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NIST GCR 16-009
An Analysis of References from US
Patents to NIST-Supported
Technical Outputs
Anthony Breitzman Sr, Ph.D.
Patrick Thomas, Ph.D.
1790 Analytics, LLC
This publication is available free of charge from:
http://dx.doi.org/10.6028/NIST.GCR.16-009
NIST GCR 16-009
Prepared for
U.S. Department of Commerce
Economic Analysis Office
National Institute of Standards and
Technology Gaithersburg, MD 20899
By
Anthony Breitzman, Sr. Ph.D.
Patrick Thomas, Ph.D.
1790 Analytics, LLC
This publication is available free of charge from:
http://dx.doi.org/10.6028/NIST.GCR.16-009
September 2016
U.S. Department of Commerce
Penny Pritzker, Secretary
National Institute of Standards and Technology
Willie May, Under Secretary of Commerce for Standards and Technology and Director
An Analysis of References from US
Patents to NIST-Supported
Technical Outputs
Disclaimer
This publication was produced as part of contract SB1341-14-SE-0422with the National
Institute of Standards and Technology. The contents of this publication do not necessarily
reflect the views or policies of the National Institute of Standards and Technology or the
US Government.
Table of Contents
I. Introduction .................................................................................................................. 1
II. Project Design ............................................................................................................. 1
III. Methodology .............................................................................................................. 3
Citing Document Set: Granted US Patents ..................................................................... 3
Cited Document Set: NIST Technical Outputs ............................................................... 4
Cited Document Category 1: Patents Assigned to NIST ............................................. 4
Cited Document Category 2: Patents with a NIST Government Interest .................... 4
Cited Document Category 3: NIST-Funded Peer Reviewed Papers ........................... 5
Cited Document Categories 4-11: NIST Grey Literature ............................................ 7
Summary of Document Sets .......................................................................................... 11
IV. Results ....................................................................................................................... 11
Organization-Level Results ........................................................................................... 11
Overall NIST Citation Counts ................................................................................... 11
Trends in NIST Citation Counts ................................................................................ 12
Benchmarking NIST Citation Counts ........................................................................ 13
Patents Citing NIST Technical Outputs .................................................................... 17
Document-Level Results ............................................................................................... 19
V. Conclusions ................................................................................................................ 22
VI. Appendix: Figures and Tables ................................................................................ 24
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Executive Summary
This report outlines the results of an analysis – carried out by 1790 Analytics on behalf of
NIST’s Economic Analysis Office – designed to evaluate the technological impact of technical
outputs associated with NIST.
The analysis is based primarily on locating technical outputs – such as patents, scientific
journal articles, standards documents, conferences papers, and other forms of grey literature –
associated with NIST funding. We then trace forward from these technical outputs to determine
how they have influenced subsequent technological developments, specifically those
developments described in patents assigned to all organizations.
The idea behind this analysis is that patents that reference NIST technical outputs as prior art
build in some way on these NIST outputs. By determining how frequently NIST technical
outputs have been cited by subsequent patents, it is thus possible to evaluate the extent to which
NIST funded activities have helped form the foundation for a wide range of technologies.
The main findings of this report are:
Between January 1995 and July 2015, there were a total of 34,241 citations from US
patents to NIST-supported technical outputs. This is an impressive figure, especially
given the fact that NIST had only 201 US patents assigned to it through the end of
2014. It suggests that NIST’s influence extends far beyond just its own patented
inventions, and that the agency’s activities help form the foundation for technological
developments made by a wide range of other organizations.
We divided the citations from US patents to NIST into four broad categories, based on
the type of NIST technical output cited. The four categories are: patents assigned to
NIST; patents in which NIST has a government interest; peer reviewed papers funded
by NIST; and NIST grey literature.
14,538 (43%) of the 34,241 citations from US patents to NIST outputs are to peer
reviewed papers authored by NIST-supported researchers; 9,062 (26%) are to patents
in which NIST has a government interest (i.e. patents resulting from research funded
by NIST in an external organization); and 2,173 (6%) are to patents assigned to NIST.
The remaining 24% of citations from US patents to NIST technical outputs are to NIST
grey literature. The largest of these grey literature categories is software, standard
reference databases and algorithms, which accounts for 2,914 (8%) of citations from
US patents to NIST documents. Other grey literature categories that receive significant
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numbers of citations are Official NIST Publications (1,671 citations, or 5%);
Educational Networking (1,267 citations, 4%); and Other NIST Publications (1,740
citations, 5%). The final four grey literature categories together account for only 2.5%
of citations from US patents to NIST documents.
In terms of trends over time, there was a more than a ten-fold increase in citations from
US patents to NIST technical outputs between 1995 and 2014.
Citations to each of the NIST document types (patents assigned to NIST; patents in
which NIST has a government interest; peer reviewed papers funded by NIST; and
NIST grey literature) all increased significantly between 1995 and 2014. The largest
increases were associated with NIST peer reviewed papers and NIST government
interest patents.
Over the same time period, the overall number of citations provided by US patents also
increased significantly. This was due to increases in the number of patents issued each
year, and also in the mean number of prior art references listed on patents. We therefore
benchmarked citations to NIST against citations to comparable document sets in order
to account for these broader changes in the citation landscape.
We benchmarked citations to NIST patents (both those assigned to NIST, and those in
which NIST has a government interest) using our quantitative, normalized patent
metrics. These metrics reveal that NIST-supported patents (especially those with a
NIST government interest) have a stronger impact, are more generally applicable, and
are more original than peer patents of the same age and technology.
The highest impact NIST-assigned patent (in terms of our normalized Citation Index
metric) is US #5,356,756, which was issued in 1994. This patent describes materials
processing for thin films, designed for use in sensors, electronic devices and sample
analysis. It has been cited as prior art by 110 subsequent patents, more than seven times
as many citations as expected for a patent of its age and technology.
The highest impact patent in which NIST has a government interest is US #7,330,404.
This patent has been cited by 127 subsequent patents since it was issued in 2008, which
is more than 40 times as many citations as expected given its age and technology. It
describes a transducer for use in optical storage (for example in disk drives), and is
assigned to Seagate Technology.
We benchmarked citations to NIST peer reviewed papers against citations from the
most prolific patenting companies to papers in journals published by the leading
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publishers. Between 2000 and 2014, citations to NIST papers from all patents increased
at a faster rate than citations from the patents of leading companies to papers in leading
journals. This is an impressive finding, given that the comparison set is highly selective,
and only includes leading companies and journal publishers.
The most highly cited NIST peer reviewed paper was published in Science in 1995, and
describes sequencing of the H.influenzae genome (the first example of a free-living
organism having its entire genome sequenced). It has been cited by 277 subsequent
patents (and over 5,000 papers, according to Google Scholar).
We benchmarked citations from US patents to NIST grey literature against citations
from US patents to grey literature from Massachusetts Institute of Technology (MIT).
Overall, citations to NIST grey literature grew almost nine-fold between 2000 and
2014. This is higher than the growth rate associated with citations to MIT grey
literature, although the difference is only slight. Even so, outperforming a prestigious
institution such as MIT on this metric is an impressive feat.
The most highly cited items of NIST grey literature are the Federal Information
Processing Standards (FIPS) publications outlining the Advanced Encryption Standard
(FIPS 197); the Secure Hash Standard (FIPS 180); and the Digital Signature Standard
(FIPS 186). These standards documents have been cited by hundreds of subsequent US
patents.
We also analyzed the US patents that cite NIST technical outputs as prior art, focusing
on the distribution of these patents by technology, industry, and assignee.
More than one-fifth of the 34,000+ citations to NIST come from patents related to
Computer Hardware & Software; and more than one-third are from that category plus
Communications. Other major citing categories are Measuring & Testing, and
Semiconductors & Electronics.
A large number of citations from Computer Hardware & Software and
Communications patents are to FIPS documents such as the Secure Hash Standard
(FIPS 180) and the Advanced Encryption Standard (FIPS 197). Also highly cited are
various NISTIRs and NIST special publications, which often describe the contents of
the FIPS documents.
IBM and Microsoft cite NIST most extensively, followed by Calcitec (a medical
devices firm), 3M and Micron Technology. Both IBM and Microsoft build heavily on
NIST grey literature, as do Intel, Cisco and Hewlett-Packard. Meanwhile, Calcitec
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builds primarily on NIST peer reviewed papers, as do the University of California and
Michigan State University, plus the US Department of Commerce (which includes
citations from NIST’s own patents to NIST papers). NIST’s patents are cited most
heavily by 3M, Western Digital and Cree.
In terms of industries, Universities cite NIST technical outputs most extensively,
followed by Semiconductor companies, Software companies, and Communications
companies. Other industries that cite NIST outputs extensively are Medical
Equipment/Instruments, Computer Systems and Electronics.
Overall, the analysis presented in this report reveals that there has been a significant
increase over time in citations from US patents to NIST technical outputs. These
citations are from patents owned by organizations across a broad range of industries,
describing a wide variety of technologies. Our analysis also demonstrates how the
increase in citations to NIST outstrips citations to comparable document sets. This
suggests that NIST’s technical outputs have had a strong, and growing, impact on
technological developments.
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I. Introduction
This report outlines the results of an analysis designed to evaluate the technological
impact of technical outputs associated with the National Institute of Standards and
Technology (NIST). NIST funds a wide range of technical activities and research,
resulting in many different types of published outputs. However, NIST itself has
relatively few patents assigned to it. In order to assess NIST’s influence on technological
developments, it is thus necessary to look beyond simply the agency’s portfolio of
granted patents.
The analysis presented in this report is designed to provide a detailed evaluation of
NIST’s technological impact. It is based primarily on locating technical outputs – such as
patents, scientific journal articles, standards documents, conferences papers, and other
forms of grey literature – associated with NIST funding. We then trace forward from
these technical outputs to determine how they have influenced subsequent technological
developments, specifically those developments described in patents assigned to all
organizations. In this way, it is possible to discern NIST’s impact on innovations
developed by organizations of all types and sizes, across all technologies and industries.
This report contains three further sections. The first of these sections provides an
overview of the project design, and the evaluation techniques used in the analysis. The
second section outlines the methodology used to carry out the analysis, including how the
various data sets were constructed. The third section contains the results of the analysis,
examining the impact of NIST funded technical outputs on subsequent technological
developments.
II. Project Design
The analysis presented in this report centers upon connections between generations of
research that are made by prior art references listed on patent documents. The purpose of
these prior art references is to detail the state of the art at the time of the patent application,
so that the applicant can demonstrate how the new invention is original over and above this
prior art. These references may consist of many different types of documents. A large
number of the references are to earlier patents and published patent applications; while
others are to scientific journal articles and conference proceedings; and others are to
standards, technical reports, magazines and newspapers.
The responsibility for adding prior art references differs across patent systems. In the US
system, it is the duty of patent applicants and their attorneys to reference (or ‘cite’) all prior
art of which they are aware that may affect the patentability of their invention. Patent
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examiners may then reference additional prior art that limits the claims of the patent for
which an application is being filed.
Patent citation analysis centers upon the links between generations of research that are
made by these prior art references. In basic terms, this type of analysis is based upon the
idea that the prior art referenced in patents has had some influence, however slight, upon
the development of these patents. The prior art is thus regarded as part of the technical
foundation for the later inventions.
In assessing the influence of individual documents – whether patents, papers or other forms
of grey literature – citation analysis centers on the idea that highly cited documents (i.e.
those cited by many later patents) tend to contain technological information of particular
interest or importance. As such, they form the basis for many new innovations and research
efforts, and so are cited frequently by later patents. While it is not true to say that every
highly cited document is important, or that every infrequently cited document is necessarily
trivial, many research studies have shown a correlation between patent citations and
measures of technological and scientific importance. For background on the use of patent
citation analysis, including a review of validation studies supporting its use, see Breitzman
A. & Mogee M. “The many applications of patent analysis”, Journal of Information
Science, 28(3), 2002, 187-205. For a detailed study of various hypotheses surrounding the
motivations of inventors in citing non-patent references, see Branstetter, L. and Oguara, Y.
“Is Academic Science Driving a Surge in Industrial Innovation? Evidence from Patent
Citations”, NBER Working Paper 11561, August 2005.
Patent citation analysis has also been used extensively to trace technological developments.
For example, in the analysis presented in this report, we examine citations from patents to
earlier technical outputs resulting from NIST funded activities. The idea behind this
analysis is that the patents have built in some way on these NIST technical outputs. By
determining how frequently NIST funded technical outputs have been cited by subsequent
patents, it is thus possible to evaluate the extent to which NIST funded activities have
helped form the foundation for a wide range of technologies.
It should be noted that the analysis presented in this report is based on prior art references
from US patents to NIST funded technical outputs, such as patents, journal articles,
conference papers, standards and software. The analysis does not consider references from
journal papers to NIST funded papers (or from journal papers to NIST funded patents,
although references from papers to earlier patents are very rare). This is purposeful, since
our primary focus is on how NIST activities have influenced innovations developed across
a range of industries. Such innovations are particularly likely to be protected by patents.
Meanwhile, scientific papers may describe more early-stage and exploratory research, so
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references from them to NIST papers may be mainly a reflection of the scientific, rather
than technological, impact of the agency’s activities.
III. Methodology
While the previous section outlines the general idea behind the analysis described in this
report – i.e. tracing citation links from US patents to earlier NIST funded technical outputs
– this section describes the methodology used to implement the analysis. In particular, it
focuses on how these two document sets – US patents and NIST funded technical outputs
– were collated, and how citation links between them were located.
Citing Document Set: Granted US Patents
In order to perform citation linkage analyses such as the one described in this report, 1790
Analytics maintains our own internal patent databases. Currently, we have every granted
US patent and published US patent application from 1969 to date in our US patent database
(which was used in this project). We also have every patent from 1978 to date in our EPO
(European Patent Office) database; and every PCT (Patent Cooperation Treaty) application
from 1978 to date in our WIPO (World Intellectual Property Organization) database.
Our patent databases contain detailed information on all patents, including inventors,
assignees, titles, abstracts, patent classifications, and application and issue dates. In
addition, our databases contain all prior art references listed on the front page of patents,
including references to earlier patents, and to other non-patent literature. It is this detailed
prior art reference information that makes possible large-scale citation studies such as the
one outlined in this report.
One other important feature of our patent databases is our corporate thesaurus, which
accounts for the many different names under which organizations own patents. As an
example, the pharmaceutical firm Sanofi has been assembled through the merger and
divestiture of companies that were themselves built through acquisition. Sanofi has patents
under 200+ different company names, and fewer than 10% of its patents are assigned to a
name that contains ‘Sanofi’ within the string. Our corporate thesaurus automatically
accounts for these subsidiaries and provides us with a complete patent inventory for each
organization. This is an important element of the analysis presented in this report,
particularly with regard to the results showing organizations whose patents reference NIST
technical outputs most extensively.
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Cited Document Set: NIST Technical Outputs
There are four main categories of NIST technical outputs included in the analysis described
in this report: patents assigned to NIST; patents in which NIST has a government interest;
peer reviewed papers funded by NIST; and NIST grey literature (which is further divided
into eight sub-categories). Below, we outline the processes involved in compiling each of
these sets of technical outputs, categorizing them (in the case of NIST grey literature), and
locating prior art references to them from US patents.
Cited Document Category 1: Patents Assigned to NIST
Collating Documents – NIST provided us with a list of patents assigned to the agency, so
this was the most straightforward document set to collate from our perspective.
Locating Prior Art References from US Patents – prior art references to patents are listed
in the form of patent numbers. For example, US Patent #9,012,542 references nine earlier
granted US patents as prior art, and these patents are identified by their patent numbers
(#2,388,169; #3,450,667 etc). This patent also references five published US patent
applications, and three foreign patents, all of which are again listed by their patent numbers.
Patent numbers (for both granted patents and published patent applications) are unique
identifiers, and are typically listed in a standard format. As a result, it is possible to
construct databases containing all citation links between generations of patents, such as the
database we maintain at 1790. The citation links consist of pairs of citing-cited patent
numbers, with both of these numbers being unique identifiers. Given access to such a
database, it is relatively straightforward to take a starting set of patent numbers (i.e. the
cited half of the pair), and locate subsequent patents that reference these patents as prior
art (i.e. the citing half of the pair). In this analysis, we carried out such a process, with the
starting set consisting of the patent numbers associated with the patents assigned to NIST.
Cited Document Category 2: Patents with a NIST Government Interest
Collating Documents – US patents have on their front page a section entitled ‘Government
Interest’. This section details the rights that the government has in a particular invention.
These typically exist where a government agency funds research at an external organization
(such as a for-profit company or a non-profit organization), and the government has certain
rights to the patents resulting from this research. For example, US Patent #9,024,298,
which is assigned to Xerox Corporation, contains the following statement in its
Government Interest field:
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This invention was made with United States Government support under Cooperative
Agreement No. 70NANBOH3033 awarded by the National Institute of Standards and
Technology (NIST). The United States Government has certain rights in the
invention.
We searched the Government Interest field of all US patents, and identified those patents
that refer to NIST. These searches included various forms of the full agency name –
National Institute of Standards and Technology – plus the NIST acronym.
Locating Prior Art References from US Patents – we identified the patent numbers for
the NIST government interest patents. We then searched in our databases for subsequent
US patents that reference these NIST government interest patents as prior art. As in the
case of NIST assigned patents, this was a relatively straightforward process involving
matching patent numbers, which are unique identifiers.
Cited Document Category 3: NIST-Funded Peer Reviewed Papers
Collating Documents – NIST provided us with a list of 50,000+ peer reviewed papers
authored by NIST personnel. These papers were downloaded by NIST personnel from the
Web of Science1.
Locating Prior Art References from US Patents – prior art references to items other than
patents are typically referred to as Non-Patent References (NPRs). These NPRs can be to
any published document, from scientific journal articles, conference papers and standards
documents, all the way to comic strips and brochures. They are much more difficult to
work with than prior art references to patents, since they are in free text. Also, inventors
are not required to use a standard referencing format for listing NPRs, in contrast to an
author submitting a manuscript for publication in a scientific journal. In addition, there is
no equivalent to a journal editor or reviewer ensuring that the references are complete,
since this is typically not a major concern of the patent examiner. As a result of these
various factors, NPRs are thus free text that can be in any format, and may be incomplete.
Author names may be present or absent, and journal names can be in many different
formats (for example, there are more than 30 variant spellings of the journal title Journal
Of Thoracic And Cardiovascular Surgery found in patents, including misspellings of
thoracic and different ways of abbreviating cardiovascular).
1 This document set consists primarily of peer reviewed journal articles, but it does also contain some papers
from conference proceedings, some of which will be peer reviewed and some not. We define this category
as peer reviewed papers to make it distinct from the so-called ‘grey literature’ categories consisting of white
papers and internal NIST publications such as NISTIRs, standards recommendations etc.
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We have built a number of tools designed specifically to address these issues with NPRs.
We applied these tools here to locate prior art references from patents to peer reviewed
papers authored by NIST funded researchers. This process involved matching the NPRs
listed on all US patents against the 50,000+ NIST papers downloaded from the Web of
Science.
These Web of Science records are in a standard format, listing the year, journal, first author,
first page, and title for each NIST funded paper. We thus processed NPRs into the same
format, parsing them in order to isolate these various reference elements. We then applied
our journal thesaurus to the journal element of each paper. This thesaurus contains more
than 50,000 variant names for journals. For example, the Journal of the American Medical
Association may appear as J. Am. Med. Assoc., Jrnl Am. Med Assoc., J of Am Med Assoc.,
JAMA, or one of more than a dozen other variants.
At this point, we had two lists – one containing NPRs, and one containing NIST papers –
each with the various bibliographic elements (year, journal, author, page, title) all extracted
and standardized. We then matched these two lists, and scored the quality of each match
according to the following scoring system:
Score Fields Matched
10 Year, Journal, Author, Page
9 Year, Journal, Author6, Page
8 Year, Journal10, Author, Page, Title15
7 Year, Journal, Author6, Title15
6 Journal, Author, Title15, Page
5 Journal, Author, Full Title
4 Year, Journal, Author, Volume OR Title
The highest scoring match is thus one where the year, journal name, first author and first
page number all match perfectly. In the second-highest scoring match, the year, journal
name and first page number all match, along with six characters of the first author name
(Auth6). For example, a name like Petropoulos may be misspelled in multiple ways, but a
match of six characters is likely to mean a correct match. Similarly, in the third-highest
scoring match, ten characters of the journal name (Journal10) and fifteen characters of the
title (Title15) must match in order to achieve this score.
Under this scoring system, matches with a score of 8-10 are automatically considered to be
correct. Matches with a score of 4-7 are considered to be possible correct matches, and
were confirmed or discarded via human inspection.
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Cited Document Categories 4-11: NIST Grey Literature
Collating Document Set – whereas NIST provided us with a list of peer reviewed papers
associated with its funding, there was no similar list of NIST grey literature available (and
such a list would be extremely difficult and time-consuming to construct). The process for
locating NIST grey literature cited by US patents was thus somewhat different from the
process used to locate other NIST technical outputs cited by patents. Specifically, the
process for other technical outputs involved two steps – i.e. first identifying the universe
of NIST outputs, and then matching these outputs to references in US patents. Meanwhile,
the process for identifying citations to NIST grey literature only involved a single step –
i.e. references from US patents to grey literature were located directly, without first
defining the universe of this literature.
Locating Prior Art References from US Patents – we identified grey literature cited in US
patents by searching the non-patent references in these patents for keywords related to
NIST, such as NBS, Nat*Bur*St*, Nat*Inst*St*, FIPS, Fed*Inf*Proc*St*, NIST* etc. We
also accounted for possible term confusion, for example searching for NIST* and not
machinist* or administration.
Categorizing Cited NIST Grey Literature – NIST personnel expressed significant interest
regarding which types of grey literature produced by the agency have been particularly
influential upon subsequent technological developments. We thus categorized NIST grey
literature into eight subcategories, as defined by NIST personnel. This was a complicated
process, and involved a series of iterations using combinations of keywords and manual
review in order to categorize NIST grey literature satisfactorily.
The eight categories of grey literature (numbered 4-11, following on from the three
categories of NIST technical outputs already discussed), are outlined below. The
constituent elements of each category are listed, along with examples of technical outputs
associated with the category.
Category 4 – Educational Networking
a. Conferences
b. Seminars
c. Webinars
d. Workshops
e. Symposiums
f. Presentations
g. Short Courses
h. Proceedings
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Examples:
Holleyman, Robert W. "On the Export of Software with Encryption Capabilities ",
testimony presented at Key Escrow Meeting, NIST, Gaithersburg, MD, Sep. 6, 1995, pp.
1-7.
Sweat et al. Characterization of natural and induced variation in the LOV1 gene, a CC-
NBS-LRRR gene conferring victorin sensitivity and disease susceptibility in Arabidopsis.
MPMI. 2008. 21(1): 7-19.
Self-Organizing Neural Network Character Recognition on a Massively Parallel Computer,
Wilson et al, NIST, International Joint Conference on Neural Networks, Proceeding, II, pp.
325 329, Jun. 1990, San Diego, Calif.
Category 5 - Software/Standard Reference Databases/Algorithms
a. Materials and Property Data
b. Standard Reference Data
c. Software (ex: NSRL)
d. Databases (excluding SRDs)
e. FIPS
f. NIST WebBook
g. Documentation/Publications Regarding SRMs (that do not have a NIST-
assigned publication number)
h. Joint Partnership Publications Regarding Standards (ex: ANSI/NIST Doc
category)
i. NIST Standard Reference Data Series (NIST NSRDS)
Examples:
NIST, “Advanced Encryption Standard (AES)”, FIPS Publication 197, 52 pages, Nov 26,
2001.
http://www.nsrl.nist.gov/, National Software Reference Library, printed from website May
15, 2012, 1 page.
Grother, Patrick J. “NIST special database 19 handprinted forms and characters database.”
National Institute of Standards and Technology (1995).
Category 6 – Standard Reference/Resource Materials/General Information
a. Measurement and Testing Methodology
b. Standard Reference Materials (SRMs)
c. Website Citation (ex: NIST Home Page)
d. Tables
e. Dictionaries
f. Stand-Alone Pictures
g. Fact Sheets
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Examples:
Periodic Table. NIST. 2003.
Photograph of the NIST Micro Microwave Oven, NISTmicropic.jpg, Mar. 1, 2011.
Semicon West 2001, Website:
http://www.nist.gov/public_affairs/factsheet/semiconwest01.htm.
Category 7 - Official NIST Publications (not peer-reviewed journal)
a. NIST Special Publications (NIST SP-XXX)
b. NIST Technical Notes (NIST TN)
c. NIST Grant/Contract Reports (NIST GCR)
d. NIST Handbook
e. NIST Interagency/Internal Reports (NISTIR)
Examples:
Ross, U.S. Department of Commerce, Nat'l Bur. Stands, Publication NSRDS-NBS59 (Jan.
1977).
Bearden, J. A.; X-ray Wavelengths and X-ray Atomic Energy Levels. US Dept of
Commerce, Nat'l Bur. Stands. NSRDS 14, pp. 1-47 (Sep. 1967).
Burr et al., Ed., “Electronic Authentication Guideline,” Version 1.0.2,
http://csrc.nist.gov/publications/nistpubs/800-63/SP800-63V1(sub)—0(sub)—2.pdf, Apr.
2006, 64 pages.
Category 8 - Joint Partnership Publications (not peer-reviewed journal)
a. DARPA
b. NSA
c. Colorado School of Mines
d. JILA
e. JQI
f. HML
g. IBM
Examples:
Federal Aviation Administration (FAA), "Draft Burnthrough Test Standard for Aircraft
Insulation," FAA on World Wide Web (http://www.fire.tc.faa.gov/burnthru.html), p. 16,
(Mar. 24, 1999).
Technisches Messen , vol. 51, 1984, Issue No. 3, pp. 83 95 Federal Physical Technical
Institute (Physikalisch Technischen Bundesantalt) or the Nat'l Bur. Stands.
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Category 9 - Other NIST (non peer-reviewed) publications
a. Circulars
b. Internal Reports
c. Recommendations
d. Proposals
e. Bulletins
f. Press Releases
Examples:
US Dept of Commerce, NIST, FY 2010 Small Business Innovation Research Program
Solicitation, NIST-10-SBIR, Oct. 30, 2009-Jan. 22, 2010.
Proctor, F.; "Validation of Standard Interfaces from a Machine Control", 1996, NIST,
NIST Internal Report, pp. 659-664.
Snoke, Hubert R., Building Mat ls & Structures, Report BMS 70, Nat'l Bur. Stands, 1941,
p. 15.
Category 10 - Communication/Correspondence/Inquiries
a. Questions, answers, and requests for comments on FIPS
b. FFOs, solicitations, private communications
Examples:
Peter L. Bender, Nat'l Bur. Stands, private communication, 1978
Leonard E. Miller, Apr. 2002, NIST.
Category 11 - Other
a. NIST news clips – when NIST is mentioned in a newspaper, article, etc.
b. Articles reporting NIST technical outputs
Examples:
English translation of Official Letter of Taiwan Patent Office (Nat'l Bur. Stands) in Taiwan
Appln. No. 82100814.
Messmer, Ellen, "NIST proposes standard for electronic signatures", Network World, p. 4,
Jul. 1991.
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Summary of Document Sets
As a result of the processes outlined above, we compiled two data sets, the first consisting
of granted US patents, and the second containing NIST funded technical outputs referenced
as prior art by these patents. These NIST outputs are categorized as follows:
Category Number Category Definition
1 NIST-Assigned Patents
2 NIST Government Interest Patents
3 NIST-Authored Peer-Reviewed Publications
4 Educational Networking
5 Software/Standard Reference Databases/Algorithms
6 Standard Reference/Resource Materials/General Information
7 Official NIST Publications (not peer-reviewed journal)
8 Joint Partnership Publications (not peer-reviewed journal)
9 Other NIST (non peer-reviewed) publications
10 Communication/Correspondence/Inquiries
11 Other
These document sets, and the citation links between them, form the basis for our analysis
of the impact of NIST funded research on subsequent technological developments. The
results of this analysis are outlined in the following section of the report.
IV. Results
We report the results of our analysis at two different levels of granularity. First, we report
organization-level results, examining the overall impact of NIST funded technical outputs,
both in absolute terms, and in the context of the broader citation landscape. We then outline
results at the level of individual NIST technical outputs, highlighting those published items
that have had a particularly strong impact on subsequent technological developments.
Organization-Level Results
Overall NIST Citation Counts
Between January 1995 and July 2015, there were a total of 34,241 citations from US patents
to NIST-supported technical outputs. This is an impressive figure, especially given the fact
that NIST had only 124 US patents assigned to it through the end of 2014. It suggests that
NIST’s influence extends far beyond just its own patented inventions, and that the agency’s
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activities help form the foundation for technological developments made by a wide range
of other organizations.
Figure 1 contains a breakdown of the 34,241 citations from US patents, according to the
category of NIST document receiving each citation. This figure reveals that 14,538 (43%)
of the citations are to peer reviewed papers authored by NIST-supported researchers. The
next largest category is NIST government interest patents, which received 9,062 (26%) of
the citations. These are patents assigned to organizations other than NIST, but in which
NIST has some rights having provided funding for the research that led to the patented
inventions. The number of citations to NIST government interest patents is more than four
times higher than the number of citations to patents actually assigned to NIST (2,173, or
6%). This reflects that fact that NIST supports a great deal of research carried out by other
organizations, rather than only funding researchers within the agency.
The remaining 24% of citations from US patents to NIST documents are to various types
of grey literature. The largest of these grey literature categories is software, standard
reference databases and algorithms, which accounts for 2,914 (8%) of citations from US
patents to NIST documents. Other grey literature categories that receive significant
numbers of citations are Official NIST Publications (1,671 citations, or 5%); Educational
Networking (1,267 citations, 4%); and Other NIST Publications (1,740 citations, 5%). The
final four grey literature categories together account for only 2.5% of citations from US
patents to NIST documents.
Figure 2 is based on the same data as Figure 1, but presents it in the form of a pie-chart.
Also, in this figure, all of the grey literature categories are combined for ease of
presentation. As such, Figure 2 is a basic overview of citations from US patents to NIST
technical outputs in the four main categories: peer reviewed papers; government interest
patents; assigned patents; and grey literature.
Trends in NIST Citation Counts
Figure 3A shows trends over time in citations from US patents to NIST technical outputs.
Specifically, this figure shows the number of citations to NIST each year from 1995 to
2014, along with the number of unique US patents citing NIST each year (the two are not
equivalent, since one patent may reference multiple NIST documents as prior art). The first
point to note in Figure 3A is the growth in the number of citations from US patents to
NIST. There was a more than a ten-fold increase in these citations between 1995 and 2014.
The second point to note is the widening gap between the two lines in this figure, especially
in recent years. In the 1990s, patents that cited NIST typically cited a single NIST
document, so the number of citations and the number of citing patents were almost
identical. More recently, the two numbers have started to diverge, to the point where, in
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2014, there were 3,000 unique patents that cited NIST, and these patents provided more
than 4,500 citations to NIST (i.e. an average of more than 1.5 citations per citing patent).
Beyond these overall trends, it is informative to examine whether there is any difference in
the citation trends across different types of cited NIST technical outputs. Figure 3B shows
the number of citations to the four main types of NIST outputs (peer reviewed papers;
government interest patents; assigned patents; and grey literature) from US patents issued
each year from 1995 through 2014. This figure reveals that the sharp increase in citations
to NIST outputs shown in Figure 3A can also be seen for each of the four document types.
Having said this, while citations to each of the NIST document types have increased over
time, the largest increases are associated with peer reviewed papers and government
interest patents.
The trend lines in Figures 3A and 3B suggest that the influence of NIST documents has
increased markedly over the past two decades. However, it should be noted that the overall
number of citations provided by US patents has also increased significantly over the same
time period. This is due to increases in the number of patents issued each year, and also in
the mean number of prior art references listed on patents. Also, over time, the corpus of
NIST technical outputs has grown, so there are many more such outputs available to be
cited. In subsequent figures, we attempt to account for these various factors, and thus place
the growth of citations to NIST technical outputs in the context of the wider citation
landscape.
This wider landscape may differ for the various types of cited document. For example,
trends over time in citations to patents may be different to trends in citations to journal
articles. Also, as shown in Figure 3B, there are differences in the rate of growth in citations
to the different types of NIST technical outputs. Given these factors, we examine each type
of NIST technical output (i.e. patents, peer reviewed literature, grey literature) separately,
as outlined below.
Benchmarking NIST Citation Counts
To assess NIST patents (both those assigned to the agency and those with a NIST
government interest) within the wider citation landscape, we employed our citation-based
patent metrics. These metrics are used across many of our projects, and form the basis for
the Patent Power Scorecards published annually in IEEE Spectrum magazine (an example
of these scorecards is available at http://spectrum.ieee.org/static/interactive-patent-power-
2015). The metrics – which are described below – assess different characteristics of patents,
notably their impact, generality and originality.
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As discussed earlier, one widely used method of assessing the impact of a patent is to count
how many times it has been cited by subsequent patents. However, using raw citation
counts to assess patent impact is often problematic, since older patents are likely to be more
highly cited, simply because they have had more time to accrue citations from later patents.
Citation rates also differ across technologies. In order to overcome these two problems, we
normalize citation counts by issue year and technology (as defined by Patent Office
Classifications) to produce a Citation Index for all granted patents.
The Citation Index is derived by dividing the number of citations received by a patent by
the mean number of citations received by all patents from the same Patent Office
Classification (POC) and issue year. For example, the number of citations received by a
patent issued in 2005 with a primary POC of 351/210 is divided by the mean number of
citations received by all patents issued in 2005 with the same primary POC.
The expected Citation Index for an individual patent is one. The extent to which a patent’s
Citation Index is greater or less than one reveals whether it has been cited more or less
frequently than expected, and by how much. For example, a Citation Index of 1.5 shows
that a patent has been cited 50% more frequently than expected. Meanwhile a Citation
Index of 0.7 reveals that a patent has been cited 30% less frequently than expected.
Patent generality is based on the premise that technologies with applications across a range
of industries are likely to be of greater interest than technologies with only a narrow range
of applications. For example, a new material that is used in many different industries is
regarded as more general than a material that is only used in a single application.
This metric is operationalized via citation links. Specifically, patents cited as prior art by
subsequent patents from numerous technologies are regarded as having more general
applicability than patents that are only cited by subsequent patents from the same
technology. We normalize generality by both issue year and technology (as defined by
Patent Office Classifications), to derive a Generality Index with an expected value of one.
Patents with a Generality Index greater than one are more general than peer patents drawn
from the same technology and issue year, while patents with a Generality Index below one
are less general than their peers.
Patent Originality is the analog of Patent Generality, and looks backwards in time, rather
than forwards. It is based on the premise that patents that build upon a wide range of
technologies are likely to be more original than patents that draw only upon earlier
developments in the same technology (which may represent incremental improvements on
that technology). This indicator is once again operationalized via citation links.
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Specifically, patents that cite as prior art earlier patents from numerous technologies are
regarded as more original than patents that only cite patents from the same technology.
We again normalize originality by both issue year and technology (as defined by Patent
Office Classifications) to derive an Originality Index with an expected value of one. Patents
with an Originality Index greater than one are more original than peer patents drawn from
the same technology and issue year, while patents with an Originality Index below one are
less original than their peers.
Figure 4 shows the Citation Index, Generality Index and Originality Index for patents
assigned to NIST and for patents in which NIST has a government interest (i.e. those
patents resulting from research that NIST funded in external organizations). The metrics
are shown for two separate time periods – i.e. NIST-related patents issued in 2005-09 and
NIST-related patents issued in 2010-2014.
The Citation Index for NIST-assigned patents is below one for both time periods,
suggesting that these patents have not had a particularly strong impact on subsequent
technological developments. However, the number of patents assigned to NIST is very
small (only 22 patents were granted to NIST in 2005-09 and 100 in 2010-2014), so not too
much importance should be attached to this finding.
The Citation Index for NIST government interest patents is much more impressive,
exceeding 1.6 in both time periods. This shows that the NIST government interest patents
have been cited more than 60% more frequently than expected, given their relative age and
technology. In turn, this suggests that they have had a strong impact on subsequent
innovations. Given that the number of NIST government interest patents is much higher
than the number of NIST-assigned patents, this finding is much more noteworthy.
A similar pattern can be seen for NIST-assigned patents and NIST government interest
patents in terms of their Generality Index. Again, NIST-assigned patents perform relatively
poorly on this metric, with a Generality Index below one in both time periods, albeit based
on a small number of patents. Meanwhile the Generality Index for NIST government
interest patents is much higher, and exceeds two in the most recent time period. This
suggests that the NIST government interest patents have a broad applicability across a
range of technologies.
The results for the two sets of patents are much more similar in terms of their Originality
Index. In both cases, the Originality Index exceeds one for both time periods, but not by a
wide margin. This suggests that both the NIST-assigned patents and the NIST government
interest patents are more original than expected, but not by a significant degree.
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Overall, the patent citation metrics in Figure 4 support the idea that NIST-supported
patents, especially those with a NIST government interest, have had a strong, wide-ranging
impact on subsequent technology developments. As such, the increases in citations to NIST
patents reported in Figure 3B appear to be associated with this strong impact, rather than
simply being a reflection of changes in the underlying citation landscape.
Placing citations to NIST’s peer reviewed papers and grey literature in a wider context is
more difficult than it was for citations to NIST-supported patents. There are no equivalent
normalizations measuring how many times a paper of a certain age, and from a given
subject area, can be expected to have been cited in subsequent patents. Given this lack of
available normalizations, we had to devise suitable comparisons in order to place the
citations to NIST literature in a wider context.
In evaluating citations to NIST published documents, we examined peer reviewed papers
and grey literature separately. For peer reviewed papers, one obvious approach would have
been to compare citations to NIST’s papers against citations to papers produced by other
agencies or institutions. However, this would have required identifying complete paper sets
for those institutions, and then doing a match similar to that described in the methodology
section above. That is a costly endeavor, and is well beyond the scope of this project.
In recognition of the time and budget constraints, our comparison set for NIST peer
reviewed papers was instead drawn from one of our existing projects. Each year, we
produce a report for the Institute of Electrical and Electronics Engineers (IEEE). In this
project, we identify the 40 companies with the largest number of US patents granted in the
most recent year. These companies include IBM, Siemens, Canon etc. We then locate and
disambiguate prior art references from the patents of these companies to papers published
in journals from the leading publishers, specifically Elsevier, Wiley, Springer, American
Chemical Society, American Institute of Physics, IEEE, IOP Publishing, and Optical
Society of America.
In the current analysis, we used the annual citation counts from this IEEE project as a
benchmark against which to compare citation counts to NIST peer reviewed papers. It is
worth noting that more than 65% of NIST’s peer reviewed papers are published in a journal
from one of these leading publishers, so this seems like a reasonable comparison set.
Figure 5A contains an index (base year = 2000), showing the growth in the number of
citations from the IEEE analysis, plus the growth over the same period in the number of
citations from all US patents to NIST peer reviewed papers. This figure reveals that
citations from the leading companies to the leading publishers increased more than six-fold
between 2000 and 2014. While impressive, this increase is still lower than that associated
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with NIST papers. Between 2000 and 2014, the number of citations from US patents to
NIST papers increased seven-fold.
The IEEE analysis is based on a highly select set of citing and cited documents – i.e.
citations from patents owned by leading companies to papers published in leading
academic journals. Hence, the fact that citations to NIST papers have grown faster than
citations to papers in the leading journals is highly impressive. If we were to add journals
from other less renowned publishers, we suspect that the outperformance of NIST papers
would be even more marked (however, we do not have data on citations to these journals
readily available).
With respect to NIST grey literature, finding a reasonable benchmark was also problematic.
NIST produces a wide variety of types of grey literature, from standards documents, to
official definitions, to software, to reference materials. There are no comparable
organizations that produce as wide a variety of grey literature as NIST. The best
comparison we could locate was Massachusetts Institute of Technology (MIT). Like NIST,
MIT produces a broad range of technical reports, thesis drafts, software, and guides.
Moreover, it is one of the most respected and entrepreneurial universities, with many of its
students and faculty creating hi-tech startup companies. As such, MIT’s technical outputs
are likely to be closely related to the applied technologies described in patents.
MIT should thus be a suitable (and indeed demanding) comparison for NIST with regard
to grey literature. Figure 5B shows an index (base year = 2000) for citations each year from
all US patents to grey literature produced by NIST and MIT. Overall, citations to NIST
grey literature grew almost nine-fold between 2000 and 2014. This is higher than the
growth rate associated with citations to MIT grey literature, although the difference is only
slight. Even so, outperforming a prestigious institution such as MIT on this metric is an
impressive feat.
Patents Citing NIST Technical Outputs
Having examined overall trends in citations to NIST, and their distribution across different
NIST document types, we now look in more detail at the patents that cite NIST technical
outputs as prior art. We focus in particular on the distribution of these patents by
technology, industry, and assignee.
Figure 6 shows citations to the four main types of NIST documents by the technology area
of the citing patents. This technology area is defined based on 1790’s technology
concordance, which maps patents to technologies based on their primary patent
classification. Figure 6 reveals that more than one-fifth of the 32,000+ citations to NIST
come from patents related to Computer Hardware & Software; and more than one-third are
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from that category plus Communications. Other major citing categories are Measuring &
Testing, and Semiconductors & Electronics.
It is also interesting to note the distribution of citations across different technologies and
NIST document types. For example, Measuring & Testing and Semiconductors &
Electronics patents cite NIST peer reviewed papers extensively. The same is true for
Biotechnology, Ceramics, and Chemicals patents. Meanwhile, Computer Hardware &
Software and Communications patents build much more extensively on NIST grey
literature.
Figure 7 contains the same data as Figure 6, but divides the citations to NIST grey literature
into the eight sub-categories outlined in the methodology section of the report. This figure
reveals that a large number of citations from Computer Hardware & Software and
Communications patents are to Category 5 (Software/Standard Reference
Databases/Algorithms). Many of these citations are to FIPS documents such as the Secure
Hash Standard (FIPS 180) and the Advanced Encryption Standard (FIPS 197). Another
highly cited category of NIST grey literature is Category 7 (Official NIST Publications).
Many of these citations are to NIST documents such as NISTIRs and NIST special
publications, which often describe the contents of the FIPS documents from Category 5.
Figures 8 and 9 show the distribution of citations to NIST by citing assignee. Figure 8 –
which is divided into the four main NIST document types – reveals that IBM and Microsoft
cite NIST most extensively, followed by Calcitec (a medical devices firm), 3M and Micron
Technology. This figure also reveals that the different assignees cite different types of
NIST outputs. Both IBM and Microsoft build extensively on NIST grey literature, as do
Intertrust, Intel, Cisco and Hewlett-Packard. Meanwhile, Calcitec builds primarily on NIST
peer reviewed papers, as do the University of California and Michigan State University,
plus the US Department of Commerce (which includes citations from NIST’s own patents
to NIST papers). NIST’s patents are cited most heavily by 3M, Western Digital and Cree.
Figure 9 is the same as Figure 8, but with citations to NIST grey literature divided into the
eight subcategories. This figure highlights the extensive influence of the Software/Standard
Reference Databases/Algorithms subcategory (Category 5) on the patents of IBM and
Microsoft, plus the patents of First Data, Cisco and Oracle. It also highlights the influence
of NIST Educational Networking (Category 4), such as workshops and conferences, on the
patents of Microsoft, Intertrust and Assa Abloy.
Figures 10 and 11 show the distribution of citations to NIST according to the industry of
the citing assignees. Note that these industries are not the same as the technologies
examined earlier in Figures 6 and 7. For example, Microsoft is categorized as being in the
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Software industry, based on its primary industry classification. Hence, Microsoft’s patents
are all considered as part of the Software industry in Figures 10 and 11. However, while
Microsoft is a software company, it has patents across a wide range of technologies (as
defined by patent classifications), which were used in the generation of Figures 6 and 7.
Figure 10 shows that Universities cite NIST technical outputs most extensively, followed
by Semiconductor companies, Software companies, and Communications companies.
Other industries that cite NIST outputs extensively are Medical Equipment/Instruments,
Computer Systems and Electronics. Figure 10 also reveals that Universities cite primarily
NIST peer reviewed papers, as do Medical Equipment/Instruments companies. Meanwhile,
Semiconductor, Software and Communications companies build more extensively on
NIST grey literature. Semiconductor companies also cite NIST patents extensively, as do
Electronics and Computer Peripherals/Storage companies.
Figure 11 breaks out citations to NIST grey literature according to the various
subcategories of this literature. This figure shows that Semiconductor, Software,
Communications and Computer Systems companies have large numbers of citations to
NIST Educational Networking (i.e. workshops and conferences). Companies in these
industries also cite Official NIST Publications, and Other NIST Publications, extensively.
Overall, the organization-level results discussed above highlight the significant increase in
citations from US patents to NIST technical outputs. These citations are from patents
owned by organizations across a broad range of industries, describing a wide variety of
technologies. The results above also demonstrate how the increase in citations to NIST
outstrips citations to comparable document sets. This suggests that NIST’s technical
outputs have had a strong, and growing, impact on technological developments.
Document-Level Results
The previous section of the report focuses on results at the level of the entire portfolio of
NIST technical outputs. In this section, we report results at the level of individual NIST
outputs. The objective of this section is to highlight individual NIST documents that have
had a particularly strong impact on subsequent technological developments. These results
are divided according to the eleven detailed categories of NIST outputs described in the
methodology section of the report (i.e. NIST assigned patents; NIST government interest
patents; NIST peer reviewed papers; plus eight categories of NIST grey literature).
Table 1 lists the NIST assigned patents with the highest Citation Index values. As outlined
earlier in the report, the Citation Index is a normalized impact indicator. It measures how
many times patents have been cited as prior art by subsequent patents, compared to peer
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patents from the same year and technology. For example, the patent at the head of Table 1
(US #5,356,756) has been cited by 110 subsequent patents. The mean number of citations
for all 1994 patents in the same patent classification is 14.6. Hence, the ’756 patent has a
Citation Index of 7.53 (110/14.6), showing it has been cited 7.53 times as frequently as
expected. This patent describes materials processing for thin films, designed for use in
sensors, electronic devices and sample analysis.
The second and third patents in Table 1 (US #5,795,782 and US #6,015,714) are part of
the same patent family (i.e. they are related to the same underlying invention). They
describe a method for rapid DNA analysis, and have both been cited by more than 100
subsequent patents, five times as many citations as expected given their age and
technology. Looking further down the list of patents in Table 1, the one with the highest
absolute number of subsequent citations is US #6,088,679. This patent describes a business
process system for workflow management. It has been cited by 233 subsequent patents, but
this is only twice as many expected, since it is in a rapidly expanding area of patenting (i.e.
business methods), in which citation rates are very high.
Table 2 shows the NIST government interest patents that have the highest Citation Index
values. There are a number of patents in this table with very high Citation Indexes, notably
the patent at the head of the table (US #7,330,404). This patent has been cited by 127
subsequent patents since it was issued in 2008, which is more than 40 times as many
citations as expected given its age and technology. It describes a transducer for use in
optical storage (for example in disk drives), and is assigned to Seagate Technology – one
of a number of highly cited Seagate patents in Table 2. Other companies with a series of
highly cited NIST government interest patents include ConforMIS (whose patents describe
treatment of cartilage in joints); Bind Biosciences (controlled drug delivery); and General
Electric (phosphor blends for LED devices).
NIST-sponsored peer reviewed papers that have been cited frequently in US patents are
shown in Table 3. The paper at the head of this table has been cited by 277 subsequent
patents (and over 5,000 papers, according to Google Scholar). It was published in Science
in 1995, and describes sequencing of the H.influenzae genome (the first example of a free-
living organism having its entire genome sequenced).
The second paper listed in Table 3 does not report original research, but is instead a
literature survey of face recognition technology. It has been cited by 161 patents. There are
three further papers in Table 3 that have been cited by more than 100 patents. They are a
1996 paper describing a membrane filter for use in DNA analysis (137 patent citations),
and two papers from the same NIST research group describing methods for measuring
nanoscale distances (120 and 116 patent citations). The most highly cited recent NIST peer
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reviewed paper is the ‘NIST Definition of Cloud Computing’. This was published in the
Communications of the ACM in 2010, and has already been cited by 68 subsequent US
patents.
Tables 4-11 list the individual items of NIST grey literature that have been cited most
frequently by US patents, with each table focusing on a different category of this literature.
Table 4 contains the most highly cited NIST Educational Networking publications (i.e.
workshops, presentations, conference papers etc). The most highly cited of these
publications is a 1996 presentation describing a proposed federal public key infrastructure
(PKI) for secure communications. It has been cited as prior art by 28 subsequent patents.
It is one of a number of papers in Table 4 concerned with PKI technology. The table also
contains highly cited papers describing frameworks for information infrastructures,
equipment operator training, and detecting intrusive behavior in networks.
Table 5 lists the NIST Software/Databases/Algorithms publications cited most frequently
by subsequent US patents. The most highly cited are the Federal Information Processing
Standards (FIPS) publications outlining the Advanced Encryption Standard (FIPS 197);
the Secure Hash Standard (FIPS 180); and the Digital Signature Standard (FIPS 186).
These standards documents have been cited by hundreds of subsequent patents, and are the
most highly cited individual items of NIST grey literature.
The NIST Standard Reference/Resource Materials cited most frequently in patents are
shown in Table 6. The most highly cited is the NIST ‘Dictionary of Algorithms and Data
Structures’, which has been cited by 67 subsequent patents. Also highly cited are the red-
black tree (48 patent citations), and the Bloom filter (17 patent citations), which are
respectively a specific data structure and an algorithm listed in this NIST dictionary.
Table 7 lists the Official NIST Publications (NISTIRs, Special Publications etc) that have
been cited most frequently by US patents. The publication at the top of this list is a 1980
NBS technical note describing a Schottky diode bridge sampling gate, designed for
measuring low level signals in circuits. This publication has been cited by 101 subsequent
US patents. The second publication in Table 7 is ‘The NIST Definition of Cloud
Computing’ with 67 citations from US patents. This is NIST’s own publication of this
definition, which also appeared in the Communications of the ACM (see Table 3). Other
highly cited NIST Special Publications are concerned with block ciphers and public key
infrastructure, both of which are related to cryptography.
The publications in Table 8 are NIST Joint Partnership Publications, meaning they were
developed in collaboration with other organizations and agencies. The publication at the
head of this table is entitled ‘Federal Criteria for Information Technology Security’, and
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dates back to 1992. It has been cited by 31 US patents since its publication. More recent is
the second publication in Table 8, which is a review of ultra-wideband technology
published by NIST in partnership with DARPA in 2003. This publication has been cited
by 24 subsequent US patents. In general, the publications in Table 8 are relatively old,
some dating as far back as 1960.
The publications in Table 9 (Other NIST Publications) are generally more recent, with most
being published post-2000. The most highly cited of these publications is from 2003, and
has been cited by 66 US patents. It is entitled ‘Intrinsic velocity and its relation to intrinsic
conductivity’. Other highly cited publications include papers on biometrics (38 patent
citations), thin films (34 patent citations), and internet security (30 patent citations).
Table 10 contains items of correspondence with NIST that have been cited by numerous
subsequent US patents. The citation counts in this table are mostly quite low, with only
four items being cited by more than 10 patents. Two of these four items are comments to
NIST regarding modes of operation of the Advanced Encryption Standard (AES). They
have been cited by 17 and 11 patents respectively. The other two items are a submission to
NIST regarding the Galois/Counter Mode (GCM), used in cryptography; and a private
communication to NIST dating back to 1978.
The citation counts in Table 11 (Publications mentioning NIST) are also relatively low,
with the most highly cited single publication having been cited by 18 subsequent US
patents. This is a paper published in 1999 that refers to the NBS phosphor standard samples.
Table 11 also contains a discussion of the NIST Digital Signature Standard (15 patent
citations); a proposed NIST standard for role-based access control (15 patent citations);
and an analysis of the NBS data encryption standard (14 patent citations).
V. Conclusions
This report outlines the results of an analysis designed to evaluate the technological impact
of technical outputs associated with NIST. The analysis is based on tracing forward from
these NIST outputs to determine how frequently they have been cited by subsequent
patents. This makes it possible to evaluate the extent to which NIST funded activities have
helped form the foundation for a wide range of technologies.
The analysis presented in this report reveals that there has been a significant increase over
time in citations from US patents to NIST technical outputs. These citations are from
patents owned by organizations across a broad range of industries, describing a wide
variety of technologies. Our analysis also demonstrates how the increase in citations to
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NIST outstrips citations to comparable document sets. This suggests that NIST’s technical
outputs have had a strong, and growing, impact on technological developments.
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VI. Appendix: Figures and Tables
188 (
0.5
%)
100 (
0.3
%)
1740 (
5.1
%)
193 (
0.6
%)
1671 (
4.9
%)
395 (
1.2
%)2
914 (
8.5
%)
1267 (
3.7
%)
14538 (
42.5
%)
9062 (
26.5
%)
2173 (
6.3
%)
02000
4000
6000
8000
1000
01200
01400
01600
01800
0
11. O
ther
- N
IST
Men
tioned
in O
ther
Docs
10. C
om
munic
atio
n/C
orr
esp/I
nquir
ies
9.
Oth
er N
IST
(N
ot
Pee
r-R
evie
wed
) p
ubli
cati
on
s
8.
Join
t P
artn
ersh
ip P
ub
s (N
ot
Pee
r-R
evie
wed
)
7. O
ffic
ial N
IST
Publi
cati
ons
(Not P
eer-
Rev
iew
ed J
ourn
al)
6.
NIS
T S
tan
dar
d R
efer
ence
Mat
eria
ls/R
eso
urc
e M
ater
ials
5.
So
ftw
are/
Sta
nd
ard
Ref
eren
ce D
atab
ases
/Alg
ori
thm
s
4. E
duca
tional
Net
work
ing
3.
NIS
T A
uth
ore
d P
eer
Rev
iew
ed P
aper
s
2.
NIS
T G
ov
ern
men
t In
tere
st P
aten
ts
1. N
IST
Ass
igned
Pat
ents
# U
S P
ate
nt
Cit
ati
on
s
Fig
ure
1:
Pa
ten
t C
ita
tio
ns
to
NIS
T D
oc
um
en
ts B
y C
ate
go
ry(N
um
be
r a
nd
Pe
rce
nt o
f U
S P
ate
nt C
ita
tio
ns
Th
rou
gh
Ju
ly, 3
1, 2
01
5)
24
25
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4.-
11. G
rey L
itera
ture
C
ate
gories,
8468, 25%
3.N
IST
Auth
ore
d P
eer
Revi
ew
ed P
apers
, 14538,
42%
2.N
IST
Gove
rnm
ent
Inte
rest P
ate
nts
, 9062,
27%
1.N
IST
Assig
ned
Pate
nts
, 2173,
6%
Fig
ure
2:
Dis
trib
uti
on
of
Pa
ten
t C
ita
tio
ns
to
Bro
ad
Ca
teg
ori
es
of
NIS
T D
oc
um
en
ts
(Nu
mb
er
an
d P
erc
en
t o
f U
S P
ate
nt
Cit
ati
on
s T
hro
ug
h J
uly
31
, 2
01
5)
26
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0
50
0
10
00
15
00
20
00
25
00
30
00
35
00
40
00
45
00
50
00
19
95
19
97
19
99
20
01
20
03
20
05
20
07
20
09
20
11
20
13
#Yearly Citations
Fig
ure
3A
: N
um
ber
of
Cit
ati
on
s t
o N
IST
(an
d #
Un
iqu
e P
ate
nts
cit
ing
NIS
T)
by Y
ear
(1995
-2014)
# P
ate
nt C
itation
s to N
IST
Sou
rces
# U
niq
ue P
ate
nts
Citin
g N
IST
Sourc
es
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0
200
400
600
800
100
0
120
0
140
0
160
0
180
0
200
0
19
95
19
97
19
99
20
01
20
03
20
05
20
07
20
09
20
11
20
13
#Yearly Patent Citations
Fig
ure
3B
: U
S P
ate
nt
Cit
ati
on
s t
o N
IST
Do
cu
men
ts b
y Y
ear
(1995
-2014)
Gre
y L
itera
ture
NIS
T A
ssig
ne
d P
ate
nts
(tim
es 5
)
NIS
T J
ou
rnal A
rtic
le
NIS
T G
ovt
Inte
rest P
ate
nt
28
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20
05
-20
09
, 2
2
20
05
-20
09
, 3
23
20
10
-20
14
, 1
00
20
10
-20
14
, 2
97
0
10
0
20
0
30
0
40
0
NIS
T A
ssig
ned
NIS
T G
ovt In
tere
st
Nu
mb
er
of
Pate
nts
fo
r T
wo
Tim
e P
eri
od
s
20
05
-20
09
, 0
.82
20
05
-20
09
, 1
.63
20
10
-20
14
, 0
.51
20
10
-20
14
, 1
.67
0.0
0
0.5
0
1.0
0
1.5
0
2.0
0
NIS
T A
ssig
ned
NIS
T G
ovt In
tere
st
Cit
ati
on
In
de
x f
or
Tw
o T
ime
Pe
rio
ds
20
05
-20
09
, 1
.01
20
05
-20
09
, 1
.18
20
10
-20
14
, 1
.03
20
10
-20
14
, 1
.15
0.0
0
0.5
0
1.0
0
1.5
0
NIS
T A
ssig
ned
NIS
T G
ovt In
tere
st
Ori
gin
ality
In
de
x f
or
Tw
o T
ime
Pe
rio
ds
20
05
-20
09
, 0
.63
20
05
-20
09
, 1
.86
20
10
-20
14
, 0
.70
20
10
-20
14
, 2
.24
0.0
0
0.5
0
1.0
0
1.5
0
2.0
0
2.5
0
NIS
T A
ssig
ned
NIS
T G
ovt In
tere
st
Ge
ne
rality
In
de
x f
or
Tw
o T
ime
Pe
rio
ds
Figu
re 4
: Pat
ent M
etric
s fo
r NIS
T A
ssig
ned
Pate
nts
and
NIS
T G
over
nmen
t In
tere
st P
aten
ts (U
S Pa
tent
s 20
05-2
009
and
2010
-201
4)
29
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6.3
7.0
0.0
1.0
2.0
3.0
4.0
5.0
6.0
7.0
8.0
200
02
00
12
00
22
00
32
00
42
00
52
00
62
00
72
00
82
00
92
01
02
01
12
01
22
01
32
01
4
Citations divided by Year 2000 Citations
Cit
ing
Year
Fig
ure
5A
: G
row
th o
f P
ate
nt
Cit
ati
on
s t
o N
IST
Peer
Revie
wed
Do
cu
men
ts v
ers
us
Pate
nt
Cit
ati
on
s t
o T
op
Jo
urn
als
Pa
tent
Cita
tion
s to
Art
icle
s in
Top
Jou
rna
ls
Pa
tent
Cita
tion
s to
NIS
T J
ourn
al A
rtic
les
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8.6
8.3
0.0
1.0
2.0
3.0
4.0
5.0
6.0
7.0
8.0
9.0
10.0
200
02
00
12
00
22
00
32
00
42
00
52
00
62
00
72
00
82
00
92
01
02
01
12
01
22
01
32
01
4
Citations divided by Year 2000 Citations
Cit
ing
Year
Fig
ure
5B
: G
row
th o
f P
ate
nt
Cit
ati
on
s t
o N
IST
an
d M
IT G
rey L
itera
ture
NIS
T G
rey
Litera
ture
MIT
Gre
y L
itera
ture
31
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010
00
20
00
30
00
40
00
50
00
60
00
70
00
Na
no
tech
no
log
y
Packag
ing
/La
be
ling
/Con
veyin
g
Te
xtile
s a
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App
are
l
Build
ing
/Co
nstr
uct
ion M
ate
rials
Agri
culture
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al H
usba
nd
ry
Spo
rts/G
am
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mu
sem
en
ts
Indu
str
ial P
rocesses/E
quip
men
t
Eart
h M
ovin
g/D
rilli
ng
/Min
ing/B
lastin
g
Moto
r V
eh
icle
s,
En
gin
es, P
art
s a
nd O
the
r M
echa
nic
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xtr
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ork
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lastics
Petr
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De
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Org
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Sm
all
Cate
gs
(Ae
rosp.,
Cosm
et.
, F
ood
, F
urn
itu
re, P
ape
r, e
tc.)
Nu
cle
ar
and
X-R
ay
Op
tics/P
hoto
gra
ph
y/E
lect
rop
ho
tog
rap
hy
Dia
gno
sis
/Su
rge
ry/M
edic
al In
str
um
en
ts
Bio
tech
no
logy
Sem
ico
nd
ucto
rs/S
olid
-Sta
te D
evic
es/E
lectr
on
ics
Instr
um
en
ts/M
ea
suri
ng
, T
estin
g &
Co
ntr
ol
Co
mm
unic
atio
ns/M
ostly T
ele
com
Co
mpu
ter
Hard
wa
re a
nd
Soft
wa
re
# U
S P
ate
nt
Cit
ati
on
s 1
975-J
uly
31, 2015
Fig
ure
6:
To
p C
itin
g T
ec
hn
olo
gy C
ate
go
rie
s v
ers
us
NIS
T D
oc
um
en
t
Typ
e (
Bro
ad
Ca
teg
ori
es
)
Gre
y L
itera
ture
NIS
T A
ssig
ne
d P
ate
nts
NIS
T A
uth
ore
d P
ee
r R
evie
wed
Pa
pe
rs
NIS
T G
ove
rnm
ent
Inte
rest P
ate
nts
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01000
2000
3000
4000
5000
6000
7000
Na
no
tech
no
log
y
Packag
ing
/La
be
ling
/Con
veyin
g
Te
xtile
s a
nd
App
are
l
Build
ing
/Co
nstr
uct
ion M
ate
rials
Agri
culture
/Anim
al H
usba
nd
ry
Spo
rts/G
am
es/A
mu
sem
en
ts
Indu
str
ial P
rocesses/E
quip
men
t
Eart
h M
ovin
g/D
rilli
ng
/Min
ing/B
lastin
g
Moto
r V
eh
icle
s,
En
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es, P
art
s a
nd O
the
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echa
nic
al
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pin
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lastics
Petr
ole
um
/Gas/C
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Ha
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/Machin
e T
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He
atin
g/V
entila
tion
/AC
/Re
frig
era
tion
De
ntistr
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en
tal P
rep
ara
tion
s
Ele
ctr
ica
l D
evic
es
Meta
llurg
y/M
eta
l W
ork
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Ch
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ical P
rocesse
s
Ele
ctr
ica
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htin
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ispla
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all
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gs
(Ae
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ce,
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sm
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, F
oo
d,
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, P
ap
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etc
.)
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cle
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ay
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tics/P
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ph
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lect
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tog
rap
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olid
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ts/M
ea
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estin
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Pate
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#
Citations
Citation
Index
year
issD
ate
Title
05356756
110
7.5
31994
19941018
Applic
ation o
f m
icro
substr
ate
s f
or
mate
rials
pro
cessin
g
05795782
127
5.8
11998
19980818
Chara
cte
rization o
f in
div
idual poly
mer
mole
cule
s b
ased o
n m
onom
er-
inte
rface inte
ractions
06015714
113
4.7
82000
20000118
Chara
cte
rization o
f in
div
idual poly
mer
mole
cule
s b
ased o
n m
onom
er-
inte
rface inte
ractions
05514501
90
4.1
61996
19960507
Pro
cess f
or
UV
?photo
pattern
ing o
f th
iola
te m
onola
yers
self?assem
ble
d o
n g
old
, silv
er
and o
ther
substr
ate
s
05345213
64
4.1
31994
19940906
Tem
pera
ture
?contr
olle
d, m
icro
machin
ed a
rrays
for
chem
ical sensor
fabrication a
nd o
pera
tion
06467761
34
3.5
12002
20021022
Positio
nin
g s
tage
05787715
38
3.1
21998
19980804
Mix
ed g
as r
efr
igera
tion m
eth
od
06079873
45
2.9
72000
20000627
Mic
ron-s
cale
diffe
rential scannin
g c
alo
rim
ete
r on a
chip
05464966
42
2.8
91995
19951107
Mic
ro?hotp
late
devic
es a
nd m
eth
ods f
or
their f
abrication
06529675
32
2.8
72003
20030304
Meth
od to o
ptim
ize r
are
eart
h c
onte
nt fo
r w
aveguid
e lasers
and a
mplif
iers
06850543
15
2.7
02005
20050201
Mode-locked p
uls
ed laser
syste
m a
nd m
eth
od
06806784
20
2.3
52004
20041019
Min
iatu
re f
requency s
tandard
based o
n a
ll-optical excitation a
nd a
mic
ro-m
achin
ed c
onta
inm
ent vessel
06201638
44
2.2
72001
20010313
Com
b g
enera
ting o
ptical cavity
that in
clu
des a
n o
ptical am
plif
ier
and a
n o
ptical m
odula
tor
05508342
28
2.2
51996
19960416
Poly
meric a
morp
hous c
alc
ium
phosphate
com
positio
ns
06327791
26
2.2
32001
20011211
Chain
code p
ositio
n d
ete
cto
r
08331632
62.2
32012
20121211
Indexin
g f
ace tem
pla
tes u
sin
g lin
ear
models
06484602
15
2.1
92002
20021126
Six
-degre
e o
f fr
eedom
mic
ro-p
ositio
ner
05901783
28
2.0
81999
19990511
Cry
ogenic
heat exchanger
05620857
37
2.0
41997
19970415
Optical tr
ap f
or
dete
ction a
nd q
uantita
tion o
f subzepto
mola
r quantities o
f analy
tes
06088679
233
1.9
82000
20000711
Work
flow
managem
ent em
plo
ying r
ole
-based a
ccess c
ontr
ol
06776619
22
1.8
32004
20040817
Refr
eshable
bra
ille r
eader
06970494
11
1.8
32005
20051129
Rare
-eart
h d
oped p
hosphate
-gla
ss lasers
and a
ssocia
ted m
eth
ods
05274545
27
1.7
91993
19931228
Devic
e a
nd m
eth
od f
or
pro
vid
ing a
ccura
te tim
e a
nd/o
r fr
equency
06626052
14
1.7
32003
20030930
Meth
od a
nd a
ppara
tus f
or
art
ific
ial w
eath
ering
05280176
29
1.7
11994
19940118
X?ra
y p
hoto
ele
ctr
on e
mis
sio
n s
pectr
om
etr
y s
yste
m
07709807
51.6
72010
20100504
Magneto
-optical tr
ap ion s
ourc
e
06648102
12
1.6
62003
20031118
Suspended d
ry d
ock p
latf
orm
07538881
51.6
52009
20090526
Fre
quency c
om
b c
avity
enhanced s
pectr
oscopy
06269144
32
1.6
32001
20010731
Meth
od a
nd a
ppara
tus f
or
diffr
action m
easure
ment usin
g a
scannin
g x
-ray
sourc
e
06034776
37
1.5
72000
20000307
Mic
roro
ughness-b
lind o
ptical scattering instr
um
ent
06002740
34
1.5
31999
19991214
Meth
od a
nd a
ppara
tus f
or
X-r
ay
and e
xtr
em
e u
ltra
vio
let in
spection o
f lit
hogra
phy
masks a
nd o
ther
obje
cts
06679938
91.4
92004
20040120
Meth
od o
f pro
ducin
g m
eta
l part
icle
s b
y s
pra
y pyro
lysis
usin
g a
co-s
olv
ent and a
ppara
tus there
for
05242800
23
1.4
81993
19930907
Recepto
r fo
r path
ogenic
fungi
06502463
13
1.4
62003
20030107
Ultra
sonic
str
ain
gage u
sin
g a
moto
rized e
lectr
om
agnetic a
coustic tra
nsducer
06169397
16
1.3
92001
20010102
Dam
ped s
uperc
onducting c
oil
syste
m h
avin
g a
multiturn
, pla
nar
geom
etr
y s
uperc
onducting c
oil
and s
hunt re
sis
tors
ele
ctr
ically
connecting s
uccessiv
e c
oil
turn
s
07009595
41
1.3
82006
20060307
Exte
nded r
efr
eshable
tactile
gra
phic
arr
ay
for
scanned tactile
dis
pla
y
05942397
31
1.3
31999
19990824
Surf
ace im
mobili
zation o
f bio
poly
mers
06393566
60
1.3
22002
20020521
Tim
e-s
tam
p s
erv
ice f
or
the n
ational in
form
ation n
etw
ork
05634718
23
1.3
11997
19970603
Part
icle
calo
rim
ete
r w
ith n
orm
al m
eta
l base laye
r
05293447
24
1.3
01994
19940308
Photo
voltaic
sola
r w
ate
r heating s
yste
m
06727492
81.2
72004
20040427
Cavity
ringdow
n s
pectr
oscopy s
yste
m u
sin
g d
iffe
rential hete
rodyn
e d
ete
ction
06151901
15
1.2
62000
20001128
Min
iatu
re m
ixed g
as r
efr
igera
tion s
yste
m
05919576
20
1.2
41999
19990706
Imm
obili
zed b
iolo
gic
al m
em
bra
nes
06043166
26
1.2
32000
20000328
Sili
con-o
n-insula
tor
substr
ate
s u
sin
g low
dose im
pla
nta
tion
Tab
le 1
: H
igh
ly C
ited
Pate
nts
Assig
ned
to
NIS
T
38
This
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n is
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T.G
CR
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09
Pate
nt
# C
ites
Citation
Index
year
issD
ate
Title
Pate
nt A
ssig
nee N
am
e
07330404
127
40.1
2008
20080212
Near-
field
optical tr
ansducers
for
therm
al assis
ted m
agnetic a
nd o
ptical data
sto
rage
Seagate
Technolo
gy P
lc
08634617
18
25.0
2014
20140121
Meth
ods f
or
dete
rmin
ing m
enis
cal siz
e a
nd s
hape a
nd f
or
devis
ing tre
atm
ent
Concorm
is Inc
08638998
17
25.0
2014
20140128
Fusio
n o
f m
ultip
le im
agin
g p
lanes f
or
isotr
opic
im
agin
g in M
RI and q
uantita
tive im
age a
naly
sis
usin
g isotr
opic
or
near-
isotr
opic
imagin
gC
oncorm
is Inc
08734846
12
22.0
2014
20140527
Meth
ods f
or
the p
repara
tion o
f ta
rgeting a
gent fu
nctionaliz
ed d
iblo
ck c
opoly
mers
for
use in f
abrication o
f th
era
peutic targ
ete
d
nanopart
icle
sB
IND
BIO
SC
IEN
CE
S IN
C
07272079
67
20.8
2007
20070918
Tra
nsducer
for
heat assis
ted m
agnetic r
ecord
ing
Seagate
Technolo
gy P
lc
08094900
29
19.1
2012
20120110
Fusio
n o
f m
ultip
le im
agin
g p
lanes f
or
isotr
opic
im
agin
g in M
RI and q
uantita
tive im
age a
naly
sis
usin
g isotr
opic
or
near-
isotr
opic
imagin
gC
oncorm
is Inc
08625874
618.2
2014
20140107
Meth
ods a
nd d
evic
es f
or
analy
sis
of
x-r
ay
images
IMA
TX
IN
C
08420123
21
16.5
2013
20130416
Dru
g loaded p
oly
meric n
anopart
icle
s a
nd m
eth
ods o
f m
akin
g a
nd u
sin
g s
am
eB
IND
BIO
SC
IEN
CE
S IN
C
08077950
49
16.3
2011
20111213
Meth
ods f
or
dete
rmin
ing m
enis
cal siz
e a
nd s
hape a
nd f
or
devis
ing tre
atm
ent
Concorm
is Inc
07767867
30
16.1
2010
20100803
Meth
ods a
nd s
yste
ms f
or
genera
ting p
oly
ols
VIR
EN
T E
NE
RG
Y S
YS
. IN
C
07379529
98
15.6
2008
20080527
Meth
ods a
nd d
evic
es f
or
quantita
tive a
naly
sis
of
x-r
ay
images
IMA
GIN
G T
HE
RA
PE
UT
ICS
IN
C
07500255
24
15.5
2009
20090303
Data
writing w
ith p
lasm
on r
esonato
rS
eagate
Technolo
gy P
lc
07596072
18
15.4
2009
20090929
Optical re
cord
ing u
sin
g a
waveguid
e s
tructu
re a
nd a
phase c
hange m
ediu
mS
eagate
Technolo
gy P
lc
06685852
99
14.5
2004
20040203
Phosphor
ble
nds f
or
genera
ting w
hite lig
ht fr
om
near-
UV
/blu
e lig
ht-
em
itting d
evic
es
Genera
l E
lectr
ic C
om
pany
08613951
14
14.0
2013
20131224
Thera
peutic p
oly
meric n
anopart
icle
s w
ith m
Tor
inhib
itors
and m
eth
ods o
f m
akin
g a
nd u
sin
g s
am
eB
IND
TH
ER
AP
EU
TIC
S IN
C
06734401
116
14.0
2004
20040511
Enhanced s
am
ple
pro
cessin
g d
evic
es, syste
ms a
nd m
eth
ods
3M
Co
08206747
38
13.6
2012
20120626
Dru
g loaded p
oly
meric n
anopart
icle
s a
nd m
eth
ods o
f m
akin
g a
nd u
sin
g s
am
eB
IND
BIO
SC
IEN
CE
S IN
C
07087387
87
13.1
2006
20060808
Nucle
ic a
cid
arc
hiv
ing
Therm
o F
isher
Scie
ntific Inc
08257866
813.1
2012
20120904
Tem
pla
te e
lectr
ode s
tructu
res f
or
depositin
g a
ctive m
ate
rials
AM
PR
IUS
IN
C
07796791
61
12.5
2010
20100914
Meth
ods f
or
dete
rmin
ing m
enis
cal siz
e a
nd s
hape a
nd f
or
devis
ing tre
atm
ent
Concorm
is Inc
07634119
77
12.2
2009
20091215
Fusio
n o
f m
ultip
le im
agin
g p
lanes f
or
isotr
opic
im
agin
g in M
RI and q
uantit. im
age a
naly
sis
usin
g isotr
opic
or
near-
iso..
Concorm
is Inc
07045361
124
12.1
2006
20060516
Analy
te s
ensin
g v
ia a
cridin
e-b
ased b
oro
nate
bio
sensors
Medtr
onic
Inc
07270694
38
11.9
2007
20070918
Sta
bili
zed s
ilver
nanopart
icle
s a
nd their u
se
Xero
x C
orp
07645581
27
11.8
2010
20100112
Dete
rmin
ing n
ucle
ic a
cid
fra
gm
enta
tion s
tatu
s b
y coin
cid
ent dete
ction o
f tw
o labele
d p
robes
Perk
inE
lmer
Inc.
08318211
30
11.3
2012
20121127
Thera
peutic p
oly
meric n
anopart
icle
s c
om
prisin
g v
inca a
lkalo
ids a
nd m
eth
ods o
f m
akin
g a
nd u
sin
g s
am
eB
IND
BIO
SC
IEN
CE
S IN
C
06944112
47
10.8
2005
20050913
Heat assis
ted m
agnetic r
ecord
ing h
ead w
ith a
pla
nar
waveguid
eS
eagate
Technolo
gy P
lc
07490092
57
10.5
2009
20090210
Meth
od a
nd s
yste
m f
or
indexin
g a
nd s
earc
hin
g tim
ed m
edia
info
rmation b
ased u
pon r
ele
vance inte
rvals
ST
RE
AM
SA
GE
IN
C
08318208
30
9.9
2012
20121127
Dru
g loaded p
oly
meric n
anopart
icle
s a
nd m
eth
ods o
f m
akin
g a
nd u
sin
g s
am
eB
IND
BIO
SC
IEN
CE
S IN
C
06613513
125
9.8
2003
20030902
Sequencin
g b
y in
corp
ora
tion
Perk
inE
lmer
Inc.
07480214
16
9.6
2009
20090120
Eff
icie
nt w
aveguid
e c
ouple
r fo
r data
record
ing tra
nsducer
Seagate
Technolo
gy P
lc
08617608
89.5
2013
20131231
Dru
g loaded p
oly
meric n
anopart
icle
s a
nd m
eth
ods o
f m
akin
g a
nd u
sin
g s
am
eB
IND
TH
ER
AP
EU
TIC
S IN
C
06621211
142
9.4
2003
20030916
White lig
ht em
itting p
hosphor
ble
nds f
or
LE
D d
evic
es
Genera
l E
lectr
ic C
om
pany
06795630
82
9.4
2004
20040921
Appara
tus a
nd m
eth
od f
or
pro
ducin
g a
sm
all
spot of
optical energ
yS
eagate
Technolo
gy P
lc
08603534
79.0
2013
20131210
Dru
g loaded p
oly
meric n
anopart
icle
s a
nd m
eth
ods o
f m
akin
g a
nd u
sin
g s
am
eB
IND
TH
ER
AP
EU
TIC
S IN
C
08613954
79.0
2013
20131224
Dru
g loaded p
oly
meric n
anopart
icle
s a
nd m
eth
ods o
f m
akin
g a
nd u
sin
g s
am
eB
IND
TH
ER
AP
EU
TIC
S IN
C
07660453
40
8.5
2010
20100209
Meth
ods a
nd d
evic
es f
or
analy
sis
of
x-r
ay
images
IMA
GIN
G T
HE
RA
PE
UT
ICS
IN
C
07688689
78.4
2010
20100330
Head w
ith o
ptical bench f
or
use in d
ata
sto
rage d
evic
es
Seagate
Technolo
gy P
lc
08156996
10
8.2
2012
20120417
Casting a
ppara
tus a
nd m
eth
od
Alle
gheny
Technolo
gie
s Inc
06657236
240
8.0
2003
20031202
Enhanced lig
ht extr
action in L
ED
s thro
ugh the u
se o
f in
tern
al and e
xte
rnal optical ele
ments
Cre
e Inc.
06939481
69
7.9
2005
20050906
White lig
ht em
itting p
hosphor
ble
nds f
or
LE
D d
evic
es
Genera
l E
lectr
ic C
om
pany
07525541
38
7.3
2009
20090428
Data
pro
cessin
g f
or
thre
e-d
imensio
nal dis
pla
ysA
CT
UA
LIT
Y S
YS
TE
MS
IN
C
07412143
45
7.3
2008
20080812
Heat assis
ted m
agnetic r
ecord
ing w
ith h
eat pro
file
shapin
gS
eagate
Technolo
gy P
lc
07027700
32
7.2
2006
20060411
Pla
nar
waveguid
e f
or
heat assis
ted m
agnetic r
ecord
ing
Seagate
Technolo
gy P
lc
06753108
65
7.2
2004
20040622
Energ
y devic
es a
nd m
eth
ods f
or
the f
abrication o
f energ
y d
evic
es
Cabot C
orp
.
07155732
19
7.2
2006
20061226
Heat assis
ted m
agnetic r
ecord
ing h
ead a
nd m
eth
od
Seagate
Technolo
gy P
lc
06853131
72
7.1
2005
20050208
Sin
gle
phosphor
for
cre
ating w
hite lig
ht w
ith h
igh lum
inosity
and h
igh C
RI in
a U
V L
ED
devic
eG
enera
l E
lectr
ic C
om
pany
Tab
le 2
: H
igh
ly C
ited
NIS
T G
overn
men
t In
tere
st
Pate
nts
39
This
pu
blic
atio
n is
availa
ble
free o
f charg
e fro
m: h
ttp://d
x.d
oi.o
rg/1
0.6
028
/ NIS
T.G
CR
.16-0
09
Age W
eig
hte
d
Citation Index
# P
ate
nt
Citations
Page
Pub
Year
Auth
or(
s)
Title
Journ
al
50.4
277
496
1995
FLE
ISC
HM
AN
N, R
D; A
DA
MS
, M
D; W
HIT
E,
O; C
LA
YT
ON
, R
A;…
WH
OLE
-GE
NO
ME
RA
ND
OM
SE
QU
EN
CIN
G A
ND
AS
SE
MB
LY
OF
HA
EM
OP
HIL
US
-
INF
LU
EN
ZA
E R
DS
CIE
NC
E
42.4
161
399
2003
Zhao, W
; C
hella
ppa, R
; P
hill
ips, P
J;
Rosenfe
ld, A
Face r
ecognitio
n: A
litera
ture
surv
ey
AC
M C
OM
PU
TIN
G S
UR
VE
YS
27.4
137
13770
1996
Kasia
now
icz, JJ; B
randin
, E
; B
ranto
n, D
;
Deam
er,
DW
Chara
cte
rization o
f in
div
idual poly
nucle
otide m
ole
cule
s u
sin
g a
mem
bra
ne c
hannel
PR
OC
EE
DIN
GS
OF
TH
E N
AT
ION
AL A
CA
DE
MY
OF
SC
IEN
CE
S
20.0
120
2975
1991
DA
NIE
LS
ON
, B
L; B
OIS
RO
BE
RT
, C
YA
BS
OLU
TE
OP
TIC
AL R
AN
GIN
G U
SIN
G L
OW
CO
HE
RE
NC
E IN
TE
RF
ER
OM
ET
RY
AP
PLIE
D O
PT
ICS
19.3
116
2836
1987
DA
NIE
LS
ON
, B
L; W
HIT
TE
NB
ER
G, C
DG
UID
ED
-WA
VE
RE
FLE
CT
OM
ET
RY
WIT
H M
ICR
OM
ET
ER
RE
SO
LU
TIO
NA
PP
LIE
D O
PT
ICS
18.2
91
2648
2001
Gao, J; X
u, JD
; Locascio
, LE
; Lee, C
SIn
tegra
ted m
icro
fluid
ic s
yste
m e
nablin
g p
rote
in d
igestion, peptide s
epara
tion, and p
rote
in
identification
AN
ALY
TIC
AL C
HE
MIS
TR
Y
14.8
89
246
1993
CH
AN
G, JY
C; A
BID
I, A
A; G
AIT
AN
, M
LA
RG
E S
US
PE
ND
ED
IN
DU
CT
OR
S O
N S
ILIC
ON
AN
D T
HE
IR U
SE
IN
A 2
-MU
-M C
MO
S R
F
AM
PLIF
IER
IEE
E E
LE
CT
RO
N D
EV
ICE
LE
TT
ER
S
17.6
88
6508
1999
Will
iam
s, P
AR
ota
ting-w
ave-p
late
Sto
kes p
ola
rim
ete
r fo
r diffe
rential gro
up d
ela
y m
easure
ments
of
pola
rization-
mode d
ispers
ion
AP
PLIE
D O
PT
ICS
14.3
86
1852
1990
FU
KA
SE
, Y
; E
AN
ES
, E
D; T
AK
AG
I, S
;
CH
OW
, LC
; B
RO
WN
, W
E
SE
TT
ING
RE
AC
TIO
NS
AN
D C
OM
PR
ES
SIV
E S
TR
EN
GT
HS
OF
CA
LC
IUM
-PH
OS
PH
AT
E
CE
ME
NT
SJO
UR
NA
L O
F D
EN
TA
L R
ES
EA
RC
H
17.0
85
235
2000
Berm
an, H
M; W
estb
rook, J; F
eng, Z
;
Gill
iland, G
; B
hat, T
N; W
eis
sig
, H
;…T
he P
rote
in D
ata
Bank
NU
CLE
IC A
CID
S R
ES
EA
RC
H
15.4
77
6142
1997
Egelh
off
, W
F; C
hen, P
J; P
ow
ell,
CJ; S
tile
s,
MD
; M
cM
ichael, R
D;…
Oxygen a
s a
surf
acta
nt in
the g
row
th o
f gia
nt m
agneto
resis
tance s
pin
valv
es
JO
UR
NA
L O
F A
PP
LIE
D P
HY
SIC
S
34.0
68
50
2010
Mell,
P; G
rance, T
The N
IST
Definitio
n o
f C
loud C
om
puting
CO
MM
UN
ICA
TIO
NS
OF
TH
E A
CM
13.6
68
3227
1999
Akeson, M
; B
ranto
n, D
; K
asia
now
icz, JJ;…
Mic
rosecond tim
e-s
cale
dis
crim
ination a
mong p
oly
cytidyl
ic a
cid
, poly
adenylic
acid
, and
poly
uridylic
acid
as h
om
opoly
mers
or
as s
egm
ents
within
sin
gle
RN
A m
ole
cule
sB
IOP
HY
SIC
AL J
OU
RN
AL
15.2
64
98
2002
Eklu
nd, C
; M
ark
s, R
B; S
tanw
ood, K
L; W
ang,
S
IEE
E S
tandard
802.1
6: A
technic
al overv
iew
of
the W
irele
ssM
AN
(T
M)
air inte
rface f
or
bro
adband
wirele
ss a
ccess
IEE
E C
OM
MU
NIC
AT
ION
S M
AG
AZ
INE
9.0
54
189
1991
VO
OR
HE
ES
, K
J; S
CH
ULZ
, W
D; K
UN
EN
,
SM
; H
EN
DR
ICK
S, LJ;…
AN
ALY
SIS
OF
IN
SO
LU
BLE
CA
RB
ON
AC
EO
US
MA
TE
RIA
LS
FR
OM
AIR
BO
RN
E P
AR
TIC
LE
S
CO
LLE
CT
ED
IN
PR
IST
INE
RE
GIO
NS
OF
CO
LO
RA
DO
JO
UR
NA
L O
F A
NA
LY
TIC
AL A
ND
AP
PLIE
D P
YR
OLY
SIS
14.6
51
2005
Ohno, Y
Spectr
al desig
n c
onsid
era
tions f
or
white L
ED
colo
r re
ndering
OP
TIC
AL E
NG
INE
ER
ING
10.2
51
2001
Burn
ett, JH
; Levin
e, Z
H; S
hirle
y, E
LIn
trin
sic
birefr
ingence in c
alc
ium
flu
oride a
nd b
arium
flu
oride
PH
YS
ICA
L R
EV
IEW
B
10.2
51
6696
1998
Wu, C
M; D
esla
ttes, R
DA
naly
tical m
odelin
g o
f th
e p
eriodic
nonlin
earity
in h
ete
rodyne inte
rfero
metr
yA
PP
LIE
D O
PT
ICS
8.5
51
667
1974
GR
EG
OR
Y, T
M; M
OR
EN
O, E
C; P
AT
EL, JM
;
BR
OW
N, W
E
SO
LU
BIL
ITY
OF
BE
TA
-CA
3(P
O4)2
IN
SY
ST
EM
CA
(OH
)2-H
3P
O4-H
2O
AT
5, 15, 25, A
ND
37
DE
GR
EE
S C
JO
UR
NA
L O
F R
ES
EA
RC
H O
F T
HE
NA
TIO
NA
L B
UR
EA
U O
F
ST
AN
DA
RD
S S
EC
TIO
N A
-PH
YS
ICS
AN
D C
HE
MIS
TR
Y
8.3
50
384
1987
CH
OH
AY
EB
, A
A; C
HO
W, LC
; T
SA
KN
IS, P
JE
VA
LU
AT
ION
OF
CA
LC
IUM
-PH
OS
PH
AT
E A
S A
RO
OT
-CA
NA
L S
EA
LE
R-F
ILLE
R M
AT
ER
IAL
JO
UR
NA
L O
F E
ND
OD
ON
TIC
S
8.3
50
273
1977
MC
DO
WE
LL, H
; G
RE
GO
RY
, T
M; B
RO
WN
,
WE
SO
LU
BIL
ITY
OF
CA
5(P
O4)3
OH
IN
SY
ST
EM
CA
(OH
)2-H
3P
O4-H
2O
AT
5-D
EG
RE
ES
-C, 15-
DE
GR
EE
S-C
, 25-D
EG
RE
ES
-C A
ND
37-D
EG
RE
ES
-C
JO
UR
NA
L O
F R
ES
EA
RC
H O
F T
HE
NA
TIO
NA
L B
UR
EA
U O
F
ST
AN
DA
RD
S S
EC
TIO
N A
-PH
YS
ICS
AN
D C
HE
MIS
TR
Y
9.8
49
1930
2000
Xu, JD
; Locascio
, L; G
aitan, M
; Lee, C
SR
oom
-tem
pera
ture
im
printing m
eth
od f
or
pla
stic m
icro
channel fa
brication
AN
ALY
TIC
AL C
HE
MIS
TR
Y
8.0
48
675
1974
PA
TE
L, P
R; G
RE
GO
RY
, T
M; B
RO
WN
, W
ES
OLU
BIL
ITY
OF
CA
HP
O4 2
H2O
IN
QU
AT
ER
NA
RY
SY
ST
EM
CA
(OH
)2-H
3P
O4-N
AC
L-H
2O
AT
25 D
EG
RE
ES
C
JO
UR
NA
L O
F R
ES
EA
RC
H O
F T
HE
NA
TIO
NA
L B
UR
EA
U O
F
ST
AN
DA
RD
S S
EC
TIO
N A
-PH
YS
ICS
AN
D C
HE
MIS
TR
Y
7.8
47
1356
1981
HO
ER
, C
AA
HIG
H-P
OW
ER
DU
AL 6
-PO
RT
AU
TO
MA
TIC
NE
TW
OR
K A
NA
LY
ZE
R U
SE
D IN
DE
TE
RM
ININ
G B
IOLO
GIC
AL E
FF
EC
TS
OF
RF
AN
D M
ICR
OW
AV
E-R
AD
IAT
ION
IEE
E T
RA
NS
AC
TIO
NS
ON
MIC
RO
WA
VE
TH
EO
RY
AN
D
TE
CH
NIQ
UE
S
7.7
46
954
1991
CH
OW
, LC
DE
VE
LO
PM
EN
T O
F S
ELF
-SE
TT
ING
CA
LC
IUM
-PH
OS
PH
AT
E C
EM
EN
TS
NIP
PO
N S
ER
AM
IKK
US
U K
YO
KA
I G
AK
UJU
TS
U R
ON
BU
NS
HI-
JO
UR
NA
L O
F T
HE
CE
RA
MIC
SO
CIE
TY
OF
JA
PA
N
7.7
46
1982
CH
AB
AY
, I
OP
TIC
AL-W
AV
EG
UID
ES
AN
ALY
TIC
AL C
HE
MIS
TR
Y
8.8
44
305
1998
Vassili
ev, V
V; V
elic
hansky, V
L; Ilchenko, V
S;
Goro
dets
ky, M
L;…
Narr
ow
-lin
e-w
idth
dio
de laser
with a
hig
h-Q
mic
rosphere
resonato
rO
PT
ICS
CO
MM
UN
ICA
TIO
NS
7.2
43
162
1990
SU
GA
WA
RA
, A
; C
HO
W, LC
; T
AK
AG
I, S
;
CH
OH
AY
EB
, H
INV
ITR
O E
VA
LU
AT
ION
OF
TH
E S
EA
LIN
G A
BIL
ITY
OF
A C
ALC
IUM
-PH
OS
PH
AT
E C
EM
EN
T
WH
EN
US
ED
AS
A R
OO
T-C
AN
AL S
EA
LE
R-F
ILLE
RJO
UR
NA
L O
F E
ND
OD
ON
TIC
S
7.2
43
383
1983
KN
AB
, LI; C
LIF
TO
N, JR
; IN
GS
, JB
EF
FE
CT
S O
F M
AX
IMU
M V
OID
SIZ
E A
ND
AG
GR
EG
AT
E C
HA
RA
CT
ER
IST
ICS
ON
TH
E
ST
RE
NG
TH
OF
MO
RT
AR
CE
ME
NT
AN
D C
ON
CR
ET
E R
ES
EA
RC
H
7.0
42
385
1991
FR
IED
MA
N, C
D; C
OS
TA
NT
INO
, P
D;
JO
NE
S, K
; C
HO
W, LC
; P
ELZ
ER
, H
J;
SIS
SO
N, G
A
HY
DR
OX
YA
PA
TIT
E C
EM
EN
T .2. O
BLIT
ER
AT
ION
AN
D R
EC
ON
ST
RU
CT
ION
OF
TH
E C
AT
FR
ON
TA
L-S
INU
SA
RC
HIV
ES
OF
OT
OLA
RY
NG
OLO
GY
-HE
AD
& N
EC
K S
UR
GE
RY
8.2
41
8916
1997
Hern
e, T
M; T
arlov, M
JC
hara
cte
rization o
f D
NA
pro
bes im
mobili
zed o
n g
old
surf
aces
JO
UR
NA
L O
F T
HE
AM
ER
ICA
N C
HE
MIC
AL S
OC
IET
Y
14.3
40
2789
2007
Berr
y, B
C; B
osse, A
W; D
ougla
s, JF
; Jones,
RL; K
arim
, A
Orienta
tional ord
er
in b
lock c
opoly
mer
film
s z
one a
nneale
d b
elo
w the o
rder-
dis
ord
er
transitio
n
tem
pera
ture
NA
NO
LE
TT
ER
S
Tab
le 3
: N
IST
Peer
Revie
wed
(W
eb
Of
Scie
nce)
Pu
blicati
on
s H
igh
ly C
ited
in
Pate
nts
40
This
pu
blic
atio
n is
availa
ble
free o
f charg
e fro
m: h
ttp://d
x.d
oi.o
rg/1
0.6
028
/ NIS
T.G
CR
.16-0
09
# P
ate
nt
Citations
Art
icle
28
Will
iam
E. B
urr
, et al., "A
Pro
posed F
edera
l P
KI U
sin
g X
.509 V
3 C
ert
ific
ate
s,"
<i>
NIS
T P
resenta
tion <
/i>
, 1
996, 12 p
p.
24
Fra
mew
ork
for
National In
form
ation Infr
astr
uctu
re S
erv
ices, N
IST
, Jul. 1
994, 12 s
lides.
23
Bern
old
, L.. e
t al. “
Equip
ment opera
tor
train
ing in the a
ge o
f in
tern
et2
,” P
roceedin
gs o
f 19th
Inte
rnational S
ym
posiu
m o
n A
uto
mation a
nd R
obotics in
Constr
uction (
ISA
RC
2002),
Sep. 2002 [re
trie
ved o
n N
ov. 12, 2010]. R
etr
ieved f
rom
the Inte
rnet: <
UR
L: http
22
Heberlein
, L. T
., e
t al., "A
Meth
od to D
ete
ct In
trusiv
e A
ctivity
in a
Netw
ork
ed E
nvironm
ent,"
Pro
ceedin
gs o
f th
e F
ourt
eenth
National C
om
pute
r S
ecurity
Confe
rence, N
IST
/NC
SC
, O
ct. 1
-4, 1991, W
ashin
gto
n, D
.C., p
p. 362-3
71.
21
Donna F
. D
odson, "P
KI Im
ple
menta
tion P
roje
cts
," <
i> N
IST
Pre
senta
tion <
/i>
, 1
996, 17 p
p.
19
Voorh
ees, E
llen M
., "
The T
RE
C-8
Question A
nsw
ering T
rack R
eport
", N
IST
, pp. 1-6
, 1999.
19
Porr
as, P
.A. et al., "E
ME
RA
LD
: E
vent M
onitoring E
nablin
g R
esponses to A
nom
alo
us L
ive D
istu
rbances,"
Oct. 1
997, P
roceedin
gs o
f th
e 2
0 <
sup>
th <
/sup>
NIS
T-N
CS
C N
ational In
form
ation S
yste
ms S
ecurity
(N
ISS
) C
onfe
rence.
15
Sandhu, R
avi, S
., e
t al., "I
mple
menta
tion C
onsid
era
tions f
or
the T
yped A
ccess M
atr
ix M
odel in
a D
istr
ibute
d E
nvironm
ent,"
Pro
ceedin
gs o
f th
e 1
5th
NIS
T-S
CS
C
National C
om
pute
r S
ecurity
Confe
rence, B
altim
ore
, M
ary
land, O
ct. 1
992, pp. 221-2
35.
14
Noel A
. N
azario, "S
ecurity
Polic
ies f
or
the F
edera
l P
ublic
Key
Infr
astr
uctu
re,"
<i>
NIS
T P
resenta
tion <
/i>
, 1
996, 11 p
p.
14
Will
iam
T. P
olk
, "M
inim
um
Inte
ropera
bili
ty S
pecific
ations f
or
PK
I C
om
ponents
," <
i> N
IST
pre
senta
tion <
/i>
, 1
996, 13 p
p.
14
Noel A
. N
azario, et al., "M
anagem
ent M
odel fo
r th
e F
edera
l P
ublic
Key
Infr
astr
uctu
re,"
<i>
NIS
T P
resenta
tion <
/i>
, 1
996, 9 p
p.
13
Burn
ett e
t al., "I
ntr
insic
Birefr
ingence in 1
57 n
m M
ate
rials
," <
i> N
IST
</i>
, S
EM
AT
EC
H C
alc
ium
Flu
oride B
irefr
ingence W
ork
shop, Jul. 1
8, 2001, S
lides.
11
Rabin
ovic
h e
t al., "O
n B
oard
Pla
sm
atr
on G
enera
tion o
f H
ydro
gen R
ich G
as f
or
Engin
e P
ollu
tion R
eduction",
Pro
ceedin
gs o
f N
IST
Work
shop o
n A
dvanced
Com
ponents
for
Ele
ctr
ic a
nd H
ybrid E
lectr
ic V
ehic
les, G
aithers
burg
, M
D, pp. 83-8
8 (
Oct. 1
993)
(not publis
hed)
10
Weste
rveld
, T
. et al., "R
etr
ievin
g W
eb p
ages u
sin
g C
onte
nt, L
inks, U
RLs a
nd A
nchors
", P
roceedin
gs o
f th
e T
enth
Text R
etr
ieval C
onfe
rence, N
IST
Specia
l
Public
ation, 'O
nlin
e!
Oct. 2
001, pp. 1-1
0.
8"T
he D
igital D
istr
ibute
d S
yste
m S
ecurity
Arc
hitectu
re",
Morr
ie G
asser,
et al., N
IST
, 12th
Nat'l
Com
pute
r S
ecurity
Confe
rence, O
ct. 1
0-1
3, 1989.
8<
i>F
ram
ew
ork
for
National In
form
ation Infr
astr
uctu
re S
erv
ices <
/i>
, N
IST
, Jul. 1
994, 12 S
lides.
8"F
ram
ew
ork
for
National In
form
ation Infr
astr
uctu
re S
erv
ices,"
NIS
T, Jul. 1
994, 12 s
lides.
8
Vik
tor
Fis
cher,
<i>
Realiz
ation o
f th
e R
ound 2
AE
S C
andid
ate
s U
sin
g A
ltera
FP
GA
</i>
, (
Jan. 26, 2001)
<http://c
src
.nis
t.gov/C
rypto
Toolk
it/a
es/r
oun2/c
onf3
/papers
/24-v
fischer.
pdf>
(M
icro
nic
--K
osic
e, S
lovakia
).
8
Khoshnevis
, B
. et al. 2
002. A
uto
mate
d C
onstr
uction U
sin
g C
onto
ur
Cra
ftin
g: A
pplic
ations o
n E
art
h a
nd B
eyo
nd. In
tern
ational S
ym
posiu
m o
n A
uto
mation a
nd
Robotics in C
onstr
uction, 19th
(IS
AR
C).
Pro
ceedin
gs. N
IST
, G
aithers
burg
, M
ary
land. S
ep. 23-2
5, 2002, pp.
8
V. V
ara
dhara
jan, "N
otification: A
Pra
tical S
ecurity
Pro
ble
m in D
istr
ibute
d S
yste
ms,"
<i>
Pro
c. of
the 1
4 <
/i>
<sup>
th <
/sup>
<i>
National C
om
pute
r S
ecurity
Confe
rence <
/i>
, N
IST
/ N
ational C
om
pute
r S
ecurity
Cente
r, O
ct. 1
-4, 1991, pp. 386-3
96.
7Jud H
ofm
ann, <
i> Inte
rfacin
g the N
II to U
ser
Hom
es <
/i>
, (
Consum
er
Ele
ctr
onic
Bus. C
om
mitte
e)
NIS
T, Jul. 1
994, 12 s
lides.
7B
urn
ett e
t al., "I
ntr
insic
Birefr
ingence in 1
57 n
m M
ate
rials
," <
i> N
IST
</i>
, S
lides.
7H
ofm
ann, L.J
., "
Inte
rfacin
g the N
II to U
ser
Hom
es,"
Consum
er
Ele
ctr
onic
Bus. C
om
mitte
e, N
IST
, Jul. 1
994, 14 s
lides.
7
Kim
, Y
. et al., "D
iscre
te E
vent S
imula
tion o
f th
e D
iffS
erv
-over-
MP
LS
with N
IST
GM
PLS
Lig
htw
ave A
gile
Sw
itchin
g S
imula
tor
(GLA
SS
),"
Join
t C
onfe
rence o
f
Com
munic
ation a
nd Info
rmation -
2002, Jeju
, K
ore
a, 4 p
gs.
6
Choi, e
t al. "
An O
verv
iew
of
the A
TandT
Spoken D
ocum
ent R
etr
ieval,"
<i>
DA
RP
A/N
IST
Bro
adcast N
ew
s T
ranscription a
nd U
nders
tandin
g W
ork
shop <
/i>
(1998).
6R
esnic
k e
t al., N
ew
Meth
ods f
or
Fabricating S
tep a
nd F
lash Im
print Lithogra
phy
Tem
pla
tes, N
IST
-SP
IE C
onfe
rence o
n N
anote
chnolo
gy S
ep. 1, 2001.
6
Fra
ncis
Kubala
et al.: "S
mart
Info
rmation S
paces: M
anagin
g P
ers
onal and C
olla
bora
tive H
isto
ries,"
<i>
Pro
ceedin
gs o
f th
e 1
998 D
AR
PA
/NIS
T S
mart
Spaces
Work
shop <
/i>
, J
ul. 3
0-3
1, 1998; 6 p
ages.
6
Sandhu, R
avi, S
., e
t al., "I
mple
menta
tion C
onsid
era
tions f
or
the T
yped A
ccess M
atr
ix M
odel in
a D
istr
ibute
d E
nvironm
ent,"
Pro
ceedin
gs o
f th
e 1
5 <
sup>
th
</s
up>
NIS
T-S
CS
C N
ational C
om
pute
r S
ecurity
Confe
rence, B
altim
ore
, M
ary
land, O
ct. 1
992, pp. 221-2
35.
Tab
le 4
:Ed
ucati
on
al
Netw
ork
ing
NIS
T P
ub
licati
on
s H
igh
ly C
ited
in
Pate
nts
41
This
pu
blic
atio
n is
availa
ble
free o
f charg
e fro
m: h
ttp://d
x.d
oi.o
rg/1
0.6
028
/ NIS
T.G
CR
.16-0
09
# P
ate
nt
Citations
Art
icle
364
NIS
T, “A
dvanced E
ncry
ption S
tandard
(A
ES
),”
FIP
S P
ublic
ation 1
97, 52 p
ages, N
ov. 26
, 2001.
345
National In
stitu
te o
f S
tandard
s a
nd T
echnolo
gy, N
IST
FIP
S P
ub 1
80-1
, "S
ecure
Hash S
tandard
", U
.S. D
epart
ment of
Com
merc
e (
Apr.
1995).
191
Announcin
g the S
tandard
for
Dig
ital S
ignatu
re S
tandard
(D
SS
), F
IPS
Public
ation 1
86, M
ay 1
9, 1994, pp. 1-1
8.
168
NIS
T, “S
ecure
Hash S
tandard
,” F
IPS
Public
ation 1
80-2
, 83 p
ages, A
ug. 1, 2002.
163
Security
Requirem
ents
for
Cry
pto
gra
phic
Module
s , F
IPS
Public
ation 1
40 1
, (J
an. 11, 1994),
pp. 1 5
3.
138
U.S
. D
epart
ment of
Com
merc
e, F
IPS
PU
B 4
6, "D
ata
Encry
ption S
tandard
," J
an. 15, 1977.
124
Security
Requirem
ents
for
Cry
pto
gra
phic
Module
s, F
IPS
Public
ation 1
40-2
, M
ay 2
5, 2001, pp. 1-6
2.
123
Dig
ital S
ignatu
re S
tandard
(D
SS
), F
IPS
Public
ation 1
86-2
, Jan. 27, 2000, pp. 1-7
2.
96
"FIP
S P
UB
46-3
." O
ct. 2
5, 1999. N
ational In
stitu
te o
f S
cie
nce a
nd T
echnolo
gy (
NIS
T).
All
pages.
84
"Data
Encry
ption S
tandard
," F
IPS
Public
ation (
FIP
S P
UB
) 46-2
, U
.S. D
epart
ment of
Com
merc
e, N
IST
, D
ec. 30, 1993.
73
"Des M
odes o
f O
pera
tion"
U.S
. F
IPS
Public
ation 8
1, D
ec. 2, 1980, 23 p
gs.
63
Guid
elin
e f
or
the U
se o
f A
dvanced A
uth
entication T
echnolo
gy A
ltern
atives, F
IPS
Public
ation 1
90, S
ep. 28, 1994, re
printe
d a
t
http://c
src
.nis
t.gov/p
ublic
ations/f
ips/f
ips190/f
ip190.txt, p
p. 1-5
5.
59
National In
stitu
te o
f S
cie
nce a
nd T
echnolo
gy C
hem
istr
y W
eb B
ook, S
tandard
Refe
rence D
ata
base N
o. 69, copyright 2008, printe
d o
n O
ct. 2
1, 2009,
http://w
ebbook.n
ist.gov/c
gi/cbook.c
gi?
Nam
e=
hexylc
yclo
hexaneandU
nits=
SI.
56
A R
evie
w o
f C
onte
ntion R
esolu
tion A
lgorith
ms f
or
IEE
E 8
02.1
4 N
etw
ork
s; N
ada G
lom
ie; Y
ves S
ain
tilla
n, and D
avid
H. S
u; N
IST
; pp. 1-1
2.
51
NIS
T, F
IPS
Public
ation: T
he K
eye
d-H
ash M
essage A
uth
entication C
ode (
HM
AC
), F
IPS
PU
B 1
98, In
form
ation T
echnolo
gy L
abora
tory
, G
aithers
burg
, M
ary
land, M
ar.
2002, 20 p
ages.
50
Escro
wed E
ncry
ption S
tandard
(E
ES
) F
IPS
Pub. 185, F
eb. 9, 1994.
46
Com
pute
r D
ata
Auth
entication, F
IPS
Public
ation 1
13, M
ay 3
0, 1985, (w
eb s
ite a
t w
ww
.itl.n
ist.gov/f
ipspubs/f
ip113.h
tm),
date
of
captu
re J
an. 16, 2001, pp. 1-7
.
45
Entity
Auth
entication U
sin
g P
ublic
Key
Cry
pto
gra
phy,
FIP
S P
ublic
ation 1
96, F
eb. 18, 1997, pp. 1-5
2.
43
FIP
S P
UB
74, "F
IPS
Public
ation 1
981 G
uid
elin
es f
or
Imple
menting a
nd U
sin
g the N
BS
Data
Encry
ption S
tandard
," F
IPS
Public
ation 7
4, N
IST
, A
pr.
1, 1981, 39 p
ages.
39
Key
Managem
ent U
sin
g A
NS
I X
9.1
7, F
IPS
Public
ation 1
71, U
.S. D
epart
ment of
Com
merc
e, A
pr.
1992.
38
NIS
T W
ebB
ook, [o
nlin
e]. [re
trie
ved D
ec. 12, 2002]. R
etr
ieved f
rom
the Inte
rnet: <
http://w
ebbook.n
ist.gov/>
. 2 p
ages.
31
NIS
T (
NIS
T),
"F
IPS
Public
ation (
FIP
S P
UB
) 199: S
tandard
s f
or
Security
Cate
gorization o
f F
edera
l In
form
ation a
nd Info
rmation S
yste
ms",
Feb. 2004.
27
itl.nis
t.gov, E
xtr
em
e S
tudentized D
evia
te T
est, [onlin
e], S
ep. 2010, In
tern
et<
UR
L:h
ttp://w
ww
.itl.n
ist.gov/d
iv898/s
oft
ware
/data
plo
t/re
fman1/a
uxill
ar/
esd.h
tm>
, entire
docum
ent, N
ational In
stitu
te o
f S
tandard
s a
nd T
echnolo
gy (
NIS
T),
U.S
. D
epart
ment of
Com
mer
24
Ralc
henko, Y
u., K
ram
ida, A
.E., R
eader,
J. and N
IST
AS
D T
eam
(2008).
NIS
T A
tom
ic S
pectr
a D
ata
base (
vers
ion 3
.1.5
), [O
nlin
e]. A
vaila
ble
:
http://p
hysic
s.n
ist.gov/a
sd3 [F
eb. 27, 2009]. N
ational In
stitu
te o
f S
tandard
s a
nd T
echnolo
gy, G
aithers
burg
, M
D.
24
Specific
ation f
or
the S
ecure
Hash S
tandard
(S
HS
), F
IPS
Public
ation 1
80-3
(2008),
National In
stitu
te o
f S
tandard
s a
nd T
echnolo
gy (
NIS
T)
US
A.
21
“Secure
Hash S
tandard
(S
HS
)”, F
IPS
Public
ation
, F
IPS
PU
B 1
80-4
, M
ar.
2012, re
trie
ved o
n D
ec. 14, 2012 f
rom
http
://c
src
.nis
t.gov/p
ublic
ations/f
ips/f
ips180-4
/fip
s-1
80
-
4.p
df,
35 p
ages.
21
"Im
port
ant F
IPS
201 D
eplo
yment C
onsid
era
tions: E
nsuring Y
our
Imple
menta
tion is F
utu
re-R
eady,"
<i>
White p
aper
</i>
, p
ublis
hed a
t w
ww
.core
str
eet.com
, 2005-
19
Bark
ley,
"R
ole
Based A
ccess C
ontr
ol (R
BA
C),
" S
oft
ware
Dia
gnostics a
nd C
onfo
rmance T
esting N
IST
(M
ar.
1998).
19
Com
pute
r S
yste
ms L
abora
tory
, N
IST
, <
i> S
tandard
Security
Label fo
r In
form
ation T
ransfe
r <
/i>
, F
IPS
Public
ation 1
88 (
FIP
S P
UB
188),
Cate
gory
: C
om
pute
r S
ecurity
,
Subcate
gory
: S
ecurity
Labels
, S
ep. 6, 1994, pp. 1-2
5.
16
Barb
ara
C. Lip
pia
tt, N
IST
. B
EE
S 3
.0, "
<i>
Build
ing f
or
Environm
enta
l and E
conom
ic S
usta
inabili
ty <
/i>
Technic
al M
anual and U
ser
Guid
e",
Oct. 2
002, (1
98 p
ages).
14
"FIP
S 2
01 S
olu
tions,"
<i>
Core
str
eet S
olu
tions O
verv
iew
</i>
, p
ublis
hed a
t w
ww
.core
str
eet.com
, 2005, 1 p
.
14
Will
iam
Burr
, et al., "M
inim
um
Inte
ropera
bili
ty S
pecific
ation f
or
PK
I C
om
ponents
," <
i> O
utp
ut of
NIS
T's
Coopera
tive R
esearc
h a
nd D
evelo
pm
ent A
gre
em
ents
for
Public
Key
Infr
astr
uctu
re d
evelo
pm
ent w
ith A
T <
/i>
and <
i> T
, B
BN
, C
ert
icom
, C
ylin
k, D
ynC
orp
, IR
E,
11
X-r
ay
Photo
ele
ctr
on S
pectr
oscopy (
XP
S)
Data
base, V
ers
ion 3
.0 (
Web V
ers
ion),
[onlin
e]. [re
trie
ved N
ov. 26, 2002]. R
etr
ieved f
rom
the Inte
rnet:
<http://s
rdata
.nis
t.gov/x
ps/>
. 1 p
age.
Tab
le 5
:So
ftw
are
/Data
base/F
IPS
/etc
. P
ub
licati
on
s H
igh
ly C
ited
in
Pate
nts
42
This
pu
blic
atio
n is
availa
ble
free o
f charg
e fro
m: h
ttp://d
x.d
oi.o
rg/1
0.6
028
/ NIS
T.G
CR
.16-0
09
# P
ate
nt
Citations
Art
icle
67
"Dic
tionary
of
Alg
orith
ms a
nd D
ata
Str
uctu
res",
Inte
rnet w
ebsite: w
ww
.nis
t.gov/d
ads/.
48
Red-B
lack T
ree, N
ational In
stitu
te o
f S
tandard
s a
nd T
echnolo
gy, at http://w
ww
.nis
t.gov/d
ads/H
TM
L/r
edbla
ck.h
tml (M
ar.
5, 2002).
21
Stu
ll, D
. R
. and P
rophet, H
., e
ditors
(1971)
<i>
JA
NA
F T
herm
ochem
ical T
able
s <
/i>
, N
at'l B
ur.
Sta
nds.
17
National In
stitu
te o
f S
tandard
s a
nd T
echnolo
gy, “B
loom
Filt
er,
” dow
nlo
aded f
rom
http
://w
ww
.nis
t.gov/d
ads/H
TM
L/b
loom
Filt
er.
htm
l on J
an. 1, 2008; 1
page.
13
Scre
enS
aver
Scie
nce a
t http://2
16.2
39.3
9.1
04/s
earc
h?q=
cache:jiP
k8V
a6T
44J:g
am
s.n
ist.gov (
vis
ited O
ct. 2
8, 2003).
5http://p
hysic
s.n
ist.gov/M
ajR
esP
roj/rf
cell/
dra
win
gs.h
tml.
5F
err
aio
lo, "R
ole
Based A
ccess C
ontr
ol,"
NIS
T W
eb p
age, http://h
issa.n
csl.nis
t.gov/r
bac 2
pp., v
isited J
un. 1, 1999.
5X
-Ray M
ass A
ttenuation C
oeff
icie
nts
--B
ISM
UT
H, 3 p
p., h
ttp://p
hys
ics.n
ist.gov/P
hys
RefD
ata
/Xra
yMassC
oef/
Ele
mT
ab/z
83.h
tml, D
ec. 14, 2002.
4
Levin
e e
t al., "N
IST
Com
pute
r T
ime S
erv
ices: In
tern
et T
ime S
erv
ice (
ITS
), A
uto
mate
d C
om
pute
r T
ime S
erv
ice (
AC
TS
), a
nd T
ime.G
ov W
eb S
ites";
National In
stitu
te o
f S
tandard
and T
echnolo
gy, M
ay
2002, pp. 1-7
9.
4
The N
IST
Refe
rence o
n C
onsta
nts
, U
nits, and U
ncert
ain
ty: In
tern
ational S
yste
m o
f U
nits (
SI)
, S
I pre
fixes, accessed o
n D
ec. 10, 2010 a
t
physic
s.n
ist.gov/U
nits/p
refixes.h
tml.
3N
IST
; C
ert
ific
ate
710a.
3
Hubbell,
J. H
., e
t al., “T
able
s o
f X
-Ray M
ass A
ttenuation C
oeff
icie
nts
and M
ass E
nerg
y-A
bsorp
tion C
oeff
icie
nts
fro
m 1
keV
to 2
0 M
eV
for
Ele
ments
Z=
1 t
o 9
2 a
nd 4
8 A
dditio
nal S
ubsta
nces o
f D
om
estic Inte
rest”
, (A
bstr
act)
, [o
nlin
e]. R
etr
ieved f
rom
the Inte
rne
3N
IST
Com
pute
r S
ecurity
Div
isio
n's
CS
RC
Hom
e p
age, S
ee h
ttp://c
src
.nis
t.gov/.
3J. D
. H
. D
onnay
et al., "C
rysta
l D
ata
, D
ete
rmin
ative T
able
s,"
3 <
sup>
rd <
/sup>
Ed., <
i> U
S D
ept. C
om
m., N
BS
</i>
, p
p. H
256, H
259 (
1973).
3"B
inary
Searc
h",
NIS
T, (D
ate
: A
ug. 27, 2004),
Web p
ublis
her:
NIS
T.
3C
ord
et al., M
icro
wave S
pectr
al T
able
s, N
at'l
Bur.
Sta
nds M
onogra
ph 7
0, vol. IV
, O
ct. 6
8, pp. 385 3
86.
3N
IST
; C
ert
ific
ate
717a.
Tab
le 6
:NIS
T R
efe
ren
ce/R
eso
urc
e M
ate
rials
Hig
hly
Cit
ed
in
Pate
nts
43
This
pu
blic
atio
n is
availa
ble
free o
f charg
e fro
m: h
ttp://d
x.d
oi.o
rg/1
0.6
028
/ NIS
T.G
CR
.16-0
09
# P
ate
nt
Citations
Art
icle
101
Perr
ey,
A.G
. and S
choenw
etter,
H.K
., <
i> N
BS
Technic
al N
ote
1121: A
Schottky D
iode B
ridge S
am
plin
g G
ate
</i>
, U
.S. D
ept. o
f C
om
merc
e, pp. 1-1
4 (
May 1
980).
67
P. M
ell
et al., “T
he N
IST
Definitio
n o
f C
loud C
om
puting
,” N
ational In
stitu
te o
f S
tandard
s a
nd T
echnolo
gy (
NIS
T),
Specia
l P
ublic
ation 8
00 1
45, S
ep. 2011, 7 p
ages.
40
Dw
ork
in, M
orr
is, “R
ecom
mendation f
or
Blo
ck C
ipher
Modes o
f O
pera
tion—
Meth
ods a
nd T
echniq
ues”
National In
stitu
te o
f S
tandard
s a
nd T
echnolo
gy, T
echnolo
gy
Adm
inis
tration U
.S. D
epart
ment of
Com
merc
e, In
form
ation S
ecurity
, N
IST
Specia
l P
ublic
ation 8
00 3
8A
, 200
40
Public
Key
Cry
pto
gra
phy,
NIS
T S
pecia
l P
ublic
ation 8
00 2
, A
pr.
1991, re
printe
d a
t http://c
src
.nis
t.gov/p
ublic
ations/n
istp
ubs/8
00 2
/800 2
.txt, p
p. 1 1
38.
38
"7H
-Dib
enzo[b
,g]f
luore
ne,"
Poly
cyclic
Aro
matic H
ydro
carb
on S
tructu
re Index, N
o. 88, N
IST
Specia
l P
ublic
ation 9
22 (
Aug. 17, 1998).
35
J. M
ars
hall
et al, "
Realiz
ing S
uspended S
tructu
res o
n C
hip
s F
abricate
d b
y C
MO
S F
oundry
Pro
cesses T
hro
ugh M
OS
IS S
erv
ice,"
NIS
TIR
5402, U
.S. N
ational In
stitu
te
of
Sta
ndard
s a
nd T
echnolo
gy, G
aithers
burg
, M
ary
land 2
0899 (
1994).
35
NIS
T, "E
ngin
eering S
tatistics h
andbook",
Nov. 18, 2001.
35
Guid
elin
e f
or
Imple
menting C
rypto
gra
phy
in the F
edera
l G
overn
ment, N
IST
Specia
l P
ublic
ation 8
00 2
1, N
ov. 1999, pp. 1 1
38.
25
R. B
ace a
nd P
. M
ell,
"N
IST
Specia
l P
ublic
ation o
n Intr
usio
n D
ete
ction S
yste
ms,"
51 p
ages, F
eb. 2001.
24
M. A
bra
mow
itz a
nd I. A
. S
tegun, H
andbook o
f M
ath
em
atical F
unctions, (N
at. B
ur.
of
Sta
ndard
s, A
ppl. M
ath
. S
er.
55),
Sect. 7
.3, pp. 300-3
02, (1
964).
21
Sin
ghal, A
. et al., "A
TandT
at T
RE
C-9
", P
roceedin
gs o
f th
e N
inth
Text R
etr
ieval C
onfe
rence, N
IST
Specia
l P
ublic
ation 5
00-2
49, 'O
nlin
e!
2001, pp. 103-1
05.
21
Bark
er,
Ela
ine a
nd J
ohn K
els
ey; “R
ecom
mendation f
or
Random
Num
ber
Genera
tion U
sin
g D
ete
rmin
istic R
andom
Bit G
enera
tors
”; N
IST
Specia
l P
ublic
ation 8
00 9
0;
National In
stitu
te o
f S
tandard
s a
nd T
echnolo
gy; D
ec. 2005; 130 p
ages.
21
Tayl
or
et al., "G
uid
elin
es f
or
Evalu
ating a
nd E
xpre
ssin
g the U
ncert
ain
ty o
f N
IST
Measure
ment R
esults,"
NIS
T T
echnic
al N
ote
1297, 1994 E
ditio
n, U
nited S
tate
s D
ept.
of
Com
merc
e, N
ational In
stitu
te o
f S
tandard
s a
nd T
echnolo
gy (
25 p
ages).
20
Tih
en
, S
. S
. et al. (
1967)
“Therm
al C
onductivity
and T
herm
al D
iffu
siv
ity
of
Gre
en R
iver
Oil
Shale
,” T
herm
al C
onductivity: P
roceedin
gs o
f th
e S
eventh
Confe
rence (
Nov.
13-1
6, 1967),
NB
S S
pecia
l P
ublic
ation 3
02, pp. 529-5
35, 1968.
18
Susan T
. D
um
ais
, "L
SI m
eets
TR
EC
: A
Sta
tus R
eport
," N
IST
Specia
l P
ublic
ation 5
00-2
07, T
he F
irst T
ext R
Etr
ieval C
onfe
rence (
TR
EC
-1),
pp. 137-1
52, M
ar.
1993.
18
Wayn
e J
ansen e
t al., "N
IST
Specia
l P
ublic
ation 8
00 1
9 M
obile
Agent S
ecurity
", N
IST
.
17
NIS
T/S
EM
AT
EC
H e
-Handbook o
f S
tatistical M
eth
od, (2
003-2
006).
17
Haw
kin
g, D
. and T
his
tlew
aite, P
., "
Pro
xim
ity
Opera
tors
-So N
ear
and Y
et so F
ar,
" P
roc. T
RE
C 4
NIS
T S
P 5
00-2
36, (D
ec. 6, 1995).
16
Burr
et al., N
IST
Specia
l P
ublic
ation 8
00 6
3 V
ers
ion 1
.0.2
, E
lectr
onic
Auth
entication G
uid
elin
e, A
pr.
2006, 64 P
ages.
16
<i>
Pic
ture
Passw
ord
: A
Vis
ual Login
Techniq
ue f
or
Mobile
Devic
es <
/i>
. N
IST
IR 7
030, Jul. 2
003. Jansen e
t al.
16
Morr
is D
work
in, “R
ecom
mendation f
or
Blo
ck C
ipher
Modes o
f O
pera
tion
: G
alo
is/C
ounte
r M
ode (
GC
M)
and G
MA
C”,
NIS
T S
pecia
l P
ublic
ation 8
00 3
80
, N
ov. 2007; 39
15
Din
kel, e
t al., "P
roto
typin
g S
P4 a
Security
Data
Netw
ork
Syste
m T
ransport
Pro
tocol In
tero
pera
bili
ty D
em
onstr
ation P
roje
ct"
, N
IST
IR 9
0-4
228, 1990, 20 p
ages.
15
Long,
“Help
Mate
Robotics, In
c. (F
orm
erly
Tra
nsitio
ns R
esearc
h C
orp
ora
tion
) R
obot N
avig
ation T
echnolo
gy”,
NIS
T S
pecia
l P
ublic
ation 9
50-1
, M
ar.
1999,
http://w
ww
.atp
.nis
t.gov/e
ao/s
p950-1
/help
mate
.htm
.
15
Bark
er,
Will
iam
C., “
Recom
mendation f
or
the T
riple
Data
Encry
ption A
lgorith
m (
TD
EA
) B
lock C
ipher”
, N
ational In
stitu
te o
f S
tandard
s a
nd T
echnolo
gy, T
echnolo
gy
Adm
inis
tration U
.S. D
epart
ment of
Com
merc
e, In
form
ation S
ecurity
, N
IST
Specia
l P
ublic
ation 8
00 6
7
15
Moff
at, A
lista
ir e
t al., "R
etr
ieval of
Part
ial D
ocum
ents
," In P
roceedin
gs o
f th
e S
econd T
ext R
etr
ieval C
onfe
rence (
TR
EC
-2),
NIS
T S
pecia
l P
ublic
ation 5
00-2
15, 1994, 11
14
Pro
cto
r, F
.M., D
am
azo, B
., Y
ang, C
. and F
rechette
, S
., “
Open A
rchitectu
res f
or
Machin
e C
ontr
ol”
, D
ec. 1993,
NIS
TIR
5307, N
ational In
stitu
tes o
f S
tandard
s a
nd
13
Abberley e
t al., “T
he T
HIS
L S
poken D
ocum
ent R
etr
ieval S
yste
m,”
NIS
T S
pecia
l P
ublic
ation 5
00-2
40 P
roc. T
RE
C-6
, 1997, pp. 747-7
51.
13
Ruiz
et al., C
IND
OR
Conceptu
al In
terlin
gua D
ocum
ent R
etr
ieval: T
RE
C-8
Evalu
ation, N
IST
Specia
l P
ublic
ation 5
00-2
46, 1999, 597-6
06.
Ta
ble
7:O
ffic
ial
NIS
T P
ub
lic
ati
on
s (
NIS
TIR
, S
pe
cia
l P
ub
lic
ati
on
s e
tc.)
H
igh
ly C
ite
d i
n P
ate
nts
13
Goya
l, "
An X
ML S
chem
a N
am
ing A
ssis
ter
for
Ele
ments
and T
ypes,"
<i>
National In
stitu
te o
f S
tandard
s a
nd T
echnolo
gy <
/i>
, d
ocum
ent obta
ined a
t
http://w
ww
.mel.nis
t.gov/m
sid
libra
ry/d
oc/N
IST
IR 7
143.p
df
on J
un. 24, 2005, 12 p
ages.
13
Rukhin
A <
i> A
Sta
tistical T
est S
uite f
or
Random
and P
seudora
ndom
Num
ber
Genera
tors
for
Cry
pto
gra
phic
Applic
ations <
/i>
NIS
T S
pecia
l P
ublic
ation, G
aithers
burg
,
MD
, U
S. N
o. 800-2
2. M
ay
15, 2001. X
P002276676 IS
SN
: 1048-7
76X
.
13
"The N
ist 60-M
illim
ete
r D
iam
ete
r C
ylin
drical C
avity
Resonato
r: P
erf
orm
ance E
valu
ation f
or
Perm
ittivity
Measure
ments
", E
ric J
. V
anzura
, R
ichard
G. G
eye
r and M
ichael
D. Janezic
, A
ug. 1993, N
ational In
stitu
te o
f S
tandard
s a
nd T
echnolo
gy T
echnic
al N
ote
.
13
Morr
is D
work
in, "R
ecom
mendation f
or
Blo
ck C
ipher
Modes o
f O
pera
tion: T
he C
CM
Mode f
or
Auth
entication a
nd C
onfidentialit
y,"
NIS
T S
pecia
l P
ublic
ation 8
00 3
8C
,
May 2
004, 26 p
ages, N
ational In
stitu
te o
f S
tandard
s a
nd T
echnolo
gy G
aithers
burg
, M
D, U
SA
.
12
Nat'l
Bur.
Sta
nds S
pecia
l P
ublic
ation 3
14, N
ov., 1
969, pp. 367 3
70, 430.
12
Kra
mer,
T.; P
rocto
r, F
.; "
The N
IST
RS
274/N
GC
Inte
rpre
ter-
-Vers
ion 2
", O
ct. 2
6, 1995, N
IST
, pp. 1-5
8.
11
C. T
. Liu
& C
. C
. K
och, D
evelo
pm
ent of
Ductile
Poly
cry
sta
lline N
i 3 A
l F
or
Hig
h T
em
pera
ture
Applic
ations , T
echnic
al A
spects
of
Critical M
ate
rials
Use b
y the S
teel
Industr
y, N
BS
IR 8
3 2
679 2
, vol. IIB
(Jun. 1983),
Cente
r fo
r M
ate
rials
Scie
nce, U
.S. D
ept. o
11
Sto
neburn
er,
G. et al., “R
isk M
anagem
ent G
uid
e f
or
Info
rmation T
echnolo
gy S
yste
ms”,
National In
stitu
te o
f S
tandard
s a
nd T
echnolo
gy, T
echnolo
gy A
dm
inis
tration
,
U.S
. D
ept. o
f C
om
merc
e, S
pecia
l P
ublic
ation 8
00 3
0; R
ecom
mendation o
f th
e N
ational In
stitu
te o
f
10
Shaw
, Joseph A
. and E
dw
ard
A. F
ox, "C
om
bin
ation o
f M
ultip
le S
earc
hes,"
In P
roceedin
gs o
f th
e 3
rd T
ext R
etr
ieval C
onfe
rence (
TR
EC
-3)
Mary
land, N
IST
Specia
l
Public
ation 5
00-2
50, 1995, 4 p
ages.
10
National In
stitu
te o
f S
tandard
s a
nd T
echnolo
gy (
NIS
T),
“R
ecom
mendation f
or
Pair W
ise K
ey
Esta
blis
hm
ent S
chem
es U
sin
g D
iscre
te L
ogarith
m C
rypto
gra
phy
(Revis
ed),
” N
IST
Specia
l P
ublic
ation 8
00 5
6A
, M
ar.
2007.
10
Bark
er
et al. R
ecom
mendation f
or
Key M
anagem
ent—
Part
I: G
enera
l. N
IST
Specia
l P
ublic
ation 8
00 5
7 M
ar.
2007
. pp. 1 1
42.
10
Voorh
ees e
t al., "T
he C
olle
ction F
usio
n P
roble
m",
Pro
ceedin
gs o
f T
RE
C-3
, N
IST
Specia
l P
ublic
ation 5
00-2
25, A
pr.
1995, pp. 95-1
04.
10
Scarf
one
, K
are
n e
t al., “G
uid
e to Instr
usio
n D
ete
ction a
nd P
revention S
yste
ms (
IDP
S),
” N
IST
(N
ational In
stitu
te o
f S
tandard
s a
nd T
echnolo
gy),
Specia
l P
ublic
ation 8
00
94, F
eb. 2007, 127 p
ages; http://c
src
.ncsl.nis
t.gov/p
ublic
ations/n
istp
ubs/8
00 9
4/S
P800 9
4
10
Kary
gia
nnos, T
om
, et al., “W
irele
ss N
etw
ork
Security
802.1
1 B
lueto
oth
and H
andheld
Devic
es,”
NIS
T S
pecia
l P
ublic
ation 8
00 4
8, T
echnolo
gy A
dm
inis
tration
, D
ept. o
f
Com
merc
e, 2002, 119 p
ages.
10
Dw
ork
in, M
. "R
ecom
mendation f
or
Blo
ck C
ipher
Modes o
f O
pera
tion: M
eth
ods a
nd T
echniq
ues",
National In
stitu
te o
f S
tandard
s a
nd T
echnolo
gy, N
IST
Specia
l
Public
ation 800 3
8B
, (2
005),
22 p
ages.
10
Roy
G. S
altm
an, A
ccura
cy, In
tegrity
, and S
ecurity
in C
om
pute
rized V
ote
-Tally
ing, C
om
pute
r S
cie
nce a
nd T
echnolo
gy, N
BS
Specia
l P
ub. 500-1
58, A
ug. 1998, 109
44
This
pu
blic
atio
n is
availa
ble
free o
f charg
e fro
m: h
ttp://d
x.d
oi.o
rg/1
0.6
028
/ NIS
T.G
CR
.16-0
09
45
This
pu
blic
atio
n is
availa
ble
free o
f charg
e fro
m: h
ttp://d
x.d
oi.o
rg/1
0.6
028
/ NIS
T.G
CR
.16-0
09
# P
ate
nt
Cita
tio
ns
Art
icle
31
Fe
de
ral C
rite
ria
fo
r In
form
atio
n T
ech
no
logy S
ecu
rity
, vo
l. I
I, V
ers
ion 1
.0, N
IST
and
Natio
na
l S
ecu
rity
Ag
en
cy,
De
c.
19
92
, 2
70
pa
ge
s.
24
Mill
er,
Leo
na
rd E
., “
Wh
y U
WB
? A
Re
vie
w o
f U
ltra
wid
eb
an
d T
ech
no
logy”
NIS
T, D
AR
PA
, A
pr.
2003, pp. 1-7
2, G
aith
ers
burg
, M
ary
land.
23
Man
de
lke
rn,
L. e
t a
l.,
"Fu
sio
n o
f P
oly
me
r N
etw
ork
s F
orm
ed f
rom
Lin
ea
r P
oly
eth
yle
ne
: E
ffe
ct
of
Inte
rmo
lecu
lar
Ord
er"
, co
ntr
ibutio
n f
rom
the
Ge
ne
ral
Ele
ctr
ic R
ese
arc
h L
abo
rato
ry a
nd
fro
m t
he
Po
lym
er
Str
uctu
re S
ectio
n,
Na
t'l B
ur.
Sta
nd
s 8
2:
46
-53
(1
96
0).
19
Pa
llett,
Da
vid
et
al.,
Be
nch
ma
rk T
ests
fo
r th
e D
AR
PA
Sp
oke
n L
an
gu
ag
e P
rogra
m,
NIS
T,
12
pa
ge
s,
un
da
ted
.
17
<i>
A G
uid
e t
o A
irb
orn
e,
Imp
act,
an
d S
tru
ctu
reb
orn
e N
ois
e C
on
tro
l in
Mu
ltifa
mily
Dw
elli
ngs <
/i>
, U
. S
. D
epa
rtm
ent
of
Ho
usin
g a
nd
Urb
an
De
ve
lopm
ent,
Pre
pa
red
fo
r th
e N
at'l
Bu
r. S
tand
s,
Wa
sh
ingto
n,
D.
C., J
an.
19
63
(5
pag
es).
16
Pa
llett,
D.S
. et
al.,
Pre
limin
ary
DA
RP
A A
TIS
Te
st
Re
su
lts,N
IST
/DA
RP
A,
6 p
ag
es,
Ju
n.
19
90
.
14
Wa
rwic
k F
ord
, "A
Pu
blic
Ke
y In
fra
str
uctu
re f
or
U.S
. G
ove
rnm
ent
Un
cla
ssifie
d b
ut
Se
nsitiv
e A
pplic
atio
ns,"
<i>
NO
RT
EL
/Be
ll-N
ort
hern
Rese
arc
h, N
IST
</i>
, 1
995
, 9
4 p
p.
8
“Da
tab
ase
fo
r S
old
er
Pro
pe
rtie
s w
ith
Em
pha
sis
on N
ew
Lea
d-f
ree S
old
ers
, P
rope
rtie
s o
f L
ea
d-F
ree S
old
ers
”, R
ele
ase
4.0
, In
tern
et
art
icle
, p
art
1—
Mech
an
ica
l P
rope
rtie
s, N
IST
and
Colo
rad
o S
ch
oo
l o
f M
ines, F
eb. 11, 2002, 2 p
gs.
6G
aro
folo
, J.,
et
al.,
" <
i> T
he D
AR
PA
TIM
IT A
co
ustic-P
hon
etic C
ontin
uo
us S
pee
ch
Corp
us <
/i>
,"
NIS
T S
pee
ch
Dis
c C
D1
-1.1
, (O
ct.
19
90
) p
p. 3
42
.
5R
ippa
rd,
W.H
. et
al.,
Sp
in-T
ransfe
r In
duce
d D
yn
am
ics in
Ma
gn
etic N
ano
str
uctu
res,
NIS
T n
an
om
agn
tod
ynam
ics a
nd
DA
RP
A S
pin
S p
rog
ram
, 29
pp
.
3N
IST
, N
ort
h A
me
rica
n I
SD
N U
se
rs F
oru
m,
Ap
plic
atio
n S
oft
wa
re I
nte
rfa
ce
Exp
ert
Wo
rkin
g G
roup
, P
ropo
se
d S
tand
ard
(S
ep
., 1
99
1).
3
“Tru
ste
d C
om
pute
r S
yste
m E
va
luatio
n C
rite
ria
”, R
etr
ieve
d a
t <
<http
://c
src
.nis
t.gov/p
ub
lica
tio
ns/h
isto
ry/d
od85.p
df>
>, D
ep
art
me
nt
of
De
fense
, D
ec.
1985, pp. 1-1
16.
3
"Th
erm
al C
hara
cte
rica
tio
n o
f E
lectr
onic
Pa
cka
ge
s--
Sta
nd
ard
iza
tio
n A
ctivitie
s S
tatu
s",
Fra
nk F
. O
ettin
ge
r, N
IST
, E
IA J
ED
EC
JC
-15 C
om
mitte
e o
n
Ele
ctr
ica
l a
nd
Th
erm
al C
hara
cte
riza
tio
n o
f S
em
ico
nd
ucto
r P
acka
ge
s a
nd
In
terc
onn
ects
, S
ep.
26
, 1
99
1.
3M
row
ec a
nd
We
be
r, "
Ga
s C
orr
osio
n o
f M
eta
ls,"
Na
t'l B
ur.
Sta
nd
s a
nd
th
e N
atio
na
l S
cie
nce
Fo
uda
tio
n (
197
8)*
.
3<
i>A
ctive
Ma
teria
ls f
or
Inte
gra
ted O
ptic A
pplic
atio
ns <
/i>
; H
ayd
en
; S
ch
ott
Gla
ss T
ech
no
logie
s,
Inc.
an
d N
IST
; S
ep.
19
99
; p
p.
18
6-1
96
.
2
Bu
eh
ler,
M.
G.
et
al, M
icro
ele
ctr
onic
Te
st
Ch
ips a
nd
Asso
cia
ted
Pa
ram
etr
ic T
este
rs:
Pre
se
nt
an
d F
utu
re,
Na
t'l B
ur.
Sta
nd
s a
nd
Sig
ne
tics C
orp
ora
tio
n,
pp. 859 8
67.
2
"Tru
ste
d M
ach
.RT
M. P
hilo
so
ph
y o
f P
rote
ctio
n",
NIS
T D
ocu
me
nt
No
.: T
MA
CH
/93
-01
4,
Tru
ste
d I
nfo
rma
tio
n S
yste
ms,
Inc.,
Gle
nw
ood
, M
D,
Cha
pte
r 5
pp.
11
-12
, 20
, M
ay 2
1,
19
93
.
2
Alla
n e
t a
l.;
To
pic
De
tectio
n a
nd
Tra
ckin
g P
ilot S
tudy F
ina
l R
epo
rt D
ate
199
8;
DA
RP
A;
We
bsite
:
http
s:/
/ww
w.itl.n
ist.
iaui/8
94
.01
/pu
blic
atio
ns/d
arp
a9
8/p
df/
tdt2
04
0.p
df.
Tab
le 8
: Jo
int
Part
ners
hip
Pu
bli
cati
on
s H
igh
ly C
ited
in
Pate
nts
46
This
pu
blic
atio
n is
availa
ble
free o
f charg
e fro
m: h
ttp://d
x.d
oi.o
rg/1
0.6
028
/ NIS
T.G
CR
.16-0
09
# P
ate
nt
Citations
Art
icle
66
Intr
insic
Vis
cosity
and Its
Rela
tion to Intr
insic
Conductivity,
9 p
ages, re
trie
ved f
rom
the Inte
rnet on O
ct. 3
0, 2003,
<http://w
ww
.cik
s.c
bt.nis
t.gov/~
garb
ocz/p
aper5
8/n
ode3.h
tml>
.
38
Podio
, F
ern
ando L
. "B
iom
etr
ics--
Technolo
gie
s F
or
Hig
hly
Secure
Pers
onal A
uth
entication,"
NIS
T, http://w
hitepapers
.zdnet.com
/searc
h.a
spx?com
pid
=3968, M
ay
34
Berr
y, B
.C., e
t al., E
ffects
of
Zone A
nnealin
g o
n T
hin
Film
s o
f B
lock C
opoly
mers
, N
IST
, P
oly
mers
Div
isio
n, G
aithers
burg
, M
D., 2
007.
30
Tow
nsend, J.E
., "
NIS
T o
n Inte
rnet S
ecurity
," M
ar.
22, 1994, pp. 1-1
5.
28
His
tory
of
Com
pute
r S
ecurity
: E
arly
Com
pute
r S
ecurity
Papers
, P
art
1, N
ational In
stitu
te o
f S
tandard
s a
nd T
echnolo
gy, S
ep. 4, 2002, vie
wed a
t
<http://c
src
.nis
t.gov/p
ublic
ations/h
isto
ry/index.h
tml>
pp. 1-2
7.
25
Burn
ett, et al., "M
inim
izin
g s
patial-dis
pers
ion-induced b
irefr
ingence in c
rysta
ls f
or
pre
cis
ion o
ptics b
y usin
g m
ixed c
rysta
ls o
f m
ate
rials
with t o
pposite s
ign o
f th
e
birefr
ingence,"
NIS
T, G
aithers
burg
, M
ary
land 2
0899, http://p
hys
ics.n
ist.gov/D
ivis
ions/D
25
Mill
er,
"W
irele
ss T
echnolo
gie
s a
nd the S
AF
EC
OM
SoR
for
Public
Safe
ty C
om
munic
ations",
NIS
T, 2005, pp. 1-6
8, G
aithers
burg
, M
ary
land.
24
S. B
erk
ovits, et al., "P
ublic
Key
Infr
astr
uctu
re S
tudy,"
Fin
al R
eport
, <
i> N
IST
</i>
, G
aithers
burg
,, M
D, A
pr.
1994, 193 p
p.
21
Brierley, C
.L., M
inera
l B
io-P
rocessin
g: O
pport
unitie
s in E
xtr
active M
eta
llurg
y a
nd E
nvironm
enta
l C
ontr
ol, N
IST
, N
ov. 1993, pp. 1-2
9.
17
NIS
T G
rant, P
roje
ct B
rief
[onlin
e]; "
Tools
for
DN
A D
iagnostics (
Oct. 1
998)
Inte
gra
ted, M
icro
-Sam
ple
Pre
para
tion S
yste
m f
or
Genetic A
naly
sis
," [re
trie
ved o
n A
ug. 5,
2002] 2 p
gs. R
etr
ieved f
orm
the inte
rnet at <
http://jazz.n
ist.gov/a
tpcf/
prj
briefs
/prj
brief.
17
How
ard
E.S
wanson e
t al., “S
tandard
X-r
ay
Diffr
action P
ow
der
Pattern
s”,
Nat'l
Bur.
Sta
nds C
ircula
r 539, vol. 1
0, pp. 6-8
, 1960.
15
Jansen
, W
., “
Auth
enticating U
sers
on H
andheld
Devic
es,”
The N
IST
, G
aithers
burg
, M
ary
land, 2003, 13 p
ages.
14
Leig
h e
t al., "T
ransfo
rmation, R
ankin
g, and C
luste
ring f
or
Face R
ecognitio
n A
lgorith
m C
om
parison,"
at http://w
ww
.itl.n
ist.gov/d
iv898/itp
erf
/renorm
.pdf.
13
Ford
, S
usan, "A
dvanced E
ncry
ption S
tandard
(A
ES
) Q
uestions a
nd A
nsw
ers
," O
ct. 2
, 2000, pp. 1-5
, obta
ined f
rom
http://w
ww
.nis
t.gov/p
ublic
<sub>
--
</s
ub>
aff
airs/r
ele
ases/a
esqanda.h
tm.
13
"Filt
ration a
nd U
ltra
filtra
tion E
quip
ment and T
echniq
ues";
Mem
bra
nes.n
ist.gov; printe
d o
n A
ug. 12, 2005; pp. 1-1
4; lo
cate
d a
t:
http://w
ww
.mem
bra
nes.n
ist.gov/A
CS
chapte
r/pelle
PA
GE
.htm
l.
12
P. L. B
ender,
A P
roposal to
the N
AS
A f
or
the S
upport
of
GP
S S
ate
llite
Orb
it D
ete
rmin
ation u
sin
g the R
econstr
ucte
d C
arr
ier
Phase M
eth
od f
or
Tra
ckin
g , Q
uantu
m
Phys
ics D
ivis
ion, N
at'l
Bur.
Sta
nds, B
ould
er,
Colo
rado, pp. 1 1
2, subm
itte
d A
ug. 5, 1980.
12
Mechanic
s o
f P
neum
atic T
ires, C
lark
, N
at'l
Bur.
Sta
nds M
onogra
ph 1
12, U
.S. D
ept. o
f C
om
merc
e, pp. 241-2
43 a
nd 2
90-2
91 (
Nov. 1971).
11
Schneem
an, R
.; "
Devic
e D
river
Develo
pm
ent fo
r M
icro
soft
Win
dow
s N
T: A
ccessin
g M
otion C
ontr
ol H
ard
ware
Usin
g a
Multim
edia
Fra
mew
ork
(w
ith D
EF
S)"
, N
IST
,
Oct. 1
, 1996, D
EF
S 0
0010531-0
0010580.
10
Wayn
e J
ansen e
t al., "P
rivile
ge M
anagem
ent of
Mobile
Agents
", N
IST
Oct. 2
000.
10
Mill
er,
L.E
., e
t al. F
Y 2
005 Inte
rim
Pro
ject R
eport
, R
FID
-Assis
ted L
ocaliz
ation a
nd C
om
munic
ation f
or
First R
esponders
, O
ct. 2
5, 2005, (r
ev. M
ar.
22, 2006),
National In
stitu
te o
f S
tandard
s a
nd T
echnolo
gy, http://w
ww
.antd
.nis
t.gov/w
ctg
/RF
ID/R
FID
assis
t.htm
.
10
W.A
. Jansen, "A
Privile
ge M
anagem
ent S
chem
e f
or
Mobile
Agent S
yste
ms"
NIS
T M
ay 2
001.
9Jansen e
t al., "M
obile
Agents
in Intr
usio
n D
ete
ction a
nd R
esponse,"
NIS
T, 12 p
ages, Jun. 2000.
9Jeff
Kurt
z, et al. M
ap N
avig
ation E
xperim
ent. h
ttp://w
ww
.itl.n
ist.gov/iaui/vvrg
/nis
t-ic
v/e
xperim
ents
/mapnav/m
apnav.h
tml. L
ast accessed o
n M
ar.
1, 2006. 3 p
gs.
9H
olm
berg
, “F
acili
ty Inte
rface to the S
mart
Grid
,” N
IST
, 7 p
ages, printe
d 2
012.
8A
lbus, J.; "
A R
efe
rence M
odel A
rchitectu
re f
or
Inte
lligent S
yste
ms D
esig
n",
NIS
T, 1993, pp. 1-3
8.
8W
ayn
e J
anson e
t al., "A
pply
ing M
obile
Agents
to Intr
usio
n D
ete
ction a
nd R
esponse"
NIS
T Inte
rim
Report
, O
ct. 1
999.
8
Jansen
, W
ayn
e “
Auth
enticating M
obile
Devic
e U
sers
Thro
ugh Im
age S
ele
ction”,
Retr
ieved a
t
<http
://c
src
.nis
t.gov/(
sub)—
gro
ups/S
N(s
ub)—
S/m
obile
(sub)—
security
/docum
ents
/mobile
(sub)—
devic
es/P
P-V
isua1A
uth
entication
-rev-D
S04.p
df>
, (2
004),
10
8
“NIS
T L
ocation S
yste
m,”
[onlin
e]. W
irele
ss C
om
munic
ation T
echnolo
gie
s G
roup
, N
ational In
stitu
te o
f S
tandard
s a
nd T
echnolo
gy, M
ar.
12, 2004 [re
trie
ved in N
ov.
1, 2004]. R
etr
ieved f
rom
the Inte
rnet: <
UR
L: w
ww
.antd
.nis
t.gov>
. (2
pages).
8
Glig
or,
Virgil
D., e
t al., “F
ast E
ncry
ption a
nd A
uth
entication
: X
CB
C E
ncry
ption a
nd E
XC
B A
uth
entication M
odes”
Mar.
30, 2001 (
Apr.
20, 2001, re
vis
ion),
64 p
ages,
retr
ieved f
rom
http
://c
src
.nis
t.gov/g
roups/S
T/toolk
it/B
CM
/modes(s
ub)—
develo
pm
ent.
htm
l.
8T
. S
pie
s. F
eis
tel F
inite S
et E
ncry
ption M
ode. http://c
src
.nis
t.gov/g
roups/S
T/toolk
it/1
5 B
CM
/docum
ents
/pro
posedm
odes/f
fsem
/ffs
em
-spec.p
df.
Tab
le 9
:Oth
er
NIS
T (
No
n-P
eer
Revie
wed
) P
ub
licati
on
s H
igh
ly C
ited
in
Pate
nts
47
This
pu
blic
atio
n is
availa
ble
free o
f charg
e fro
m: h
ttp://d
x.d
oi.o
rg/1
0.6
028
/ NIS
T.G
CR
.16-0
09
# P
ate
nt
Cita
tio
ns
Art
icle
17
Lip
ma
a, H
elg
er,
et al., “C
om
me
nts
to N
IST
co
nce
rnin
g A
ES
Mod
es o
f O
pera
tio
ns:”
CT
R-M
od
e E
ncry
ptio
n 2
000, 4 p
ages.
13
McG
rew
, D
avid
A.,
et
al.,
Th
e G
alo
is/C
oun
ter
Mod
e o
f O
pera
tio
n (
GC
M)
Su
bm
issio
n t
o N
IST
, M
ay
31,
20
05
, 4
4 p
ag
es.
11
Bla
ck,
Jo
hn
, "C
om
me
nts
to N
IST
co
nce
rnin
g A
ES
Mod
es o
f O
pera
tio
ns:
A S
ugg
estio
n f
or
Ha
nd
ling A
rbitra
ry-L
en
gth
Messa
ge
s w
ith
th
e C
BC
MA
C,"
Un
ive
rsity
of
Ne
va
da
, R
en
o,
Ph
illip
Rog
aw
ay,
Un
ive
rsity
of
Ca
lifo
rnia
at
Da
vis
http
://c
src
.nis
t.go
v/C
ryp
toT
oolk
it/m
od
11
Pe
ter
L. B
end
er,
Na
t'l B
ur.
Sta
nd
s,
priva
te c
om
mu
nic
atio
n,
19
78
.
9R
og
aw
ay, P
hill
ip, “P
MA
C—
Pro
po
sa
l to
NIS
T f
or
a p
ara
lleliz
able
me
ssa
ge
au
the
ntica
tio
n c
ode
” A
pr.
1, 2001
, 27 p
ages.
8
Sch
roe
ppe
l, R
ich
ard
C., e
t al., “C
iphe
r-S
tate
(C
S)
Mod
e o
f O
pera
tio
n f
or
AE
S”
Sa
nd
ia N
atio
na
l L
ab
ora
torie
s, S
ubm
issio
n t
o N
IST
, M
ay 7
, 2004,
8 p
age
s.
7B
ella
re, M
., e
t al., “A
Co
nve
ntio
na
l A
uth
entica
ted
-En
cry
ptio
n M
od
e”
Su
bm
issio
n t
o N
IST
, A
pr.
13, 2003,
14 p
age.
7K
ohn
o, T
ada
yosh
i, e
t al., “T
he C
WC
Au
the
ntica
ted
En
cry
ptio
n (
Asso
cia
ted
Data
) M
od
e”
May 2
7, 2003, 18 p
ages, S
ubm
issio
n t
o N
IST
.
7H
ou
se
ly, R
uss, et al., “C
ou
nte
r w
ith
CB
C-M
AC
(C
CM
)—A
ES
Mod
e o
f O
pera
tio
n”
RS
A L
ab
ora
torie
s, S
ubm
issio
n t
o N
IST
, Ju
n. 3, 2002, 9 p
ages.
7D
. W
hitin
g,
R.
Hou
sle
y, N
. F
erg
uso
n,
"Su
bm
issio
n t
o N
IST
: C
oun
ter
with
CB
C-M
AC
(C
CM
)",
AE
S M
od
e o
f O
pera
tio
n,
RS
A L
ab
ort
orie
s.
5W
agn
er
et a
l.,
"Co
mm
ents
to N
IST
co
nce
rnin
g A
ES
Mod
es o
f O
pera
tio
ns:
CT
R-M
od
e E
ncry
ptio
n",
20
00
, U
niv
ers
ity
of
Ca
lifo
rnia
, p
. 1
-4.
4
Gu
rne
y e
t a
l.,
Usin
g L
ime
sto
ne
to
Red
uce
Se
t R
eta
rdatio
n in
Hig
h V
olu
me
Fly
Ash
Mix
ture
s:
Imp
rovin
g C
onstr
ucta
bili
ty f
or
Susta
inab
ility
, N
IST
(Su
bm
issio
n D
ate
: A
ug.
1,
20
11
).
3R
ive
st
et
al., T
he M
D6 h
ash
fu
nctio
n—
A P
ropo
sa
l to
NIS
T f
or
SH
A-3
. S
ubm
issio
n t
o N
IST
, F
eb. 20, 2009
.
3
Str
uik
, R
.; “
Co
mm
ents
on N
IST
Dra
ft P
ub 8
00-3
8C
: C
CM
Mod
e o
f O
pera
tio
n”,
Oct. 2
0, 2003. A
va
ilable
fro
m:
httlp
://c
src
.nis
t.go
v/C
ryp
toT
oolk
it/m
ode
s/R
eco
mm
end
atio
n/.
1
L. K
nud
se
n,
DE
AL
-A 1
28-b
it B
lock C
iphe
r, s
ubm
itte
d a
s a
n A
ES
ca
nd
idate
(se
e h
ttp
://w
ww
.nis
t.go
v/a
es),
http://w
ww
/ii/uib
/no/~
lars
r/papers
/deal.ps, A
ug. 20-2
2, 1998.
1
Te
ch
nic
al p
rop
osa
l e
ntitle
d,
So
lid S
tate
Ava
lanch
e P
hoto
dio
de
Dete
cto
r A
rra
y T
ech
no
logy f
or
Me
dic
al, E
nviro
nm
enta
l, a
nd R
ese
arc
h
Ap
plic
atio
ns,
su
bm
itte
d to
NIS
T a
s c
onfid
en
tia
l, p
roprie
tary
in
form
atio
n,
da
ted
Fe
b. 2
3,
19
93
, p
p.
5 1
3 5
16.
1F
erg
uso
n,
N.
"Au
the
ntica
tio
n W
eakn
esse
s in
GC
M,"
Co
mm
ents
to t
he
NIS
T M
od
es o
f O
pera
tio
n P
roce
ss.
20
05
.
1
Ho
t M
eta
l G
as F
orm
ing (
HM
GF
) b
y A
uto
Bo
dy C
onso
rtiu
m,
Inc.
Ma
r. 1
8, 1
99
8,
NIS
T A
dva
nce
d T
ech
no
logy,
Pro
gra
m G
ene
ral P
rogra
m
Co
mp
etitio
n 9
8-0
1.
Tab
le 1
0:C
orr
esp
on
den
ce w
ith
NIS
T H
igh
ly C
ited
in
Pate
nts
48
This
pu
blic
atio
n is
availa
ble
free o
f charg
e fro
m: h
ttp://d
x.d
oi.o
rg/1
0.6
028
/ NIS
T.G
CR
.16-0
09
# P
ate
nt
Cita
tio
ns
Art
icle
18
Oh
ku
bo
, K
. et
al (1
99
9)
"Ab
so
lute
Flu
ore
sce
nt
Qu
an
tum
Eff
icie
ncy o
f N
BS
Ph
osp
ho
r S
tand
ard
Sa
mp
les,"
Jo
urn
al o
f th
e Illu
min
atin
g
En
gin
ee
ring
In
stitu
te o
f Ja
pa
n 8
3(2
):8
7-9
3 (
pa
rtia
l tr
an
sla
tio
n).
15
"Th
e D
igita
l S
igna
ture
Sta
nd
ard
," N
atio
na
l In
stitu
te o
f S
tand
ard
s a
nd
Te
ch
no
logy (
NIS
T),
Pro
po
sa
l a
nd
Dis
cu
ssio
n,
<i>
Co
mm
. of
the
AC
M <
/i>
, 3
5 (
7),
Ju
l. 1
992
, p
p.
36
-54
.
15
Fe
rra
iolo
, e
t a
l, "
Pro
po
se
d N
IST
Sta
nd
ard
fo
r R
ole
-Base
d A
cce
ss C
ontr
ol"
, A
CM
Tra
nsa
ctio
ns o
n I
nfo
rma
tio
n a
nd
Syste
m S
ecu
rity
, vo
l.
4, N
o.
3,
Au
g.
20
01
, p
p.
22
4-2
74
.
14
Diffie
an
d H
ellm
an,
Exh
au
stive
Cry
pta
naly
sis
of
the
NB
S D
ata
En
cry
ptio
n S
tand
ard
, p
p.
74
-84
, C
om
pute
r, J
un.
19
77
.
10
Bro
wn
et
al., “S
oft
wa
re I
mp
lem
enta
tio
n o
f th
e N
IST
Elli
ptic C
urv
es O
ve
r P
rim
e F
ield
s”,
To
pic
s in
Cry
pto
logy: T
he C
ryp
tog
rap
her's T
rack
at R
SA
, Le
ctu
re N
ote
s in
Com
pute
r S
cie
nce
(L
NC
S)
20
01
, vo
l. 2
020
, p
p.
25
0-2
65
.
9T
ransla
tio
n o
f th
e O
ffic
ial L
ett
er
Da
ted
Dec.
17
, 2
00
4 F
rom
the
Nat'l
Bu
r. S
tand
s,
Min
istr
y o
f E
co
no
mic
Aff
airs o
f T
aiw
an R
e.: 9
21
28
40
7.
9
Frie
nd
, D
an
iel G
.; T
herm
oph
ysic
al P
rope
rty C
om
pute
r P
acka
ge
s f
rom
NIS
T;
pp
. 1
3-1
8;
19
92
; A
SM
E H
TD
vo
l. 2
25,
Co
mp
ute
rize
d
Th
erm
oph
ysic
al P
rope
rty P
acka
ge
s.
9A
nde
rso
n, Jo
hn
C.; “
Re
sp
on
se
to
NIS
T's
Pro
po
sa
l”; C
om
mu
nic
atio
ns o
f th
e A
CM
; vo
l. 3
5, N
o. 7; Ju
l. 1
992; pp. 41
-54.
5
IRE
; N
ew
s R
ele
ase
; IR
E T
ake
s L
ea
d in
Bu
ildin
g S
ecu
re F
oun
da
tio
n f
or
Ele
ctr
onic
Co
mm
erc
e o
n th
e I
nte
rne
t; P
art
ne
rs w
ith
NIS
T t
o
De
ve
lop P
ublic
Ke
y S
tand
ard
s;
Ba
ltim
ore
, M
ary
land
; Ju
l. 2
4, 1
99
6;
Info
rma
tio
n R
eso
urc
e E
ngin
ee
ring
; (V
ER
I-1
60
58
85
-VE
RI-
160
58
86
).
5
He
ller,
E.
"NIS
T A
wa
rds $
2 M
illio
n C
ontr
act
to E
HC
/Lig
hts
tre
am
fo
r D
eve
lopm
ent
of
Ne
w P
oto
ca
taly
st
Te
ch
no
logy,"
pre
ss r
ele
ase
Au
g.
16, 1995, pp. 1-3
.
4
Na
tio
na
l In
stitu
te o
f S
tand
ard
s a
nd
Te
ch
no
logy (
NIS
T),
"O
ptica
l M
icro
sco
pe
s E
nte
r th
e N
an
o A
ge,"
Be
tte
rhu
ma
ns N
ew
sle
tte
r
.CO
PY
RG
T.
20
02
-20
05,
2 p
ag
es.
3
Bro
wn
, D
an
iel R
.L.; “
Co
nje
ctu
re S
ecu
rity
of
the
AN
SI-
NIS
T E
llip
tic C
urv
e R
NG
”; C
ryp
tolo
gy e
Prin
t A
rch
ive
; R
ep
ort
2006/1
17; M
ar.
29,
2006; 14 p
ages. R
etr
ieved f
rom
the inte
rnet <
http://e
print.ia
cr.
org
>.
Tab
le 1
1:P
ub
licati
on
s M
en
tio
nin
g N
IST
th
at
are
Hig
hly
Cit
ed
(in
Pate
nts
)