Contracer - jaindah.com.t · Contracer CV-2100 SERIES 218 — Contour Measuring Instruments • The operation flow is significantly shortened by arranging the controls for stylus

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ContracerHigh precision + high functionality + high operability = Contracer

Mitutoyo operates a policy of continuous improvement that aims to provide the customer with the benefit of the latest technological advances.Therefore the company reserves the right to change any or all aspects of any product specification without notice.

Contracer CV-2100SERIES 218 — Contour Measuring Instruments

• The operation flow is significantly shortened by arranging the controls for stylus position change, measurement start/stop and return on the front of the drive unit.

• Fine and coarse X-axis positioning can be performed easily by using the jog shuttle that covers the whole measuring range.

• The quick-vertical-motion stand allows operators to swiftly and easily move the drive unit to and from the measurement height without having to push or pull (only for CV-2100M4).

• The detector unit (Z1 axis) is equipped with a highly accurate arc scale. This scale directly tracks the arc locus of the stylus tip so that the most accurate compensation can be applied to the scale output, which leads to higher accuracy and resolution. Operators are free from bothersome operations such as measurement magnification switching and calibrating each magnification as required for analog instruments.

• A notebook or desktop PC can be used as the data processing unit for the CV-2100M4/N4.

Contour Measuring System enabling measurement that is fast, accurate, and easy.

Refer to the Contracer CV-2100(Catalog No.E15020) for more details.

An inspection certificate is supplied as standard. Refer to page X for details.

CV-2100M4

CV-2100M4

Optional accessories dedicated to the CV-2100N4Column stand • Allows the use of the CV-2100N4 in a

fixed configuration.Order No. 218-042 Inclination range: ±45°Up/down movement: 320mmMass: 110kg Note: While the appearance of the

natural stone measuring table varies according to the source, the high stability for which this material is known can always be relied upon.

Notebook PC Form Analysis program FORMTRACEPAK

Desktop PC

Centralized front control panel Motor-driven jog shuttle Quick-vertical-motion stand

CV-2100N4

Highly accurate arc scale

SPECIFICATIONSModel No. CV-2100M4 CV-2100N4Measurement range

X-axis 100mmZ1-axis (detector unit) 50mm

Z2-axis (column) travel range 350mm—

X-axis inclination angle ±45°

ResolutionX-axis 0.1μmZ1-axis 0.1μm

Drive methodX-axis Motorized drive (0 - 20mm/s)Z1-axis (column) Manual (quick-up-and-down motion, fine feed) —

Measuring speed 0.02, 0.05, 0.1, 0.2, 0.5, 1.0, 2.0, 5.0mm/sLinearity accuracy (X-axis horizontal orientation) 2.5μm/100mm

Accuracy (20°C)

X-axis ±(2.5+0.02L) μm L = Measurement Length (mm)Z1-axis ±(2.5+|0.1H|) μm H = Measurementt height from horizontal position within ±25mm

Measurement direction Forward / backwardMeasurement surface direction DownwardMeasuring force 30±10mN (3gf)Stylus traceable angle (Standard accessory stylus) Ascent 77°, Descent 87° (Depends on the surface condition)

External dimensions (W×D×H) 745×450×885mm 651×143×138.5mmMass 145.8 kg 5.8 kgNote: While the appearance of the natural stone measuring table varies according to the source, the high stability for which this

material is known can always be relied upon.

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Optional Accessories for ContracerFor CV-2100 series

• Straight arm • Eccentric arm

• One-sided cut stylus

• Knife-edge stylus

• Intersecting cut stylus

• Cone stylus

• Small hole stylus SP-12/32


• Small hole arm

Tip angle: 12°Tip radius: 25μmMaterial: Carbide

Tip angle: 20°Edge width: 3 mmMaterial: CarbideTip radius: 25μm



Tip shape: one-sided(Tip angle: 20°)Tip shape: Cone(Tip angle: 30°)Tip radius: 25μmTip material: Carbide


ø3

H



• Ball stylus

Tip ball diameter: 1 mmTip material: Carbide

• Cone stylus

Tip angle: 30° (50° for SPH-79)Tip radius: 25μmMaterial: Sapphire, carbide(Diamond for SPH-79)

Arms

Styli

ø8

ø4

5040H

ø6

ø1.6

5012.5

H

ø6

ø3

5020H

ø3

H

ø3

H

ø3

H H

ø3

15155

H

ø8

25145

95H

ø8

H

15

40155

H

ø8

ø3

H

List of Applicable ArmsArm name Arm No. Order No. Applicable stylus No. H (mm)

Straight arm

AB-51 935111 SPH-51, 52, 53, 54, 55, 56, 57 6AB-61 935112 SPH-61, 62, 63, 64, 65, 66, 67 12AB-71* 935113 SPH-71, 72, 73, 74, 75, 76, 77, 79 20AB-81 935114 SPH-81, 82, 83, 84, 85, 86, 87 30AB-91 935115 SPH-91, 92, 93, 94, 95, 96, 97 42

Eccentric arm

AB-52 935116 SPH-51, 52, 53, 54, 55, 56, 57 6AB-62 935117 SPH-61, 62, 63, 64, 65, 66, 67 12AB-72 935118 SPH-71, 72, 73, 74, 75, 76, 77, 79 20AB-82 935119 SPH-81, 82, 83, 84, 85, 86, 87 30AB-92 935120 SPH-91, 92, 93, 94, 95, 96, 97 42

Small hole arm AB-11 935110SP-11, 31 0.4SP-12, 32 1SP-13, 33 2.5

* Standard Accessories

List of Applicable StyliStylus Stylus No. Order No. Compatible Arm No. H (mm)

One-sided cut stylus

SPH-51 354882 AB-51·52 6SPH-61 354883 AB-61·62 12

SPH-71* 354884 AB-71·72 20SPH-81 354885 AB-81·82 30SPH-91 354886 AB-91·92 42

Intersecting cut stylus

SPH-52 354887 AB-51·52 6SPH-62 354888 AB-61·62 12SPH-72 354889 AB-71·72 20SPH-82 354890 AB-81·82 30SPH-92 354891 AB-91·92 42

Cone stylus tip angle 20° (carbide-tipped)

SPH-57 12AAE865 AB-51·52 6SPH-67 12AAE866 AB-61·62 12SPH-77 12AAE867 AB-71·72 20SPH-87 12AAE868 AB-81·82 30SPH-97 12AAE869 AB-91·92 42

Cone stylus tip angle 30° (Sapphire)


Cone stylus tip angle 50° (Diamond) SPH-79 355129 AB-71·72 20

Cone stylus tip angle 30° (carbide-tipped)

SPH-56 12AAA566 AB-51·52 6SPH-66 12AAA567 AB-61·62 12SPH-76 12AAA568 AB-71·72 20SPH-86 12AAA569 AB-81·82 30SPH-96 12AAA570 AB-91·92 42

Knife-edge stylus


Ball stylus


Small hole stylus (One-sided cut)

SP-11 932693 AB-11 0.4SP-12 932694 AB-11 1SP-13 932695 AB-11 2.5

Small hole stylus (Cone)

SP-31 12AAE873 AB-11 0.4SP-32 12AAE874 AB-11 1SP-33 12AAE875 AB-11 2.5

*Standard Accessories

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• CV-3200 series are contour measuring instruments equipped with a high-precision arc scale and newly designed arm on the Z1 axis (detector). The high-precision arc scale can directly read the arc track of the stylus tip to achieve high accuracy and resolution. The new arm has extended the Z1-axis measuring range by 10 mm while reducing the chance of interference with workpieces compared to conventional models. The arm mount can be attached/detached with a single touch on the magnet joint for improved ease of operation.

• The 700mm Z2-axis (column) range models are new to the lineup.

Dramatically Improved High-Precision Contour Measuring Instruments.


Z1-axis measuring range has been extended by 10mm.

• CV-3200 (conventional model)

• CV-3200

50mm

10 mm

60mm

19 mm

SPECIFICATIONSModel No. CV-3200S4 CV-3200H4 CV-3200W4 CV-3200L4 CV-3200S8 CV-3200H8 CV-3200W8 CV-3200L8Measuring range

X axis 100mm 200mmZ1 axis (detector) 60mm (±30mm from the horizontal)

Z2-axis (column) moving range 300mm 500mm 700mm 300mm 500mm 700mm

Z1 axis (Detector)

Scale type Arc Resolution 0.04μmStylus up/down Arc motionMeasuring direction Forward / backward Face of stylus Vertical direction (up/down, single measurement)Measuring force 30mN (adjustment using weights)

Traceable angle Ascent: 77°, descent: 83° (using the standard one-sided cut stylus*1 provided anddepending on the surface roughness)

Drive unit

Scale typeX axis Separate type linear scaleZ2 axis (column) ABS scale

ResolutionX axis 0.05 μmZ2 axis (column) 1 μm

Drive speedX axis 0 to 80mm/s or manual operationZ2 axis (column) 0 to 30mm/s or manual operation

Measuring speed X axis 0.02, 0.05, 0.1, 0.2, 0.5, 1.0, 2.0, 5.0, 10, 20mm/sStraightness*2 X axis 0.8µm/100mm 2μm/200mmInclination range X axis ±45°

Accuracy (20°C)X axis

±(0.8+0.01L)µm L = traverse length (mm)Wide range: 1.8µm/100mm

Narrow range: 1.05μm/25mm

±(0.8+0.02L)µm L = traverse length (mm)Wide range: 4.8µm/200mmNarrow range: 1.3μm/25mm

Z1 axis (detector) ±(1.4+|2H|/100)μm H = probing height from the horizontal (mm)External dimensions(W×D×H) Main unit*3 756×482x

966mm756×482× 1166mm

1156×482×1176mm

1156×492×1436mm

766×482×966mm

766×482×1166mm

1166×482×1176mm

1166×492×1436mm

Mass Main unit 140kg 150kg 220kg 270kg 140kg 150kg 220kg 270kg

*1: SPH-71 (No.354884)*2: In X-axis horizontal position*3: Base material of the main unit is Gabbro.Note: While the appearance of the natural stone measuring table varies according to the source, the high stability for which this material is known can always be relied upon.


CV-3200S4

CV-3200L4 (with options)

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Refer to the Contracer CV-3200/4500 series (Catalog No.E15010) for more details.

• CV-4500 series are contour measuring instruments equipped with a high-precision arc scale and newly designed arm on the Z1 axis (detector). The high-precision arc scale can directly read the arc track of the stylus tip to achieve high accuracy and resolution. The new arm has extended the Z1-axis measuring range by 10 mm while reducing the chance of interference with workpieces compared to conventional models. The arm mount can be attached/detached with a single touch on the magnet joint for improved ease of operation.

• The following two features have been added exclusively for the CV-4500 series.(1) Continuous measurement in the vertical

direction (up/down) is available in combination with a double-sided conical stylus. Up/down continuous measurement data facilitates the analysis of the effective diameter of screw threads, which has been difficult to measure in the past.

(2) The measuring force can be set in the FORMTRACEPAK software. Weight replacement and position adjustment are not required to adjust the measuring force.


Dramatically Improved High-Precision Contour Measuring Instruments.

CV-4500S4



• CV-4500 (conventional model)

• CV-4500

50mm

10 mm

60mm

19 mm

Downward (Bottom plane) measurement

Upward/downward measurement direction is switchable on the software

Upward (Top plane) measurement

Measuring direction

SPECIFICATIONSModel No. CV-4500S4 CV-4500H4 CV-4500W4 CV-4500L4 CV-4500S8 CV-4500H8 CV-4500W8 CV-4500L8Measuring range

X axis 100mm 200mmZ1 axis (detector) 60mm (±30mm from the horizontal)

Z2-axis (column) moving range 300mm 500mm 700mm 300mm 500mm 700mm

Z1 axis (Detector)

Scale type Arc Resolution 0.02μmStylus up/down Arc motionMeasuring direction Forward / backward Face of stylus Vertical direction (up/down, available for continuous measurement)Measuring force 10, 20, 30, 40, 50mN (switching on the software)

Traceable angle Ascent: 77°, descent: 83° (using the standard one-sided cut stylus*1 provided anddepending on the surface roughness)

Drive unit

Scale typeX axis Separate type linear scaleZ2 axis (column) ABS scale

ResolutionX axis 0.05 μmZ2 axis (column) 1 μm


Measuring speed X axis 0.02, 0.05, 0.1, 0.2, 0.5, 1.0, 2.0, 5.0, 10, 20mm/s

Straightness*2 X axis 0.8µm/100mm 2μm/200mmInclination range X axis ±45°

Accuracy (20°C)X axis

±(0.8+0.01L)µm L = traverse length (mm)Wide range: 1.8µm/100mm

Narrow range: 1.05μm/25mm

±(0.8+0.02L)µm L = traverse length (mm)Wide range: 4.8µm/200mmNarrow range: 1.3μm/25mm

Z1 axis (detector) ±(0.8+|2H|/100)μm H = probing height from the horizontal (mm)

External dimensions(W×D×H) Main unit*3 756×482×

966mm756×482× 1166mm

1156×482 ×1176mm

1156×492 ×1436mm

766×482 ×966mm

766×482 ×1166mm

1166×482 ×1176mm

1156×492 ×1436mm

Mass Main unit 140kg 150kg 220kg 270kg 140kg 150kg 220kg 270kg*1: SPH-71 (No.354884)*2: In X-axis horizontal position*3: Base material of the main unit is Gabbro.Note: While the appearance of the natural stone measuring table varies according to the source, the high stability for which this



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Stylus name Model No. Order No.Compatible arm No.

H(mm)CV-3200/4500 SV-C3200/4500SV-C4500CNC

Double-sided conical stylus*2

SPHW-56 12AAM095*4

AB-31, 37

20SPHW-66 12AAM096 32SPHW-76 12AAM097 48

One-sided cut stylus

SPH-51 354882 6SPH-61 354883 12SPH-71 354884*5 20SPH-81 354885 30SPH-91 354886 42

Intersecting cut stylus

SPH-52 354887 6SPH-62 354888 12SPH-72 354889 20SPH-82 354890 30SPH-92 354891 42

Cone stylus tip angle 30°(Sapphire)


Cone stylus tip angle 30°(carbide-tipped)

SPH-56 12AAA566 6SPH-66 12AAA567 12SPH-76 12AAA568*6 20SPH-86 12AAA569 30SPH-96 12AAA570 42

Cone stylus tip angle 20°(carbide-tipped)

SPH-57 12AAE865 6SPH-67 12AAE866 12SPH-77 12AAE867 20SPH-87 12AAE868 30SPH-97 12AAE869 42

Cone stylus tip angle 50° (Diamond) SPH-79 355129 20

Knife-edge stylus


Ball stylus


Small hole stylusSPH-41 12AAM104

AB-332

SPH-42 12AAM105 4SPH-43 12AAM106 6.5

*1: Standard accessory for the CV-3200/4500, SV-C3200/4500, and SV-C4500CNC series.*2: Dedicated stylus for the CV-4500, SV-C4500, and SV-C4500CNC series.*3: When one-sided cut stylus SPH-71 (standard accessory) is used.*4: Standard accessory for the CV-4500, SV-C4500, and SV-C4500CNC series.*5: Standard accessory for the CV-3200/4500 and SV-C3200/4500 series.*6: Standard accessory for the SV-C4500CNC.

List of Applicable Styli

Tip angle: 20°Edge width: 3 mmTip radius: 25µmMaterial: Carbide

H

ø3

• One-sided cut stylus

Tip angle: 12°Tip radius: 25µmMaterial: Carbide

ø3

H

• Intersecting cut stylus


H

ø3

• Knife-edge stylus

H

ø3• Ball stylus

Tip ball diameter: 1 mmTip material: Carbide

ø3

H

• Cone stylus

Tip angle: 30° (50° for SPH-79)Tip radius: 25µmTip material: Sapphire, carbide (Diamond for SPH-79)

H

ø3

• Cone stylus



H

ø3

• Small hole stylus SPH-41



• Double-sided conical stylus

Tip shape: one-sided (tip angle: 20°)Tip radius: 25µmTip material: Carbide



13

ø1.6

ø4.8

H0.4

55

ø3

H 120

ø5

55

ø4

H2.5

40 55

Stylus

Optional Accessories for ContracerArms for CV-3200/4500 series, SV-C3200/4500 series, and SV-C4500 CNC series Arms• Straight arm AB-31 • Eccentric arm AB-37 • Small hole arm AB-33

List of Applicable ArmsStylus name Model No. Order No. Applicable styli

Straight arm AB-31 12AAM101*1 SPH-5 , 6 , 7 , 8 , 9SPHW*2-56, 66, 76

Eccentric arm AB-37 12AAQ762SPH-5 , 6 , 7 , 8 , 9SPHW*2-56, 66, 76

Small hole arm AB-33 12AAM103 SPH-41, 42, 43

φ857.5

20

218※3

φ8

40

57.520

φ8

218

57.520

218※3

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Optional Accessories for Contracer

Cross-travel table

Optional accessories that can be used with the cross-travel table.

Holder with clamp

Rotary vise

Swivel center support

V-block with clamp

Center support

Center support riser

172-234 172-378

Workpiece fixture for rotary vise

No.218-001

Code No. 218-003Fixing method Two-slide jaw

Angle of rotation360° (0°, 30°, 60°, 90° equipped with

quick stop function)Resolution 1°Jaw opening 60mmJaw width 80mmJaw depth 35mmTotal height 110mm

Code No. 172-142Max. length of the workpiece 120mm

Max. diameter of workpiece 120mm

Code No. 172-143Total height 60mm

Code No. 172-197Inclination range ±10°

Resolution 1°Max. length of workpiece 140mm

Max. diameter of workpiece

80mm(when the inclination

angle is 0°)65mm

(when the inclination angle is 10°)

Code No. 172-234 172-378V-block length 60mm 41mmMaximum height of workpiece

50mm 25mm

Code No. 172-144Rotation method One-slide jawAngle of rotation 360°

Jaw opening80mm

(When the auxiliary block is inserted: 25mm)

Jaw width 40mmJaw depth 20mmTotal height 76mm

Code No. 176-107Maximum supportable height 35mm

T-groove 152mmMounting hole pitch 84mm,120mm

Tip shape: ConeTip angle: 20° (SPHW-21) 30° (SPHW-31)Tip radius: 25µmTip material: Carbide

Tip shape: ConeTip angle: 20° (SPHW-22) 30° (SPHW-32)Tip radius: 25µmTip material: Carbide

Tip shape: ConeTip angle: 30°Tip radius: 25µmTip material: Carbide

ø4.8ø1.6

ø8

275

20

ø5ø3

ø8

275

20

ø4

ø8

275

20H

Enlarged view of the tip

H


H


Arm stylus (Arm/stylus integrated type) for CV-4500 series, SV-C4500 series, and SV-4500CNC series

• Double-sided small hole Arm stylus SPHW-21/31 • Double-sided small hole Arm stylus SPHW-33• Double-sided small hole Arm stylus SPHW-22/32

Arm stylus name Model No. Order No. H (mm)

Double-sided small hole arm stylus*1

SPHW-21 12AAT 469 2.4SPHW-22 12AAT 470 5SPHW-31 12AAM108 2.4SPHW-32 12AAM109 5SPHW-33 12AAM110 9

*1: Arm stylus for the CV-4500, SV-C4500, and SV-C4500CNC series.

Code No. 218-001Dimensions of the table 280×180mmHeight of the table 100mmMax. stage loading 30kgFixture mounting T-groove and dovetail groove

Travel range 100mm (right/left)×50mm (forward/backward)

Resolution/Graduation 0.01mm thimble (with 1mm scales only in the right/left direction)

Swivel range —

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Optional Accessories for Contracer

Lubricant• Apply in a thin layer regularly to

the Z-column sliding surfaces of a motorized model.

(Standard accessory for the motorized column type models)

Order No. 352637

Leveling table V-block stage 2 (A set of two)Maximum supportable diameter: 25mmMass: 700g

No.181-902-10

V-block with clamp• Can be mounted on the

cross-travel table.No.998291

Precision viseNo.178-019

• Can be mounted on the cross-travel table.

Cross-travel table• Equipped with micrometer heads on the X

and Y axes. Best suited for the alignment of axes since the inclination adjustment center and the rotation center are the same.

Centering chuck (knurled ring operated)• Suitable for holding small

parts with easy-to-operate knurled-ring clamping.

No.211-032

Micro chuck• Used for clamping work-

pieces smaller than ø1 mm that the centering chuck cannot hold.

No.211-031

Code No. Digimatic: 178-042-1 Digimatic: 178-049 venier: 178-043-1Dimensions of table (W×D) 130×100mmMaximum table loading 15kgInclination range ±1.5° — ±1.5°Rotation range ±3° — ±3°X- and Y-axes range ±12.5mmResolution/Graduation 0.001mm 0.01mmExternal dimensions (W×D×H) 262×233×83mm 262×233×55mm 220×189×83mmMass 6.3kg 5kg 6kg

Fixing method Two-slide jawJaw opening 36mmJaw width 44mmJaw depth 16mmTotal height 38mm

Workpiece diameter(using both V-grooves)

ø1 to 7mmø6 to 160mm

Code No. 178-016Dimensions of table 130×100mmInclination range ±1.5°Maximum table loading 15kgExternal dimensions (W×D×H) 130×100×40mmMass 3kg

Holding capacityOD with internal jaws ø1-ø36mmID with internal jaws ø16-ø69mm

OD with external jaws ø25-ø79mmExternal dimensions (D×H) ø118×41mmMass 1.2kg

Holding capacity OD ø0.2-ø1.5mmExternal dimensions (D×H) ø107×48.5mmMass 0.6kg

For information on the three-axis adjustment table (No.178-047)

For the high-accuracy surface roughness measurement of a cylindrical workpiece, it is necessary to set the workpiece line axis parallel with the measurement axis and to adjust the leveling. Using the three-axis adjustment table facilitates the adjustment of the alignment and leveling necessary just by following the guidance supplied by the machine. No experience or intuition is required.

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• Enables efficient, automatic measurement of multiple aligned workpieces and multiple points on a single table surface.

No.178-097

CV-3200/4500 series, For SV-C3200/4500 series

• Calculates the angle in advance when measuring the cross-sectional data in the orthogonal direction or at the specified angle pitch of a cylindrical or spherical workpiece.

No.12AAD975

Using the following optional accessories enables semi-automatic (simplified CNC) measurement.

1-axis table No.12AAD975

Y-axis table

• Calculates the angle in advance when loading the sectional data at the specified angle pitch when measuring the multiple cross-sectional data of a rectangle workpiece or the axial direction of a cylindrical workpiece.

No.178-078

2-axis unit

Travel range 360°Resolution 0.004°Rotational speed 10°/sec (max.)Table diameter ø150mmMaximum loading 12kg

Travel range 360°Resolution 0.0072°Rotational speed 18°/sec (max.)Table diameter ø118mmMaximum loading(loading moment)

4kg(343N·cm or less)

Travel range 200mmResolution 0.05 μmPositioning accuracy ±3μmDrive speed 80mm/s (max.)Maximum loading 50kgMass 28kg*Note: This Y-axis table cannot be used with CNC form

measuring instruments.

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FormtracerHybrid machine with dual-role capability


• The combination of a surface roughness tester and contour measuring instrument saves installation space.

Surface roughness testing function• Z1-axis detector provides highest resolution of

0.0001µm (when the measuring range is 8µm) is provided as standard.

• High-accuracy glass scales, built-in on the X axis, directly read the drive unit movement. Greatly facilitates spacing parameter evaluation while achieving high-accuracy positioning.

• Measuring force for the detector is selectable from 4mN or 0.75mN.

Contour measuring function• The Z1 axis (detector) is equipped with a high-

precision arc scale and newly designed arm. The high-precision arc scale can directly read the arc track of the stylus tip to achieve high accuracy and resolution. The new arm has extended the Z1-axis measuring range by 10 mm while reducing the chance of interference with workpieces compared to conventional models. The arm mount can be attached/detached with a single touch on the magnet joint for improved ease of operation.

• The following two features have been added exclusively for the SV-C-4500 series as functions dedicated to contour measuring systems.

(1) Continuous measurement in the vertical direction (up/down) is available in combination with a double-tipped stylus.

Up/down continuous measurement data facilitates the analysis of the effective diameter of screw threads, which has been difficult to measure in the past.

(2) The measuring force can be set in the FORMTRACEPAK software. Weight replacement and position adjustment are not required to adjust the measuring force.



Formtracer SV-C3200/4500SERIES 525 — Surface Roughness and Contour Measuring Systems

Surface roughness testing

Contour measuring

Formtra

cer

Refer to the Formtracer SV-C3200/4200 series (Catalog No.E15012) for more details.

Downward (Bottom plane) measurement

Upward/downward measurement direction is switchable in the software

Upward (Top plane) measurement

SPECIFICATIONSModel No.

SV-C3200S4 SV-C3200H4 SV-C3200W4 SV-C3200L4 SV-C3200S8 SV-C3200H8 SV-C3200W8 SV-C3200L8SV-C4500S4 SV-C4500H4 SV-C4500W4 SV-C4500L4 SV-C4500S8 SV-C4500H8 SV-C4500W8 SV-C4500L8

• Surface roughness measurement

Measuring range

X axis (drive unit) 100mm 200mmZ1 axis (detector) 800µm/80µm/8µm

Straightness (0.05+L /1000) μm L: traverse length (mm) (0.1+0.002L) μm L: traverse length (mm)Resolution Z1 axis (detector) 0.01µm(800µm), 0.001µm(80µm), 0.0001µm(8µm)

Measuring force 0.75mN (when the Code No. of the main unit ends with "-1") / 4mN (when the Code No. of the main unit ends with "-2")

Stylus tip shape 60°, 2µmR (when the Code No. of the main unit ends with "-1") / 90°, 5µmR (when the Code No. of the main unit ends with "-2")

Applicable standards JIS1982/ JIS1994/ JIS2001/ ISO1997/ ANSI/ VDA

ParameterPa, Pq, Psk, Pku, Pp, Pv, Pz, Pt, Pc, PSm, P q, Pmr (C), Pmr, P c, Ra, Rq, Rsk, Rku, Rp, Rv, Rz, Rt, Rc, RSm, R q, Rmr (C), Rmr, R c, Wa, Wq, Wsk, Wku, Wp, Wv, Wz, Wt, Wc, WSm, W q, Wmr (C), Wmr, W c, Rk, Rpk, Rvk, Mr1, Mr2, A1, A2, Rx, AR, R, Wx, AW, W, Wte, Ry, RyDIN, RzDIN, R3y, R3z, S, HSC, Lo, Ir, a, a, q, Vo, Htp, NR, NCRX, CPM, SR, SAR, NW, SW, SAW

Assessed profilePrimary profile, Roughness profile, Filtered waviness profile, Waviness profile, Rolling circle waviness primary profile, Rolling circle waviness profile, Envelope residual profile, DF profile (DIN4776/ ISO13565-1), Roughness motif (Envelope waviness profile is displayed when evaluating the motif.)

Analysis graphMaterial ratio curve, Profile height amplitude distribution curve, Power spectrum chart, Auto-correlation chart, Walsh power spectrum chart, Walsh auto-correlation chart, Slope distribution chart, Local peak distribution chart, Parameter distribution chart (Contour analysis function can analyze the area of abrasion amount and overlay.)

Data compensation functions Least squares straight line, R-surface compensation, Ellipse compensation, Parabola compensation, Hyperbolic compensation, Conic compensation, Polynomial compensation (auto or arbitrary 2nd to 7th), No compensation

Filter Gaussian filter, 2CRPC75, 2CRPC50, 2CR75, 2CR50, Robust spline filter• Contour measurement

Measuring range

X axis (drive unit) 100mm 200mmZ1 axis (detector) 60mm (±30mm from the horizontal)

Straightness 0.8µm/100mm 2μm/200mm

AccuracyX axis (drive unit) ±(0.8+0.01L)µm L: traverse length (mm) ±(0.8+0.02L)µm L = traverse length (mm)

Z1 axis (detector) SV-C3200 series: ±(1.4+|2H|/100)µm, SV-C4500 series: ±(0.8+|2H|/100)μmH: Probing height from the horizontal (mm)

ResolutionX axis (drive unit) 0.05 μmZ1 axis (detector) SV-C3200 series: 0.04μm, SV-C4500 series: 0.02μmZ2 axis (column) 1 μm

Measuring force SV-C3200 series: 30mN (adjustment using weights)SV-C4500 series: 10, 20, 30, 40, 50mN (switching on the software)

Face of stylus SV-C3200 series: Vertical direction (up/down, single measurement)SV-C4500 series: Vertical direction (up/down, available for continuous measurement)

• Common specificationZ2-axis (column) moving range 300mm 500mm 700mm 300mm 500mm 700mm

X axis Inclination range ±45°


Measuring speed 0.02, 0.05, 0.1, 0.2, 0.5, 1.0, 2.0, 5.0, 10, 20mm/s

Note: While the appearance of the natural stone measuring table varies according to the source, the high stability for which this material is known can always be relied upon.


• CV-3100/4100 (conventional model)

• CV-3200/4500

50mm

10 mm

60mm

19 mm

SV-C3200L4 (with options)

SV-C3200S4

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• Equipped with a wide range and high resolution Z-axis detector.• Measuring range Z1 axis (detector): 5mm (Resolution: 0.0008µm *Applicable when the measuring range is 0.05mm) X axis: 100mm (Resolution: 0.05μm)

• Overhang of the detector: Max. 70mm (Fixable at a desired position)

• Uses the well-respected FORMTRACEPAK software to provide a rich variety of analysis functions to achieve excellent surface texture evaluation.

Formtracer CS-3200S4SERIES 525 — Surface Roughness and Contour Measuring System

CS-3200S4

Refer to the Formtracer CS-3200 (Catalog No.E15025) for more details.

SPECIFICATIONSModel No. CS-3200S4

Measuring range/Resolution

X axis 100mm/0.05μm

Z1 axis (detector)5mm/0.08µm

0.5mm/0.008µm0.05mm/0.0008µm

Z2 axis (column) 300mm/1μm

Accuracy (20°C)

X axis ±(0.8+0.01L)µm L= measuring length(mm)Z1 axis (detector) ±(1.5+|2H|/100) μm H = probing height from the horizontal (mm)

Drive unit

Straightness (X axis)

Under normal use 0.2μm/100mmWhen protruding to the maximum extent 0.4μm/100mm

Measuring speedRoughness measurement 0.02, 0.05, 0.1, 0.2mm/s (4-step)Contour measurement 0.02, 0.05, 0.1, 0.2, 0.5, 1.0, 2.0mm/s (7-step)

Drive speedX axis (horizontal direction) 0 to 80mm/s or manual operationZ2 axis (vertical direction) 0 to 20mm/s or manual operation

Up/down movement 300mm (motorized)Inclination range ±45°

Detector

Detection method Differential inductanceMeasuring force 0.75mN

Stylus

Standard stylus (for roughness/contour measurement) Tip angle: 60° cone, Tip radius: 2μm, Diamond tip

Cone stylus (for contour measurement) Tip angle: 30° cone, Tip radius: 25μm, Sapphire

Stylus up/down Available (Stoppable at a mid-air position)Note1: While the appearance of the natural stone measuring table varies according to the source, the high stability for which this

material is known can always be relied upon.Note2: High column and 200mm X-axis drive-unit models are also available. Please consult your local Mitutoyo office for applicable

specifications.


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FormtracerHybrid machine with dual-role capability


• High-accuracy stylus type CNC Surface Roughness / Contour Measuring System that allows measurement of surface roughness and form/contour with one unit through detector replacement.

• The X1-, Y- and Z2-axes have a maximum drive speed of 200mm/s.

This permits high-speed positioning that can potentially result in a large increase in the throughput of multiple-profile / multiple-workpiece measurement tasks.

• For models with the α axis, it is possible to perform continuous measurement over horizontal and inclined surfaces by power-tilting the X1 axis. In addition, automatic measuring force adjustment function of Z1-axis detector for contour measurement enables automatic measurement with constant measuring force even with the X1 axis tilted.

• For models with the Y-axis table, it is possible to expand the measuring range for multiple workpieces, etc., through positioning in the Y-axis direction.

• Detector for contour measuring systems (Z1 axis)

Accuracy ±(0.8+|2H|/100)μm• For the model without an α axis, indication

accuracy of the Z2-axis (column) is guaranteed. For this reason, it expands the measuring range of the Z1 axis (detector) in form/contour measurement by using the Z2-axis tracing function.

• 2-axis simultaneous control in the X- and Y-axis directions enables inclined plane measurements.

• When the Z1-axis detector for form/contour measurement is replaced with that for surface roughness measurement, or vice versa, it is a simple, one-touch replacement without rerouting of the connecting cables.

• Since the Z1-axis detector incorporates an anti-collision safety device, the machine will automatically stop if the detector touches a workpiece or jig.

• Optional external control function (Ext I/O) through bidirectional communication (RS-232C) with the PLC (programmable logic controller) is available.


Detector for surface roughness measurement

Detector for contour measurement

Formtracer Extreme SV-C4500CNCSERIES 525 — CNC Surface Roughness and Contour Measuring

Systems

SV-C4500CNC (Contour detector shown mounted together with the inclinable drive unit and Y-axis table)

SPECIFICATIONSModel No. SV-C4500CNC

X1 axis(Drive unit)

Measuring range 200mmResolution 0.05 μmScale type Reflective-type linear encoder

Drive speedCNC mode Max. 200mm/sJoystick mode 0 to 50mm/s

Measuring speed 0.02, 0.05, 0.1, 0.2, 0.5, 1.0, 2.0mm/s

ContourMeasuring direction Forward / backward Straightness 2μm/200mmAccuracy (20°C) ±(0.8+4L/200)µm L: Measuring length (mm)

Surface roughness

Measuring direction Backward Straightness 0.5 μm/200mm

Z1 axis(Detector)

Contour

Measuring range 60mm (±30mm from the horizontal)Resolution 0.02 μmMeasuring direction Both forward and backward (Direction is changed by FORMTRACEPAK)Vertical movement of the stylus Arc motionScale type Arc

Accuracy (20°C) ±(0.8+|2H|/100)µmH: Measuring height from horizontal position (mm)

Measuring force 10, 20, 30, 40, 50mN (setting measuring force Formtracepak)Traceable angle Ascent: 70°, Descent: 70°, (Depends on the surface texture.) Note1

Stylus tip 30° cone, Carbide

Surface roughness

Measuring range 800µm/80µm/8µmResolution 0.01μm/0.001μm/0.0001μmMeasuring force 0.75mN

Z2 axis(Column)

Drive range Specification is selectable from 300mm or 500mm.Resolution 0.05 μmScale type Reflective-type linear encoder


Accuracy(at 20°C)

Model without α axis ±(1.5+10H/1000)µm H: Z2 axis measuring height (mm)Model with α axis —

Base size (W×D) 750×600mmBase material Gabbro

Note1: When measuring range is ±15mm and stylus SPH-76 and SPHW-56 are used.Note2: While the appearance of the natural stone measuring table varies according to the source, the high stability for which this


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Formtracer Extreme CS-5000CNC/CS-H5000CNCSERIES 525 — CNC Surface Roughness and Contour Measuring

Systems

Wide range detector employing active control technology

CS-H5000CNC(with Y-axis table)

• High-accuracy stylus type CNC Surface Measuring System that allows batch measurement of surface roughness and form/contour.

• The X1- and Z2-axes have maximum drive speeds of 40mm/s and 200mm/s, respectively. This permits high-speed positioning that can potentially result in a large increase in the throughput of multiple-profile / multiple-workpiece measurement tasks.

• A Mitutoyo Laser Holoscale is incorporated in the X1- and Z1-axes so that high resolution is achieved and batch measurement of form/contour and surface roughness can be made.

• The active control method is employed for the Z1-axis detector to implement a wide-range measurement capability wherein the variation in dynamic measuring force is restricted.

• Since the Z1-axis detector incorporates an anti-collision safety device, the machine will automatically stop if the detector touches a workpiece or jig.

• For models with the axis, it is possible to perform continuous measurement over horizontal and inclined surfaces by power-tilting the X1 axis. (CS-5000CNC only)

• For models with the Y-axis table, it is possible to expand the measuring range for multiple workpieces, etc., through positioning in the Y-axis direction.

• Optional external control function (Ext I/O) through bidirectional communication (RS-232C) with the PLC (programmable logic controller) is available.

SPECIFICATIONSModel No. CS-5000CNC CS-H5000CNC

X1 axis

Measuring range 200mmResolution 0.00625 μmScale type Laser Holoscale


Measuring speed 0.02, 0.05, 0.1, 0.2mm/s (surface roughness), 0.02, 0.05, 0.1, 0.2, 0.5, 1.0, 2.0mm/s (form/contour)Measuring direction Forward / backward

Straightness(with standard stylus) (0.1+0.0015L)μm L: traverse length (mm) (0.05+0.0003L)μm L: traverse length (mm)(with 2X-long stylus) (0.2+0.0015L)μm L: traverse length (mm) (0.1+0.0015L)μm L: traverse length (mm)

Accuracy (20°C) ±(0.3+0.002L)μm L: traverse length (mm) ±(0.16+0.001L)μm L: traverse length (mm)

Z1 axis(Detector)

Measuring range(with standard stylus) 12mm(with 2X-long stylus) 24mm

Resolution(with standard stylus) 0.0008 µm(with 2X-long stylus) 0.0016 μm

Vertical movement of the stylus Arc motionScale type Transmission-type linear encoder Accuracy (20°C) ±(0.3+|0.02H|)μm H: probing height (mm) ±(0.07+|0.02H|)μm H: probing height (mm)

Measuring force(with standard stylus) 4mN (Fixed)(with 2X-long stylus) 0.75mN (Fixed)

Traceable angle Ascent: 60°, Descent: 60°, (Depends on the surface texture.)

Stylus tip shape

Standard stylus Tip angle: 40°, Tip radius: 5μm, Diamond tipStandard ball stylus Tip ball radius: 0.25mm, Sapphire2X-long stylus Tip angle: 40°, Tip radius: 5μm, Diamond tip2X-long stylus — Tip angle: 60°, Tip radius: 2μm, Diamond tip2X-long ball stylus Tip ball radius: 0.25mm, Sapphire

Face of stylus Downward

Z2 axis(Column)

Travel rangeZ2 axis (column, type S) 300mmZ2 axis (column, type H) 500mm —

Resolution 0.05 μmScale type Reflective-type linear encoder


Base size (width×depth) 750×600mmBase material Gabbro

Note: While the appearance of the natural stone measuring table varies according to the source, the high stability for which this material is known can always be relied upon.




Contracer (Contour Measuring Instruments)Quick Guide to Precision Measuring Instruments

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■Traceable Angle

The maximum angle at which a stylus can trace upwards or downwards along the contour of a workpiece, in the stylus travel direction, is referred to as the traceable angle. A one-sided sharp stylus with a tip angle of 12° (as in the above figure) can trace a maximum 77° of up slope and a maximum 87° of down slope. For a conical stylus (30° cone), the traceable angle is smaller. An up slope with an angle of 77° or less overall may actually include an angle of more than 77° due to the effect of surface roughness. Surface roughness also affects the measuring force.For model CV-3200/4500, the same type of stylus (SPH-71: one-sided sharp stylus with a tip angle of 12°) can trace a maximum 77° of up slope and a maximum 83° of down slope.

If a profile is read from the recorder through a template or scale, it is necessary to compensate for the stylus tip radius beforehand according to the applied measurement magnification.

■Compensating for Stylus Tip RadiusA recorded profile represents the locus of the center of the ball tip rolling on a workpiece surface. (A typical radius is 0.025mm.) Obviously this is not the same as the true surface profile so, in order to obtain an accurate profile record, it is necessary to compensate for the effect of the tip radius through data processing.

3: Software processing. To measure a workpiece contour that involves a large displacement in the vertical direction with high accuracy, one of these compensation methods needs to be implemented.

■Compensating for Arm RotationThe stylus is carried on a pivoted arm so it rotates as the surface is traced and the contact tip does not track purely in the Z direction. Therefore it is necessary to apply compensation in the X direction to ensure accuracy. There are three methods of compensating for arm rotation.1: Mechanical compensation2: Electrical compensation

■AccuracyAs the detector units of the X and Z axes incorporate scales, the magnification accuracy is displayed not as a percentage but as the linear displacement accuracy for each axis.

■Overload Safety CutoutIf an excessive force (overload) is exerted on the stylus tip due, perhaps, to the tip encountering a too-steep slope on a workpiece feature, or a burr, etc., a safety device automatically stops operation and sounds an alarm buzzer. This type of instrument is commonly equipped with separate safety devices for the tracing direction (X axis) load and vertical direction (Y axis) load.For model CV-3200/4500, a safety device functions if the arm comes off the detector mount.

■Simple or Complex Arm GuidanceIn the case of a simple pivoted arm, the locus that the stylus tip traces during vertical movement (Z direction) is a circular arc that results in an unwanted offset in X, for which compensation has to be made. The larger the arc movement, the larger is the unwanted X displacement (δ) that has to be compensated. (See figure, lower left.) The alternative is to use a complex mechanical linkage arrangement to obtain a linear translation locus in Z, and therefore avoid the need to compensate in X.

■Z axis Measurement MethodsThough the X axis measurement method commonly adopted is by means of a digital scale, the Z axis measurement divides into analog methods (using a differential transformer, etc.) and digital scale methods.Analog methods vary in Z axis resolution depending on the measurement magnification and measuring range. Digital scale methods have fixed resolution.Generally, a digital scale method provides higher accuracy than an analog method.

RxM

RxMRxM

Recorded profile

Workpiece contour

R: Stylus tip radiusM: Measurement magnification

Stylus

StylusMeasuring arm

Fulcrum

δ: Unwanted displacement in X to be compensated

δ

Up slope

Down slope

77˚ or less 87˚ or less


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■Contour analysis methodsYou can analyze the contour with one of the following two methods after completing the measurement operation.

Data processing section and analysis programThe measured contour is input into the data processing section in real time and a dedicated program performs the analysis using the mouse and/or keyboard. The angle, radius, step, pitch and other data are directly displayed as numerical values. Analysis combining coordinate systems can be easily performed. The graph that goes through stylus radius correction is output to the printer as the recorded profile.

■Tolerancing with Design DataMeasured workpiece contour data can be compared with design data in terms of actual and designed shapes rather than just analysis of individual dimensions. In this technique each deviation of the measured contour from the intended contour is displayed and recorded. Also, data from one workpiece example can be processed so as to become the master design data to which other workpieces are compared. This function is particularly useful when the shape of a section greatly affects product performance, or when its shape has an influence on the relationship between mating or assembled parts.

■Best-fittingIf there is a standard for surface profile data, tolerancing with design data is performed according to the standard. If there is no standard, or if tolerancing only with shape is desired, best-fitting between design data and measurement data can be performed.

The best-fit processing algorithm searches for deviations between both sets of data and derives a coordinate system in which the sum of squares of the deviations is a minimum when the measured data is overlaid on the design data.

■Data CombinationConventionally, if tracing a complete contour is prevented by stylus traceable-angle restrictions then it has to be divided into several sections that are then measured and evaluated separately. This function avoids this undesirable situation by combining the separate sections into one contour by overlaying common elements (lines, points) onto each other. With this function the complete contour can be displayed and various analyses performed in the usual way.

Aspheric lens contour

Internal gear teeth

Male thread form Gage contour

Female thread form

Inner/outer ring contour of a bearing

■Measurement Examples

Measured data

Design data

Measured data

Design data

<After best-fit processing><Before best-fit processing>

Data combination

Data 2Data 1

Documents

Contracer - jaindah.com.t · Contracer CV-2100 SERIES 218 — Contour Measuring Instruments • The operation flow is significantly shortened by arranging the controls for stylus