Bridging the information gap....

BERTScope™ Family

■ Fastercompliancetesting■ Fastertimetomarket■ Moreinformationyoucanuse

■ Stressandadvanced analysisforcomplete compliancetesting

■ HighSpeedBERT■ SamplingScope■ Stressed/Pre-Emphasized EyeGeneration■ MaskTester■ JitterAnalyzer■ ErrorAnalyzer

TheVisionofaScope,theConfidenceofaBERT,andClockRecoveryyoucanCounton.

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The BERTScope Family

BERTScope

BERTScope S

BERTScope Si

BERTScope-SPG

Everviewedaperformanceprobleminthewaveform,errororjitterdomains?Whydoesn’ttheinformationevertietogether?TheBERTScopefamilyisthenextgenerationofsignalintegrityequipmentthatprovidesmultipleviewstohelpyoufindanswersmorequickly.

TheBERTScopefamilyprovidesanewapproachtosignalintegritymeasurementsofserialdatasystemswithspeedsupto17.5Gb/s.BERTScopescombinethecapabilitiesofanenhancedhighperformanceBitErrorRateTester(BERT),withtheeyepatterndisplay,andmeasurementcapabilityofanoscilloscope.

ConventionalBERTsonlygiveyouinformationonthequalityofthechannelintegrity–howoftenerrorsoccur.TheBERTScopeaddspowerfulerrorlocationandanalysiscapabilitiestoallowyoutopinpointandcorrectthecausesoftheseerror.Conventionalsamplingoscilloscopesonlyacquiresamplesatratesfrom20–100kHz,andthenstopsamplingtoanalyzethedata.TheBERTScopesamplesatthedatarate,thousandsoftimesfaster,andneverstopsacquiringdata.Measurementsarebasedonordersofmagnitudemoredata,soelusivefaultsthatoccurinfrequentlyarenevermissed.

Traditionally,theBERThasbeenusedforreceivertesting,whilethesamplingscopecharacterizestheperformanceofthetransmitter.Combiningbothcapabilitiesinthesameinstrumentallowsseamlesstransitionsacrossmeasurementdomains,providingyouinformationofvalueforcharacterizingandtroubleshootingyourdesignwhichtraditionalinstrumentationcannot.

BERTScopesareavailableinmodelssupportingmaximumdataratesof17.5Gb/s,12.5Gb/sand7.5Gb/s.Threeseriesareavailable:

Thebasicmodelsincludeflexiblepatterngeneration,BERmeasurement,andeyediagramwithmasktestingandeyemeasurements.Optionscanbeaddedtoprovidephysicallayermeasurementswithbasicjittermeasurement,extensiveerroranalysis,extendedjittermeasurementswithlongpatternsupport,andequalizationprocessing.

TheStressedmodelsaddcalibratedstresscapabilitytothepatterngeneratorinthebasicBERTScope

TheSignalIntegritymodeladdsenhancedSpreadSpectrumClock(SSC)clockgeneration,additionalstressgenerationcapability,andextendedjittersubcomponentanalysiswithlongpatternsupporttoBERTScopeS

StressedPatternGenerationcapabilityoftheBERTScopeS,withouttheerrordetection/BERcapability

BERTScope - The Logical Evolution of Test

“ Havingseencustomersstrugglewithtestinghigh-speedcomponents,werealizedthatanewapproachwasessential.Thisnewapproach,theBERTScopefamily,preciselytiestogethereyediagramswithbiterrorratestoprovidethemissinglinkbetweenthetime,errorandjittermeasurementdomains.Thisenablesthesolvingofproblemsthatare1inatrillionaseasilyassolvingproblemsthatare1bitin10.

” Tom Waschura ChiefTechnologyOfficer SyntheSysResearchInc.

Samples orders of magnitude deeper with BER basedJitter Decomposition

BERT with stressed PGand error location analysis

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Eyediagramshavealwaysprovidedaneasyandintuitiveviewofdigitalperformance.IthasbeenhardertotiethisdirectlywithBERperformance,astheinstrumentsthatprovideviewsofeachhavebeenarchitectedinfundamentallydifferentways.Eyediagramshavebeencomposedofshallowamountsofdatathathavenoteasilyuncoveredrarerevents.BERTshavecountedeverybitandsohaveprovidedmeasurementsbasedonvastlydeeperdatasets,buthavelackedtheintuitivepresentationofinformationtoaidtroubleshooting.ThishasleadtoaninformationgapbetweenBERTsandsamplingscopes.

TheBERTScoperemovesthisgapallowingyoutoquicklyandeasilyviewaneyediagrambasedonatleasttwoordersofmagnitudemoredatathanconventionaleyes(seepage5).Seeingafeaturethatlooksoutoftheordinary,youareabletoplacecursorsontheitemofinterestandbysimplymovingthesamplingpointoftheBERT,usethepowerfulErrorAnalysiscapabilitiestogainmoreinsightintothefeatureofinterest.Forexample,checkforpatternsensitivityofthelatestrisingedges.Alternatively,useonebuttonmeasurementofBERContourtoseewhetherperformanceissuesareboundedorlikelytocausecriticalfailuresinthefield.Ineachcaseinformationisreadilyavailabletoenhancemodelingoraidtroubleshooting,andisavailableforpatternsupto231-1PRBS.

View performance in the time domain to new data depths...

Go deeper with one-button BER Contour...

Compare standards specified masks at 10–1� levels with measured BER Contour to easilysee whether your device complies.

Pick a feature to examine more deeply...and analyze exactly the pattern sequence behind it.

Easily export high quality infor-mation to your favorite modeling software.

Linking Domains

Withtheabilitytovarysampledepth,itisveryeasytomovebetweendeepmeasurementswhichgiveamoreaccurateviewoftherealsystemperformance,andshallowmeasurementsthatmachthoseofasamplingscope.Themeasurementsshownherearefromtheeyediagramofanopticaltransmitter.WiththeBERTScopesampledepthsettoonly3000waveforms,theBERTScopegeneratesthediagramshowninthemiddleinonly1second.Themeasuredmask

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Transmitter Testing Made Easy

Data-Rich Eye DiagramsAsshownonthefacingpage,thereisanimpressivedifferenceindatadepthbetweenconventionaleyediagramstakenwithasamplingoscilloscopeandthosetakenwithaBERTScope.Sowhatdoesthatmean?Itmeansthatyouseemoreofwhatisreallygoingon–moreoftheworldoflowprobabilityeventsthatispresenteverytimeyourunalongpatternthroughadispersivesystemofanykind,haverandomnoiseorrandomjitterfromaVCO–aworldthatiswaitingtocatchyououtwhenyourdesignisdeployed.Addingtothisthedeeperknowledgethatcomesfromtheone-buttonmeasurementsofBERContour,JitterPeakandQFactor,andyoucanbeconfidentthatyouareseeingthecompletepicture–apicturethatdoesn’trelyonextensiveextrapolationfromarchitectureswithshallowmeasurementdepth.

Deep Mask Testing Thedepthadvantagegainedforeyediagramsisatleast10timesgreaterformasktesting.Unlikepseudo-masktestingofferedbysomeBERTs,aBERTScopemasktestsampleseverypointontheperimeterofanindustrystandardmask,includingtheregionsaboveandbelowtheeye.Notonlythat,buteachpointistestedtoadepthunseenbefore.Thismeansthatevenforatestlastingafewsecondsusingamaskfromthelibraryofstandardmasksorfromamaskyouhavecreatedyourself,youcanbesurethatyourdevicehasnolurkingproblems.

Accurate Jitter Testing to Industry StandardsTestingwithlongorshortpatterns,themostaccuratejittermeasurementislikelytocomefromthemethodologythatuseslittleornoextrapolationtogetit’sresult.WiththeBERTScope,youcanquicklymeasuretolevelsof1x10–9(1x10–10athighdatarates),orwaitfortheinstrumenttomeasure1x10–12directly.Eitherway,theBERTScope’sone-buttonmeasurementsarecomplianttotheMJSQjittermethodology,andbecausetheunderlyingdelaycontrolisthebestavailableonanyBERT,youcanbesurethatthemeasurementsareaccurate.Usethebuilt-incalculationsforTotalJitter(TJ),RandomJitter(RJ)andDeterministicJitter(DJ)oreasilyexportthedataanduseyourownfavoritejittermodel.

Mask Compliance Contour TestingManystandardssuchasXFP/XFIandOIFCEInowspecifymasktestsintendedtoassureaspecified1x10–12eyeopening.ComplianceContourviewmakesthiseasybytakingamask,andoverlayingitonyourmeasuredBERcontours–soyoucanimmediatelyseewhetheryouhavepassedthemaskatwhateverBERlevelyoudecide.

Whetheryourdatachanneliselectricaloroptical,theBERTScopewillgiveyouinsightthatisjustnotavailableanywhereelse.Inadditiontoalltheviewsandmeasurementsyoucangetfromatraditionalsamplingscope,theBERTScopeprovidesmoreinformationthatyoucanactuallyuse.

TestingopticaltransmitterswithBERTScopemasktestingandaDCRj12500Areferencereceiver.

TheBERTScopeshownwithopticalunitsenabled.Inthisexample,aPicometrixreceiverisbeingused,andmeasurementsconvertedtotheopticaldomainautomatically.

WiththeBERTScopesample

waveforms,theBERTScope

marginof20%exactlycorrelatestothesamemeasurementmadeonasamplingoscilloscope,whichrequiredover30secondstocomplete.Thelowerdiagramshowstheeyeproducedbythesamedevice,usingComplianceContourmeasuredataBERof1x10-6.Herethemaskmarginisreducedto17%.

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A Question of Depth....

“ Weneedtounderstandwhat’s limitingtheperformanceofthedevices wearedeveloping.Theeyediagram optionsontheBERTScopearegreat becausetheyprovidesomuchdata depth.Toreallyprobedeeply,the BERContourandJittermeasurements showuswhat’sactuallygoingon.The BERTScopehelpsusalottobemore effectiveinourresearch.

” Alexei Glebov ResearchScientist FujitsuLabsofAmerica

Thesecondpictureshowsthesampledepthofa10secondBERTScopeeyediagrammeasurementatstandarddepth,onthesamescaleastheoneabove.

Plottingthesamedatainthesecondpictureonascale100timessmallershowsthatthedepthofmeasurementofaBERTScopeeyeisatleast100xthedepthofaconventionalsamplingscope.

Thefirstphotoshowsthesampledepthofaconventionalequivalent-timesamplingoscilloscope,measuringforaround10seconds.

BridgingeyediagramandBERdomains,aBERContourmeasurementgivesevengreaterdepthtouncoverproblematicperformanceissues.

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Flexible ClockingThegeneratorclockpathfeaturesintheBERTScopeSandBERTScopeSi provide the test fl exibility needed foremergingreal-worlddevices.Whethercomputercardsordiskdrives,itisoftennecessarytobeabletoprovideasubratesystemclock,suchas100MHzforPCI-Express®(PCIe).Togetthetargetcardrunningmayrequireadifferentialclocksignalwithaparticularamplitudeandoffset;thisiseasilyaccomplishedwiththeBERTScopearchitecture,withmany fl exible divide ratios available.

SpreadSpectrumClocking(SSC)iscommonlyusedinelectricalserialdatasystemstoreduceEMIenergybydispersingthepowerspectrum.TheabilitytomodulatetheclockwithSSCisstandardintheBERTScopeSi,andanoptionavailableinBERTScopeSmodels.Adjustablemodulationamplitude,frequencyandachoiceoftriangleorsinemodulationwaveshapeallowtestingreceiverstoanycompliancestandardwhichutilizeSSC.Anadditionalmodulatorandsourceallowsuserstostresstheclockwithhighamplitude,lowfrequencySinusoidalJitter(SJ).

Data Path

Internal Clockwith

XSSC Option

External Clock(can be stressed)

External Clock Input

ClockSelect

1,2,4,8...

1,2,4,5,6,7,8,9...

Sub-rateOutputSelect

Unstressed dividedor undivided

Stressed full-rate clockor unstressed, binarydivided or full-rate clock

Stressed Data

Multi-RateDividers

BinaryDividers

StressModulation

Example: PCI-Express Transmitter MeasurementsThescreenshotsshowcompliancemeasurementsmadewiththeBERTScope.ThePCI-Expresscardwastestedinacompliancetestboard,andtheBERTScopeprovideda100MHzdifferentialclocksignalwiththecorrectamplitudesandoffset.Thecardoutputwasmeasuredusingtherequiredcompliantloopbandwidthclockrecovery,providedbyaBERTScopeCRinstrument.

Ontheupperleftisshownthetestdevicepassingtheappropriatecompliancemask.Ontheupperright,thesamesignalismeasuredwithQFactortogetanaccuratevalueforthede-emphasizedmeanamplitudes.Thelowertwoscreenshotsshowthesamemeasurementsforthetransitionalbit.

ClockpathinBERTScopeS,SiandSPGmodels

De-emphasized bit measurements

Transitional bit measurements

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Working With Closed Eyes

Withtheneedtopusheverincreasingdataratesthroughelectricalchannels,thefrequencydependentlossesoftenresultineyeclosureatthereceiverend.Engineersuseequalizationtocompensatefortheselossesand

Forreceivertesting,theDPP12500ADigitalPre-EmphasisProcessoraddscalibratedpre-emphasistotheBERTScopepatterngeneratoroutputs,emulatingpre-emphasisappliedatthetransmitter.Pre-emphasisiscurrentlyusedin10GBASE-KR,PCIe,SAS,DisplayPort®,USB3.0andotherstandards.

ThePatternVuoptionincludesasoftwareimplementedFIRfilterwhichcanbeinsertedbeforetheeyepatterndisplay.Insystemsemployingreceiverequalization,thisallowsyoutoviewtheeyediagramandperformphysicalmeasurementsontheeyeasthereceiver’sdetectorwouldseeit,aftertheeffectoftheequalizer.Equalizerswithupto32tapscanbeimplemented,andtheusercanselectthetapresolutionperUI.

PatternVualsoincludesCleanEye,apatternlockedaveragingsystemwhichremovesthenon-deterministicjittercomponentsfromtheeye.ThisallowsyoutoclearlyseepatterndependenteffectssuchasISI(InterSymbolInterference)whicharenormallyobscuredbythepresenceofhighamountsofrandomjitter.

SingleValueWaveformexportisacomponentinthePatternVuoption.Thisallowsyoutocaptureapatternlockedwaveformshowingsinglebits,similartoasingleshotcaptureinarealtimeoscilloscope.Oncecaptured,thewaveformcanbeexportedinavarietyofformatsforfurtheranalysisinanexternalprogram.

Determiningoptimumtapweightingsneededtoequalizeachannelcanbeatedioustask,especiallywhenyouneedtoresorttomanualtrialanderrormethods.OurFIR(FiniteImpulseResponse)ExplorerTapOptimizerutilityisastraightforwardapproachtodeterminingFIRtapweightsfromusersuppliedS-parameters.TheutilitycanacceptS-parameterdataofthedesiredresponse,ortheactualchannelresponse,whichitwillinverttodeterminetheoptimumequalization.Theusercanselectthenumberoftapsavailable,andfocustheresponsematchingtoaparticularareaofthefrequencybandtoavoidboostingoutofbandnoisecomponents.Setupiseasythroughasinglegraphicaldisplayview,whichplotsthecomputedresultingresponsealongwiththeresponsetarget.

InkeepingwiththeBERTScopephilosophy,thegraphicaluserinterfacepresentsthecontrolfunctionalityinalogical,easytofollowformat.Atimedomainrepresentationoftheresponseshowstheeffectsoftapweightsettings.ThefrequencydomainBodeplotshowshowthefilterwillcompensateforthechannellosses.

InkeepingwiththeBERTScope

Features:

• 1–12.5Gb/sclockrates•3or4tapversions•Flexiblecursorplacement allowingpre-cursoror postcursor

“opentheeyes”intherealsystem.Weofferpowerfultoolstoallowdesignerstocharacterizeandtestcomplianceofreceiverandtransmittercomponentsusedinthesesystems.

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Highquality,lowjitteroutputsassureyourdeviceisbeingstimulatedbyaninstrumentqualitysignal.

TheBERTScopeSandBERTScopeSisimplifytestingreceiversandclockrecoverycircuitswiththeintegratedstressgenerator.

Complementarydataoutputsandinputstoallowcharacterizationoftherealworldperformanceofdifferentialdevices

The BERTScope – Up Close

BERTScopesavailablein17.5Gb/s,12.5Gb/sor7.5Gb/smodels.Upgradetohigherspeedasyourneedsgrow.

User-replaceableAPC-3.5PlanarCrown®connectoradapteranduniqueprotectioncircuitryonhighspeedinterfacesgiveyoumoremeasurementup-timethanyoumayhaveexperiencedwithBERTsbefore.

PlanarCrown®connectoradaptersmaybeuser-exchangedtootherconnectertypessuchasN-type.

AddstresstoclockanddataoutputsoftheBERTScopeusinganexternalclockinput.

A formidable list of clock divide ratios areavailable from the differential clock output as well as full-rate, with full amplitude, offset and termination control.

BERandeyediagrammeasurementwithinternalorexternalclock

Data Path

Internal Clockwith

XSSC Option

External Clock(can be stressed)

External Clock Input

ClockSelect

1,2,4,8...

1,2,4,5,6,7,8,9...

Sub-rateOutputSelect

Unstressed dividedor undivided

Stressed full-rate clockor unstressed, binarydivided or full-rate clock

Stressed Data

Multi-RateDividers

BinaryDividers

StressModulation

Data Path

Internal Clockwith

XSSC Option

External Clock(can be stressed)

External Clock Input

ClockSelect

1,2,4,8...

1,2,4,5,6,7,8,9...

Sub-rateOutputSelect

Unstressed dividedor undivided

Stressed full-rate clockor unstressed, binarydivided or full-rate clock

Stressed Data

Multi-RateDividers

BinaryDividers

StressModulation

Stressedfull-rateclockorunstressed,binarydivided/full-rateclock

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Acknowledgedastheeasiesttousebiterroranalyzeravailable–thelogicalandconsistentuserinterfacegivesyoutheinformationyouneedclearlyatalltimes.Accessfeaturesusingthetouchscreen,frontpanelcontrolknoborusingakeyboardandmouse.Manymeasurementscanbeassessedwiththetouchofasinglebutton.

Intuitivedisplayscanbenavigatedeasilyusingwebbrowser-likebuttons

FrontpanelUSBinterfacegiveseasyconnectionformemorysticks,keyboardandmouseorotherperipherals

Ancillaryinterfacesgiveeasyfrontpanelconnectionaccess.Combinedwiththecomprehensiverear-panelset,thesegiveyouimpressiveflexibilityininstrumentuse.

Usefulinformationontheinstrumentmeasurementstateisalwaysdisplayed.Theuseofcolorcodingalertsyoutonon-standardoperatingconditions.

BERandeyediagrammeasurementwithinternalorexternalclock

Jittertolerancetestingissimple,withmanyindustry-standardtemplatesbuiltin,oreasilycreateyourown

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Channel Testing

BERContourofabackplaneoperatingat4.25Gb/swithtwodifferentpatterns:CJTPAT(left)and231-1PRBS(right).Beloweachisthesamedataexportedandplottedin3-dimensionsasan‘EyeBowl’.

Channelstakemanyforms,fromtrans-oceanicfiberlinkstoinchesofFR-4

atspeedsneveroriginallyenvisagedsuchasspecifiedinOIFCEIandIEEE802.3ap.They

allcountashostileenvironments,pushingthelimitsoflinkperformance.Whileclassicalfiber

andsatellitelinkstendtobenoise-limited,modernbusandbackplaneconnectionsaremore

likelytobejitterlimited.

Whateverthelimitation,itisoftenachallengecomparingreal-worldperformancewiththepredictions

ofsimulationsoftware.Forexample,backplanesareoftenmeasuredinS-parameterterms,buttheseneed

tobecombinedwithtransmitterparameterstobeabletogetanideaoftheeyethatareceiverwilleventuallysee.

Withalloftheassumptionsrequired,theroleofreal-worldmeasureddatabecomesincreasinglyimportant.Thisiswhere

BERContourmakesanintuitivelinkbetweentheoryandpractice.Italsoplaysausefulroleinsettingupthetemplate

forreceiverjittertolerancetesting.

Theexamplesshownatthetopofthepageareofanexperimentalbackplanewithtwodifferentpatterns-CJTPAT,a

FibreChannelshortjitterpattern,and231-1PRBS,amuchlongerpattern.ThemoreaggressivenatureofthePRBSpatternisreadilyvisible,withinfrequentlyoccurringpatterncombinationscausing

significantdispersioneffects.

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Theintuitiveuserinterfaceprovideseasycontrolofalloperatingparameters.AuniqueLoopResponseviewshowstheloopcharacteristics–actuallymeasured,notjustthesettingsvalue.

TheBERTScopeCR12500Aaddsnewlevelsofflexibilityincompliantclockrecovery.Moststandardsrequiringjittermeasurementspecifytheuseofclockrecovery,andexactlywhichloopbandwidthmustbeused.Usingadifferentorunknownloopbandwidthwillalmostcertainlygiveyouthewrongjittermeasurement.Thenewclockrecoveryinstrumentenableseasyandaccuratemeasurementstobemadetoallofthecommonstandards.

Add Clock Recovery

TheBERTScopeCRandCRJ’susefulnessarenotjustconfinedtoBERTScopemeasurements.Usethemstandaloneinthelabwithyourrealtimeandsamplingoscilloscopes,orwithexistingBERTequipment.Compliantmeasurementsareavailabletoyoubypairingeitheroftheseversatileinstrumentswithyourexistinginvestments.

Spreadspectrumclocking(SSC)isusedbymanyofthelatestserialbussesincludingSATA,PCI-Express,FB-DIMM,andnextgenerationSASinordertoreduceEMIissuesinnewboardandsystemdesigns.TheBERTScopeCRandCRJprovidespreadspectrumclockrecoverytogetherwiththedisplayandmeasurementoftheSSCmodulationwaveform.Automatedmeasurementsincludeminimumandmaximumfrequencydeviation(inppmorps),modulationrateofchange(dF/dT),andmodulationfrequency.Alsoincludedaredisplayofthenominaldatafrequencyandeasytouseverticalandhorizontalcursors.

Display and Measure SSC Modulation Waveform

CombineBERTScopeCRJ12500AwithBERTScopeforvariableclockrecovery,dutycycledistortion(DCD)measurement,andreal-timejitterspectralanalysis.Displayjitterspectralcomponentsfrom200Hzto90MHzwithcursormeasurementsofjitterandfrequency.Measureband-limitedintegratedjitterwithuser-settablefrequencygatedmeasurements(pre-setbandlimitsandintegratedjittermeasurementforPCI-ExpressGen2jitterspectruminthisexample).Foropticalapplications,combinetheBERTScopeDCRJ12500AwithBERTScopeforSONET/SDH/OTNtelecomjittergenerationmeasurementsandoptical/electricalclockrecovery.

Add Jitter Analysis

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Taking the Stress out of Receiver TestingAsnetworkshavechanged,sohavethechallengesoftestingreceivers.WhiletestssuchasBERandreceiversensitivityarestillimportant,receiverjittertolerancehasevolvedtobemorereal-worldforjitter-limitedsystemssuchas10Gb/sperseconddataoverbackplanesandnewhighspeedbuses.StressedEyetestingisbecomingincreasinglycommonasacompliancemeasurementinmanystandards.Inaddition,engineersareusingittoexplorethelimitsoftheirreceiverperformancetocheckmarginindesignandmanufacturing.

CreatingthestressrecipeforreceivertestingtoacomplicatedstandardsuchasPCIeG2usedtorequire"rackingandstacking"severalinstruments,thenspendinghourscalibratingthesetup.WithBERTScope,aeasytounderstandgraphicalviewgivesyoucontrolofallofthecalibratedstresssourcesyouneed–insidethesameinstrument.Eliminatingtheneedforexternalcabling,mixers,couplers,modulators,etc.simplifiesstresscalibration.

“ Inourdesignofleading-edgeadvanced memorybuffers(AMB),we’vesignificantly reducedtestandvalidationtimesusingthe BERTScope,fromhourstominutes,givingus theabilitytotestmoreparametersandmore devices.We’vebeenabletocompressthe projecttimelinewiththisnewapproachto testandmeasurement

” Roland Knaack AMBDesignManager IDT,Inc.

4xFibreChannelcompliantopticalstressedeye4xFibreChannelcompliant

XFIcompliantelectricalstressedeye

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TheBERTScopestressedeyeoptionprovidesanintegrated,calibratedandeasytousesolutiontojittertolerancetesting.ThissimplifiescompliancetestingforelectricalstandardssuchasOIF-CEI,XFI,FibreChannel,Serial-ATAIIandPCI-Express.

AddtheDCRj11000ADigitalCommunicationReceiverforacompletetestsolutionforbothopticalreceiversandtransmitters.Combiningopticalreferencereceivercapabilitywithcalibratedclockrecoveryandspectraljittermeasurements,theDCRj11000AallowscompletecompliancetestingtoSONETandSDHstandards,alongwith1and10GbEthernetandFibreChannel.

WiththeLTS8500ALightwaveTestSet,theBERTScopeSprovidescompleteopticalandelectricalstressedeyetestingforopticaltransceiverssuchasXFP.OpticalTestingisalsoeasyforstandardssuchas10GBASE-SR,10,8,4,2,and1XFibreChannel.

SinusoidalJitter

BoundedUncorrelatedJitter

RandomJitter

F/2Sub-RateClockJitter

Inter-SymbolInterference

SinusoidalInterference

Flexible Stress Impairments

Communications Test ExamplesBERTScope SPG

Stressed Pattern Generator

TheBERTScopehashighquality,calibratedsourcesofstressbuiltin,includingRJ,SJ,BUJandSI.

ISIisalsoacommoningredientinmanystandards.TheBERTScopedifferentialISIboardprovidesawidevarietyofpathlengths,freefromswitchingsuck-outsandanomalies.

TheBERTScopeSPGprovidesallthefunctionalityoftheBERTScopeS12500Bstressedpatterngenerator,withoutthedetectorhalfoftheBERT.Thisinstrumentprovidesaneasytousealternativetoarackfullofmanuallycalibratedinstrumentsneededtoprovideastressedpattern.UsesincludereceivertestingofdeviceswithinternalBERmeasurementabiltysuchasDisplayPort,oraddingstresscapabilitytolegacyBERTinstruments.

ManystandardscallforSJtobesteppedthroughatemplatewithdifferentSJamplitudesatparticularmodulationfrequencies.ThisiseasywiththebuiltinJitterTolerancefunctionwhichautomaticallystepsthroughatemplatethatyoudesigned,oroneofthemanystandardtemplatesinthelibrary.

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RJvariesbyedgeinthedatapattern,shownplottedwiththedatapatternandinahistogram

TJismeasuredusinganMJSQ-compliantBERTScan(or“BERbathtub”)method

BUJismeasuredonsingleedgesofthedatapatternusingtheBERbathtubmethod

DDJ,ISI,andDCDaremeasuredbasedonhistogramsofrisingandfallingaverageedgetimings.Edgetimingsarealsoplottedwiththedatapattern.

BUJismeasuredonsingleedges

DDJ,ISI,andDCDaremeasuredbased

SRJismeasuredforanumberofuser-defi ned sub-rates

datapatternandinahistogram

Jitter Measurements

Multigigabitserialdatachannelshaveeyeopeningsonlyacouplehundredpicosecondswide–orless.Insystemswhereonlyafewpicosecondsofjittercount,accuratemeasurementofjitterisessentialformanagingtightjitterbudgets.TheBERTScopehastwosetsoftoolswhichperformthesecriticalmeasurements.

ThePhysicalLayerTestSuiteoptionincludesmeasurementofTotalJitter(TJ)alongwithbreakdownintoRandomJitter(RJ)andDeterministicJitter(DJ),usingthewellaccepteddualDiracmethod.Thedeep,BERTcollectedmeasurementsuseseveralordersofmagnitudelessextrapolation,orinsomecasesnoextrapolation,thanoscilloscopesuseasabasisforthejittermeasurements.Thisproducesinherentlymoreaccurateresultsthanmeasurementsmadeonotherinstrumentswhichrelyonhighlevelsofextrapolation.

JitterMapisthelatestsuiteofjittermeasurementsavailablefortheBERTScope.ItprovidesacomprehensivesetofsubcomponentanalysisbeyondRJandDJ,includingmanymeasurementscompliantwithhigherdataratestandards.JitterMapcanalsomeasureanddecomposejitteronextremelylongpatterns,suchasPRBS-31,aswellasLiveData(requiresLiveDataAnalysisoption)providingthatitcanfirstrunonashortersynchronizeddatapattern.Featuresinclude:

• DJbreakdownintoBoundedUncorrelatedJitter(BUJ), DataDependentJitter(DDJ),Inter-symbolInterference(ISI), DutyCycleDistortion(DCD),andSub-rateJitter(SRJ)including F/2(orF2)Jitter • BERbasedfordirect(non-extrapolated)TotalJitter(TJ) measurementto10–12BERandbeyond • Separationofcorrelatedandnoncorrelatedjittercomponents eliminatesmistakinglongpatternDDJforRJ • Canmeasurejitterwithminimumeyeopening • Additionallevelsofbreakdownnotavailablefromother instrumentssuchas:EmphasisJitter(EJ),UncorrelatedJitter(UJ), DateDependentPulseWidthShrinkage(DDPWS),andNon-ISI • Intuitive,easytonavigatejittertree

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Finallyasolutiontotheage-oldproblemofmakingphysicallayermeasurementsonhighspeedlinecards,motherboardsandlivetraffic–theBERTScopeLiveDataAnalysisoption.Throughnoveluseofthedual-decisionpointarchitecture,theinstrumentisabletomakeparametricmeasurementssuchasJitter,BERContourandQFactorinadditiontotheeyeandmaskmeasurementthatareusableasstandard–allthatisrequiredisaclocksignal.AddtheJitterMapoptiontoseeevenmorelayersofjitterdecompositiononLiveData.Nomorefrustrationbecausethepatternisnotknown,predictable,orinvolvesrate-matchingwordinsertions.Troubleshootingissomucheasiernowthattheone-buttonphysicallayertestscanbeemployedtoprovideuniqueinsight.

Testing Interface Cards?

JitterPeakandBERContourmeasurementsmadeonlivedata

Thereareseveralmethodsfordealingwithunknownincomingdata.InadditiontoLiveDataAnalysisdiscussedabove,ausefulstandardfeatureonallBERTScopeanalyzersispatterncapture.Thisallowstheusertospecifythelengthofarepeatingpatternandthenallowtheanalyzertograbthespecifiedincomingdata.Thiscanthenbeusedasthenewdetectorreferencepattern,oreditedandsavedforlateruse.

Pattern Capture

InthisexampleeyediagramviewswerelinkedwithBERtoidentifyandsolveadesignissueinamemorychipcontroller.Theeyediagram(topleft)showsafeatureinthecrossingregionthatisunexpectedandappearinglessfrequentlythanthemaineye.MovingtheBERdecisionpointtoexploretheinfrequenteventsisrevealing.ErrorAnalysisshowsthatthefeaturesarerelatedinsomewaytothenumber24.FurtherinvestigationtracedtheanomalytoclockbreakthroughwithintheIC;thesystemclockwasat1/24thoftheoutputdatarate.Redesigningthechipwithgreaterclockpathisolationgavethecleanwaveformofthetoprighteyediagram.

Using the Power of Error Analysis

www.bertscope.com

Our Promise to YouWehavebeensupplyingthemostdemandingcustomersfornearly20years.Wehavebuiltuplongandtrustingrelationshipswithengineersworkingindemandingenvironmentsofaerospace/defense,telecom/datacom,datastorage,semiconductorandcomputerperipheral,andareproudtobeanimportantpartnerintheirsuccess.Wearecommittedtoprovidingyouwiththebesttoolsavailable.WearesosurethatyouwillbedelightedwiththeBERTScopefamilythatweofferfreetechnicalsupport,astandard1yearwarrantyextendableto3years,1dayofstart-upassistanceuponsystemdelivery,applicationexpertiseandsupport,responsivecalibrationandrepair,andalibraryofweb-basedtechnicalinformation.Allofourinstrumentsareupgradeable–asweadvanceourcapabilites,wewon'tleaveyoustranded.

Copyright©2009SyntheSysResearch,Inc.Allrightsreserved.PrintedinUSA.Specificationssubjecttochange.U.S.andInternationalpatentsgrantedandpending.

SR-DS01331MAR09

3475-DEdisonWayMenloPark,CA94025U.S.A.Voice650364-1853Fax650364-5716info@synthesysresearch.com

Avarietyofusefulapplicationinformationandmeasurementprimersaswellasinformationonotherproductsisavailableforfreedownload.Visitourwebsiteat:www.bertscope.com

BERTScopeproductsaresolddirectlyandthroughrepresentativesthrougouttheworld.To find your closest contact, visit our web site.

BERTScopeisatrademark,andBitAlyzerandErrorLocationsAnalysisareregisteredtrademarksofSyntheSysResearch,Incorporated.PlanerCrownisaregisteredtrademarkofAreoflex/Weinschel.PCIeandPCIExpressareregisteredtrademarksofPCI-SIG.SATAisaregisteredtrademarkofSerialATAInternationalOrganization.DisplayPortisatrademarkoftheVideoElectronicsStandardsAssociation.

BERTScopeModel

7500A S7500B 17500A 17500CSi S12500B-SPG 12500A S12500B

FeaturesFlexiblePatternGeneration ✔ ✔ ✔ ✔ ✔

BERMeasurement ✔ ✔ ✔ ✔ –EyeDiagram,MaskTesting,EyeMeasurements ✔ ✔ ✔ ✔ –BERContour,JitterPeak,ComplianceContour ✔ ✔ –CalibratedStressInsertion ✔ ✔ ✔

ExtendedSJModulationRange ✔BinaryDividedDifferencialClockOutput ✔ ✔ ✔

JitterToleranceTemplates ✔ ✔ –

OptionsOption F2-F/2ClockGeneration – Option – Option OptionOption XSSC-ExtendedSSCwithincreasedSJrange – Option – ✔ OptionOption XS - ExtendedStressGeneratorsforPCIe – – – Option OptionOption ECC-ErrorCorrectionCodingEmulation Option ✔ Option ✔ –Option J-Map-ComprehensiveJitterbreakdownwith Option Option Option Option –Option LDA-LiveDataAnalysis Option Option Option Option –Option MAP-ErrorMappingAnalysis Option ✔ Option ✔ –Option PL-PhysicalLayerTestSuite:BERContour,BasicJitterMeasurements,ComplianceContour Option ✔ Option ✔ –

Option PVu-PatternViewEqualizationProcessing Option Option Option Option –

✔-Standardfeature– -NotAvailableOption-AvailablebyaddingthelistedoptionForcompleteinstrumentspecificationsanddescriptionofavailableoptions,refertotheBERTScopeSignalIntegrityInstrumentsTechnicalSpecificationsdatasheet.

OrderingInformation:

BSA7500A BERTScope7.5Gb/sPatternGeneratorandErrorDetectorBSA7500B BERTScopeS7.5Gb/sStressedPatternGeneratorandErrorDetectorBSA75B-PCIE 7.5Gb/sBERTScopeSAnalyzerwithPCIeStressGenerationBSA12500A BERTScope7.5Gb/sPatternGeneratorandErrorDetectorBSA12500B BERTScopeS12.5Gb/sStressedPatternGeneratorandErrorDetectorBSA125B-PCIE 12.5Gb/sBERTScopeSAnalyzerwithPCIeStressGenerationBSA17500A BERTScope17.5Gb/sPatternGeneratorandErrorDetectorBSA17500CSi BERTScopeSi17.5Gb/sStressedPatternGeneratorandErrorDetectorBSA12500B-SPG BERTScopeS12.5Gb/sStressedPatternGenerator

Avarietyofproductaccessories,upgrades,extendedwarrantyandcalibrationservicesareavailable.ContactyourBERTScopesalesrepresentativeforadditionalinformation.

BERTScope Product Family