Certificate of non-use for examining part - littelfuse.com/media/files/littelfuse/technical resources... · Certificate of non-use of The Controlled Substances ... nor such use, for

Littelfuse, Inc.

Certificate of non-use of The Controlled Substances

Company name Littelfuse, Inc

Product Covered Thyristor TO-92 Package EV series (Wire-Bonded)

Issue Date March 4, 2013

It is hereby certified by Littelfuse, Inc., that there is neither RoHS (EU Directive

2011/65/EU)-restricted substance, nor such use, for materials to be used for unit parts, for

packing/packaging materials, and for additives and the like in the manufacturing processes.

It is also certified by Littelfuse, Inc., that the products listed in this report do not contain Halogens

and their compounds judged per widely accepted industrial guidelines.

In addition, it is hereby reported to you that the parts and sub-materials, the materials to be used

for unit parts, the packing/packaging materials, and the additives and the like in the manufacturing

processes, are all composed of the following components.

Issued by

< Global EHS Engineer>

(1) Parts, sub-materials and unit parts

This document covers Thyristor TO-92 Package EV series, supplied by Littelfuse, Inc.

Please see table 1 on page 2 for the list of products covered.

＜Materials used＞

Please see table 2 on page 2 and table 3 on page 3 of this document.

(2) The ICP data on all measurable substances

Please see pages 3-39 attached to this document.

Remarks：

1. Pb (lead) contained in passivation glass on die bonding solder (item 3) and

silicon wafer (item 6) to be categorized as exempt in RoHS Annex III 7(a) and

7(c)-I.

Please refer to last page of this report for the extract of the applicable

exemptions of RoHS (EU Directive 2011/65/EU)

Page 1 of 3

Littelfuse, Inc.

Table 1: Littelfuse Part Number covered by this report

Standard (Catalog) Part Number SPECIAL DEVICE P/N

L0103DE MCR100-6 Any Special P/N which has base standard P/N listed in this table.

L0103ME MCR100-8

L0103NE S402ES

L0107DE S4X8ES S887S6X8ESRP

L0107ME S4X8ES1 S890S4X8ES1

L1017NE S4X8ES2 S891S6X8ES1

L0109DE S602ES

L0109ME S6X8ES

L0109NE S6X8ES1

LX803DE S6X8ES2

LX803ME S8X8ES

LX807DE S8X8ES1

LX807ME S8X8ES2

Any Standard Part Number listed here may be followed by suffix for packing options, such as RP or AP.

Table 2: Homogeneous Material Used

# Description Name of Material

Type Pages

1 Lead finish Hot solder dip metal 4-8

2 Molding compound Epoxy resin plastic 9-13

3 Die bonding solder Solder metal 14-21

Pb in this solder is exempted by RoHS Annex III 7(a). Please refer to Annex 7 for the RoHS exemption.

4 Die bonding wire Gold metal 22-28

5 Lead frame copper alloy metal 29-32

6 Silicon wafer

silicon metal 33-39

Pb is from in passivation glass on wafer and is exempted by RoHS Annex III 7(c)-I.

Please refer to Annex 7 for the RoHS exemption.

aluminum metal

glass glass

Page 2 of 3

Littelfuse, Inc.

Table 3: RoHS-regulated substance in raw materials

Components Analysis Result

Cd Cadmium

Cr Chromium

Hg Mercury

Pb Lead

PBB PBDE Total

Halogens

As Component Total

(Typical Values) < 2ppm < 2ppm < 2ppm <5 ppm*

1 < 5 ppm < 5 ppm <100ppm

Outside lead finish (Hot-Tin dipping)

See pages for the detail.

< 2ppm < 2ppm < 2ppm 49ppm*2

< 5ppm < 5ppm ---

Epoxy Resin compound (Mixture of resin, filler and fire retardant)


< 0.5ppm < 1ppm < 2ppm < 5ppm < 5ppm < 5ppm 126 ppm

Die Bonding Solder


< 2ppm < 2ppm < 2ppm 88wt%*3

< 5ppm < 5ppm ---

Die-bonding Wire (Au wire)


< 0.5ppm < 1ppm < 2ppm < 5ppm < 5ppm < 5ppm ---

Lead frame (Copper Alloy, KFC )


< 2ppm < 2ppm < 2ppm < 2ppm --- --- ---

Silicon Die (Silicon + Metal electrode + passivation glass)


< 2ppm < 2ppm < 2ppm 2.3% *4

< 5ppm < 5ppm < 50ppm

*1 Less than 5ppm Pb content overall, excluding Pb from passivation glass on the silicon die.

*2 Pb (lead) contained in outside finish is not exempted from restriction by RoHS, but considered as process

contamination. Littelfuse does not add Pb (lead) intentionally.

*3 Pb (lead) contained in die-bonding solder is exempted from restriction by RoHS Annex III 7(a).

*4 Pb (lead) contained in Silicon wafer is from passivation glass and is exempted from restriction by RoHS Annex III 7(c)-I.

Please refer to page 40 of this report for the applicable exemptions of RoHS (EU Directive EU Directive 2011/65/EU)

Page 3 of 3

sc$Test Report No. rseorTo, xcccoRponmot4leoutu

iE46 Yongam-nBongdong€ubWanju-gunJEONEUK

The iollowing merchandise was submitted

SGS Filo o.

Timolhy JeonJinhee KimCindy ParkJerry Jung/ T*ting Peraon

YAAl3-06857

nd identified by the cli€ntas:

lssued Date: 2013.02 15 Page I of5

. AYAA1&06

: 2 0 1 3 . 0 2 . 0 6

| 2013. 02.07 to 2013.02. 15

, please refer to following page(s)

: SGS Korca lhe sample(s) selecled by applic€nlwith following rcsulls

SGS Korea Co., Ltd.

-? il) -r--let-.J*6

Jetr Jang / Chemical Lab Mg.

_sGsTest Report

S.nple De3c.iption

[at€ri.13

No. resororfl-rcr. AYAA1 3-0685

: KTt\4C-1050c

iaYAAl3{0E57 lssued Date: 2013.02.15 Pa9e2of5

.001

J

Unlt I/|DL

Cadmium (Cd) m9KS lMlh €ierence to lEc 62321 :2008. lcP 0.5 N.O.

m9KS \Mih €fe€ne to lEc 62321:2008.lcP 5 N.D,Mercury (Hs) m9KS \\llth €ference to lEc 6232112008. lcP 2 N O .

Hexavalent Chrcmium (q Vl) mgKs $Ilh refe€n@ lo IEC 62321 :2008, UV-VIS N.O

FLm. R.t .danb+BB3/PBDES

u t MDL

m0/k0 wrh €ierence to lEc 62321:2008. Gc-|,1s 5 N.D.

Wrth refeen@ to IEC 62321:2008 GCMS 5 N.D.

lllth €feen@ ro lEc 62321 :2008, GC,MS 5 N.D.

Wth €feEn@ to IEC 62321:2008, GC-MS 5 N.O.

Wlh reference lo IEC 62321 :2008, GC-MS 5 N.D.

lMrh .eie€ne to lEc 62321 :2008, GC-MS 5 N D

Wlh reierenc€ to rEc 62321 :2008. GC-MS 5 N.D.

EC 62321:2008.GC-tMS 5 N.O.

EC 62321:2008, GC MS 5 N.O

EC 62321:2008. GC MS 5 N,D.

Monobromodiphenyl ether EC 62321:2008, GC-MS 5 N,D

Wrth referene to IEC 6232112008. GC-MS 5 N.D

wth referen@ ro lEc 62321 :2008, Gc Ms 5 N.O

TelEbomodiphenyl ether wih.efeEnc€ lo rEc 62321:2008, Gc-Ms 5 N D .

Penlabromodiphenyr elhe. wth reierenc€ to lEc 62321:2008 GC-MS 5 N.D.

Hexabrcmodipheny' eiher wth €fe€nce to IEC 62321 :2008, Gc-Ms 5 N.D

Heptabromodipherryl elher wth reie€nc€ to lEc 02321 :2008. Gc Ms 5 N.D.

Oclabrcmodiphenyl eiher wth reierence to lEc 62321:2008. GC-MS 5 N.D,

Nonabromodipherryl ether wiih €le€n@ lo lEc 62321 :2008, Gc-Ms 5 N.O

Deebomodiphenyl ether wlh reierenc€ to lEc 62321:2008 GC-MS N.D.

(1)N.D. = Not detecled.(<MDL)(2) mg/kg = PPm(3) MDL = lvlethod Creteclion Limi{4)- = No regulaiion(5) Negative = undeteclable / Por(6) t'= Qualitative analysis (No L(7) ' = Boiling_water-€xt€ctbn i

Negative = Absence of CrVlPositive = Presence of C lsolulion is equalor gr€ater t

)oatng)caling; the detected concentraiion in boiling-waler-€xtlaolonan 0.02 mg/kg with 50 cm2 sample surface area.

t - . .scs (q * co ! d | , . ! : .

-

NOTE

scsTest Report

Sampl6 Doacriplion

El$3tstss

No. rssorov

: KTMC,I

AYAAI3-06857 lssued Date: 2013.02.15 Page3of5

001

)

MDL

Di{2-elhylhexyl) phthalale (DEHP) US EPA 8061A, GC/MS 50 N.D.

Dibutyl phlh€late (OBP) US EPA80614, GC/MS 50 N.D.

Benryl buryl phrhalare (BBP) mqks us EPA 80614 , GC/tVlS 50 N.O.

EEqs.AgtsslllE

il|DL

Hexsbromoctclododecane mdks USEPA 3540C, LC/IMS 5 N.D.

IOTE:(1) N.D. : Not detected.(<MDL)(2) mg&g = ppm(3) MDL = Method Delection Limi(4) _ = No rcgulation(5) Negative = undetectable / Pol(6)" = Qualitalive analysis (No L(7)' = BoilinS-waleFexlraclion:

Negalive : Absence of CrVlPositive = Pres€nce ofC lsolution is equalor grealer t

nlJ

:oatrng)oatingt lhe delected concentration in bollrng-water-exiractonan 0.02 mg/kg with 50 cm2 sample surface area.

NOT

YAAt3{6857 lssued Daler 2013.02. 15 Page 4 of 5

Picture ol Sample as Rec€ived:

NOTE:(1) N.D. = Not detected.(<MDL)(2) mgftg = ppm(3) llDL = Method Deteclion Lim(4) - = No regulation

{6) " = Oualilalive analysis (No(7)' = Boiling-waterextradion:

Negative = Absence of CrVlPositive = Pr€sence olC l

(5) Negative = Undeteclable /

ngr the detected concenlration in boiling-water€xtraclion

solution is equalor grcater 0.02 mg/kg wiih 50 c.n2 sample surrace area.

_scsTest Report No. roeor

Cd/Pb/Hg

Total Oigestion

DATA

NOTE:

The samples were dissolved lotallySeciion Chief : Gilsae Yi

(1) N.D. = Not delected.(<MDL)(2) mg/kg = ppm(3) MDL = lvethod oeteclion Li(4)- = No rcgulation(5) Negative = Undeleclable /

soldion is equalor greater

(6)1* = Qualitative analysis (No(7)' = Boiling-water-€xt€clion:

Negative = Absenc€ of CA/lPositive = Prcsence of CrVl

YAAi3-06657 lssued Date: 2013.02 15 Page5of5

Testing Flow for RoHS:CdtPb/Hg/Cf /PBBS&PBDES Testing

PB s/PBDES Cr a .

by pE-conditioning melhod accoding to above flow chadfor

DATA

Cd,Pb,Hg.

nrr)

the detected concentration in boiling-waler-€xt|acnonan 0.02 mg/kg wjlh 50 crn2 sample suriace area.

i*33r.Ilaf#:ffi -"s:--::--'::';;-:;F-rii-a j;:-{.;T:--i*-:*E*-:

"' End "'

SamDle ll€asurement

Nonmetallic liaterial

Adding Extraclion Solution

Filtration and pH AdjGtrnent

Adding 1,s-Diphenylcarbazid€for Color D€vdooment

Adding 1,5-Diphenylcarbazide

for Color Development

A R€d Color lndlcatesthe Pre3ence of CrVl

Test Report No: 10295887(1) Date: 22-Feb-13 Page 1 of 8

Heraeus Materials Singapore Pte Ltd26 Pioneer Crescent #06-11/12 West Park Bizcentral Singapore 628558

The following sample(s) was/were submitted and identified by/on behalf of the client as:

Sample Description :

Sample Receiving Date : 20-Feb-13Testing Period : 20-Feb-13 to 22-Feb-13

Test Requested : In accordance with the RoHS Directive 2011/65/EU Annex II.

Test Result(s) : Please refer to next page(s).

Conclusion : Based on the performed tests on submitted sample(s), the results complywith the RoHS Directive 2011/65/EU Annex II ; recasting 2002/95/EC.

Signed for and on behalf of SGS Testing & Control Services Singapore Pte Ltd

Y.C. ThamLaboratory Manager

SGS Testing & Control Services Singapore Pte Ltd 3 Toh Tuck Link, #01-02/03, Singapore 596228 t +65 6379 0111 f+65 6777 2914 www.sgs.com

Member of SGS Group

PbSn2Ag2.5 Solder Wire

Test Location: 3 Toh Tuck Link, #01-02, Singapore 596228This document is issued by the Company under its General Conditions of Service accessible at www.sgs.com/terms_and_conditions.htm and, for electronic formatdocuments, subject to Terms and Conditions for Electronic Documents at www.sgs.com/terms_e-document.htm. Attention is drawn to the limitation of liability,indemnification and jurisdiction issues defined therein. Any holder of this document is advised that information contained hereon reflects the Company’s findings at the timeof its intervention only and within the limits of Client’s instructions, if any. The Company’s sole responsibility is to its Client and this document does not exonerate parties toa transaction from exercising all their rights and obligations under the transaction documents. Any unauthorized alteration, forgery or falsification of the content orappearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law. Unless otherwise stated the results shown in this test report referonly to the sample(s) tested and such sample(s) are retained for 30 days only. This document cannot be reproduced except in full, without prior approval of the Company.


Test Result(s):


mg/kg n.d. 2 100

mg/kg 953739.3+ 2 1000

mg/kg n.d. 2 1000

--- Negative #(By spot test / boiling water extraction)

mg/kg n.d. - 1000mg/kg n.d. 5 -mg/kg n.d. 5 -mg/kg n.d. 5 -mg/kg n.d. 5 -mg/kg n.d. 5 -mg/kg n.d. 5 -mg/kg n.d. 5 -mg/kg n.d. 5 -mg/kg n.d. 5 -mg/kg n.d. 5 -mg/kg n.d. - 1000mg/kg n.d. 5 -mg/kg n.d. 5 -mg/kg n.d. 5 -mg/kg n.d. 5 -mg/kg n.d. 5 -mg/kg n.d. 5 -mg/kg n.d. 5 -mg/kg n.d. 5 -mg/kg n.d. 5 -mg/kg n.d. 5 -


Member of SGS Group


Test Item(s): Unit Method Results MDL RoHS Limit

Cadmium(Cd) With reference to IEC62321, Ed1:2008. Analysis was performed by ICP/AES

Lead (Pb) With reference to IEC62321, Ed1:2008. Analysis was performed by ICP/AES

Mercury (Hg) With reference to IEC62321, Ed1:2008. Analysis was performed by ICP/AES

Hexavalent Chromium (CrVI) With reference to IEC62321, Ed1:2008 and performed by Spot test / boiling water extraction method. (see Note 9)

Sum of PBBs

With reference to IEC62321, Ed1:2008. Analysis was performed by GC/MS

MonobromobiphenylDibromobiphenylTribromobiphenylTetrabromobiphenylHexabromobiphenylPentabromobiphenylHeptabromobiphenylOctabromobiphenyl

Pentabromodiphenyl ether

NonabromobiphenylDecabromobiphenylSum of PBDEsMonobromodiphenyl ether

0.02 mg/kg

with 50 cm2

surface area

Test Location: 3 Toh Tuck Link, #01-02, Singapore 596228This document is issued by the Company under its General Conditions of Service accessible at www.sgs.com/terms_and_conditions.htm and, for electronic format documents,subject to Terms and Conditions for Electronic Documents at www.sgs.com/terms_e-document.htm. Attention is drawn to the limitation of liability, indemnification andjurisdiction issues defined therein. Any holder of this document is advised that information contained hereon reflects the Company’s findings at the time of its intervention onlyand within the limits of Client’s instructions, if any. The Company’s sole responsibility is to its Client and this document does not exonerate parties to a transaction fromexercising all their rights and obligations under the transaction documents. Any unauthorized alteration, forgery or falsification of the content or appearance of this document isunlawful and offenders may be prosecuted to the fullest extent of the law. Unless otherwise stated the results shown in this test report refer only to the sample(s) tested andsuch sample(s) are retained for 30 days only. This document cannot be reproduced except in full, without prior approval of the Company.

Decabromodiphenyl ether

Hexabromodiphenyl etherHeptabromodiphenyl etherOctabromodiphenyl etherNonabromodiphenyl ether

Dibromodiphenyl etherTribromodiphenyl etherTetrabromodiphenyl ether


Test Result(s):


mg/kg n.d. 50 -

mg/kg n.d. 30 -

DBP (Di-butyl phthalate) mg/kg n.d. 30 -

DEHP (Di-(2-ethylhexyl) phthalate) mg/kg n.d. 30 -

Note: (1) mg/kg = ppm ; 0.1wt% = 1000ppm(2) n.d.= Not Detected(3) MDL = Method Detection Limit(4) “-“ = Not regulated (5) * : Exceeds limit (6) # : Positive means the presence of CrVI on the tested areas. Negative means the absence of CrVI on the tested areas.(7) Spot-test:Negative = Absence of Cr(VI) coating / surface layerPositive = Presence of Cr(VI) coating / surface layerThe tested sample should be further verified by boiling-water-extraction method if the spottest result cannot be confirmed.Boiling-water extraction:Negative = Absence of Cr(VI) coating / surface layerPositive = Presence of Cr(VI) coating / surface layer the detected concentration in boiling-water-extraction solution is equal or greater than 0.02 mg/kg with 50 cm2 sample surface area.(8) Reference information:Directive 2011/65/EU recasting RoHS Directive 2002/95/EC:Hexabromocyclododecane(HBCDD), Benzyl butyl phthalate (BBP), Di-butyl phthalate (DBP), Di-(2-ethylhexyl) phthalate (DEHP )are considered as a priority for risk evaluation and substance restriction.

+Exemption: The received sample is exempted under directive 2011/65/EC Annex III Article 4(1): 7(a)lead in high melting temperature solder type solders (i.e. tin-lead solder alloys containing more than 85% of lead).

Remarks: Sample received was totally dissolved by preconditioning method for test item(s)Pb, Cd & Hg only.Lab Analyst(s): Jay, Jojo and Pheng


Member of SGS Group

With reference to USEPA 3540C & 8270D. Analysis was performed by GC/MS

Test Location: 3 Toh Tuck Link, #01-02, Singapore 596228This document is issued by the Company under its General Conditions of Service accessible at www.sgs.com/terms_and_conditions.htm and, for electronic format documents,subject to Terms and Conditions for Electronic Documents at www.sgs.com/terms_e-document.htm. Attention is drawn to the limitation of liability, indemnification and jurisdictionissues defined therein. Any holder of this document is advised that information contained hereon reflects the Company’s findings at the time of its intervention only and within thelimits of Client’s instructions, if any. The Company’s sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rightsand obligations under the transaction documents. Any unauthorized alteration, forgery or falsification of the content or appearance of this document is unlawful and offenders may beprosecuted to the fullest extent of the law. Unless otherwise stated the results shown in this test report refer only to the sample(s) tested and such sample(s) are retained for 30 daysonly. This document cannot be reproduced except in full, without prior approval of the Company.


With reference to USEPA 3540C & 8270D. Analysis was performed by GC/MS

MDL RoHS Limit

HBCDD (Hexabromocyclododecane) With reference to USEPA 3550C & 8270D. Analysis was performed by GC/MS

Test Item(s): Unit Method Results

BBP (Benzyl butyl phthalate) With reference to USEPA 3540C & 8270D. Analysis was performed by GC/MS


Sample photo: Sample Description :

SGS authenticate the photo on original report only


Member of SGS Group




Cr (Vl)

Remarks: Sample received was totally dissolved by preconditioning method. (CrVl method excluded)


Member of SGS Group

Process Flow of IEC 62321 (Pb, Cd, Hg & Cr6+)


Pb,Cd

Solution

ICP-AES

Acid digestion by suitable acid depended on different sample material

Filtration

Residue

1) Alkali Fusion2) HCl to dissolve

Sample Measurement

Cutting / Preparation

Microwave digestion with HNO3/HCl/HF

Heat to appropriate temperature to extract

Cool, filter digestate through filter

Add diphenyl-carbazide for color development

Measure the absorbance at 540 nm by UV-VIS

Add appropriate amount of digestion reagent

Hg



Member of SGS Group

High Mass Range GC/MS

Data

Process Flow of PBBs and PBDEs by GC/MS (IEC 62321)


First Testing Process → Optional screen process …… Confirmation process ...→

Cutting/Preparation

Sample Pre-treatment

Screening Analysis

Solvent Extraction

Concentrate/Dilute extracted solution

Filter



Member of SGS Group


Cutting/Preparation

Sample Pre-treatment

Solvent Extraction

Concentrate/Dilute extracted solution

Process Flow of HBCDD by GC/MS

Filter

High Mass Range GC/MS

Data



Member of SGS Group

Process Flow of Phthalate Analysis


Cutting/Preparation

Sample Measurement

Soxhlet Extraction

Concentrate and dilute the extracted solvent

Filter

Analyze by high-mass range GC/MS

***End of Report***

Test Report No. regor ovLrcrsryrx r casgsTo, HEEsultc menL co.. Llo.

#693-1Gojan-dongNamdong-gutncneomKorea

The following merchandise was submitted and identified by the client as :

fssued Date: 2011.12.02 Pagel orT

SGS Fllo No.

Product Name

Item No./Pait No.

Recslved Oat6

Tgst Pedod

Test ResultsT€t Pe]fo]med

AYAA1 1-38595

Gold Bonding VMre(4N)

Gold Bonding \Mre(4N)

2011.11.29

2011 . 11 .30 to 2011 .12 .02

For further details, please refer to following page(s)

SGS Korea tested the s€mple(s) selected by applicant with following results.

SGS Korea Co. Ltd.

Timothy JeonJlnhe. KimClndy ParkJerry Jung/T6tlng Po6on

ffi

J#-ITJeffJang / Chemical Lab lilgr

_sG$Test Report No. rogor or llrcrsrvmr r -sosss

sample No. : AYAA1',1-38595 001

lssued Date: 2011.12.02 Page 2 ol T

Sample OescriptionItem No./Part No.lllatedals

: Gold Bonding Wre(4N): Gold Bonding Wre(4N)

T€t ltem. Unlt Te3t Method iIDL

cadmium {cd) wth €ference to lEc 62321:200E, ICP 0 5 N.D.

Lead (Pb) wlh reference to tEc 6232112008, ICP 5 N.D.

Merc!ry (Hg) mg/Kg Wth rcbrence to IEC 62321:2008, lcP 2 N.D.

Hexavalent chromium (crVl) By boiling wth €ierence to lEc 62321:2008 Negaiive

Anlimony {sb) mS/kS Wth refe€nce to EPA3052(SS6), US EPA60108(1996), ICP

1 0 N.D.

Tesl lisms Unit Test Method MOL Results

mg/Ks wth refeEnce to lEc 62321:2008, GC-MS 5 N.D.

DibromobiDhenvl wtn €ference to lEc 62321:2008 Gc-Ms 5 N.D.

wth rcfercnce to lEc 62321 2008, GC-ML N.D,

Terabromobiohenvl mq/ks Wth returence io IEC 62321:2008,GC-MS 5 N.D.

Pentabromobphenyl wth reference to lEc 52321 2008, GC:U! 5 N.D.

mq/kg Wth reference to IEC 62321:2008, Gc-llq 5 N.D.

Heptabromobiphenyl ms/ks Wth retu€nce to IEC 62321:2008 GC'i4q 5 N.D.

Octabromobiphenyl mq/kq Wth refer€nce to IEC 62321:2008, GC-U9 5 N.D.

Nonabromobiphenyl mg/Kg Wih efe€nce to IEC 62321 2008, GC4! 5 N.D.

Dec€bromobiphenyl Wth |ebrence to IEC 62321:200E, GC-lvtS 5 N D .

MonobromodiPh€nYl ether Wlh relerence ro lEc 62321:2008, GC-MS 5 N.D.

DibromodiphenYl ether Wth rcierence to IEC 62321:2008 GGMS 5 N.D.

Tibromodiphenyl ether With €br€nce to IEC 62321 2008 GC-MS 5 N.D,

TelrabromodiphenYl ether wfih hiFEne ro IEC 62321.2008 GC-lvlS N.D.

5 N.D.PentabromodDhenyl ether wth rcne€nce io lEc 62321 20qQi9l!!

Hexabrcmodiphenyl ether \ fih FreEne io IEC 62321:2008, GC-lVlS 5 N.O.5 N.D.

HeotabromodiPhenyl elher wnh rcbrence to lEc 62321 2008 G(-;-Ms

odabrcmodiphenyl eth€r mg/Kg Wlh rcfe€nc€ lo IEC 62321:2008, GC'MS 5 N.D.

NOTE: (1) N.O. = Not detected (<MDL)(2) mg/kg = PPm(3) MDL = Method Detectron L'm'li4)-=Noreoulationisi " = Quat-native anatysis (No Unit)(6) ' = Boiling-water-extraclion:-

Neoative = Ab6ence of CrVl coating;;ffi;= ir;;;;;icirii-Jt-ind; tr'" a"t"a"o concentration In borling-water-extraction

".'f.itio" i"

"qr"roi g*'ter than 0 d2 mg/kg with 50 cm2 sampl€ sudace area

r,g:*g?1H'l'.:,1F:'?Hi;1fi ;aii:tiir;;6i{ -

Test Report No. resor or [r-crsryaar r -$sss lssued Date: 2011.12.02 Page3 of T

Sample No.sample De6criptlonItem No./Parl No.Matedala

AYM11-38595.001Gold Bonding \Mre(4N)Gold Bonding Wre(4N)

Teat ltom3 Unit Test Method MDL

Nonabromod|Dhenvl ether wth refeEnc€ to lEc 62321:2008. GGlq 5 N.D.

Decabrcmodiphenyl ether ms&s vvnh relerencs 10 lEc 62321 :2008, GC-MS 5 N.D.

Unit Test Melhod MDL Results

Bromine(Bd Wth refe€nc€ to ASTM D 7359-08 , IC 30 N.D.

Chlorine(Cl) Wrth €ieGnce lo ASTM D 735M8 , lC 30 N.D.

Wth €Grcnce to ASTM D 7359-08,lC 30 N.D,

lodine0) mg,Kg wdh refercnc€ io ASTM D7359{8, lC 50 N.O.

Te3t ltems Unit Tesl Mothod MDL Results

Tetrabromobisphenol A mg/Kg us EPA 3540C, GC/MS 1 0 N.D.

Teat ltams Unlt T€t ethod MDL Re8ull3

PFOA(Periuorooctanioc acid) us EPA 3540C/3550C, LC/149 N.D

PFOS(PefluorooctaneSutfonates-Acid/Melal savAmide)

mg/kg us EPA 3540C4550C, LC/l\rS 1 N.D.

NOTE: (1) N.D. = Not detecled (<MDL)(2) mgi kg = PPm{3) MDL = Method Deteclion Llmt(4)-=Noregulatlon{5) " = Qualitative analvsis (No Unit)(6)' = Boiling-water-extrac'tion:

Neoative = Absenc€ of C lcoating;;:;i:;;;;; c*ii-"tind"' tn" o"t"a"o concentration in boiling-warer-exl€ction

solution is equalor greater than 0 02 mg/kg with 50 cm2 sample sunace area

ffi =.*g:H:r.g:--t;;;:l:;-;;-;;;;;..

Test Report No. regororrLrcrsrymrr-sssgs fssued D€te: 2011 . 12. 02 Page 4 ol 7

Plcturc of SamDle as Roceived:

NOTE: {1) N.D. = Not detected (<MDL)(2) mgl(g = PPm(3) MDL = Method Detection LIm(4)-=Noregulationi5) " = Qualitative analysi6 (No unit)(6)' = Boiling-wateFextraction:

Neoative = Absenc€ of CrVl coatinq;;:il;= PriiJn. ; crv co;tin;: the detected concentration in boiling-wateFextraclion

Jrtion i" eqrat o, greattr than O d2 mg/kg with 50 cm2 sample surface area'

Test Report No. rsgor ot[rctslYll'l l-sgsgs rssued Date: 2011.12. 02 PagesotT

Testing Flow Chart for RoHS:Cd/Pb/Hg/Cfl /PBBs&PBDEs Testing

Cd/Pb/Hg PBBS/PBDES cr6* Cr 6+

Nonmetallic aterial

Adding Extraction Solution

Heating to 90-95"Cfor Extraction

Filtration and pH Adiustment

Adding 1,5-Dlphenylca.bazidefor Color DeveloDment

UV.Vis

;A

The samples were dissolv€d totally by pr€-conditioning method according to above flow chart for Cd,Pb,Hg'Section Chief : GilsaeY

NOTE: (1) N.D. = Not dotected.(<MDL)(2) mg/kg = PPm(3) MDL = Method Detection Limit(4)-=Noregulation(5) " = Qualitaiive analvsis (No Unit)(6) ' = Boiling-water-extraction:

Negative = Abs€nce of CrVI coatingPo;itive = Presence of CrVl coatnd; the detected concentraton in boiling-water-extractionsolution is equal or greater than 0 02 mgy'kg with 50 cm2 sample surfac€ area'

Hffii#i&*-iEsfi$-qE#efitr|s#**+@Hltr'j.Effi

DA

scs Korc. co Lld I r !:,oFr !a?i:i,

ilechanic_SampleM€chanic_Sample

Sample ileasurement

Clean-up with FlColumn

DATA

ilechanic_Sample

Metallic lrlaterial

Spot Test / BoillngWater Extraction

Adding 1,5-Diphenylcarbazide

for Color Development

A Red color Indicatesthe P.eaence of Cr6+

DATA

Test Report No. regor onrcrsryrar r -sesss fssued Date: 2011 . 12. 02 Paga 6 ol 7

Flow Chart for Halogen Test

NOTE: (1) N.D. = Not detec'ted.(<MDL)(2) mgikg = PPm(3) MDL = Melhod Deteclion Limit(4)-=Noregulation(5) '* = Qualitative analysis (No Unit)(6)' = Boiling-water-extrac.tion:

Negative = Absen6 of CM coatingPositive = Prosence of CrVl coating; the detected concenfation in boiling_water-extractionsolution is equal or greater than 0.02 mg/kg with 50 cm2 sample surlace area.

ffi 5ffi ;* *--gc*':'rc:s;:*'#;-B*f

Sample screening using XRF.

Liquid coniaining water(>8o%)?

Welgh the samples into the combBtion boat

Add ab3orption solution into the bomb or tube.

Admit 02 gas or 02 +Ar2 gas and stad the combugtion.

Allow durlng abgorption of the burnt gag.

Analyze abgorbed solution using lon Chromatography.

Data

Test Report No. regor orllrcrsryrrr r -sasss lssued Dater 2011 . 12. 02 Page 7 of 7

Flow Chart for PFOS/PFOA Test

NOTE: (1) N.D. = Not detec{ed-(<MDl)(2) mg/kg = ppm(3) MDL = Method Deteclion Limit(4)-=Noregulation(5) " = Qualitative analysis (No Unit)(6) ' = Boiling-water-extraclaon:

Negative = Abs€nce of CrVl coatingPo;tive = Presence of CrVl co€tind; the detecled concentmtion in boiling-water_extractionsolution is equal or greater lhan 0 02 mg/kg with 50 cm2 sample surface area'

r n: r$r 6! (ni f {: tr:i {rr:5! !i ,$Jffi!,.r: i, !r \!j!:s!r!!Jat

Sample pr€treatment / Separation

Sample extraction

ConcentraterDllute Extracted solution

Analysis was performed by HPLC/lttS

QA, OC review / Check analysis result

Data

Test Report No.

Client : TSP - T Co.,Ltd.Norutem R€gionT.Banldang, A. ilu

The following sample(s) was^^/ere

Sample DescriptionSample No.Sample ConditionQuantity Submittedlvaterial TypeSize (t x w)Item NameLot No.Country of OriginCounhy of DestinationBuyer's Name

sample Receiving DateTesting Peiod

Test Requested

Test Method

Test Results

Signed for andSGS (Thailand)

on behalf ofLimited

PtaY*Pompana LirathpongHardlines T€6ting Itanagel

rfubLfubhkfub'fdy,Mid!&

SGS {rt]airaidl Lio

^ArIEI-

l/Page I ot,lDate : 23-Jan-2013

I Estate 123 lloo 4,lamphun SlOO0Thailand

ubmitted and identified by/on behalf ofthe client as:

Lead

attached photograph

KOBE MaterialKFC0.381 43.0 mm.FT (FrA-34)81211+03KoleaI nalKEC:

18-J18-J

(1 ) |

Customer

-2013-2013 to 23-Jan-2013

with the RoHS Directive 2011/65/EU Annex ll ; recasting 2002/95/Ec

use method LBTY-08409 with reference toby ICP-OES.

(2) method LBTY-08409 with reference toum content Analyzed by ICP-OES.

method LBry-08408 with reference tory content,Analyzed by ICP-OES.

method LBTY-06378 with reference to IEC 62321ent Chromium by Colodess and Colored Chromate

ric Method, Analyzed by UV-MS speckometry.

refer to next page.

M'tuh.e;M*tu tt i#

IEC 62321 Ed1:2008for Lead

|EC62321 Ed1i2008for

1EC62321 Ed.1:2008 for(3)

(4) Ed.1:2008forCoating on MetalJ

' M , 4 i " h - d d f t c @

Le.lsvssvicr. 1113 gi nana lll5g n|tb Inod Onng tr.o Ya.nam &t|!r0r10120I r€6l()n6a(E41 2S174ES$ I +66l0l214 816830756 xMldr.cdn

SGSI

Test Report No. 2394TEST RESULTS

Tesl result€ by chemicalmethod

:23-Jan-2013

.:Ntrttd\t/Page 2 of4

mg/kg)

T€lr lt€m (3): Method Result (1)(Ref€r to)

UDL RoHS Limit

Lead (Pb) ( 1 ) 26 2 '1000

cadmium (cd) (2) 2 100

Mercury (H9) (3) 2 1000

lexavalent Chrom ium {C.Vl) by Spottest / boiling water extraction

(oplional)

(4) 1000

Te€t Part DesciptionResull (1) metal

(a) mgt tg = ppm;01wP/6 = 1000(b) n.d. = Not Detected(c)MDL = Melhod Detection Limi(d) spot-rest

Negative- Absence oi C lcc(Ihe lested sample should be

Boilin g-waler-€xtraction:Negative = Absence of C^/I oPositive = Presence of CfVl c'greater than 0.02 mg/kg with 5

(€) '1" = Not t€sulat€d(0 For corrosion protection costinis unavailable and thus results ofat the time oftesling

SGS llh.ilaidl

ing, Positive = Prcsence of C l coatingidher ver'fied by boiling-water-extraciion method il the spot test result cannot be

tingting;the detected concentration in boilingwater-etaction solution isequalor

i on metals: lnformation on storage condiiions and production dete ol the tested sample(Vl) represent status of lhe sample atthe time of testing represent stalus or the sample

h!;k,r{,htup'!"*E

j I tab.rldr Ssvtsr aU23 Sd Fai. l[ 50 Bdtlt lll to€d C|!isB*s YainaNa &.Col 10lA)Ir {6opm3611 aat186s I r€[email protected]| m3o58 tvivwroxs|'I x-..cb33sarr

Test Report No. Date :23-Jan-2013

.ll\lntn|: .1 - t

-f-

r.or.,.i.r: ar..,.t.rn,. a..il.. Cxt: t.l.r.F. rr.r.n.la, tl....rr. r.r ar...tnar.r.rv t

IEC 62321 : Pb/cd/Hdc'.1PAAr/PBOB TBtine

hl.rl.r rtr...3..nirrr. r.r.rndcr.n, {cr...r. trrntlD!.r..r r. ...x.rr...)

tu tuhrt t tud hy htuN.qbrdb E MdMtutuiff itu.htrs;r, ' 'e..r{r. h6^'0rr*846 tu a^;.

"d L ;@ asd ; @. ffi tu tu Md

Laho6lrysc\rc.. 4lZ3 S.i 8!N lllSg &|t| l! Fo.d Ov'!Bt$6 Ya.ru|o &.eror t0t20r +88(0p6f!05t1 294 ?a 05.$ I rao (012 294 7181 E83 0t 58 M.ss'om

,dd.'g r "rdlrur/€,b.rd.

F.

SGSTest ReDort No.

SAT'PLE'ATTACHMENT

tu&o.dLrandr6.copydt/E bBad-,fubrfu.fublt6'frdy,Mffi

J d n l h d d . . t F k ! * * f u ! f u e 6

d}@t.d&Br*.&4e @'ee.-tuthtur.t b44.Eid6 r r. h cdM !+ ^ts".6.t

Date :23-Jan-2013

zhtnn\t/

tdborlt|r S€dicas 41/It Sd tum l0 5e na!t' no€d ClEncEs€. Ya atl! &.!r* 10120r +661MiE3641 AaT4gg$ I rO6(OPAn748. OtlltSs uvwl$xlm

Signature glidForQuedionPlease Ghfiwith SGSwww.tw.sal-om

Test Report No.:CE/2012B1363 Oale :201?J11114

LITE-ON SEMICONDUCTOR CORP.2&1, WU SHIN STREET, TAWU LUNG, KEELUNG, TAIWAN

Tho following sampl.(s) was/wer. submltted and identified by/on behalf of tho client as:

Page: 1 of 7

lr|| tlfifitttl

Sample DescriptionStyle/ltem No.Sample Receiving OateTesting Period

WAFERTHYRISTOR2012t111082012t 1 I tog r O 2012J11 | I 4

Test Reouo6ted : (1) As specified by client, to test Cadmium, Lead, Me.cury, Cr(Vl)' PBB6, PBDEScontents in the submitted t€mple.

(2) A6 specified by client, to test Halogen_Fluodne, Chlorine, Bromine, lodinecontents in the submitted 6amPle.

Please refer to next page(s).

: Please refer to next page(s).

T.5t Method

Te€t R€auqs)

NW,q,vi\

iedbra

Test Report No. : CE/201281363

LITEON SEMICONDUCTOR CORP.28-1, WU SHIN STREET, TA WU LUNG, KEELUNG, TAIWAN

Date:2012111114 Page.2 d 7

tl|| ltlt lllllll

T€st R€aultls)

PART MME No.1 MIXED ALL PARTS (2 TYPES)

Test lten(s) Unlt irethod MDLResultNo.t

Cadmium (Cd) mgft9 Wttr reference to IEC 623211 2008 andperformed by |CP4ES.

2 n.d.

Lead (Pb) mdls Wittr reference to IEC 62321: 2008 andpedormed by |CPAES.

10900

Mercury (Hg) mgkg With referenca to IEC 62321 i 2008 andpedormed by lCPiES.

2 n-o.

Fexavalent Chromium cr(Vl) ms,/KgWit-n reference to IEC 62321 i 2008 andperformed by UV-VIS.

n.o.

Sum of PBB6

mg/kg,aar""alwith reference to lEc 6232'1:

performed by GC/MS.

5n.d.

Monobromobiphenyl n.d.

Dibromobiphenyl n.o.

Tribromobiphenyl 5 n.d.

Ietrabomobiphenyl 5 n.d.

PentabromobiPhenYl 5 n.d.n-o.Hexabromobiphenyl

5 n.d.tteptaorornobiptrenytoclabromobiphenyl 5 n.o.

Nonabromobiphenyl 5 n.d.

Decabromobiphenyl 5 | n.d.

Sum ol PBDEs n.d.

Monobromodiph€nyl eth€r 5 n.d.

5 n.o.Dibromodiphenyl etherTribromodiphenyl ether 5 n.d.

fetrabromodiphenyl ether n.d.

5 n.d.Pentabromodiphenyl elherHexabomodiphenyl ether 5 n.d.

n.d.Heptabromodiphenyl ether

n.d.Oclabromodiphenyl ether

5n.d.

NonabromodiphenYl etherDecabromodiphenyl ether n.d.

ffiffif

Test Report No. I CE/201281363 Oale | 201?,11114

LITE.ON SEMICONDUCTOR CORP,28-1. WU SHIN STREET, TA WU LUNG, KEELUNG, TAIWAN

l,lote :1. mg/kg = ppm i 0.1wt% = 1o00ppm2. n.d. = Not Det€cted3. MDL = Method Det€ction Limit4 . " - "=No tRegu la ted5. The sample(s) was/w€re analyzed on behalf of the applicant as mixing sample in one testing

The above result(s) v/as/teere only given as the infomality value

NaraF rc rY ldvm/ r I - f r i L l l r f L rn l ] :

Page: 3 of 7

ttl|flltrItIatt]l

Test ltem(s) Unit Method MDLResultNo.l

HalogenHalogen-Fluorine (F)(CAS No.: 14762-9,1-8)

mg/KgWith reference to BS EN 14582:2007.An€lysis \ras perform€d by lC-

50 n.d.

Halogen-Chlorine (Cl)(CAS No.: 22537-15-1)

50 n.o.

Halogen-Bromine (Br)(CAS No.:10097-32-2)

50 n.d.

Halogenlodine (l)(CAS No.: 14362-44-8)

50 n .d .

Test Report No. : CE/2012,81363 Oa,'e'. 2012h1h4 Page: 4 of 7

l]fitlllfllll]ILITE-ON SEMICONDUCTOR CORP.2&1, WU SHIN STREET, TA WU LUNG, KEELUNG, TAIWAN

1) These samples were dissolved totally by pre-conditioning method according to below iow chart.( Cf' test method excluded )

of measurementr Troy Chang

cf.

ICP.AES

Sample Material Digestion Acid

S'teel, crpper, aluminum, solder Aqua regia, HNq, HCl, HF, HrO,

Glass HNO3/HF

Gold, platinum, palladium, ceramic Aqua regia

Silver HNO3

Plastic HrSOi HrOr, HNO3, HCI

Others Added apprcpriate reag€nt to totaldioeslion

Note" : (1) For non-metallic material, add alkeline digestion reagent and heat to 90-9511(2) For metallic matedal, add pure water and heat to boiling.

a ; ; ; ; : : : - - ; - ' ' A j : . ; ' a l ls..; P""t"d o€€ar

"" r"br' o" req

ii'o ri'iil<ir<;;r' ri;q.;-ss. -bld 6r'ms.{c-dtr"*ti@mn. onlmnbd*.{"@n.n'ei's d conoblqe- aDotumP;;;;;;;bitu hd6mturcn $d,i"sd,@o" '*' dd d hd;/;i h$ ; ' . ; i i ; i ; ; ; . - , ?sd *h in ne r rEo ' c r ' en ta

"m . " i ; i " r + c "m* oe F5po*b l t v s t odsc " r ' noh t s

;d;,;" ;;;*6,"q,.1.." "gtu

a"o "d,sa-"'*,

ta ti;"d;;iu;;;ia- dd'.i" @di;;N tu r'u,i6ei dhubn ,0rco1o, hi' r*bn oli. o;;;;ii,ii:i;o oir;;,s 5*t"r,

, r r 4 i L n ! ; t 1 r r r . t

2) Name of the person who made measurement Climbgreat Yang

Add appropriate amount of

digestion reagent

Microwave digestion withAcid digestion by suitable aciddeDended on difierent s€mDlematerial {as below table)

Heat to appropriate

temperalure to ext act

Cool, filter digestate

through fitterAlkali FusionHClto dissolve

Add diphenyl-carbazide for

color development

measure the absorbance

at 540 nm by UV-VIS

Test Report No. : CE/201281363

LITE-ON SEIVICONDUCTOR CORP,28.1, WU SHIN STREET, TA WU LUNG, KEELUNG, TAIWAN

Date.2012111114

PBB/PBDE analytical FLOW CHART

Name ofthe person who made measuement Roman WongName of ihe pe6on in charge of mea6urement: Troy Chang

Page: 5 of 7

[||[lrtl|||tt!!rr

I

I

First testing proc€ss -----|

Optional scr€en Process ..'.

Confirmation process - .>

Screen analysisr . . . . . . r . . r , ! t r . . . r r I r ! . . . r

V

Sample extractjorvsoxhlet method

concentaate/DiluteExfacted solution

Analysis by GC/MS

vlgEue Report

,ifF#}:",sT;t::,,; IJ: :T:i4 l:fl [:::::;::::H:$;":,;il;;,,'-*;; d;.{;#;;,, ndb ' . . doccbmJ ldodmnE$Fdo+ -smo .q " ' " *o : t i . " im "

d!"*d*, .* ' "-* '* ;" . ; \ , "- ;dd; ' ; . ' 'd* '=dj .-*. ' . ' - - . . " . ' ' ' ' ' ' ' ' " ; ; i ' i " " - . i ;n# i ' in i * r . im," , 'y

o*" . - , . -^ . . . ' . . ' ; ; ; i . 'o . . - ' i la" - ' * .e* .or.ry-='" -'. "

* -,;:.iii*p-L#.i;r o*mm'"*'"t' aniftde- -rrbse*'oFd"j

, ) I n i . { . I s l r t t

Filter

Test ReportLITE-ON SEMICONDUCTOR CORP.2&1. WU SHIN STREET. TA WU LUNG, KEELUNG, TAIWAN

No. : CEl2012l/81363 Dale:2012111114

Analytical flow chart of halogen content'1) Md€ of the person who nEcle nEasurerEnt: Rita Chen2) Mfip of the person in charge of nEasurenBnt Troy Chang

Page: 6 of 7

l|||||tl|Itfllllll

. M ' n d ' 9 8 5 1 ' e p o n ' * : 0 1 ! l o l Td ; ; ; : : ; ; i . : . r . ' / . 0 . r

" 4 i

, #L ] i nn . * t - ao igmen" * j 6b f ' - dcond (o *b : i | * b1 .DdJgSdM"q 'd .d reoonom.;''i]w-i'nire1":t"o*l.F.iq"dlsohdmbm]j!t@l

. . t e ' . t o ' ' a ' s ' s ^ . i ; ' ' ' ' i ; ; - ; ; c ; ; 6 " i ' 9h - * * iD ' Id m 6 o€lons 'nd* 'T 'd6;o' dod sn i r'" orJml' 6n'd

.. ., iii-.ip-;* i dt o; o;;;idJnm' do ore@i ?i F p'

: : " i r ' " ] ! ' l I r . w , . h * " k " N i w i i , i . , ; r f n l : E ' i

Sanple pretreatfiEnt / Separation

Weighting and putting sarnple in cell

Orygen Bomb Con$ustion / Absorption

Dilution to fi)@d volunE

Analysi6 w6 perfonned by lC

Test Report No. : C92012/81363 D8le | 201?,11114 Paget 7 ol7

lll]ltttllflllllllLITE-ON SEMICONDUCTOR CORP,28-1, WU SHIN STREET. TA WU LUNG, KEELUNG, TAIWAN

*' End of Repod '-

&iul.be's*btr"*J"!s1er h,;rp..r*dvb'eg::T*"J:.;J"i::ffiJ:1"J.:::::"_."":;*;:J-::,1:::;":::'ijrh s locnfrem s 'susd bv te cdmpany abie 'o 6 GdeBr condi, ; ' i ' ; . d i , . bmde -mfu ' sb< tbFm.adcoo rc t l ; i | i . i a . n .Dum{ rdM$ . j - .i;Li";;'i; ' i i i;oir,r-m. so ,: ra,-*'**'ae Edt.n:ao;d o, a,i doammr s-.0',ed'ai " J i i ' i " i i g . i i i i ; rm i - - r 'mo . . | i n . hP 'nso | c i en t9 ' 1 {aa .1 ! ' . ' v . f comodn l ss' . " j n ' 6 n n . o . ; * . ' o a r | . n " , " ' 1 d q h ' a d n m d m ; ' ' r f . d o ( e i . c m o i b scil6ii"- ri.i ,i"-",li,-.?oin"'it*l toe;t o;dsn-b"dh -;;i; andonende.m4 b' prosdedb h

' The tested sample / part ia mark€d by an arow if it's shown on the photo. '

I

B1363

81363

November 26, 2012 Littelfuse, Inc.

Annex 7: Applicable RoHS exemptions (2011/65/EU Annex III)

Annex 7 Annex 7

kbacila

Text Box