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Smart Modular Technologies Santa Clara, CA USA August 2010 Apples to Apples, Pears to Pears in SSS Performance Benchmarking Esther Spanjer Director, SSD Marketing

Apples to Apples, Pears to Pears in SSS Performance ... · PDF fileApples to Apples, Pears to Pears in SSS Performance Benchmarking Esther Spanjer ... •Spec 1.0 focus on Enterprise

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Smart Modular Technologies

Santa Clara, CA USA

August 2010

Apples to Apples, Pears to Pears in

SSS Performance Benchmarking

Esther Spanjer

Director, SSD Marketing

Smart Modular TechnologiesSmart Modular Technologies

Santa Clara, CA USA

August 2010 2

Santa Clara, CA USA

August 2010

The Performance LandscapeOne Year Later

IOPS?Random Precondition

Sustained Speed?

Up to?

MB/s or Mb/s?

Random or

Sustained?

Block Size?

Smart Modular TechnologiesSmart Modular Technologies

Market Segmentation

Santa Clara, CA USA

August 2010 3

Client SSD

• Low cost

• C-MLC

• 0-7% over provisioning

• No supercap

• No Enterprise features

• No customization

• Warranty 1-3 yrs

Enterprise SSD

• Higher cost

• E-MLC/SLC

• 28-50% over provisioning

• Supercap support

• Enterprise features

• Customization

• Warranty 5 yrs

Smart Modular TechnologiesSmart Modular Technologies

Santa Clara, CA USA

August 2010

Performance ComparisonEnterprise vs. Client SSD

0

50

100

150

200

250

300

350

400

MB

/s

Sequential Read

Enterprise SSD (SATA)

Enterprise SSD (SAS)

Client SSD 1 (SATA)

Client SSD 2 (SATA)

0

50

100

150

200

250

300

350

400

MB

/s

Sequential Write

Enterprise SSD (SATA)

Enterprise SSD (SAS)

Client SSD 1 (SATA)

Client SSD 2 (SATA)

0

10,000

20,000

30,000

40,000IO

PS

Random Write

Enterprise SSD (SATA)

Enterprise SSD (SAS)

Client SSD 1 (SATA)

Client SSD 2 (SATA)

0

20,000

40,000

60,000

80,000

100,000

IOP

S

Random Read

Enterprise SSD (SATA)

Enterprise SSD (SAS)

Client SSD 1 (SATA)

Client SSD 2 (SATA)

Smart Modular TechnologiesSmart Modular Technologies

Variables influencing Performance

• Platform

• Test Hardware (CPU, interface, chipset, etc)

• Software (OS, drivers)

• SSS Device Architecture

• Flash geometry, cache, flash management algorithm, etc

Santa Clara, CA USA

August 2010

Smart Modular TechnologiesSmart Modular Technologies

Variables influencing Performance

• Platform

• Test Hardware (CPU, interface, chipset, etc)

• Software (OS, drivers)

• SSS Device Architecture

• Flash geometry, cache, flash management algorithm, etc

• Workload

1. Write history & preconditioning: State of device before

testing

Santa Clara, CA USA

August 2010

Smart Modular TechnologiesSmart Modular Technologies

The need for Preconditioning

Santa Clara, CA USA

August 2009 7

0

0.2

0.4

0.6

0.8

1

1.2

0 50 100 150 200 250 300

No

rma

lize

d IO

PS

(IO

PS

/Ma

x(I

OP

S))

T ime (Minutes)

Performance States for Various SSDs

NM (MLC) NS (SLC) JS (SLC) PSM (MLC) JM (MLC)

FOB

Transition

Steady State (desirable test range)

Smart Modular TechnologiesSmart Modular Technologies

0

5000

10000

15000

20000

25000

30000

35000

40000

45000

20

60

100

140

180

220

260

300

340

380

420

460

500

540

580

620

660

700

740

780

820

860

900

940

980

1020

1060

1100

1140

1180

1220

1280

1320

1360

1400

1440

1480

1520

1560

1600

1640

1680

IOPS

Time (Minutes)

4K Random to 128K Sequential Transition

Write History - 1

Santa Clara, CA USA

August 2010 8

4K Steady State

F.O.B. (~1hr)

Random to Sequential Transition (~1.5hr)

128K Steady State

Smart Modular TechnologiesSmart Modular Technologies

Write History - 2

Santa Clara, CA USA

August 20109

0

500

1000

1500

2000

2500

3000

3500

4000

4500

20

60

100

140

180

220

260

300

340

380

420

460

500

540

580

620

660

700

740

780

820

860

900

940

980

1020

1060

1100

1140

1180

1220

1280

1320

1360

1400

1440

1480

1520

1560

1600

1640

1680

128K Sequential to 4K Random Transition

4K

Steady

State

128K Steady State

F.O.B.~10 hrs

Smart Modular TechnologiesSmart Modular Technologies

Variables influencing Performance

• Platform

• Test Hardware (CPU, interface, chipset, etc)

• Software (OS, drivers)

• SSS Device Architecture

• Flash geometry, cache, flash management algorithm, etc

• Workload

1. Write history & preconditioning: State of device before

testing

2. Workload pattern: Read/write mix, transfer size,

sequential/random

Santa Clara, CA USA

August 2010

Smart Modular TechnologiesSmart Modular Technologies

Santa Clara, CA USA

August 2010

Workload Pattern

Santa Clara, CA USA

August 2009

0.5

2

8

1024

0.0

500.0

1000.0

1500.0

2000.0

2500.0

3000.0

3500.0

4000.0

0/100 10/90 20/80 35/65 65/3580/20

90/10100/0

Blo

ck S

ize

(K

B)

IOP

S

R/W Mix (%)

3D IOPS Surface Profile

0.0-500.0 500.0-1000.0 1000.0-1500.0 1500.0-2000.0

2000.0-2500.0 2500.0-3000.0 3000.0-3500.0 3500.0-4000.0

Performance

depends on

Read/Write Mix

Block Size

Queue Depth

(not shown)

Note: Shown 3D IOPS image

courtesy of Calypso Systems

Smart Modular TechnologiesSmart Modular Technologies

Variables influencing Performance

• Platform

• Test Hardware (CPU, interface, chipset, etc)

• Software (OS, drivers)

• SSS Device Architecture

• Flash geometry, cache, flash management algorithm, etc

• Workload

1. Write history & preconditioning: State of device before

testing

2. Workload pattern: Read/write mix, transfer size,

sequential/random

3. Data Pattern: The actual bits in the data payload written to

the deviceSanta Clara, CA USA

August 2010

Smart Modular TechnologiesSmart Modular Technologies

Santa Clara, CA USA

August 2010

Dependency on data content - 1

0.5

2

8

32

128

512

0

5,000

10,000

15,000

20,000

25,000

30,000

35,000

0/10010/90

20/8035/65

65/3580/20

90/10100/0

Transfer Size (KB)

IOPS

R/W Mix %

3D IOPS Surface Profile (IOMETER 2008)

30,000 - 35,000

25,000 - 30,000

20,000 - 25,000

15,000 - 20,000

10,000 - 15,000

5,000 - 10,000

0 - 5,000

Smart Modular TechnologiesSmart Modular Technologies

0.5

2

8

32

128

512

0

5,000

10,000

15,000

20,000

25,000

30,000

35,000

0/10010/90

20/8035/65

65/3580/20

90/10100/0

Transfer Size (KB)

IOPS

R/W Mix %

3D IOPS Surface Profile (IOMETER 2008)

30,000 - 35,000

25,000 - 30,000

20,000 - 25,000

15,000 - 20,000

10,000 - 15,000

5,000 - 10,000

0 - 5,000

Dependency on data content - 2

14

0.51

24

816

32

64

128

256

512

1024

0

5,000

10,000

15,000

20,000

25,000

30,000

35,000

0/10010/90

20/8035/65

65/3580/20

90/10100/0

Transfer Size (KB)

IOPS

R/W Mix %

3D IOPS Surface Profile (IOMETER 2006)

30,000 - 35,000

25,000 - 30,000

20,000 - 25,000

15,000 - 20,000

10,000 - 15,000

5,000 - 10,000

0 - 5,000

IOMeter 2006

High Entropy Data Content

IOMeter 2008

Low Entropy Data Content

Smart Modular TechnologiesSmart Modular Technologies

Santa Clara, CA USA

August 2010

Test Suite Client SSDEnterprise

SSD

PCMark HDD Score, OS and application loading timing,

user simulation (surfing web, windows media

player, etc)√

SysMark System-level test. Measures performance based

on average response time, gives score (0-250) √

IOMeter Sequential/Random performance, workload

simulation (file server, web server workload, etc) √ √

HDTach/

H2benchw

Performance stability, Sequential/Burst

performance, Access Time √ √

HD Tune Performance stability, Sequential/Burst

performance, Access Time

Everest Random Access Time (Read/Write) √ √

VDBench Workload generator, performance on DAS and

NAS √

Calypso CTS Device (RAW) level, direct IO synthetic stimulus

generator for both client and enterprise √ √

Benchmark Suites

Smart Modular TechnologiesSmart Modular Technologies

The Need for Industry Standardization!

• SNIA Technical Working Group (TWG)

• Created in early 2009

• Specification for tests procedures to enable

comparative testing of SSS performance

• Agnostic – Does not favor any one technology

• Relevant & Repeatable – Meaningful to end

users

• Practical – Complete with reasonable time and

effort

• Spec 0.9 open for review now

• Spec 1.0 focus on Enterprise vs Client SSS testingSanta Clara, CA USA

August 2010

Smart Modular TechnologiesSmart Modular Technologies

SNIA Performance Specification

1. Prepare the Device

• Purge/Erase put SSD back into “original” state

2. Workload independent preconditioning

• Write data 2x capacity bring device to known state

3. Steady State Testing (includes workload based

preconditioning)

• Run Test Loop up until steady state is achieved

• Performance stays within ± 10% margin

4. Test Report

• Steady state convergence

• Steady State Verification

• Performance measurement (2D/3D)Santa Clara, CA USA

August 2010

Smart Modular TechnologiesSmart Modular Technologies

• SSSI Group of SNIA

• Technical Work Group (TWG) Performance

Benchmark Spec

• Tech Dev Group Performance Test Platform

• JEDEC 64.8

• Specification for SSD endurance measurement

• SSDA

• Testing of reliability (power cycling, data retention,

endurance, etc) and OS compatibility (Windows 7)

Other Standardization Initiatives

Santa Clara, CA USA

August 2010

Smart Modular TechnologiesSmart Modular Technologies

Summary

• SSS Performance is dependent on many

variables

• Comparing vendors is not trivial industry

standard required

• SNIA Performance Specs allows

apples to apples comparison

• Spec for review at

http://www.snia.org/tech_activities/publicreview

• Send your feedback to [email protected]

Santa Clara, CA USA

August 2010

Smart Modular TechnologiesSmart Modular Technologies

Santa Clara, CA USA

August 2009 20

Thank you!