Upload
others
View
6
Download
0
Embed Size (px)
Citation preview
Chapter 5
Digital Electronics
AS-Chap. 5 - 2
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
fast (< 100 GHz) low-power (aJ / gate)
5.1 Superconductivity and Digital Electronics
requires cooling new technology new periphery (power supply, packaging, ...)
AS-Chap. 5 - 3
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
The Cryotron (1956)
Icontr Igate Icontr
Igate
0 1
(a) (b)
5.1.1 Historical Development
• low switching speed of ≈ 10 ns limited by the L/R time
• control line has higher critical magnetic field switching of gate line into normal state
AS-Chap. 5 - 4
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
Icontr Igate
0 1
(a)
Icontr
Igate
0 1
(b)
The Josephson Switch (1966, Matisoo, IBM)
5.1.1 Historical Development
JJ JJ
• critical current of dc SQUID is suppressed below Igate by magnetic field generated by control line switching to voltage state
• sub-ns switching speed achievable
AS-Chap. 5 - 5
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
Rapid Single Flux Quantum (RSFQ) Logic (1985)
5.1.1 Historical Development
(Likharev, Nakajima)
AS-Chap. 5 - 6
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
1. Fast, low power
10-8
10-7
10-6
10-5
10-4
10-3
10-2
10-12
10-11
10-10
10-9
10-8
10-7
ga
te d
ela
y (
s)
power dissipation / gate (W)
5.1.2 Advantages of Josephson Switching Devices
AS-Chap. 5 - 9
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
2. Matched superconducting striplines for wiring
3. Junction technology available (Nb based)
for 1 Mio. switching elements
5.1.2 Advantages of Josephson Switching Devices
W: line width tI: insulator thickness tM: magnetic thickness e: dielectric constant
AS-Chap. 5 - 10
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
1. no transistor-like superconducting devices limited gain, fan-out, small parameter spread of Josephson junctions required
5.1.2 Disadvantages of Josephson Switching Devices
AS-Chap. 5 - 12
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
Ic
I
V 2D/e
Igate
Igate Icontr IL
Ic Ls RJ(V) C RL
5.2 The voltage state Josephson logic
• Josephson junction stays in the voltage state after switching latching logic
• to switch back to the zero-voltage state the gate current has to be switched off
AS-Chap. 5 - 13
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
JJ RL
Ib
Ig
Ls C R(V)
5.2 The voltage state Josephson logic
Simplified circuit diagram
AS-Chap. 5 - 14
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
Characteristic Times
5.2.1 Operation Principle and Switching Times
with
AS-Chap. 5 - 15
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
Switching Speed 1. Turn-on delay:
5.2.1 Operation Principle and Switching Times
3. Steering time:
2. Rise time:
AS-Chap. 5 - 16
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
0 20 40 60 t (ps)
0 20 40 60 t (ps)
I gate
+ I co
ntr
I L
tt tr
0
DI
5.2.1 Operation Principle and Switching Times
AS-Chap. 5 - 18
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
5.2.2 Power Dissipation
Ic
I
V Vg = 2D/e
Igate
for Nb-junction technology:
𝑉𝑔 ≃ 3 mV
𝐼𝑐 ≥ 1 mA @ 4.2 K to avoid thermally activated processes
with 𝑉𝑔 ≃ 𝐼𝑐𝑅N and 𝐼𝑐 ≥ 1 mA ⇒ 𝑅N ≤ 3 Ω
𝑅sg ∼ 10 ⋅ 𝑅N ⇒ 𝑅sg ≤ 30 Ω
⇒ 𝑃diss ≤ 3 × 10−7 Watt ⇒ 𝐸 = 𝑃diss ⋅ 𝜏 ≤ 3 × 10−18 J
AS-Chap. 5 - 19
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
5.2.2 Power Dissipation
comparison to semiconductor technology
AS-Chap. 5 - 20
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3) 1. latching nature of Josephson junction based switch requires to
switch off the bias current
2. global clock system required
3. ac power source Josephson junctions biased with ac current source Shapiro steps
4. switching back into the zero voltage state takes long time problem to recapture the phase in local minimum running state may occur, if we switch on the bias current after a too short time punchthrough effect
5.2.3 Global Clock, Punchthrough
AS-Chap. 5 - 21
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
5.2.4 Josephson Logic Gates
general requirements:
• high fan out: a single switching gate should be capable of triggering N
consecutive gates
• large operating margins for stable operation and large tolerable parameters
spread
• small size allowing for very large scale integration (VLSI)
• short switching time allowing for high clock frequency
• low power dissipation allowing for high integration density
• sufficient input -- output isolation allowing for directionality of logic signals
AS-Chap. 5 - 22
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
magnetically coupled gate
directly/galvanically coupled gate:
Icontr Igate
Icontr Igate
2Ic
Igate
S
R
Ism(Icontr)
Icontr
Ic Ic
Ic Ic
2Ic
Igate
S
R
Ism(Icontr)
Icontr
0
0
Ism
Ism
5.2.4 Josephson Logic Gates
AS-Chap. 5 - 23
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
Icontr
Ic 2Ic Ic
Rd Rd
Igate
RL
Icontr 0
S
R
(a) (b) Is
m
Igate
A
B
3-Junction Interferometer Logic (JIL) Gate
5.2.4 Josephson Logic Gates
AS-Chap. 5 - 25
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
IA
Ic 3Ic
Rd
3L
RL
IA 0
S
R
(a) (b) IB
Igate
A
B
L
IB
Igate
Current Injection Device (CID)
5.2.4 Josephson Logic Gates
AS-Chap. 5 - 27
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
Icontr J2
RL
Icontr 0
S
R
(a) (b)
Ic1
Igate
Igate
J1
Ism
Ic1+Ic2
Ic1-Ic2
Ioff
Josephson Atto Weber Switch (JAWS)
5.2.4 Josephson Logic Gates
AS-Chap. 5 - 29
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
Icontr
RL
Icontr 0
S
R
(a) (b) Igate
Igate
Ism
Ic1+Ic2
Ic1
Directly Coupled Logic (DCL) Gate
5.2.4 Josephson Logic Gates
AS-Chap. 5 - 31
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
Icontr
RL
(a) (b) Igate
R3
RBP
Icontr J2
R4 RL J1
Igate
J3
R3
Resistor Coupled Josephson Logic (RCJL) Gate
5.2.4 Josephson Logic Gates
AS-Chap. 5 - 33
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
Icontr
RL
Icontr 0
S
R
(a) (b) Igate
Igate
Ism
Ri
Rp
J1
A
B
J2
J3
J4
4-Junction Logic (4JL) Gate
5.2.4 Josephson Logic Gates
AS-Chap. 5 - 35
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
5.2.4 Josephson Logic Gates
AS-Chap. 5 - 36
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3) Types:
NDRO: Non-Destructive Read-Out DRO: Destructive Read-Out Speed: ≈ CPU speed
5.2.5 Memory Cells
AS-Chap. 5 - 37
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
Igate
write write
L/2 L/2
read J3
J1 J2
NDRO
5.2.5 Memory Cells
“0” no flux in the loop no circulating current junction J3 is in zero voltage state: 𝑽 𝑱𝟑 = 𝟎 “1” a single or several flux quanta in the loop finite circulating current junction J3 is in voltage state: 𝑽 𝑱𝟑 ≠ 𝟎
bias current of J3 is below its zero field critical current
AS-Chap. 5 - 38
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
Icontr 0
Ism
``0” ``1”
WR1 WR0
Rea
d
2Ic
J1 J2
control line Icontr
Igate
L
Igate
DRO
5.2.5 Memory Cells
“0” no flux in the loop threshold characteristic 𝐼𝑠
𝑚 𝐼contr is peaked at 𝐼contr = 0
“1” a single or several flux quanta in the loop threshold characteristic 𝐼𝑠
𝑚 𝐼contr is peaked at 𝐼contr ≠ 0 corresponding to a single flux quantum in the SQUID loop
“READ” vary 𝐼gate and 𝐼contr allong the green arrows:
voltage state for “1” and zero voltage state for “0” memory content is destroyed during read-out
AS-Chap. 5 - 40
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
5.2.5 Memory Cells
AS-Chap. 5 - 41
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
MUX shift
Q register
MUX shift
MUX MUX destination controller
source controller
function controller
output controller
A decoder
A memory
cell
B decoder
B memory
cell
A address B address memory I/O
register
I/OC
carry out carry out
data in
function
control
carry in
output
control
destination
control
source
control
ALU
5.2.6 Microprocessors
AS-Chap. 5 - 43
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
ETL-JC1: integrating Josephson element based on niobium into 4LSI chips, it demonstrated the principle of Josephson computer.
Josephson register and arithmetic logic unit.
5.2.6 Microprocessors
AS-Chap. 5 - 44
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
5.2.6 Microprocessors
AS-Chap. 5 - 45
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
5.2.6 Microprocessors
AS-Chap. 5 - 46
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3) specific properties of RSFQ logic
5.3 RSFQ Logic
• nonlatching logic,
• clock frequencies above 100 GHz,
• requirement of overdamped Josephson junctions,
• low power consumption: 𝑃diss ⋅ 𝜏 ≃ 10−18 J per bit.
AS-Chap. 5 - 47
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
S1
S2
S3
Sn
Sout
V(t)
t
S1
S2
Sout
``0”
``1”
T
T
t t´
5.3.2 Information in RSFQ Logic
AS-Chap. 5 - 49
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
Ic
I
V IcRL
Igate
Igate + Icontr
V
t 0 0
0
1 0
Igate Icontr IL
Ic Ls RL
Ic
I
V 2D/e
Igate
Igate + Icontr
0
1
0
5.3 RSFQ Logic
latching voltage state logic
non-latching flux quantum logic
AS-Chap. 5 - 50
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
Ic
I
V IcRL
Igate
Igate + Icontr
V
t 0 0
0
1 0
Igate Icontr IL
Ic Ls RL
Ic
I
V 2D/e
Igate
Igate + Icontr
0
1
0
5.3 RSFQ Logic
latching voltage state logic
non-latching flux quantum logic
AS-Chap. 5 - 51
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
-1.0
-0.5
0.0
0.5
1.0
I(t)
/ I
c
0 10 20 30 40 500.0
0.5
1.0
1.5
2.0
V(t
) / I c
R
t / tc
(a)
(b)
5.3.1 Basic Components of RSFQ Circuits
generation of RSFQ pulses
AS-Chap. 5 - 52
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
SFQ pulse generation
pulse duration: 𝚽𝟎/𝟐𝑰𝒄𝑹𝑵 ≃ 1 ps for 𝐼𝑐𝑅𝑁 = 1 mV
5.3.1 Basic Components of RSFQ Circuits
AS-Chap. 5 - 53
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
Igate
L
SFQ out
J1
J2
ramp in
Icontr
Icontr
0
Ism
t pulse reset
I1
I2
Vout
0 t
Vout
0 Icontr
``0” ``1”
Igate
I1 I2
L2
SFQ out
J2
J1
dc in
Igate
Vout
L1
L3 J3
(a) (c)
(b) (d)
5.3.1 Basic Components of RSFQ Circuits
dc to SFQ converter
AS-Chap. 5 - 54
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3) Igate,1
J1 J2 J3
Igate,2 Igate,3
L1 L2 L3 A B
J1
L1 A
J2
L2
J3
L3
B
C
Igate,1
Igate,2
Igate,3
J2
Igate
B J1
L2 A
L1
Josephson transmission line
buffer stage pulse splitter
5.3.1 Basic Components of RSFQ Circuits
AS-Chap. 5 - 56
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
J1 J2
Igate
L
F LS
LR
JS
JR
S
R
LF
0 1
Icirc
Ism
IS
``0” ``1”
Igate
IR
(a) (b)
RS flip-flop or DRO register
5.3.1 Basic Components of RSFQ Circuits
AS-Chap. 5 - 57
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
J1 J2
Igate,2 L
C LS
LR
JS
JR T L3
0 1
Icirc
OR gate A
B
Igate,1
J1 J2
Igate,A L
LS
LR
JS
JR T
0 1
Icirc
J1 J2
Igate,B L
LS
LR
JS
JR T L3
0 1
Icirc
B
A L3
JA
JB
JA
JB
JC
C
Igate,C
AND gate
5.3.3 Basic Logic Gates
AS-Chap. 5 - 58
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
J1 J2
Igate
L
out
LS
LR
JS
JR
in
T
0 1
Icirc
J3
NOT gate
5.3.3 Basic Logic Gates
AS-Chap. 5 - 59
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
Igate
0 1
Icirc
Igate
0 1
Icirc
Igate
0 1
Icirc
Igate
0 1
Icirc
Igate
T
out in
shift register
5.3.3 Basic Logic Gates
AS-Chap. 5 - 60
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
simulation: maximum delay about 6𝜋𝜏𝑅𝐿
overdamped Josephson junctions:
5.3.5 Maximum Speed of RSFQ Logic
3 µm technology: 2𝜋𝜏𝑅𝐿 ≃ 3 ps
AS-Chap. 5 - 61
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
but: power dissipation mainly determined by dissipation in biasing resistors: ≈ 1µW/gate
5.3.6 Power Dissipation
with 𝐼𝑐 ≃ 100 𝜇𝐴 and ∫ 𝑉𝑑𝑡 = Φ0
AS-Chap. 5 - 62
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
Applications of RSFQ
5.3.7 Prospects of RSFQ
AS-Chap. 5 - 63
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
5.3.7 Prospects of RSFQ
AS-Chap. 5 - 64
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
Pseudo random bit generator, operated up to 17 GHz
5.3.7 Prospects of RSFQ
AS-Chap. 5 - 66
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
________________________
Stony Brook ____________________________________________
PetaFLOPS Scale Computing:
Speed and Power Scales (Year 2006)
Semiconductors (CMOS)
Performance: > 100K chips @
<10 GFLOPS each
Power: >150 W per chip
total >15 MW
Footprint: >30x30 m2
Latency >3 ms
Superconductors (RSFQ)
Performance: 4K processors @
256 GFLOPS each
Power: 0.05 W per PE node
total 250 W @ 5 K
(100 kW @ 300 K)
Footprint: 1x1 m2
Latency 20 ns
K. K. Likharev, SUNY Stony Brook
5.3.7 Prospects of RSFQ
AS-Chap. 5 - 67
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
K. K. Likharev, SUNY Stony Brook
5.3.8 Fabrication Technology
AS-Chap. 5 - 68
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
1 THz
HTS RSFQ (??)
100 GHz 30M JJ
3M JJ 0.4 mm
300K JJ 0.8 mm
10K JJ 1.5 mm
3.5 mm
10 GHz 0.05 mm
0.07 mm
0.10 mm
0.12 mm
0.14 mm
0.20 mm
1 GHz
"no known solutions"
optical lithography
100 MHz
1995 1998 2001 2004 2007 2010
Year
RSFQ ROADMAP (VLSI circuit clock frequency)
RSFQ (Stony Brook Forecast)
CMOS (SIA Forecast 1997)
LTS RSFQ
5.3.9 RSFQ Roadmap
________________________
Stony Brook ____________________________________________
AS-Chap. 5 - 70
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
x(t)
0
x (tk)
t 0
1
2
3
4
5
6
T tk
ym
5.4 Analog-to-Digital Converters
step 1: transform the time-continuous signal 𝑥 𝑡 into a time-discrete signal 𝑥𝑘 = 𝑥 𝑡𝑘 : 𝑡𝑘 are the points in time at which the signal is sampled, usually one writes 𝑡𝑘 = 𝑘 ⋅ 𝑇, with 𝑘 an integer and 𝑇 the sampling period
ADC – principle of operation
step 2: transform the real number 𝑥 into a set of discrete numbers 𝑦𝑚, which most conveniently are represented by a set of integer numbers 𝑦𝑚 = 𝑚, smallest step in the quantization process: least significant bit (LSB)
ADC converts an analog signal 𝑥 𝑡 into a digital signal 𝑚, 𝑘 , 𝑚, 𝑘 = integer numbers
AS-Chap. 5 - 71
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
superconducting ADCs are based on the principle of flux quantization in a closed superconducting loop and the fast switching of Josephson junctions
5.4 Analog-to-Digital Converters
• practical devices: the input signal S to be measured (e.g. a current or voltage) is converted into a magnetic flux Φ (cf. SQUID sensors)
• corresponding circuit has to determine the integer 𝑚 satisfying the relation
𝑚 − 1 Φ0 ≤ Φ ≤ 𝑚 Φ0 the flux generated by the input signal S is determined within an accuracy of Φ0/2
• important fact: the quantization process relies on a fundamental physical constant and therefore has an inherent precision not known for semiconductor devices
• there exist various ways to determine the number 𝑚 and hence types of ADCs.
AS-Chap. 5 - 72
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
superconductor technology exhibits a set of characteristics uniquely suitable for the implementation of ADC:
• high switching speed of JJs providing a very short aperture
time 𝜏𝑎 and hence a very high speed and resolution for ADCs
• low power consumption
• natural quantization
• quantum accuracy
• high sensitivity
• low noise
5.4 Analog-to-Digital Converters
AS-Chap. 5 - 73
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
5.4.1 Foundations of ADCs
resolution
• both the range of the input signal 𝑥 and the number of output values 𝑦𝑚 is limited
• the number of output values is usually given as a power of 2:
- n-bit ADC integer numbers range from 0 to 2𝑛 − 1
- representation of any integer number in this range:
𝑥 = 𝑥020 + 𝑥121 + 𝑥222 + ⋯ + 𝑥𝑛−12𝑛−1 with 𝑥0, 𝑥1, 𝑥2, … , 𝑥𝑛−1 = 0 or 1
• scale and offset the input signal in the analog domain so that x′ = 𝑎𝑥 + 𝑏
AS-Chap. 5 - 74
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
0 1 2 3 4 5 6 7 0
1
2
3
4
5
6
7
analog input
dig
ital
ou
tpu
t, e
rro
r
x
xmin
xmax
0
2n-1
ym
5.4.1 Foundations of ADCs
scaling & offset
resolution
AS-Chap. 5 - 75
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
• example:
voltage measurement with 16 bit ADC (216 = 65536 quantization levels)
full scale measurement range is -10 V to +10 V
ADC voltage resolution is: 10𝑉− −10𝑉
65536=
20𝑉
65536= 0.305 mV
5.4.1 Foundations of ADCs
resolution
• effective number of bit (ENOB):
analog signal has limited signal-to-noise ratio (SNR)
it is impossible to resolve the signal beyond a certain number of bits
required SNR per bit:
20 log10 2 = 6.02 dB (16 bit ADC: SNR = 96.32 dB)
AS-Chap. 5 - 76
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
5.4.1 Foundations of ADCs
accuracy
• the magnitude of the quantization error at the sampling instant is between zero and ½ LSB
• the instances 𝑡𝑖 of the sampling process are determined by the sampling period 𝑇 if the original signal >> LSB, the quantization error is not correlated with the signal, and has a uniform distribution then, the quantization error can be treated as white noise its root mean square (rms) value is the standard deviation of this distribution
AS-Chap. 5 - 77
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
5.4.1 Foundations of ADCs
accuracy
• detailed calculation of 𝜖rms
quantization noise 𝜖 𝑛 is treated as a random variable in interval
−𝑞
2, +
𝑞
2,
it has the probability density 𝑝𝜖 𝑥 = 1/𝑞 for 𝑥 ≤ 𝑞/2 and 𝑝𝜖 𝑥 = 0 for 𝑥 > 𝑞/2 (in our case: 𝑞 = 1)
thus, the probability that a given round-off error 𝜖 𝑛 lies in the interval 𝑥1, 𝑥2 is given by
variance of the random variable 𝜖 𝑛 , which is treated as a random
variable in interval −𝑞
2, +
𝑞
2
AS-Chap. 5 - 78
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
5.4.1 Foundations of ADCs
dynamic range of ADCs
• for n-bit ADC the peak-to-peak amplitude is 𝐴𝑝𝑝 = 2𝑛 − 1
• for a sinusoidal input signal, then the rms value of its amplitude is given by
𝐴rms = 𝐴𝑝𝑝/2 2
• the dynamic range (DR) of an ADC is defined as 𝐴rms/𝜖rms using the approximation 2𝑛 − 1 ≃ 2𝑛 (valid for large 𝑛), we obtain for a 𝑛-bit ADC
(98.1 dB for a 16-bit ADC)
AS-Chap. 5 - 79
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
Claude Elwood Shannon Harry Nyquist
5.4.1 Foundations of ADCs
sampling rate
• Shannon-Nyquist sampling theorem: The successful reproduction of a band-limited signal 𝑥 𝑡 is only possible if the sampling rate is higher than twice the highest frequency of the signal: 𝑓𝑠𝑎𝑚 ≥ 2𝑓𝑚𝑎𝑥
AS-Chap. 5 - 80
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
5.4.1 Foundations of ADCs
sampling rate & sampling theorem
What happens if we increase the signal frequency 𝑓𝑆 above half of the sampling frequency 𝑓sam/2 (same sampling frequency 𝑓sam in all subfigures): for 𝑓𝑆 > 𝑓sam/2, we have a second possible signal (dashed lines), which has exactly the same sampling points
no unique result of the sampling process
𝒇𝑺 = 𝒇𝒔𝒂𝒎/𝟐
𝒇𝑺 > 𝒇𝒔𝒂𝒎/𝟐
𝒇𝑺 < 𝒇𝒔𝒂𝒎/𝟐
AS-Chap. 5 - 81
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
5.4.1 Foundations of ADCs
sampling rate & sampling theorem
• mathematical description of the sampling theorem:
the sampling of a signal 𝑆(𝑡) can be described by the multiplication of 𝑆(𝑡) with periodic array 𝐶 Δ𝑡 of Dirac 𝛿-functions (Dirac comb) yielding the sampled signal 𝑆sam
mathematically this corresponds to a convolution using the convolution theorem we obtain
𝑭𝑻 𝑺𝐬𝐚𝐦 𝝎 = 𝑭𝑻 𝑺 ⋅ 𝑭𝑻 𝑪 𝚫𝒕 𝝎
here, the Fourier transform 𝐹𝑇 𝑆sam (𝜔) = 𝐹𝑇 𝑆sam 𝜔 +2𝜋
Δ𝑡 is
periodic with angular frequency 𝜔sam = 2𝜋/Δt, where Δ𝑡 is the distance between two sampling instances
if 𝑓sam =1
Δ𝑡< 2𝑓S,max (𝑓S,max = maximum signal frequency), lower and
higher frequencies are superimposed in frequency space and can no longer be separated
AS-Chap. 5 - 82
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
5.4.1 Foundations of ADCs
sampling rate & sampling theorem
X(f) (top blue) and XA(f) (bottom blue) are continuous Fourier transforms of two different functions, S(t) and SA(t) (not shown). When the functions are sampled at rate fsam, the images (green) are added to the original transforms (blue) when one examines the discrete-time Fourier transforms (DTFT) of the sequences. In this example, the DTFTs are identical, which means the sampled sequences are identical, even though the original continuous pre-sampled functions are not. If these were audio signals, S(t) and SA(t) might not sound the same. But their samples (taken at rate fsam) are identical and would lead to identical reproduced sounds; thus SA(t) is an alias of S(t) at this sample rate. In this example (of a bandlimited function), such aliasing can be prevented by increasing fsam such that the green images in the top figure do not overlap the blue portion.
−𝑓sam
−𝑓sam
+𝑓sam
+𝑓sam
−𝐵 − 𝑓sam + 𝐵 +𝑓sam − 𝐵 + 𝐵
𝑋(𝑓)
𝑋𝐴(𝑓)
𝑓
𝑓
AS-Chap. 5 - 83
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
0 1 2 3
-1
0
1
S
t
5.4.1 Foundations of ADCs
𝑡𝐴
sampling rate & aperture time
• sampling process takes a finite amount of time given by the so-called aperture time 𝑡a
• the sampling frequency 𝑓sam must smaller than 1/𝑡𝑎
AS-Chap. 5 - 84
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
5.4.1 Foundations of ADCs
sampling rate & signal frequency/bit resolution
• the input signal is not allowed to changes by more than 1 LSB during 𝑡a (otherwise the error in the conversion process would exceed the resolution of the ADC)
upper limit of the ADC frequency bandwidth
• for a harmonic signal 𝑆 = sin 2𝜋𝑓𝑡 with frequency 𝑓 and amplitude 1, the
maximum slew rate is 𝑑𝑆
𝑑𝑡= 2𝜋𝑓 cos 2𝜋𝑓𝑡 = 2𝜋𝑓
time to slew by one LSB is 𝜏 = 2
(2𝑛−1) 2𝜋𝑓 (peak-to-peak amplitude is 2)
since 𝜏 ≥ 𝑡𝑎 to keep error smaller than ±LSB
𝒇 ≤𝟏
(𝟐𝒏−𝟏) 𝝅
𝟏
𝒕𝒂= 𝒇𝑩 (𝑓𝐵 is input bandwidth of ADC)
2𝑛𝑓𝐵 ≃ 1/𝑡𝑎 : the aperture time is limiting the performance of the ADC
(to increase the bit resolution, we have to reduce the bandwidth and vice versa)
• if a signal is sampled at 2𝑓𝐵, we say that it is sampled at the Nyquist rate 𝑓sam = 2𝑓𝑁 = 2𝑓𝐵
AS-Chap. 5 - 85
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
Output size (bits)
Input frequency
1 Hz 44.1 kHz 192 kHz 1 MHz 10 MHz 100 MHz 1 GHz
8 1,243 µs 28.2 ns 6.48 ns 1.24 ns 124 ps 12.4 ps 1.24 ps
10 311 µs 7.05 ns 1.62 ns 311 ps 31.1 ps 3.11 ps 0.31 ps
12 77.7 µs 1.76 ns 405 ps 77.7 ps 7.77 ps 0.78 ps 0.08 ps
14 19.4 µs 441 ps 101 ps 19.4 ps 1.94 ps 0.19 ps 0.02 ps
16 4.86 µs 110 ps 25.3 ps 4.86 ps 0.49 ps 0.05 ps –
18 1.21 µs 27.5 ps 6.32 ps 1.21 ps 0.12 ps – –
20 304 ns 6.88 ps 1.58 ps 0.16 ps – – –
24 19.0 ns 0.43 ps 0.10 ps – – – –
32 74.1 ps – – – – – –
5.4.1 Foundations of ADCs
sampling rate & signal frequency/bit resolution
𝒕𝒂 =𝟏
(𝟐𝒏−𝟏) 𝝅
𝟏
𝒇𝑩
AS-Chap. 5 - 86
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
5.4.1 Foundations of ADCs
aliasing
• if the input signal is changing much faster than the sampling rate, spurious signals called aliases will be produced at the output of the DAC
• the frequency of the aliased signal is the difference between the signal frequency and the sampling rate
• to avoid aliasing, the input to an ADC must be low-pass filtered to remove frequencies above half the sampling rate. This filter is called an anti-aliasing filter.
sampling instances
time / period of the signal
sign
al
AS-Chap. 5 - 87
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
• advantages:
− significant reduction of the requirement for the anti-alias filter leading to a significant cost reduction
− reduction of quantization noise within the input bandwidth
reduction of a factor 𝑂𝑆𝑅 improvement of dynamic range by 10 log OSR (dB)
− use one-bit ADC and heavy oversampling (penalty: complexity of the digital part and processing speed)
5.4.1 Foundations of ADCs
oversampling
• the term oversampling is used, if the sampling rate is larger than the Nyquist rate 𝑓𝑁
• the oversampling rate is defined as: 𝐎𝐒𝐑 = 𝒇𝒔𝒂𝒎/𝟐𝒇𝑵
example: if an audio signal of 20 kHz bandwidth is sampled at a rate of 160 kHz (2𝑓𝑁 = 2𝑓𝐵 = 40 kHz) , i.e. an OSR of four
AS-Chap. 5 - 88
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
out Sref
Sin JQ
Isens
L
Icirc
Sin Vout
JQ
L
Icirc
Sin Vout
JS
L Sin
Vout
JQ
RL
RB
semiconductor comparator superconducting one-junction SQUID comparator
Superconducting quasi-one-junction SQUID comparator (QOS)
superconducting voltage to frequency quantizer
5.4.2 The Comparator
AS-Chap. 5 - 89
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
Igate
L/2
Icirc
Sin
OUT-
JQ2 JQ1
OUT+
L/2
Ism
0 Iin
- Igate
+ - + - + - + - +
5.4.2 The Comparator
incremental quantizer
threshold characteristic
if the analog signal increases or decreases, the threshold characteristic is crossed in the one or the other direction to a different flux state
flux quanta enter or leave the superconducting loop via the quantizer Josephson junctions 𝐽𝑄+ and 𝐽𝑄− resulting in SFQ voltage pulses at the
outputs OUT+ and OUT-, respectively
AS-Chap. 5 - 90
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
5.4.3 Aperture Time
• minimum aperture time given by switching time of Josephson junctions 𝑡𝑎 ∼ 2 𝑝𝑠
• achievable performance of ADC: 𝒇𝑩 ≤𝟏
(𝟐𝒏−𝟏) 𝝅
𝟏
𝒕𝒂
bandwidth of more than 1 MHz for a 16 bit ADC
• fast switching speed of Josephson junctions cannot be fully used due to several technical hurdles: – junctions are embedded into complex circuits the actual switching
speed of the junction may be larger due to parasitic capacitances and inductances
– the SFQ pulses do not arrive exactly at the intended moment
AS-Chap. 5 - 91
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
5.4.4 Different Types of ADCs
two main categories: 1. Nyquist-sampling ADCs (e.g. flash converters)
an ideal Nyquist ADC samples a bandwidth-limited signal at a sampling rate 𝑓sam = 2𝑓𝑁 and provides an accurate digital representation of that signal
composed of a large number of separate quantizers (single-bit comparators), each defining a single quantization level performance limited by the precision of the quantization levels
2. Oversampling ADCs (e.g. delta-sigma converters)
signal is sampled at a frequency 𝑓sam ≫ 2𝑓𝑁 using a single quantizer
feedback techniques and digital filtering have to be used to decrease the quantization noise and enhance the effective dynamic range
AS-Chap. 5 - 92
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
offset
input Comparator clock
offset
input Comparator clock
offset
input Comparator clock
offset
input Comparator clock
offset
input Comparator clock
R
R
R
R
R
R
2R
2R
2R
2R
2R
S/2
S/4
S/8
S/16
S/32
offset
clock analog signal S
D0 (MSB)
D1
D2
D3
D4 (LSB)
5.4.4 Different Types of ADCs
Flash ADC
most significant bit
least significant bit
R/2R resistor ladder signal division
AS-Chap. 5 - 93
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
time
anal
og
sign
al
VCO f = V/F0
ga
te
counter
gate
co
ntr
ol
analog input
digital output
VC
O
ou
tpu
t
gate
co
ntr
ol
pu
lse
s to
co
un
ter
time
time
time
pass
block
T t
5.4.4 Different Types of ADCs
Counting Coverters
AS-Chap. 5 - 94
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
5.4.4 Different Types of ADCs
Delta-Sigma Converters
AS-Chap. 5 - 95
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
the evolution of 𝑛𝑟 = − 𝑆𝑁𝑅 + 10 log10 𝐵𝑊 for semiconductor based delta-sigma modulators (DSM) and Nyquist ADCs over time
5.5 Prospects of Superconducting ADCs
AS-Chap. 5 - 96
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
5.5 Prospects of Superconducting ADCs
Performance of superconductor lowpass ADCs compared to semiconductor state-of-the-art ADCs (A. Gupta, in Microwave Symposium Digest (MTT), 2011 IEEE MTT-S International)
AS-Chap. 5 - 98
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
5.5 Prospects of Superconducting ADCs
15-bit ADC chip
AS-Chap. 5 - 99
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
5.5 Prospects of Superconducting ADCs
superconducting sigma-delta ADC
AS-Chap. 5 - 100
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
A 1998 HYPRES superconductor transient digitizer: (a) Block diagram. (b) A superconductor chip with two transient digitizers based on a 6-bit flash ADC and a 32-bit-deep memory. (c) A fast pulse capture: 4 ns for 8 GS/s (top) and 2 ns for 16 GS/s (bottom).
5.5 Prospects of Superconducting ADCs
AS-Chap. 5 - 101
R. G
ross
, A. M
arx
and
F.
De
pp
e ©
Wal
the
r-M
eiß
ne
r-In
stit
ut
(20
01
- 2
01
3)
A 2007 HYPRES second-order band-pass sigma-delta ADC. (a) Schematics of ADC modulators with implicit and explicit feedback loops. (b) X-band ADC chip consisting of second-order band-pass ADC modulator centered for 7.4 GHz and digital signal processor.
5.5 Prospects of Superconducting ADCs