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CPC field-specific training
G01Q – Scanning Probe Techniques
Paolo Polesello June 2018Examiner, European Patent Office
European Patent Office 2
Outline
▪ Content of the subclass:
− What belongs to the subclass
− What does not belong to the subclass
− Neighbouring fields
▪ How to assign a symbol
▪ Content of the main groups
European Patent Office 3
Content of the Subclass
Scanning Probe Techniques:
▪ Scanning probes, i.e. devices having at least a tip of nanometre or
micrometre sized dimensions that scans or moves over an object
surface, typically at a distance of a few angstroms or nanometres,
monitoring some interaction between the tip and the surface, e.g.
monitoring the generation of a tunnelling current.
▪ Techniques or apparatuses involving the use of scanning probes
European Patent Office 4
Outline
▪ Content of the subclass:
− What belongs to the subclass
− What does not belong to the subclass
− Neighbouring fields
▪ How to assign a symbol
▪ Content of the main groups
▪ Conclusion
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Content of the subclass
What belongs to the subclass
▪ Scanning probes per se, including their manufacturing method
▪ Scanning Probe Microscopes (SPM), i.e. devices for surface analysis
of a sample with atomic resolution using a scanning probe
▪ Other applications of scanning probes, like, e.g., surface treatment
− NB: these other applications are classified as additional
European Patent Office 6
Outline
▪ Content of the subclass:
− What belongs to the subclass
− What does not belong to the subclass
− Neighbouring fields
▪ How to assign a symbol
▪ Content of the main groups
European Patent Office 7
Content of the subclass
What does not belong to the subclass
▪ Electron microscopes, i.e. wherein the probe is an electron beam
(H01J37/00)
▪ Optical far-field microscopes, like, e.g., scanning confocal
microscopes (G02B21/00)
▪ Cantilever sensors per se (G01N29/036)
European Patent Office 8
Outline
▪ Content of the subclass:
− What belongs to the subclass
− What does not belong to the subclass
− Neighbouring fields
▪ How to assign a symbol
▪ Content of the main groups
European Patent Office 9
Content of the subclass
Neighbouring fields
▪ Surface treatment:
− Atom by atom nanostructuring: B82B
− Nanolithography: G03F
▪ Data recording and reading: G11B
▪ Sensors:
− Chemical or physical: G01N33, G01N29
− For measuring profiles: G01B
European Patent Office 10
Outline
▪ Content of the subclass:
− What belongs to the subclass
− What does not belong to the subclass
− Neighbouring fields
▪ How to assign a symbol
▪ Content of the main groups
European Patent Office 11
How to assign a symbol
▪ The invention is classified.
▪ If the invention involves more aspects, more symbols may be
assigned as invention
▪ Other aspects which are not part of the invention and can be relevant
can be classified too as additional
▪ If the invention relates to a specific application (e.g., a SPM
technique), at least the symbol relating to that application must be
assigned as invention
▪ Use the deepest level possible
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How to assign a symbol
Where to find schema and definition
Scheme:
▪ https://www.cooperativepatentclassification.org/cpc/scheme/G/
scheme-G01Q.pdf
▪ via Espacenet www.worldwide.espacenet.com
▪ in +CLA (Epoque Net)
Definition:
▪ https://www.cooperativepatentclassification.org/cpc/definition/G/
definition-G01Q.pdf
▪ via Espacenet www.worldwide.espacenet.com
European Patent Office 13
Outline
▪ Content of the subclass:
− What belongs to the subclass
− What does not belong to the subclass
− Neighbouring fields
▪ How to assign a symbol
▪ Content of the main groups
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Content of the main groups
Main groups
G01Q10
G01Q20
G01Q30
G01Q40
G01Q60
G01Q70
G01Q80
G01Q90
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Content of the main groups
G01Q10 - 1
Scanning or positioning arrangements:
▪ "scanning" is on the plane of the sample (usually "xy" plane)
▪ "positioning" can be on the plane of the sample as well as in a
direction perpendicular to the sample (usually "z" direction)
▪ it may be applied on the probe or on the sample
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Content of the main groups
G01Q10 - 2
Scanning or positioning arrangements:
▪ it can be "coarse", i.e. with low resolution (G01Q10/02)
▪ it can be "fine", i.e. with high resolution (G01Q10/04-045)
▪ It comprises also circuits, algorithms and protocols (G01Q10/06-065)
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Content of the main groups
G01Q10 - 3
If a circuit or protocol is applied to a particular SPM technique
classified in G01Q60 (e.g. a scanning protocol for an AC AFM),
at least the G01Q60 symbol relating to that technique must be
assigned as invention.
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Content of the main groups
Example: EP1978348 – G01Q10/065
& G01Q60/32
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Content of the main groups
G01Q20
Monitoring the movement or position of the probe
▪ It comprises methods and devices:
− optical (G01Q20/02)
− piezoelectrical, thermal (G01Q20/04)
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Content of the main groups
Example: US2003/0047675 – G01Q20/02
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Content of the main groups
G01Q30 - 1
Auxiliary means to assist or improve scanning probe techniques
▪ It comprises:
− Means to couple the SPM with other analytical devices
(G01Q30/02-025)
− Computers and softwares to analyse the data
(G01Q30/04-06)
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Content of the main groups
G01Q30 - 2
Auxiliary means to assist or improve scanning probe techniques
▪ It further comprises:
− Means to control the environment in the measuring chamber:
temperature (G01Q30/10), gaseous (G01Q30/12) liquid
(G01Q30/14) or vacuum environment (G01Q30/16), means to
handle the sample within the chamber (G01Q30/20)
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Content of the main groups
Example: EP1990626 – G01Q30/14
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Content of the main groups
G01Q40
Calibration methods and standards
▪ It comprises:
− procedures for probe calibration (G01Q40/00)
− deconvolution procedures (G01Q40/00)
− calibration standards and their manufacture (G01Q40/02
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Content of the main groups
Example: EP2312325 – G01Q40/00
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Content of the main groups
G01Q60 - 1
Particular types of SPM
▪ It comprises:
− multiple-type SPMs (G01Q60/02-08)
− STM (G01Q60/10-16)
− SNOM (G01Q60/18-22)
− AFM (G01Q60/24-42)
− Other types of SPM (SICM, SCM, MFM, SThM, SECM)
(G01Q60/44-60)
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Content of the main groups
G01Q60 - 2
Particular types of SPM
▪ It further comprises:
− Details of the particular types of SPM:
− probes, their manufacture and eventually their constitution
(it can be combined with a G01Q70 symbol)
− particular applications (e.g. friction force microscopy,
tapping mode AFM)
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Content of the main groups
G01Q60 - 3
▪ If a document relates to a particular SPM technique, at least the
G01Q60 symbol related to that technique must be assigned
as invention
▪ A combination of a G01Q60 symbol with one from another main
group, both as invention symbols, may be possible
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Content of the main groups
Example: US5519212 – G01Q60/34
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Content of the main groups
G01Q70 - 1
General aspects of scanning probes not related to a particular SPM
▪ It contains:
− Probe holders in themselves (G01Q70/02-04)
− Probe tip arrays (G01Q70/06)
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Content of the main groups
G01Q70 - 2
General aspects of scanning probes not related to a particular SPM
▪ It further contains:
− Structural aspects of the probe: shape (G01Q70/10), whether it
consists of a nanotube or nanowire (G01Q70/12), composition
(G01Q70/14):
− These symbols can be combined with a symbol related to a probe
for a particular type of SPM (e.g.: a nanotube probe for AFM is
classified into G01Q60/38 and G01Q70/12)
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Content of the main groups
G01Q70 - 3
General aspects of scanning probes not related to a particular SPM
▪ It further contains:
− Manufacture of the probe, whenever it can be applied to any kind
of SPM probe (G01Q70/16-18)
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Content of the main groups
Example: US2010/0229265 – G01Q70/12
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Content of the main groups
G01Q80
Other applications of a scanning probe, e.g. for surface treatment
(e.g., DPN) or data storage
▪ This symbol is always additional
▪ There must be some aspect related to the probe
▪ It should be always given together with a symbol of the specific
application (e.g. a G03F symbol for DPN or a G11B symbol for
data storage)
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Content of the main groups
G01Q90
The G01Q90 group is for techniques or apparatuses not otherwise
provided for. This function is already covered by the G01Q80 group and
the G01Q90 group is therefore empty.
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Thank you for your attention!
