)𝑆ℎ(𝑄𝑖𝑦)
} 𝐶𝑜𝑠(𝑘𝑥𝑥)𝑆𝑖𝑛(𝑘𝑧𝑧)
𝐸𝑦,𝑖(1)
𝐸𝑦,𝑖(2)} = {
𝐴𝑦,𝑖(1)𝑆ℎ(𝑄𝑖𝑦)
𝐴𝑦,𝑖(2)𝐶ℎ(𝑄𝑖𝑦)
} 𝑆𝑖𝑛(𝑘𝑥𝑥)𝑆𝑖𝑛(𝑘𝑧𝑧)
𝐸𝑧,𝑖(1)
𝐸𝑧,𝑖(2)} = {
𝐴𝑧,𝑖(1)𝐶ℎ(𝑄𝑖𝑦)
𝐴𝑧,𝑖(2)𝑆ℎ(𝑄𝑖𝑦)
} 𝑆𝑖𝑛(𝑘𝑥𝑥)𝐶𝑜𝑠(𝑘𝑧𝑧)
(3.3)
where 𝐴𝑥,𝑦,𝑧,𝑖(1,2)
are arbitrary amplitudes, 𝑄1,3 = 𝐾,𝑄2 = 𝑘𝑦 and
𝐾 = √𝑘2(1 − 휀′𝜇′) + 𝑘𝑦2, 𝑘 =
𝜔
𝑐= √𝑘𝑥
2 + 𝑘𝑧2 − 𝑘𝑦
2, (3.4)
The boundary conditions on the perfectly conducting sidewalls are
𝐸𝑥,𝑖 = 𝐸𝑦,𝑖 = 0
𝐸𝑦,𝑖 = 𝐸𝑧,𝑖 = 0 at
𝑧 = 0, 𝑧 = 𝑙𝑥 = 0, 𝑥 = 𝑏
, 𝑖 = 1,2,3 (3.5)
To satisfy these conditions horizontal wavenumbers should be in the form of 𝑘𝑥 =
(𝑚 − 1)𝜋
𝑏, 𝑘𝑧 = (𝑛 − 1)
𝜋
𝑙, 𝑚, 𝑛 = 1,2,3…. 𝑘𝑦 transverse vertical wavenumber should be
determined from boundary condition on low-conductive layer surfaces and vertical walls.
On vacuum-low conductive layer borders, from the continuity of tangential electric
and magnetic field components
𝐸𝑥,1 = 𝐸𝑥,2, 𝐸𝑧,1 = 𝐸𝑧,2𝐵𝑥,1 = 𝐵𝑥,2, 𝐵𝑧,1 = 𝐵𝑧,2
at 𝑦 = 𝑎/2 (3.6)
𝐸𝑥,2 = 𝐸𝑥,3, 𝐸𝑧,2 = 𝐸𝑧,3𝐵𝑥,2 = 𝐵𝑥,3, 𝐵𝑧,2 = 𝐵𝑧,3
at 𝑦 = −𝑎/2 (3.7)
- 58 -
On the outer boundaries between low conductive layers and ideal conductors,
electrical tangential components of fields must vanish
𝐸𝑥,1 = 0, 𝐸𝑧,1 = 0
𝐸𝑥,3 = 0, 𝐸𝑧,3 = 0 at
𝑦 = 𝑎′/2
𝑦 = −𝑎′/2 (3.8)
Using Maxwell's equation 𝑑𝑖𝑣�⃗⃗�𝑖(1,2) = 0, the amplitudes 𝐴𝑧,𝑖
(1,2) can be expressed by
the amplitudes 𝐴𝑥,𝑖(1,2)
and 𝐴𝑦,𝑖(1,2)
. Thus, we have a linear homogeneous system consisting
of 12 equations (Eq. 3.6 - Eq. 3.8) and containing the same number of indeterminate
coefficients: 𝐴𝑥,𝑖(1,2)
, 𝐴𝑦,𝑖(1,2)
with 𝑖 = 1,2,3. Condition of existence of non-trivial solutions of this
system is the vanishing of its determinant
𝐷 = 𝑃1𝑃2𝑃3𝑃4 = 0 (3.9)
where
𝑃1 = 𝐾𝑛𝑚𝐶ℎ(𝑑𝐾)𝑆ℎ(𝑎𝑘𝑦𝑓) + 𝑘𝑦𝑓𝑆ℎ(𝑑𝐾𝑛𝑚)𝐶ℎ(𝑎𝑘𝑦𝑓) (3.10a)
𝑃2 = 𝐾𝑛𝑚𝐶ℎ(𝑑𝐾𝑛𝑚)𝐶ℎ(𝑎1𝑘𝑦𝑓) + 𝑘𝑦𝑓𝑆ℎ(𝑑𝐾𝑛𝑚)𝑆ℎ(𝑎1𝑘𝑦𝑓) (3.10b)
𝑃3 = −𝐾𝑛𝑚𝑘2𝑆ℎ(𝑑𝐾𝑛𝑚)𝐶ℎ(𝑎𝑘𝑦𝑓) − 𝑘𝑦𝑓𝑘
2휀′𝜇′𝐶ℎ(𝑑𝐾𝑛𝑚)𝑆ℎ(𝑎𝑘𝑦𝑓) (3.10c)
𝑃4 = −𝑘𝑦𝑓𝑘2휀′𝜇′𝐶ℎ(𝑑𝐾𝑛𝑚)𝐶ℎ(𝑎𝑘𝑦𝑓) −𝐾𝑛𝑚𝑘
2𝑆ℎ(𝑑𝐾𝑛𝑚)𝑆ℎ(𝑎𝑘𝑦𝑓) (3.10d)
where 𝐾𝑛𝑚 = √𝑘𝑥𝑛2 + 𝑘𝑧𝑚
2 − 𝑘2휀′𝜇′, 𝑘 =𝜔
𝑐= √𝑘𝑥𝑛
2 + 𝑘𝑧𝑚2 − 𝑘𝑦𝑓
2 , 𝑛,𝑚, 𝑓 =
1,2,3,….
The result is four independent dispersion equations:
𝑃𝑖 = 0, 𝑖 = 1,2,3,4 (3.11)
Each of these four equations includes three eigenvalues: 𝑘𝑥𝑛, 𝑘𝑧𝑚 and 𝑘𝑦𝑓 .
Moreover, the horizontal transverse 𝑘𝑥𝑛 and longitudinal 𝑘𝑧𝑚 wave numbers are fixed for
given numbers 𝑛 and 𝑚. They form two infinite sequences generated by integer indices 𝑚
and 𝑛 . Thus, each of equations (Eq. 3.10.a -3.10d) defines the sequence of 𝑘𝑦𝑓 , (𝑓 =
1,2,3, … ) values for each fixed combination of indices 𝑚 and 𝑛. As a result, from these
- 59 -
equations we get dependent on 𝑚 and 𝑛 sequences of eigenvalues 𝑘𝑦 = 𝑘𝑚𝑛𝑓(𝑖) (𝑖 = 1,2,3,4)
for = 1,2,3… .
Let us compare the obtained expressions with the corresponding expressions,
obtained in Chapter 1, for the two-layer flat structure (1.24):
𝑇1 = 𝑘𝑦(1)𝐶ℎ(𝑑𝑘𝑦
(1))𝑆ℎ(𝑎𝑘𝑦(0)) + 𝑘𝑦
(0)𝑆ℎ(𝑑𝑘𝑦(1))𝐶ℎ(𝑎𝑘𝑦
(0))
𝑇2 = 𝑘𝑦(1)𝐶ℎ(𝑑𝑘𝑦
(1))𝐶ℎ(𝑎𝑘𝑦(0)) + 𝑘𝑦
(0)𝑆ℎ(𝑑𝑘𝑦(1))𝑆ℎ(𝑎𝑘𝑦
(0))
𝑇3 = −𝑘𝑦(0)𝑘2휀𝑖
′𝜇𝑖′𝐶ℎ(𝑑𝑘𝑦
(1))𝑆ℎ(𝑎𝑘𝑦(0)) − 𝑘𝑦
(1)𝑘2𝑆ℎ(𝑑𝑘𝑦(1))𝐶ℎ(𝑎𝑘𝑦
(0))
𝑇4 = −𝑘𝑦(0)𝑘2휀𝑖
′𝜇𝑖′𝐶ℎ(𝑑𝑘𝑦
(1))𝐶ℎ(𝑎𝑘𝑦(0)) − 𝑘𝑦
(1)𝑘2𝑆ℎ(𝑑𝑘𝑦(1))𝑆ℎ(𝑎𝑘𝑦
(0))
(3.12)
Obviously, there is a correspondence: 𝑃𝑖 ↔ 𝑇𝑖 , 𝑖 = 1,2,3,4 . A complete coincidence
cannot take place, since in the case of an infinite two-dimensional structure, the
variables 𝑘𝑥 and 𝑘𝑧 are integration variables, but in the case of a resonator, the
wave numbers 𝑘𝑥𝑛 and 𝑘𝑧𝑚 are discrete and fixed for specified values by the index
n and m.
The standing wave excited in the resonator consists of the imposition of two
traveling waves propagating in opposite directions: a wave incident on the front wall of the
resonator (�⃗⃗�1) and reflected from it (�⃗⃗�2):
𝐸𝑥,𝑦,𝑧 = 𝐸1,𝑥,𝑦,𝑧 ± 𝐸2,𝑥,𝑦,𝑧, 𝐸1,2,𝑥,𝑦,𝑧 = 𝐴1,2,𝑥,𝑦,𝑧𝑒𝑗(±𝑘𝑧𝑧−𝜔𝑡) (3.13)
The wave �⃗⃗�1 can serve as an analog of a wave propagating in an infinite planar two-layer
structure, generated by a particle. Since its frequency 𝜔 in this case is complex, it can be
represented in the form:
𝜔 = 𝑐√𝐴 + 𝑗𝐵 = 𝑐√√𝐴2+𝐵2+𝐵
2+ 𝑗𝑐 𝑆𝑖𝑔𝑛 𝐵√
√𝐴2+𝐵2−𝐵
2 (3.14)
with 𝑘𝑦𝑓 = 𝑘𝑦𝑓′ + 𝑗𝑘𝑦𝑓
′′ , 𝐴 = 𝑘𝑥𝑛2 + 𝑘𝑧𝑚
2 − 𝑘𝑦𝑓′2 + 𝑘𝑦𝑓
′′2, 𝐵 = 2𝑘𝑦𝑓′ 𝑘𝑦𝑓
′′
The real part of (3.14) determines the phase velocity of the wave, and the imaginary part
characterizes its damping. The phase velocity of the wave, incident on the front wall of the
resonator, is determined by the following relation:
- 60 -
𝑣𝑝ℎ =𝑅𝑒{𝜔}
𝑘𝑧 (3.15)
This speed can be either more (at 𝑘𝑥𝑛2 > 𝑘𝑥0𝑛
2 ) or less (at 𝑘𝑥𝑛2 < 𝑘𝑥0𝑛
2 ) than the speed of
light, where
𝑘𝑥0𝑛2 = 𝑘𝑦𝑓
′2 − 𝑘𝑦𝑓′′2 − 𝑘𝑧𝑚
2 ± 2𝑘𝑧𝑚√2𝑘𝑦𝑓′ 𝑘𝑦𝑓
′′ + 𝑘𝑧𝑚2 (3.16)
Equality 𝑘𝑥𝑛2 = 𝑘𝑥0𝑛
2 (at which the wave has a phase velocity equal to the speed of light)
cannot be fulfilled exactly because 𝑘𝑦𝑓′2 , 𝑘𝑦𝑓
′′2 and 𝑘𝑧𝑚2 are discrete and fixed. The condition
for the greatest closeness of the phase velocity of a wave to the velocity of light, thus, is
the requirement 𝑚𝑖𝑛|𝑘𝑥𝑛2 −𝑘𝑥0𝑛
2 |. The mode (or set of modes) that satisfies this requirement
forms the main resonance arising as a result of the interactions in it of elementary free
oscillations.
3.3 Pure copper cavity. Measurements and interpretation
To check the accuracy of manufacturing, firstly an experimental resonances of pure
copper cavity are compared with theoretical results for the cavity.
The resonant behavior of pure copper cavity has been investigated experimentally
in CANDLE SRI by measuring the testing device (cavity) transmission S-parameter 𝑺𝟏𝟐
(forward voltage gain) [69] using Network Analyzer ZVB14 [70]. The measurements are
performed for the rectangular cross-section copper cavities.
Measured narrow-band extremes are compared with the standing wave
eigenfrequencies of rectangular cavity with perfectly conducting walls [72] with same
dimensions (𝑎′ = 22, 32, 42 𝑚𝑚, 𝑏 = 65𝑚𝑚, 𝑙 = 200 𝑚𝑚):
𝑓𝑚𝑛𝑞 =𝑐
2√(
𝑚−1
𝑎′)2
+(𝑛−1
𝑏)2
+ (𝑞−1
𝑙)2
𝑚, 𝑛, 𝑞 = 1,2,3… {
𝑖𝑓 𝑚 = 1, 𝑛, 𝑞 > 1 𝑖𝑓 𝑛 = 1, 𝑚, 𝑞 > 1𝑖𝑓 𝑞 = 1, 𝑚, 𝑛 > 1
(3.17)
Note that in IHLCC cavity when 𝑑 = 0, both equations (𝑃1 and 𝑃2) are transformed
to equation for the vertical wave number of the ideal resonator (Eq. 3.12): 𝑆𝑖𝑛ℎ(𝑎𝑘𝑦) = 0
with solution 𝑘𝑦 = 𝑗 𝜋(𝑞 − 1) 𝑎⁄ . Similarly, in the limiting case of 𝐾 = 𝑘𝑦 (휀′𝜇′ = 1) we have
- 61 -
both from (Eq. 3.10.a) and (Eq. 3.10.b): 𝑆𝑖𝑛ℎ(𝑎′𝑘𝑦) = 0 with solution 𝑘𝑦 = 𝑗 𝜋(𝑞 − 1) 𝑎′⁄ .
In these extreme cases, all three eigenvalues are independent from each other.
𝑎′ = 22 𝑐𝑚 𝑎′ = 32 𝑐𝑚
N m n q Exp. Calc. N m n q Exp. Calc.
1 2 2 6 8.04 8.116 1 1 1 12 8.25 8.25
2 2 2 6 8.12 8.116 2 1 4 8 8.7 8.69
3 2 2 7 8.48 8.489 3 1 1 13 9.06 9
4 2 2 8 8.86 8.909 4 3 1 2 9.4 9.405
5 1 2 13 9.31 9.291 5 1 3 12 9.46 9.453
6 2 2 9 9.39 9.371 6 3 2 2 9.69 9.684
7 2 1 10 9.56 9.594 7 2 3 11 9.97 9.976
8 1 4 10 9.65 9.670 8 3 2 6 10.36 10.358
9 1 5 6 9.92 9.963 9 3 3 5 10.88 10.872
10 1 2 14 10.04 10.019 10 3 2 8 10.97 10.99
11 2 4 5 10.15 10.169 11 1 6 1 11.58 11.539
12 1 5 7 10.28 10.269 12 1 6 3 11.65 11.636
13 1 1 15 10.51 10.50 13 3 4 3 11.76 11.750
14 1 5 8 10.6 10.619 14 1 6 5 11.91 11.922
15 1 5 9 11.01 11.009 15 1 4 14 11.96 11.960
16 1 3 15 11.46 11.470 16 3 3 9 12.05 12.050
17 1 6 5 11.93 11.922 17 1 3 16 12.16 12.160
18 1 5 12 12.3 12.38 18 3 3 10 12.43 12.440
19 2 1 15 12.53 12.519 19 3 2 12 12.7 12.700
20 2 5 8 12.605 12.62 20 3 1 13 13.0 12.996
21 2 2 15 12.71 12.73 21 2 2 17 13.11 13.088
22 1 5 13 12.9 12.892 22 3 4 10 13.48 13.468
23 2 1 16 13.14 13.155
24 2 3 15 13.33 13.343
25 2 6 3 13.47 13.486
26 2 4 6 13.57 13.59
27 2 5 11 13.7 13.709
28 2 1 17 13.8 13.802
29 2 3 16 13.94 13.941
30 1 5 15 13.98 13.980
Table 3.1.a: Comparison of the measured (Exp., GHz) and calculated (Calc., GHz) values of the
eigenfrequencies of a rectangular cavity with a height of 22 𝑐𝑚 and 32 𝑐𝑚.
Table 3.1 shows the correlation of eigenfrequencies of the cavity with the perfectly
conducting walls, calculated by Eq. 3.12, with measured peaks.
- 62 -
𝑎′ = 42 𝑐𝑚
N m n q Exp. Calc. N m n q Exp. Calc.
1 1 4 7 4.12 4.129 10 1 3 10 8.18 8.177
2 1 4 8 4.33 4.344 11 1 2 12 8.56 8.5666
3 1 5 2 4.65 4.63 12 2 1 12 8.98 8.9899
4 1 2 7 5.04 5.057 13 1 4 9 9.17 9.1601
5 1 3 5 5.52 5.505 14 1 3 12 9.45 9.4533
6 1 3 16 6.08 6.080 15 2 5 2 9.93 9.9260
7 2 3 5 6.66 6.562 16 3 3 9 10.42 10.408
1 1 10 6.75 17 3 3 10 10.84 10.857
8 1 4 5 7.55 7.545 18 3 4 7 10.90 10.918
9 2 3 8 7.85 7.850
Table 3.1.b: Comparison of the measured (Exp., GHz) and calculated (Calc., GHz) values of the
eigenfrequencies of a rectangular cavity with 42 𝑐𝑚 height.
As can be seen from Table 3.1, there is a good matching (up to the second decimal)
between experimentally obtained and calculated eigenvalues. This is achieved due to the
high precision machining of internal surfaces of the cavity with keeping dimensional
accuracy.
The main result of the above research is the establishment of agreement of
experimentally obtained narrowband peaks with resonant frequencies of the rectangular
copper cavities. This means that the accuracy of manufacturing of copper resonator
component allow to obtain the corresponding frequency distribution for the IHLCC cavity
with acceptable distortions.
3.4 IHLCC cavity resonance frequency comparison with experimental results
The transmission 𝑺𝟏𝟐 parameters of IHLCC cavity has been measured to perform a
comparison between resonant behaviors of real structure and IHLCC.
The defining parameters of the cavity are the following: the height of the inner
chamber 𝑎, the thickness of the low conductive layer 𝑑 =𝑎′−𝑎
2, the width 𝑏 and length 𝑙 of
the chamber, conductivity 𝜎1 and relative dielectric constant 휀1 of low conductive layer.
The choice of material and the thickness of a low-conductive metallic layer,
covering the top and bottom walls of cavity is conditioned by following two factors:
- 63 -
1. network analyzer ZVB14 provides spectral distribution in the range of 0 − 14 𝐺𝐻𝑧.
The resonance frequency is determined roughly by the geometrical parameters of
the cross-section of the cavity: 𝑓𝑟𝑒𝑧 ≈𝑐
2𝜋√2/𝑎𝑑, which depends on the thickness of
the inner layer 𝑑 and structure height 𝑎. Having a bunch in a structure imposes the
lower limit on its height (𝑎~1 𝑐𝑚). Also with the increase of the height the impedance
decreases, so the height should be near to its lower limit. For a structure with 2 −
4 𝑐𝑚 height the thickness of the coating should be about 1 − 0.5 𝑚𝑚 to have a
resonance frequency in 0 − 14 𝐺𝐻𝑧 range, given by measuring devise.
2. for the double-layered parallel plates the condition of resonance 휁 ≈ 𝑍0𝜎1𝑑~1 is
derived in chapter 2. Assuming that for the resonator the condition should be
approximately the same, the low conducting material is chosen to have 𝜎1~2.65 𝑆𝑚⁄
conductivity for a layer with 𝑑 = 1 𝑚𝑚 thickness.
As a result, germanium (Ge) crystal plates with sizes 𝑙 = 30 c𝑚, 𝑏 = 6 c𝑚, 𝑑 =
1 𝑚𝑚 with conductivity 𝜎1 = 2 Ω−1𝑚−1 [73] and the relative dielectric constant 휀1 = 16,
were selected. Measurements were carried out for three different heights: 𝑎 = 2 𝑐𝑚, 𝑎 =
3 𝑐𝑚 and 𝑎 = 4 𝑐𝑚 (𝑎′ = 2.2, 𝑎′ = 3.2 and 𝑎′ = 4.2 𝑐𝑚, respectively).
For the above-given vertical apertures and the Ge layer thickness, the skin depth at
resonant frequency 𝛿 is larger than the Ge layer thickness by factor of 3 (𝛿/𝑑 > 3). The
predicted resonant frequencies of the corresponding two parallel plates lie in the X-Band
region between 9 − 15 𝐺𝐻𝑧.
3.4.1 Comparison with flat two-layer structure
The measured resonant frequencies of the test cavity with laminated horizontal
walls have been compared with resonant frequencies of the corresponding two-
dimensional two-layered structure (outer layer is assumed as a perfect conductor) with
inner 1 𝑚𝑚 Ge layers.
The longitudinal impedance of two parallel infinite laminated plates is derived in the
second chapter of the dissertation. For an ultrarelativistic particle moving parallel to the
plates along geometrical axis of the structure with perfectly conducting outer and low
- 64 -
conducting inner metallic layers the longitudinal impedance can be presented as (Eq. 2.15,
Eq. 2.33, Eq. 2.42 and Eq. 2.43)
𝑍∥ =𝑍0
16𝜋2∫
𝑘𝑢(𝑝2−𝑢2)𝑆ℎ(2𝑝𝑑)
𝑆1𝑆2
∞
−∞𝑑𝑢 (3.18)
where
𝑆1 = 𝑝𝐶ℎ(𝑝𝑑)𝐶ℎ(𝑢𝑎) + 𝑢𝑆ℎ(𝑝𝑑)𝑆ℎ(𝑢𝑎)
𝑆2 = (𝑢2 + 𝑘2 − 𝑝2)𝐶ℎ(𝑝𝑑)𝐶ℎ(𝑢𝑎) +
𝐾𝑘2
𝑞𝑆ℎ(𝑝𝑑)𝑆ℎ(𝑢𝑎)
(3.19)
with 𝑎1 = 𝑎 2⁄ , 𝑘 = 𝜔 𝑐⁄ longitudinal wavenumber and
𝐾 = √𝑢2 + 𝑘2(1 − 휀1) − 𝑗𝑘𝑍0𝜎 (3.20)
Figure 3.2 presents the longitudinal impedance curves for such parallel laminated
plates with 2 𝑐𝑚, 3 𝑐𝑚 and 4 𝑐𝑚 vertical apertures. The distances between the plates and
material of the inner layers (germanium) are the same as in the tested cavities. The
dashed lines indicate the measured main resonant frequencies of the corresponding
copper cavities with laminated top and bottom walls.
Figure 3.2: The longitudinal impedance of perfect conductor-Ge infinite parallel plates
(solid lines) and measured resonant frequencies of copper cavity with Ge inner layers at
the top and bottom walls (dashed lines). The Ge layer thickness is 1 𝑚𝑚, the vertical
apertures are 2 𝑐𝑚, 3 𝑐𝑚 and 4 𝑐𝑚.
- 65 -
Figure 3.2 shows that there is a good agreement between measured and calculated
resonant frequencies. The relative difference in resonant frequency is 2.6 % for 2 𝑐𝑚 ,
3.5 % for 3 𝑐𝑚 and 7 % for 4 𝑐𝑚 aperture cavities. The difference is caused mainly due to
the limited volume of the cavity: the presence of highly conductive sidewalls. The presence
of additional bursts is the result of the display of modal structure of the test cavity. Their
contribution is weakened by decreasing of the distance between plates. Thus, by
decreasing the height of cavity, its resonant characteristics approach to the characteristics
of a flat structure consisting of two identical two-layer parallel plates.
3.4.2 Comparison with IHLCC resonator theoretical results
Resonant frequencies of the cavity with outer perfectly conducting walls and inner
germanium layers at the top and bottom walls can be obtained from Eq. 3.11.
Experimentally fixed resonances (Figure 3.5) can be identified as concrete solutions
(modes) of dispersion relations given by Eq. 3.11. Choosing the needed mode (𝑘𝑥, 𝑘𝑧) the
main resonances frequencies can be obtained for our IHLCC cavity with ideally conductive
walls. Table. 3.2 shows comparison of experimentally observed resonance frequencies of
the test cavity (“Experiment” in table) and analytically calculated resonances of cavity with
outer perfectly conducting walls (“Calculated” in table).
Aperture
2
Experiment
4
5
Calculated Rel. dif.
2 𝑐𝑚
12.32 𝐺𝐻𝑧
12.29 𝐺𝐻𝑧
0.2 %
3 𝑐𝑚 11.42 𝐺𝐻𝑧
11.36 𝐺𝐻𝑧
0.5 %
4 𝑐𝑚
10.6 𝐺𝐻𝑧
10.49 𝐺𝐻𝑧
1 %
Table. 3.2: The main resonances obtained experimentally and calculated for a cavity with
perfectly conducting walls and inner Ge layers at the top and bottom walls.
0.251
0.339
0.754
1.001
1.257
1.508
1.760
As can be seen from Table. 3.2, there is a good agreement on measured and
calculated results. The relative differences between the calculated and measured
frequencies (“Rel. dif.” in table) are below 1 %.
As it was noted earlier (see section 3.2), free electromagnetic waves formed in the
resonator form standing waves, which can be represented as the superimposition of two
oppositely directed traveling waves: incident on the front wall of the resonator and going in
- 66 -
the opposite direction (see Eq.3.13). The phase velocities of these waves are equal in
absolute value and opposite in sign (since they propagate in opposite directions): 𝑣𝑝ℎ =
𝑐 𝑅𝑒{𝑘} 𝑘𝑧⁄ with 𝑘 =𝜔
𝑐= √𝑘𝑥2 + 𝑘𝑧2 − 𝑘𝑦2 ; 𝑘𝑥 and 𝑘𝑧 are real numbers determined by the
indices m and n and 𝑘𝑦 is determined by the equations (3.10) and is a set of complex
numbers. Thus, k is a complex number, the real part of which determines a discrete series
of eigenfrequencies of the resonator, and its imaginary part, caused by the finite
conductivity of the inner layers covering the inside walls, determines the finite Q of the
resonator at its eigen frequencies. Determining k from the equations (3.10), we can
determine the dependence of the phase velocity of the partial traveling waves in the cavity,
depending on the frequency. As noted earlier, the exact equality of the phase velocity of
the partial wave in the resonator with the speed of light is unlikely. Investigations of the
solutions of the equations (3.10) show that in the frequency range 0-14 GHz with the
corresponding cavity parameters, only equation 𝑃4 = 0 (3.10d) give solutions for slow
partial waves. The corresponding graphs are shown in the Figure 3.3.
Figure 3.3: The phase velocities of the partial waves in the resonator for modes 𝑃4,𝑛𝑓𝑚 (solutions of
equation 𝑃4 = 0) for 𝑛 = 2, 𝑓 = 1,2, 𝑚 = 1,2,3,4,…; 𝑎 = 1 𝑐𝑚 (left), 1.5 𝑐𝑚 (middle), 𝑎 = 2 𝑐𝑚 (right).
Each of the graphs shows two sequences (discrete curves) of phase velocities of
the modes: 𝑃4;21𝑚 and 𝑃4;2,2𝑚 with monotonically decreasing phase velocities. On all three
graphs, a discrete curve depicting a sequence of modes 𝑃4;2,2𝑚 intersects the
synchronization line 𝑣𝑝ℎ 𝑐⁄ = 1. The second discrete curve containing the phase velocities
of the modes 𝑃4;21𝑚 is located above the line 𝑣𝑝ℎ 𝑐⁄ = 1, gradually approaching it as the
frequency increases and intersecting with the first line. In the first and second cases
(for 𝑎 = 1𝑐𝑚 and 𝑎 = 1.5𝑐𝑚 ), the measured fundamental resonance frequency
corresponds to the intersection point of two discrete lines adjacent to the synchronization
- 67 -
line and calculated (for two – dimensional planar case) is closed to intersection point of
first curve and line of synchronization. In the third case, the situation is reversed: the
measured fundamental resonance frequency corresponds to intersection point of first
curve and line of synchronization and calculated is closed to the intersection point of two
discrete lines.
It is obvious that in all three cases the main resonance is formed by several modes
with closed frequencies and close in phase velocity: modes 𝑃4;2,1,15,
𝑃4;2,1,16, 𝑃4;2,2,15, 𝑃4;2,2,16, 𝑃4;2,2,17 for 𝑎 = 1𝑐 , 𝑃4;2,1,13, 𝑃4;2,1,14, 𝑃4;2,1,15, 𝑃4;2,213, 𝑃4;2,2,14, 𝑃4;2,2,15
for 𝑎 = 1.5𝑐𝑚 and 𝑃4;2,1,13, 𝑃4;2,1,14, 𝑃4;2,1,15, 𝑃4;2,213, 𝑃4;2,2,14, 𝑃4;2,2,15 for 𝑎 = 2𝑐𝑚.
3.5 Summary
The chapter is the logical follow-up of the study of high frequency single-mode
accelerating structures with laminated metallic walls (flat and cylindrical) [50, 75, 76].
Theoretical model of a rectangular cavity with horizontal double layer metallic walls
is created and electro-dynamic properties of the model are studied. The model with
sufficient accuracy displays experimental tested device and enables clearly interpret the
measurement results. Extreme frequencies on the experimental curves have been
correlated with the respective modes of resonator model. The experimental results are
also compared with theoretical results for two infinite parallel plates. A good agreement
between them stimulates the experimental study of beam radiation and acceleration in
laminated structures. The corresponding experimental program at AREAL test facility is
foreseen.
- 68 -
Chapter 4: Electron bunch compression in single-mode
structure
4.1 Introduction
The generation and acceleration of ultrashort electron bunches is an important
issue for generation of coherent radiation in THz and Infrared regions, driving the free
electron lasers (FEL) and direct applications for ultrafast electron diffraction [14-16, 77-79].
Length of bunches generated in RF guns is limited due to technical characteristics
of photocathode and lasers. So for having a sub-ps bunches one need to shorten ps
bunches generated in RF gun. There are several methods for obtaining sub-ps bunches,
e.g. magnetic chicanes are used for high energy beams shortening [80], velocity and
ballistic bunching are for low energy beams [26-29]. For all these methods one needs to
have an energy modulated beam.
It is well known that the relativistic charge, moving along the structure, interacts with
the surrounding environment and excites the electromagnetic field known as wakefield
[36-38, 59-61]. Structures are usually the disk, plasma or dielectric loaded channels that
drive the corresponding wakefield accelerator (WFA) concepts [25, 34, 35, 37, 55, 57], the
performance of which can be improved by using the asymmetric driving beam to achieve
high transformer ratio [45, 83]. For the charge distribution the wakefield acts back to
bunch particles producing an energy modulation within the bunch by longitudinal wake
potential. The form of longitudinal wake potential depends both on the bunch charge
distribution and the surrounding structure [36]. Although for Gaussian bunch the energy
modulation is driven by the bunch head-tail energy exchange, for rectangular and
parabolic bunch shapes the energy modulation at high frequency can be obtained.
To have an energy modulation disc and dielectric loaded structures are used.
These kind of structures have high order modes excited by a charge when it passes the
structure, which leads to energy storage in that parasitic modes and beam instabilities [35-
46]. To avoid such effects one needs a single-mode structure. In this chapter wakefield
induced bunch energy modulation during bunch interaction with the single-mode
- 69 -
structures is studied. As a single mode structure cold plasma and recently proposed
internally coated metallic tube (ICMT) are considered [47-50]. In a cold plasma purely
sine-like wakefield without damping are generated, while in ICMT wakefields are sine-like
with damping factor [50].
The direct application of the holding integral for bunch rectangular or parabolic
shape and point wake potential lead to energy modulation within the bunch at the excited
mode frequency. To obtain sub-𝑝𝑠 bunches, a structure with excited frequency higher
than 𝑇𝐻𝑧 is needed. In cold plasma and ICMT, for appropriate parameters, the excited
mode is within sub-𝑇𝐻𝑧 to 𝑇𝐻𝑧 frequency region.
For comparatively low energy bunches wakefield generated energy modulation
causes velocity modulation and for proper ballistic distance leads to density modulation or
microbunching. To have that effect in proper distance, energy modulation in a bunch after
the structure should be greater than several 𝑘𝑒𝑉, which can be achieved with 100 𝜇𝑚 −
500 μ𝑚 bunches. Electron bunches with 100 𝑝𝐶 charge and 10 𝑀𝑒𝑉 energy are observed,
which corresponds to usual values in modern linear accelerators [84].
4.2 Wakefields and Impedances
A relativistic charge 𝑄 , passing throw a structure interacts with it. Due to this
interaction the particle radiates electromagnetic fields, known as wakefields, which then
can act to the test charge 𝑞. From the causality principle, wakefields generated by an
ultrarelativistic driving charge should vanish in front of it [37]. The longitudinal component
of the wakefield produces energy gain (or loss) of the test particle, while the transverse
component produces the transverse kick of the test particle.
- 70 -
Figure 4.1: Driving 𝑄 and test 𝑞 charge moving in a structure
The longitudinal wake function (point wake potential) is the integrated longitudinal
Lorentz force excited in a structure by a point charge 𝑄 experienced by the test particle
traveling on an 𝑠 distance behind it [36]
𝑤𝑧(𝒓, 𝒓𝑸, 𝑠) = −1
𝑄∫ 𝐸𝑧 (𝒓, 𝒓𝑸, 𝑧, 𝑡 =
𝑧+𝑠
𝑐)𝑑𝑧
∞
−∞ (4.1)
where 𝐸𝑧 is the longitudinal component of excited electric field, 𝒓 is a transverse offset of
test particle, 𝒓𝑸 is a transverse offset of source particle and 𝑐 is the speed of light in
vacuum (Figure 4.1). In the definition 𝑠 > 0 corresponds to the distance behind the driving
point charge, 𝑠 = 0 to the position of the charge and 𝑠 < 0 to the distance in front of the
charge.
The transverse wake function is defined as an integrated transverse Lorentz force
acting on a test particle
𝒘⊥(𝒓, 𝒓𝑸, 𝑠) = −1
𝑄∫ (𝑬 + 𝒗 × 𝑩)⊥ (𝒓, 𝒓𝑸, 𝑧, 𝑡 =
𝑧+𝑠
𝑐) 𝑑𝑧
∞
−∞ (4.2)
For a longitudinal distributed 𝜆(𝑠) driving bunch, the wake potentials are defined as
an integrated longitudinal and transverse Lorentz forces excited by a bunch at the
position of the test particle traveling on an 𝑠 distance behind it. Here distance 𝑠 is
- 71 -
measured from the center of driving bunch. The longitudinal wake potential could be
obtained from the wake functions using the convolution integral
𝑊∥(𝑠) = ∫ 𝑤𝑧(𝑠 − 𝑠′)𝜆(𝑠) 𝑑𝑠′𝑠
−∞ (4.3)
here integration is from −∞ to 𝑠, because there is no field in front of driving bunch.
The total energy loss of the driving charge in a structure due to its radiation is
proportional to the square of the charge
Δ𝑈 = 𝑄2𝐾𝑙𝑜𝑠𝑠 (4.4)
The proportionality factor 𝐾𝑙𝑜𝑠𝑠 is a longitudinal loss factor and can be presented by
wake potentials
𝑘𝑙𝑜𝑠𝑠 = ∫ 𝑊∥(𝜏)𝜆(𝜏)𝑑𝜏∞
−∞ (4.5)
The wake potential is a function of time, while Fourier transformation of the wake
potential gives an information in frequency domain and is called the impedance [36, 47]
𝑍∥(𝜔) = ∫ 𝑊𝑧(𝜏)𝑒−𝑖𝜔𝜏𝑑𝜏
∞
−∞=1
𝑐∫ 𝑊𝑧(𝑧)𝑒
−𝑖𝜔𝑧𝑐⁄ 𝑑𝑧
∞
−∞
𝑊𝑧(𝜏) =1
2𝜋∫ 𝑍∥(𝜔)𝑒
𝑖𝜔𝜏𝑑𝜔∞
−∞
(4.6)
4.3 Ballistic bunching
Traveling in the structure bunch particles gain (loss) energy due to interaction with
wakefields generated by themselves and particles in front of them. Ballistic bunching
method of studying microbunching and bunch compression is used. In ballistic method it is
assumed that in the structure charge is rigid and only energy modulations occur. The
energy modulation leads to particles velocity change in the structure and for non-
ultrarelativistic bunches charge density redistribution occurs in drift space after the
structure (Figure 4.2). For appropriate initial bunch energy and energy spread after the
structure, bunches with several 𝜇𝑚 length can be formed.
- 72 -
Figure 4.2: Geometry of ballistic bunching (blue line illustrates the wakefield)
After bunch passes the structure energy gain (loss) of 𝑖-th particle with initial 𝑠𝑖
coordinate is determined by
Δ𝑈(𝑠𝑖) = 𝑞𝑄𝑊𝑧(𝑠𝑖)𝐿 (4.7)
where 𝑞 is a charge of test particle, 𝑄 is a total charge of a source bunch, 𝑊𝑧(𝑠𝑖) is a wake
potential in a structure and 𝐿 is a structure length.
Velocity of 𝑖-th particle on the entrance of drift space can be presented as
𝛽(𝑠𝑖) = √1 − (𝑈𝑟𝑒𝑠𝑡
𝑈𝑓(𝑠𝑖))2
(4.8)
where 𝑈𝑟𝑒𝑠𝑡 is a particle rest energy and 𝑈𝑓(𝑠𝑖) = 𝑈0 + Δ𝑈(𝑠𝑖) is an energy of 𝑖-th particle
after the structure. Here cold bunch approximation is assumed, which means that there is
no energy spread in the initial bunch. Having a velocity of each particle at the end of the
structure, the coordinate 𝑠𝑖,𝑓 of 𝑖-th particle after passing 𝑙𝑑𝑟𝑖𝑓𝑡 distance in a drift space can
be calculating by
𝑠𝑖,𝑓 = 𝑠𝑖 + Δ𝑠𝑖 = 𝑠𝑖 + 𝑙𝑑𝑟𝑖𝑓𝑡 (1 −𝛽(𝑠𝑖)
𝛽0) (4.9)
- 73 -
where 𝑠𝑖 is the initial coordinate of 𝑖 -th particle, 𝛽0 = √1 − (𝑈𝑟𝑒𝑠𝑡
𝑈0)2
is the bunch initial
velocity, 𝛽(𝑠𝑖) is the velocity of 𝑖-th particle after passing the structure. With the coordinate
of each particle in a bunch after a drift space, one can obtain the bunch’s shape.
Numerical simulations are done for observing wakefield effects on various line
charge distributions. The bunch is presented as an ensemble of 𝑁 particles that
experience the energy deviations due to longitudinal wakefield. For simulations 𝑁 = 106
particles have been used.
4.4 Energy modulation, bunch compression and microbunching in cold
neutral plasma
Bunch charge density modulation in infinite cold neutral plasma is studied via
ballistic bunching method. It is assumed that the electrons temperature is much higher
than the ions temperature (cold plasma). Under this assumption the plasma can be
considered as a medium with 휀 = 1 −𝜔𝑝2
𝜔2⁄ macroscopic dielectric constant, where the
plasma frequency is 𝜔𝑝 = 56.4 ∗ 103√𝑛𝑒 𝐻𝑧, with 𝑛𝑒 being the plasma electron density (in
𝑐𝑚−3 units) [47]. The wake function of the relativistic point charge, passing the cold neutral
plasma, is given by [47, 48]
𝑤𝑧(𝑠) = −2𝐻(𝑠)𝐾𝑙𝑜𝑠𝑠 cos(𝑘𝑝𝑠) (4.10)
where 𝐻(𝑠) is the Heaviside step function, 𝑘𝑝 =𝜔𝑝
𝑐⁄ is the wave number, 𝐾𝑙𝑜𝑠𝑠 is the
longitudinal loss factor of plasma channel.
- 74 -
Figure 4.3: Point charge wake function in cold neutral plasma (𝜔𝑝 = 56.4 ∗ 103√𝑛𝑒 𝐻𝑧 and
𝐾𝑙𝑜𝑠𝑠 = 45𝑘𝑉
𝑚/𝑝𝐶)
Numerical simulations of bunch compression and microbunching have been
performed for the driving bunch with 100 𝑝𝐶 charge and 10 𝑀𝑒𝑉 initial energy.
Wake potential generated by a Gaussian bunch in plasma channel can be obtained
by Eq. 4.2
𝑊∥(𝑠) =1
√2𝜋𝜎∫ 𝑤𝑧(𝑠 − 𝑠′)𝑒
−𝑠2
2𝜎2 𝑑𝑠′𝑠
−∞ (4.11)
Figure 4.4 presents the wake potential of the Gaussian charge distribution with
0.1 𝑚𝑚 rms bunch length in plasma channel with 𝑓𝑝 =𝜔𝑝
2𝜋⁄ = 1.43 𝑇𝐻𝑧 plasma frequency
(wavelength 𝜆𝑝 = 0.2 𝑚𝑚).
- 75 -
Figure 4.4: Gaussian bunch wake potential.
Figure 4.4 shows that the wake potential is decelerating at bunch’s head (𝑠 < 0)
and accelerating at bunch’s tail (𝑠 > 0). This leads to bunch compression till some critical
drift space distance, after which particles with coordinates 𝑠 > 0 overtake particles with
coordinates 𝑠 < 0. For distances bigger than the critical distance bunch starts to expand
and debunching process starts. From Figure 4.4 it can be seen that the central part
(~70%) of the bunch sees focusing wake, while bunch’s tail sees a decelerating wake.
Compressed bunch shape at various drift space distances after 2 𝑚 plasma channel
is shown in Figure 4.5. The dashed line represents the initial Gaussian bunch distribution.
It can be seen, that till 3.5 𝑚 drift space length bunch compresses, after which it starts to
expand. On 3.5 𝑚 drift space length the rms length of bunch’s central part that contains
70 % of the particles is 15 𝜇𝑚.
- 76 -
a
b
c
d
Figure 4.5: Line charge distribution after bunch passes 𝑙𝑑𝑟𝑖𝑓𝑡 distance in drift space
𝑎) 𝑙𝑑𝑟𝑖𝑓𝑡 = 1.5 𝑚, b) 𝑙𝑑𝑟𝑖𝑓𝑡 = 3.5 𝑚, c) 𝑙𝑑𝑟𝑖𝑓𝑡 = 4 𝑚, d) 𝑙𝑑𝑟𝑖𝑓𝑡 = 4.5 𝑚
To find the maximum compression, rms length dependence of distance is
calculated. rms length of the Gaussian bunch 70 % (central part) and 100 % particles
versus bunch travel distance in drift space is shown in Figure 4.6. As it was mentioned,
bunch’s tail sees defocusing wakefield. This defocused part artificially increases rms
length of a whole bunch and it always stays above 70 𝜇𝑚 . For 70 % bunch particles
maximum bunch compression is reached at 4 𝑚 distance (bunch rms length is ~ 12 𝜇𝑚)
after which the debunching process starts.
- 77 -
Figure 4.6: The Gaussian bunch longitudinal rms length for 70 % (left) and 100 % (right)
versus drift distance.
To have a microbunching, one needs a wakefield with several times smaller wave
length than bunch’s length. High frequency fields generated by a Gaussian distribution
are very low, because of exponential damping factor in distribution. While for Gaussian
bunch it is not possible to have a microbunching in appropriate distances, for some non-
Gaussian distributed bunches it is possible.
For the rectangular uniform charge distribution the wake potential in plasma
channel produces bunch energy modulation at the excited mode wavelength.
Rectangular uniform line charge distribution is in the form of
𝜆(𝑠) = { 1
2𝑎, |𝑠| ≤ 𝑎
0 , |𝑠| > 𝑎 (4.12)
and the rms length of the bunch is given by 𝜎 =𝑎
√3.
Wake potential of such a bunch can be derived from Eq. 4.2
𝑊𝑧(𝑠) = ∫ 𝑤𝑧 (𝑘𝑝(𝑠 − 𝑠′)) 𝜆(𝑠′)𝑑𝑠′
∞
−∞= {
0 , 𝑠 < −𝑎
𝑘𝑙𝑜𝑠𝑠
2𝑎𝑘sin (𝑘𝑝(𝑠 + 𝑎)) , |𝑠| ≤ 𝑎
𝑘𝑙𝑜𝑠𝑠
𝑎𝑘sin(𝑘𝑝𝑎) cos(𝑘𝑝𝑎) , 𝑠 > 𝑎
(4.13)
Figure 4.7 shows the wake potential generated by a rectangular uniform distributed
bunch of 0.58 𝑚𝑚 rms length (2 𝑚𝑚 total length) in a plasma channel with 0.6 𝑚𝑚 (𝑓𝑝 ≈
0.5 𝑇𝐻𝑧) excited mode wavelength.
- 78 -
Figure 4.7: Uniform bunch wake potential.
The energy modulation at the wakefield excited mode frequency leads to the charge
density modulation as the beam travels in free space.
a
b
c
d
Figure 4.8: Line charge distribution after passing 𝑙𝑑𝑟𝑖𝑓𝑡 distance in a drift space
𝑎) 𝑙𝑑𝑟𝑖𝑓𝑡 = 1.5 𝑚, b) 𝑙𝑑𝑟𝑖𝑓𝑡 = 2.5 𝑚, c) 𝑙𝑑𝑟𝑖𝑓𝑡 = 3.5 𝑚, d) 𝑙𝑑𝑟𝑖𝑓𝑡 = 5 𝑚
- 79 -
Charge density modulation at various drift space distances after 0.3 𝑚 plasma
channel is shown in Figure 4.8. As it can be seen, the density modulation leads to three
microbunches formation.
The best bunching is at the 3.5 𝑚 drift space distance, where the initial rectangular
bunch is transformed into three microbunches with 14 𝑝𝐶 charge and 40 𝜇𝑚 full width at
half maximum (FWHM). After that distance debunching process starts (Figure 4.8(d)).
Parabolic line charge distribution is taken in the form of
𝜆(𝑠) = { 1
2𝑎3(𝑎2 − 𝑠2), |𝑠| ≤ 𝑎
0 , |𝑠| > 𝑎 (4.14)
and rms length of the bunch is determined by 𝜎 =𝑎
√5.
The longitudinal wake potential of parabolic charge can be derived from Eq. 1.2
𝑊𝑧(𝑠) = ∫ 𝑤𝑧(𝑘(𝑠 − 𝑠′))𝜆(𝑠′)𝑑𝑠′
∞
−∞=
{
0 , 𝑠 < −𝑎
𝑘𝑙𝑜𝑠𝑠
𝑎3𝑘3[sin(𝑘(𝑠 + 𝑎)) − 𝑘𝑎 cos(𝑘(𝑠 + 𝑎)) − 𝑘𝑠] , |𝑠| ≤ 𝑎
𝑘𝑙𝑜𝑠𝑠
𝑎3𝑘3[sin(𝑘(𝑎 + 𝑠)) + sin(𝑘(𝑎 − 𝑠)) − 𝑘𝑎(cos(𝑘(𝑎 + 𝑠)) + cos(𝑘(𝑎 − 𝑠)))] , 𝑠 > 𝑎
(4.15)
The wake potential for parabolic charge distribution of 0.45 𝑚𝑚 rms length (2 𝑚𝑚
full length) is shown in Figure 4.9. Dashed line represents the bunch shape. To satisfy a
microbunching criterion a plasma channel with 0.6 𝑚𝑚 ( 𝑓𝑝 ≈ 0.5 𝑇𝐻𝑧 ) excited mode
wavelength is taken.
- 80 -
Figure 4.9: Parabolic bunch wake potential.
Particles energy modulation is observed with linear ramp of the average energy
deviation.
Figure 4.10 shows the parabolic charge density modulation at various drift space
distances after 1 𝑚 plasma channel length. The density modulation leads to microbunching
and initial bunch transforms into three microbunches.
a
b
c
d
Figure 4.10: Line charge distribution after passing 𝑙𝑑𝑟𝑖𝑓𝑡 distance in a drift space:
𝑎) 𝑙𝑑𝑟𝑖𝑓𝑡 = 1 𝑚, b) 𝑙𝑑𝑟𝑖𝑓𝑡 = 3 𝑚, c) 𝑙𝑑𝑟𝑖𝑓𝑡 = 5 𝑚, d) 𝑙𝑑𝑟𝑖𝑓𝑡 = 7 𝑚
The best bunching is observed on a 5 𝑚 drift space length, where microbunches
with 10 𝑝𝐶 charge 20 𝜇𝑚 length (FWHM) are formed. It can be seen that at 7 𝑚 drift space
length debunching of all three microbunches occurs.
- 81 -
4.5 Energy modulation, bunch compression and microbunching in internally
coated metallic tube
Energy and charge density modulation of Gaussian, rectangular uniform and
parabolic charge distributions in ICMT are observed. The geometry of ICMT is shown in
Figure 4.11.
Figure 4.11: Geometry of the ICMT
In a high frequency range, for a thin, low conductivity inner layer and infinite thick,
perfectly conducting outer layer the ICMT is a single-mode structure with 𝑓0 =𝑐
2𝜋√2 𝑎𝑑⁄
resonant frequency, where 𝑎 is the inner radii of a layer and 𝑑 is its thickness.
Wake function generated in ICMT by an ultrarelativistic point charge moving along
the structure axis can be presented as [50]
𝑤∥(𝑠) = −𝑍0𝑐
𝜋𝑎2𝑒−𝛼𝑠 [cos(𝑘𝑎𝑠) −
𝛼
𝑘𝑎sin(𝑘𝑎𝑠)] (4.17)
where, 𝑘𝑎 = √𝑘02 − 𝛼2 , 𝑘0 =
2𝜋
𝑐𝑓0 and 𝛼 damping factor is a function of layer thickness
and conductivity.
- 82 -
For non-ultrarelativistic particle (10 𝑀𝑒𝑉) the longitudinal wake function calculated in
[85] is used. Wake functions of a point charge with various energies are shown in Figure
4.12.
a
b
c
d
Figure 4.12: Wake functions of a point charge with gamma factor 𝛾 a) 𝛾 = 10, b) 𝛾 = 20, c) 𝛾 = 40, d) 𝛾 = 80
Matching the inner radii of the internal cover and its thickness one can obtain a
resonant frequency in 𝑇𝐻𝑧 region in the ICMT.
Numerical simulations are performed to determine bunch shape after drift space for
driving bunch charge of 𝑞 = 100 𝑝𝐶 with 𝑈0 = 10 𝑀𝑒𝑉 initial energy. The inner diameter of
a structure is 0.5 𝑚𝑚, electric conductivity of the first layer is 104 𝑆
𝑚, thickness of the first
layer is 1 𝜇𝑚. Excited mode frequency in ICMT with these parameters is approximately
𝑓0 =𝑐
2𝜋√2 𝑎𝑑⁄ = 3 𝑇𝐻𝑧 , which corresponds to 0.1 𝑚𝑚 wavelength. Point wake function of
such a structure is shown in Figure 4.12.b.
- 83 -
Figure 4.13 presents the wake potential of the Gaussian charge distribution with
0.1 𝑚𝑚 rms length (dashed line shows bunch shape).
Figure 4.13: 100 𝜇𝑚 Gaussian bunch wake potential.
The wake potential is decelerating at bunch’s head (𝑠 < 0) and accelerating at
bunch’s tail (𝑠 > 0). This energy modulation can lead to bunch compression for appropriate
drift space length.
Compressed bunch shape at various drift space distances after 1 𝑚 ICMT is shown
in Figure 4.14. Dashed line presents the initial Gaussian bunch distribution. The bunch
compresses till about 4 𝑚 drift space length after which tail of the bunch passes its head
and bunch starts to expand.
- 84 -
a
b
c
d
Figure 4.14: Line charge distribution at 𝑙𝑑𝑟𝑖𝑓𝑡 drift space distances.
𝑎) 𝑙𝑑𝑟𝑖𝑓𝑡 = 1 𝑚, b) 𝑙𝑑𝑟𝑖𝑓𝑡 = 2 𝑚, c) 𝑙𝑑𝑟𝑖𝑓𝑡 = 4 𝑚, d) 𝑙𝑑𝑟𝑖𝑓𝑡 = 6 𝑚
In ICMT, like in plasma, the Gaussian bunch sees strong focusing field on its central
part, while in its head and tail there is a weak field. Note that in ICMT there is no
debunching field on bunch’s tail. rms lengths of 70 % (central part) and 100 % particles
versus bunch travel distance in drift space is shown in Figure 4.15. The best compression
is reached at 3.8 𝑚 drift space distance, where a bunch with 70 𝑝𝐶 charge and 8.02 𝜇𝑚
rms length is formed.
- 85 -
Figure 4.15: rms of 70% (left) and 100% (right) of particles in a bunch versus drift space
distance.
To have a microbunching process in a structure one need a bunch several times
longer than the excited wavelength (0.1 𝑚𝑚 ). This criterion is taken into account for
studying microbunching of uniform rectangular and parabolic bunches.
Microbunching of rectangular uniform charge distribution with 0.17 𝑚𝑚 rms length
(0.6 𝑚𝑚 total length) in ICMT is studied. Wake potential of the bunch is presented in
Figure 4.16 (dashed line shows bunch shape). This wake potential generates an energy
modulation within the bunch at excited mode wavelength.
Figure 4.16: Uniform bunch wake potential.
The excited energy modulation leads to charge density modulation while it travels in
a free space. Figure 4.17 shows charge density modulations in various drift space
distances after 0.2 𝑚 ICMT. The initial uniform bunch transforms into several
microbunches.
- 86 -
a
b
c
d
Figure 4.17: Line charge distribution after passing 𝑙𝑑𝑟𝑖𝑓𝑡 distance in a drift space
𝑎) 𝑙𝑑𝑟𝑖𝑓𝑡 = 1 𝑚, b) 𝑙𝑑𝑟𝑖𝑓𝑡 = 2 𝑚, c) 𝑙𝑑𝑟𝑖𝑓𝑡 = 3 𝑚, d) 𝑙𝑑𝑟𝑖𝑓𝑡 = 4 𝑚
The best bunching is on 3 𝑚 drift space length, after which a debunching process
starts. Full width at half maximum (FWHM) of the first microbunch is 8 𝜇𝑚, which is a good
length for generating THz radiation. 7.8 % of total charge is concentrated in a full width
region of the first microbunch, and 10 % in three full width region. Full width of the second
microbunch is 16 𝜇𝑚 . 5.94 % of total charge is concentrated in a full width region and
10.5 % in three full width region.
Wake potential of parabolic charge distribution with 0.13 𝑚𝑚 rms length (0.6 𝑚𝑚
total length) is presented in Figure 4.18 (dashed line shows bunch shape). Bunch damping
energy modulation with linear ramp of the average energy deviation is observed.
- 87 -
Figure 4.18: Parabolic bunch wake potential.
Bunch shape change in various drift space lengths after 1 𝑚 ICMT is shown in
Figure19. The initial parabolic bunch transforms into several microbunches.
a
b
c
d
Figure 4.19: Line charge distribution after passing 𝑙𝑑𝑟𝑖𝑓𝑡 distance in a drift space
𝑎) 𝑙𝑑𝑟𝑖𝑓𝑡 = 3 𝑚, b) 𝑙𝑑𝑟𝑖𝑓𝑡 = 5 𝑚, c) 𝑙𝑑𝑟𝑖𝑓𝑡 = 7 𝑚, d) 𝑙𝑑𝑟𝑖𝑓𝑡 = 9 𝑚
- 88 -
The best bunching is on 7 𝑚 drift space length. On that distance FWHM of the first
microbunch is 7.5 𝜇𝑚. 1.8 % of total charge is concentrated in a full width region of the first
microbunch, and 2.2 % in three full width region. FWHM of the second microbunch is 3 𝜇𝑚.
1.54 % of total charge is concentrated in a full width region and 2.42 % in three full width
region.
4.6 Summary
Energy and charge density modulation of relativistic electron bunch after its
interaction with cold plasma and ICMT have been studied. The bunching and
microbunching processes of cold, low energy (10 𝑀𝑒𝑉) electron bunches of Gaussian,
rectangular and parabolic charge distributions are researched by ballistic method. It is
shown, that the Gaussian bunch interaction with these structures leads to its compression.
Bunch shape 𝑞0 𝑈0 𝜎0 𝜎𝑝, 𝑞𝑝 𝜎𝑡, 𝑞𝑡
Gaussian 100 𝑝𝐶 10 𝑀𝑒𝑉 100 𝜇𝑚 12 𝜇𝑚, 70 𝑝𝐶 8.02 𝜇𝑚, 70 𝑝𝐶
Table 1.1: Gaussian bunch parameters before and after interaction with plasma and ICMT.
Table 1.1 shows Gaussian bunch compression after plasma channel and ICMT. In
the table 𝑞0 is for bunch initial charge, 𝑈0 for initial energy, 𝜎0 is initial rms length, 𝜎𝑝 and
𝑞𝑝 are compressed bunch rms length and charge for plasma channel and finally 𝜎𝑡 and 𝑞𝑡
are rms length and charge for ICMT.
In a cold plasma a Gaussian bunch with 0.1 𝑚𝑚 rms length and 100 𝑝𝐶 charge can
be compressed by factor of 8, while in ICMT it can be compressed by factor of 12. For the
rectangular and parabolic bunches several times longer than the structure excited
frequency the microbunching process can be obtained.
Plasma ICMT
Bunch shape 𝑎0,𝑝 𝑎𝑝, 𝑞𝑝 𝑎0,𝑡 𝑎𝑡, 𝑞𝑡 𝑎𝑡, 𝑞𝑡
Rectangular 2 𝑚𝑚 40 𝜇𝑚, 14 𝑝𝐶 0.6 𝑚𝑚 8 𝜇𝑚, 7.8 𝑝𝐶 16 𝜇𝑚, 6 𝑝𝐶
Parabolic 2 𝑚𝑚 20 𝜇𝑚, 10 𝑝𝐶 0.6 𝑚𝑚 7.5 𝜇𝑚, 1.8 𝑝𝐶 3 𝜇𝑚, 1.5 𝑝𝐶
Table 1.2: Rectangular and parabolic bunches’ parameters before and after interaction with plasma
and ICMT.
- 89 -
Table 1.2 shows microbunching results for rectangular and parabolic bunches. In
the table indexes 𝑝 and 𝑡 are for plasma channel and ICMT, respectively. 𝑎0 is for bunch’s
initial length (FWHM), 𝑎and 𝑞 represents microbunches’ lengths and charges.
It is shown that in a cold plasma a uniform bunch with 2 𝑚𝑚 total length (0.58 𝑚𝑚
rms) and 100 𝑝𝐶 charge can be splitted into three microbunches with 40 𝜇𝑚 FWHM length
and 14 𝑝𝐶 charge. Parabolic bunch with 2 𝑚𝑚 full length ( 0.45 𝑚𝑚 rms) and 100 𝑝𝐶
charge forms three microbunches of 20 𝜇𝑚 full width and 10 𝑝𝐶 charges. Study of
microbunching process of rectangular bunch in ICMT shows that it is possible to generate
microbunches of 8 𝜇𝑚 FWHM length with 7.8 𝑝𝐶 charge and 16 𝜇𝑚 FWHM length with
5.94 𝑝𝐶 charge. Having an initial parabolic charge distribution, it is possible to generate
microbunches of 7.5 𝜇𝑚 FWHM length with 1.8 𝑝𝐶 charge and 3 𝜇𝑚 FWHM length with
1.54 𝑝𝐶 charge.
- 90 -
Summary
It is shown that in single-mode structures sub-ps bunches can be formed from
longer ones. The sub-ps bunch formation is researched in plasma channels and internally
coated metallic tubes. The ballistic bunching method is used in research. Bunch shape is
reconstructed numerically.
It is shown that two-layer structures with inner low conductivity material is a high
frequency single-mode structures. The theory of flat two-layer structure is developed. It is
shown that electrodynamic properties of the flat structure are similar to properties of the
cylindrical one. Rectangular cavity with horizontal two-layer metallic walls is studied and
correlation between modes obtained experimentally and theoretically is performed.
The main results of the dissertation are the following:
Matrix formalism has been developed which allows to couple point charge
radiated electromagnetic fields in the inner and outer regions of multilayer
parallel infinite plates.
Non-ultrarelativistic point charge excited electromagnetic fields in multilayer
parallel infinite plates are obtained analytically.
Explicit expression of non-ultrarelativistic point charge radiation fields in two-
layer parallel infinite plates with unbounded external walls is derived analytically.
Also point charge radiation fields in single-layer unbounded structure is derived
as a special case of two-layer structure.
Longitudinal impedance and dispersion relations of symmetrical two-layer
parallel infinite plates are derived. It is shown that, for low-conductivity thin inner
layer and high conductivity thick outer layer, the longitudinal impedance has a
narrow-band resonance in high frequency region.
- 91 -
The resonant frequency dependence of two-layer parallel infinite plates’
parameters is studied and resonance frequency dependence on structure
parameters is derived empirically.
Longitudinal wakefields generated by a point charge traveling through the center
of the two-layer parallel infinite plates with outer perfectly conducting material
are calculated. The longitudinal wake potential is a quasi-periodic function with
period given by the resonant frequency as c
𝑓𝑟𝑒𝑠.
Resonance frequencies of rectangular cavity with horizontal laminated walls are
obtained analytically.
It is shown that for rectangular cavity with vertical dimensions much bigger then
horizontal ones, the resonance frequencies are in good agreement with
frequencies of two-layer parallel infinite plates.
The measured resonances of copper cavity with horizontal walls internally
covered by germanium thin layer are correlated with analytically obtained
resonance modes of rectangular cavity. All resonances of the test cavity are in
conformity with analytically obtained modes.
It is shown that for appropriate structure parameters the rectangular cavity with
internally covered horizontal walls is a good candidate for bunch acceleration
and sub-ps (micro) bunch generation.
Compression of Gaussian bunches and microbunching of rectangular and
parabolic bunches is studied numerically in plasma channels and internally
coated metallic structures, based on the ballistic bunching method.
It is shown that Gaussian distributed bunches with initial 100 𝜇𝑚 rms length can
be compressed to 12 𝜇𝑚 and 8 𝜇𝑚 rms length in plasma channel and ICMT,
respectively.
- 92 -
It is shown that bunches with 20 𝜇𝑚 and 3 𝜇𝑚 full length can be formed due to
microbunching of parabolic bunches in plasma channel and ICMT, respectively.
It is shown that bunches with 40 𝜇𝑚 and 8 𝜇𝑚 full length can be formed due to
microbunching of rectangular bunches in plasma channel and ICMT,
respectively.
The results of the study can be useful for the development of new accelerating
structures for particle acceleration, monochromatic coherent radiation sources, ultrashort
bunch generation.
- 93 -
Acknowledgements
I express sincere gratitude to the director of CANDLE prof. Tsakanov, the head of the
doctor's work. M.I. Ivanyan and all the staff of CANDLE for their constant support and
assistance.
- 94 -
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