EENG 3510 Chapter 4 Metal-Oxide- Semiconductor (MOS) Field-Effect Transistors (MOSFETs) 1

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  • EENG 3510 Chapter 4 Metal-Oxide- Semiconductor (MOS) Field-Effect Transistors (MOSFETs) 1
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  • Chapter 4 Homework 4a 4.5, 4.7a&b, D4.14, D4.34, 4.36, 4.42(a for Figures (a) & (b), assume saturation in (a)), 2
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  • Chapter 4 Homework 4b 4.51, 4.59, 4.58, 4.64a, 4.69, 4.99 3
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  • Introduction From Diode to Transistor Two terminals to three terminals Use of the voltage between two terminals to control the current flowing in the third terminal Two types of Transistors MOSFETs: metal oxide semiconductor field effect transistors (chapter 4) BJT: bipolar junction transistor (chapter 5) Topics Physical structure and operations Terminal characteristics Circuit models Basic circuit applications: amplifier and logic inverter 4
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  • Metal-Oxide- Semiconductor (MOS) Field- Effect Transistors (MOSFETs) MOSFET Most important component in modern digital integrated circuits Used in microprocessors Used in computer memory 5
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  • 4.1 Device Structure and Physical Operation ( Physical structure of the enhancement-type NMOS transistor) 6 perspective view cross-section Typically L = 0.1 to 3 m, W = 0.2 to 100 m, and the thickness of the oxide layer (t ox ) is in the range of 2 to 50 nm.
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  • 4.1 Device Structure and Physical Operation 4.1.1 Device Structure Source (S) connects to Body (B), Drain (D) is at a positive voltage relative to S, two pn junctions are cut off Substrate: no effect on device operation 3 terminals device Source and drain can be interchanged 7
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  • 4.1.4 Applying a Small VDS 8 An NMOS transistor with v GS (gate voltage) > V t (threshold voltage)and with a small v DS applied. The device acts as a resistance whose value is determined by v GS. Specifically, the channel conductance is proportional to v GS V t and thus i D is proportional to ( v GS V t ) v DS. Note that the depletion region is not shown (for simplicity).
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  • 4.1.4 Applying a Small VDS (Cont.) 9 The i D (drain current) v DS (drain voltage) characteristics of the MOSFET in the above slide when the voltage applied between drain and source, v DS, (drain source) is kept small. The device operates as a linear resistor whose value is controlled by v GS (gate source).
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  • 4.1.5 Operation as V DS I s Increased 10 Operation of the enhancement NMOS transistor as v DS is increased. The induced channel acquires a tapered shape, and its resistance increases as v DS is increased. Here, v GS is kept constant at a value > V t.
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  • 4.1.6 Derivation of the I D V DS relationship 11 The drain current i D versus the drain-to-source voltage v DS for an enhancement-type NMOS transistor operated with v GS > V t.
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  • 4.1.8 Complementary MOS or CMOS 12 Cross-section of a CMOS integrated circuit. Note that the PMOS transistor is formed in a separate n-type region, known as an n well. Another arrangement is also possible in which an n-type body is used and the n device is formed in a p well.
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  • 13 Symbols for enhancement-type MOSFETs
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  • 4.2 Current-Voltage Characteristics 4.2.1 Circuit Symbol 14 (a) Circuit symbol for the n-channel enhancement-type MOSFET. (b) Modified circuit symbol with an arrowhead on the source terminal to distinguish it from the drain and to indicate device polarity (i.e., n channel). (c) Simplified circuit symbol to be used when the source is connected to the body or when the effect of the body on device operation is unimportant.
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  • 4.2.2 The I D v DS Characteristics There are three distinct regions of operation: The cut-off region The triode region The saturation region 15
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  • 4.2.2 The I D v DS Characteristics (Cont.) 16 (a) An n-channel enhancement-type MOSFET with v GS and v DS applied and with the normal directions of current flow indicated. (b) The i D v DS characteristics for a device with k n (W/L) = 1.0 mA/V 2.
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  • 4.2.2 The I D v DS Characteristics (Cont.) 17 Cut off region
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  • 4.2.2 The I D v DS Characteristics (Cont.) 18 Triode region The N-channel enhancement-type MOSFET Operates in the triode region when v GS is greater than V i and the drain voltage is lower than the gate voltage by at least V t.
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  • Triode Region Example 19
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  • Triode Region Example (Cont.) 20
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  • Problem 4.7c&d 21
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  • Problem 4.7c&d (Cont.) 22 ox for silicon = 3.45x10 -11
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  • 4.2.2 The I D v DS Characteristics (Cont.) 23 Saturation region The N-channel enhancement-type MOSFET Operates in the saturation region when v GS is greater than V i and the drain voltage does not fall below the gate voltage by more than V t.
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  • Saturation Region Example 24
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  • 4.2.2 The I D v DS Characteristics (Cont.) 25 Saturation region The i D v GS characteristic for an enhancement-type NMOS transistor in saturation (V t = 1 V, k n W/L = 1.0 mA/V 2 ).
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  • 4.2.2 The I D v DS Characteristics (Cont.) 26 Large-signal equivalent-circuit model of an n-channel MOSFET operating in the saturation region
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  • 4.2.3 Finite Output Resistance in Saturation 27 IDEAL: a change v DS causes zero change in I D, which means infinite output resistance Increasing v DS beyond v DSsat causes the channel pinch-off point to move slightly away from the drain, thus reducing the effective channel length (by L).
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  • 4.2.3 Finite Output Resistance in Saturation 28 Large-signal equivalent circuit model of the n-channel MOSFET in saturation, incorporating the output resistance r o. The output resistance models the linear dependence of i D on v DS and is given by Eq. (4.22). Eq. 4.22Eq. 4.24
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  • 4.3 MOSFET Circuit At DC 29
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  • Example 4.2 30 Design the circuit of Fig. 4.20 so that the transistor operates at I D =0.4mA and V D =+0.5V. The NMOS transistor has V t =0.7V, n C ox =100 A/V 2, L = 1 m, and W=32 m. Neglect the channel- length modulation effect (i.e. assume that =0). RD= ?, RS = ?
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  • Example 4.2 (Cont.) 31
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  • Example 4.2 (Cont.) 32
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  • Another Design Example 33 Figure 1
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  • Example 4.4 34 Design the circuit in Fig. 4.22 to establish a drain voltage of 0.1 V. What is the effective resistance between drain and source at this operating point? Let Vt=1 V, knW/L=1mA/V2.
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  • Example 4.4 (Cont.) 35
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  • Example 4.4 (Cont.) 36
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  • Another Design Example 37 Figure 2 Assume saturation
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  • Figure (c) 38 V 5 = -10 - ( - (2.5x10 3 )(2x10 -3 )) = - 10 + 5 = -5 V I D = 2 = ()(1)(V ov ) 2 ) (V ov ) 2 = 4 V ov = 2, However, V ov = -2 V since pmos circuit V GS = V t + V ov = -2 -2 = - 4 Thus V s = 4 V = V 4 Assume saturation
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  • Figure (d) 39 I D = 2 = ()(1)(V ov ) 2 ) (V ov ) 2 = 4 V ov = 2, However, V ov = -2 V since pmos circuit V GS = V t + V ov = -2 -2 = - 4, V s = 4 V 6 = 10 4 = 6 V V 7 = 6 4 = 2 V
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  • 4.4 The MOSFET As An Amplifier and As A Switch 40
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  • 4.4.1 Large-signal Operation The Transfer Characteristic 41 Basic structure of the common-source amplifier Graphical construction to determine the transfer characteristic of the amplifier in (a). Common Source Amplifier (CS) To determine the voltage transfer characteristic between v I and v O V I = v GS V O = v DS = V DD - R D i D Graphically and analytically v DS = V DD -R D i D i D = (V DD -v DS )/R D
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  • 4.4.2 Graphical Derivation of the Transfer Characteristic 42 Transfer characteristic showing operation as an amplifier biased at point Q.
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  • 4.4.3 Operation As Switch 43
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  • 4.4.4 Operation as a Linear Amplifier 44 Two load lines and corresponding bias points. Bias point Q 1 does not leave sufficient room for positive signal swing at the drain (too close to V DD ). Bias point Q 2 is too close to the boundary of the triode region and might not allow for sufficient negative signal swing.
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  • 4.4.5 Analytical Expressions for the Transfer Characteristic 45 Cutoff-Region Segment, XA v I < V t, and v O = V DD
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  • 4.4.5 Analytical Expressions for the Transfer Characteristic (Cont.) 46 Saturation-Region Segment, AQB A v = - 2 (V DD V OQ ) / V OV = - (2V RD ) / V OV
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  • Example 47
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  • Example (Cont.) 48 A v = - 2 (V DD V OQ ) / V OV = - (2V RD ) / V OV
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  • 4.4.5 Analytical Expressions for the Transfer Characteristic (Cont.) 49 Triode-Region Segment, BC
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  • 4.5 Biasing In MOS Amplifier Circuits 50
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  • 4.5.1 Biasing by Fixing V GS 51 Most straightforward Device dependent Temperature dependent The use of fixed bias (constant V GS ) can result in a large variability in the value of I D. Devices 1 and 2 represent extremes among units of the same type. Variability
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  • 4.5.2 Biasing by Fixing VG and Connecting a Resistance in the Source 52 Reduced Variability Biasing using a fixed voltage at the gate, VG, and a resistance in the source lead, RS: (a)basic arrangement; (b)reduced variability in ID;
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  • 4.5.2 Biasing by Fixing VG and Connecting a Resistance in the Source (Cont.) 53 Biasing using a fixed voltage at the gate, VG, and a resistance in the source lead, RS: (c) practical implementation using a single supply; (d) coupling of a signal source to the gate using a capacitor CC1; (e) practical implementation using two supplies.
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  • Example 54 6 Bias current does not change
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  • Example 55
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  • 4.5.3 Biasing Using a Drain-to-Gate Feedback Resistor 56 Biasing the MOSFET using a large drain-to-gate feedback resistance, R G.
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  • Problem 4.64b 57
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  • 4.5.4 Biasing Using a Constant-Current Source 58 Biasing the MOSFET using a constant-current source I. Implementation of the constant- current source I using a current mirror.
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  • 4.5.4 Biasing Using a Constant-Current Source (Cont.) 59
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  • 4.6 Small-Signal Operation And Models 60
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  • 4.6.1 The DC Bias Point 61 Set v gs to zero Conceptual circuit utilized to study the operation of the MOSFET as a small-signal amplifier.
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  • 4.6.2 The Signal Current in the Drain Terminal 62 Conceptual circuit utilized to study the operation of the MOSFET as a small-signal amplifier. VOVO i D = the instantaneous drain current I D = the DC Bias Current To reduce nonlinear distortion, the input signal should be kept small so that:
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  • 4.6.3 The Voltage Gain 63 Conceptual circuit utilized to study the operation of the MOSFET as a small-signal amplifier.
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  • 4.6.4 Separating the DC Analysis and the Signal Analysis 64 Conceptual circuit utilized to study the operation of the MOSFET as a small-signal amplifier.
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  • 4.6.5 Small Signal Equivalent-Circuit Models 65 neglecting the dependence of i D on v DS in saturation (the channel- length modulation effect) including the effect of channel- length modulation, modeled by output resistance r o = |V A | /I D. V A = 1/ (where = the channel-length modulation effect) r 0 = 10K to 1000K
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  • 4.6.6 The Transconductance g m 66 In contrast, g m for a bipolar junction transistor (BJT) is proportional to I D and is independent of the physical size And geometry of the device.
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  • Example 67
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  • Example a 68 I D = (1/2) x 1 x (5 1) 2 2I D = 4 2 = 16 I D = 8 mA
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  • Example b 69 G m = 1 x (5 1) = 4 mA/V
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  • Example c 70 A V = - 4mA x 4K = -16 V/V
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  • Example d 71 output resistance r o = |V A | /I D V A = 1/ (where = the channel-length modulation effect) r O = 1 / (0.01 x 8mA) = 1 / 0.08mA = 12.5 K A V = - 4mA x (4K || 12.5K) = - 3.03 V/V
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  • 4.6.7 The T Equivalent-Circuit Model 72 Development of the T equivalent-circuit model for the MOSFET. For simplicity, r o has been omitted but can be added between D and S in the T model of (d).
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  • 4.6.7 The T Equivalent-Circuit Model (cont.) 73 The T model of the MOSFET augmented with the drain-to-source resistance r o. An alternative representation of the T model.
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  • 4.6.9 Summary Small Signal Parameters Transconductance: Output Resistance: Small Signal Equivalent Circuit Models 74 Hybrid- model T models
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  • 4.7 Single-Stage MOS Amplifiers 75
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  • 4.7.1 The Basic Structure 76 Basic structure of the circuit used to realize single-stage discrete-circuit MOS amplifier configurations
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  • 4.7.2 Characterizing Amplifiers 77
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  • 4.7.2 Characterizing Amplifiers (cont.) 78
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  • 4.7.2 Characterizing Amplifiers (cont.) 79
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  • 4.7.3 The Common-Source (CS) Amplifier 80
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  • 4.7.3 The Common-Source (CS) Amplifier (cont.) 81
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  • 4.7.3 The Common-Source (CS) Amplifier (cont.) 82
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  • 4.7.4 The Common-Source Amplifier with a Source Resistance 83 Common-source amplifier with a resistance R S in the source lead. Small-signal equivalent circuit with r o neglected.
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  • 4.7.4 The Common-Source Amplifier with a Source Resistance 84
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  • Problem 77 85
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  • Problem 77a 86 a)V G = 15 x (5/15) = 5 V V S = 3I D = V GS = 5 - 3I D I D = (1/2)(2)(5 - 3I D - 1) 2 0 = 16 -25I D + 9I D 2 I D = 1 mA V GS = 5 - 3I D = 2 V V D = 15 (7.5K x 1mA) = 7.5 V
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  • Problem 77b 87 G m = 2 I D / V OV = (2 x 1) /(2 1) = 2 mA r O = V A / I D = 100/1mA = 100K
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  • Problem 77c 88
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  • Problem 77d 89 x x
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  • 4.7.5 The Common-Gate (CG) Amplifier 90
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  • 4.7.5 The Common-Gate (CG) Amplifier (cont.) 91
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  • 4.7.6 The Common-Drain (CD) or Source- Follower Amplifier 92
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  • 4.7.6 The Common-Drain (CD) or Source- Follower Amplifier (cont.) 93
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  • 4.7.6 Summary and Comparisons 94
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  • 4.7.6 Summary and Comparisons (cont.) 95
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  • 4.7.6 Summary and Comparisons (cont.) 96
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  • 4.7.6 Summary and Comparisons (cont.) 97