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ALS UM 2009
Stochastic Behavior of Magnetic ProcessesStochastic Behavior of Magnetic Processeson a Nanoscaleon a Nanoscale
Mi-Young ImCenter for X-ray Optics, LBNL
Berkeley, CA, [email protected]
ALS UM 2009
Challenge in Nano-magnetism
1 cm 1 mm 1 µm 1 nm
Ultra-smallUltra-small
Ultrathin Films Nanowire Nanoparticles
Novel Manuplating TechniqueNovel Manuplating Technique
B-field Spin current Thermal
Controllability Controllability
Vortex switchingDomain wall motion
Nano-MagnetismNano-Magnetism
1 ms 1 ns 1 ps 1 fs
Ultra-fastUltra-fast
Thermal activation Damping ThermalizationPrecession
ALS UM 2009
Contents
Background Background
Statistical Behavior of Magnetic ProcessesStatistical Behavior of Magnetic Processes
--- Domain Nucleation Process in Ultra Thin Magnetic Film (2D)
--- Domain Wall Depinning Process in Notch Patterned Nanowires (1D)
--- Vortex- State (chirality) Creation Process in Circular Nanodot Arrays (0D)
Summary Summary
ALS UM 2009
Statistical Behavior
Whether the magnetic process is deterministic or stochasticWhether the magnetic process is deterministic or stochastic
Scientific Point of ViewScientific Point of View : century old long-standing question
- Is there any unifying physical mechanism?- Is there any specific law, which governs the complicate magnetic phenomena?
- Which is dominant factor for determination of statistical nature?
Technological Point of ViewTechnological Point of View: substantial issue for application - Is the spin reversal phenomena repeatable?
- Is the domain wall motion controllable? - What is the way to acheive the tunable and
repeatable spin reversal and dynamics?
ALS UM 2009
ReviewIrreversible ReversalReproducible Hysteresis loop
J. M. Deutsche et al., Phys. Rev. Lett.(2004)
M. S. Pierce et al., Phys. Rev. Lett. (2003)
Macroscopic or k-space Contradictory
DWM at Single Time
A. J .Zambano et al., Appl. Phys.Lett. (2004)
Switching Field Distribution
Justin M. Shaw et al., J. Appl. Phys. (2007)
Theoretical approach Single measurement
Simulation for DW Process
E. Martinez et al., Phys. Rev. Lett. (2007)
Reversal Process in Nanodot
V. Novosad, et al., Phys. Rev. B, (2002)
Direct observation in real spaceDirect observation in real space
Statistical measurementStatistical measurement
ALS UM 2009
Our Goal
Observation S. Parkin US Patent 309, 6,834,005 (2004).G. Meier et al. PRL (2007)
Understanding Controlling
S. Parkin US Patent 309, 6,834,005 (2004).
Nanodot (0D)
Ultrathin Films Nanowires
Ultra Thin Film (2D) Nanowire (1D)
Nanodot
possibility for controllable spin process
solution for unsolved-question
ALS UM 2009
Magnetic soft X-ray microscopy at XM-1
Hmax= 5 kOe (perp.)= 2 kOe (long.)
CCD 2048x2048 px2
Mag ~ 2000FOV ~ 10-15 mm
t<70 ps
3rd generationsynchrotron source
E = 250 eV - 1.8 keVl= 0.7 nm - 5 nmE/E=500
element specificity
time resolution
XMCD contrast
polarization
circ. polarization
mm
5
-5
1-1 0intensity
10
0
lateral resolution
r< 25 nm
ALS UM 2009
Domain Nucleation Process in Ultra Thin Magnetic Film
ALS UM 2009
Sample: 50–nm (Co 82Cr18)87 Pt13 / 40-nm Ti / 200-nm Si3N4
Magnetic Domain Evolution Patterns
+H
-H -H-H
-2 -1 0 1 2-600-400-200
0200400600
M
s (em
u/c
c)
Field (kOe)
+400 Oe +600 Oe
2m
+200 Oe
0 Oe
-200 Oe
Nucelation-mediated magnetization reversal behavior that originated from individual switching of grain
M.-Y. Im et al., APL 83, 4589 (2003)
ALS UM 2009
Stochastic Nature
1st cycle
2nd cycle
Stochastic and asymmetric nature of magnetic domain nucleation process
1st cycle (left branch) 2nd cycle (right branch) Both cycles (branches)
Magnetic domain configurations in Magnetic domain configurations in repeated hysteretic repeated hysteretic cycles and different branchescycles and different branches
ALS UM 2009
Degree of Stochastic Nature
))(( 22ijij
ijij
YX
YXr
X and Y : same size matrices 1 : existence 0 : nonexistence of domain nucleation in each pixel r=0 : totally different r=1: completely identical
Average correlation coefficient Average correlation coefficient among domain among domain configurationsconfigurations
-600 -400 -200 0
0.0
0.1
0.2
0.3
0.4
0.5
Applied field (Oe)
Co
rrel
atio
n c
oef
fici
ent
a
0 200 400 6000.0
0.1
0.2
0.3
0.4
0.5
Applied field (Oe)
b
0 200 400 6000.0
0.1
0.2
0.3
0.4
Applied field (Oe)C
orr
elat
ion c
oef
fici
ent
c
Correlation coefficient in both cases increases as magnetization reversal is progressed
M.-Y. Im et al., Adv. Mater 20, 1750 (2008)
ALS UM 2009
eff fluct eff fluct
d MM H h M M H h
dt M
>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>>
20
2
1B
s
k TVar
M V
gyromagnetic ratio dimensionless damping
coefficient parameter hfluc fluctuating magnetic field
LLG equation incl. thermal term
Micromagnetic simulation of magnetization reversal Micromagnetic simulation of magnetization reversal patterns in patterns in repeated hysteretic cycles at 300 Krepeated hysteretic cycles at 300 K
Thermal flucutation effect play a role on stochastic nature in domain nucleation process
Thermal Fluctuation Effect
-100 0 100 200 300 400 500
0.2
0.3
0.4
0.5
Co
rrel
atio
n C
oef
fici
ent
Applied Field (Oe)
ALS UM 2009
Domain Wall Depinning Process in Notch Patterned Nanowires
ALS UM 2009
Permalloy (Ni80Fe20)
SEM imagesSEM images
Wire width (w): 150, 250, 450 nm Notch depth (Nd): 30, 50 % Film thickness (t): 50, 70 nm
Notch Patterned Permalloy Nanowire
+H
-H-H
-H
MTXM imageMTXM image
ALS UM 2009
-47 Oe
-383 Oe
-413 Oe
-430 Oe
-489 Oe
-141 Oe
-189 Oe
-236 Oe
-259 Oe
-371 Oe
-24 Oe
-106 Oe
-124 Oe
-129 Oe
-319 Oe
w= 150 nm w= 250 nm w= 450 nm
Domain walls are stopped at precise position
Domain Wall Evolution Patterns
ALS UM 2009
Depinning field of domain wall in Depinning field of domain wall in repeated hysteretic repeated hysteretic cyclescycles
-100 Oe H -530 Oe
DW depinning process shows stochastic behavior in repeated measurements
Stochastic Nature
DW depinning process is not completely governed byDW pinning mechanism
ALS UM 2009
Multiplicity of Domain-wall Types
The multiplicity of domain-wall type generated in the vicinity of a notch is responsible for the observed stochastic nature
Vortex wall
Transverse wall
courtesy S. Parkin
-440 Oe
-450 Oe
-485 Oe
-490 Oe
ALS UM 2009
Degree of Stochastic Nature
Standard deviationStandard deviation of DW depinning fieldof DW depinning field
200 300 400
10
20
30
40
t=30 nm, Nd=30 %
t=50 nm, Nd=50 %
S
tan
da
rd D
ev
iati
on
(O
e)
Wire Width (nm)
30 40 50
20
40
60
t=30 nm, w=250 nmt=50 nm, w=250 nm
Notch Depth (%)
M.-Y. Im et al, Phys. Rev. Lett. 102, 147204 (2009)
Standard deviation of the depinning field is minimized to below 7 Oe
The DW depinning process can be controllable in properly designed nanowire
ALS UM 2009
Vortex State (chirality) Creation Process in Nanodot Arrays
ALS UM 2009
Permalloy Nanodot Arrays
MTXM ImageMTXM Image
Dot Size (r): 200, 400, 600, 800, 1000 nm Film Thickness (t): 40, 70, 100 nm
800 nm• Chirality
in-plane circular domain structure• Polarity
out-of-plane component of magnetization
Vortex StateVortex State
Ni80Fe20 :t=100 nm, r=800 nm
Normalized ImagesNormalized Images
In-plane Out-of-plane
1000 nm
800 nm
600 nm
400 nm
200 nm
ALS UM 2009
Statistical Behavior of Vortex State (chirality) Creation Process
Ni80Fe20 (t=40 nm, r=1000 nm, d=200 nm)
2nd1st
+x saturation
Overlapped images
Overlapped imagesSwitched Dots
Switched Dots
In-plane domain state in In-plane domain state in repeated measurements and repeated measurements and changing the field directionchanging the field direction
Stochastic nature of creation process of chirality in repeated (different saturation field direction) measurements
M.-Y. Im, Peter Fischer, et al., in preparation
+xH
-x saturation
ALS UM 2009
Summary
Statistical Behavior of Magnetic Processes on a NanoscaleStatistical Behavior of Magnetic Processes on a Nanoscale
Direct observation of stochastic behavior - Domain nucleation process in ultra thin ferromagnetic system - Domain wall depinning process in nanowire system - Vortex state creation process in nanodot system
Investigation of the origin (thermal fluctuation, multiplicity, aspect ratio, etc.) of stochastic behavior
Answering for long-standing fundamental question on nanomagnetism Providing of controllable magnetic process
ALS UM 2009
Thanks to…
• Peter Fischer, B. Mesler, A.E. Sakdinawat, W. Chao, R. Oort, B. Gunion, S.B. Rekawa, P. Denham, E.H. Anderson, D.T. Attwood (CXRO Berkeley USA)
• S.-C. Shin (KAIST, Taejeon), S.-K. Kim (SNU, Seoul), S.B. Choe (SNU, Seoul), D.-H. Kim (Chungbuk U)
• L. Bocklage, Judith Moser, A. Vogel, R. Eiselt, M. Bolte, G. Meier, B. Krüger (U Hamburg, Germany)
• S. Kasai (NIMS in Jap.), K. Yamada, K. Kobayashi, T. Ono (U Kyoto), A. Thiaville (U Paris-Sud)
• ALS and CXRO staff
Thank you for attention!