dave heading and bp1 - Samtec Microelectronicssuddendocs.samtec.com/testreports/206131 test report rev 1.2_qua.pdf1240 Steam Ageing Unit Mountaingate Eng. SAT1-0-S1 9211-264 See Manual

Contech ResearchAn Independent Test and Research Laboratory

APRIL 24, 2006

TEST REPORT #206131, REVISION 1.2

QUALIFICATION TESTING

PES/PET CONNECTOR SERIES

PART NUMBERS

PES-08-01-S-RA-SDPET-08-01-S-RA

SAMTEC, INC.

APPROVED BY: THOMAS PEELPRESIDENT AND

DIRECTOR OF TEST PROGRAM DEVELOPMENTCONTECH RESEARCH, INC.

TR#206131, REV.1.2 2 of 36 Contech ResearchAn Independent Test and Research Laboratory

REVISION HISTORY

DATE REV. NO. DESCRIPTION ENG.

4/24/2006

4/25/06

5/2/06

1.0

1.1

1.2

Initial Issue

Editorial changes

Added Part Numbers

TP

TP

TP


CERTIFICATION

This is to certify that the evaluation described herein wasdesigned and executed by personnel of Contech Research, Inc.It was performed with the concurrence of Samtec, Inc. of NewAlbany, Inc. who was the test sponsor.

All equipment and measuring instruments used during testingwere calibrated and traceable to NIST according to ISO 10012-1and ANSI/NCSL Z540-1 and MIL-STD-45662 as applicable.

All data, raw and summarized, analysis and conclusionspresented herein are the property of the test sponsor. No copyof this report, except in full, shall be forwarded to anyagency, customer, etc., without the written approval of thetest sponsor and Contech Research.

Thomas PeelPresident And

Director Of Test Program DevelopmentContech Research, Inc.

TP:js/cm


SCOPE

To perform Qualification testing on the PES/PET Connector Seriesas manufactured and submitted by the test sponsor Samtec, Inc.

APPLICABLE DOCUMENTS

1. Unless otherwise specified, the following documents ofissue in effect at the time of testing performed form apart of this report to the extent as specified herein. Therequirements of sub-tier specifications and/or standardsapply only when specifically referenced in this report.

2. Product Specifications: Samtec TC0610-0959

3. Standards: EIA Publication 364

TEST SAMPLES AND PREPARATION

1. The following test samples were submitted by the testsponsor, Samtec, Inc., for the evaluation to be performedby Contech Research, Inc.

Description Part Number

a) PES Connector Series (lead free) PES-08-01-S-RA-SDPower Terminal Recept

b) PET Connector Series (lead free) PET-08-01-S-RAPower Terminal Plug

2. Test boards for mounting test samples were supplied by thetest sponsor.

3. Test samples were supplied assembled and terminated to testboards by the test sponsor.

4. Figure #1 illustrates the test board layout used formounting test samples.

5. The test samples were tested in their ‘as received’condition.

6. Unless otherwise specified in the test procedures used, nofurther preparation was used.


TEST SELECTION

1. See Test Plan Flow Diagram, Figure #2, for test sequencesused.

2. Test set ups and/or procedures which are standard or commonare not detailed or documented herein provided they arecertified as being performed in accordance with theapplicable (industry or military) test methods, standardsand/or drawings as specified in the detail specification.

SAMPLE CODING

1. All samples were coded. Mated test samples remained witheach other throughout the test group/sequences for whichthey were designated. Coding was performed in a mannerwhich remained legible for the test duration.

2. The test samples were coded in the following manner:

Sequence A : 1,2,3Sequence B : 4,5,6Sequence C : 7,8,9Sequence D : 10,11,12


FIGURE #1


FIGURE #2

TEST PLAN FLOW DIAGRAM

SAMPLE PREPARATION

LLCR MECHANICAL SOLDERABILITY CLEANINGSHOCK

DURABILITYSINE

VIBRATIONLLCR

THERMALSHOCK

LLCR

CYCLICHUMIDITY

LLCR

SEQUENCE A SEQUENCE B SEQUENCE C SEQUENCE D


DATA SUMMARY

TEST REQUIREMENT RESULTS

SEQUENCE A

LLCR RECORD 0.44 mΩ MAX.DURABILITY NO DAMAGE PASSEDLLCR +10.0 mΩ MAX.CHG. +0.09 mΩ MAX.CHG.THERMAL SHOCK NO DAMAGE PASSEDLLCR +10.0 mΩ MAX.CHG. +0.09 mΩ MAX.CHG.CYCLIC HUMIDITY NO DAMAGE PASSEDLLCR +10.0 mΩ MAX.CHG. +0.10 mΩ MAX.CHG.

SEQUENCE B

MECHANICAL SHOCK NO DAMAGE PASSED10.0 NANOSECOND PASSED

SINE VIBRATION NO DAMAGE PASSED10.0 NANOSECOND PASSED

SEQUENCE C

SOLDERABILITY 95% COVERAGE PASSED

SEQUENCE D

CLEANING NO DAMAGE PASSED


EQUIPMENT LIST

ID# Next Cal Last Cal Equipment Name Manufacturer Model # Serial # Accuracy Freq.Cal

1 6/27/2006 6/27/2005 Digital Thermometer John Fluke Mfg. 2190A 2775012 See cal cert 12mon.55 Air Fume Hood Labconco 47715 61279 N/A N/A

152 Drill Press Stand Craftsman 25921 N/A N/A N/A171 Temp. control / Hot Plate Dowty MDC5 1169 N/A Ea Test192 Vertical Thermal Shock Cincinnati Sub-Zero VTS-1-5-3 88-11094 See Cal Cert Ea Test281 Vibration Power Amp Ling Dynamics DPA 10K 156 N/A N/A282 Vibration Shaker Table Ling Dynamics V-730 163 N/A N/A297 10/26/2006 10/26/2005 Micro-Ohm Meter Keithley Instr. 580 485414 See Cal Cert 12mon323 Computer Legatech 286-12 N/A N/A N/A340 X-Y Table NE Affiliated Tech. XY-6060 N/A N/A N/A547 Temp Humid Chamber CSZ ZH-8-1-H-AC ZG9442057 See Cal Cert Ea Test553 12/12/2006 12/12/2005 12 channel Power Unit PCB Co. 483A 1303 See Cal Cert 12mon609 Ultrasonic Cleaner Bransonic 5210 9609010C N/A N/A621 Ultrasonic Cleaner Branson Co. 8210 RPC9610504C N/A N/A684 6/22/2006 6/22/2005 Accelerometer PCB. Co. 353B04 47648 See Cal Cert. 12mon874 Computer M&P Vectra us75203327 N/A N/A

1028 12/22/2006 12/22/2005 Event Detector Analysis Tech 32 EHD 981019 See Cal.Cert. 12mon1240 Steam Ageing Unit Mountaingate Eng. SAT1-0-S1 9211-264 See Manual N/A1314 1/10/2007 1/10/2006 Multiplexer card Keithley Co. 7708 0862544 See CERT 12mon1315 1/10/2007 1/10/2006 Data Aquisition Multimeter Keithley Co. 2700 0862680 See CERT 12mon1328 Melting Pot Waage RSP2-13-2 1200W N/A N/A1361 1/10/2007 1/10/2006 Multiplexer Card Keithley 7708 1067661 See Cal Cert 6mon1366 Main Frame Aiglent H.P. 8408A N/A N/A1367 Interface Aiglent H.P. E8491A N/A N/A1368 2/13/2007 2/13/2006 Sine/Rnd Control digitizer Aiglent H.P. E1432A US35470169 See Manual 12mon


TEST RESULTS

SEQUENCE A


PROJECT NO.: 206131 SPECIFICATION: TC0550-0899A------------------------------------------------------------PART NO.: PES-08-01-S-RA-SD PART DESCRIPTION: RT Angle Power

PET-08-01-S-RA Terminal------------------------------------------------------------SAMPLE SIZE: 3 Samples TECHNICIAN: DAM------------------------------------------------------------START DATE: 3/28/06 COMPLETE DATE: 3/28/06------------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 24%------------------------------------------------------------EQUIPMENT ID#: 297, 323------------------------------------------------------------LOW LEVEL CIRCUIT RESISTANCE (LLCR)

PURPOSE:

1. To evaluate contact resistance characteristics of thecontact systems under conditions where applied voltages andcurrents do not alter the physical contact interface andwill detect oxides and films which degrade electricalstability. It is also sensitive to and may detect thepresence of fretting corrosion induced by mechanical orthermal environments as well as any significant loss ofcontact pressure.

2. This attribute was monitored after each preconditioningand/or test exposure in order to determine said stabilityof the contact systems as they progress through theapplicable test sequences.

3. The electrical stability of the system is determined bycomparing the initial resistance value to that observedafter a given test exposure. The difference is the changein resistance occurring whose magnitude establishes thestability of the interface being evaluated.

------------------------------------------------------------PROCEDURE:

1. The test was performed in accordance with EIA 364, TestProcedure 23 with the following conditions:

2. Test Conditions:

a) Test Current : 100 milliamps maximumb) Open Circuit Voltage : 20 millivoltsc) No. of Positions Tested : 8 per test sample


PROCEDURE: continued

3. The points of application are shown in Figure #3.

------------------------------------------------------------REQUIREMENTS:

Low level circuit resistance shall be measured and recorded.

------------------------------------------------------------RESULTS:

1. The following is a summary of the data observed:

LOW LEVEL CIRCUIT RESISTANCE(Milliohms)

Sample ID# Avg. Max. Min.

1 0.32 0.38 0.302 0.32 0.35 0.293 0.33 0.44 0.28

2. See pages 20613101 through 20613103 for individual datapoints.


FIGURE #3



PET-08-01-S-RA Terminal------------------------------------------------------------SAMPLE SIZE: 3 Samples TECHNICIAN: DAM------------------------------------------------------------START DATE: 3/28/06 COMPLETE DATE: 3/28/06------------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 24%------------------------------------------------------------EQUIPMENT ID#: 152, 297, 323, 340------------------------------------------------------------DURABILITY

PURPOSE:

1. This is a preconditioning sequence which is used to inducethe type of wear on the contacting surfaces which may occurunder normal service conditions. The connectors are matedand unmated a predetermined number of cycles. Uponcompletion, the units being evaluated are exposed to theenvironments as specified to assess any impact onelectrical stability resulting from wear or other weardependent phenomenon.

2. This type or preconditioning sequence is also used tomechanically stress the connector system as would normallyoccur in actual service. This sequence in conjunction withother tests is used to determine if a significant loss ofcontact pressure occurs from said stresses which in turn,may result in an unstable electrical condition to exist.

------------------------------------------------------------PROCEDURE:

1. The test was performed in accordance with EIA 364, TestProcedure 09.

2. Test Conditions:

a) No. of Cycles : 100b) Rate : 1.0 inch per minute

3. The test samples were assembled to special holding devicesand attached to the manual cycling equipment.



4. All subsequent variable testing was performed in accordancewith the procedures previously indicated.

------------------------------------------------------------REQUIREMENTS:

1. There shall be no evidence of physical damage to the testsamples so tested.

2. The change in low level circuit resistance shall not exceed+10.0 milliohms.

------------------------------------------------------------RESULTS:

1. There was no evidence of physical damage to the testsamples as tested.


CHANGE IN LOW LEVEL CIRCUIT RESISTANCE(Milliohms)

Avg. Max.Sample ID# Change Change

1 +0.01 +0.032 +0.02 +0.093 -0.02 +0.02




PET-08-01-S-RA Terminal------------------------------------------------------------SAMPLE SIZE: 3 Samples TECHNICIAN: DAM------------------------------------------------------------START DATE: 3/29/06 COMPLETE DATE: 3/29/06------------------------------------------------------------ROOM AMBIENT: 25°C RELATIVE HUMIDITY: 24%------------------------------------------------------------EQUIPMENT ID#: 192, 297, 323, 1314, 1315, 1361------------------------------------------------------------THERMAL SHOCK

PURPOSE:

1. To determine the resistance of a given electrical connectorto exposure at extremes of high and low temperatures andthe shock of alternate exposures to these extremes,simulating the worst probable conditions of storage,transportation and application.

2. This test provides a short-term simulation of thelong-term effects of temperature cycling. The thermalcycling provides a breathing action, inducing the corrosionprocess.

------------------------------------------------------------PROCEDURE:

1. The test environment was performed in accordance withEIA 364, Test Procedure 32, with the following conditions:

2. Test Conditions:

a) Number of Cycles : 5 Cyclesb) Hot Extreme : +70 +3°C/-0°Cc) Cold Extreme : -20 +0°C/-3°Cd) Time at Temperature : 30 Minutese) Mating Conditions : Matedf) Mounting Conditions : Mountedg) Transfer Time : Instantaneous

3. The total number of cycles were performed continuously.



4. All subsequent variable testing was performed in accordancewith the procedures as previously indicated.

5. Prior to performing variable measurements, the test sampleswere allowed to recover to room ambient conditions.

------------------------------------------------------------REQUIREMENTS:

1. There shall be no evidence of physical damage to the testsamples as tested.

2. The change in low level circuit resistance shall notexceed +10.0 milliohms.

------------------------------------------------------------RESULTS:


2. The following is a summary of the observed data:



1 +0.00 +0.042 +0.01 +0.093 -0.02 +0.00




PET-08-01-S-RA Terminal------------------------------------------------------------SAMPLE SIZE: 3 Samples TECHNICIAN: DAM------------------------------------------------------------START DATE: 3/31/06 COMPLETE DATE: 4/10/06------------------------------------------------------------ROOM AMBIENT: 24°C RELATIVE HUMIDITY: 26%------------------------------------------------------------EQUIPMENT ID#: 297, 323, 547, 1314, 1315, 1361------------------------------------------------------------HUMIDITY (THERMAL CYCLING)

PURPOSE:

To evaluate the impact on electrical stability of the contactsystem when exposed to any environment which may generatethermal/moisture type failure mechanisms such as:

a) Fretting corrosion due to wear resulting frommicromotion, induced by thermal cycling. Humidityaccelerates the oxidation process.

b) Oxidation of wear debris or from particulates from thesurrounding atmosphere which may have become entrappedbetween the contacting surfaces.

c) Failure mechanisms resulting from a wet oxidationprocess.

------------------------------------------------------------PROCEDURE:

1. The test environment was performed in accordance withEIA 364, Test Procedure 31, Procedure III with thefollowing conditions:

2. Test Conditions:

a) Preconditioning (24 hours) : 50°C ± 5°Cb) Relative Humidity : 90% to 95%c) Temperature Conditions : 25°C to 65°Cd) Cold Cycle : Noe) Polarizing Voltage : Nof) Mating Conditions : Matedg) Mounting Conditions : Mountedh) Duration : 240 hours



3. Prior to performing variable measurements, the test sampleswere allowed to recover to room ambient conditions.

4. All subsequent variable testing was performed in accordancewith the procedures previously indicated.

------------------------------------------------------------REQUIREMENTS:

1. There shall be no evidence of physical deterioration ofthe test samples as tested.

2. The change in low level circuit resistance shall notexceed +10.0 milliohms.

------------------------------------------------------------RESULTS:

1. The test samples as tested showed no evidence of physicaldeterioration.




1 +0.00 +0.032 +0.02 +0.103 -0.02 +0.01



LLCR DATA FILES

FILE NUMBERS

206131012061310220613103


Low Level Contact Resistance

Project: 206131 Spec: EIA 364,TP 23Customer: Samtec Subgroup: Seq AProduct: Series PES connector File #: 20613101Description: ID#1Open circuit voltage: 20mv Current: 10ma

Delta valuesunits: milliohms

Temp ºC 23 23 25 24R.H. % 24 24 24 26Date: 28Mar06 28Mar06 29Mar06 10Apr06Pos. ID Initial 100x T.Shock Hum

1 0.31 0.02 -0.01 -0.012 0.32 -0.02 -0.01 -0.013 0.31 0.03 0.01 0.014 0.31 0.01 0.00 0.005 0.31 0.02 0.03 0.026 0.38 -0.01 -0.06 -0.047 0.30 0.02 0.03 0.038 0.32 0.01 0.04 0.01

MAX 0.38 0.03 0.04 0.03 MIN 0.30 -0.02 -0.06 -0.04 AVG 0.32 0.01 0.00 0.00 STD 0.02 0.02 0.03 0.02 Open 0 0 0 0 Tech DAM DAM DAM DAM

Equip ID 323 323 323 323297 297 297 297






1 0.35 -0.01 -0.01 -0.022 0.31 0.04 0.00 0.023 0.29 0.03 0.04 0.044 0.32 0.00 0.00 0.025 0.33 -0.01 -0.03 -0.016 0.33 0.01 0.03 0.037 0.29 0.09 0.09 0.108 0.33 -0.02 -0.03 0.00

MAX 0.35 0.09 0.09 0.10 MIN 0.29 -0.02 -0.03 -0.02 AVG 0.32 0.02 0.01 0.02 STD 0.02 0.04 0.04 0.04 Open 0 0 0 0 Tech DAM DAM DAM DAM

Equip ID 323 323 323 323297 297 297 297






1 0.32 -0.02 0.00 -0.012 0.28 0.02 -0.01 0.013 0.31 -0.01 0.00 -0.014 0.30 0.02 0.00 0.015 0.33 -0.02 -0.02 -0.016 0.34 -0.05 -0.04 -0.057 0.44 -0.04 -0.06 -0.088 0.33 -0.03 -0.01 -0.03

MAX 0.44 0.02 0.00 0.01 MIN 0.28 -0.05 -0.06 -0.08 AVG 0.33 -0.02 -0.02 -0.02 STD 0.05 0.03 0.02 0.03 Open 0 0 0 0 Tech DAM DAM DAM DAM

Equip ID 323 323 323 323297 297 297 297


TEST RESULTS

SEQUENCE B



PET-08-01-S-RA Terminal------------------------------------------------------------SAMPLE SIZE: 3 Samples TECHNICIAN: DAM------------------------------------------------------------START DATE: 3/29/06 COMPLETE DATE: 3/29/06------------------------------------------------------------ROOM AMBIENT: 24°C RELATIVE HUMIDITY: 25%------------------------------------------------------------EQUIPMENT ID#: 281, 282, 553, 684, 874, 1028, 1366, 1367, 1368------------------------------------------------------------MECHANICAL SHOCK (SPECIFIED PULSE)

PURPOSE:

To determine the mechanical and electrical integrity ofconnectors for use with electronic equipment subjected toshocks such as those expected from handling, transportation,etc.

------------------------------------------------------------PROCEDURE:


2. Test Conditions:

a) Peak Value : 50 Gb) Duration : 11 Millisecondsc) Wave Form : Half-sined) Velocity : 11.3 feet per seconde) No. of Shocks : 3 Shocks/Direction, 3 Axis (18 Total)

3. Figure #4 illustrates the test sample fixturing utilizedduring the test.

4. The samples were characterized to assure that the lownanosecond event being monitored will trigger the detector.

5. Following characterization it was determined the samplescould be monitored for the desired event.

------------------------------------------------------------REQUIREMENTS: See next page.


REQUIREMENTS:

1. There shall be no evidence of axial movement of the testsamples relative to each other.

2. There shall be no low nanosecond event detected greaterthan 10 nanoseconds.

------------------------------------------------------------RESULTS:


2. There was no low nanosecond event detected greater than10 nanoseconds.

3. The Mechanical Shock characteristics are shown in Figures#5 (Calibration Pulse) and #6 (Test Pulse). Each figuredisplays the shock pulse contained within the upper andlower limits as defined by the appropriate testspecification.


FIGURE #4

TR#206131, REV.1.2

0.90 0.92 0.94 0

-80

-60

-40

-20

0

20

40

60

80

100

[g]

Classical Shock

ACCELERATION

(g)

LOWER L

ACTUA

UPPER

28 of 36 Contech ResearchAn Independent Test and Research Laboratory

FIGURE #5

.96 0.98 1.00 1.02 1.04 1.06 1.08 1.10

[s]

Channel 5Channel 5Channel 5Channel 5

IMIT-----

L PULSE-----

LIMIT------

Project: 20613150G’s 11mshalfsineTech:DAMDate: 29Mar06Actual Wave

DURATION (Seconds)

TR#206131, REV.1.2

0.90 0.92 0.94 0.96

-80

-60

-40

-20

0

20

40

60

80

100

[g]

Classical ShockACCELERATION

(g)

LOWER LIMI

ACTUAL P

UPPER LI

DU

29 of 36 Contech ResearchAn Independent Test and Research Laboratory

FIGURE #6

0.98 1.00 1.02 1.04 1.06 1.08 1.10

[s]

Channel 5Channel 5Channel 5Channel 5

T-----

ULSE-----

MIT------

Project: 90613150G’s 11mshalfsineTech:DAMDate: 29Mar06Cal 1

RATION (Seconds)



PET-08-01-S-RA Terminal------------------------------------------------------------SAMPLE SIZE: 3 Samples TECHNICIAN: DAM------------------------------------------------------------START DATE: 3/29/06 COMPLETE DATE: 3/31/06------------------------------------------------------------ROOM AMBIENT: 24°C RELATIVE HUMIDITY: 25%------------------------------------------------------------EQUIPMENT ID#: 281, 282, 553, 684, 874, 1028, 1366, 1367, 1368------------------------------------------------------------VIBRATION, SINUSOIDAL

PURPOSE:

1. To determine if electrical discontinuities at the levelspecified exist.

2. To determine if the contact system is susceptible tofretting corrosion.

------------------------------------------------------------PROCEDURE:

1. The test was performed in accordance with EIA 364, TestProcedure 28, Test Condition III.

2. Test Conditions:

a) Frequency : 10 to 2000 to 10 Hzb) Amplitude : 0.06" da or 15 G’sc) Duration : 4.0 hrs/axis, 3 axis totald) Test Current : 100 mae) Sweep Time : 20 minutes

3. Figure #4 illustrates the test sample fixturing utilizedduring the test.

4. Prior to testing, the connectors were characterized toassure that the desired event being monitored was capableof being detected.

5. Following characterization it was determined the samplescould be monitored for the desired event.

------------------------------------------------------------REQUIREMENTS: See next page.


REQUIREMENTS:

1. There shall be no evidence of physical damage to the testsamples as tested.

2. There shall be no events detected greater than10 nanoseconds.

------------------------------------------------------------RESULTS:


2. There was no evidence of low nanosecond events in excessof 10 nanoseconds.


TEST RESULTS

SEQUENCE C



PET-08-01-S-RA Terminal------------------------------------------------------------SAMPLE SIZE: 3 Samples TECHNICIAN: DAM------------------------------------------------------------START DATE: 4/12/06 COMPLETE DATE: 4/13/06------------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 34%------------------------------------------------------------EQUIPMENT ID#: 1, 609, 621, 1240, 1328------------------------------------------------------------SOLDERABILITY

PURPOSE:

1. To determine the solderability of solder terminations.This determination is made on the basis of the ability ofthese terminations to be wetted by a new coating of solder,or to form a suitable fillet when dip soldered. Theseprocedures will verify that the treatment used in themanufacturing process to facilitate soldering issatisfactory and that it has been applied to the requiredportion of the part which is designated to accommodate asolder connection.

2. An accelerated aging test is included in this test methodwhich simulates a minimum of one year natural aging undera combination of various storage conditions that havedifferent deleterious effects.

------------------------------------------------------------PROCEDURE:


2. Prior to application of flux, the test specimens wereexposed to steam aging for 8.0 hours.

3. Specimens were immersed in type Rol0 Flux to a depth equalto the area to be observed. Immersion time was 5 to 10seconds and after removal allowed to drain for 10 to 60seconds.



4. Test Conditions:

a) Pre-clean : N/Ab) Steam Aging : 8.0 Hoursc) Flux : Type ROL0 (R)d) Flux Immersion : 5 to 10 Secondse) Drain Time : 5 to 20 Secondsf) Immersion Rate : 1 Inch per Minuteg) Dwell Time (Solder) : 5 Secondsh) Solder Composition : Sn/Ag3/Cu 0.7i) Solder Temperature : 265 ± 5°Cj) Post Clean : Isopropyl Alcohol

5. Test specimens shall be visually examined under10X magnification.

------------------------------------------------------------REQUIREMENTS:

The dipped portion of the termination shall be 95% coveredby a continuous new solder coating.

------------------------------------------------------------RESULTS:

The specimens as tested met the requirements as specified.


TEST RESULTS

SEQUENCE D



PET-08-01-S-RA Terminal------------------------------------------------------------SAMPLE SIZE: 3 Samples TECHNICIAN: DAM------------------------------------------------------------START DATE: 3/30/06 COMPLETE DATE: 3/30/06------------------------------------------------------------ROOM AMBIENT: 22°C RELATIVE HUMIDITY: 26%------------------------------------------------------------EQUIPMENT ID#: 55, 171------------------------------------------------------------CLEANING

PURPOSE:

To determine the ability of the plastic housing to withstand aDi-ionized water bath without damage.

------------------------------------------------------------PROCEDURE:

1. Di-ionized water was placed into a beaker and heated to atemperature of 54°C to 66°C.

2. Each sample was subjected to the following steps 3 times:

a) The samples were immersed into the heated DI water for1.0 minute.

b) Following immersion, the samples were air dried at atemperature of 93°C to 121°C for 60 to 90 seconds.

-----------------------------------------------------------REQUIREMENTS:

There shall be no evidence of discoloration, degradation orphysical damage to the plastic housing.

-----------------------------------------------------------RESULTS:

All samples so testes met the requirements specified.

Documents

dave heading and bp1 - Samtec Microelectronicssuddendocs.samtec.com/testreports/206131 test report rev 1.2_qua.pdf1240 Steam Ageing Unit Mountaingate Eng. SAT1-0-S1 9211-264 See Manual