Design and calibration of System-on-Chip switched capacitor array based waveform

digitizers for particle trackingI sar Mostafanezhad, Ph.D.

Founder and CEO, Nalu Sc ient i f ic , LLC

Sep 14, 2018

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On behalf of teams at Nalu Scientific and University of HawaiiWork sponsored by DOE Office of Science SBIR program

2800 Woodlawn Dr. Ste #240Honolulu, HI 96822info@naluscientific.com+1 (888) 717-6484

About Nalu Scientific

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Photo: http://www.myhawaiirealestateonline.com/manoa-real-estate/

Mission statement:

Design house for DOE electronics needs with commercial grade support

ASIC DesignMixed signal System-on-ChipPower optimizationFull suite commercial grade Cadence license and server + design kits

Hardware DesignFPGA, VHDL developmentImplementationBring up and debuggingComplex multi-layer boards

Expertise in:Radiation detection, fast timing, time of flight measurementsReadout electronics for HEP/NP

1. Various Front-end Chip:• Event based digitizer+DSP• 4-32 channel scope on chip• 1-15 Gsa/s, 12 bit res.• Low SWaP• Low cost• User friendly

Main application: Particle collider experiments(Belle II at KEK in Japan)

3. Other applications:• Lidar• UAV radar• PET imaging• Low light detection• Picosecond timing

Waveform Digitizer SoCs for Single Photon Time of Fight Detection:

Compact, Low Cost, Low Power

NALU SCIENTIFIC, LLC

2. Integration:• SiPM• PMT• LAPPD• Antenna arrays

A Bit of History:Belle II Upgrade

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2015 2018

Belle II: e+ e- experiment at 40x luminosity of Belle -> Detector needs to operate at severe beam background

Belle II: KLM Scintillator Upgrade20k+ channels at 1 GSa/s ea.

KLM detectors:◦ Endcap: scintillators

◦ Barrel: scintillators +RPCs

Located outside the magnet

5Belle II Summer School, PNNL, August 2015

Belle II: KLM Scintillator Upgrade20k+ channels at 1 GSa/s + DSP

6Barcode Laser engraving

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Benchtop testing

Crate testing at UH

1) KLM Motherboard2) KLM Ribbon Header Interface Card (RHIC)3) KLM SCROD Rev A4) TARGETX Daughtercards

Electronics testing

7NALU SCIENTIFIC, LLC---- PREPARED FOR NASA, AUG 7, 2017- DO NOT PUBLISH

KLM final packaging: 111 modules in 4 large crates ~16k channels

Motherboards andRHICs staged in minicrates

Minicrates inserted in large crates

Crates closed and ready for truck

8NALU SCIENTIFIC, LLC---- PREPARED FOR NASA, AUG 7, 2017- DO NOT PUBLISH

TOP and KLM Subdetectors fully commissioned

92017 IEEE NSS-MIC, N-05 — Analog and Digital Circuit I Nalu Scientific, LLC

Lessons learned 1:Classical HEP/NP Experiment

102017 IEEE NSS-MIC, N-05 — Analog and Digital Circuit I Nalu Scientific, LLC

Lessons learned 2:OpportunitiesHEP/NP electronics need to be:◦ Rad hard

◦ High performance

◦ Low cost

◦ Low power

◦ Highly integrated

◦ User friendly

Optimize to get to sweet spot = 2-3x gain

Solution: new design/SoC integration = 10 x gain

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Low cost

High performanceLow power

How to save power? - Analog Memory

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• Always sampling• On-demand digitizing

Gary Varner

Benefits of Higher Integration - SoC•Analog memory:• Sampling always on (1-10 Gsa/s), but at low power

• Digitize only Region of Interest (ROI)

• Long analog buffer -> suitable for large experiments

•Digital processing:• Per channel cost reduction by a factor of 4

• Relax thermal design by 40% reduction in power dissipation

• Trigger time-stamping at the front-end

• Eliminating the need for costly high-end FPGAs

• User friendly: substantially reducing the FPGA firmware development labor

• Reduced complexity and design and cabling effort/cost for the front-end boards

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Analog/Mixed signal design

Digital/Synthesized logic

System-on-Chip (SoC)

SBIR Data Rights.

SBIR Project: ASoC- System on ChipCompact, high performance waveform sampling- Funded Phase II

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Spec

Sampling rate 2-4 Gsa/s

ABW 0.9-1.5GHz

Depth 32k Sa

N channels: 4-8

Fab 250nm CMOS

Key Contribution:• High performance digitizer: 3+ Gsa/s• Highly integrated• Commercially available• 5mm x 5mm die size

Waveform Sampling Core

Funded DOE Phase II Project

Nalu Scientific- ASIC developments NALU SCIENTIFIC, LLC-

All chips, are designed with commercial grade tools and licenses and can be sold once commercialized.

ASoC Under test

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ASoC Evaluation FMC Card

ASoC Test/Calibration Underway

•Digitized waveform vs. ideal sinewave

•Calculating residuals and calibrating ADC bias points for optimal performance

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68.5V SiPM bias - self triggeredTemporal ROI readout

ASoC Next steps•Wrap up testing and publish results

•Send evaluation modules to collaborators for taking data and testing (aka sales!)

•Prepare for next tape-out:• Funded SBIR Phase II

• Address minor bugs

• More integration/features:

•Internal developments on applications of ASoC

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AARDVARC Rev.1Packaged (QFN-12mmx12mm)

AARDVARC Rev.1Die wire-bonded to pins

AARDVARC Rev.1Input stage wire-bonds

http://www.naluscientific.com/

Moving toward higher sample rate:AARDVARC : 5-15 GSa/s Digitizer System-on-Chip – Phase II SBIR

Main focus: 5-10ps timing resolution

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AARDVARC Eval PCB semi populated.Testing ongoing.So far NO SMOKE!

Current SoC-ASIC ProjectsProject Sampling

Frequency (GHz)

Input BW (GHz)

Buffer Length (Samples)

Number of Channels

Timing Resolution (ps)

Integration

Built-in Readout Available Date

ASoC 3-5 0.8 32k 8 35 SoC Pre amps Parallel Aug 2018

SiREAD 1-3 0.7 4k 64 80-120 SoC Amp, bias Fast serial May 2018

AARDVARC 6-10 2.5 32k 4-8 4-8 SoC Pre amps Fast serial Sep 2018

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• ASoC: Analog to digital converter System-on-Chip• Rev 1 under test – Eval card available

• SiREAD: SiPM specialized readout chip with bias and control• Rev 1 under test

• AARDVARC: Variable rate readout chip for fast timing and low deadtime• Rev 1 under test –

All chips, are designed with commercial grade tools and licenses and can be sold once commercialized.

NALU SCIENTIFIC, LLC-

Seeking Collaborations• R&D funding has been secured for :

• 3x SBIR Phase I

• 2x SBIR Phase II

• Enabling technology:• Low cost ($10s/ch - $100s/ch)

• High precision (100-5 ps)

• Compact (SoC)

• Low power (20-50 mW/ch)

• Long analog buffer (3-10us/ch)

• Looking to develop the next generation instruments for:• Fast diagnostics imaging

• High channel count, low cost Time of Flight (ToF)

• Radiation detection

21NALU SCIENTIFIC, LLC