46
\ ALBEP Array E - Digital Data Processor Reliability and Failure Mode 1 Effects and Critical Analysis - ATM 950 DATI 1/29/71 This .AT.M clocam.e•• the Failure Modes, Effect• &ad Criticality 4Dalysi& on the Digital Data Pr.oceaaor. The analysi1 reflects aulyete on those parts which 'are presently plaDDed to be used in fb).al flight configuration. This document is prepared iD accordance with the requirements of Section 5. 2 of the Reliability Program Plan for Array E, ALSEP-RA-08, Bendix document number BSR 30Z4 elated 11-30-70. From the results of theae it has been concluded that the reliability and design objectives have been fully satisfied. I / \ Preparecl by 26: $. ,/,...)tJ John G. Smith . . ALSEP Reliability Dept. ' Preparec:l by S. J. bison ALSltP Reli<i biJlty

ALSEP Array E - Digital Data Processor reliability and failure … · 2013-12-04 · ,--~a11paee f818nW~ \ ALBEP Array E - Digital Data Processor Reliability and Failure Mode1 Effects

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Page 1: ALSEP Array E - Digital Data Processor reliability and failure … · 2013-12-04 · ,--~a11paee f818nW~ \ ALBEP Array E - Digital Data Processor Reliability and Failure Mode1 Effects

,--~a11paee f818nW~

\

ALBEP Array E - Digital Data Processor Reliability and Failure Mode1 Effects and Critical Analysis

-ATM 950

DATI 1/29/71

This .AT.M clocam.e•• the Failure Modes, Effect• &ad Criticality 4Dalysi& on the Digital Data Pr.oceaaor. The analysi1 reflects aulyete on those parts which 'are presently plaDDed to be used in fb).al flight configuration.

This document is prepared iD accordance with the requirements of Section 5. 2 of the Reliability Program Plan for Array E, ALSEP-RA-08, Bendix document number BSR 30Z4 elated 11-30-70.

From the results of theae ~alyaes, it has been concluded that the reliability and design objectives have been fully satisfied.

I

/ \

Preparecl by 26: $. ,/,...)tJ John G. Smith . . ALSEP Reliability Dept.

' Preparec:l by J~#lt..~--~

S. J. bison ALSltP Reli<i biJlty Mano~er

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WGIP••

1. 0 INTRODUCTION

ALS.EP Array .E - Digital Data Processor Reliability and Failure Mode, Effects and Critical Analysis

..0. ~~tl!V. ~~.

ATM 950 ;;

DATE 1/?.9/71

The resulte of the Reliability Prediction aDd the FaUure Mode, Effects aDd Criticality Analysis for ALSEP E. Digital Data Proceasor is docu­mented in this report.

Z. 0 CIRCUIT DDClUPTION

Figure 1 presents a Functioal Block Diagram of the Digital Data Pro·­cessor. The redUDd.ant circuits are in power standby.

a. I TIMING AND CONTROL WORD GENERATOR

The timing pulses for the Data Processor are senerated in this module. The three control word• are al•o generated in this module.

Z. Z DEMAND MA TIUX

The De:maDd Matrix generate• the comm&Del• for each experiment and collect• the data from each experiment and sends that data to the modu­lator.

Z. 3 INTERFACE BOARD

The Interface Board take• the DemaDd Matrix CommaDds and buffers the Data Demand Lines to the experiments.

3. 0 RELIABILITY PREDICTION

The reliability goal for the Digital Data Processor in standby redundant configuration is • 996. The reliability prediction for the Digital Data Processor with st&nciby redundancy is • 998Z8 for processing all ex­periment data. The reliability prediction for the proceesing all ex­periment data except for one experiment is • 99953. This reliability i.s based on a time span covering launch, deployment and two years of lunar operation.

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~ .,..._~·""'YIP

:~

ALSEP Array E -Digital Data Proceal!lor ATMJ~ Reliability and Failure Mode. Effects and Critical Analysis PAGI- ~ -·~·, ()' -~!._ r · ... ..,.~ ~~

~~ ......... MTI 1/29/71

._----------------------------------------~---~ 3. o Figure Z de.fines the Di1ital Data Reliability Block Diagram. ~l'w<l>

identical channels are represented by "X" in operation and 11 Y11 in standby redundancy. The non-redundant blocks to each of the experi­ments consist of filter resistors and capacitors on .data den1.and lines and filter capacitors on data lines from each experiment.

The probability of failure for each block identified i1'1 figure Z is tabu­lated in Ta'ble I. The probability of failure shown represents the con:l-· posite totals derived from the parts application stress :ratiot!J o.f each electronic piece part modified by the failure mode appo:r.tio.tune.n.t,

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ATM950

ALSEP E Digital Data Proce· Failure Mode. Effects and C.

· Reliability and al Analysis PAGI 4 ,Of, 46

DATI 1-29-71

Timina & Control Word Generator

r-rr; 'bner

1~ KHs _J Clock I Sub Bit

Timer l!l=' Gen.

Frame I N Counter

Control Word Gen.

--------·- -Lope

I Ccmtrol ~r::rol I Signals Command

J >igDals 1

\tulti­:O:rma.t ~mmu­

ator l.dvance

- Experiment Data

-.., I

1 - - • I · Demand Demand DemaDd J ·... ... Matrix .. Matrix • Matrix ~ """"' -1 . ' Generator .. Decoder - Buffer

~~-J--h

I I

r

Modulator

I ·=---=-­J I I

I Demand Matrix x - - - ___ .;:::;...~ .,. Interface

Board x

e l DaU., Prccee:sor Block

-I

_j

Data To Transmitter

Data Demand Lines

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Dema.Dd Matrix

a 11 = .o1zo

Matrix (Standby)

!~.--~__._..,._ •

Q~l ::.000121

ALSEP Array E - Digital!'-., Processor RellabUity and Fallure MCI !:ffects and Critical Analysis

Timing aDd Control

Word Gen. (Standby)

a~z =. ooo119 6

Interface. Board

Interface Board

(Standby)

Q~3 ;:: • 000031

Interface Board

Non- Redundant (Cap. + R.ea. )

Interface Board

Non-Redundant (Cap. + Res.) ~

laY. NO.

/ , ... 5 OP-- .. 46.

DATI 1/29/71

Demaad Matrix

Non-Redundant (Cap.)

Qp = .000008 I

Dem811Cl Matrix

Non-Reduadaat (Cap.)

2 .. =. Demand Matrix

Non-Redundant (Cap.)

2, =. 000008

Demand Matrix

Non-Redundant (Cap.)

Dem&Dd Matrix

Non-Redundant (Cap.)

22 = • 000 Demand Matrix

Non-Redundant (Cap.)

''Ozz -;-:-·cro"Omnr-··

Figure 2 Digital Data Proce~Esor Block Diag:r:am

EXPT l

EXPT 2

EXPT 3

EXPT ..

EXPT 5

EXPT 6

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·4\tJ•au•• , ..... DhtiiiDn·

ALSEP Array E - Digital Data Processor Reliability and Failure Mode, Effects and Critical Analysis

TABLE I

1:1 ~~av. nv.

ATM 950~ ;l

DATe 1/29/71

PROBABILITY OF FAILURE SUMMARY

ASSEMBLY

X - Demand Matrix

X - Tlmf.na • Coatrol Word Oenerator

X - IDterface Boar<!

hlterface Board Non-Redundant

Demancl Matrix Non- ReduDdant

Q OPERA TINa

• 012 08

.01196

• 00314

.000217

• 000008

* Y -function• have •ame Q as X-function~

Ql

STANDBY _...,. __ _ "00012 J

'000 120

. 000031

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ALSEP Array E- Digital Data Processor Reliability and Failure Mode. Effects and Critical Analysis

ifi!V. ~l'tlltV•I'IIU,

ATM 950 :j I (> ~~-c~~~aes S!llli~ER

''AII'DI!=IIIDe wstenw mvl•lan

DAU 1/29/71

3.1 RELIABILITY CALCULATIONS

··'· 3. 1. 1 Q T = probabUity of failure of proce 11ing all experimental da.ta

3. 1. 2

3. 1. 3

1 1 1 1 0 1 = Qll + Ql2+ 0 t3

' QT = Q1 Oi + ~ ~ + 6 'l2 2 2

2 QT = 1.01 a1 + 602 2

RT = 1 -Q T= reliability of procee sing all experimental data

Q8

= proba'bUlty of faUure of processing all experimental data except for one experiment.

Oz= 0 21 + 0 22 R2 = 1-Clz

1 [ 6 . 5 J 0 s= 0 1 °1 + Ql ~ + 1-R 2+ 6 R2 ~ 2 z

z [ 1. R~ •S ]

Q = 1. 01 Q 1 + + 6 Rl Q 8

2

= reJJablUty of~success of processing all experim.ental data except for one experiment.

01=0 11 + 0t2+ 0 13=.01210 +.01182 +.00314

o, = • 02706

Qz= 021 + 022 = • ooo211 + • ooooos Q = .000225 2 .

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W'DI828£Je

ALSEP Array E - Digital Data Processor ReliabUity and FaUure Mode, Effects and Critical Analysis

. 2 Q = 1. 0101 + 60 T 2 2

2 , QT = O. 5 (. 02718) + 6 (. 000225)

QT = • 000369 0 0+ • 001350

QT =. 001719

.-. ftillli!IY • ..V.

~ ~

ATM 950 i --~~·~-----

DATil! 1/29/71

R.r = 1-QT = 1-.001719

. " ·~

~ = • 998284 reliabUity of processing all experiment d~lta

as= 1.o1Q12 + [ 1-R26 + 6R.z5 02]

z

o8

= o.5 (.02718)2 + [ 1-(.999775)

6 + 6 (.999775)5

(. ooozzs)J

o8

= .ooo369 + [ 1-.998551 + 6 (.998775)(.ooozzs)]

o8

= • ooo369 + [ 1-.998551 + • ool3497]

o8 = • ooo369 [ 1-. 999901]

o5 = • ooo369 + • oooo99

o5 = .ooo468

Rs = 1-05 = 1 •• ooo468

Rs = ~ 999532 reliability of processing all experiment data except for one expB riment.

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\81GIIP8-.,.11Jm8Dht11DII

AlB.EP Array E - Digital Data Processor Reliability and Failure Mode, Effects and Critical Analysis

4.0 FAU..UBJC MODES, EFFECTS lc CRITICALITY ANALYSIS

P.II.GI 9

li»A'n 1/29/71

The failur~ mode and effects aD&ly8is for the Digital Data Processor i8 documented in Table II. Table II delineates the failure modes at the piece part level.

The faUure probabW.ties reflect the identified line item. The format of Table II ie designed to provi-de the reader with a narrative descriptim1

. of·tlle vuyiJ:II qrpee of failure that could occur, combined with therE~­sultant performance characteristics. This information is useful t~) syateJn support in performing fault isolation should any anomaly occur. There are no ALSEP .E single point failures with the Digital Data Pro~ cessor, but each experim.ent has a critical failure mode in the filter capa­citor on each data line and the filter capacitor and resistor on each data demand line. This means that we can lose the ability to process data from an experiment and still process data on the other experim.e:nts.

The faUure probabllf.ty figures were derived usiq the data obtained in Table II. ATM 60SA was used to derive the component a's (open, short, drift, etc. apportionment). Some failure modes, such as drift of d

resistor in a digital circuit, do not affect the operation. The failure modes whicb do not' affect the operation are not included in the FMECA. For thie reason, the sume of a's for eome circuit/function items do not equal one.

Not aU failure modeu are eerioue. When the effect of failure on the eyetem is termed "outpu.t 1Ughtly erroneous ', the digital value received on the arOWld can be adjusted to the correct value.· This can be done by observiD& how the failure or drift baa affected the calibration signats.

The Digital Data Proceasor circuits are raDlced according to criticality ranJd.Ds which rates the effect on mission success. The higher the cJ'i .. ticality ranking number the lesser the effect on mission succet~s.

Criticality Ranldn& I Loss of system

II Lo1e of syatem control

III Loes of one experiment

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-ve~anWDivl•lan '

ALSEP Array E - Digital Data Processor Relia.bility and Failure Mode, Effects a.nd Critical. Analysis

C:riticallty Rank!!!& (Cont. )

IV Lose of houeekeeping channel

V Loes of redundant element

VI DeiJ'&dation of a redundant element

5. 0 RELIABILITY ASSESSMENT

I NO.

ATM950

The purpose of performing a reliability prediction and failure n1ode analysis is to identity inherent design weaknesses. .From the reaults of these aD&lyses, it baa been concluded the reliability and de~:~igu objectives have been fully satisfied.

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MRJ~ .... 1.·o Demall4 ~~atria

1.1 Cl • Cl

Cl1 • C21

.. ,. .

~lEN ~l.S~:P ~ · ~~ -Jfbc .,;~"ra r

FALURE MODE EFFECT &. CRITICALITY ANAlYSIS -.(TTL> ~r~~-b~r:-:~-tift":~;;:

FAII.UK MGDl

1.1 A) Cl-C8, CJ6.czl l'at1 Short

B} Cl-C8, Cl6-CZJ l'aU Drift

Ef'PICT OF FAILURE

(&)_I AS$EM1LY END ITEM

l.J A} JacreaH SV supply capaelt&Dce

B) lslc:ra.u or decreaee JD IV Clilpad~

1. I A) Increaaea 5V aupply fUterfa1 wllicb

helpa ayat..ma Umtt aol.ae

B) Not -h effect C1D Oflil\em

U.4 VI

. ,___

1.1 Commuro4 ~1.1 bp.ter ! A) FF UlA Fatb UJ !!

m. J 0

B) FF UlA l'al1e

m 0 1 .

C) FF UlB l'al1e

-1.! 1.1!

m l 1

u' A) UU. F&n.

~ () B) tv ?..A F'alla

~ r l 0 c

l

ci uz:a Fa.Ulll

l.Z . A) ~ i!dvance :-epeter'a hila

Ao .B. C, D, E, F atop cbaaalq

B) ~advance resbter'a Wta B, .c, D, E, I' cOilthmea to ce\mt

C) CornmaN~ aclvance reslfter'• lllta B, ((, D. E, F atop cbaDsJna

1.3 A} C<nnmlmd ad:vmu:e register'• bitr;

A, B, D, E, F e.ontinue t.o c<>WI.t

B/ Coinmlmd <Hh~c"' regieter'e bite C, D, E, F llli'op ehangmg

C} Co:m:nau-d ao,h?l\n.ce reglt.ltoR'a\l Mta D:. E, r ~tc.t 1.:-.hE.ng'"inf

:I

t! ;t

I . -

1. 2 A) Data dt~J~nacd line e~ t!tay at

the 11t1me word

B) Data demaacl Uae commNIII, c~dtl wr0111 ..ord aDC! cauaee JZ wonle to repeat

C) Data demarulllae c~ Altemates betw-eea two-~

1.3 Aj Data demlllld line comJ:b&Dd coms:natuta

wrong word and causes a different set of 3Z word11 to repeat •

B) Datl!l demand &e commande e&ll!H!II

4 word8 to repeat in serial faehiGa

C) D»ta demand UDe comma.ad e&UIIe8

S WGz-ds to repeat in eerial fae!Wm

i9.8 VJ

ZC)I.8 Vl

~""'=~~m;:rm,..mn~ *" =' n ...,........t ...... ~~~.tl\\Wt'~·~~~" ' "S"""Mr~~.._.~~~"""'"""--.... ~

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FALURE MOD£,_ EFFECT & CRITICALITY ANALYSIS

FMT/CDfiMNT SM:IGL

MIWR£~ (CE.l

1.4 CcmmaDdAdvucell.4 Relifter A) U3A Falla m il i U3

1.5 tU us U6 U1· U39 us U9 UlO · Ull

B) U3A Flllle

C) U3B Fan.

1.5 -A} U4.A Fails -BiJh

U7A Fall§ Low

B) U4A F.U. x­U7A Falle Blah

1!

m~ 1 1 0

NOTE: 1.5 is repeated JS timet! for other 15 coded outputs hom command

EFFtCT

ASS£MILY

1.4 lA> CommaJU!advance regieter'e bite

A, B, C, D, F cGD~ to count

OF

B) CommaDd advaDc:e register's bitE, F atopc~

lc) Bit F lrtope cbaJaslq

!1.5 ~) D~ matrix decoder will not

decode 8 of 64. worde

!BJ Demand matrix decoder will cauee Z worcle w be commallded OlD at the same time aDd thle will hapPell 8 tlu.u outof64wo*

...

(TTL)

FAILURE

END ITEM

1.4 A) Data demand line coziunand comma»da

wrong word and causes a different aet of 3Z words to repeat

B) Data dema.'ld line command causes 16 words to repeat in aerial fashion

C) Data demand line comm&DC causes 32 words to ri!peat in serial fashion

1. 5 A) Data demand line commands will be IAl

miaablg 8 words per frame

B) Data demand line commaDds will causej:3) Z words to be commanded OD at the same time and this will happen 8 timee out of 64 word!!

29.8

228.9

+-- . .. I -~~~w~-----------------t-----------------------------ir-------------------~--------~---------+-1,6 !.6

1U A) 1U Failf! Open

B} lU Fails Drift

.6 ~) Command advance register'«

A, B, C, D .Wp cOUDting E, F

~~ Comnuuu! advance regieter'e might

1. 6 A\ Dat<. deu.and line command stay at

ean).£ wo:-d

8) D.at£ den=n() 1.:\..;:e eomw..and might

6.!!

. _ count erratically · ~~<n:nnxand ;;•;-,-ong word f- --··-·· . . ···--- - ~-- --~---- .

I 1..1 !.1 ~ 7 L ".'

lU. L, R1H.U."""" t c~ .... adv=o• """••'• E. F Ai Dou •·•=dl;., •oo=d •ill ,.~. I •. c r StOp c01.m.ting ) (:. Wf ':'"~0 tO !"epea.t i.n l'e rial fashion

L~-~ -- - ~" - -· .. -

..

VI ~

VI

VI

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. . F>~TfJIII ALSEP E 'l'."<t"' S:itb 'llfM ~50 fD" ~ "ri~f:l"' ~,.,.

~13 ~ .,.. FALURE ~. EFF£CT & C._riCALITY ANALYStS . ~~ f..l'mand Matrb r7,:t ... !J"lll. Z/19/71

. !FFiicT cw fAILURE • IMF/CXJI'cNI'r ~~ amc-MURE tiiiJOK ALITT ..... (C) ~y END ITEM Ox_KP I

2. Demuld Mattia ' Decocle:r 28 VI

2.1 2.1 Z.l 1.1 ' uzo A) tnOA l'aD8 HIP · AJ »ec:oa.:r ...a p1a s .ta~ 1a &-.late A)_ nret word comm!Uld stays at-.

atate or Brat word off poaitlGIIl for aU c:ommaDCla

B) UZOA Fat1a Low B) Decoder !Willi pia 3 ata~ Ia 0-state B) nnt word c~d staya at_aero •tate or flut word em positl• fo:r aU commaDCla

C} UZOB Fal1ll HIP C) Decoder DUUI pia 14 !Ita~ Ia 1-atate C) SecODd word command stapda ' eecond word off positlG!l for an coaunande

. D) UZOB hila Low . D) Dec,.ocler DaDd pla 14 stay m 0-etate D) ~o.ud word ;;:~ stay& m

se-ca.ud wQrd on positiOD i I

E} U:UlC Falle Hlp E) Decoder IWlG phl 8 lltay Ia I ~state E) Third word command stays iD thlr4 word off stat<> for all cOil1ZDIUIIlll

F} tnOC Fa.ilB Low F) Decoder ~ pm 8 stay Ia O_·lltate F) Third word cODI.lDADd stays m third word on state for all commNida

G) UZOD FaUa HiP G) Decoder flUid pla 5 eta~ Ia 1-atato G) N/C -·-H) U20D FaUll Low H) Decoder aarad pta 5 eta~ Ia 0-atate H) N/C

z.z z.z· z.z z.z 28 VI tTU A). u~ ZA Falls Bish A) I>Kod•r wired or pta 8 ataye Ia A) 57 word staye m off eOII.d:lttoD 1-atate .

B) UlZA F.U. Low B) Decoder wired 07 pizl 8 ataya Ia B) 57 word stays In on c:ondit!AJa 0-Dtate

C) U12B Falle Hilh C) Decoder wlrecl or p1D 3 stays iD C) 58 word stays in orr c:ondltie 1-etate

D) Ul2B Fails !..aw D) Decoder wired or pm 3 atay" ta 0) SS word ~U]-.si :h; on .;;.O;J."i!itio.o C-stl!!,te

~~ ... ;;;:~1.4!~.»=~~,._- -"""~ - .---

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IMT~ .... 2.1

VII

z.s VIS t1M tm V14 uu t715 tJZ5 t716 t121 U17 U26 Ul8 U%7 U19. uu --

%.4 U8C.

.

f'>TSIVI ALSEP..X F1!! ITiiM ~p

rr.·c.~&f; ~M..9U.~ pMj ttO.

~J.Ld Mo.

FALURE MODE. EFFECT l CRITICALITY ANALYSIS ~~and :Matdx ~ICJ-. 1"'"",, ... , ~ 2120h'l

FAII.UR£ MODI (4t_l

1.2 -E) Ul2C Falb RIP

F) Ul2C Falla Low

G) unD ran. mp

H) UlZD ran. Low

Z.3 Ul3-U19 Ull-UJI

Same cGIIMU.dOD ae tJ'lZ Same COJiditla •• U12

L4 A) UBC Fafla JBP

B) USC Fa11a Low

tfFitr

-~-la.z !£) Decoder wind or pia 5 etaye Ia

. 1-etate

1F) Decoder wln&l or pia 5 etaye Ia 0-etate

~a) Decoder wired or phl14 ata.ye In I •-•tate

OF MLURI

DO 111M

z.z E) 60 word c:Oir!DlaDd ataye Ia off

cODdltiOD. for all eommsacle

F) 60 word comD'..fUld itt&y8 ba Clll

condition for all co:rnm•Dde

G) 61 word command ataye iD off condition tor all C('M!Dl!IDIJe

Decoder wiNd or pbl 14 etaya In Hl 61 word command stay a iD •

FAILIJAE PAOSA_SHJ__ T Y Qx _!CP

CIIITie­AUTY

0-etate c:ondltlon tor all c<'m"'~e I -""· I -1

!Z.S Same c:Gilldlt!oa ae VIZ except 4Uferellt wont

z.s Words 4-56. 59. 6Z-6t are effected eame aa word 57

) Nand pte sdD• fall• iD ldP coadlt:loll A) 64 -rd camaot be c:ammaade4 cm ~4 11.4 ) . Naad gate pia 5 f&ile Ia low condition . B) 64 word eOinm!!IDd stay OD an tjme

11JZ.4· VI

I. a· VI

1-- . -3. Demand Bvfier

3. l U30

3.1 A) U30A Fall

Bl U30A Fail

tJ U30A FaD

~

m oro m

p.l jA) U30.A experiment I iii c~ed on

IBl U30A exp"riment ! 1• comm&Dded off

3-.1 A} (DDIZP) Data demlm4 UDe eommanded

on and data flowe out (SlDYN) ·

Bi {DDiZP) Data d~ma.nd Uae comma.tlded o!f and dat<. stops !lowing out (SIDYN}

:) !:xpe_ dmm I turnt l-d~ta demand. line I C) ( DD:ZF; Data oema.nd liue commanded off end I daUI. line on off, but ! data line il; tllrned on to

SIDYN

zg. 8· VI

!,.,.,-~~"•=·=-~---~"~--"-'m"""""~-~m~=v"""~~-"""-~~-""""""~· , · ~ ~~~.J

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. . ~~- ALSEPE -~~'!mtth fATM9SO~ . p ~~..,.ro<!lliSII01' ~1'111·

~15 of' 46 . . FALURE MODE, EFFECT & CtWTICALITY ANALYSIS ~~! Matrix ~~,. .. , r-"'f& 2 Z0}71

"""~ imcT OF FAilURE ~~~ Cml'IC-..... .. FAIWM MODI

j_&j_ ASSDa.¥ EW ITEM Qx ld' M.ITY

, .. 3.1 ' d.. ~· . . 'S.l uso D) USOA Fall !DJ l:zpedmeat 1 bli'IIUJ lclata demaM &e D) (DDIZP) c1&ta demaJld Uae c:~

o·o - ... 1 data Jhae .. Oil, blat I c1&t& !me le tui"DOII oil to (SlDYM)

E) USOB E) throup H) tau. aame E) (DDBYN) falla !!Mne u 3.1 A) ae 3.1 A) th~ D) thrcmpD)

F) F)

OJ G) ..

' R) H)

s.z ~ s.z ~-I s.z J9.8 VI U33 A) US3A A) th~ D) tiiUII --. A) (DDHYN) fa!lm sam• a• 3.1 A) -

. uS.lA)~D) throup D) ...... .

'

B) B) . C) . .

C) . D) .... D)

E) U33B E) thltOiliP B) fal1e 8IIIDO E) (DDEYN) Ia& same. u S.~ .4) ·u .. S.l A) th~ D) thJ'OUgh D) - .. .

F) .. F}

-Gl G)

H) . H)

I I n ,, . . :

L ~

_j ,, li i: ~ ·~=

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S.J 1Bf

S.4 ms

:., ~ t');~

rri-1

U3il

s

'AIL.Uftl MODI

t134A A) tllrGQih D) faD.• •- u J. 1 A)throaafaD)

UM E) throqlt. G) latl• - u S.l A) throop D)

4 . I, .• tBSA A)~ D) fall• - .. :s.I AI A) tlm:icah D)

WSB El~ D) tan. auae u 3.1 A} throuah D)

r~-5 .A\ Ul6A Fails IDgb Low

iE,) U3'1'A l'tt!ls Hl.s'h Low

iC) Ul6B Ft>!.b H.igh LCF-w

·-

I ... A} t"36A ~lock I egpt. data

13) U31A,~1cck H expt. data

i C} Ul6:S,'block G expL data :'

' (DDGYN) falls e<tme •• :S. I A)throupD)

(DDAYP) falls s~$:M u 3.1 A) throqh D)

4

C)

D}

(DDFYN) fan. eame u S. I A)throqhD)

(!

E) t1>DDYN} ~ •~ &II 3. 1 A)t~D)

GJ

3. 5 A) Cotnl'T>-And d,.o::od"'t' datA!> fal111

B) H tx~~t~ da..tz, !all&

C} G -e.Etpt~ &.~J~. f~~!a

)

VI

~ .. VI

@8. CJ- Vl

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' . . «:e•-

"]'4 -c;'~ rfi.y. 950,.,. ~,.,.

~--~46 FALURE MODE. EFFECT &. CRITICALITY ANALYSIS ~~clMatria ~i.6•

f!.Wf~ lfiFICT or FAII.URI FA~ CltiT!t-FAI!WRE MeiDl. AUn ~ («) ASSDBY END 11'111 Q ')( 16'1

D) VS'IB J'dle JBp Low D) VS1B Mock I' ezpt. data D) I' apt. clata lalla

E) t137C l'alla JBP :Low E) tmc 1Uc:k A. apt. data E) Houekeeplllfl data ialle

., t136C !'a!1a . JBP Low F) tJS6C ltlodt E ~ data F) J: expt data lalla

G) VS1D Fall• mp Low G) VS1D blodt D expt. data G) D expt data fane

B) VS6D Fane JBp Low H) US6D block B e311t. data H) B expt data lalla

l)ms Fall• Hlp Low I) Block aU data n (SIDTN) data 14 completur !OIIt .

' U7i' hila HlP Low

=~

3.6 3.6 '·' . 3:6 n VI Vi9 A) UZ9 Falla ... A) FP'tnOBeapt. Ble~a A) (DDBYN) data demand I1De Is oa aac1 U11D VSlD Falla. Low . data flows out ~ (StDYN) no matter . what data demand line le oa

BJ U29 Falla Low B) FPVSOBapt. Ble ~off B) (DDB YN) data clemaocl Une ia off VSID Fall• Bl .. &Del no data ncran from expt. B

I

3.7 lUC 3.7 3.7 ··. 3.7 35.7 I au A) RIO Falla Open-Drift A) FF lDOB expt. B La commanded em A) (DDB YN! data de=and line ia Oil VI

R.lZ . and data demand line cam.ot be ! JUS turned off - . Bl-4 RJS B) au FaU• Open-Drift B) FF VSOB espt. B Ia commanded Oil

. C) RlZ Falla Open-Drift C} FF IDOB ezpt. B la commanded OG

D) Rl3 Fall• Open-Drift D) FF moB expt. B il comm'anded on

E) Rl4 Falla Open-Drift Ei FF U30B expt. B ie commanded on

F) Rl5 Fall• Open-Dr~ Fl FF U30B expt B h commanded on F) I

:!

'' .

·~lkWt:hLL - 4ii~W~'ll!li

··.~·"""'

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~ t. 'AlLURE MODI I•IJ .... epa! !.I .. Sol

I 5,.6 I VI

S...aeS.7 .. 3.7

~

&_;' I'·' ·' 6&0 I VI 3..9

ll9 hl1o Op-. Drift Demauul nll-ter lllllJht tun em all data oirle mipt tunl Q!l all ~ii'IIMDCI. data lhlee ~U..eat~ caueln& mbdnl Qf ~a

S.lO c·lO S.IO 3.10 I a.o I VI 'CHI A} U40A Fane Hllh A) FJ' VSSA u:pt. H la cCIIDIDBilded em ) (DDHYN) d~~.ta demud lloe la em

FaJla x- and data a~n om (SIDYN)

F•ne x- B) FF VSSA u:pt B lo -COIN'D"'~ off } (DDHYN) di!.ta de~ 11De 1o off

hU. Blah and no dMa flow11 oat (SDYM)

Fa!lo Hlp C) I'~ VSSA apt. I' to ~<ed em. C} (DDFYN) data demand u- l8 em J'Jl. "Low . and data ftwe eNt {SIDYN)

Faile 1.-. .PJ FFVSSA.u:ptJ'Io~off D) (DDFYN} data demand line b ell Faile Hlp and no data flows oat (Sm"'JJ) ;

3..11 3.11 S.ll ··- s.u I 1*0 I V[ VSZA A) tnZA AJ Demaaclllaffer regloter VSO. vss. A) Dematd reP~ter.c:&llDOt 'be preMt ·V!ZB U3ZB Fall. HlP. UU. VS5 ~.'be preaet · when (ASEYP) command 18 11-VJIC U32C

B) Demaa4 buffer nlloter eta,. Ia B) Demand Register b cllsabl<ed aad Fan Low I pnaet COiiMJltloe cUaabllq deiDaDd

' no data demllcd •1111&1• c:aa paae

"baf!er

~.lZ !"" !".. . . 3.12. r · · ·14- o i VI ln!B A) U31B Dem&IU! baffer loses ita c:loc:k aDd Is Demand buffer h dleabled and laBt t:iaQ

U3U: U32E Fan Low or High ditrabled demand line on after the failure stays U3ZF U3ZF ' on till a preaet pulse comes along and

data demand line off

~ I l ,,

I .l •

~~,

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. . ·~ - -----

i:Sm»" II: 'i. -o~ :!:lt1l t'fiM.~sofB ~ :>!l~Proceesor ~""· -~~19 II 46 ..

· FALURE ·MODE .. EFFECT & CRITICAt..lTY ANALYSIS ~- ~mand Matrbr "'Tsfr4J,· ~bao 71

IMfj'CDI'aar UFICT OF FA LURE _21WRI CRITIC-·FAIWRit«<DD! ALIT\' .... I«) AS~Y END ITIM -a.·ldl·

3.n 3.n . 3.n 3.n .u.s VI USZD A) U3ZD Falla HIP At FF U30A la cOJIIDUIIlC! .. oa A) Commaftd decoder data demaftd tJSIC U31C J'alla Low llfte la oa and data flow eut (SIDYN)

B) U3ZD Falla Low B) FF VSOA le e~ elf B) Commaad decoder data demand llae USlC J'al1a IBp ls off and ru1 data flows out (SIDYN)

3.If 3.lf 3.1 .. 3.14 .s..,s VI U3IA At USIA J'alla IBp A) DDIZP le eO'I'DIDIUlcle4 oa A) DDIZP le commanded Cll ~

catmGt be tumed off

B) U31A ~a Low B) DDIZP Ia eommalltlecl oil B) DDIZP is commanded off

3.11 3.15 1.15 3.15 ~G VI C9 A)C9 Falla Shol't • A) Lo .. I:DFZD data A) (EDFZP) data faDe CIO .

. Cll B) ClO Falla Shol't B) Lo.- EDGZP data B) (EDGZP) data faDe CIS . - -Clo& C) Cll FaDe Shol't C) Lose EDHZP 4ata C) (EDHZP) data falla CIS

D) Cl3 . Falla Sbol't D) Loae I:DEZP data· D) (EDEZP)&dafaU.

E} C14 Fane Sbart E) Loae EDDZ~ 4lata E) (EDDZP) data fal1e

F} CU Fan, Short F) Loae EDBZP daia FJ (EDBZP) data fan.

.

.

.

I l ' ! f,

l'

~""'-"'.

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' ~'GTIJ}.LSEP E ~

·;r. '<:t" ~. 'fi.M950 F . ~ ~~roc.eaaor pwci NO. . -20 elf 46. ' . FALURE MODE. EFFECT & CRITICALITY ANALYSIS 1C P'l ~ftir .. ,._ ... _, "TM'f416 ti/1, 17A

UPIICT OF FAILURE oi'ill:lililerMOr FA? CRITIC-JMr~ FAUIRE .MODI

(«) "ASSDILY p~ AUTY ... END ITEM

-· · 54LN .Ot? 14.66 VI

1. Sublllt Tlmu 1. 1 Invertor Al-l Falla low or hlp 1.1 Subbit Timer atop aU tiiDlaa Pata•• 1. 1. 1 Lou Tlm!~t~ palsea to tbniq pu1H

I seurator

V6l U68A h!la Q G I 1. 1. 2 Lou at&ri: and data traufer •Ia-

1 0 D&la for A/D convener (TT3YM) U69 54L73 0 1 .

1 1 tJ70 0 0

1. 1.3 Lou pulaea to bit timer

U71 . 1. 1. 4 Lou of aubbit tiiP1na pahles (SB1 YJ

!i4UM .ozt·: {!._14; VI U67 1. 2 Inverter A1-Z Falla low or hfcll 1. 2 hbbtt timer •top tbnl~t~ paleea for 1. 2 Lou timing pul11e gene rater ai&Mlll

ace 10.6 KHI and LSPE 3.5 KHI ACJZN; and DSHYP e!gn&J. HSLZN ' 116M tan. Q Q U69Btau. Q Q allll snoduJ&tor bit rate; for LSPE and

0 1 0 1 ace uperlmeDts. 54L18 0 0 54L78 1 0

' 0 0 . i . 1 • 1

I -~ 7.48 VI I

1.3 U6'A ~ Q Q 1. 3 Sabblt timer cUWJ- Ez. ~ cUWJee 1. 3 Timing pulse seneratoll'' IIIS,Mla. for 1 0 by 2 iuteacl of bJ , I.SPE experiment are IDcrea•ed by .

54L78 1 1 1.5 . ··-

54~ .ou ' -J.r74 VI -

1. 4 2 Input cab U70.A tan. Jdcll 1.4 Subbit timer atepa ~ pulaea for L 4 Lo .. t1m111.s palae geoe~~r •ipala, . -· l.SPE experlments for lSPE experimeat

54LOO .046 1"4. 35 VI

l. S Z input p.te TJ70A faila low 1 .• 5 Subblt timer stope tlmbac· p.ililea for 1. 5 Lou timing pulse geneator slgaala. U70B falls low ace a.nd lSPE e xpei'IIDeate lor LSPE an<! ace experiments U70C falla low or high

>-· 54LOC ~ • 012. ·3.74 VI

t. 6 Z input gate U70 B faila high I, l. 6 Subbit timer atops timing pulees fo:r · 1. 6 Lou tirning pulae geoe:rator signala, ace exp.;rirnentrl for ace experiment•

~-;;::::,,;;:;:,, U7l B t;;,·.~.O'Il . -;:-, su:bk ,~~;~;;::-::::;;::: .=.: •'•=~ --,~14 ]-vl ~" !ails lrlgh <H" lo">;' are and U3PE experimenb for LSPE and ace e:;:?"'?irnents 1

- . -- • . \!lii" - . ;:-.«-"""~~- . -~-~ .· ., .. =-== =- J 3

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. ~~LSEP. . T.>:Go">~ rf"TM 450 ru"

FALURE ~ EF~ & CAITicAuTY A\u.LYSIS -roceAw 1JWij Mil •• !If ll "'"ot- 46

-' ··ll ~. ~ 'B«t4u . 1 II?/70

JMr)ti.'Maalr UFICT OF FA LURE worac ... ~

'"~ avnc-$MD.

FAIWRI MODE («) •ASS!MILY. END lTd· ~ AUTY

HLCM .• ol~ . 5.50 VJ .. I. Sdlldl Timer t. 8 lAveftel' U6?C tau. hiP • lotr 1. 8 Subblt ttmu etop.t thnllll pu)aee for I. 8 Loae tJJD!q pu1ee ceaentor eipal ..

(CCIIIL J ACJ'ZN fOI' ACJZN

54 1M ·' ·- 1.49 VI

1. 9 lavutu V61D !alb Jd&h 1. 9 A) SabWt tim.el' W0\114 eupply data 1. C) A) Timing pulse pnentor slgl!Wa oil ..

ehUt palaee at 3. 5I KBa • B) T!mtas pu1ee aaeratol' s~ 10. 6 KHs with coatJool elpal B DSBYP. HSLZN ihb. ;;tbJft •II-at Jdth. Dale at wr~ p..>!ae rat-ca.

B) At (3.52 KR& ol' l0.61CHa) aD4 . . (540 Ha or 1.5 HKa) with co.atrol

\ elpal B at low. - "' •• oo Z;ofC) I

. HIM VI

1.10 Im-eftel' U6?D tau. low 1.10 Sublt timer utope ttadra& paleee for 1. 10 ~· TSJams pdM aeneratol' alpall

I .. data elalft ~md JDOdulator fol' ACE fol' data ehUt aD4 1nocl1alato1' for .,.. .

\ 1Tn . aD4 LSPE ezperimetde. ACE aDd LSPE uperbaeats.

54LOO ' • o'l ,.-.,..;. VI ' I

A I I

1.11 2-!Dp11t pte UUA fai1a JdP 1. 11 hbblt thn$r· ~~tope ttnm~a pal11e11 1. 11 Loaa t:lmlDg pulee &eDerator ·~ '

for 4at& •bUt Uoee aac\ ~ f~ for data ehlft aud ~r for ACE all«< LSPE u.perlmellte ACE and LSPE ezperimeata. . --. I

54LOO .oz 6 ... 6 ·: VI

-. 1. ll l-fu!M gate U7ZA failm low I. 12 Subhit timer stope timln1 palaea l.lt Lose t1miag polae pmerator eipala

U7ZB faili low for data ehlft linea &.nd rnodalator for data eldft arac1 modulator fo:r all f for all experlmeDte • e:x:perlmems.

r--~- 54LOO -COl 3J3 - VI

L 13 Z-tupm Gate.tJ7lB fa.ilei high 1. 1;. Subbii: t!me r stope timing ptllsu ! . I 3 Lou ttmmg pulee selierator eig-fo:r data sbL"t linee and modulator nala for data shift and modulator which ne,;d 540Hz or 1. 06 KJU.. which need 540 Hz or I. 06 KHz..

·j

ij I ~

.,..., .. ,_~,,~.: ~~~::;:,.~,~\\U'$1111" t: t~._..,~~~.e<'l: -· ~ L.~,-~ c..

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' plaltR ALSEP E T.o~w. ~TM9sof8" ~:~

pw&-..,. -2Zof 46

F'ALURE MOD£. EFFECT & CRITICALITY ANALYSIS . .. -·

* ~~ .. !.~.!.· Pff .. ftu. t .,·,, 'J /7tt •

URn cw MI.URI Ge11erator .. .

.. FAILUIIE FMr/4DfaBI' . ame-

FAILURE MODE $MIL («) ~--y £NO tl'Dt ·a x-KSI' ALiTT

.,i»U: 6. 86 VI 1. Sl1bbtt T~ .ULOO

(CCIIIt) 1.14 Z-Iapat Oate U?ZC falb Jdch eDI! lcnl 1.14 Subbtt Timer stops tlmlq palaee 1.14 Loss timing pulee generator sJ.saale

" " ussc " " " for data eldft lblea allCliDOI!ulator for data shift allCl modulator for all for all ezperlmente expedmeata

54LCM • .olf S:.JO VJ:;.

1. 15 ilmt!tell' U6 n: fatla low 1.15 Subbit tlmel' !Jtops timing pulaee 1. 15 Lose timlDg palae Jenentor sfinabl for data ehlft lines allCl mochtla\Or for data shift 11M a and modulator whicla oeed 540 Hz and T'l lYN. which need 540 Ha u.d TT3YN. (

TTJYP wh!eh !Wed 8. 44 KHa . TTZYP which aeri 8. 44 KHs for transfer sigD.ale for A/D c:oav.

Sf !.Of 1.15 Inverter U6?E fai1e hiP 1. 15A) Subbtt timer 111uppliee tlmloa 1.15A) Timiac pulse aenentor dpala .

puleee coneetly Jf elo_w mode are correct Jf slow mode ~ eomma1ld Is &tv- lei glvea

B) If oormal mode c:ommalld ie B) If normal mode command le givea • &lYell the aubblt timer auppllee the aubbit timu supplies timJD1

tlmlng_pulsea at 540 Hs with 75ft pulaee at 540 HI: with 75" duly dutJ' cycle ud TT 3YN puleee at aod TT3YN pulses at 4. 28 KHs 4.18 KHa with 75"1 at,. cycle with 75"' duty cycle

i ... filii . s:4s.: Vl MLOO

1. I6 z Input pte unc fal1e hiP 1.16 Subbit timer stope tlmlna pula•• 1. 16 No pi&J.aes for subbtt timer data

V13 .. - for data i.Juft. modulator. TT3YN, ahJ.ft, mod'lllator TT3YN, aDd bit

U14 and Wt timer when slow ~!).ode timer when slow mode cmnmaM 1e

. U15 c-DC! b givea. gi,.-en . -S4:LOO

.t&Zi 6a6~ VI

1. J7 2 Ia.pat pte U?!C fai1e low 1. 17 Subbit timer stops timing puleea ~. 17 No pulse• !or subbit timer data 2 Iapat gate U7 3A !aU. low for data ehi!t, modulator, T't 3YN, shift, :modulator, TT3YN, aod bit

Ule bit timer when elow or normal tbner when slow or normal mode mode cOIIllllancle are given commands are given I

I 54LOO

• o¥111 3.43- VI 1 I

1. 18 Z Input gate U7 3A fails high 1. 18 Subbit timer stopl! timing pulses 1. 18 No pulseD for subbit timer data ! for data shift, modulator, TT3YN, ehiit, moduhtor TT3YN, and bit I and bit timer when normal mode ti=er whe~, normal rnode com:tntu~d i

i commang_k_g_iven ·-~' ··- -~-_j

54LOO • 045': J4. 03 - VI 1. 19 2 il:>:f"'* gate UHE .fa!.:tc Mjlh or low 1. 19 Subbit tim<J:t stops timing puh.;s for 1 .. 19 Nc :p-..1Isea for aubbit tim<i!Y d-ata

U73D fail;; high or low data shift, modulator TT3YN, and ~!ihH't. ?i"'i(}{"1il1;;{h-.l" TT 3YN: an!~ bit -· -bit timeT whe!1 rtorma! or ~lD-~ l-n.f..\n. Ur·n~? ~·h~n !'!!)?rr-.:.al rn£:..de OF al~

corrun<>ndti! are given :me>de comm;.l.;-u:ls a.re givea

k,w~---~~- ::=-1-mr>o ---,~~

I

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. . ~AUEPE :r.o:~ ~),( 9!i0 r"" -Fl&~Procelilhl' ~ M).

f'ALt.JR£ MODE. EFFECT & CRITICALITY ANALYStS .. ~wE 21 'ar 46 .

t~:!.~ ~16 ~2/17/70

~ EFRCT OF FAI.\ME: Genentw F~.suil! CRITIC-SMICIL

FAILURE MODE («.) ""OB.Y END itEM Q X ICf5 AUTY

J. Sulablt Tm.z. '54L73 9..A ..ffl 6t.7s VI (CGatJ 1.20 FF-U68B falla 0 0 1. 20 D...W. by tea cOGIIter atopa aad 1. 20 No pulses for aubbit timer data

0 1 nbbtt timer atopa tlmlq Jlllbe• shift, modulator TT3YN, aa.cllrit 1 0 timer whea uormal or slow mode I 1 cOIIUDallda llll'e pvea

QQ FF-U7U lalla 1'0

0 0 ...

QQ FF -U74B faU.IJ 1 0 •

0 1 0 0

'· . ·Q a . FF-U75A lalla i'"O . .

0 1 . ·,

0 0

. . . Q.Q . . FF-U75B fai1a TO

0 1 ... .. 1 1 ..

54L73 g_§ .... . tL~- Vl ··-1. Zl FF-U74A falle 0 1 1.21 DMchbrtea~. Dl~by 1. 21 Pulse rate fOl' nbblt timer data 1 1 taD tutead oi br ... abUt, _..,ator awl b1t timer . ue iner.ued by factor of S for

. o a DOrm&! or dow mode C'ommaDds FF-U74B fai1a IT •

QQ FF -U75A faile IT

QQ FF-U75B faib -~ -J

-;;\ll'.!')i.)~!.'<:<l-1~,·

Page 24: ALSEP Array E - Digital Data Processor reliability and failure … · 2013-12-04 · ,--~a11paee f818nW~ \ ALBEP Array E - Digital Data Processor Reliability and Failure Mode1 Effects

. ptliltl:l'l ALSEP E ·r.~ ~TN950~l fHl>~Proeeaaor ~ I'IUo ,_ u -~46 I

FALURE MODE. EFFECT & C~TICALITY ANALYSIS ~ ~:.~~~o!t ~3=-4lf P'n:. n h7 no ,.J

'

'--~ • UF8:T OF FAILURE GeneJ;ator

~~ CRITIC- i FAILURE MOD£ ALITY i

S'IMICL («) ASSD&Y END ITEM -(fx.i[5 ' • .ou . 3.74 VI

1. Subbit Timer 54LOO (Coat) I. U Z-Inpat pte U10D falla-low 1. Z1 Divide bJ tea cOWiler (ES-1!'9) 1. ZZ No pulses for subblt tbr!er, data

U16 .tope dlvtc!bta bJ I 0 shift, modulator, ai1d bit timer

54LOO .ou 3..74 VI U77 1. 13 Z-Input pte U10D falla-hlch I. 23 Di-.ide by teD countu (E5-E9) 1. Z3 Night have error ill puhee for

Operates manually except 1:6, E7 aubbit timer, data shift, modulator. · alld E8 might not be reset properly and bit timer and caae aD error ill pu.lae rate I

S.LOf .(1, sao VI

1.24 Invener U67F falle-hlgh w low 1. U CCNDter ElO-EU etvpe divi4bta 1. U No pulses for subbit timer, data by •tcld shift, modulator alld bit timer

54L73 .iii . 41.09 VI QQ

1. 25 FF-U76A faUe i'"O I. 25 Counter EIO-EU atope 4ivlcUD& 1.25 No pubes for aubbit timer. data 0 l bJ'eipt shift, modulator and bit timer

- 0 0

QQ -FF-U76B~ 1 0

0 0

QQ ... FF-tr17A fille lO ..

0 l 0 0 - ..

~

QQ FF-U77B laUe '10

0 1 0 0 ..

u';~-,~"=:1=-='~ ~~- ·••''••~::'lllf)l~l;lil!tlol'll~''"'~:,:;;.t:($:';;:>:;1&~;~ ~·'ilt~~~::O'lll: ~ -! ~~ --~=L~_.: t2-

Page 25: ALSEP Array E - Digital Data Processor reliability and failure … · 2013-12-04 · ,--~a11paee f818nW~ \ ALBEP Array E - Digital Data Processor Reliability and Failure Mode1 Effects

1. Subblt Tbluar (Com)

p~~ ALSEP£ r~th ~~Proees801' pw&NO.

FALURE MODE. EFFECT & CRITICALITY ANALYSIS _, ~$'1' _--'XIl"fmin& • Control ~~u

FAI.URE MODE

--s41."73 ____ ·-g-kg-1. 26 FF-ut,6A lalla 1

FF-U16B lalla Q IQ 0 l l 1

FF-U17A lalla Q I Q I 1

rr-.unB falla a 1 a 1 l

(&l

.. 038

s.LZo .eu 1. 27 2 inpl.i 11id.a U7ZD fallii"Jov

54LZO .oil I, Z8 2 lnp1t gate U27D tan. hlp

.616 1. 29 eo-ter 54L93 U71A fa1b low

or JaJch

VfiiCT OF FAI.UR£ Word Generator

·-1. Z6 Coaater ElO..EU dlridee by 1

lutead of by elcJd

i. 2'1 Coluater 1:1 o-£13 stops dlvkte by elnt

1. 28. Coaater El O-E13 dlridee by t­but a mlss eouat mlaht cawae error

1. 29 Coaater E14 stops dlvi41Dtl by Z Uld lllow mode Io.es ita timb!g pubes •

! ~. ij i'• d

£NO ITEM

1. 26 Pulse rate for aubbit timer. data sbift0 modlllator aDd bit timer will IDcrease

1. 27 No pd:~es for sub-bit timer0 data shift. ~r aDI1 bit timer

1. 28 might have error in pqlsea for sub-bit

1. 29 No pulses for sub-bit timer0 data shift. modulator IUid bolt timer In slow mode COJDJDUid

~

'fi.wCJSo,_-Nzs d- 46

P"ffi 18/70

FM.UIE

·::':f" I =-11.85 VI

s.u-- VI

s.-~s· - 'VI

7 ... 'VI

f\ kt2:1o.~~·-<~~ • I i" ~~ vn= 1 I v !"'!""'W~~~ T,J ;v = l ._.,._..,._1/)

Page 26: ALSEP Array E - Digital Data Processor reliability and failure … · 2013-12-04 · ,--~a11paee f818nW~ \ ALBEP Array E - Digital Data Processor Reliability and Failure Mode1 Effects

.. . ~~lV' A' JCrP r ':t'~~ ~TM 950 fitlAo ' ~~~---~-.... ~..,~

PM£·26 elf 46

FALURE MODE. EFFECT & CRITICALITY ANALYSIS ~ ~- AM rn'ftt....t "'2349416 f'\11118/70

fMI'/CIMIOMENr EFnCT OF FAI.UR£ Word Generator · FAILURE CIUTIC-

FAIWRI. MODI . («) .

END ITEM ~~ AUTY ,.,., ':f :HtA..\U .oas 9.65 VI

z. Tlmlac ~· 1.! 3-bapat ... U78A tan.-Jow. hlp z. 1 Tlmtac pulse aeaerMor poae.a Z.l A) Data gate output OOYN, DGTYP Oeaerator DGYH, DGTYP, .FUN., J'HLZN, fail

aDd NFYN, AAL%P, ACLZP B) Fram marker outpu.ta, FMN, U78 FMLZN, NFIZN and NFYN fail U.79 C) Analog multiplex AALZA aDil U80 active sei:mlc cloak ALSEP out-U81 ptlta fall

...043 .f. a. VI ' 5tLM <

Z. Z JDverter U19A falla-low 1dp z.z ~ pulse aeDBrator !o••• z.z Timins pulse geuera.tor out-p&t DGTYP, FN.N, J'M.LZI', NHZH OOTYP, FMN,FhU.Z:to\ NF1ZN

. NFYN,AALZP,ACLZP NFYN, AALZP, ACLZP fail . SofLM 40io . s.4i· ·. VI

Z.3 berter.U81B fan. low Z.3 TbnUia palae 1-rator Joaa Z.3 Timblg pulse generator outpat - ntN I'MLZN FMN FMLZN fail

54lM ·~013 1.48 VI. Z.4 fmoerter UtflB fd.wp - Z.4 ~pulse g-rator outpllta Z.4 Fram marker Olltpt.ta l!'MJI aDd

FMN, FMLZN, ARS Gllllor aD. 90 FMLZN are on for all 90 -~ words iD a frame iDeta4 of for 1 in a frame instead of ~or 1 word word in each frame in each frame.

541.00 ·.~ s.oo VI z.s Z blpllt gate U80A fai1ll low z.s Timing pl!ae geaerMor OD&pv.ta z.s Fram marker outpt.ta l!'MJI,

FMN IUid FWLZN FMLZN '-11 .. · . .

MLOO .• 019 Z.16 ·.~ VI Z.6 Z taput pte U80A fan. hfcli 2.6 Timillc pulse g-rMor oa&puta Z.6 A) fram marker outpata_I"MN, ..

J'MN, FMLZN, NFIZN uad NFYN J'M.LZN fail fall B) 'JO fram marker outpota NFYN .

aDd NFYN '-11

Timing Pulse S4lM ·.030 l . 3.41-· .•. VI Generator Z.7 laverter USIA fai1a low Z.7 TimiDg puJ..e gesaerator loeea 2. 7 A) fram marker for multiplexer

FMLZN, NFlZN ud NFYN outputs FMLZN fails U50

' B} 90 !ram marker NF'IZN uad

U8Z NFYN fall USCJ -· ,,

SU-04 ,, ... ou 1.41l . VI

. 2.. 8 Inverter USIA fall• high , .. z, 8 timing pulse &••u~raw:r lew a. l. 8 !ram rnarke!' for multiplexer o~t-. ' FMLZN put FM.LZN :faU '

~~~.,_ ~· PI

Page 27: ALSEP Array E - Digital Data Processor reliability and failure … · 2013-12-04 · ,--~a11paee f818nW~ \ ALBEP Array E - Digital Data Processor Reliability and Failure Mode1 Effects

~ $1181.

l Ttmtaa PalM ~

FAUJRE MODE. EFFECT&. C~TICALITY ANALYSIS

FAIWR£ MODE (&)

54LO<I .~, 2 ·9 IDverter V81C Faile low or ldch

54LOO .tu z.IO Z-Input gate UBOD faDe low or hiP

~<!LQ.I --- ::046

£liFitr

ASSb&Y

z. 9 TimiJII pulse seaerator loeea FMLZN

2..10 'fimiDs pulaegeneratcw toe .. NFIZN &Del NFYN

OF

~iEMALSEPE ''1~~ flltugso ra' 46

END ITEM

2.9 Frame marker for multiplexer C!Qtplt FMLZN lalla

2..10 90 Frame marker CNtplte NFIZN aacl NFYNfail , '

4.88 VI

7.15 VI

2.11 Inv"zter USOE fail low or hlP I 2..11 Timing pulse generator loses IZ· 11 90 Frame marker output NFIZN faU~ 5;-U VI

'!llli'l7N

'

~4Ll~ ~ . 2. u 3 T~• te U78B fall! , 1-J.S. . z. U Timing pulae generator loses z. lZ Mt!ltiiorma.t coi!UlilD>nd actva. nee I 9. f2 I VI I

-"""'1"'- P . -or PCLYN a PCLYN £aU. ~ 54IM .. Oft! --- - 4. 88 Vx

2.13 IDverter U79B Jail low or ldgh 2.13 Timina pulee generator loses z.u a) 64 word interval output SIFYP

541.00 .406 2.14 Z-Input pte U~OB fall low or high

54LM Jmrerter· U81D fail low or hlp

~.15 54LOO .063

. 1 -Input pte UUA f:aU low or hiP

t.l6 54LZO -it~ 4~InpUt pte U59B fAillow.ol' hiP

I 54LM

SIFYP and AALZP aipab !ails . b) Analog multiplex adva&ce al-

2.14 Timing pules generator loe .. AALZPalpal

2.15 Tim~~~~ palee 1eaerator loaea HSLZH alpal

z. 16 Tlmiq pulse 1enerator loa .. ACLZP atalll&l

!alae information or faU.. &&:Jc9':t:

2.14 Analog m"Ultiplex advance output • AALZP Calla •

2.15 HousekeepiDg ahifl: to D/A eOIWI$dewj 011tput HSLZN fane

2.16 Active 11mamic clcclt omtput ACLZP f.aD.m

U.03 .VI

7.f5 VI

t

VI 11.96 ..

------- ~ I -----+-~ - I I -1 I l Inverter USIE la.U :a..- ..,.. Mn

I .106

l

.: ~ntro'l Logic. U83 U84

;t.l7 54LOO 11.) l-Input pte UBOE fail11 low or

high b) Ir.t.verter t181F fails low or hiszh

~ - .

54LOO •• J'i_, 3.1 Z-Input gate U83A !afls high j

54UO j 4-Ir.put gate U84A fail~ 1.,..

Z..l7 Timma pultoe ~~ loHs CWEZP

3.1 Timin& Pule~ generator ACJZN 11blye at 3. 5Z kHz

~. rr Active &r!emk ~::lock outpat CWEZP faihr

3. 1 Active ~teillmic: cloek output 111t:ay1t at 3. SZ kHz

1Z.03 VI

11.96 VI

l 54L()O . '. ·.,!)'}& I ~ 9. 03 I vi ! t'85 3. z z. <npu< gote US3A fail• ,_ 3. Z T!m!ngp"''' <•~••<~ AC:fZN 3. Z A,·~""'"""' d~k _,., •<ap 1 l "4:LZO 6tl!.ys at 10kHz, SBJYZi st<Ays .lit :o H!m · ! ;) z.a. !1 kHz ! ,..-

L~=·~~- 4-.!npu.t gatG US4A !ails hiP ~~---=~-~--- -·s~ ~ ••= _ L~_jl;>

·;

Page 28: ALSEP Array E - Digital Data Processor reliability and failure … · 2013-12-04 · ,--~a11paee f818nW~ \ ALBEP Array E - Digital Data Processor Reliability and Failure Mode1 Effects

~ ALSEPE "J'.~ 'fm!t~t . f'rTM 'l50~ ~ YJ.Il Processor~ ICJo .,_ zs"d' 46

;. FALURE MOO£, EFFECT &. CRITICALITY ANALYSIS .. . . lt::"J ... l~ t:'..,. ,..,." r"u,ano l ' I I I . . . . EFFECT· CW FAILURE FAILUIIII C:llmt:-

. I PR08A8tUTY ALITY Ox tcP

FAILURE MODI ... £NO ITEM («~ JiUU .U9

3.3 4-llap¢ pte 'OMB faUa low s Control Lope

54LOO Z.-Jupat pte UI3D f&Jls hish

54UO l098 3.4 4-Inpat pte UMB taU a hip·

54.1AO 2-IDpat pte UI3D lalh low

5·il.U ,159 3.5 a) F.F. U85A .• QQ .

faD.e 1 0

b) fane Q ~ 0 1 . .

e) fllU.a Q Q 1 1

d) falls Q Q l 0 0

~ .078 3.6 &) 2-btpat pte U8ZB taU. h.lp

b) Z -Jnpu.t pte USZB fe.lla low I

. 54L74 o a .. u.,-I ~.7 a} F. F. T185B

falls 0 1

S. S hbblt timH stays Ia alO. mode aUI S. S time

Timina pulse generator 0\ltputa datil shift (DSHYP), · HSLZN housekeepint ehift uui bit rata to m.odulator stay in elowmode

S.f Subblt timer .taya in aormal mode I 3.4 Timing pulse generator outputs data ucllhe time ~shift (mHYP). (HSLZN) housekeep

3.5 al SubhU timer etaya hi. aormal 3.5 %nOde aU the Ume

b) Subbit timer etaya m •low mode aD. the tbDe

I . . . c} hbbit ~ daya Ia aJDw mode

d) SQbblt timer ataya in DOrmal I mode

3.6 a) Subblt timer for LSPE expert- 3.6 meDt wUl DOt go from normal mocle to slow~

b) Subbit tlsner hae output o! 1 kHz or 540 1tHJ: for data shift for all operating modea:

3.7 !i) 5-.:.bbit thner will at:o:.y in no~'lT.al 3.7 :rn.t.1-~e w;.-tt-,en you corro..zn.ai~d e lew rn.ode for no1rrna.l mode s.r"d eif.l;W

mode get wrong data ahlit wig.

ing shift and bit ratS to modul&tor stay in normal mode

a) 'riming pulse generator ou~a stay in normal mocle

b) Timing pulse generator outpot stay in dow mode

c) Timing pulse generator oatput stay in slow mode bat c011trol word gen. will say data proc:-es sor ill in nonnal and alcnr mod

d) Timins pulse generator output

I

stay in normal mode bQt_ coat.roll word generator wiD. say data processor ia not In mormal ~ or slow mode

a) Timing pulse generator output in I LSPE experiment (ACJYN) will not go from normal moqe to slolll mode

b) Timing pulse generator's data shift pulses are in error for LSPE and active ae:ixmic u:peri mente

~) Tlm.ing p<llee IS"'"'"""a.to;r's out-put I DSHYP, HSLZN ~;4><'!W&tcr dock will be &t %Y'T~.SJJ Fate in ~IM!

u.96 VI

9.08 I VI

1«7-t .. ,

I VI

'

;

-·-7:23;

I V1 ;

r4.73 I I VI

·~*=~:.';l!,;.•\:;.~,~~~1\!~ liO: :1"<~\l'~~~··:t&~~ -::-~-~~·"~-=~ l!!ll.d8!~~- j 1!6

Page 29: ALSEP Array E - Digital Data Processor reliability and failure … · 2013-12-04 · ,--~a11paee f818nW~ \ ALBEP Array E - Digital Data Processor Reliability and Failure Mode1 Effects

Proc:eaaor , - ,:Q of' 46 rALSEU ~--- ~-~oJ~:..

-~~~c~ ']["j I -~ I FAIJJRE- I ·-~., FA~-= . ,I ~LW· -=~-' $MilL («) AHg!LY --, 1 \ £NO ITEM . _:-+ 9 x ;r AUT

FALURE MOD£~ EFFECT & CRITICALITY ANAl-YSIS

!

I

s.7 b) 54L7o& F.F. U85B

e)

cl)

lalla ~~~

fai1a

~

lalla .,QJA' 010

54LOO •• 076 3.8 a) Z-Inpat pte U83B faf:Ja hlch

b) fails low

54LOC .t.076 3.9 a) Z-Input sate U83C fa.U. hlp

b) failelow

3.7 b) &birlt timer LSP willaot at..;tt tel alow mode eel LSP aDd ac:tm aelamlc experlmellte wU1 have wr~ data ehlft pulses. allll modulator clock frequency

c) Subbit timer LSP experimellt command will JlOt go mto ita alow mode allll normal aad •low modes will have wr011g pulae rate for data shift pulses, and moclnlator clock frequ-ey

4) Suh'blt timer will not shift from llOrmt!ll to alow mode rate

3.7

3.8 11.) Su'bb1t ftmer will not ahlft from 1.:0 8 aormal mocle to a low moc1e ..,

... b) Subbit timer will not shift from

· si- mode to nonnal mode

b) Timing pulse geaeratou Olttput DSAYP, HSLZN, modullil 1' doc: will be at wrong rata ;=" aa.l active aeismic exper ·'"' .--1t com­maDe!

c) Timing pulse gen·era.tora output DSHYP, HSLZN, modulator c:locl will be at wronr ···.:,\e !;,r ~ru.l and slow rna ·'

d) Timing yulee g~nerator output DSHYP, HSLZN. u~OOuhtor c:loC will be at wrong rate for LSP IIDC active eeismic ~riment com­ma~:<ds.

a) Timin& pulse generator output DSHYP, HSLZN, modulator c:loc:' will be a.t wrcms rate lor slow mode comtnand

b) Timinr _;;ulae benerator outputs DSH' .', HSLZN, modulator cloc ...

1.0-&c VI

I ·rill \::.,; at wrong rate for normal f --- - ---1~-~ ·t I i

3.9 a} SWJ.bit timer hae wrong output J ~.9 · a) Timing pulse geJWra.t;::;:· outp•lt.~< ' ?.04

VI for LSP and active seihmi· f DSHYF .. HSLZN. mr .,;,·. -.40.:i experiment• will bt at wrong ra' (, (:_: P <UI(

b) Subbit n;:n- • haa 'ln'Ol:oi output for nc;ma.L !!.nd alo-w modee

active r;eismic ""[,' i;-neu;;t:

b) : irr.ir . ., :.lfl • gent -"tor" output DSHYF, HSLZN, t 1~••lator cloc: ~rill b~ at "~,rro . .::g rat.. ·.n· normal

·.:: 2lo¥;· mfY.ie co!~tnl.. "1Js.

L __ I --- • .......__,~ --------------~·~.,.,_,.~r,:"t.'}~~~

17

Page 30: ALSEP Array E - Digital Data Processor reliability and failure … · 2013-12-04 · ,--~a11paee f818nW~ \ ALBEP Array E - Digital Data Processor Reliability and Failure Mode1 Effects

..

::---·· ...... ;..

IMTJ'CDIPMWr .... .:u.aiDI=' MODE. EFFECT&. CRITICALITY ANALYSIS

FAILURE MODE C«) A$$DIIky

IFFECT OF

• • ,. ; .

~J.LSEPE ~~M9SofB'"

~·;;~~~ 46 ·· Timi ·y 1 "\V n.'!!. 1"'.-... t /11 hJ

MtWR£ ~ FAII.URE I amc-EIID ITEM ~ ?x~ ALITY

• Fnm Coaatlu uso

4 1 54LOf • llwerter USOC taUs lOW'

llwerter USOD taUs 1cnr

.• 05SJ4.1 Frame couter etay ruet ud framel4. 1 Frame COWiler stops cOWitf.Dg &1111 fume cOWiter atopa cOIIIIItblc . · mode selection (3 worcl10 diBit) etay1

ill last nate

6.87 VI

54L04 ~.z llwerter U50C faU8 hlp

llwerter USO.D fdla htp

54L73 U56 J&.s F. F. US6A

54L73

QQ ftilla 1 0

1 1

"·4 F.F. U56A . Q Q

j4.s 54L73

F.F. US6B

falls 0 1 0 0

fails QQ 0 1 1 0 0 0

•• oZ4

.05'

••• 059

•• ua

4.Z Frame cOQIIter will oat reset after r·z Control WO!?d generator wU1 have 90th frame -wroua frame smmt after 90th -I'd

4. 3 Frame c~er 11topl ·e~

4.4 Fnm8 cowder stop• ~

·14· 3 Coni:;rol word generator stope pro­ducing control worde. event frame marker counte Z times u laat

j4. 4 Control word goane~rator lltope pro­du:cfns c:ozmool worclll. tnreat frame marker l!lt<lps

- I L 4. 5 . Frame coater ~ coaDtlDc Ia u r· 5 Coatrol word Jf!Minlor haa wr0111

frame cOIU:It •7th dJsib

3.00 VI

7.S7 VI

'1.37 VI

14.74 vi

1 1

· .. ual ""' I ~·~ I 1-1.74 i VI I 115'1 I S.o..'IS

1"·6 F.F. U57A • Q Q !alb (I l

1 c () (I

4.6 ~ com~ter tltopv ~ m !d - 7th lli8it&

j4.6 Colti>Uol word fi~~llltor U. 'llrii'OIIi frame count ·

!---·-~~-~- 1 1 _. nal i · . I 14. 74 f vz I

S4.L13 jf.? F. F. U57B

faJle QQ 0 1 1 0 0 0

4. 7 Frrune co.;mter ll'i.:t~pe: c~bJg· in 4th - 1th digit"

,.

4. 1 Comrol word generator Mil 'lln'O!Ig fran:;,® cowrt

- 18 ---~- ~-~·.,-~--~"···---·-- ~ t 1 1 • . ~M ~ U58 54L73 ' · .8 F.'§". U5SA Q Q , , ·i, 8 Frame Counter e~ope c;:r.w.t~.:g in 4. 8 Cout~ol 'l'i<:><'d i"'"'"N'tcJ< has wrong J

!aile 0 1 ' . 5th - 7th di&ita {~£me cov.$ 1 0 0 0 ~

~-·a " .J. ~- ~ 1 ~=-·-n~~,e._.,..--~=~·...... ~~ •1ft

,!"\

~-~

·! I. '

Page 31: ALSEP Array E - Digital Data Processor reliability and failure … · 2013-12-04 · ,--~a11paee f818nW~ \ ALBEP Array E - Digital Data Processor Reliability and Failure Mode1 Effects

i

I ' ~lalf:" ALSKP E 7.u.- ~M950~ i

i ~.~. Proceea01r DMiJV. ._.,t·~ 46 ~

FALURE MOD£. EFFECT & CRITICALITY ANALYSIS . X. ~:r.:;.~~ p!I'Rt JUo n *•6 . 1 :CI'71

fMI'faM"'NENT lfFieT OF FAII..URI ~~ ClllTie-FAIL.URl MODE AUTY .. -- (Gt) ..... ,;._ .. END IT£M ·a·x~· .

4 Fram Coate~' 4.9 541.73 ' .118 4.9 Frame c_.er .stope cOIIIItbls iD .. , Control word 1enerator hal!l wrcms 14.74 VI F.F. t158B.. .g.l, 6tll - 7th cHpta frame couat I fai1e 0 1

1 0 . .0 0 1 1

54L'IS .118 14.:74, VI

4.10 ;'.1t'. U47B Q J. 4.10 Frame cOIIDter t1topa c~ iD. 4.10 Control word generator has wrOJI8 fall• 'i 1 7tll cJ1Pt &amecoaat

I l 0 0 0 1 1

. .

MUO . ,..u:;a ?'~~ ,VJ

I t146G 4.11 Z-JDpul pte U46G t&lb JUab. low 4.11 J)vul frUM marker etcpB working 4.11 EveDt frame marker atopa 'IIIOddDc : I . (Enml) (EFMTN) I

J

. 4.12 . rx-rter USOB tan. bip. low • !Jlf ,.: 1Z Col!.trol word geherator has WH1fC

4.87 •: Vi 1 U50B 4.ll Frame counter lltop ~ worda

i s c-trol w.-. 54LIO ..t040 13.48 VI

i Genen.tOir 5.1 3-hlput gate U64A falls hiP 5.1 ~ror 1D -rmal •fee4 commalld lD 5.1 Control word generator 3-word 10 I UMA loir coatrol word 1_eaerator digit mode selection wfll be Ia errol ' I 541.04 for normal speed coJ'DIIIUIIl

i U45Il ~er 045D fal1e hlch or low i .040 13.48: I 54Ll0

•. VI i .

OMB s.z 3-l:npat gate 064B taU. high or 1- 5.2 ·• Error ill slow speed cCIIW:II8.J!Id iD s.z Coatrol word generator 3-word 10

54L04 ccatrolword .~ <;Ugit m.ode seleetion will be ill error

U45E mverter U45E fails hip or low for 1'!0\IV speed con~

54Ll0 .106 l5. 73- VI

U66A 5.3 3-ID.pat gate U66A falls high or low S.l Error in normal speed c~nd in 5.3 Conl:x-ol word generator 3-worc! 10 - !

-U66B " rr U66B " " r conb'~:>l word f<P-Iler&tor digit mode 11election will be in errol -·""·

"J46D " II U46D " " " U66C " II U66C " II " ' 1:.

t-~ ·---·-"""";'HZ - "'3'17'7!>--HLlC ''

I

-:J64C 5.4 l-!zipnt .Cau U64C f&!le high or' low 5.4 Ei·ror m 4H".O"!.t.ll:'JU>:~h<i:11' com.- 5.4 Cont.-ol w<:tzd gcnerat<>r 3-wo?a ~~ . U65A .. .. U6SA " If " m<U:i:d in control woYd <?flt~el!';otor digit moo~ liieleet!on will be in euo

-~~5B " .. ?r!~~ " If .. "' i@r ~>erial nu:mb&r

;o;r. .. .. " " " ..., l't

~"""-7;:)'-,.""""-"""'~"''"""'-"-'"'""'.:::..""""''""" - ~ - ··-

Page 32: ALSEP Array E - Digital Data Processor reliability and failure … · 2013-12-04 · ,--~a11paee f818nW~ \ ALBEP Array E - Digital Data Processor Reliability and Failure Mode1 Effects

. ~t:tftllll AlBEP E ... 'T.tj. 'lmltla rlTM 9so ft.Y. ~Proceaaor p!.IKj IG.

~nor 46.

FALURE MODE. EFFECT & CRITICALITY ANALYSIS t ~! -~~.t·Q! .... pll& J«). 7344341 6 ~1/~/71 . fMI'/CII4PCH!Rf IIFICT OF FAILURE ~ MU.U. 'CRITic:-

J FAIWM MOK ~:r ' ~ (Gt) ...... - .. AUTY END ITEM

5 CoDtrol won 54LOO ~-0541 18.20 VI a-raw U59A 5.5 4-Inpat Gate U59A faJla hlP or low 5.5 Error ba 3-word 10 dfclt mode 5.5 Control word generator 3-word 10

54 !.0f a elect'- digit mode selection will be ill error

! i Iuverter Uf!SC falle hlP or low

t 54Ll0 .. us 46.51 VI

• U60A 5.6 3-hlput Gate U60A flf.ila htp or low 5.6 l:rrw ba fraale c:OWlt S-word dijita 5.6 Control word generator frame c:OWlt

i U61A II II U61A .. .. " 6-9 ill c:~ol word seoentor 3-word dla!tm 6-9 wU1 be ill error ' U6ZA " II U6ZA .. " ..

541.00 U63A 4-l:up1t Gate U63A .. " II

\

. 54L04 ' unc IDnrter US3C l.alle hiP or low

54Ll0 .-ua 46.52 VI . 5.7 3-l!aput gate U6ZB faJlaldp or low s. 1 . Zrror ill fnme c:oui 3-wwd digits 5.'1' Control word generat. &am. COQid U6ZB

U6lC II .. U6ZC " II .. J-5 Ia COl!itrol 801'4' cenerator 3-word d!glta 3-5 w'.U be In error -. U61C .. II U61C II " "

54LZO· U63B 4-Jnput pte U6)B II .. "

54L04 ··-U53D 6-Iawerter U53D faile high or low

,. -, OZ8 54Ll0 - 9.44 .. - -VI I

UMC s.e 3.-hqmt gate U60C fail<! blsh OJC low s. 8 ·'Error !n ccm.t!rol word gener!l.tor 5,8 Cont:o-ol word genliu·ator mode ._ .... ,

I $-word, HI~ f.l_election 3-word. lC digit will be in error

-~- - ·--S4LOO • 02.1 . 1.08 Vl I

'('::<:.c 5.9 Z-~ gate U5ZC fall& high vt low S.'J .i:rl!"or ia eon~rol wo~d generator 5.~ Conl:'l:'C•l ""'r.d generator mode - I

I 3-word, l-Z digit& eeledion 3-word, l-l digit!! will

-· .. be in ew?or I

I

I -r

i l '

"'-~~WI~'""•'~ol,.l\l;i:;.~~·- .....:<m--='lo:.~WJii:Ul:Oii iS>;O::;om 'WVFW"'*'= . ·;( .. __J lf"~~ll -' ~~-~ ..

20

Page 33: ALSEP Array E - Digital Data Processor reliability and failure … · 2013-12-04 · ,--~a11paee f818nW~ \ ALBEP Array E - Digital Data Processor Reliability and Failure Mode1 Effects

::'t

l , . O>~la. AI.BEP 1: ·-i:a:' ~ ~M 950 ~ , . fJC11lll: P.roceesor I.IIII(J ..,. ~ 33 d 46

r FALURE MOD£. EFFECT & CRITICALITY ANALYSIS · lSc ~:i"J..l~~ ~ I\Uo2]4~4~ 6 P"~ 1 r4171

FMf~ UFKT fW FAilURE FAII..U'RI! CRmC-Sl'Pm. FAILURE MODE («.) A5S!MIIILY END ITEM ~ AUTY

5 ~ol 'Wort 54L10 • «.1 • 2~ 56 VI . GeMrator U60B 5.10 3-IDput 1ate Ut.oB laJh hlp or 1- 5.10 Error Ia coatrol worclseauator 5.10 Control worclaenerator mode

54LOO S-WOJrcl eeloction 3-word wW be ba enw

USZD Z-Input 1ate USZD " " "

54~

t153A Iuverter USSA fa1la -~ 01' 1-

.0U 4.05 VI 54LM • ..

U53E 5.11 Inverter U53D faD.II hiP w low 5. U ·S-word wUl be Ia errw from cODtrc 5.11 Control word geaerata 3-won oatp ~ ~4 a•erator will bi!! lD error to rmaltlfo:rmat com

mutistor (THRZN) ·.

~--------5-4-LOO------------------~-~~r-----------------------------~-------- ~65· • vr'· USlA 5.12 Z-Izput pte USIA laAa hiP w low 5.1J 1-worcl wW be Ia enor floom s. U Conttolword generator 1-•.worcl out-USZA " " USU • • • coatrol W0&'41&eillill'ator put wfll be in error US2.B " " USZB " " " • usu " .. U54A .. .. •

I 541.04 ... ou cos VI ti'53A 5.13 ~r USSA a) failalow 5.13 a) 1-S wwct w11l be Ia enor S. 13 a} CODtrot WOI!"d renerator 1-S von!

b) lalla IIJp 1») 1-wwc! wm be b\411'1'01' will be m error •·• h) Co!!'t%:rolli'O!'c! ~~ 1-~

will 'be ill. ~rror . ~•.&NV -.085 ~ · JL65 VI

U51B 5.14 Z-IIIput pte USlB fal1a hfP or low 5.14 1-wort wiJ1 lao lil ..--r ~OIB ~~ 5.1'!§ Control wor<l I'"'~ Z-worct wiD · -. us1c · " " o~nc " • " .-•s-rataar · 11e in erltO!l' • U51D " " USID " n •• '· use " " use " .. • · ·

=-=---------------------~---------+----~ S4L04 ·• OU . 4. 05 Vl

U53B 5.15 Invener USlB a) tan.~ 5.15 a') 1-S wore! wilt be Ia •~ 5.15 ~l CI).:W:a-ol \!V~Grd g-rator 1-3 ._rd .... b) 1ill.!la htp b) Z-'W'IWcl wU1 be Ia error will be w ~rror

'b} Comroi w'Qrd goeii.erator Z-WOI'I!! will he in errow

~i.L!6 • OUl ~- '----------· 'j. 4-4 VI 'J'Sr>B s.u, 3-InpW; zate U55B !aib htgh or~ S.16 1-3 -rd will be in uror 5.16 Cof.i.trol w;::;rd genu&tor 1-l Wl)Z'ci ~ . .' wHl be ln error "' r---- - --+--· -.....-4-------~---~-----:---····-.. ··------... -......... _. ____________ ~·-- ...... _. ___ .... __ ....... ---·-·--

~- ;I· ~" n HLHI ~ · US5A 5.17 3-!l'llW-t gate U55.A faih high or M>w S,l'l Proouo:j;ot 1·3 word comrr.a'nt!c to 5 .. !7 Contn:;l wc.rd generator O!l~put c4 ·

mcdu~t~r w!U be !!:l er-ror jH'.Oifuct of 1-3 word eorr~i!ldlll to J nu>dulatoll' will be in eri'Ol'

-~,J.:,_;,".:.-:.~·~=-r~~ ~~=- t ,;~,~~.-b~~~~~~~~:;;AJ i'¥:'!11'=~----...o!!.-----.....a-...... __ ...... 2.[

Page 34: ALSEP Array E - Digital Data Processor reliability and failure … · 2013-12-04 · ,--~a11paee f818nW~ \ ALBEP Array E - Digital Data Processor Reliability and Failure Mode1 Effects

... 6.2

6.S

FAIWRE MaDE

1Jf5A ,6.1 Jlmmers u.S. fall low or hiP. tHSB " U45B " n "

54!.00

'· 2 1-J:a.pat pU. t14.6A lalla hiP

V41AI 6.3 a) F.F. u•TA ill falls 0 0

0 l 1 0 1 1

VcaA

U48B

tWJA

'0'49B

F.F. U41A Q'Q lalla 1 0 0 0

!'.F. ir48B falb

F.F. U49A faib

ill 1 0

ill-1 (I

F. F. U49B w-faU:e 1 0

0 1 lp

Bit timer haa uror ID cC~~&~~t~Dt 6. 1 Collh'ol word generator has enor ID output due to bit ttmer tlmbtt pulse IODerator outputa DGTYM. OOTYP. FMZTN. PCLYN are 1D

MJPt c:aue error m blt_ timer tl I 6. Z Control word senerato:r might ha.,. U48A. U48B. U49A fUp 1JGp do Dot error reset

6. S a) Dlvlde bJ teD couuter stope and bit timer lltopa tlmlDi pal•••

·--

-

6.3 a} Bit timer stops opentmc encl (BPIZP) bit period of bit timer and control word generator stop operat~Dt

VI

.16 VI

7L57 VI

,~.....,""'' I 1

- I , I j l )'2.,_ .tt t . as n :u ~.,......,... ... ~ ~ ..... ~~- ,JL &J $.1111

t ' .

Page 35: ALSEP Array E - Digital Data Processor reliability and failure … · 2013-12-04 · ,--~a11paee f818nW~ \ ALBEP Array E - Digital Data Processor Reliability and Failure Mode1 Effects

'

ill~

l''

7.1 e.) Z-Japat pte fall§ 10ilW

b) Z-Input gat.e falls high ~ t· .. 'l •

·.-06i 7.1 a.) ~~l!' lomas active seia:mic

data and all other l!erill.l da~ fa'-. experit:m!>nta

b; Modulator lose11 a.etive sei•nni<:: data

1.1 a) Modulator outputs T.AK, T:BK. TCK lose active seismic data and all other serial d!!.t& !rom ~er l.menl:e

b} ML.Juli.U.c vl.dy>!.t TAK, TBK. TCK l.DBi! active seis:mlc d~

?:13

VI

_Vl ~

VI

'· ~·.

~ ..... ~ .• ~filo=:r:t>:<'lltmow- ._ ... ..J ~:: h::;:;a:a I ±iOIIl;:o!;II<AW "'"m;:snra att-.:;~J ~""" ~,..,. ,

4_ ) ~_/;

t 4 "

Page 36: ALSEP Array E - Digital Data Processor reliability and failure … · 2013-12-04 · ,--~a11paee f818nW~ \ ALBEP Array E - Digital Data Processor Reliability and Failure Mode1 Effects

1 No4lu1atiOI'

.!

. . f'J_../

FALURE MODE. EFFECT&. CRITICALITY ANALYSIS

MI.URE MODE lflllln cw FAI.Qftl . I '"....._ I aune-PROBA.BiLtTY MJTY

END ITDI . Q x tcP • («l ASSD&.Y 541.00 -063

UUD 17.1 1-lapat pte lalla low or hiP I 7.1 Y.ohlator loMe adhe aetamie dabll7.1 alll1 aD, edler aerial data from apeif.. meats

Moclulator outputs TAK. TBK,. TCK lose active seismic data aDd all other aeriel data from a:perimeah

54134 UUA 1.7.3 F.:F. '08U. faBa~

hiP :t~ low

5~

UI6A I 7. • a) lDYerter b11s low

V86BI b) hw~ fliUitf hiP .

iii:iii '054CI 7.5 a} z:.Iapat pta .U. lCiw

b) 1-hlput pte faila Mch .

~,, .. 541.00 a} z-lnpat pte tan. hiP

.. ue

... 016

....ot.3

.. 063

7.3 Nodu1&tor lone active seiomlc da,7.3 ModuJator ~TAX. TBK. TCK aDd aU other serial data from lose active seismic date aDd an u:perlmerd:s other aerial data fr0111 uperlmellh

7.4 a) ModWator loaea active seismic: clata aJlC1 an otber IICll'!al flat& from expertmellta

b) Yo&slatOl' wiD. have euora !II. • cc.trol -rcl data if serial.blpat

clata la preaeme4 aiD:lalta!l~

7.5 a) modDJ&tor loaea ancfata

•.. b) mocl11Jator loses cODtrol .WOrd

aenerator ••

7.6 a) YA:Miul•tor loses aerial data from. experiments

1. 4 a) Modulator output. T AI<. TBK, TCK lose active aelamtc data lUll an other serial data from experi. meat

b) Modulator outputs TAlC 1-BK. TCK will have errlwa ill c:oatrol -rd cJata if aeriel blpat data le presel!ted •ilmdtaD-.ly

7. 5 a) modulator output TAK. TBK,. TCK loses all data

b) Modulator output8 TAX. TBK,. TCK lose c:o.Eitrol !fOI'claeeeratol data

1. 6 "i Modu.altor 0\llputll TAK, TBK,. TCK lose aerial data from ~el"imenl:lt

bl l-Inpat pte fans low b) Modulator l.ose;m all «<&ta I b) Modulator outpgU TAK. TBK.

t------------------1--------~ _ TCK lose aU data 54LOO .• 063 ---· -

U87A 7.7 z .. Input gate fails low, hi; S4L74 1

US&B 7. 8 F. F. U88B Q Q

1 D. 0 f

7. 7 ModulatOr losee all. data

.130 7. 8 Mooulator lose& all d.Ma

7.7

7.8

Mo<!ula.tor ontputa T AK, . TBK. TCK' lose all data

Mc<lulator <Outpa.ts TAX. TBK, 1'CI( !o:;e all d.:tta

7.13

14.71

5.11

·.

-=-.. -

7~.U

1:.u

7.U

14.71

I

I I

.

VI

I VI

vi

-

-VI

vr

.Vl

VI

L__j_ -- ~.! _ L ·-··- ,_J . 2'(

Page 37: ALSEP Array E - Digital Data Processor reliability and failure … · 2013-12-04 · ,--~a11paee f818nW~ \ ALBEP Array E - Digital Data Processor Reliability and Failure Mode1 Effects

. .

· EFFECT & CRITICAL!TY ANALYSIS x IM'I'~ FAI1.UR£ MODE URn fw FALUR£ CRmt-

SMa. ASSDa.Y • £NO ITEM AUTY

~ I 54LOO •• 063 • VI 'U87B ?.9 a) 2-blput sate t&nal- 7.9 a) ~tor loeea aU data ?.9 a) Modulator OGtpat T.Al<. TBX. TCI

loae all data •

b) 2-lnput aate tana btp I b) Mocll.dator loaea all data 111hlch I b) Modulator oalput TAX. TBK. le lotlf.c:al aen . TCK loae aU data wblcb le loika.

;ero I S4LOO •• oul . 1 . t:u 1 VI

uaTC I 7.10 a) 2-Wpu.t sate falle low 7.10 a) Moclu.Jator luen l!ll data 7.10 a) modulator output TAK. TBX. • TCK loee aU data

b) 2-Input ff&te faDe hiP I b) Ko4alator loaee aU dtota wblcll b) Modulator output T.AK. TBJC. le lopcalGae TCK loee an data wiU.c:b le I I >

logical one

tJ87DI 7:~11 z-~!':te laUe JdP. ~o~r· .ld63 7.11 Yodu1ator looee aU :w. ?. 11 Modulator wtput TAX. TBK, T~ I ?; 13 ~---~

loee all data 541..04 • N6 • I r.'..2.1" I --

'U86F I 7.12 J!mlrter tana Jd&b,. low 7. lZ Moclalator loeee TCK OQtpat dMa 7. lZ Modulator oatpat TCK fatte- 1Hee . VI an data

54L04 .. 046 • I 5.-.21 I VJ U86EI ?.lS I:averter fai1a tdp. low 7. U Modalator loette TBK. TCK Old:pllt 7.13 Modulator Old:pl&te TBK. TCK loee

data all data 5ft.o-i- ,,;, 046 .• . I s;. Zl I VI

U86DI 7. 14 Invertell' fall• high. low 7. 14 Modulator lOMe TAX Ol1tpt data 7.14 MC>dulator output TAK loeee all clata

• . -~~.,... .

U'!!JAI 7.15 }'.of'. a'ailB ill 7.15 ~.deaee an Uta 7.IS Mooulato~.output TAK., l'BK. TCK I 14• ?l I VI

lou:-all data 1 1 0 I v

~ I·J

:· ~ JI'S'l.Jt

·.~.:;;~.~,,-,..,,r.· ... ~·c>""-'""-~""""'".._.~dll;;;--m;;"'l'>W~ .• ~~'-L-Y.l:.':.I"'-<O'.m"2<:.!-~~~,.~,.,.~~w; 11&4 a· ~~ )(

Page 38: ALSEP Array E - Digital Data Processor reliability and failure … · 2013-12-04 · ,--~a11paee f818nW~ \ ALBEP Array E - Digital Data Processor Reliability and Failure Mode1 Effects

I. l t l i : ! j ~ . ; . t ; 1 I! I I I f ; I

t i •

' i l

. I

~srtla r~~E!»E ~':!"Proee .. or

~...,.. [ffM950~

FALURE MODE •. EFFECT & CRITICALITY ANAL-cs~S ~'Y X·e&I'CI 'C-6.--·--~ modal• pw6Jft456

PA6£ '' or _A FJ"rf. I 122171

IMf/tiJRIBIF .... FAa..u. MODI

llltelface....... · UIM 1.1 Ul 11. I lllvener

A) Ul-A J'alle

8) Ul-B "

C) Ul-C II

D) Ul-D n

E) UI-E .. F) Ul-F •

G) Ul-A J'alle .

B) JJl-B " I) UI-C " J} Ul-D " IC} Ol-E "

').

Ll Ul-F "

1 UFRT OF FAILURE

1 FAll...URE 1 amc:-

(&) . MS;ILY I END ITEM ~ AUTY

.. -. 'lo. )0 1.1

HIP I A) Lose frame mark-B •lt-1 with +5YX SupplJ'

I. I A) (I'MBZP) Frame mark B aipalis

loat whee X Interface module ia Oil

VI

"

"

"

..

" •

Lair

" .. "

"

"

B) i.e.. frame mark-C alpal wltla +5YX &applJ'

C) Loaa frame Mark-:b alpal with +5YX wpplf •·

D) Lose frame Mark-£ alpal with +5YX supply

E) X.O.a frame Mark-O efpal vt.a +5YX -pply

F) W.e 90th frame -o atpal wl.tla +SVX aupply ·

B) (FMCZP) Frame mark C aipalloet wh- X Interlace module boa

C) (FMDZP) Signalle loat aame aa A

D) (FMEZP) Sigut ia loot same aa A

E) (FMEZP) Sigut ht !oat same u A

F) (NFaZP) Sipalla loot aame aa A

G) I. Lo .. frame marker-B •ia-1 l G) with +SYX or +VY If Ul-A alalt-

1. (FMBZP) Slpal wUh +SVX or +SVY faila if Ul-A ·ablkblg tnu­lstor tans mortM IDs tranabtor ~ila aborted

Z. Loae frame marbr-B alJaal with +SVX U Ul-A aiaklq Uau• iator1a drive circ:ult lalla c-•iltc ef.nkiBc trlliUtiator to atay ill aero c~itiOil aa 1oac ae SVX b applied

H} &une •• G) with UI-B

I)

;J)

iC)

L)

" " a} " Ul-C

" " 0) " Ol-D

" II a) It UI-E

" n G) " Ul-F

Z. (FMBZP) Signal wltla +SVX faU. lf Ul-A •bakiDc tnuiator'a driYe circuit fails causing ainkiltc-tna­•l•tor to stay iu. 0 coadltion a• Joaa as X haterfac:e module· i8 Oil

H) (FMCZP) Signal fail• same u a

I)

J)

K)

Ll

(FMDZP) Signal faila same as a

!FMEZP) Signal fails eame as a

tFMGZP) Signal fails same aa 0

(NFGZP) Signal h ile a10m'" u G

·-·

_/

L._ . l_. _ _ I_ _ . _ J I I~~ I

Page 39: ALSEP Array E - Digital Data Processor reliability and failure … · 2013-12-04 · ,--~a11paee f818nW~ \ ALBEP Array E - Digital Data Processor Reliability and Failure Mode1 Effects

i. ! I

I I

' . 1.1

. t t . ' ' j i ' f ; i I $.

I

; f I ! i J ~ . I ~ ~ l

I =

I !

Ul

~lUll ALSEPE_

F"8ar:!"PI'oc•anr :r.G~•

fiiiiiii'IU• IA~N950 r-~9~af .46

FALURE MODE. EFFECT & C~TICALITY ANAU'SIS · ~~·y X·Card · Interlace MOilttl. P"':,..- ~J}U/71

FAIWM MODE

I. 2 541..04 IPel'tel" A) Ul-A . Falla

B) Ul-B "

C) Ul-C .. D) Ul-D "

E) UJ-"E .. FJ U3-1' It

aJ-- UJ-A • I' alb

B) 03-B II

!} · U3-C .. .n 03-D " K) U3-E II

I liiPII:T OP MI.URI. i FAILURE c•l ASSD&Y I . oo •mc _ ~.~· ·

1.1 1. 2 .., I' I 30.10 Rtp A) Loae data de-.1 U•-B elpal A) (DDBZP) Data demand a \pal wtdl

"

"

... "

.. Lew

n

.. " ..

wt• +SVX eupplr +SVX npplJ le lollt

BJ · Loee Data de mud llced elpal wuta +VXeupplr

C) Lon clata demanct u--E atpal with +5V:X nppir

D) Loee clata demand ll11e-G elpal willa +SVX eupplr

E) Loee data clemallll U..-F a.,_l wi• +SVX eapply

F) Loee -90th &om -C etPat with +5VX eupply ·

G) 1. Lose data demucl U..-B wuta +SVX or +5VY If Ul-A •~iDI tra•letor lalla ahorted Z. '--• data demaad Uu-B •It· -.1 wttb. +5VX lf Ul-A ef.aldac tr-fliator'e drive drealt lalla caUIIIQaa eillkiuc tramsl.etor: to eta)'

la !leJ't!> eomUtl- u 1ofta ae 5VX '" ia appti.ed. ..

H) Sa- u 0) with U3-B

I} &me a• G) with Cl-C

.T) &me ae G} witb U3-D

K} &me ~m G) with t!3-.E

B) (DDDZP) Sis•l te lo.t lib A)

C) (DDEZP) Signal ie lost like A)

D) (DOOZP) Stgaal Ia lost like A)

E) (DDFZP) Siii!alla lollt IDle A)

F) (NFCZP) StiDal l• loet. ~ A)

G) 1. (DDBZPJ Data dem&Dd slpalwtfa +SVX or +5VY !aile tf Ul-A

. 11la1dag traJUJLaltor faiJ.a Uortecl Z. (DDBZ~} Sipal with. +5VX lalla lf U3-A ein'!r.inS tli'6Uiator'e clriYe c:irc:nl~ !ail$ .:auciq aillkiaa tnD­ei.stor to flt&y ln sero ccmditl- ae long &IJ X iute!'face mochllo li. -.

B) (DDDZPi Sltloo.l fails mam.e lUI G)

I1 CDDEZP) Sipal faits lllame a. 0)

J} {DDGZP} Slgftll.l fa ill; same 11.11 G)

K} (DDFZP) Sl&wal kib same lUI G}

CRfT'IC­AUn

VI

___ ·--- ----+~----~-~s ---~~ .. ~-~=·--~~~--J-~~~~---~;; :~~~c sig~l -~th --~~L~l-~~FC~~~-~~~:~-~~ ume u G) ---~~~30, 301- VI '··OM

1 ~ '0'4 l. 3 SH .. .04 mve!t'ter 1. 3 l. 3 ;z:-l U~ Al U4-A FIO..l.ltl Hl.p A) &me u U3-A A) A) (~.FllZP) 90th !ll'om !ilgnal with

L~- +5VX Supply is lest I

'I

L7

Page 40: ALSEP Array E - Digital Data Processor reliability and failure … · 2013-12-04 · ,--~a11paee f818nW~ \ ALBEP Array E - Digital Data Processor Reliability and Failure Mode1 Effects

. ~E· ·:r:n.-~lt!lt ~T..; caso P-"'

bata Proceeeor ~""· ~ .. o of"Al.. . FAL\1£ MOD£ •. EFFECT &. CRITICALITY ANAL 'ISIS · 11'1! ~1' A•\O&IrCI ~zs't945 ~/,: ,.,, terfaee-Modot..

IMT;a;.aar IJINtT • FAI.URE FAH.UAE CIU'Tle-FAILURI MODI (Gt) ASSIMILY . ifx "'iii!. Y AUTY ..... . END ITEM

1. 3 IDterlae. Mom el. 3 54LCM IDverter I. J . 1. 3 .. B) 04-B 1 Faile Hip B) Same ae Ul·A A) 8) (NFDZP) 90th from elpa1 wl.da

+SVX Sllpply t. loet

C) u ... c •• n C) ... " .. .. C) (NFEZP) " " " .. " .

D) 04-D " .. D) .. " " " D} (SLBZN) Shift ltne eignal with +SVX . Supply ie !oat . . ~~

E) 04-E .. .. E) .. " .. " E) (SLCZN) " n " .. .. F) 04-F " .. F) ... .. .. .. F) {S!..OZN) " " " " .. ' .. 1;. J l.J 1. 3

; G) . 05-A Falla LGw G) Same ae VJ·A G) G) {NFBZP) Falla eame ae VJ-A G) " • I I . I I I I I L) US-I' • " Ll SameuUJ"!FLI 14 (SLDZN) _Faile eame u VJ-F U

' 1.4 1.4 . ·.064 1.4 1.4 !0. J& _. VI - 07 .

A) U7-A .

Falla _mp A) Same ae 03-AA) Al fSLEZN) Faile eame u U!-A A} -A

B) 07-B " " B) \ Bl {DGBZP) j

C) U7-C .. " C) C) (EFBZPJ . .. -·-" . D) . U7-D !1

D) - D} {SBJZP}

E) U7-E .. .. E) E) {ACJZP)

F) 0'7-F " " F) Sama ae Ul-F F) F} {DGFZP) FaUr. same u 03-F F) · v

G) U7-A Fails Low Gi Same ae U3-A G} G) {SLEZN) Falla $&.me u 03-A G)

I I t I ' I I L) U7-F .. " L) Same u U3-F L) L} (DGFZP) Fall~ wame u U3-F L)

-- ·--. -

w~ ----- -· - -----·-- 2d

Page 41: ALSEP Array E - Digital Data Processor reliability and failure … · 2013-12-04 · ,--~a11paee f818nW~ \ ALBEP Array E - Digital Data Processor Reliability and Failure Mode1 Effects

' '

. FAUJRE MODE. EFFECT & CRITICALITY ANAI.XSIS ·

-~ f.FF£1' or

SltBIL FAIWft£ MOOI

(&) ASSO&Y

l.s- 1. 5 ' .• 01 l. 5 aa~ate ... at .A) AI Faile OpeD .A) J..oae frame mark for LSQ aperi-Capac-....cl Cl Fa lie Slum liD4IDt

B) &1 Fall• Drift B) · 90th fr-• mark for LSO atD1 Cl :i"aila Drift· · -rb

1.~ 1.6 ••• I. 6 B.eeido.- - ll2 A) :az Falla Ope a A) Loea 90th frame 'mark for LSO Capacltiir - C2 C2 I' alb Short experlmeat •

B) 11.2 Fallll ; Drift B) 90th frame mark for LSG etlll wor cz Falla '

.Drift

.. 1.7• l. 7• .~01 I. 7 ._, .. , l!\3 Falla ()pea A) !Aee hame madt for C-experi-

C-3 Cl Fa ill! Short ...... B) &3 Fallll. Drift B) Frame mark for C-experlmeDt

C3 Fallll Drift atlll·wodte

1.3* T! 1.1 •• C)l 1.8

•• AJ ll4 Falla OpeD A) Loee 90th·tnme mark lor LEIIJI4 . Cl C4 !'alb - Short aperlm.atll

B) ll4 Fa ill! Drift B) 90th frame ~dt for LEAN ettU C4 Falla Drift worke

.. .

1.9• 1.9 1.' ItS A) RS i'ait. o,a.-01 A) Loee frame mark for LEAN expri cs cs Falla Sbort DlOJit

B) RS Falla Drift . B) Frame man for 1.EAW experlmen cs Faile . Drift .till WORIII

1.10* 1.10 .•:OJ l.lC R6 A) ll.6. Fallll OpeD A) Lose 90th frame for LMS•expri-C6 C6 Falls Sbort ment

B) B.6 Fails Drift Bi 90th frame for LMS experiment

-" C6 Fa Us Drift 11till work•

LH* 1.11 • (ll Lll R8 A} R8 Fails Open A) Loll!e shift line for LSG experi-ca C8 .. Fails Short m;,nt

B) R.8 • Faile Driit B) Shift line !or LSQ Experiment ce Faile Drift still works'

L~~c~ '"'"''''"'''l\1\\t·\•\lll\ll\\\\1""'"%'"''"' "'w"'""""' "''"' \\\\\\~ "' "".;~,,,;;\\\,,,;:,"c:::;,~,~~=,~~e."'.'le,e;d,~,!,M!!.!!!"'~""~'"'''"'

«~ ,- -nllllf-1 ... ~TMCJsofD' LNIIII ru. •··r ot46

~1' i;t':rf:ce Mochl ~~4 456 ""'If. 1 ~'IJ71 FALURI. ~~ ·' amc:-

END ITEM ·a·x·~-. ALtn

.. 1. 5 5. Zl lU A) (FNBZP) Frame E mark elpal

faile

B) (NFBZP) 90 frame elpal will etlU work -

I. 6 · s;z1 _w A) (Nl-~BZ.P) 90fnme •i&-1 fallll ..

: B} (NFBZP) 90 frame •i.a-1 will stlll work

' ~-

l. 7 S.Zl m A) (FMCZ.P) Stga&l fatlll

B) (NFBZ.P) Siauat will stlll wodt

1.8 5.1tl .. m A) (NFDZP) Sipal fallll

B} (NFDZP) Sipal will etillwork --

1.9 . 5:.21

,., A) (FMDZP} Sipal faU. - m . B) • (FMDZP) Sipal will etiU work

I. 10 ...: s. 21 ..:.m A) (NFEZ.P} Sigaal falls

Bl {NFEZ.P) Sign&! will still wodt

. 1.n 5. 21 ,III A) (SLBZN) Signal fails

~

B) (SLBZN} Signal "Hl1 works

i Z7

I I I I·

' ..

Page 42: ALSEP Array E - Digital Data Processor reliability and failure … · 2013-12-04 · ,--~a11paee f818nW~ \ ALBEP Array E - Digital Data Processor Reliability and Failure Mode1 Effects

~---- ·r. T8:rtt~a ~M 950 re" ,.._ ..

~~.,. ....... ~IU· PAG£uor46 . .

FAIJJRE MODE. EFFECT & CRITICALITY ANALYSIS· . "'~:T A_-_.. Interface.-~

~ .... · p•ut/zzrn

IMI'/CGJR~Br uncr 01 ,. .... FAIUJIIE CIIITIC-FAIWRI MCIDI . ~:~y AIJTY

SMQL tal ~ .. EIID ITEM

llltedace......_ .on s. Jl m 1.11A I.U ' l.U I.U

&7 A) ll7 Falla OpeD A) Loea fr- mark for LNS aper- A) (I'MEZP) alpat lalla

C7 C'l Fall• Silent lmnt B) . .., Fail a Drift B) l'r- iaark for LYI experlmeat B) (FMEZP) afpalatlU worka

c:r l'aUa Drift atm won.

1.1,. 1 • ., .ou I. IS I. IS 5,11! w· •• A) a9 Falla OpeD A) Loee frame ~-for heat now , A) (FMGZP) alpal laUe C9 C9 Falla Short e:~perimeat

. B) a9 Faile · Dl'lft B) Frame muk for. heat Row uper• Bl (FMGZPI alpalatlU worka

C9 Faile Drift l~ atUl worka

1.1~ 1.1. ·.~n 1.1. 1.1. ~11, m 8.10 A) lllO Falla OpeD A) Lon Uta ahUl 1lDe fow: C-uper- At (SLCZN) alpal fal1a - ·~. -· CIO ClO Falla Sbut imnt

B) lllO Faile . Drift B) Data alllft 1lDe for C-uperlmelll B) (SLCZN) 11lpal atnt worb . . · ClO Fail~ Drift atlUworka" . !

1.15* J.l5 .. ou 1.15 1.15 .s.zv m au A) au Fall• OpeD A) Lose 90th f.._ for G-experlmem A) (NFGZP) eipal falls en en • J'alb Sllori i

B) 11.11 Fall• Drift B) 90th frame for heat now exper- B) (NFGZP) ·•lgnal attn workl I I

Cll l'ail• Drift iment atUl worlte I I ... ~ 1.16 . .on 1.16 1. 16 >11, :m I I

8.11 A} au ran. Open A) Lo•e clata ehlft line for leam A) {SLDZN) sigu.l fall• ··--. cu cu Falla Short .npen-u.t -·

B) lll2 Falla Drift B) Data ehlft line for learn e:~pt. B) (SLDZN} signal atill worke C12 Fa1b Drl.ft etm works .

L !"7* L 17 .011 1.17 '

1.17 5. 21 lii tU3 A) lll3 Faib Open A) Lo~>e data demaad line for LSC A) {DDBZP) dpal !ails Cll C13 Faile Short experiment ..

B) RU Faile Drift B) Data damand line for LSCi expt. B) {DDBZPi al.pal etm worb ·-C13 Fall• Drl.ft l etill worb ' ---"

~"~a~ 1.18 • 0~1 1.18 1. 18 S.ll lli Rl4, A) Rl4 Faile Open A) Lose data ehift Hne for LMS A) (SLEU~) "i e;naJ failii Cl4 Cl4 Fails Short e'"~eriment

B) Rl4 Fe.ib Drift B) Da~a shift lme lor J_,MS expt. B) (SLEZN) s!~ sti!lwo .. u Cl4 Fails Drift &till woz-ke •

I

~-.-,.;;~~ ?D t ) f

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. '

FALURE MOD£. EFFECT&. CRITICALITY ANALYSIS fMI'/Q»FCHHft' UPin OF

,AII.URE MODI SYJGL (Gr.) ·--tv

1.19• 1.19 .ou 1.19 8.15 A) 8.15 l'aUa Opea A) Loae data demaad lbae for leam C15 C15 Falla Aolrt uperlmeal

B) 8.15 Falla Drift ., Data demaud liM fw team apt. C15 l'alb Drift etnlwolrb

l.zte 1.20 .ou· 1.10 8.16 A) 8.16 Falla ()pee A) Loae data altlft lbae for heat n-Cl6 C16 Falla SIMm aperlmnll .

B) 8.16 Falla Drift ., Data abUt 11M fw heat fl- e;ozpt. Cl6 Faile Drift etlll WOI'b

1.11• 1. Zl .on 1.11 1\17 A) 8.17 'F.alla a.-· A) Loae data demaad Uae for LMI Cl? C17 Falla Sllolt eaper._.

B) 8.17 hila DnA B) Data demaacl :IM for LYS apt. C17 Falla Drift atWwodta

l.Z~ 1.21 .on 1.U B.18 A) 8.18 Faile ()pea A) Lose data daift llae for LSP C18 C18 Falla Sllod ............

B) 8.18 .

Faile DnA ., Data ab1ft 11M for LIP ezpel'fmlat Cl8 Falla Dna atiUwolrb

x.n• 1. 2S .on 1.15 lUI A)' RZl Falla ()pea A) Loae data demaad pal" belli fkrw Cl9 C19 l'alla Ao.t experllllnit ., 8.21 Falla Drift B) • Data demud ..... Jleat flair

Cl9 Falla Drift uperiaaeBt attn wodta

1.2,4* l.U .on 1. 24 B.Z8 A) 1l28 Falla ~· A) Loee data deiiMM elpal fpr I' czz czz Falla Aort upsrilaeat

B) B.Z8 . Falla Drift B) Data demand alpat for F .zpt.

I czz Falla Drift atlllwodta

1 1. zse 1.25 .on I.ZS f R35 A) IUS Fail• Open' A) Loee data gate elpal for B

C26 C26 Fall• Shott ,-xperimeal B) R.35 Falls Drift B) Data gate signal tor B eo;::pt. atUl

CZ6 Fall• Ddft WOi'O

·'·~-~:~~ "'-~----!'.A.- - - -- __ ..a,. .. A-.-a.

~J!ai" J: "7~-cr.-... ~TN 950ft.V. i:Pf,a/ptlrace~aor f1'R' ru. PM:£43 or 46

~,.: • ..;;~at. ~!'!'! ..... r'1.1, ·17• MUM ~~ CRITIC-

ALITY END ITEM Ox Kil' 1.19 5. 21 m A) (DDDZP) eigiuLl fatla

B) (DDDZP) aipal ettlt won.

I. ZO 5.21 m A) (SLOZN) elp.al falla

• B) (SLQZN) aipal atiU won.

l.ll S.lJ. m A) (DDEZP) alpal f"'lla

B) (DDEZP) aisaal stlU wona

l.U .. S.U· m.

A) (SL.JZN) alpal falla '

B} (SLJZN) alpal etUl wodta

1.23 t.Ut .w A) (DDGZP) alpal faUa . .•. B) (DDGZP) alpal etm wodta •

1.24 J.~. m Aj (DOOZP) alpd fane

B) (DD:FZP} elPal .till wodul

!. zs 5. 21 III A) (DCBZP) sipal falls

B) (DGBZP) slgnal m:m worb

--

I

i I I

I

I I

I

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Page 44: ALSEP Array E - Digital Data Processor reliability and failure … · 2013-12-04 · ,--~a11paee f818nW~ \ ALBEP Array E - Digital Data Processor Reliability and Failure Mode1 Effects

. ' . ~'DlJ.!szp E ~TN ~so fD"_ . 7-o.-. . . . L:NI:d: Proce .. or !JWI> nu.

PA«i£«of'46

FALURE unnt-. EFFECT & CRITICALITY ANALY$1S .. ~' .1}7:;--~ .. ~~&.(. Ll'lf 12; 171 . . Interface

IMI'~ IJIIIII:T OF .. MUIIE ._!'!IL.URI CRITit-

MI..UMMCIDI ..... y AUTY ~ (&) .ASSba.Y ,.,.,_. END ITEM Ox IdS

1.$ 1. Z6 • Oil 1. Z6 1.16 5.ll m B.S6 A) B.S6" FaUe ()pea A) Lo .. eveftt frame e!PaJ lor B • At (EFBZP) aipal falb en CZ7 F.n. llloJt ezperlmeat

B) . B.S6 J'alla Dl'lft B) Evellf frame elpalfor B-apt. B)' fEFBZP) alpal atlU won. . en J'alla Drift etill worka .

a.zr- 1. 27 . on 1. n •. n s.n . .. ..

B.S8 A) lUI FaUe OpeD A)• Loee LSP clock elpal A) (AC.JZP) alpal falb CZ9 Cl9 FaUa Short . ..

B) B.S8 Falla Drift B). LSP CloCk elpal atm worka B) (ACJ'ZP) eipat atm wu1ra CZ9 Falla Drift -.... 1.28 .,u ••• ••• 5.21 m . .

&39 A) ast Falla Opea A) Loae dat.e pte alpal lw F ..... At (DGFZP) elpal laUe ,. c:so c:so J'alla llloJt --

B) B.S9 Falb Drift B) Data 1at• elpal etm won. ., (DGFZP) elpal at1ll worb C30 J'alla Drift

••• 1.19 .ou 1.29 ..

LJt . 5.21. m B.40 A) 8.40 Falla OpeD •. A) Lose 90th lruae elpal for C· A) (NFCZP) elpal laUe C31 CSl Falla

. Sbort ezperlmeat

B) B.40 F.Ue Drift B) 90th frame alpat lor C-apt. ., (NFCZP) signa! stnt warb I I CSJ . Falb Drift . atl11W01'ka I

. . . -· .

l.SO l.Sl .ooz 1.31 1.31 • 0.95 VI CD A) en Fall Short A) Ga.use CRZ zeur diode to fall A) (PPSXN) eJana.l pri cemma11111 to . -

ella nge supply s011rcell from x to y

B) C23 Fail Dt-ift Bl Could aUow aoiee to aive a falee '8} CPRSXN) eig-t might be wroaa the dgn&l to noise .

. ! h ~

- -

l ___ "" {! ..

*Theee !kme are Ma--r~ - -~-

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. ' '-...... . .. ' .

'"-.. FALURE . .!!9J&. I'FFECT & ~MtCALITY ANALYStS

..... J'IM'al!llr DNitT OF ......... . . ..... (&) ASSDIIIU

LJJ l.SZ .010 l.U .,. A) a:n, l'aUe ()pea .A) lleeet elrcalt etm woitt Ia . . clecnted mode_

Bl ltSl ...... Dria B). CUc:eit atm ..... - -·

I.JZ 1. 33 .111 1.31 -caz A) Clll J'aSl• -rt .A) B.eaet clrcd «Ul WOI'It Ia

· 4earacled IDOile . . B) C1U I'&Ua ()pea .. , Clrc:.ut f&Ua

•. C) caz Falla Drift C) are.ut -m 1a t~epadecl moae

... .001 _!.» 1.34 l.M

Jl29 A) lU9 hila Ope. At • B.eeet clre.tlt fall•

. B) lU9 l'aUe Drift B) • Ch-ealt -rb Ia 4epadecl mode . . ,4)02.. . 1.)4 1. 35 l.SS

CZ4 A) cz• Falla Short A) · lteael"·clrcatt falle

B) cu I' aU• OpeD B}· ..._ ell'C:Uit loaee c1elay oa.tuxu

' ..

L,~ - L '4/'t;, tJ

' --

~JI: T.a:-s:laa 'ftM950~ ~~roc:eellft IMii NO.

?NiE.45 o' 46

~'!rffc~ ~~56 P'lbntn ,Ai.Uii£ ,~ CNTC-

~ ·:' £JfD ITEM AUTT

1. JZ .. 74 VI A) (P~ aipal ettU -rlt II 5Ys

pea to aero YOib

BJ (PRSXH) aipal atRI -b

1.31 - 55.87 VI A) (PR.SXN) aipal atm worb If 5VJl -,_.to zero

' -

B) (PRSXN) •ipala!Ye• tabe •lpal . C) (PllSXlf} elpal atm worb II S.. • --·to-- 4-U. l;M

VI

A) (PRSXN) elgn.alp .. !abe alpal .

B) (PRSXK1 stpal etm won. II !lvz ~·to sero

l.JI 0.95_:· VI

A) {PRSXN} 11ignal gives falae signal

B} (PRSXN} signa! loey ~e delay whet~ ;

signal •oe• f- uio to GDe -- ·.· .

.

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Page 46: ALSEP Array E - Digital Data Processor reliability and failure … · 2013-12-04 · ,--~a11paee f818nW~ \ ALBEP Array E - Digital Data Processor Reliability and Failure Mode1 Effects

' ~ ..__,_..,.,

-- ~---· -----·-. ·-··-· ., · .. :

' I ......::T - rA~ I ~.1.1!11- . I "~- I FAI.IIRI ._

~-.114 QIA ~ P.O. OpeD ,~ Pow.r OD reaet clii'CGlt laile to lA) (PitSXN) power - reaet faUa ,..... Sbolt . re..-4 to loae of ~YOllap

au

.·1

JUZ J'alh Ope. X ..,. llll l'&lb Opa

Jl..ZT ·an Pall• ()pea B.H IUS -- .. Falla ()pea 1lM ltU F.U. ()pee 89C. D u9c Falla HlP

U9D FaD a RIP U9C FaDe I.. U9D FaDe I.. ., QlA Falb Drift I ., Pawer •. .,...eked wodre W I B) (PRSXN) .-.. - l'eHt work .Ia lUJ Palle Drl& .. ~ .... ~ depoa4eclmoa. lUO ..... Ddt au ran. Drift· IUS F&lla Ddtt RM ..... Ddft

•·n. ?•

•..

'.

.., ·!,~tsd• ,~'lJsi¥1-~ 11·.- 1 .,; rl_y_t,.:• -... ~~-.;zf}if$1t1 •n u· ,.},.... ·as -a?i' * ' · -,..&-~l!§(i:w ... "~~*"'= a&l Jtl 11 _.. t&t J: I l'f '.~.'Jl<·~ ;:,.;· - ·- :;.,.' - ,.... )