Bruker D8 Advance XRD Operation Procedure - 4D LABS · Bruker D8 Advance XRD Operation Procedure Standard Operating Procedure 4D Labs Confidential Revision: 3.0 — Last Updated:

1

Simon Fraser University 8888 University Drive, Burnaby, B.C. V5A 1S6

E [email protected] T 778.782.8158 F 778.782.3765 www.4dlabs.ca

Bruker D8 Advance XRD

Operation Procedure

Standard Operating Procedure

4D Labs Confidential

Revision: 3.0 — Last Updated: January 6, 2017

Revision History

# Revised by: Date Modification

1.0 Nathanael Sieb 2010/12/17 Initial release

2.0 Nathanael Sieb 2012/11/27 Updates for wizard and thermal stage

3.0 Philip Kubik 2017/01/05 Added Bragg-Brentano & Goebel Mirror differences. Ex-panded automated operation. Added data analysis section. Additional changes throughout.

2



Table of Contents

1 Purpose ........................................................................................................................................... 4

2 Definitions ....................................................................................................................................... 4

3 Conventions .................................................................................................................................... 4

4 References ....................................................................................................................................... 5

5 Contact ........................................................................................................................................... 6

6 XRD2 Overview ................................................................................................................................ 6

7 Procedure ........................................................................................................................................ 8

7.1 Start-up .................................................................................................................................... 8

7.2 Sample Loading ...................................................................................................................... 10

7.2.1 Standard Stage................................................................................................................ 10

7.2.2 Thermal/Vacuum Stage .................................................................................................... 11

7.3 Optics Configuration ............................................................................................................... 15

7.4 Data acquisition ...................................................................................................................... 18

7.4.1 Manual Operation ........................................................................................................... 18

7.4.2 Automated Operation ...................................................................................................... 22

7.5 Wrapping Up .......................................................................................................................... 31

7.6 Data Analysis with EVA ........................................................................................................... 32

3



4



1 Purpose

This document describes how to measure x-ray diffraction using 4D Labs’ Bruker D8 Advance X-Ray Dif-

fractometer (XRD2). It is intended to be a reference for trained users of the system and is not a substitute

for training by Nanofabrication Facility staff. In addition to training in the operation of XRD2, users are re-

quired to have recent x-ray safety training. Readers of this document are expected to have a basic familiari-

ty with x-ray diffraction.

2 Definitions

B-B: Bragg-Brentano primary optics

GM: Goebel Mirror primary optics

Job: Measurement recipe, which can be run unattended, e.g., a sequence of temperature changes and XRD

scans

PSD: Position Sensitive Detector (LynxEye detector)

XRD: X-Ray Diffraction or X-Ray Diffractometer

3 Conventions

In this document, the following items are italicized.

Hardware units

Software menu items

Software windows and panels

Software box names

The following items are underlined.

Hardware buttons and switches

Software buttons

Special keyboard keys, e.g., Enter.

Text to be typed is shown in Courier font.

5



Hazard conventions:

CAUTION indicates a hazard which may cause damage to equipment.

WARNING indicates a hazard which may cause injury to personnel. It may also cause damage to

equipment.

4 References

Cambridge Structural Database: http://cufts2.lib.sfu.ca/CRDB4/BVAS/resource/5639 1

Crystallography Open Database (COD): http://www.crystallography.net/cod/

EVA 12 User Manual, Bruker AXS GmbH, Document DOC-M85-EXX002 V15, Software version 12, Re-

lease 2006 (September 7, 2006).

Inorganic Crystal Structure Database (ICSD): https://www.fiz-

karlsruhe.de/de/leistungen/kristallographie/icsd.html 2

International Centre for Diffraction Data (ICDD): http://www.icdd.com/

XRD Commander 2.6 User Manual, Bruker AXS GmbH, Document DOC-M88-EXX060 V2.6, Software

version 2.6, Release 2007 (November 8, 2007).

XRD Wizard 2.9 User Manual, Bruker AXS GmbH, DOC-M88-EXX012 V2.91. Release 2007 (December

20, 2007).

1 Crystal structures, determined by X-ray or neutron diffraction, of organic compounds and metal-organic compounds. High pol-

ymers and oligomers having more than 25 residues are not included. Available to SFU students, faculty, and staff at standalone

computer #2 on the third floor of SFU’s Bennett library but restricted to SFU students, faculty and staff with an SFU computing

ID and password.

2 Available online through the SFU library web site.

http://cufts2.lib.sfu.ca/CRDB4/BVAS/resource/5639

http://www.crystallography.net/cod/

https://www.fiz-karlsruhe.de/de/leistungen/kristallographie/icsd.html

https://www.fiz-karlsruhe.de/de/leistungen/kristallographie/icsd.html

http://www.icdd.com/

6



5 Contact

Questions or comments concerning this document or operation of XRD2 should be directed to the current

tool owner at 4D Labs Nanofabrication Facility, Simon Fraser University, Burnaby, BC, Canada. The current

tool owner is listed on the web page for the tool on the 4D Labs Nanofabrication Facility users' web site.

6 XRD2 Overview

Figure 6-1: 4D Labs' Bruker D8 Advance X-ray Diffractometer (XRD2).

4D Labs' Bruker D8 Advance X-ray Diffractometer (XRD2) has the following capabilities:

High resolution XRD of:

powders

films

7



liquid samples in capillaries (thermal/vacuum stage only)

Primary optics:

Bragg-Brentano or

Goebel mirror

Multichannel silicon strip detector.

Independent control of incidence angle (θ) by rotation of the sample stage and diffraction angle (2θ)

by rotation of the detector.

Sample heating from 30°C to 1200°C in vacuum, air, or inert atmosphere.3

X-ray reflectometry.4

Grazing incidence diffraction.5

Two sample stages are available, both of which have a single axis of rotation.

1) Standard stage: Room temperature XRD of samples on a variety of sample holders. 4D Labs has sam-

ple holders with the following sample cavities but custom holders could easily be fabricated by users.

a) Clear plastic: 10 mm diameter, 0.7 mm deep. Volume = 55 mm3. b) Grey plastic: 24.8 mm diameter, 1.4 mm deep. Volume = 675 mm3.

2) Thermal/vacuum stage: XRD from room temperature to 1200°C in vacuum, air, or inert atmosphere.6

The sample holder is an alumina cup with inner dimensions of 15 mm diameter, 0.8 mm deep. Volume

= 140 mm3.

The current instrument configuration (sample stage & optics) of XRD2 is listed on the tool status page of

the 4D Labs user web site:

3 Requires the thermal/vacuum stage. An inert atmosphere can be provided on request. Additional setup is required.

4 Requires the reflectometry stage and, preferably, the Goebel mirror primary optics. Contact the tool owner.

5 Requires the grazing incidence attachment and, preferably, the Goebel mirror primary optics. Contact the tool owner.

6 An inert atmosphere can be provided on request. Additional setup is required.

8



https://users.4dlabs.ca/resource_status.html

Contact the tool owner to request changes to the stage or primary optics.

7 Procedure

7.1 Start-up

1) Check that the two orange lamps on top of the XRD2 cabinet are illuminated, indicating that the x-rays

are on. If not, contact the tool owner.

2) Check that the instrument status sign displays UP.7 If not, do not proceed.

3) Sign in to Log Book.

4) Create a usage ticket on the 4D Labs Nanofabrication Facility users' web site.

5) Open XRD Commander.

6) Ensure that the Adjust tab at the bottom left is selected. A window similar to that in Figure 7-1 should

open.

7) Observe the actual Theta and 2Theta angles (blue font) in the upper left corner of the XRD Commander

window. If hyphens are displayed to the right of the decimal point, e.g., 45.---, the sample stage and

detector positions are not calibrated. If there are no hyphens, proceed to step 9).

8) To calibrate the sample stage and detector posiitions:

a) Ensure that no objects will impede the motion of the detector.

b) Ensure that both the Theta and 2Theta check boxes are checked.

c) Click the Init Drives toolbar button ( ) to initialize the Theta and 2Theta drives.

9) Optional: Rotate the sample stage to 30° in order to facilitate mounting the sample holder on the

sample stage.

a) Type 30 in the Requested Theta box.

7 If the instrument status sign displays DOWN, the instrument is currently unavailable for use. More information may be available

on the tool status page of the 4D Labs users' web page: https://users.4dlabs.ca/resource_status.html.



9



b) Check the Theta check box.

c) Click the Move Drives toolbar button.

Figure 7-1: Adjust window of XRD Commander.

10



7.2 Sample Loading

7.2.1 Standard Stage

1) Place your sample in the cavity of the sample holder. The top surface of your sample should be flat and

flush with the top surface of the holder.8 Putty may be placed under a thin film sample, if necessary.

2) Powder samples: Wipe off any excess powder which spilled onto the sample holder. Ensure that no

powder will fall onto the diffractometer when the sample stage rotates.

a b

Figure 7-2: a) Thin film sample mounted on sample holder. b) Checking that the top surface of the sample is flush with the top surface of the sample holder.

3) Ensure that the x-ray source shutter is closed.

4) Press the Open Door button on either side of the XRD2 cabinet.

5) Pull open the cabinet doors.

6) Place the sample holder on the sample stage, push the stage up against all 3 pins in the top of the

sample stage (see Figure 7-3), and lock the sample holder in place.

8 If the surfaces are not flush, the measured diffraction angles will be shifted slightly.

11



Figure 7-3: Sample holder mounted on sample stage.

7.2.2 Thermal/Vacuum Stage

7.2.2.1 Alumina Cup Sample Holder


2) Press the Open Door button on the side of the XRD2 cabinet.


4) While supporting the sample holder with one hand (see Figure 7-4a), loosen each of the four thumb

screws with the other hand until the screw drops a few mm.

5) Lower the sample holder carefully and place it on the stand (see Figure 7-4b).

12



a b

Figure 7-4: Sample holder in a) oven and b) stand.

6) Remove the ceramic clip and alumina sample cup from the sample holder (see Figure 7-5).

Figure 7-5: Sample cup mounted on sample holder with ceramic clip.

7) On the sample preparation bench, place your sample in the alumina cup. Ensure that the top of the

sample is level with the top of the cup.

8) Clean off any excess sample on the cup.

9) Place the sample cup on the sample holder and secure it with the ceramic clip. Ensure that the clip is

properly engaged and the cup is held securely by gently attempting to push it laterally.

10) If you plan to evacuate the oven, ensure that the o-ring on the sample holder is clean.

13



11) Align the sample holder with the oven and carefully raise the holder into the oven (see Figure 7-6).

Secure the sample holder in the oven by tightening the four thumb screws evenly, using a cross pat-

tern.

Figure 7-6: Sample holder being placed in oven.

7.2.2.2 Capillary holder

WARNING

When handling a capillary or sample holder with a capillary mounted, wear safety glasses.




4) Remove the oven vent valve, the gas inlet port, and screw in the guide rods.

5) Remove the sample holder as described in Section 7.2.2.1.

6) Carefully install the two side plates and the anti-scattering plate on the holder. Do not apply to much

force or the plates may be broken.

7) Insert the sample holder back into the oven.

14



8) Using a flashlight, check that there is a clear path for the capillary through the gas inlet port and the

sample holder

9) Load the capillary on to the capillary holder.

10) Connect the USB camera to the computer and open SuperEyes.

11) Using the 4 adjustment axis, align the capillary with the center of the scale.

12) Connect the sample spinner cable and turn on the rotation.

13) Ensure that the capillary does not move laterally as it rotates.

14) Turn off the rotation.

15) Using the guide rods, CAREFULLY insert the capillary into the oven. Move slowly and stop if you feel

any resistance. It is easy to break a capillary inside the oven. Contact the tool owner if you break a ca-

pillary.

16) Insert the Cu 0.1 absorber into the secondary optics.

17) Run a detector scan from -2° to 2° with a step size of 0.01° and a Scanspeed of 0.1 sec/step. You

should see two peaks with a valley between them. The valley is the capillary and needs to be aligned

to 0°.

18) Raise or lower the oven using the screw on top (see Figure 7-7).

Figure 7-7: Screw for adjusting the sample height in the oven.

15



19) Repeat steps 17) & 18) as necessary to center the valley between the peaks.

20) Remove the Cu 0.1 absorber.

21) If you changed the oven height, make a note in the log book and inform the tool owner. The height

will need to be changed back for the sample cup.

7.3 Optics Configuration




4) Install the primary optics slit9 in accordance with Table 7-1, depending upon whether the Bragg-

Brentano (see Figure 7-8) or Goebel mirror (see Figure 7-9) primary optics are installed.

Table 7-1: Bragg-Brentano and Goebel mirror optics configurations.

Optics Type Slit Width (mm) Slit Bevel Position Knife Edge

Bragg-Brentano Any 10 Rear and down No

Goebel Mirror 0.1, 0.2, or 0.6 Rear and up Yes

9 The slit in the Bragg-Brentano optics is denoted the divergence slit. The slit in the Goebel mirror optics is denoted the exit slit.

10 The 0.6 mm slit with Bragg-Brentano optics has similar resolution to the 0.1 mm slit with Goebel mirror optics.

16



Figure 7-8: Bragg-Brentano primary optics with 0.6 mm divergence slit.

17



Figure 7-9: Goebel mirror primary optics with 0.2 mm exit slit and knife edge.

5) Ensure that the following slits and filter are installed in the secondary optics (see Figure 7-10), in the

order shown.

a) 3 mm anti-scatter slit

b) Bragg-Brentano: Ni 0.5 absorber (x-ray kβ filter) 11

c) 2.5° vertical Soller slits (reduces lateral beam divergence)

d) 8 mm anti-scatter slit

6) Close the XRD2 cabinet doors, pushing both handles firmly into the locked position.12

11 A kβ filter is not required in the secondary optics when using the Goebel mirror because it filters out the kβ x-rays. The number

0.5 on the Ni absorber indicates that that the kβ:kα1 ratio is reduced to 0.5%. The unfiltered kα1:kα2:kβ ratio is 10:5:2.

12 If the handles are not pushed into the locked position, a door closure error may be triggered, in which case the x-ray generator

will switch off.

18



Figure 7-10: Secondary optics and LynxEye detector configured with an Ni filter for Bragg-Brentano prima-ry optics.

7.4 Data acquisition

7.4.1 Manual Operation

1) Select the Details window of XRD Commander.

2) Observe whether the following settings are selected. If not, select the desired settings and press Set

Detector.

a) Detector 1: PSD13

b) Scanning Mode:1D

13 PSD = Position Sensitive Detector.

19



Figure 7-11: Details window of XRD Commander.

3) Select the Adjust window of XRD Commander.

4) Optional: Add a sample description to the plot title, which will also appear in the header of the meas-

urement file.

a) Type the sample description in the Sample ID box, below the toolbar.

b) Right-click on the plot and select Apply Ident to clear the current description.

c) Right-click on the plot and select Apply Ident a second time to enter your new description into the

plot title.

5) Set the x-ray voltage and current to the 40 kV and 40 mA.

6) Ensure that Theta and 2Theta are unchecked.

7) Select the desired Scantype:

a) Locked Coupled (Theta & 2Theta mode)14 or

b) Detector Scan (Theta fixed, 2Theta scanned). For liquid samples in capillaries.

14 In Locked Coupled mode, both Theta and 2Theta are scanned such that 2Theta = 2 x Theta. Theta is the orientation of the

sample stage. 2Theta is the orientation of the detector. Theta and 2Theta are independent, except in Locked Coupled scans.

20



Figure 7-12: Adjust window of XRD Commander after a measurement has completed.

8) Start: Type the desired minimum 2Theta angle.

9) Stop: Type the desired maximum 2Theta angle.

10) Increment: Type the desired angular step size (typically ≈ 0.01°).

11) Scanspeed:

a) Select angular speed in °/min or dwell time in s/step by clicking on the Scanspeed units box. 15

b) Type the desired angular speed (typically ≈ 10°/min) or dwell time (typically ≈ 0.1 s/step).

12) Select Continuous for the scan type.16

15 Scanspeed may be selected to be angular speed in °/min or a dwell time in s/step. Totaltime, shown at the bottom of the win-

dow, is the product of the dwell time and the number of channels (192) in the LynxEye detector.

21



13) Thermal/vacuum stage: Set the desired temperature (30°C – 1200°C) and ramp rate (0.01°C/s –

0.5°C/s).

14) Click to commence measuring.

15) Measurement options:

a) To abort a scan immediately, click Stop.

b) To restart a scan, click .

c) To repeat the current scan once more and average the accumulated scans, click .

d) To average multiple scans:

i) Ensure that the auto repeat button in the toolbar is depressed.

ii) When sufficient scans have accumulated, click the auto repeat button again so that it is

no longer depressed. Scanning will terminate when the current scan has completed.

16) When scanning has completed, save your measured data.

a) In the menu bar, select File: Save As.

b) Select the desired file format:

i) Diffrac Plus RAW file (*.raw): Bruker's proprietary format, which can be read by Bruker's EVA

software.

ii) Diffrac Plus Text file (*.txt): Text format, which can be read by spreadsheet applications, e.g.,

Microsoft Excel.

c) Type the filename, including the correct file extension.

d) Click OK.

16 The other option Step Scan is incompatible with the hardware.

22



7.4.2 Automated Operation

7.4.2.1 Introduction

A job is a measurement recipe, which allows the operator to specify a sequence of temperature changes

and XRD scans, which can then be run unattended. It is particularly useful in conjunction with the ther-

mal/vacuum stage.

The first step in creating a measurement recipe is to create a parameter file using XRD Wizard (see Section

7.4.2.2). The temperatures at which XRD measurements are desired, temperature ramp rates, and the XRD

scan parameters are defined in the parameter file, which has the file extension .dql. A parameter file may

be created from scratch but, usually, it is simpler to copy an existing parameter file, save it with a different

name, and modify it as needed.

After creating the parameter file, create a job using XRD Commander (see Section 7.4.2.3).

7.4.2.2 Create or Modify a Parameter File

Create a new parameter file or modify an existing parameter file as follows. Usually, it is simpler to do the

latter.

1) Ensure that XRD Commander is closed.

2) Open XRD Wizard.

3) In the menu bar, select either:

a) File: Open and browse to the desired parameter file to be modified e.g., a copy of

C:\\DIFFDAT1\Reference\XRD_vs_T_Example.dql or

b) File: New.

The parameter file should open in the XRD Wizard window, as shown in Figure 7-13. Selection of a

category in the tree view on the left opens a pane on the right, which displays the parameters for that

category.

23



Figure 7-13: XRD Wizard window after opening a parameter file. By default, the Structured edit tab is se-lected and the SCAN DOCUMENTATION pane is displayed on the right.

4) Change the following parameters but no others.

a) SCAN DOCUMENTATION (optional): Type information in the following boxes.

i) Operator

ii) Sample

24



iii) Comments

iv) Click OK.

Figure 7-14: FIXED BEAM OPTICS pane of XRD Wizard.

a) FIXED BEAM OPTICS pane, Fixed Beam Incident Optics section (see Figure 7-14):

i) Divergence slit: Select the width of the divergence slit (B-B optics) or exit slit (GM optics) which

will be installed during the measurement.

25



ii) Click OK.

b) DETECTOR SELECTION (see Figure 7-15):

i) Detector: Ensure that PSD: LynxEye is selected.

ii) PSD electronic window: Ensure that use default is selected.

iii) Click OK.

Figure 7-15: DETECTOR SELECTION pane of XRD Wizard.

26



c) SCAN PARAMETERS (see Figure 7-16):

i) Ranges section (just below the edit tabs): select the scan (range) No. to be modified by double

clicking it.

Figure 7-16: SCAN PARAMETERS pane of XRD Wizard.

27



ii) Temperature stage section:

(1) If temperature control is desired, check start after reaching box, click the Set new values

button and set the following parameters. Otherwise, uncheck the start after reaching box

and jump to step iii).

(2) Set the desired temperature in °C (Range: 30°C – 1200°C).

(3) Set the desired temperature rate of change in °C/s (Range: 0.01°C/s – 0.50°C/s).

(4) Click OK.

iii) Scan parameters section:

(1) Modify the XRD scan parameters as desired. If Step size is set, No. of steps is determined

and vice versa.

(2) Set Delay Time to allow for sample thermalization.17

(3) Click OK.

iv) Add or delete scans as follows. In the Ranges section:

(1) Add a scan to the bottom of the Ranges list by pressing Copy (to add a scan with the

same parameters as the current selection) or Add (to add a scan with default parameters).

(2) Delete the selected scan by pressing Delete.

Important: The final scan should always be at a temperature of 30°C in order that the ov-

en is actively cooled to room temperature. Without active cooling, the thermal stage may

take hours or even days to cool to room temperature, delaying sample removal.

v) Repeat steps i) to iv)iii) for other scans.

d) Generator Settings (see Figure 7-17):

i) Set Voltage = 40 kV.

ii) Set Current = 40 mA.

iii) Click OK.

17 Delay time is the delay between the time at which the sample stage thermal sensor reaches the desired temperature and the

start of the XRD scan.

28



Figure 7-17: Generator Settings pane of XRD Wizard.

2) Optional: Select Table edit (see Figure 7-18) to review your scan parameters quickly. If changes are

required, it is best to return to Structured edit to make them.

29



Figure 7-18: Table edit tab of XRD Wizard.

3) Save the parameter file as follows.

a) In the menu bar, select File: Save.

b) Navigate to your data folder.

c) Type a name for the file with the file extension .dql.

d) Click OK.

4) Close XRD Wizard. At the prompt to save changes in XRD1, click No.

30



7.4.2.3 Create and Run a Job

1) Open XRD Commander.

2) In the menu bar, select Jobs: Create Jobs. The Create Jobs window should open (see Figure 7-19 but

all rows will be blank).

Figure 7-19: Create Jobs window in XRD Commander.

3) In the first row of the Create Jobs table, do the following.

a) Sample ID: Type in the desired sample description.

b) Parameter File:

i) Browse to the desired parameter file (see Section 7.4.2.2).

ii) Click Open.

c) Raw File:

i) Browse to the desired destination folder for the measurement file, e.g., your folder in

C:\\DIFFDAT1.

ii) Type a filename, including the extension .raw.

iii) Click Open.

d) Script:

31



i) Browse to the measurement script C:\\:DIFFPLUS\MeasureV4.vbs .

ii) Click Open.

e) Mode:

i) Select QL from the scroll menu.

4) Click Start to run the job.

5) To abort a job, in the menu bar, select Jobs: Halt all jobs.

As each XRD measurement is completed, the data will automatically be saved to the measurement file. A

single file contains all of the scans.

7.5 Wrapping Up

1) Set V = 20 kV and I = 5 mA.

2) Optional: Set Theta to 30° for convenient removal of the sample holder.

3) Close XRD Commander, unless it will be used again shortly.

4) Unload the sample holder from the sample stage and take it to the sample preparation table.

5) Clean up any powder or other debris in the XRD2 cabinet.

6) Remove your sample from the sample holder. It is your responsibility to dispose of unwanted samples

appropriately, in accordance with health and safety regulations.

7) Clean the sample holder. Do not use alcohol on the clear plastic sample holders.18 For sample holders

subjected to room temperature only, wiping with a moist tissue or brushing with a detergent solution

is usually sufficient. The alumina sample cup from the thermal stage may require acid cleaning, e.g.,

20% nitric acid, with sonication.

8) Clean up the sample preparation table.

9) Retrieve your data. Data on the XRD2 computer may be deleted at any time without warning.

10) Complete your log book entry.

11) Complete your usage ticket on the 4D Labs Nanofabrication Facility users' web site.

18 Alcohol will cause the clear plastic sample holders to crack.

32



7.6 Data Analysis with EVA

Simple data analysis of .raw files may be performed using EVA software, including:

Background subtraction

kα2 peak removal

Offset removal

Addition or subtraction of scans

Merging of scans covering different angular ranges.

For information, refer to the EVA manual. Pattern matching is a feature of EVA which is unavailable be-

cause we have no powder diffraction file database.

The measurement file with the extension .raw is not affected by processing with EVA. Instead, files saved

by EVA have a proprietary Bruker format with file extension .EVA. EVA files may be converted to text files

by the following procedure.

1) In EVA, select File: Export to export the file to .raw format. Avoid overwriting the measurement file,

which has the same file extension.

2) Open File Exchange (see Figure 7-20).

3) In the Input file(s) section:

a) Type: Select Diffrac (AT/plus) Raw.V1.4.

b) Path: Browse to the .raw file to be converted.

4) In the Output file(s) section:

a) Type: Select Diffrac Exchange Format (UXD).

b) Name suffix: Type a suffix or leave blank, as desired.

c) Path: Browse to the desired destination folder for the text file.

5) Select other options, as desired.

6) Click Convert, to convert the .raw file to a text file with file extension .uxd.

7) When finished, click Exit.

33



Figure 7-20: File Exchange main window. When File Exchange is opened, text boxes will be blank and scroll boxes may have different selections.

8) Optional: Navigate to the destination folder and change the file extension of the text file from .uxd to

.txt to allow it to be opened more conveniently by other applications.

Documents

Bruker D8 Advance XRD Operation Procedure - 4D LABS · Bruker D8 Advance XRD Operation Procedure Standard Operating Procedure 4D Labs Confidential Revision: 3.0 — Last Updated: