Inspire Infrared Nanocharacterization SystemHighest Resolution Nanoscale Chemical, Electrical, and Mechanical Imaging

Atomic Force MicroscopyInnovation with Integrity

Discover New Structural Detail with Highest Resolution Chemical ImagingBruker’s Inspire™ is a nanoscale

characterization system that

extends atomic force microscopy

(AFM) into the chemical regime

by providing infrared absorption

and reflection imaging based on

scattering scanning near-field optical

microscopy—the most powerful technique for

identifying composition at the nanoscale. For the first time, Inspire

makes 10-nanometer spatial resolution infrared chemical mapping widely available

in an easy-to-use, laser-safe package. Inspire instantly correlates nanochemical

information with molecular scale electrical and mechanical measurements that are

only possible with PeakForce Tapping®.

Simply put, Inspire redefines what’s possible with atomic force microscopy.

� Resolve unseen nanochemical detail on an atomic resolution platform

� Expand your research with the widest range of unique modes

� Experience the quickest, easiest, and safest IR nanocharacterization

Image of IR absorption (1750 cm-1) overlaid on height showing chemical separation in thin PS/PMMA film on Si. Image size 10 μm.

“Inspire is really the first fully integrated sSNOM solution. That combined with its PeakForce Tapping capabilities will allow us to perform novel experiments right from the start. I am pleased to partner with Bruker to expand the great potential of sSNOM as a versatile tool for broader scientific discovery.”

– Gilbert C. Walker, Professor of Chemistry, University of Toronto.

PeakForce Tapping—The Most Significant Advance in Nanocharacterization

PeakForce IR delivers:

� Nanoscale chemical and plasmon imaging even on sample types not conducive to TappingMode™

� Instantly correlated PeakForce QNM® quantitative nanomechanical modulus and adhesion mapping.

PeakForce QNM provides:

� Highest resolution, fastest, most quantitative nanomechanical mapping

�Widest operating range for samples, from extremely soft materials (~1 kPa) to hard metals (100 GPa)

PeakForce KPFM™ and PeakForce TUNA™ enable:

� Quantitative work function maps with millivolt sensitivity at the 10-nanometer resolution level

� Conductivity maps even on soft and fragile samples not amenable to contact mode

ScanAsyst® ensures:

� Automatic image optimization for consistent, expert-quality results for all AFM users

�More routinely high-resolution imaging than any other AFM mode

Bruker’s exclusive PeakForce Tapping permits the use of greatly reduced imaging forces, leading to the most consistent, highest resolution AFM imaging, from the softest biological samples to very hard materials. PeakForce IR™ is a revolutionary new technique that combines scattering SNOM (sSNOM) signal acquisition with PeakForce Tapping feedback, providing the full combined set of information and extending chemical and plasmon imaging to new sample types, such as suspended membranes.

PeakForce IR images providing instantly correlated chemical and nanomechanical information of a Polystyrene/LDPE blend. Image size 1 μm x 2 μm.

Polymer brush imaged with ScanAsyst. Image size 2 μm. Sample courtesy of S. Sheiko, University of North Carolina, Chapel Hill.

Height

Modulus

Chemistry

Highest Resolution Nanochemical Imaging on all MaterialsMost Powerful Chemical Mapping Approach

In addition to nanoscale absorption and reflection imaging, Inspire also provides monolayer sensitivity and 10-nanometer lateral resolution, routinely, by employing sSNOM. Inspire succeeds where conventional photothermal approaches fail due to lack of sensitivity and low resolution caused by contact mode imaging. Inspire achieves the highest spatial resolution consistently, from resolving sub-30-nanometer phase separations in block copolymers to detecting monolayers in layered and 2D materials, such as pentacene, boron nitride, and graphene, to interrogating inorganic crystals and many other materials.

Highest Resolution by Design

With sSNOM, as with most AFM modes, a small tip radius is critical to achieving high spatial resolution. A single uncontrolled tip-sample collision caused by system vibration or poor feedback will blunt or contaminate a sharp tip. By building on an atomic-resolution platform with an extremely small and stiff mechanical loop and high response bandwidth, Inspire achieves a lower noise floor than most AFMs, ensuring highest resolution every time and for hours of imaging.

Taking Chemical Mapping to the Next Level

For the first time, Inspire enables chemical imaging to be performed using PeakForce Tapping feedback. Where conventional sSNOM imaging is subject to limitations from stiction on steep side walls, air damping in challenging geometries, vibration of thin membranes, and spatial averaging when dipping into very soft samples, PeakForce Tapping enables Inspire to perform the highest resolution chemical imaging on all samples.

Resolving 10 nm features in IR reflection at 1933 cm-1 on Si/SiO2

IR absorption (top, 1725 cm-1), and height (bottom) of PS-b-PMMA block copolymer, showing sub-30 nm chemical separation. Image size 500 nm.

IR reflection (1900 cm-1) overlaid on height, showing monolayer sensitivity on pentacene. Image size 3.3 μm.

Atomic resolution height image of graphite. The Fourier transform (insert) shows the expected, undistorted hexagonal symmetry.

Widest Range of Nanocharacterization and Unique Imaging Modes

Inspire goes beyond being an integrated solution for nanoscale chemical and optical imaging. It builds on the extensive set of AFM modes and takes full advantage of PeakForce Tapping technology. For example, images of plasmons on graphene and related effects on other 2D materials are easily generated on Inspire. But what are the electronic properties of grain boundaries that reflect plasmon waves? With PeakForce KPFM, Inspire can accurately, quickly, and easily answer this question. PeakForce KPFM successfully maps workfunction with repeatability at the 10mV level and with spatial resolution not attainable in conventional AM-KPFM.

Inspire also can easily generate a nanochemical map of a polymer blend. When a blend constitutes the bulk heterojunction of an organic photovoltaic device, the relationship of nanoscale chemistry to conductivity pathways becomes interesting. Inspire offers PeakForce TUNA to answer this question. PeakForce TUNA has been shown to resolve the lamellar ordering in current maps of thin films of P3HT, achieving a resolution not attainable with conventional, contact mode based approaches.

PeakForce TUNA (A) topography, (B) current, and (C) adhesion maps reveal the influence of an embedded nanotube on P3HT lamellar ordering and current pathways. Image size 500 nm. Image courtesy of Philippe Leclère et al, University of Mons (UMONS) Belgium.

Height (A), adhesion (B), and surface potential (C) images of Sn-Pb obtained with PeakForce KPFM. The workfunction difference is accurately mapped while nanoscale phase structure in the adhesion map is simultaneously revealed. Image size 4 μm.

Graphene plasmonics. Image size 18 μm.

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A

B

B

C

C

Three Steps to Measurement Success

� Select wavelength

� Find hotspot with IR EasyAlign

� Auto set phase

Quickest, Easiest, and Safest IR Nanocharacterization

Inspire is the first laser-safe sSNOM system, and the first one that does not require expertise in aligning free-space laser optics. The infrared laser radiation is completely contained, eliminating any chance of exposure. IR EasyAlign™ reduces alignment to pointing and clicking on a new probe position. The interferometer remains aligned, independent of the laser source and probe. An intuitive user interface with complete integration of laser and detector control ensures a fast, successful setup every time and even automates the acquisition of hyperspectral image stacks. Inspire frees you to focus on your next discovery.

Image stack (top) and associated absorption (red) and reflection (black) spectrum, identifying the hourglass shaped domain as PMMA.

Automated Hyperspectral Imaging

Easily Customize Your System with Accessories and OptionsInspire is a highly expandable platform that can grow with your research needs. You can access additional chemistries by adding more tunable lasers at any time. Adding lasers does not require realignment, and switching between lasers takes only minutes.

Bruker makes it easy to further expand Inspire’s AFM capabilities with the widest available selection of AFM accessories and options. Add optional accessories to image in liquid, under electrochemical control, or under temperature control. Or, add optional application modules to perform additional electrical measurements:

�Conductive AFM (CAFM)

�Tunneling AFM (TUNA)

� PeakForce TUNA

� Scanning spreading resistance microscopy (SSRM)

� Scanning capacitance microscopy (SCM)

� PeakForce KPFM

Inspire also performs nanoscale mechanical and thermal characterization with force volume imaging and optional PeakForce QNM, nanoscale thermal analysis, scanning thermal microscopy, and nanoindentation.

Fluid cell: Probe holder for operation in fluid.

Triangle DNA origami imaged in fluid. Image size 300nm. Sample courtesy of Prof. M. Endo and Prof. H. Sugiyama, Kyoto University.

PeakForce TUNA applications module.

PFTUNA image of vertical nanotubes: Shown are height (left) and current (right), which are impossible to image in contact mode.

Inspire delivers the most complete approach

to nanochemical research, enabling

a vast array of new correlated

measurements, such as combined

chemical, conductivity, and

workfunction mapping down to

the molecular scale. Wherever

your research leads you, Inspire’s

performance and flexibility will help

you expand the frontier of knowledge.

Bruker Nano Surfaces Division

Santa Barbara, CA • USA Phone +1.805.967.1400/800.873.9750 productinfo@bruker.com

www.bruker.com/inspire

Cover application images

Lower left: IR absorption (1730 cm-1) showing chemical separation in PS-PMMA blend (image size 5 μm). Middle: IR absorption (1725 cm-1) of PS-b-PMMA block copolymer (image size 500 nm). Top-right: IR reflection (1097cm-1) of amelogenin protein fibrils (Image size 1μm). Sample courtesy of S. Habelitz, University of CA, San Francisco. Background: IR absorption (870 cm-1) showing graphene plasmonics (image size 2x7 μm).

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Specifications

IR Optics

Integrated and laser-safe scattering SNOM system:Includes all required optics, laser, and detector;High-quality, broadband mid-IR optical components;Lowest noise, liquid N2 -cooled detector;Accurate interferometer control;Tunable quantum cascade laser source with low relative intensity noise;Optimized near-field excitation and collection optics with IR EasyAlign;Additional laser sources can be added

AFM Head Application module-ready AFM head (supports all optional modes)

Scanners125 μm x 125 μm X-Y x 5 μm Z range; Other scanner options available upon request

Controller NanoScope® V Control Station

ComputerIntel i-series , 16GB RAM, 1TB HD, DVD-RW drive, single 30 in. LCD display, Windows 7 Operating System

Software v9.x NanoScope real-time control software; NanoScope v1.5 or later analysis software

Height Noise 30 pm

IR Spatial Resolution 10 nm typical, tip-radius limited

Modes

IR General Imaging Available Material Characterization

� TappingMode IR sSNOM

� PeakForce IR

� PeakForce IR-TUNA and IR-KPFM

� ScanAsyst

� PeakForce Tapping

� TappingMode

� Contact Mode Torsional Resonance Mode

� Scanning Tunneling Microscopy

� Lateral Force Microscopy

� PhaseImaging

� PeakForce QNM

� PeakForce KPFM

� PeakForce Capture

� Force Spectroscopy

� Force Volume

� Nanoindentation

� Electric and Magnetic Force Microscopy

� Coductive AFM

� Tunneling AFM

� Scanning Sprading Resistance microscopy

� Nanoscale Thermal Analysis

� Scanning Thermal Microscopy

� Liquid Imaging

� Electrochemical SPM