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Ewald Effinger BE-BI-BLBLM AUDIT 2010
BLM tunnel installation and data acquisition card (BLECF)
Ewald Effinger
AB-BI-BL
Ewald Effinger BE-BI-BLBLM AUDIT 2010
Outline
• Introduction: the BLM System• Tunnel hardware installation• The data acquisition card (BLECF)• Irradiation and additional tests• Test of the monitors and cables• Test of the acquisitions card• Commissioning of the complete BLM system• Tests during operation • System changes due to internal Audit 2008
Ewald Effinger BE-BI-BLBLM AUDIT 2010
Introduction: the BLM System
• 3893 Ionization chambers (IC)• 289 Secondary emission monitors (SEM)• 3 Little Ionization chambers (LIC) (for test measurements) • 669 HV distribution boxes (BJBHT)• 309 Signal patch boxes (BJBAP) • Signal cables for 3m up to 800m length
Ewald Effinger BE-BI-BLBLM AUDIT 2010
Introduction: the BLM System
• 669 BLM data acquisition cards (BLECF)– In the arc the cards are installed underneath the magnets
in a 19’’ create– In the straight section the cards are installed in the nearby
side-tunnels, because of reduced radiation level
Ewald Effinger BE-BI-BLBLM AUDIT 2010
Introduction: the BLM System
• Optical links are connected to 342 threshold comparators (TC) with an optical receiver card on the surface
• 25 VME creates are distributed around the LHC• Each create includes a PowerPC (data logging), a Combiner card
(connected to the beam interlock system), and two timing cards (CISV, CTRP, BOBR)
• USB connected system for test and development
Courtesy of C. Zamantzas
Ewald Effinger BE-BI-BLBLM AUDIT 2010
Tunnel hardware installation
Grounding scheme
• Shielded signal and high voltage cables
• Floating ground to avoid ground
loops
Ewald Effinger BE-BI-BLBLM AUDIT 2010
Tunnel hardware installation
• Schemes of the arc installation
– 6 Ionization chambers
– Filter capacitors and resistors are installed in the IC
– Signal cable length 3 to 11m
Ewald Effinger BE-BI-BLBLM AUDIT 2010
Tunnel hardware installation
• Schemes of the straight section installation
– Ionization chambers
– Filter capacitors and resistors are installed in the IC
– Signal cable length up to 800m
Ewald Effinger BE-BI-BLBLM AUDIT 2010
Tunnel hardware installation
• Schemes of the collimation installation
– Ionization chambers and secondary emission monitors
– Additional 150kΩ resistor installed
– Filter capacitors are installed in the BJBHT
– Signal cable length up to 600m
Ewald Effinger BE-BI-BLBLM AUDIT 2010
Tunnel hardware installation
• Schemes of the dump installation– Ionization chambers and secondary emission monitors– Additional 150kΩ resistor is used in the IC– Filter capacitors are installed in the BJBHT– Filter installed before the BJBAP
Ewald Effinger BE-BI-BLBLM AUDIT 2010
Specification of the acquisitions card
• Radiation tolerant up to 500Gy (20 LHC lifetime)• Reliability level SIL3 ( 10E-6 to 10E-7 failure/h) to damage of
equipment• Current measuring range 2.5pA to 1mA• Accuracy 25% in the range from 1mA to 1nA• Accuracy 100% in the range from 1nA to 10pA• Integration time window 40us• Input current protection ~ 10A @100us• Input voltage protection ~ 1500V @100us• Redundant optical data transfer to surface• Test features for system check• Survey of the card voltage supplies• Survey of detector high voltage supply
Ewald Effinger BE-BI-BLBLM AUDIT 2010
The acquisitions card
Essentials of the input circuit• Current to frequency
converter (CFC)• Balanced charge integrator• No charge loss (“no blind
time”)• Very large dynamic range• Output frequency depends
on input current
Switch
Iin(t)
Referencecurrent
Tresholdcomparator
One-shotT
Iref
Integrator
fout
Switch
Iin(t)
Referencecurrent
Tresholdcomparator
One-shotT
Iref
Integrator
fout
Input Current Output frequency
1mA 5MHz
1uA 5kHz
1nA 5Hz
1pA 5mHz
Ewald Effinger BE-BI-BLBLM AUDIT 2010
The acquisitions card
Measures to fulfill the specification• Irradiation of single components (JFET, OP, Comparator, One shot, …)• Insertion of fast protection diodes, high voltage capacitors, and leaded
resistors on the input • ADC added to decrease response time / increase dynamic range• Automatic feedback loop with DAC to compensate leakage current due to
integrated dose
U nom. = 1500V
Tested with puls 10A@100us
Tested with puls 1500V@100us12 bit ADC AD41240
8 bit DACA5346
No changeNo change
-30 to -80pA
140pA
No change
At 500Gy
Ewald Effinger BE-BI-BLBLM AUDIT 2010
The acquisitions card
• 8 current inputs (CFC)• ADC AD41240 CERN
ASIC • LM4140 voltage
reference• FPGA for data combiner • Two redundant GOH from
CMS (including CERN ASIC)
• Line driver CRT910 CERN ASIC
• DAC AD5346
Ewald Effinger BE-BI-BLBLM AUDIT 2010
The acquisitions card
• Actel antifuse FPGA A54SX72A
• 4024 sequential cells
• 2012 combinational cells
• Total logic usage: 85%
• Pin usage: 100%• 40 MHz clock
Ewald Effinger BE-BI-BLBLM AUDIT 2010
The acquisitions card
GOH 1
GOH 2
CFC
Tripled Inputpins
CFC Counter Ch1 - Ch8
( 8 times )
8 bit counter
2 out of 3
Timing, monitor
and control - signals
Input C
Count Q1
2 out of 3
8 bit counterInput B
8 bit counterInput A
Count Q2
Count A
Count B
Count C
• Tripled redundant logic• 2 x 2 out of 3 voter connected to two GOHs
Ewald Effinger BE-BI-BLBLM AUDIT 2010
Irradiation and additional tests
• Energy : 251.63 [MeV]• Run time : 4488 [sec]• Fluence : 9.712e+11
[p/cm2]• Dose : 4.914e+04 [rad]
• Flux : 2.164e+08 [p/cm2/sec]
• Doserate : 1.095e+01 [rad/sec
• FPGA irradiation up to 491Gy, no corrupt data package received (CRC Error =0)
Ewald Effinger BE-BI-BLBLM AUDIT 2010
Irradiation and additional tests
• Single component irradiation tests
• 54SX72A (FPGA), malfunction at 480 to 790Gy, no SEP detected up to 1x 10¹² p/cm²
• 74HCT123 (one shot), malfunction at 300 to 350Gy components recovered when not irradiated
• All other components were working up to 1500Gy
Ewald Effinger BE-BI-BLBLM AUDIT 2010
Irradiation and additional tests
• Installed test system at HERA, no CRC error occurred for several months
• Temperature test: 0 – 70C passed
• Magnetic field test: 1000Gauss passed, performed for CMS
Ewald Effinger BE-BI-BLBLM AUDIT 2010
Test of the monitors and cables
• All ionization chambers checked with a radioactive source in the Gamma Irradiation Facility (GIF)
• All secondary emission monitors are checked with a radioactive source in the GIF and with beam in H4
• All the cabling is tested for conductivity with a current source
• All the cabling are tested for leakage current with a pico ampere meter
Ewald Effinger BE-BI-BLBLM AUDIT 2010
Test of the acquisitions card
• All inputs of the acquisition card are calibrated in two steps– Maximum current 1mA with Keithley current source– Minimum current 10pA with open inputs
• Automatic final check test of the acquisition card with the BLECFT system– Verification of the calibration and input linearity (10
steps)– Complete functionality of the FPGA including status
bits, HV comparator levels and CRC check
Ewald Effinger BE-BI-BLBLM AUDIT 2010
Commissioning of the complete BLM system
• Tunnel check test of the acquisitions card– Each acquisition card is checked after the installation
in the tunnel with the BLECFT system
• Verification of the signal path of the complete system– Introducing of signal current using a 137CS source on
each ionization chamber– Verification of the signal in Control room display and
database, with a crosscheck of the layout database
Ewald Effinger BE-BI-BLBLM AUDIT 2010
Tests during operation
• Constant 10pA offset current - Check on channel availability
- In case of exceeding limits (no count for more than 100s), a beam dump can be generated
• Continuous status monitoring - Monitoring of voltage supplies and other
status information (CFC- Error, Integrator Level, Temperature, High voltage level)
- Should failure occur, a beam dump can be generated
Ewald Effinger BE-BI-BLBLM AUDIT 2010
Tests during operation
• Continuous check during data transmission
- Checked at each transmission
* Card identity number check
* Frame identity number check
* Cycle redundancy check
- Should failure occur, a beam dump can be generated
Ewald Effinger BE-BI-BLBLM AUDIT 2010
Tests during operation
High Voltage (HV) activation test and HV modulation test
• 100pA added, dynamic test
• Capacitive current injection via chamber electrodes
• Degradation of complete chain can be detected
• In case limits are exceeded, no beam permission given
• To be carried out before each beam fill
Ewald Effinger BE-BI-BLBLM AUDIT 2010
System changes due to internal Audit 2008
Spare production of tunnel equipment
• Production of 100 BLECF launched • Purchase of LSS power supplies• Spare production of tunnel chassis
Additional irradiation test of the BLECF and power supplies
• Irradiation in neutron beamo 5.551 E12 Neutrons/cm2 o Card was still working and no SEU observed
• Irradiation in mixed filed beam in the CNGS test facilityo Total dose of 270Gyo 64.95 1MeV eq. neutrons [1e11*cm-2]o 45. 76 Hadrons>20MeV [1e11*cm-2]o Card was still working and no SEU observed
Ewald Effinger BE-BI-BL
Implementation of a general power reset of the BLECF
• Mezzanine PCB added in all BLECF electronic and tested
• General reset possibility (per point) with to High voltage distribution (operational)
• Separate reset possibility (per BLECF) via WorldFip distribution (partly operational in point 6)
BLM AUDIT 2010
System changes due to internal Audit 2008
Ewald Effinger BE-BI-BLBLM AUDIT 2010
Measurement results
CFC input circuit• Dynamic range
over 8 decadesfrom 1mA to 10pA
• Specified error 100%
• Down to 1nA max error of 6.5%
• Down to 10pA max error of 96%
Output frequency = f (Input current)
1.E-02
1.E-01
1.E+00
1.E+01
1.E+02
1.E+03
1.E+04
1.E+05
1.E+06
1.E+07
1.0E-11 1.0E-10 1.0E-09 1.0E-08 1.0E-07 1.0E-06 1.0E-05 1.0E-04 1.0E-03
I in [A]
f o
ut
[Hz]
Channel 2 Channel 4
Channel 6 Channel 8