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Data acquisition automation - automation of angle-resolved experiment - spectra acquisition - sample rotation control - data processing and visualization - fast processing and fitting of thousands spectra - visualizations specific for each method and mode

Data acquisition automation - Kolibrik.net · Data acquisition automation ... polar or azimuthal scans of XPD pattern 2D view of XPD pattern Angle resolved spectra can be fitted (Cartesian

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Data acquisition automation

- automation of angle-resolved experiment- spectra acquisition- sample rotation control

- data processing and visualization- fast processing and fitting of thousands spectra- visualizations specific for each method and mode

KolXPD & X-ray photoelectron diffractiontree view of multiple

experiments

spectra for each angle step(multiple regions in one step)

polar or azimuthal scans of XPD pattern

2D view of XPD pattern(Cartesian or polar)Angle resolved spectra can be fitted

- all angular points are automatically fitted- any parameter of the fit or an expression of them

can be drawn in scan chart or 2D-pattern view

θsin22|| kinEmk

=

Acquisition modes of ARUPS measurements

Azimuthal scans

Polar scans

Constant-energy mapsAngular-dependent UPS spectra

RTG UV

Analysersample

Example of displaying AExample of displaying ARUPS datRUPS dataaset of UPS spectra 2D map B.E. vs. polar angle

2D map B.E. vs. k|| image processing

acquireddata

X-normalization

Fermi edgecompensation

color mask overlay

color mask of orig. intensity

max

min

high-passfilter

Image processing of ARUPS dataImage processing of ARUPS data

Example of constant energy maps on Ni(111)

KolXPD: Other capabilities• measurements of methods using variable photon energy

(NEXAFS, resonant photoemission, etc.)at MSB beamline (synchrotron Elettra in Trieste, ITA)

• fast processing and visualization of standard photoemission data (XPS, UPS and SRPES methods)

• import of result of XPD-pattern simulations (software EDAC*)• simple quantitative analysis• import and export of many file-formats

Author: Jiří Libra, [email protected]

* F. J. García de Abajo, M. A. Van Hove, C. S. Fadley, Phys. Rev. B 63 (2001) 75404.