ATML Status October 2007 Issue 13

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ATML Status

October 2007Issue 13

An overview of the ATML activity in the ATML focus group and as part of the IEEE

SCC20 sub-committees

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ATML• ATML’s mission is to define a collection of XML-based schemas that

allows ATE and test information to be exchanged in a common format adhering to the XML standard

• ATML defines a framework through which different architectures using XML can be implemented. – defines the components from which users can build their architectures,

whilst being interoperable with other compliant architectures.– Show examples of the net centric services by which this information can

be exchanged across different ATS platforms as part of a maintenance process.

– defines the XML format that these elements.• The ATML specifications will define:

– How to define XML schemas that represent ATE and test information.– A set of XML schemas supporting the exchange of specific ATE and

test information.• The ATML specifications will support:

– services that can be used for exchanging ATE and test information in a distributed net-centric environment.

– services supporting the exchange of specific ATE and test information in specific common areas.

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Key:

ATML Overview and ArchitectureIEEE Std 1671-2006

Test Station (1671.6)

Instrument Description (1671.2)

Test Adapter (1671.5)

Test Configuration (1671.4)

Test Description (1671.1)

In IEEE Ballot Process

Standard passed ballot, in IEEE RevCom

Draft of the Standard

SIMICA Test Results and Session InformationIEEE Std 1636.1-2007

Diagnostics: AI-ESTATEIEEE Std 1232-2002

SIMICA Maintenance Action Information

(1636.2)

UUT Description (1671.3)

ATML Common, HardwareCommon, TestEquipment, and Capabilities (1671)

Standard approved by the IEEE

Errata to Standard approved by the IEEE

Draft revision of a standard

Started

Signal Descriptions: STDIEEE Std 1641-2004

ATML

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SCC20 & ATML Organisations

• The IEEE SCC20 is the standards organisation through which the ATML components (i.e.; schemas and documentation) will be published under various IEEE standards.

• The ATML organisation is an open, independent focus group contributed to by the ATE industry and government agencies to advance the common exchange of test information through the use of XML.– The ATML group provides draft schemas and associated

documents, examples, use cases, requirements and conducts trial use of any ATML components.

– Their findings are submitted to the various SCC20 sub-committees and working groups to advance the IEEE standards associated with the ATML components.

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SCC20 Organisation for 2008

Common, HardwareCommon,

TestEquipment

Key:

Synthetic Instruments:UpConverter,

DownConverter,ARB, Digitizer

Capabilities

SCC20Steering and Administrative

Chair: Mike Seavey (Northrop Grumman)Vice Chair: John Sheppard (Johns Hopkins University)

Secretary: Dave Droste (DRS-TEM)

LiaisonsJohn Sheppard (CS), Joe Stanco & Mark Kaufman (I&M),

Joe Stanco (AES), Bill Ross (DoD), Malcolm Brown (MoD), Les Orlidge (NDIA)

Administrative (ADMIN)Les Orlidge (AAI)

John Sheppard (Johns Hopkins University)

Hardware Interfaces (HI)Co-Chair: Mike Stora (SysIntech)

Co-Chair: Dave Droste (DRS-TEM)Secretary: Dave Droste (DRS-TEM)

Diagnostic and Maintenance Control (DMC)Co-Chair: Tim Wilmering (Boeing)

Co-Chair: Mark Kaufman (NWSC/Corona)Secretary: John Sheppard (Johns Hopkins

University)

Test and ATS Description (TAD)Co-Chair: Ashley Hulme (EADS)

Co-Chair: Ion Neag (Reston Software)Secretary:

Test Information Integration (TII)Co-Chair: Teresa Lopes (Teradyne)

Co-Chair: Chris Gorringe (EADS)Secretary: John Ralph (Northrop Grumman)

IEEE-1505Receiver Fixture Interface

(RFI)

IEEE-P1505.1Common Test Interface Pin

Map

IEEE-1522Testability and Diagnosability

IEEE-1232AI-ESTATE

IEEE-P1636SIMICA

IEEE-P1636.1Test Results and Session

Information

IEEE-P1636.2MAI

IEEE-1546DTIF Guide

IEEE-1445DTIF

IEEE-1641STD

IEEE-716C/ATLAS

IEEE-771Guide to the use of ATLAS

IEEE-P1641.1Guide to the use of STD

IEEE-P1671.1Test Description

IEEE-P1671.2Instrument Description

IEEE-1671ATML Overview and

Architecture

IEEE-P1671.3UUT Description

IEEE-P1671.4Test Configuration

IEEE-P1671.5Test Adapter

IEEE-P1671.6Test Station

ATML Component

Errata

Synthetic Instrument Annexes

IEEE-P1505.22-Tier RFI

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ATML’s 2007 Objectives & Goals• To have the P1671.2 (Instrument Description) Trial-Use Standard:

– written, reviewed and to start the formal ballot process by Apr 2007– Incorporate Synthetic Working Group (SIWG) material by Jul 2007 √– to submit as a trial-use standard by Q2 2008

• To have the P1671.3 (UUT Description) Trial-Use Standard:– written, reviewed and to start the formal ballot process by Feb 2007 √– to submit as a trial-use standard by Q4 2007

• To have the P1671.4 (Test Configuration) Trial-Use Standard:– written, reviewed and to start the formal ballot process by Feb 2007 √– to submit as a trial-use standard by Q4 2007

• To have the P1671.5 (Test Adapter) Trial-Use Standard:– written, reviewed and to start the formal ballot process by Jul 2007 √– to submit as a trial-use standard by Q3 2008

• To have the P1671.6 (Test Station) Trial-Use Standard:– written, reviewed and to start the formal ballot process by Jul 2007 √– to submit as a trial-use standard by Q3 2008

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ATML’s 2007 Objectives & Goals (cont)

• To have the P1671.1 (Test Description) Trial-Use Standard:– written, reviewed and to start the formal ballot process by Aug 2007– to submit as a trial-use standard by Q4 2008

• To have the P1636.1 (Test Results) Trial-Use Standard published √– formal ballot process complete by Sept 2007

• To have candidate schemas for all ATML components in 2007– Q1

• Diagnostics (AI-ESTATE - 1232)• Signal Description (STD - 1641)• All IEEE Std 1671 ATML Components (P1671.1 thru P1671.6 &P1636.1) √

– Q2• Maintenance Action Information (MAI - P1636.2)

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Standards & Schema Revisions (1 of 2)

Project or Standard

Project or Standard Number

Document & Draft Number XML Schema Name

XML Schema Version Number

Common.xsd 2.00 (Note 1,3)HardwareCommon.xsd 2.01 (Note 1,3)

TestEquipment.xsd 0.14 (Note 3)Errata: Annex C

Draft 1.1Capabilities.xsd 0.03 (Note 2,3)

ATML Test Description

P1671.1 P1671.1 Draft 0.4 TestDescription.xsd 0.15

InstrumentDescription.xsd 0.24InstrumentInstance.xsd 0.03

UUTDescription.xsd 1.00UUTInstance.xsd 1.00

ATML Test Configuration

IEEE Std 1671.4-2007

- TestConfiguration.xsd 1.01

TestAdapterDescription.xsd 0.08TestAdapterInstance.xsd 0.08

TestStationDescription.xsd 0.08TestStationInstance.xsd 0.08

Note 2: Capabilities will be included in next publication (~Jan 2009)

indicates project is a published standardindicates project is in the ballot process

Note 3: Annex B & C will be handled as Errata until next publication (~Jan 2009)

Note 1: Schema version 1.01 is posted on the IEEE download site (as of May 2007)

P1671.6 Draft 4P1671.6ATML Test Station

P1671.2 Draft 7P1671.2ATML Instrument

DescriptionATML UUT Description

IEEE Std 1671.3-2007

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IEEE Std 1671™-2006

ATML Overview and Architecture

Errata: Annex B Draft 9.0

P1671.5 Draft 5P1671.5ATML Test Adapter

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Standards & Schema Revisions (2 of 2)

Project or Standard

Project or Standard Number

Document & Draft Number XML Schema Name

XML Schema Version Number

SIMICA Test Results and Session Information

IEEE Std 1636.1™-2007

- TestResults.xsd 2.02

SIMICA Maintenance Action Information

(MAI)P1636.2 Not Available MAI.xsd 0.11

AI-ESTATEIEEE Std

1232™-2002Note 4 Note 5 -

STDIEEE Std

1641™-2004Note 6 Note 7 -

Note 5: XML schemas associated with the EXPRESS models are being developed

Note 7: The XML schemas included in STD are being updatedNote 6: STD (IEEE Std 1671-2004) is being updated, expected to go to ballot in 2008

indicates project is a published standardindicates project is in the ballot process

Note 4: AI-ESTATE (IEEE Std 1232-2002) is being updated, expected to go to ballot in 2008

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ATML Overview & Architecture (IEEE 1671)

• IEEE Std 1671-2006– Published December 2006– Common schema Version 1.01– HardwareCommon Version 1.01

• Errata Document to “replace” published Annex B– Presently at Draft 9.0– Errata until 2009

• Common schema Version 2.00• HardwareCommon schema Version 2.01• TestEquipment schema Version 0.14

– Published IEEE Std 1671™-2006 did not include Test Equipment

• ATML Capabilities– Proposed as “new” Annex C

• Errata to IEEE Std 1671 until 2009– Annex Document presently at Draft 1.1– Capabilities schema Version 0.13

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ATML Test Description (P1671.1)

Task Date (month/day/year)

Draft Standard Draft 0.4 available for review

Upload Draft Document to IEEE MEC

MEC Approval

Invitation to Ballot

Initiate Ballot

Ballot Closed

Initial Ballot Results -

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ATML Instrument Description (1671.2)


Draft Standard Draft 6: 09/04/07 Incorporates Synthetic Instruments as Annexes: Up-converter, Down-Converter, ARB, Digitizer


09/04/07

MEC Approval 10/12/07


Initiate Ballot

Ballot Closed


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ATML UUT Description (1671.3)Task Date (month/day/year)

Draft Standard Draft 3: 03/03/07


03/03/07


Invitation to Ballot 04/25/07

Initiate Ballot Draft 6: 06/13/07

Ballot Closed 07/13/07

Initial Ballot Results - Passed

Number of Balloters = 55

45 Responded 81.8% (≥ 75% of balloters)

Affirmative = 40

Negative = 2

Abstain =3

Approval Rate 95.2% (≥ 75% of returned ballots)

Abstain Rate 6.7%

Number of Comments = 118

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ATML UUT Description (cont)Task Date (month/day/year)

Ballot Resolution 07/13/07-09/05/07 All 118 comments have been addressed Regardless of classification or vote

Re-circulation path has been taken. IEEE editors could not have resolved some of these comments on there own. The XML schema was modified.

Re-Circulation Ballot Draft 8: 09/05/07

Re-Circulation Ballot Closed

09/14/07

Recirculation Ballot Results - Passed



Affirmative = 44

Negative = 2

Abstain =2 (1 Lack of time, 1 Other)


Abstain Rate 4.2%

Number of Additional Comments = 22

IEEE RevCom Submittal Package

10/09/07

IEEE RevCom Meeting

12/04/07 preliminary RevCom comments by late November 2007

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ATML Test Configuration (1671.4)




03/03/07


Invitation to Ballot 04/25/07

Initiate Ballot Draft 6: 06/13/07

Ballot Closed 07/13/07

Initial Ballot Results - Passed



Affirmative = 39

Negative = 2

Abstain =3


Abstain Rate 6.8%

Number of Comments = 102

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ATML Test Configuration (cont)Task Date (month/day/year)

Ballot Resolution 07/13/07-09/05/07 All 102 comments have been addressed Regardless of classification or vote

Re-circulation path has been taken. IEEE editors could not have resolved some of these comments on there own. The XML schema was modified.

Re-Circulation Ballot Draft 9: 09/05/07

Re-Circulation Ballot Closed

09/14/07

Recirculation Ballot Results - Passed



Affirmative = 44

Negative = 1

Abstain =2 (1 Lack of time, 1 Other)


Abstain Rate 4.3%

Number of Additional Comments = 1

IEEE RevCom Submittal Package

10/02/07

IEEE RevCom Meeting

12/04/07 preliminary RevCom comments by late November 2007

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ATML Test Adapter (P1671.5)




10/01/07



Initiate Ballot

Ballot Closed


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ATML Test Station (P1671.6)




10/01/07

MEC Approval


Initiate Ballot

Ballot Closed


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ATML/SIMICA (IEEE-1636.1 &P1636.2)

• SIMICA:Test Results and Session Information– IEEE Std 1636.1-2007

– TestResults schema Version 2.02

• SIMICA:Maintenance Action Information (MAI)– Draft standard under development

– Draft MAI schema Version 0.11

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2008 Meeting Schedule• Face-to-Face Meetings:

– Jan. TBD; possibly Orlando, FL (Lockheed Martin)

– Apr. TBD; SCC20 08-1 possibly St. Louis, MO (Boeing) or Boston, MA (The Mathworks)

– Jun./Jul. TBD; Open - no meeting presently planned

– Sept. TBD; SCC20 08-2 possibly Salt Lake City, UT• In conjunction with AUTOTESTCON

– Oct./Nov. TBD; Open - no meeting presently planned

• Additionally:– Bi-Weekly Teleconferences– 4 Meetings a year plus additional break-out working groups as

necessary– Synchronise with SCC20 meetings

Documents

ATML Status October 2007 Issue 13