COM/DCOM Basics

Peter Chochula CERN-ALICE / Dpt. Of Nucl. Physics MFF UK Bratislava

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HTTP

IPX,SPXComponentClient

ComponentClient COM

ComponentClient

COM COMDCE-RPC

Client Process

Client Process

Server Process

Server Process

Accessing COM services

In the same Process:direct function calls

On the same machine:secure IPC

Across machines:secure DCE-RPC based DCOM protocol

Component

TCP, UDP

Multiple network Transports

COM

COM

Client Machine Server Machine

COM/DCOM BasicsCOM/DCOM Basics

Security: NT Security SSL Certificates Kerberos IP Security


Data access overviewData access overview

Windows OS offers several Database Client

technologies

OLE DB - recent technology, replacing

former ODBC standard

growing choice of commercial OLE DB

providers

OLE DB OS ( NT, UNIX, VMS )

interoperability

OLE DB provides highest performance

compared to other (here discussed)

technologies

ADO - provides object model for the

database access


MS Access as a Database ExampleMS Access as a Database Example


Virtual Instruments SoftwareVirtual Instruments SoftwareArchitecture - VISA Architecture - VISA

NI-VISA - National Instruments

implementation of industry

standard

package for configuring,

programming and troubleshoting of

instrumentation systems based on

VXI, VME, GPIB and Serial

interfaces

unified program acces to all

interfaces

LabWindows, LabView, C, C++,

Visual basic interfaces

set of libraries, interactive tools and

configuration utilities


Bundled ToolsBundled Tools

Test and Measurement Explorer

VXI Interactive control

VIC - Visa Interactive Control


Test systems for the Alice1 chipTest systems for the Alice1 chip

Verification tests with IMS IC tester

– system setup

– software components DAQ test system for detector prototypes

– hardware setup

– backup options

– status of software components

• DAQ software

• software for JTAG control

• data logging

• evaluation of results


Software for the Test CampaignSoftware for the Test Campaign

Tester SetupTester Setup Lab SetupLab Setup Testbeam SetupTestbeam Setup

•Non portable setup - for use only at CERN•Primary task: Chip debugging•Based on commercial software (IMS Screens, IMS-Link, TESTview•People involved: Sajan Easo (LHC-B), P. Chochula (Alice) + chip developers, Mike Burns (Verilog JTAG model)

•Non portable setup - for use only at CERN•Primary task: Chip debugging•Based on commercial software (IMS Screens, IMS-Link, TESTview•People involved: Sajan Easo (LHC-B), P. Chochula (Alice) + chip developers, Mike Burns (Verilog JTAG model)

•Currently developed and used at CERN•LabView + VISA +COM based•Primary tasks: Chip characterization, debugging of VME electronics•People involved: P. Chochula, P. Rosinsky (Bratislava)

•Currently developed and used at CERN•LabView + VISA +COM based•Primary tasks: Chip characterization, debugging of VME electronics•People involved: P. Chochula, P. Rosinsky (Bratislava)

•Currently “under study”•Based on Motorola and DATE•Primary task: test beam data taking•Special requirement: must be compatible with Lab Setup at least at the data level•People involved: Anton Jusko, P. Chochula

•Currently “under study”•Based on Motorola and DATE•Primary task: test beam data taking•Special requirement: must be compatible with Lab Setup at least at the data level•People involved: Anton Jusko, P. Chochula


Pilot-Serlink Test SystemPilot-Serlink Test System

PCI-VMEPCI-VME

Data LoggerData Logger

Error AnalyzerError Analyzer

Test PanelTest Panel

VISA LayerVISA Layer

EthernetEthernet

HP16500CHP16500C

GPIBGPIB

RX FiFo

RX FiFo

TX FiFo

TX FiFo

C/SR

C/SR

Test

Run

Test?

VME

BUS

VME

BUS

Link

Link

Yes No

Mode?


Pilot-Serlink Test PanelPilot-Serlink Test Panel

Software components:

– Event generator

– VME control

– Event analyzer

– Error analyzer

– Data logger

Tests with external PG

– TCP/IP communication

– Program generator


SUNSolaris

VXIpc-850Win. NT

VIM

IMS LinkSCREENS

IC Tester SetupIC Tester Setup

Available software tools:

SCREENS - package for the control and execution of digital tests on the IMS tester

IMS-LINK - translation of test patterns (Verilog interface)

SEQUENTEST - LABview compatible test sequencer

LIMITEST - tool to define acceptance limits for analog measurements

VIM - Virtual Instrument Manager, handles communication between Slot0 controller and SUN

WAVEMAKE - generation and analysis of analog and digital signals


Interfacing with IC testerInterfacing with IC tester Software interface :

– Screens will be used to debug the chips

– TestView based programs will be used to characterize the chips (complicated measurements requiring multiple runs and data evaluation)

Possible test enhancements:

– Connection Wafer Prober - IC tester exists, but was not yet tested

– need to synchronize with a PC controlling the prober (using LabView and BusLab)

There is no JTAG controller attached to the tester. To overcome this limitation one can:

Emulate JTAG controller with the tester: Use Verilog Simulation or an vector generator to prepare patterns which will be scanned to the chip. Reloading of patterns might be slow!

Use external PC equipped with F100 board. This task involves synchronisation of PC and SUN over TCPIP, which should be fast. However there is a risk of inducing new problems while using additional hardware and software


TestViewTestView

Programming environment using LabView Provides the same tester control capabilities as Screens &Co. Handles communication with the LogicMaster

TestModules/TestLITETestModules/TestLITE

IMS ApplicationsIMS Applications

TestLITE “C”libraryTestLITE “C”library

IMS ApplicationsIMS Applications

MATTS Server InterfaceMATTS Server Interface

LM Command languageLM Command language

TestVIEW

TestEnvironment

Tester Firmware

Documents

COM/DCOM Basics