ATML StatusOct 2005

An overview of the ATML activity in the ATML focus group and as part of the IEEE

SCC20 sub-committee

ATML• ATML’s mission is to define a collection of XML-based schemas that

allows ATE and test information to be exchanged in a common format adhering to the XML standard

• ATML defines a framework through which different architectures using XML can be implemented. – defines the components from which users can build their architectures,

whilst being interoperable with other compliant architectures.– Show examples of the net centric services by which this information can be

exchanged across different ATS platforms as part of a maintenance process

– defines the XML format that these elements will take.• The ATML specifications will define:

– How to define XML schemas that represent ATE and test information– A set of XML schemas supporting the exchange of specific ATE and test

information– Example services that can be used for exchanging ATE and test

information in a distributed net-centric environment.– A set of services supporting the exchange of specific ATE and test

information in specific common areas.

UUTDescription

(1671.3)

Test AdaptorTest Station

InstrumentDescription

(1671.2)

Test Configuration

Test Description(1671.1)

Test Results(1632.1)

Diagnostics(1232)

Candidate

Reviewed Draft

Started

ATML Framework

SIMICA1632 Drafts 1

SCC20 & ATMLOrganisations

• The IEEE SCC20 is the standards organisation through which the ATML components (Documents) will be published under various IEEE standards.

• The ATML organisation is an open, independent focus group contributed to by the ATE industry and government agencies to advance the common exchange of test information through the use of XML.– The ATML group provides draft schemas and associated

documents, examples, use cases, requirements and trials any ATML components

– Their findings are submitted to the various SCC20 sub-committees and working groups to advance the IEEE standards associated with the ATML components

SCC-20 Organization for 2005Incorporating the ATML Components

SCC-20Steering & Administrative

Chair: Les Orlidge (AAI) - Vice Chair: John Sheppard (ARINC)Secretary - Dave Droste (DRS TEM)

Administrative/Procedural (ADMIN)Mike Seavey (Northrop-Grumman)Narayanan Ramachandran (TYX)

LiaisonsJohn Sheppard (CS), Joe Stanco & Mark Kaufman (I&M), Joe Stanco (AES),

Bill Ross (DoD), Malcolm Brown (MoD), Les Orlidge(NDIA)

Hardware Interfaces (HI)Co-Chair - Mike Stora (SysIntech)Co-Chair - Dave Droste (DRS TEM)

IEEE-P1552Structured Architecture for Test

Systems (SATS)

IEEE-P1505Receiver-Fixture Interface (RFI)

Diagnostic and Maintenance Control (DMC)Co-Chair - Tim Wilmering (Boeing)

Co-Chair - Mark Kaufman (NSWC/Corona Div)

IEEE-P1522Testability & Diagnosability

IEEE-1232AI-ESTATE

Test Description (TD)Co-Chair - Keith Ellis (ApSys)

Co-Chair – Ion Neag (TYX)

IEEE-1641Signal and Test Definition (STD)

IEEE-716ATLAS

IEEE-771Guide to the Use of ATLAS

IEEE-P1636Software Interface for Maintenance Information

Collection Analysis (SIMICA)

IEEE-1445Digital Test Interchange Format (DTIF)

IEEE-1546DTIF Guide

Test Information Integration (TII)Co-Chair – Chris Gorringe (Racal)

Co-Chair – Mike Seavey (Northrop Grumman)

IEEE-P1671ATML Overview and Architecture

IEEE-P1636.1ATML Test Results

Test Description

Instrument Description

Test Station

Test Adapter

ATML IEEE Stds with PARS

Expected ATML Components without PARS

SCC20 IEEE Std

Test Configuration

UUT Description

IEEE-P1641.1Signal and Test Definition User Guide

Key Assigned within SCC20

ExpectedLocation

SCC-20 ATML PARs Status

• Project Authorisation Request (PAR) need to be approved by the IEEE NESCOM prior to any SCC-20 working group being established.– ATML Framework PAR 1671 Approved– Diagnostics PAR 1232 Existing– Test Results PAR 1636.1 Approved– Test Description PAR 1641.1 Approved– Instrument Description PAR 1641.2 Approved– UUT Description – PAR Review Approved Steering– Test Configuration - PAR Review April 2006– Test Station &Test Adapter - PAR Review April 2006

ATML Objectives & Goals

• To have the P1671 standard written, reviewed and a ballot called by mid-2006, in order to be in a position to submit as a standard by Q4 2006

• To have Candidate Schemas available by End ‘05 for– Test Results– Instrument Description– Diagnostics (AI-ESTATE 1232)

• To have Draft Schemas available by End ‘05 and Candidate schemas for early ‘06

– Test Description– UUT Description

• To have Draft Schemas available by Early ‘06 and candidate schemas for end of ‘06

– Test Adaptor– Test Station– Test Configuration– SIMICA (Joe’s work)

ATML/IEEE Schedule(TII)

• TII Sub-committee– Operating Instructions (April 2005) √

• ATML Framework 1671 (Chris Gorringe/Mike Seavey)– IEEE Par Approved (Nov 2004) √– ATML Framework Draft (Review April 2005) √– ATML Framework Requirements (Review April 2005) √– ATML Framework Draft Document (H) (Oct 2005) √– ATML Framework Ballot (May 2006)

• UUT Description (John Ralph)– Requirements (April 2005) √– Draft Schema (Review June 2005) √– Draft 2 Schema review (October 2005)– Ballot Date (2007)

• Test Configuration (Tim Davis)– Start (April 2005) √– Requirements (July 2005) √– Draft Schema (Review Oct 2006) √– Ballot date (2008)

• Capability (Dan Pleasant)– Requirements (Sept 2005) √

ATML Schedule(DMC)

• Diagnostics (Tim Wilmering)– AI-Estate Amendment (Dec 05)

• (a) AI-ESTATE (1232) is working on an update to the -2002 published standard.• The PAR has not yet been approved by the IEEE-SA (it missed the deadline for the

Standards board meeting).

– P1636 SIMICA Draft (April 2006) (Joe Stanco)• (b) SIMICA is working to get to an initial Ballot.

– Diagnostic Candidate (Jan 2006)– Ballot (Jan 2007)

• Test Results 1636.1 (John Ralph?)– ATML Candidate (Dec 2004) √– PAR Approved (Mar 2005) √– DMC Requirements Document (Review April 2005) √– 1636.1 Draft (Review April 2005) √

• Draft 2 posted with DMC (Oct 2006) √– Test Results Ballot (Jan 2006)

ATML ScheduleTAD

• Test Description P1671.1 (Ion Neag)– Draft Schema review (Oct 2005)

• The spec is developed by Mike Seavey and Ion• They handle separate sections that we will merge when creating the Draft version.

– Candidate Schema (Jan 2006)– PAR (Oct 2005) √– Ballot Date (Jan 2007)

• Instrument Description P1671.2 (Teresa Lopes)– Draft Schema review (July 2005)√– Candidate Schema (Jan 2006)– PAR (Oct 2005) √– Ballot Date (May 2007)

• Test Station & Test Adapter (Tamara Einspanjer– Start (April 2005) √– Requirements (July 2005) √– Draft Schema (Oct 2006)– Ballot date (2008)

ATML Meeting Schedule

• Bi-Weekly Teleconferences• 4 Meetings a year plus additional break-out

working group as necessary• Synchronise with SCC20/01 meetings

– Oct 25-27th Austin Tx (NI)– Jan 17-19th Orlando (LM)– April/May SCC20 Madrid (Indra?)– July/Aug TBD– ATC2006 Anaheim – SCC20, TII Management Only– Oct/Nov TBD