COPPERHEAD (MPC5554) ULTRA FLEX B PLATFORM QUALIFICATION · COPPERHEAD (MPC5554) ULTRA FLEX B PLATFORM QUALIFICATION ... J750 – 1024 Handler Type : Delta Flex X4 Load board :

COPPERHEAD (MPC5554) ULTRA FLEX B PLATFORM QUALIFICATION

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1. INTRODUCTION

This document states the Correlation and Qual result of * COPPERHEAD (MPC5554) device in order to qualify Ultra Flex-B Tester as qualified platform for direct shipment to customer. All evaluations stated in this document have been discussed and agreed by both OHT and KLM, based on KLM Class A Qualification and Correlation Procedure (*Spec#: 12MRQ85104A)

PRODUCT INFORMATION

COPPERHEAD (MPC5554)Product Line : S9U5554,G9U5554Target Device : MPC5554MZP, MPC5554MVR, MPC5554MZP80, MPC5554MZP132, MPC5554MVR132, MPC5554MZP112, MPC5554MVR113,

MPC5554AZP132Mask : M68CPackage Code : 5252 (416 PBGA 27 X 27) Assembly Site : KLMPTI Code : JBEC

This document also states the results of all evaluations listed in the correlation plan and Class A Qual. Any requirements stated in the KLM Site Qualification Procedure (Spec#: 12MRQ85104A) which cannot be fulfilled will require approval from OHT’s & KLM’s PE and RQA.

Hardware Requirements:System (Tester) Type : J750 – 1024Handler Type : Delta Flex X4Load board : ATX-7202Software (Test Program) : MPC5554_M68C_C05

System (Tester) Type : Ultra Flex-B Handler Type : Delta Castle X4Load board : ATX-7493BSoftware (Test Program) : MPC5554_M68C_UC06

2. BIN TO BIN CORRELATION


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Action: A minimum of 1000 units from three different wafers lots to be tested at each temperature Room, Hot and Cold insertion in J750-1K, and then Ultra Flex-B tester.

Accept Criteria: All units must achieve 100% bin to bin correlation. All good units from pilot site correlate 100% at transfer site. All reject units from pilot site correlate 100 % bin to bin.

Result

Lot Number WEMHA0NWQD01Target Device MPC5554MZPTrace Code QQGM0806CWafer Lot Number MXDD435001

FINAL TEST ROOM (25 C):

KTM TEST RESULT

Binning Bin1 Bin3 Bin4 Bin5 Bin6 Bin7 Bin8

Bin1 976

Bin3 35

Bin4 0

Bin5 3

Bin6 0

Bin7 12

KL

M T

ES

T R

ES

UL

T

Bin8 0


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FINAL TEST HOT (145 C):

KTM TEST RESULT


Bin1 929

Bin3 35

Bin4 0

Bin5 6

Bin6 0

Bin7 6

KL

M T

ES

T R

ES

UL

T

Bin8 0

FINAL TEST COLD (-45 C):

KTM TEST RESULT


Bin1 923

Bin3 0

Bin4 0

Bin5 3

Bin6 0

Bin7 3

KL

M T

ES

T R

ES

UL

T

Bin8 0

Summary:All units from WEMHA0NWQD01 tested at KLM and KTM site are 100% correlated.


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Lot Number WEMHA0NWRE01Target Device MPC5554MZPTrace Code QQGR0806 Wafer Lot Number MXDD432001


KTM TEST RESULT


Bin1 960

Bin3 107

Bin4 0

Bin5 9

Bin6 0

Bin7 5

KL

M T

ES

T R

ES

UL

T

Bin8 0

FINAL TEST HOT (145 C):

KTM TEST RESULT


Bin1 954

Bin3 0

Bin4 0

Bin5 3

Bin6 0

Bin7 3

KL

M T

ES

T R

ES

UL

T

Bin8 0FINAL TEST COLD (-45 C):

KTM TEST RESULT



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Bin1 943

Bin3 0

Bin4 0

Bin5 9

Bin6 0

Bin7 2

KL

M T

ES

T R

ES

UL

T

Bin8 0

Summary:All units from WEMHA0NWRE01 tested at KLM and KTM site are 100% correlated.

Lot Number WEMHA0NQHH01Target Device MPC5554MZPTrace Code QQGD0805 Wafer Lot Number M1DD432011


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KTM TEST RESULT


Bin1 988

Bin3 115

Bin4 0

Bin5 8

Bin6 0

Bin7 21

KL

M T

ES

T R

ES

UL

T

Bin8 1

FHA(145 C):

KTM TEST RESULT


Bin1 985

Bin3 0

Bin4 0

Bin5 3

Bin6 0

Bin7 2

KL

M T

ES

T R

ES

UL

T

Bin8 0FINAL TEST COLD (-45 C):

KTM TEST RESULT


Bin1 973

Bin3 0

Bin4 0

Bin5 9KL

M T

ES

T

RE

SU

LT

Bin6 0


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Bin7 3

Bin8 0

Summary:

All units from 3 lots achieve 100% bin to bin correlation.

3. PARAMETRIC COMPARISON

Action:A sample of 50 units for 5 parametric tests between J750-1K and Ultra Flex B shall be used for parametric comparison.

Accept Criteria:T-test and F-test should be no significant difference with p-value more than 0.05.

Result:

FINAL TEST ROOM PARAMENTRIC COMPARISON (25’C)T-Test : P Value F-Test : P-Value

TRIPIDDP_VDD 0.428 0.818PULLUPS_VDDE 0.904 0.686PLL_CLOOP_D1_MFD0 0.540 0.912PLL_TME 0.283 0.438OSCSELFBIASVEXTAL 0.617 0.617

T-TEST RESULT

Below is the T-Test details result from MINITAB 15:

Paired T-Test and CI: tripiddp_vdd(J750), tripiddp_vdd(Uflex)

Paired T for tripiddp_vdd(J750) - tripiddp_vdd(Uflex)

N Mean StDev SE Meantripiddp_vdd(J750) 50 0.011710 0.000128 0.000018tripiddp_vdd(Uflex) 50 0.011731 0.000124 0.000018Difference 50 -0.000021 0.000186 0.000026


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95% CI for mean difference: (-0.000074, 0.000032)T-Test of mean difference = 0 (vs not = 0): T-Value = -0.80 P-Value = 0.428

Paired T-Test and CI: pullups_vdde(J750), pullups_vdde(Uflex)

Paired T for pullups_vdde(J750) - pullups_vdde(Uflex)

N Mean StDev SE Meanpullups_vdde(J750) 50 -0.000119 0.000002 0.000000pullups_vdde(Uflex) 50 -0.000119 0.000002 0.000000Difference 50 -0.000000 0.000002 0.000000


Paired T-Test and CI: pll_cloop_d1_mfd0(J750), pll_cloop_d1_mfd0(UFlex)

Paired T for pll_cloop_d1_mfd0(J750) - pll_cloop_d1_mfd0(UFlex)

N Mean StDev SE Meanpll_cloop_d1_mfd0(J750) 50 37.260 1.026 0.145pll_cloop_d1_mfd0(UFlex) 50 37.400 1.010 0.143Difference 50 -0.140 1.604 0.227


Paired T-Test and CI: pll_tmE(J750), pll_tmE(UFlex)

Paired T for pll_tmE(J750) - pll_tmE(UFlex)

N Mean StDev SE Meanpll_tmE(J750) 50 3334.5 76.1 10.8pll_tmE(UFlex) 50 3349.9 85.1 12.0Difference 50 -15.4 100.4 14.2


Paired T-Test and CI: oscSelfBiasVEXTAL(J750), oscSelfBiasVEXTAL(UFlex)

Paired T for oscSelfBiasVEXTAL(J750) - oscSelfBiasVEXTAL(UFlex)


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N Mean StDev SE MeanoscSelfBiasVEXTAL(J750) 50 0.97748 0.03304 0.00467oscSelfBiasVEXTAL(UFlex) 50 0.97488 0.02965 0.00419Difference 50 0.00260 0.03658 0.00517

95% CI for mean difference: (-0.00779, 0.01300)T-Test of mean difference = 0 (vs not = 0): T-Value = 0.50 P-Value = 0.617

F-TEST RESULT

Below is the F-Test details result from MINITAB 15:

Test for Equal Variances: tripiddp_vdd(J750), tripiddp_vdd(Uflex)

95% Bonferroni confidence intervals for standard deviations

N Lower StDev Upper tripiddp_vdd(J750) 50 0.0001044 0.0001281 0.0001650tripiddp_vdd(Uflex) 50 0.0001010 0.0001239 0.0001596

F-Test (Normal Distribution)Test statistic = 1.07, p-value = 0.818


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tripiddp_vdd(Uflex)

tripiddp_vdd(J750)

0.000170.000160.000150.000140.000130.000120.000110.0001095% Bonferroni Confidence Intervals for StDevs

tripiddp_vdd(Uflex)

tripiddp_vdd(J750)

0.01200.01190.01180.01170.01160.01150.0114Data

Test Statistic 1.07P-Value 0.818


F-Test

Levene's Test

Test for Equal Variances for tripiddp_vdd(J750), tripiddp_vdd(Uflex)

Test for Equal Variances: pullups_vdde(J750), pullups_vdde(Uflex)


N Lower StDev Upper pullups_vdde(J750) 50 0.0000015 0.0000019 0.0000024pullups_vdde(Uflex) 50 0.0000016 0.0000020 0.0000026



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pullups_vdde(Uflex)

pullups_vdde(J750)

0.000002500.000002250.000002000.000001750.0000015095% Bonferroni Confidence Intervals for StDevs

pullups_vdde(Uflex)

pullups_vdde(J750)

-0.000114-0.000116-0.000118-0.000120-0.000122-0.000124Data



F-Test

Levene's Test

Test for Equal Variances for pullups_vdde(J750), pullups_vdde(Uflex)

Test for Equal Variances: pll_cloop_d1_mfd0(J750), pll_cloop_d1_mfd0(UFlex)


N Lower StDev Upper pll_cloop_d1_mfd0(J750) 50 0.836263 1.02639 1.32208pll_cloop_d1_mfd0(UFlex) 50 0.823036 1.01015 1.30117



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pll_cloop_d1_mfd0(UFlex)

pll_cloop_d1_mfd0(J750)

1.31.21.11.00.90.895% Bonferroni Confidence Intervals for StDevs



41403938373635Data



F-Test

Levene's Test

st for Equal Variances for pll_cloop_d1_mfd0(J750), pll_cloop_d1_mfd0(UFle

Test for Equal Variances: pll_tmE(J750), pll_tmE(UFlex)


N Lower StDev Upper pll_tmE(J750) 50 62.0401 76.1449 98.081pll_tmE(UFlex) 50 69.3616 85.1309 109.656



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pll_tmE(UFlex)

pll_tmE(J750)

1101009080706095% Bonferroni Confidence Intervals for StDevs

pll_tmE(UFlex)

pll_tmE(J750)

35503500345034003350330032503200Data



F-Test

Levene's Test

Test for Equal Variances for pll_tmE(J750), pll_tmE(UFlex)

Test for Equal Variances: oscSelfBiasVEXTAL(J750), oscSelfBiasVEXTAL(UFlex)


N Lower StDev Upper oscSelfBiasVEXTAL(J750) 50 0.0269176 0.0330373 0.0425549oscSelfBiasVEXTAL(UFlex) 50 0.0241615 0.0296546 0.0381977



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oscSelfBiasVEXTAL(UFlex)

oscSelfBiasVEXTAL(J750)




1.0751.0501.0251.0000.9750.9500.9250.900Data



F-Test

Levene's Test

st for Equal Variances for oscSelfBiasVEXTAL(J750), oscSelfBiasVEXTAL(UFle

Summary:

T-Test and F-Test of the selected parametric test is within the acceptance criteria, with a p-value of more than 0.05.

FINAL TEST HOT PARAMENTRIC COMPARISON (145’C)

T-Test : P Value F-Test : P-ValueTRIPIDDP_VDD 0.076 0.510PULLUPS_VDDE 0.127 0.907PLL_TME 0.647 0.545OSCSELFBIASVEXTAL 0.085 0.245RUNIDD_VDD 0.172 0.931

T-TEST RESULT


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Paired T-Test and CI: pullups_vdde(J750), pullups_vdde(Uflex)

Paired T for pullups_vdde(J750) - pullups_vdde(Uflex)

N Mean StDev SE Meanpullups_vdde(J750) 50 -0.000101 0.000001 0.000000pullups_vdde(Uflex) 50 -0.000101 0.000001 0.000000Difference 50 0.000000 0.000001 0.000000




N Mean StDev SE Meanpll_tmE(J750) 50 3347.4 116.0 16.4pll_tmE(UFlex) 50 3356.2 126.6 17.9Difference 50 -8.8 134.4 19.0




N Mean StDev SE MeanoscSelfBiasVEXTAL(J750) 50 1.04009 0.01110 0.00157oscSelfBiasVEXTAL(UFlex) 50 1.04320 0.00939 0.00133Difference 50 -0.00310 0.01247 0.00176


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Paired T-Test and CI: runidd_vdd(J750), runidd_vdd(UFlex)

Paired T for runidd_vdd(J750) - runidd_vdd(UFlex)

N Mean StDev SE Meanrunidd_vdd(J750) 50 0.673288 0.001776 0.000251runidd_vdd(UFlex) 50 0.673725 0.001754 0.000248Difference 50 -0.000436 0.002227 0.000315


F-TEST RESULT







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tripiddp_vdd(Uflex)

tripiddp_vdd(J750)


tripiddp_vdd(Uflex)

tripiddp_vdd(J750)

0.03000.02950.02900.02850.02800.02750.0270Data



F-Test

Levene's Test


Test for Equal Variances: pullups_vdde(J750), pullups_vdde(Uflex)


N Lower StDev Upper pullups_vdde(J750) 50 0.0000007 0.0000008 0.0000010pullups_vdde(Uflex) 50 0.0000007 0.0000008 0.0000010



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pullups_vdde(Uflex)

pullups_vdde(J750)


pullups_vdde(Uflex)

pullups_vdde(J750)

-0.000098-0.000099-0.000100-0.000101-0.000102-0.000103-0.000104Data



F-Test

Levene's Test

Test for Equal Variances for pullups_vdde(J750), pullups_vdde(Uflex)






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pll_tmE(UFlex)

pll_tmE(J750)


pll_tmE(UFlex)

pll_tmE(J750)

37003600350034003300320031003000Data



F-Test

Levene's Test







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1.061.051.041.031.021.01Data



F-Test

Levene's Test


Test for Equal Variances: runidd_vdd(J750), runidd_vdd(UFlex)


N Lower StDev Upper runidd_vdd(J750) 50 0.0014472 0.0017762 0.0022879runidd_vdd(UFlex) 50 0.0014292 0.0017542 0.0022595



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runidd_vdd(UFlex)

runidd_vdd(J750)


runidd_vdd(UFlex)

runidd_vdd(J750)

0.6770.6760.6750.6740.6730.6720.6710.670Data



F-Test

Levene's Test

Test for Equal Variances for runidd_vdd(J750), runidd_vdd(UFlex)

Summary:


FINAL TEST COLD PARAMENTRIC COMPARISON (- 45’C)

T-Test : P Value F-Test : P-ValueTRIPIDDP_VDD 0.458 0.689

PLL_CLOOP_D1_MFD0 0.159 0.850

PLL_TME 0.503 0.290

OSCSELFBIASVEXTAL 0.200 0.757STOPIDD_VDD 0.311 0.400

T-TEST RESULT



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Paired T-Test and CI: pll_cloop_d1_mfd0(J750), pll_cloop_d1_mfd0(UFlex)

Paired T for pll_cloop_d1_mfd0(J750) - pll_cloop_d1_mfd0(UFlex)

N Mean StDev SE Meanpll_cloop_d1_mfd0(J750) 50 37.440 0.929 0.131pll_cloop_d1_mfd0(UFlex) 50 37.720 0.904 0.128Difference 50 -0.280 1.386 0.196




N Mean StDev SE Meanpll_tmE(J750) 50 3381.4 155.8 22.0pll_tmE(UFlex) 50 3362.9 181.4 25.7Difference 50 18.6 194.6 27.5




N Mean StDev SE MeanoscSelfBiasVEXTAL(J750) 50 0.96642 0.02326 0.00329oscSelfBiasVEXTAL(UFlex) 50 0.96180 0.02582 0.00365Difference 50 0.00462 0.01965 0.00278

95% CI for mean difference: (-0.00096, 0.01021)


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T-Test of mean difference = 0 (vs not = 0): T-Value = 1.66 P-Value = 0.103

Paired T-Test and CI: stopidd_vdd(J750), stopidd_vdd(UFlex)

Paired T for stopidd_vdd(J750) - stopidd_vdd(UFlex)

N Mean StDev SE Meanstopidd_vdd(J750) 50 0.003375 0.000173 0.000024stopidd_vdd(UFlex) 50 0.003327 0.000176 0.000025Difference 50 0.000048 0.000269 0.000038


F-TEST RESULT







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tripiddp_vdd(Uflex)

tripiddp_vdd(J750)


tripiddp_vdd(Uflex)

tripiddp_vdd(J750)

0.01170.01160.01150.01140.01130.01120.0111Data



F-Test

Levene's Test


Test for Equal Variances: pll_cloop_d1_mfd0(J750), pll_cloop_d1_mfd0(UFlex)


N Lower StDev Upper pll_cloop_d1_mfd0(J750) 50 0.757193 0.929340 1.19707pll_cloop_d1_mfd0(UFlex) 50 0.736881 0.904411 1.16496



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4039383736Data



F-Test

Levene's Test

st for Equal Variances for pll_cloop_d1_mfd0(J750), pll_cloop_d1_mfd0(UFle






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pll_tmE(UFlex)

pll_tmE(J750)


pll_tmE(UFlex)

pll_tmE(J750)

38003600340032003000Data



F-Test

Levene's Test







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1.041.021.000.980.960.940.920.90Data



F-Test

Levene's Test


Test for Equal Variances: stopidd_vdd(J750), stopidd_vdd(UFlex)


N Lower StDev Upper stopidd_vdd(J750) 50 0.0001410 0.0001731 0.0002229stopidd_vdd(UFlex) 50 0.0001431 0.0001756 0.0002262



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stopidd_vdd(UFlex)

stopidd_vdd(J750)


stopidd_vdd(UFlex)

stopidd_vdd(J750)

0.00400.00380.00360.00340.00320.0030Data



F-Test

Levene's Test

Test for Equal Variances for stopidd_vdd(J750), stopidd_vdd(UFlex)

Summary:


4. GAGE REPEATABILITY AND REPRODUCIBILITY STUDY (GRR)

Action:

3 parameters will be taken for this study. The collection of data will be captured and arranged as follow:

Factor Levels Comment

Unit 10 Process

Site (Dut)4 Reproducibility

Repeat 5 Repeatability


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Accept Criteria:

Tolerance of all GR&R study must not exceed 10%

Result:

Omni GR&R result can be obtained from the link below:http://globalomni/QU/ZeroDefect/GageDetail.aspx?u=r63668&g=4967bbfe-4601-4b7b-818c-124311daa0be&n=1833

Omni GR&R summary result as below:

Details analysis for selected test for GR&R as below:

Gage R&R for oscSelfBiasVEXTAL

Study Var %Study Var %ToleranceSource StdDev (SD) (5.15 * SD) (%SV) (SV/Toler)Total Gage R&R 0.0247661 0.127545 100.00 0.64 Repeatability 0.0229479 0.118182 92.66 0.59 Reproducibility 0.0093140 0.047967 37.61 0.24 Site 0.0093140 0.047967 37.61 0.24Part-To-Part 0.0000000 0.000000 0.00 0.00Total Variation 0.0247661 0.127545 100.00 0.64

http://globalomni/QU/ZeroDefect/GageDetail.aspx?u=r63668&g=4967bbfe-4601-4b7b-818c-124311daa0be&n=1833

http://globalomni/QU/ZeroDefect/GageDetail.aspx?u=r63668&g=4967bbfe-4601-4b7b-818c-124311daa0be&n=1833


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Gage R&R for Ivrcctl_startup



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Gage R&R for pullups_vdde



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Gage R&R for tripiddp_vdde

Study Var %Study Var %ToleranceSource StdDev (SD) (5.15 * SD) (%SV) (SV/Toler)Total Gage R&R 0.163196 0.840457 98.16 4.94 Repeatability 0.161641 0.832449 97.22 4.90 Reproducibility 0.022476 0.115749 13.52 0.68 Site 0.022476 0.115749 13.52 0.68 Site*Part 0.000000 0.000000 0.00 0.00Part-To-Part 0.031771 0.163620 19.11 0.96Total Variation 0.166259 0.856236 100.00 5.04


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5. WAVEFORM CHECK

Action:

Perform signal waveform scoping on power supply pins to check for over voltage (+30% from test VDD). Waveform scoping study performed using the first insertion’s test program, Post Room.

Accept Criteria:

Zero over voltage spike and zero under voltage spike.


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Results:

HDVS Channel 23e.401 (VDD)

Summary:

30% of the maximum Vdd Voltage Level = 1.5 + (1.5 x30%) = 1.95V. None of the Vdd pin exceeds 1.78V, no over-voltage observed


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30% of the minimum Vdd Voltage Level = 0 - (1.5 x30%) = - 0.45V. None of the Vdd pin has voltage lower than 0V, no over-voltage observed

Results :

HDVS Channel 23m.407 (VDDE)

Summary:

30% of the maximum Vdde Voltage Level = 3.3 + (3.3 x 30%) = 4.29V. None of the Vdde pin exceeds 3.86V, no over-voltage observed


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30% of the minimum Vdde Voltage Level = 0 - (3.3 x30%) = - 0.99V. None of the Vdde pin has voltage lower than 0V, no over-voltage observedResults :

HDVS Channel 23m.414 (VDD33)

Summary:

30% of the maximum Vdd33 Voltage Level = 3.3 + (3.3 x 30%) = 4.29V. None of the Vdd33 pin exceeds 3.74V, no over-voltage observed

30% of the minimum Vdd33 Voltage Level = 0 - (3.3 x30%) = - 0.99V.


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None of the Vdd33 pin has voltage lower than 0V, no over-voltage observed

Results :

HDVS Channel 23e.407 (VDDFlash)

Summary:

30% of the maximum VddFlash Voltage Level = 3.3 + (3.3 x 30%) = 4.29V. None of the VddFlash pin exceeds 3.81V, no over-voltage observed


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30% of the minimum VddFlash Voltage Level = 0 - (3.3 x30%) = - 0.99V. None of the VddFlash pin has voltage lower than 0V, no over-voltage observedResults :

HDVS Channel 23m.412 (VDDA)

Summary:

30% of the maximum Vdda Voltage Level = 3.3 + (3.3 x 30%) = 4.29V. None of the Vdda pin exceeds 3.76V, no over-voltage observed

30% of the minimum Vdda Voltage Level = 0 - (3.3 x30%) = - 0.99V.


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None of the Vdda pin has voltage lower than 0V, no over-voltage observedResults :

HSDM Channel 13.d313 (AN34)

Summary:

30% of the maximum AN34 Voltage Level = 3.3 + (3.3 x 30%) = 4.29V. None of the AN34 pin exceeds 3.96V, no over-voltage observed

30% of the minimum AN34 Voltage Level = 0 - (3.3 x30%) = - 0.99V. None of the AN34 pin has voltage lower than 0V, no over-voltage observed


Page 40 of 41


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6. CONCLUSION

Base on above data, Ultra Flex B is now a qualified production tester.

KLM responsible engineer:

TPE:Name/Core ID: Li Hong FeyE-mail: [email protected] Tel: 03-78734068 / #6773

MBG PE:Name/Core ID: Mark WagnerE-mail: [email protected] Tel: 1-512-8953189

QA: Name/Core ID: Kong KWE-mail: [email protected] Tel: 03-78732341 / #6382

~ End of Report ~

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COPPERHEAD (MPC5554) ULTRA FLEX B PLATFORM QUALIFICATION · COPPERHEAD (MPC5554) ULTRA FLEX B PLATFORM QUALIFICATION ... J750 – 1024 Handler Type : Delta Flex X4 Load board :